CN109458899A - A kind of method of quick judgement mark line width - Google Patents
A kind of method of quick judgement mark line width Download PDFInfo
- Publication number
- CN109458899A CN109458899A CN201811200135.7A CN201811200135A CN109458899A CN 109458899 A CN109458899 A CN 109458899A CN 201811200135 A CN201811200135 A CN 201811200135A CN 109458899 A CN109458899 A CN 109458899A
- Authority
- CN
- China
- Prior art keywords
- mark
- line width
- line
- parallel lines
- test paper
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/02—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness
Abstract
The present invention relates to laser marking fields, and in particular to a method of quickly determine mark line width.After laser marking machine mark, just cut-off that in interval on test paper among two parallel lines forms wide twice straight line, opposite traditional measurement mode is more intuitive, and operation error is less to line group.By the above-mentioned line group in each measurement module on observation test paper, line width values can be directly read, also very efficiently, accurately.Even if laser power, mark speed are variant, that line group being just cut through to midfeather can be also found in the canonical measure figure, compatibility is also high.And the test paper needed for testing is inexpensively common, greatly reduces measurement hardware cost.
Description
Technical field
The present invention relates to laser marking fields, and in particular to a method of quickly determine mark line width.
Background technique
In CO2 laser marking field, possess most thin beam diameter (energy density is maximum) in focal point after laser focusing,
It requires to carry out cutting or mark in focal position under normal circumstances, shows as the mark line width of machine in effect.It is
Measure the important parameter of a laser marking machine performance superiority and inferiority and process debugging level.The factor that can influence mark line width is main
Have two broad aspects, first is that the actual design of equipment is assembled horizontal, another is the process debugging ability of user, the two because
Element air exercise graticule is wide of great impact.
Traditional measurement mark line width is tested generally by means such as microscope, Quadratic Finite Elements, due to laser marking line width side
Boundary will not be apparent, and boundary is not necessarily regular rectilinear, additionally due to using different capacity or Same Efficieney not synchronized
It is also very big to spend the line width difference that mark comes out, causes traditional test standard to be difficult to unification, testing efficiency is lower.
Summary of the invention
The technical problem to be solved in the present invention is that in view of the above drawbacks of the prior art, providing a kind of intuitive efficient
Quickly determine the method for mark line width.
The technical solution adopted by the present invention to solve the technical problems is: providing a kind of side for quickly determining mark line width
Method, comprising the following steps:
S1: calibration laser marking machine is in A*B (mm2) error in range；
S2: test paper is lain among mark range, and is opened vacuum suction and put down the test paper；
S3: canonical measure figure is imported into mark software simultaneously placed in the middle；The canonical measure figure includes at least one
Measurement module；The measurement module includes the line group of N row, Q column；Each line group includes two parallel lines being spaced apart from each other；
S4: adjustment laser marking machine parameter is to just punching test paper；
S5: canonical measure figure described in laser marking machine mark is used；When laser is along two parallel lines marks, two are beaten
Mark track just cuts through the test paper between two parallel lines, then spacing of the line width values of mark between this two parallel lines
Value.
Still more preferably scheme of the invention is: the line width values are H (q.n), H (q.n)=A+ (q-1) * 0.1+ (n-
1)*0.02；Wherein, A is the distance values between two parallel lines of the line group of the first row first row；When two mark tracks are just cut
When wearing the test paper between two parallel lines, the position of the line group where two parallel lines is the line n in measurement module, q
Column, and 0 < n≤N, 0 < q≤Q.
Still more preferably scheme of the invention is: the A=0.1；Line number N=5；Columns Q=7.
Still more preferably scheme of the invention is: the canonical measure figure is equipped with four groups of measurement modules；Described four groups
Measurement module includes respectively in 0 °, 45 °, 90 °, 135 ° of directional spredings.
Still more preferably scheme of the invention is: the canonical measure figure further includes the outline border for size calibration；
The area of the outline border is S, S=C*D and C≤A, D≤B；The measurement module is located in the outline border；When mark canonical measure
After figure, whether verification frame size coincide with design size, if identical on read test paper among two parallel lines between
Every the line width values H (q.n) of just cut-off that line group；If misfitting, S1 commissioning device again is returned.
Still more preferably scheme of the invention is: the A=100；B=100；C=100；D=70.
Still more preferably scheme of the invention is: the canonical measure figure further includes the label for showing columns；
The label is arranged in outline border and is located at the corresponding lower section of each line group of the first row.
Still more preferably scheme of the invention is: the test paper is office copy paper.
The beneficial effects of the present invention are intervals after laser marking machine mark, on test paper among two parallel lines
Just cut-off that forms wide twice straight line, opposite traditional measurement mode is more intuitive, and operation error is more to line group
It is few.By the above-mentioned line group in each measurement module on observation test paper, line width values can be directly read, also very efficient,
Accurately.Even if laser power, mark speed are variant, also that can be found in the canonical measure figure to midfeather just
The line group being cut through, compatibility are also high.And test needed for test paper it is inexpensively common, greatly reduce measurement hardware at
This.
Detailed description of the invention
Present invention will be further explained below with reference to the attached drawings and examples, in attached drawing:
Fig. 1 is the schematic diagram of the canonical measure figure of the embodiment of the present invention.
Specific embodiment
Now in conjunction with attached drawing, elaborate to presently preferred embodiments of the present invention.
To solve drawbacks described above, the present invention provides a kind of method for quickly determining mark line width, comprising the following steps:
S1: calibration laser marking machine is in A*B (mm2) error in range；
S2: test paper (not shown) is lain among mark range, and is opened vacuum suction and put down the test paper；
S3: canonical measure figure is imported into mark software simultaneously placed in the middle；The canonical measure figure includes at least one
Measurement module；The measurement module includes the line group of N row, Q column；Each line group includes two parallel lines being spaced apart from each other；
S4: adjustment laser marking machine (not shown) parameter is to just punching test paper；
S5: canonical measure figure described in laser marking machine mark is used；When laser is along two parallel lines marks, two are beaten
Mark track just cuts through the test paper between two parallel lines, then spacing of the line width values of mark between this two parallel lines
Value.
As shown in Figure 1, laser marking has line width on test paper, it can see both threads after two parallel lines of mark,
But it if will only see on test paper one 2 times wide when the actual range of both threads is just equal to mark line width
Straight line, the opposite more intuitive and to be measured mark line of traditional measurement mode is thicker, when measurement caused by make mistakes also more
It is few.In the present embodiment, the laser marking machine used is CO2 laser marking machine, and relevant parameter is adjustable, mark positioning accuracy
Higher than 0.02mm.The test paper used is common office copy paper, very cheap common, greatly reduces measurement cost.
The technological parameter of laser marking machine is adjusted, power is just to punch office copy paper as standard, if the judgement side just punched
Method is that whether there is also the places not cut through on observation mark line.
Test scope is designed according to the actual needs, and the measurement range of the present embodiment is 0.10-0.78mm.By the measurement
Module design is 7 column, 5 rows.
Specifically, the line width values are H (q.n), H (q.n)=A+ (q-1) * 0.1+ (n-1) * 0.02.Wherein, A first
Distance values between two parallel lines of the line group of row first row and be a fixed value, in this example A=0.10.0.1 in formula
Indicate laterally two adjacent lines groups spacing difference, therefore the spacing in each line group of the first row between two parallel lines from left to right according to
It is secondary are as follows: 0.10mm, 0.20mm, 0.30mm, 0.40mm, 0.50mm, 0.60mm, 0.70mm；0.02 in formula indicates longitudinal two
The difference of the spacing of adjacent lines group, therefore in the line group of same row, opposite first line group, other line groups are from bottom to top distinguished
Increase 0.02mm, 0.04mm, 0.06mm, 0.08mm, therefore the spacing in each line group of first row between two parallel lines is from the bottom up
Successively are as follows: 0.10mm, 0.12mm, 0.14mm, 0.16mm, 0.18mm.In practical applications, horizontal and vertical two adjacent lines group
The difference of spacing can change big according to measurement range and accuracy requirement or change small.When two mark tracks just cut through two in parallel
When test paper between line, the position of the line group where two parallel lines is line n in measurement module, q column, and n, q are whole
Number and 0 < n≤5,0 < q≤7.For example, being located at line width values H (4.2)=0.10+ (4-1) * 0.1 of that line group of the 2nd row the 4th column
+ (2-1) * 0.02=0.42mm, line width values H (7.3)=0.10+ (7-1) * for that the line group for being located at the 3rd row the 7th column positioned at the
0.1+ (3-1) * 0.02=0.74mm etc., does not enumerate herein.By finding out the interval between two parallel lines just
That the line group being cut through coordinate position locating in measurement module, then can directly calculate and read its mark line width values, and ten
Divide efficiently, accurately.Even if laser power, mark speed are variant, as long as its mark line width values falls in the survey of canonical measure figure
It measures in range, its value can be calculated, compatibility is very high.
Standard since the line width of laser marking in different directions may be inconsistent, to reduce error, in the present embodiment
Measurement pattern be equipped with four groups be in respectively 0 °, 45 °, 90 °, 135 ° directional spreding measurement module, and each measurement module includes 5
The line group of row, 7 column.Natural, each measurement module any rotation can also be subjected to mark measurement in practical application.
By taking a certain CO2 laser marking machine measures line width at 450mm focal range center as an example, same marking machine is being beaten
Measurement result after marking the canonical measure figure, in four groups of measurement modules are as follows:
0 ° of line width: H (3.3)=0.34mm；45 ° of line widths: H (3.2)=0.32mm；
90 ° of line widths: H (3.2)=0.32mm；135 ° of line widths: H (3.3)=0.34mm；
Therefore, the line width values measured under the parameter are 0.32mm-0.34mm.Particularly, when needing accurately to look for focus,
This method can also provide an accurate Modulated Reference foundation for commissioning staff.
Reality belongs to normal range (NR) repeatedly to the result of distinct device measurement mark line width between 0.30mm-0.36mm.
If it is greater than 0.36mm, illustrate that the effect of that equipment is poor, it is possible to determine that be unqualified, should check whether equipment debugs appearance
Problem, even equipment fault problem.Such measurement standard is formulated by this method, to the performance between distinct device
Contrast difference's test is very helpful.
Further, the canonical measure figure further includes the outline border for size calibration；The outline border is located at A*B calibration
In range, area S, S=C*D and C≤A, D≤B；The measurement module is respectively positioned in the outline border.It is surveyed in the standard of importing
After spirogram shape and adjustment marking machine parameter, whether frame size and design size can be checked with ruler after mark canonical measure figure
It coincide.Because of the frame size meeting slight difference that every marking equipment is got, need in advance to guarantee dimension correction each of its inside
Spacing actual value between the parallel lines of line group is consistent with design.If coincideing on read test paper among two parallel lines between
Every the line width values H (q.n) of just cut-off that line group；If misfitting, S1 commissioning device again is returned.In the present embodiment
In, A=100mm, B=100mm, C=100mm, the D=70mm, similarly, the value of described A, B, C, D be not it is fixed, can basis
The size of design drawing is changed.
More preferably, for convenient for the coordinate position where read line group, the canonical measure figure is additionally provided with label；The mark
Number be arranged in outline border and be located at the corresponding lower section of each line group of the first row.For convenience of interpretation of records, the upper right corner in outline border is also set
There is the mark time, the mark time can also voluntarily change label on test paper according to the real time.
In design standard measurement pattern, it is desirable that mark sequence is subject to minimum influence paper distortion, and typical case is such as
First each line group of mark, rear mark label and outline border.When debugging laser marking machine parameter, Laser output Q frequency is sufficiently large, and is beaten
Mark speed matches, it is desirable that mark came out must be continuous line, rather than the dotted line being made of point, it is also necessary to set sharp
The switch time delay of light, there is no emphasis for the mark first stroke of a Chinese character for guaranteeing every single line and last pen, i.e. interval breakpoint cannot be two every time
End position.In each line group of mark, it is desirable that laser just punches test paper, and energy should be as small as possible in mark label and outline border
And test paper can not cut through.
It should be understood that the above embodiments are merely illustrative of the technical solutions of the present invention, rather than its limitations, to ability
It for field technique personnel, can modify to technical solution illustrated in the above embodiments, or special to part of technology
Sign is equivalently replaced；And all such modifications and replacement, it should all belong to the protection domain of appended claims of the present invention.
Claims (8)
1. a kind of method for quickly determining mark line width, comprising the following steps:
S1: calibration laser marking machine is in A*B (mm2) error in range；
S2: test paper is lain among mark range, and is opened vacuum suction and put down the test paper；
S3: canonical measure figure is imported into mark software simultaneously placed in the middle；The canonical measure figure includes at least one measurement
Module；The measurement module includes the line group of N row, Q column；Each line group includes two parallel lines being spaced apart from each other；
S4: adjustment laser marking machine parameter is to just punching test paper；
S5: canonical measure figure described in laser marking machine mark is used；When laser is along two parallel lines marks, two mark rails
Mark just cuts through the test paper between two parallel lines, then distance values of the line width values of mark between this two parallel lines.
2. the method for quick judgement mark line width according to claim 1, it is characterised in that: the line width values are H
(q.n), H (q.n)=A+ (q-1) * 0.1+ (n-1) * 0.02；Wherein, A is between two parallel lines of the line group of the first row first row
Distance values；Line when two mark tracks just cut through the test paper between two parallel lines, where two parallel lines
The position of group arranges for the line n in measurement module, q, and 0 < n≤N, 0 < q≤Q.
3. the method for quick judgement mark line width according to claim 2, it is characterised in that: the A=0.1；Line number N=
5；Columns Q=7.
4. the method for quick judgement mark line width according to claim 1, it is characterised in that: the canonical measure figure is set
There are four groups of measurement modules；Four groups of measurement modules include respectively in 0 °, 45 °, 90 °, 135 ° of directional spredings.
5. the method for quick judgement mark line width according to claim 1, it is characterised in that: the canonical measure figure is also
Including the outline border for size calibration；The area of the outline border is S, S=C*D and C≤A, D≤B；The measurement module is located at institute
It states in outline border；After mark canonical measure figure, whether verification frame size coincide with design size, the read test if coincideing
Line width values H (q.n) of just cut-off that in interval on paper among two parallel lines to line group；If misfitting, S1 is returned
Again commissioning device.
6. the method for quick judgement mark line width according to claim 5, it is characterised in that: the A=100；B=100；
C=100；D=70.
7. the method for quick judgement mark line width according to claim 5, it is characterised in that: the canonical measure figure is also
Including for showing the label of columns；The label is arranged in outline border and is located at the corresponding lower section of each line group of the first row.
8. the method for quick judgement mark line width according to claim 1, it is characterised in that: the test paper is that office is multiple
Printing paper.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2018215527957 | 2018-09-21 | ||
| CN201821552795 | 2018-09-21 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109458899A true CN109458899A (en) | 2019-03-12 |
| CN109458899B CN109458899B (en) | 2020-12-18 |
Family
ID=65607620
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811200135.7A Active CN109458899B (en) | 2018-09-21 | 2018-10-16 | Method for rapidly judging marking line width |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109458899B (en) |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6342407A (en) * | 1986-08-07 | 1988-02-23 | Matsushita Electric Ind Co Ltd | Measuring method for pattern line width |
| CN1541846A (en) * | 2003-04-28 | 2004-11-03 | ��ʿ��Ƭ��ʽ���� | Device and method for laser marking |
| JP2004333355A (en) * | 2003-05-09 | 2004-11-25 | Sumitomo Chem Co Ltd | Line width measuring method |
| CN1844846A (en) * | 2005-04-08 | 2006-10-11 | 株式会社日立国际电气 | Wire width measuring device |
| CN102628736A (en) * | 2012-04-20 | 2012-08-08 | 核工业理化工程研究院 | Laser linewidth measuring device |
| CN103389041A (en) * | 2013-07-30 | 2013-11-13 | 中节能太阳能科技（镇江）有限公司 | Method for measuring width of grating line |
| US20160255241A1 (en) * | 2015-02-26 | 2016-09-01 | Konica Minolta, Inc. | Image-checking equipment for check image and image-forming apparatus that using the same |
| CN107883866A (en) * | 2016-09-30 | 2018-04-06 | 上海微电子装备（集团）股份有限公司 | A kind of optical measuring device and method |
-
2018
- 2018-10-16 CN CN201811200135.7A patent/CN109458899B/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6342407A (en) * | 1986-08-07 | 1988-02-23 | Matsushita Electric Ind Co Ltd | Measuring method for pattern line width |
| CN1541846A (en) * | 2003-04-28 | 2004-11-03 | ��ʿ��Ƭ��ʽ���� | Device and method for laser marking |
| JP2004333355A (en) * | 2003-05-09 | 2004-11-25 | Sumitomo Chem Co Ltd | Line width measuring method |
| CN1844846A (en) * | 2005-04-08 | 2006-10-11 | 株式会社日立国际电气 | Wire width measuring device |
| CN102628736A (en) * | 2012-04-20 | 2012-08-08 | 核工业理化工程研究院 | Laser linewidth measuring device |
| CN103389041A (en) * | 2013-07-30 | 2013-11-13 | 中节能太阳能科技（镇江）有限公司 | Method for measuring width of grating line |
| US20160255241A1 (en) * | 2015-02-26 | 2016-09-01 | Konica Minolta, Inc. | Image-checking equipment for check image and image-forming apparatus that using the same |
| CN107883866A (en) * | 2016-09-30 | 2018-04-06 | 上海微电子装备（集团）股份有限公司 | A kind of optical measuring device and method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN109458899B (en) | 2020-12-18 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN106338521B (en) | Increasing material manufacturing surface and internal flaw and pattern composite detection method and device | |
| CN105588840B (en) | A kind of electronic units fix method and device | |
| CN105004252B (en) | The detection method of verticality between the Mosaic face and datum level of square-section slender piece | |
| CN108919083A (en) | A method of improving Serdes IP wafer test efficiency | |
| US11200714B2 (en) | Virtual image distance measurement method, apparatus and device | |
| CN107748539A (en) | The multi-shaft interlocked Error Tracing ＆ method of five-axis machine tool based on the identification of RTCP error characters | |
| CN103640349A (en) | Secondary printing alignment method of silicon solar cell | |
| CN102749470A (en) | Fragment velocity measuring device | |
| CN108592816A (en) | A kind of three-dimensional measuring apparatus and method for large scale surface | |
| CN104535011B (en) | A kind of room parameter scaling method of three-dimensional line laser rut detection equipment | |
| CN103942551A (en) | Image-based arrester leakage current recognition method and system for convertor station | |
| CN108088381A (en) | A kind of contactless minim gap method for measuring width based on image procossing | |
| CN109458899A (en) | A kind of method of quick judgement mark line width | |
| CN105629321A (en) | Integrated device achieving image collection, and automatic optical detection method for three planes | |
| CN109848549A (en) | A kind of laser cutting machine flitch seeks edge system and its application method | |
| CN108538961B (en) | Method for positioning and marking crystalline silicon-based solar cell wafer | |
| CN106482648A (en) | Based on the absolute monitoring device of thin tail sheep in the long-distance plane of fixed point and method | |
| CN203293646U (en) | Screen printing equipment and special measuring device for same | |
| CN105973142A (en) | Grating scale error compensation method based on experience mode decomposition | |
| CN105427282A (en) | Method and device for testing 3D positioning accuracy | |
| CN104848829B (en) | Gang form detecting system and method | |
| CN104730217B (en) | The defect distribution display methods of a kind of glass substrate and display device | |
| CN106247997A (en) | Error of perpendicularity method for orthogonal guide rail platform | |
| CN207197430U (en) | The flatness detecting tool of surface labeling type electronic component pin | |
| CN205679165U (en) | A kind of length detection instrument |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |