CN109444151A - A kind of liquid crystal display panel defect inspection method and its system - Google Patents
A kind of liquid crystal display panel defect inspection method and its system Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
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- G—PHYSICS
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
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Abstract
The invention discloses a kind of liquid crystal display panel defect inspection method and its systems.For liquid crystal display panel defect inspection method comprising steps of benchmark image makes, liquid crystal display panel image making to be detected identifies each region of liquid crystal display panel to be detected, identifies defect and statistical shortcomings pixel quantity.Liquid crystal display panel defect detecting system includes API detection device, picture taking lens, motor, backlight area and support construction, and wherein picture taking lens include polaroid, photosensitive element.Detection side and its system of the invention, overexposure can be carried out automatically to take pictures and image comparison detection, it is able to achieve burr simultaneously and checks all functions of board, to can be achieved with liquid crystal display panel defects detection process by only increasing a small amount of productive temp, effectively reduce the whole production cycle, equipment cost and human cost are reduced, Detection accuracy is more controllable, to improve detection reliability.
Description
Technical field
The present invention relates to liquid crystal display panel defect detecting technique fields, more particularly, to a kind of liquid crystal display panel defect inspection method
And its system.
Background technique
For the liquid crystal display panel after cutting in existing liquid crystal display (Liquid Crystal Display, LCD) industry
Edge mainly uses burr inspection (Burr check) equipment of profession to carry out the edge cut quality of testing product, and whether there is or not broken for confirmation
Side (Chipping), chimb salient angle, the defects of degree of balance is bad.
Wherein common detection mode is that (Application Program Interface, application program connect using API
Mouthful) detection system detected, find AA (Active Area, effective display area domain) viewing area in liquid crystal display panel
Method be to sample white picture, camera overexposure, after distinguishing the sealing area (Seal) and the viewing area AA through grey scale in conjunction with software, people
Work checks each area defects.
The detection mode need to separately purchase professional burr and check board, product transmission equipment, this increases to a certain extent
Production cost.Further, artificial detection is finally needed, and the accuracy rate of artificial detection is uncontrollable, reliability is relatively low,
And detection process period is long.
Therefore, it is necessory to develop a kind of novel detection method and its system, to overcome defect in the prior art.
Summary of the invention
To solve the above problems, the present invention provides a kind of liquid crystal display panel defect inspection method and its system, can automatically into
Row overexposure is taken pictures to be detected with image comparison, while including API detection device, is able to achieve burr and is checked all functions of board, thus
It can be achieved with liquid crystal display panel defects detection process by only increasing a small amount of productive temp, effectively reduce the whole production cycle,
Equipment cost and human cost are reduced, Detection accuracy is more controllable, to improve detection reliability.
An embodiment of the invention provides a kind of liquid crystal display panel defect inspection method, and the detection method includes:
S1, benchmark image making step acquire each area image of benchmark liquid crystal display panel, carry out geometric correction to described image
And filtering processing, benchmark image, is distinguished in collected each area image by software through grey scale as a comparison
The backlight area (Backlight, BL) and liquid crystal display panel area edge boundary, record each area pixel grayscale value, define each area
Domain grayscale value range；
S2, liquid crystal display panel image making step to be detected with overexposure state acquisition liquid crystal display panel image to be detected, and are obtained
The grayscale value range in each region；
S3, identification each region step of liquid crystal display panel to be detected, by each area image of liquid crystal display panel to be detected with it is described
Benchmark image compares and analyzes, and identifies the liquid crystal display panel figure to be detected according to each region grayscale value range of the benchmark image
Its backlight area and liquid crystal display panel area are known in turn in each region as in；
S4, identify defect step, analyze the straightness on four side of detection liquid crystal display panel area image identified, and with
The benchmark image corresponding position compares, when the difference of the two is more than predetermined value, then it is assumed that the liquid crystal surface to be detected
Plate existing defects, wherein the predetermined value is within the scope of 0.1~0.5mm.
Further, wherein the defect detected includes cutting accuracy exception defect, to compare liquid crystal to be detected
The edge boundary of panel image and comparison benchmark image calculates in the liquid crystal display panel image to be detected and in comparison benchmark image
It is different to belong to cutting accuracy when any side length deviation is greater than the predetermined value for the side length deviation on the corresponding each side of panel
Normal defect；Wherein the predetermined value is within the scope of 0.15~0.5mm.
Further, wherein the defect detected includes cutting chimb salient angle defect, to calculate liquid crystal surface to be detected
Plate image is at a distance from each side of the corresponding panel in comparison benchmark image, described in liquid crystal display panel area to be detected any side protrusion
When comparing the distance values of benchmark panel area corresponding edge greater than the predetermined value, belong to chimb salient angle defect；It is wherein described
Predetermined value is within the scope of 0.1-0.25mm.
Further, wherein the defect detected includes fragmentation defect, to calculate liquid crystal display panel image to be detected
At a distance from panel in comparison benchmark image accordingly each side, when the liquid crystal display panel area to be detected any side is retracted the comparison base
When the distance values of quasi- panel area corresponding edge are greater than the predetermined value, belong to fragmentation defect；Wherein the predetermined value exists
Within the scope of 0.1-0.25mm.
Further, liquid crystal display panel defect inspection method further comprises the steps of:
S5, statistical shortcomings pixel quantity step calculate liquid crystal display panel to be detected in processing unit and compare benchmark panel
Difference pixel quantity is liquid crystal display panel defect pixel quantity to be detected when the difference pixel quantity is greater than 5, according to
The size of the liquid crystal display panel defect pixel quantity to be detected divides defect rank.
Further, it is wherein divided and is lacked according to the size of the liquid crystal display panel defect pixel quantity to be detected described in step S5
Sunken grade specifically includes: counting meter respectively according to cutting accuracy exception defect, chimb salient angle defect described in step S4, fragmentation defect
Calculation obtains the liquid crystal display panel defect pixel quantity to be detected；Or, according to cutting accuracy exception defect described in step S4, convex
Side salient angle defect, fragmentation defect read group total obtain the liquid crystal display panel defect pixel quantity to be detected；Or, according to step S4 institute
State cutting accuracy exception defect, chimb salient angle defect, fragmentation defect weighted sum are calculated the liquid crystal display panel to be detected and lack
Fall into pixel quantity.It can realize that different classes of defect counts respectively in such a way that the classification of defect calculates separately, using defect
The statistics available total defect area size of the mode of classification read group total is summed using the class weights of defect and is counted convenient for quickly identifying
Influence degree can be compareed according to different weights to be arranged by calculating.
It further, described in step S2 is wherein that will take pictures in a manner of overexposure state acquisition liquid crystal display panel image to be detected
Polarization effect removal on camera lens, makes it that overexposure state be presented, and obtains liquid crystal display panel image to be detected to shoot.
Further, wherein the mode by the polarization effect removal on picture taking lens is to drive the bat by motor
The polaroid looked in the mirror on head is removed, or the upper polaroid or down polaroid of the polaroid on the picture taking lens are driven by motor
It is rotated by 90 °, keeps upper polaroid parallel with down polaroid polarization direction without polarization effect.
An embodiment of the invention provides a kind of liquid crystal display panel defect detecting system, including API detection device, bat
It looks in the mirror head, motor, backlight area and support construction.Wherein the API detection device is for handling received data and output processing
As a result.The picture taking lens obtain comparison benchmark image and liquid crystal display panel image to be detected and by described image data for shooting
It is sent to the API detection device, the picture taking lens include polaroid (Polarizer, POL), photosensitive element；The motor
For the polaroid on picture taking lens is mobile；For the back lighting device for providing backlight when shooting, the back lighting device is fixed
The center in the backlight area of justice is oppositely arranged with the picture taking lens；The support construction is located at around the back lighting device, institute
The backlight area that the regional scope that support construction surrounds is defined with the back lighting device is stated to be oppositely arranged.
Wherein, the opportunity that rotation polaroid can be set according to the pitch time period using motor control, thus more intelligent
And automation.The regional scope and the backlight area that support construction surrounds, which are oppositely arranged, can make the unsupported structure of picture taking lens
Influence, backlight area is shot it is complete, can better discriminance analysis.The backlight that backlight area provides when shooting can will be to be detected
The edge-illuminated of liquid crystal display panel, overexposure state acquisition liquid crystal display panel image to be detected side when making liquid crystal display panel image making to be detected
Edge is apparent.
The beneficial effects of the present invention are: the present invention provides a kind of liquid crystal display panel defect inspection method and its device, it can be certainly
The dynamic overexposure that carries out is taken pictures and image comparison detection, while including API detection device, is able to achieve burr and is checked all functions of board,
So as to can be achieved with liquid crystal display panel defects detection process by only increasing a small amount of productive temp, whole production week is effectively reduced
Phase reduces equipment cost and human cost, and Detection accuracy is more controllable, to improve detection reliability.
Detailed description of the invention
Fig. 1 is the flow chart of the liquid crystal display panel defect inspection method of first embodiment of the invention；
Fig. 2 is the flow chart of the liquid crystal display panel defect inspection method of second embodiment of the invention；
Fig. 3 is the liquid crystal display panel image to be detected and benchmark image contrast schematic diagram of third embodiment of the invention；
Fig. 4 is the liquid crystal display panel defect detecting system main view of fourth embodiment of the invention；
Fig. 5 is the liquid crystal display panel defect detecting system top view of fifth embodiment of the invention.
Component mark is as follows in figure:
1, backlight area, 2, liquid crystal display panel area, 3, chimb salient angle, 4, fragmentation,
5, cutting accuracy is abnormal, 6, picture taking lens, 7, motor, 8, support construction,
9, back lighting device, 21, seal area, 22, the viewing area AA, 61, polaroid,
62, photosensitive element.
Specific embodiment
An embodiment of the invention provides liquid crystal display panel defect inspection method, please refers to shown in Fig. 1, Fig. 3, described
Detection method includes:
S1, benchmark image making step acquire each area image of benchmark liquid crystal display panel, carry out geometric correction to described image
And filtering processing, benchmark image, is distinguished in collected each area image by software through grey scale as a comparison
Backlight area 1 and liquid crystal display panel area 2 edge boundary, record each area pixel grayscale value, define each region grayscale value range.
Wherein, liquid crystal display panel area 2 includes seal area 21 and the viewing area AA 22, and the viewing area AA 22 is actually having for liquid crystal display panel
Imitate display area.
S2, liquid crystal display panel image making step to be detected with overexposure state acquisition liquid crystal display panel image to be detected, and are obtained
The grayscale value range in each region.
Wherein, described is by the polarisation on picture taking lens 6 in a manner of overexposure state acquisition liquid crystal display panel image to be detected
Effect removal, makes it that overexposure state be presented, and obtains liquid crystal display panel image to be detected to shoot.It is wherein described by picture taking lens 6
On polarization effect removal mode be drive the polaroid 61 on the picture taking lens to remove by motor 7, or pass through motor 7
The upper polaroid (not shown) or down polaroid (not shown) for driving the polaroid 61 on the picture taking lens are rotated by 90 °, and are made
Polaroid is parallel with down polaroid polarization direction without polarization effect.It can be according to the pitch time period using the control of motor 7
Come set polarization effect removal opportunity, thus it is more intelligent and automation.Wherein, overexposure, which refers to, makes picture under the great time for exposure
Complete white characteristic is presented in face, to highlight boundary.
S3, identification each region step of liquid crystal display panel to be detected, by each area image of liquid crystal display panel to be detected with it is described
Benchmark image compares and analyzes, and identifies the liquid crystal display panel figure to be detected according to each region grayscale value range of the benchmark image
Its backlight area 1 and liquid crystal display panel area 2 are known in turn in each region as in.
The straightness on four side of detection liquid crystal display panel area image that S4, analysis identify, and with the benchmark image
Corresponding position compares, when the difference of the two is more than predetermined value, then it is assumed that the liquid crystal display panel existing defects to be detected,
Described in predetermined value within the scope of 0.1~0.5mm.
Further, wherein the defect detected includes cutting accuracy exception defect, to compare liquid crystal to be detected
The edge boundary of panel image and comparison benchmark image calculates in the liquid crystal display panel image to be detected and in comparison benchmark image
It is different to belong to cutting accuracy when any side length deviation is greater than the predetermined value for the side length deviation on the corresponding each side of panel
Normal defect；Wherein the predetermined value is within the scope of 0.15~0.5mm.
Further, wherein the defect detected includes cutting chimb salient angle defect, to calculate liquid crystal surface to be detected
Plate image is at a distance from each side of the corresponding panel in comparison benchmark image, described in liquid crystal display panel area to be detected any side protrusion
When comparing the distance values of benchmark panel area corresponding edge greater than the predetermined value, belong to chimb salient angle defect；It is wherein described
Predetermined value is within the scope of 0.1-0.25mm.
Further, wherein the defect detected includes fragmentation defect, to calculate liquid crystal display panel image to be detected
At a distance from panel in comparison benchmark image accordingly each side, when the liquid crystal display panel area to be detected any side is retracted the comparison base
When the distance values of quasi- panel area corresponding edge are greater than the predetermined value, belong to fragmentation defect；Wherein the predetermined value exists
Within the scope of 0.1-0.25mm.
Further, calculate liquid crystal display panel to be detected and the side length deviation and calculating that compare the corresponding each side of benchmark panel to
Detect liquid crystal display panel and comparison benchmark panel accordingly at a distance from each side can according to the every pixel physical length of liquid crystal display panel to be detected and
It is long that liquid crystal display panel actual defects to be detected are calculated in the proportionate relationship of the every pixel physical length of photosensitive element 62 of picture taking lens 6
Degree.
It please refers to shown in Fig. 2, liquid crystal display panel defect inspection method further comprises the steps of:
S5, statistical shortcomings pixel quantity step calculate liquid crystal display panel to be detected in processing unit and compare benchmark panel
Difference pixel quantity is liquid crystal display panel defect pixel quantity to be detected when the difference pixel quantity is greater than 5, according to
The size of the liquid crystal display panel defect pixel quantity to be detected divides defect rank.The difference pixel quantity range can basis
Actual requirement precision set, general setting range are 5-10.
Wherein, described specifically to be wrapped according to the size of the liquid crystal display panel defect pixel quantity to be detected division defect rank
It includes: institute being calculated respectively according to cutting accuracy exception defect 5, chimb salient angle defect 3 described in step S4, fragmentation defect 4
State liquid crystal display panel defect pixel quantity to be detected；Or, according to cutting accuracy exception defect 5, chimb salient angle described in step S4
Defect 3,4 read group total of fragmentation defect obtain the liquid crystal display panel defect pixel quantity to be detected；Or, being cut according to described in step S4
Cut precision exception defect 5, the liquid crystal display panel defect to be detected is calculated in chimb salient angle defect 3,4 weighted sum of fragmentation defect
Pixel quantity.It can realize that different classes of defect counts respectively in such a way that the classification of defect calculates separately, using the class of defect
The statistics available total defect area size of the mode of other read group total is convenient for quickly identifying, using the class weights read group total of defect
Influence degree can be compareed according to different weights to be arranged.
In addition, the result of the defect rank of the liquid crystal display panel to be detected produces detection report or report, to consult.
Another embodiment of the invention provides a kind of liquid crystal display panel defect detecting system, and described device can be realized
The detection method of any of the above-described.
It please refers to another embodiment of the invention shown in Fig. 4-Fig. 5 and provides a kind of liquid crystal display panel defects detection system
System, including API detection device (not shown), picture taking lens 6, motor 7, back lighting device 9 and support construction 8.The wherein API inspection
Device (not shown) is surveyed for handling received data and output processing result.The picture taking lens 6 are compared for shooting
Described image data are simultaneously sent to the API detection device (not shown), institute by benchmark image and liquid crystal display panel image to be detected
Stating picture taking lens 6 includes polaroid 61, photosensitive element 62；The motor 7 is used for the polaroid 61 on picture taking lens 6 is mobile；
The back lighting device 9 is taken pictures for providing backlight, the center in the backlight area 1 that the back lighting device 9 defines when shooting with described
Camera lens is oppositely arranged；The support construction 8 is located at around the back lighting device 9, the regional scope that the support construction 8 surrounds
It is oppositely arranged with the backlight area 1 of the back lighting device 9 definition.
Wherein, the opportunity that rotation polaroid 61 can be set according to the pitch time period is controlled using motor 7, thus more intelligence
It can and automate.The regional scope that support construction 8 surrounds is oppositely arranged with the backlight area 1 can be such that picture taking lens 6 are not propped up
The influence of support structure 8 shoots backlight area 1 completely, can better discriminance analysis.The backlight that backlight area 1 provides when shooting
Can be by the edge-illuminated of liquid crystal display panel to be detected, overexposure state acquisition liquid crystal to be detected when making liquid crystal display panel image making to be detected
Panel image edge is apparent.
The beneficial effects of the present invention are: the present invention provides a kind of liquid crystal display panel defect inspection method and device, it can be automatic
It carries out overexposure to take pictures and image comparison detection, while including API detection device, be able to achieve burr and check all functions of board, from
And liquid crystal display panel defects detection process can be can be achieved with by only increasing a small amount of productive temp, effectively reduce whole production week
Phase reduces equipment cost and human cost, and Detection accuracy is more controllable, to improve detection reliability.
The above is only a preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art
Member, various improvements and modifications may be made without departing from the principle of the present invention, these improvements and modifications also should be regarded as
Protection scope of the present invention.
Claims (10)
1. a kind of liquid crystal display panel defect inspection method, which is characterized in that the detection method includes:
S1, benchmark image making step acquire each area image of benchmark liquid crystal display panel, carry out geometric correction and filter to described image
Wave processing, benchmark image, distinguishes the back in collected each area image through grey scale by software as a comparison
The edge boundary in light area and liquid crystal display panel area records each area pixel grayscale value, defines each region grayscale value range；
S2, liquid crystal display panel image making step to be detected with overexposure state acquisition liquid crystal display panel image to be detected, and obtain each area
The grayscale value range in domain；
S3, identification each region step of liquid crystal display panel to be detected, by each area image of liquid crystal display panel to be detected and the benchmark
Image compares and analyzes, and is identified in the liquid crystal display panel image to be detected according to each region grayscale value range of the benchmark image
Each region so that know its backlight area and liquid crystal display panel area；
S4, identify defect step, analyze the straightness on four side of detection liquid crystal display panel area image identified, and with it is described
Benchmark image corresponding position compares, when the difference of the two is more than predetermined value, then it is assumed that the liquid crystal display panel to be detected is deposited
In defect, wherein the predetermined value is within the scope of 0.1~0.5mm.
2. liquid crystal display panel defect inspection method according to claim 1, which is characterized in that is detected in step S4 is described
Defect includes cutting accuracy exception defect, to compare liquid crystal display panel image to be detected and comparing the edge boundary of benchmark image,
The side length deviation for calculating each side corresponding to panel in comparison benchmark image in the liquid crystal display panel image to be detected, works as any side
When long deviation is greater than the predetermined value, belong to cutting accuracy exception defect；Wherein the predetermined value 0.15~
Within the scope of 0.5mm.
3. liquid crystal display panel defect inspection method according to claim 1, which is characterized in that is detected in step S4 is described
Defect includes cutting chimb salient angle defect, to calculate each side of the corresponding panel in liquid crystal display panel image to be detected and comparison benchmark image
Distance, when the distance values of the prominent comparison benchmark panel area corresponding edge of the liquid crystal display panel area to be detected any side are greater than
When the predetermined value, belong to chimb salient angle defect；Wherein the predetermined value is within the scope of 0.1-0.25mm.
4. liquid crystal display panel defect inspection method according to claim 1, which is characterized in that is detected in step S4 is described
Defect includes fragmentation defect, for calculate liquid crystal display panel image to be detected each side corresponding with panel in benchmark image is compared away from
From when the liquid crystal display panel area to be detected any side is retracted the distance values of the comparison benchmark panel area corresponding edge greater than described
When predetermined value, belong to fragmentation defect；Wherein the predetermined value is within the scope of 0.1-0.25mm.
5. liquid crystal display panel defect inspection method according to claim 1, which is characterized in that further comprise the steps of:
S5, statistical shortcomings pixel quantity step calculate liquid crystal display panel to be detected in processing unit and compare the difference of benchmark panel
Pixel quantity is liquid crystal display panel defect pixel quantity to be detected, according to described when the difference pixel quantity is greater than 5
The size of liquid crystal display panel defect pixel quantity to be detected divides defect rank.
6. liquid crystal display panel defect inspection method according to claim 5, which is characterized in that described in step S5 according to it is described to
The size of detection liquid crystal display panel defect pixel quantity divides defect rank and specifically includes:
It is calculated respectively according to cutting accuracy exception defect, chimb salient angle defect described in step S4, fragmentation defect described
Liquid crystal display panel defect pixel quantity to be detected.
7. liquid crystal display panel defect inspection method according to claim 5, which is characterized in that described in step S5 according to it is described to
The size of detection liquid crystal display panel defect pixel quantity divides defect rank and specifically includes:
It is calculated according to cutting accuracy exception defect, chimb salient angle defect described in step S4, fragmentation defect weighted sum described
Liquid crystal display panel defect pixel quantity to be detected.
8. liquid crystal display panel defect inspection method according to claim 1, which is characterized in that with overexposure state described in step S2
The mode for acquiring liquid crystal display panel image to be detected is to make it that overexposure state be presented the polarization effect removal on picture taking lens, from
And it shoots and obtains liquid crystal display panel image to be detected.
9. liquid crystal display panel defect inspection method according to claim 8, which is characterized in that it is described will be inclined on picture taking lens
The mode of light effect removal is to drive the polaroid on the picture taking lens to remove by motor, or drive the bat by motor
The upper polaroid of the polaroid on head of looking in the mirror or down polaroid are rotated by 90 °, and keep upper polaroid parallel with down polaroid polarization direction
Without polarization effect.
10. a kind of liquid crystal display panel defect detecting system characterized by comprising
API detection device, for handling received data and output processing result；
Picture taking lens, for shooting acquisition comparison benchmark image and liquid crystal display panel image to be detected and sending described image data
To the API detection device, the picture taking lens include polaroid (Polarizer, POL), photosensitive element；
Motor, for the polaroid on picture taking lens is mobile；
Back lighting device provides backlight, the center in the backlight area that the back lighting device defines and the mirror of taking pictures when for shooting
Head is oppositely arranged；
Support construction, around the back lighting device, regional scope and the back lighting device that the support construction surrounds
The backlight area of definition is oppositely arranged.
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| CN201811359546.0A CN109444151A (en) | 2018-11-15 | 2018-11-15 | A kind of liquid crystal display panel defect inspection method and its system |
| PCT/CN2019/077042 WO2020098181A1 (en) | 2018-11-15 | 2019-03-05 | Liquid crystal panel defect detection method and system thereof |
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| CN201811359546.0A CN109444151A (en) | 2018-11-15 | 2018-11-15 | A kind of liquid crystal display panel defect inspection method and its system |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020098181A1 (en) * | 2018-11-15 | 2020-05-22 | 深圳市华星光电半导体显示技术有限公司 | Liquid crystal panel defect detection method and system thereof |
| CN111693533A (en) * | 2020-06-11 | 2020-09-22 | 南通通富微电子有限公司 | Workpiece surface quality detection method and device and appearance machine |
| CN112763511A (en) * | 2020-12-24 | 2021-05-07 | 深圳市华星光电半导体显示技术有限公司 | Method for detecting line defect of display panel |
| CN112945984A (en) * | 2021-02-01 | 2021-06-11 | 深圳市华星光电半导体显示技术有限公司 | Detection method and detection device for display panel |
| CN115061294A (en) * | 2022-06-28 | 2022-09-16 | Tcl华星光电技术有限公司 | Method and system for repairing defects of liquid crystal display panel and storage medium |
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| CN115061294A (en) * | 2022-06-28 | 2022-09-16 | Tcl华星光电技术有限公司 | Method and system for repairing defects of liquid crystal display panel and storage medium |
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