CN109443214A - A kind of scaling method of structured light three-dimensional vision, device and measurement method, device - Google Patents
A kind of scaling method of structured light three-dimensional vision, device and measurement method, device Download PDFInfo
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- CN109443214A CN109443214A CN201811556616.1A CN201811556616A CN109443214A CN 109443214 A CN109443214 A CN 109443214A CN 201811556616 A CN201811556616 A CN 201811556616A CN 109443214 A CN109443214 A CN 109443214A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
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Abstract
The embodiment of the present application discloses scaling method, device and the measurement method of a kind of structured light three-dimensional vision, device, the striation print image including obtaining each height of scaling board;Obtain the intersection point pixel coordinate of striations and pattern on the scaling board in every frame striation print image;The pixel coordinate at pattern preset position is determined according to the shape of the corresponding intersection point pixel coordinate of pattern and pattern;Pixel coordinate at each pattern preset position is associated with the actual height that pattern preset position is in the scaling board and forms incidence relation, enable and the corresponding actual height of pixel on the striations to be measured is obtained according to the pixel coordinate on striations to be measured on the pixel coordinate of pixel, the incidence relation and scaling board at all pattern preset positions, line-structured light measurement process calibration process complexity is reduced, it is accurate to improve structural light measurement.
Description
Technical field
This application involves technical field of visual measurement more particularly to a kind of scaling methods of structured light three-dimensional vision, device
And measurement method, device.
Background technique
Currently, there are many ways to carrying out vision measurement, including contact type measurement and non-contact measurement.And it is existing
Non-contact 3-D vision measurement be broadly divided into Binocular vision photogrammetry and structure light vision measurement.
Wherein, structure light vision measurement is measured based on optical triangulation principle, and measuring instrument is main
It is made of optical projection device (laser) and CCD industrial camera.Optical projection device is by the project structured light of certain pattern in object
Surface, optical plane form the striation print image modulated by testee surface shape in body surface, and the image is by another
The CCD industrial camera of one position absorbs.The height that the distortion degree of striation print image depends primarily on light profiling object surface becomes
Change, in striation print image, the offset of striations and the height of profiling object surface are proportional.
Therefore, it needs first to demarcate before vision measurement, and existing scaling method is to optical projection device and video camera point
It is not demarcated, obtains the inside and outside parameter of optic plane equations and video camera that optical projection device transmits, utilize these calibration
The parameter obtained afterwards solves light stripe center pixel to be measured, it can obtains the three-dimensional data of object.In calibration process,
It is complex to demarcate this process of optic plane equations, and measurement accuracy can be influenced because of model error, rounding error etc..
Summary of the invention
The embodiment of the present application provides scaling method, device and the measurement method of a kind of structured light three-dimensional vision, device, drop
Low line-structured light measurement process calibration process complexity, it is accurate to improve structural light measurement.
In view of this, the application first aspect provides a kind of scaling method of structured light three-dimensional vision, comprising:
Obtain the striation print image of each height of scaling board;
Obtain the intersection point pixel coordinate of striations and pattern on the scaling board in every frame striation print image;
The pixel coordinate at pattern preset position is determined according to the shape of the corresponding intersection point pixel coordinate of pattern and pattern;
Pixel coordinate at each pattern preset position is in the actual height of the scaling board with pattern preset position
It is associated with and is formed incidence relation, so that according to the pixel coordinate of pixel, the incidence relation and calibration on striations to be measured
It is corresponding practical high that pixel coordinate on plate at all pattern preset positions can obtain pixel on the striations to be measured
Degree, wherein the striations to be measured is to extract from the striation print image of object to be measured.
Preferably,
It is the center of pattern at the pattern preset position.
Preferably,
The pattern is circle.
The application second aspect provides a kind of caliberating device of structured light three-dimensional vision, comprising:
First acquisition unit, for obtaining the striation print image of each height of scaling board;
Second acquisition unit, for obtaining the intersection point picture of striations and pattern on the scaling board in every frame striation print image
Plain coordinate;
Determination unit, for being determined at pattern preset position according to the shape of the corresponding intersection point pixel coordinate of pattern and pattern
Pixel coordinate;
Associative cell, for the pixel coordinate at each pattern preset position to be in the calibration with pattern preset position
The actual height of plate is associated with and is formed incidence relation, so that according to the pixel coordinate of pixel, the pass on striations to be measured
Pixel coordinate in connection relationship and scaling board at all pattern preset positions can obtain pixel on the striations to be measured
Corresponding actual height, wherein the striations to be measured is to extract from the striation print image of object to be measured.
The application third aspect provides a kind of measurement method of structured light three-dimensional vision, comprising:
Obtain the striation print image of object to be measured;
Extract the striations in the striation print image;
Pixel on the striations to be measured is obtained according to the pixel coordinate of pixel on the striations and calibrating parameters
The corresponding actual height of point, wherein the calibrating parameters include pixel coordinate, the figure on scaling board at all pattern preset positions
The pixel coordinate of case predetermined position and pattern preset position are in the incidence relation between the actual height of the scaling board.
Preferably,
Pixel on the striations to be measured is obtained according to the pixel coordinate of pixel on the striations and calibrating parameters
The corresponding actual height of point specifically includes:
Light stripe center is extracted from the striations to be measured;
For each pixel on the light stripe center, determined according to the pixel coordinate of pixel apart from the pixel
Pixel coordinate on four neighbouring scaling boards of point at pattern preset position, then according to the pixel coordinate at pattern preset position
The incidence relation that is between the actual height of the scaling board with pattern preset position simultaneously obtains the pixel by differential technique
The corresponding actual height of point.
Preferably,
It is the center of pattern at the pattern preset position.
Preferably,
The pattern is circle.
The application fourth aspect provides a kind of measuring device of structured light three-dimensional vision, comprising:
Third acquiring unit, for obtaining the striation print image of object to be measured;
Extraction unit, for extracting the striations in the striation print image;
4th acquiring unit, for according to the pixel coordinate of pixel on the striations and calibrating parameters obtain it is described to
The corresponding actual height of pixel on striations is measured, wherein the calibrating parameters include all pattern preset positions on scaling board
Pixel coordinate and pattern preset position at the pixel coordinate at place, pattern preset position be in the scaling board actual height it
Between incidence relation.
Preferably,
4th acquiring unit is specifically used for:
Light stripe center is extracted from the striations to be measured;
For each pixel on the light stripe center, determined according to the pixel coordinate of pixel apart from the pixel
Pixel coordinate on four neighbouring scaling boards of point at pattern preset position, then according to the pixel coordinate at pattern preset position
The incidence relation that is between the actual height of the scaling board with pattern preset position simultaneously obtains the pixel by differential technique
The corresponding actual height of point.
As can be seen from the above technical solutions, the embodiment of the present application has the advantage that
In the embodiment of the present application, a kind of scaling method of structured light three-dimensional vision is provided, it is each high first to obtain scaling board
The striation print image of degree;Then the intersection point pixel coordinate of striations and pattern on scaling board in every frame striation print image is obtained;Again
The pixel coordinate at pattern preset position is determined according to the shape of the corresponding intersection point pixel coordinate of pattern and pattern;It finally will be each
Pixel coordinate at pattern preset position is associated with the actual height that pattern preset position is in scaling board and is formed incidence relation,
So that according on striations to be measured on the pixel coordinate of pixel, incidence relation and scaling board at all pattern preset positions
Pixel coordinate can obtain the corresponding actual height of pixel on striations to be measured, wherein striations to be measured is to be measured
It is extracted in the striation print image of object;
Because the present invention can obtain the corresponding actual height of light stripe center pixel to be measured according to association connection,
Without solving light stripe center to be measured by ginseng inside and outside calibration structure optic plane equations and camera, to avoid calibrated
Journey calculates the deficiency of accuracy caused by error and rounding error, improves the measurement accuracy of structured light three-dimensional vision, and simplify
Measurement process.
Detailed description of the invention
Fig. 1 is the method flow diagram of the scaling method of structured light three-dimensional vision in the embodiment of the present application;
Fig. 2 is the structural schematic diagram of the caliberating device of structured light three-dimensional vision in the embodiment of the present application;
Fig. 3 is the method flow diagram of the measurement method of structured light three-dimensional vision in the embodiment of the present application;
Fig. 4 is the structural schematic diagram of the measuring device of structured light three-dimensional vision in the embodiment of the present application;
Fig. 5 is the schematic diagram of an angle of calibration facility in the embodiment of the present application;
Fig. 6 is the schematic diagram of another angle of calibration facility in the embodiment of the present application;
Fig. 7 is the schematic diagram of another angle of calibration facility in the embodiment of the present application.
Specific embodiment
In order to make those skilled in the art more fully understand application scheme, below in conjunction in the embodiment of the present application
Attached drawing, the technical scheme in the embodiment of the application is clearly and completely described, it is clear that described embodiment is only this
Apply for a part of the embodiment, instead of all the embodiments.Based on the embodiment in the application, those of ordinary skill in the art exist
Every other embodiment obtained under the premise of creative work is not made, shall fall in the protection scope of this application.
Referring to Fig. 1, in the embodiment of the present application the scaling method of structured light three-dimensional vision method flow diagram.
The application first aspect provides a kind of one embodiment of the scaling method of structured light three-dimensional vision, comprising:
Step 101, the striation print image of each height of scaling board is obtained.
In the present embodiment, can first by scaling board slant setting, then control line structured light device and camera along
Horizontal direction moves synchronously, and line-structured light is projected on scaling board different height, to generate each height of scaling board
Striation print image, line-structured light is projected on scaling board, forms striations, and acquire each height of scaling board by camera
Striation print image;Because pattern distortion is related with body surface height, on scaling board, the image of different height pattern is abnormal
Change degree is different, and corresponding pixel-shift amount is different on the image, i.e. the imaging position of pattern on the image is different.
Therefore, each pixel corresponds to an actual height on striation print image.
It should be noted that the pattern types on scaling board include a variety of, such as can be filled circles array pattern, that is, scheme
Case is circle, can also be chessboard pattern.
Step 102, the intersection point pixel coordinate of striations and pattern on scaling board in every frame striation print image is obtained.
It is understood that for each pattern on scaling board, with the movement of striations, pattern will with it is a plurality of
Striations is crossed to form multiple intersection points.
Step 103, the picture at pattern preset position is determined according to the shape of the corresponding intersection point pixel coordinate of pattern and pattern
Plain coordinate.
In the present embodiment, pattern preset position can be each position of pattern, specifically can according to actual needs into
Row setting, such as can be the center of pattern at pattern preset position.
When pattern is round, pattern preset position can be the center of circle, or a quarter branch on round edge;When
Pattern be round and pattern preset position at when being the center of circle, the intersection point pixel coordinate of striations and circular pattern can be passed through and determined
The pixel coordinate of the center point of circular pattern.
Step 104, the pixel coordinate at each pattern preset position is in the reality of scaling board with pattern preset position
Highlights correlations simultaneously form incidence relation, so that according to the pixel coordinate of pixel, incidence relation and calibration on striations to be measured
Pixel coordinate on plate at all pattern preset positions can obtain the corresponding actual height of pixel on striations to be measured,
In striations to be measured be to be extracted from the striation print image of object to be measured.
It is understood that there are many sides after the pixel coordinate at pattern preset position is associated with actual height formation
The corresponding actual height of pixel on the available striations to be measured of method;Such as it can be calculated by pixel coordinate to be measured
Measure pixel coordinate relationship between pixel and surrounding vicinity points on striations, further according to incidence relation can calculate to
The corresponding actual height of pixel on striations is measured, and then the actual height of some point of object to be measured can be completed.
It should be noted that the present embodiment completes measurement using pixel coordinate and the incidence relation of actual height, do not need
Optical projection device and video camera are demarcated, and the calculating error of inside and outside parameter and distortion factor is avoided to cause image rectification not
Completely, the measurement accuracy of structured light three-dimensional vision is improved, and simplifies measurement process.
Further it will be understood that if the pixel coordinate of all the points on scaling board is homogeneously associated with actual height, that
For each pixel on striations to be measured, its corresponding actual height can be determined according to incidence relation;However,
This method needs in advance demarcate all the points on scaling board, and the invention of this reality only need at pattern preset position into
Rower is fixed, then measurement is completed by calculating, so the workload of calibration is greatly saved in the present invention.
For ease of understanding, below by the application with a concrete application scene to a kind of scaling method of structured light three-dimensional vision
It is illustrated, application examples includes:
Fig. 5 to Fig. 7 is please referred to, the application carries out the calibration of structured light three-dimensional vision with the calibration facility.The calibration facility
Including platform 1, and industrial camera 8, line-structured light transmitter 7, the high-precision dot scaling board 9, guide rail of setting on the platform 1
5,2, two cylinder gauge blocks 3 of multiple and different specification cuboid gauge blocks and two magnetic v blocks 4, as shown in Figures 5 to 7, industrial phase
Machine 8 and 7 relative position of line-structured light transmitter are fixed, and are mounted on 9 top of scaling board and along horizontal motion, high accuracy circular
Point 9 positioned beneath of scaling board has a guide rail 5, and it is free that there are two 6 one end of sliding block on guide rail 5, another sliding block 6 is solid by holding screw
It is scheduled on guide rail 5.Two sliding blocks 6 are connected with screw thread and two magnetic v blocks 4 respectively, and magnetic v block 4 is consistent with two specifications
Cylinder gauge block 3 because magnetic force be in close contact, free end place different size cuboid gauge block 2 constitute arbitrary height.It should
Calibration facility angle can be adjusted arbitrarily, can be adjusted angle according to the measurement request of different height, be made between two neighboring demarcating circle
Vertical height distance has any adjusting.
From Fig. 7 according to geometrical relationship:
Then
H is gauge block height, and L is the length between two v blocks 4, can directly be measured by tools such as micrometers, and l is height
On precision dot scaling board 9 between two circles on scaling board 9 actual physics spacing, h be high-precision dot scaling board 9 two
Projection physical range difference between circle in vertical direction.
In the calibration facility, it can control line-structured light transmitter 7 and transported with industrial camera 8 along horizontal direction is synchronous
It is dynamic, line-structured light is projected on 9 different height of scaling board, so that the striation print image of each height of scaling board 9 is generated, it will
Line-structured light is projected on scaling board 9, forms striations, and the striations of each height of scaling board 9 is acquired by industrial camera 8
Image;The intersection point pixel coordinate for obtaining striations and pattern on scaling board 9 in every frame striation print image again, then according to pattern pair
The shape of the intersection point pixel coordinate and pattern answered determines the pixel coordinate at pattern preset position, finally by each pattern preset position
The pixel coordinate at the place of setting is associated with the actual height that pattern preset position is in scaling board 9 and is formed incidence relation, so that according to
Pixel on striations to be measured on the pixel coordinate of pixel, incidence relation and scaling board 9 at all pattern preset positions is sat
Mark can obtain the corresponding actual height of pixel on striations to be measured.
Referring to Fig. 2, in the embodiment of the present application the caliberating device of structured light three-dimensional vision structural schematic diagram.
The application second aspect provides a kind of one embodiment of the caliberating device of structured light three-dimensional vision, comprising:
First acquisition unit 201, for obtaining the striation print image of each height of scaling board.
Second acquisition unit 202, for obtaining the intersection point picture of striations and pattern on scaling board in every frame striation print image
Plain coordinate.
Determination unit 203, for determining pattern preset position according to the shape of the corresponding intersection point pixel coordinate of pattern and pattern
Set the pixel coordinate at place.
Associative cell 204, for the pixel coordinate at each pattern preset position to be in calibration with pattern preset position
The actual height of plate is associated with and is formed incidence relation, so that being closed according to the pixel coordinate of pixel, association on striations to be measured
System can obtain the corresponding reality of pixel on striations to be measured with the pixel coordinate at pattern presets all on scaling board position
Border height, wherein striations to be measured is to extract from the striation print image of object to be measured.
Referring to Fig. 3, in the embodiment of the present application the measurement method of structured light three-dimensional vision method flow diagram.
The application third aspect provides a kind of one embodiment of the measurement method of structured light three-dimensional vision, comprising:
Step 301, the striation print image of object to be measured is obtained.
Step 302, the striations in striation print image is extracted.
Step 303, pixel on striations to be measured is obtained according to the pixel coordinate of pixel on striations and calibrating parameters
The corresponding actual height of point, wherein calibrating parameters include that pixel coordinate, pattern on scaling board at all pattern preset positions are pre-
If the pixel coordinate and pattern preset position at position are in the incidence relation between the actual height of scaling board, wherein pattern is pre-
If at position can be the center of pattern, pattern can be circle.
It should be noted that according to calibrating parameters, there are many pixel on the available striations to be measured of method is corresponding
Actual height, such as can specifically include:
First light stripe center is extracted from striations to be measured;
Then for each pixel on light stripe center, determine that Range Profile vegetarian refreshments is adjacent according to the pixel coordinate of pixel
Pixel coordinate on four close scaling boards at pattern preset position, then according to the pixel coordinate and figure at pattern preset position
Case predeterminated position is in the incidence relation between the actual height of scaling board and obtains the corresponding reality of pixel by differential technique
Highly.
It should be noted that the method from extraction light stripe center method includes but is not limited to extremum method and gravity model appoach;Difference
Value method includes a variety of, such as bilinearity differential technique, and neighbor interpolation method etc. is the prior art, so be not detailed herein.
The present embodiment passes through differential technique and can to calculate pixel on striations to be measured according to incidence relation corresponding
Actual height does not need to demarcate optical projection device and video camera, and the calculating of inside and outside parameter and distortion factor is avoided to miss
Difference causes image rectification incomplete, improves the measurement accuracy of structured light three-dimensional vision, and simplifies measurement process.
The application fourth aspect provides a kind of measuring device of structured light three-dimensional vision, comprising:
Third acquiring unit 401, for obtaining the striation print image of object to be measured.
Extraction unit 402, for extracting the striations in striation print image.
4th acquiring unit 403, it is to be measured for being obtained according to the pixel coordinate and calibrating parameters of pixel on striations
The corresponding actual height of pixel on striations, wherein calibrating parameters include the pixel on scaling board at all pattern preset positions
Pixel coordinate at coordinate, pattern preset position is between the actual height of scaling board with pattern preset position is associated with pass
System.
4th acquiring unit 403 can be specifically used for:
Light stripe center is extracted from striations to be measured;
For each pixel on light stripe center, determine that Range Profile vegetarian refreshments is neighbouring according to the pixel coordinate of pixel
Pixel coordinate on four scaling boards at pattern preset position, then according at pattern preset position pixel coordinate and pattern it is pre-
If position is in the incidence relation between the actual height of scaling board and obtains the corresponding actual height of pixel by differential technique.
More than, above embodiments are only to illustrate the technical solution of the application, rather than its limitations;Although referring to aforementioned reality
Example is applied the application is described in detail, those skilled in the art should understand that: it still can be to aforementioned each
Technical solution documented by embodiment is modified or equivalent replacement of some of the technical features;And these are modified
Or replacement, the spirit and scope of each embodiment technical solution of the application that it does not separate the essence of the corresponding technical solution.
Claims (10)
1. a kind of scaling method of structured light three-dimensional vision characterized by comprising
Obtain the striation print image of each height of scaling board;
Obtain the intersection point pixel coordinate of striations and pattern on the scaling board in every frame striation print image;
The pixel coordinate at pattern preset position is determined according to the shape of the corresponding intersection point pixel coordinate of pattern and pattern;
Pixel coordinate at each pattern preset position is associated with the actual height that pattern preset position is in the scaling board
And incidence relation is formed, so that according on striations to be measured on the pixel coordinate of pixel, the incidence relation and scaling board
Pixel coordinate at all pattern preset positions can obtain the corresponding actual height of pixel on the striations to be measured,
Described in striations to be measured be to be extracted from the striation print image of object to be measured.
2. the scaling method of structured light three-dimensional vision according to claim 1, which is characterized in that
It is the center of pattern at the pattern preset position.
3. the scaling method of structured light three-dimensional vision according to claim 1 or 2, which is characterized in that the pattern is circle
Shape.
4. a kind of caliberating device of structured light three-dimensional vision characterized by comprising
First acquisition unit, for obtaining the striation print image of each height of scaling board;
Second acquisition unit, the intersection point pixel for obtaining striations and pattern on the scaling board in every frame striation print image are sat
Mark;
Determination unit, for determining the picture at pattern preset position according to the shape of the corresponding intersection point pixel coordinate of pattern and pattern
Plain coordinate;
Associative cell, for the pixel coordinate at each pattern preset position to be in the scaling board with pattern preset position
Actual height is associated with and is formed incidence relation, so that being closed according to the pixel coordinate of pixel, the association on striations to be measured
It is corresponding that system with the pixel coordinate at pattern presets all on scaling board position can obtain pixel on the striations to be measured
Actual height, wherein the striations to be measured is to extract from the striation print image of object to be measured.
5. a kind of measurement method of structured light three-dimensional vision characterized by comprising
Obtain the striation print image of object to be measured;
Extract the striations in the striation print image;
Pixel pair on the striations to be measured is obtained according to the pixel coordinate of pixel on the striations and calibrating parameters
The actual height answered, wherein the calibrating parameters include that pixel coordinate, pattern on scaling board at all pattern preset positions are pre-
If the pixel coordinate at position and pattern preset position are in the incidence relation between the actual height of the scaling board.
6. the measurement method of structured light three-dimensional vision according to claim 5, which is characterized in that according on the striations
The pixel coordinate and calibrating parameters of pixel obtain the corresponding actual height of pixel on the striations to be measured and specifically include:
Light stripe center is extracted from the striations to be measured;
For each pixel on the light stripe center, determined according to the pixel coordinate of pixel adjacent apart from the pixel
Pixel coordinate on four close scaling boards at pattern preset position, then according to the pixel coordinate and figure at pattern preset position
Case predeterminated position is in the incidence relation between the actual height of the scaling board and obtains the pixel pair by differential technique
The actual height answered.
7. the scaling method of structured light three-dimensional vision according to claim 5, which is characterized in that
It is the center of pattern at the pattern preset position.
8. the scaling method of the structured light three-dimensional vision according to any one of claim 5 to 7, which is characterized in that institute
Pattern is stated as circle.
9. a kind of measuring device of structured light three-dimensional vision characterized by comprising
Third acquiring unit, for obtaining the striation print image of object to be measured;
Extraction unit, for extracting the striations in the striation print image;
4th acquiring unit, it is described to be measured for being obtained according to the pixel coordinate of pixel on the striations and calibrating parameters
The corresponding actual height of pixel on striations, wherein the calibrating parameters include on scaling board at all pattern preset positions
Pixel coordinate and pattern preset position at pixel coordinate, pattern preset position are between the actual height of the scaling board
Incidence relation.
10. the measuring device of structured light three-dimensional vision according to claim 9, which is characterized in that the described 4th obtains list
Member is specifically used for:
Light stripe center is extracted from the striations to be measured;
For each pixel on the light stripe center, determined according to the pixel coordinate of pixel adjacent apart from the pixel
Pixel coordinate on four close scaling boards at pattern preset position, then according to the pixel coordinate and figure at pattern preset position
Case predeterminated position is in the incidence relation between the actual height of the scaling board and obtains the pixel pair by differential technique
The actual height answered.
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WO2021007944A1 (en) * | 2019-07-15 | 2021-01-21 | 南昌欧菲生物识别技术有限公司 | Method for calibrating bracket of 3d structured light module, apparatus, and device |
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Citations (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6101455A (en) * | 1998-05-14 | 2000-08-08 | Davis; Michael S. | Automatic calibration of cameras and structured light sources |
CN101074869A (en) * | 2007-04-27 | 2007-11-21 | 东南大学 | Method for measuring three-dimensional contour based on phase method |
CN101526336A (en) * | 2009-04-20 | 2009-09-09 | 陈炳生 | Calibration method of linear structured light three-dimensional visual sensor based on measuring blocks |
CN101936716A (en) * | 2010-03-23 | 2011-01-05 | 上海复蝶智能科技有限公司 | Contour measuring method |
CN101949693A (en) * | 2010-08-03 | 2011-01-19 | 河北工业大学 | Method for calibrating three-dimensional imaging system |
CN101954557A (en) * | 2009-07-16 | 2011-01-26 | 北京石油化工学院 | Two-dimensional location information extracting method for structured light welding line image tracking |
CN102063718A (en) * | 2010-12-24 | 2011-05-18 | 江南大学 | Field calibration and precision measurement method for spot laser measuring system |
CN102376089A (en) * | 2010-12-09 | 2012-03-14 | 深圳大学 | Target correction method and system |
CN102818523A (en) * | 2012-07-26 | 2012-12-12 | 北京信息科技大学 | Vision measurement method and measurement system of small workpiece |
CN103148865A (en) * | 2013-01-17 | 2013-06-12 | 天津大学 | Camera model standardization method and standardization device |
CN103398660A (en) * | 2013-08-05 | 2013-11-20 | 河北工业大学 | Structured light visual sensor parameter calibration method for acquiring height information of welded joint |
CN104111039A (en) * | 2014-08-08 | 2014-10-22 | 电子科技大学 | Calibrating method for randomly placing fringe projection three-dimensional measuring system |
CN104452556A (en) * | 2014-12-02 | 2015-03-25 | 吉林大学 | Verification system for vehicle-mounted pavement primary crack acquisition system based on line structured light reference |
CN204388802U (en) * | 2015-01-19 | 2015-06-10 | 长春师范大学 | Line-structured light vision system calibration plate |
CN105157604A (en) * | 2015-08-07 | 2015-12-16 | 天津大学 | Rapid calibration method of outfield multi-beam line-structured light vision measuring system |
CN105783773A (en) * | 2016-03-18 | 2016-07-20 | 河北科技大学 | Numerical value calibration method for line structured light vision sensor |
CN105953747A (en) * | 2016-06-07 | 2016-09-21 | 杭州电子科技大学 | Structured light projection full view three-dimensional imaging system and method |
CN106989695A (en) * | 2017-04-28 | 2017-07-28 | 广东工业大学 | A kind of projector calibrating method |
CN107121110A (en) * | 2017-06-12 | 2017-09-01 | 中国科学院长春光学精密机械与物理研究所 | The device and uncalibrated image acquisition method gathered applied to uncalibrated image |
CN107123148A (en) * | 2017-05-09 | 2017-09-01 | 广东工业大学 | A kind of camera parameter scaling method and device |
CN107167073A (en) * | 2017-05-18 | 2017-09-15 | 浙江四点灵机器人股份有限公司 | A kind of three-dimensional rapid measurement device of linear array structure light and its measuring method |
CN206788927U (en) * | 2017-06-05 | 2017-12-22 | 广东理工学院 | A kind of gridiron pattern caliberating device of no color differnece polishing mode |
CN107764205A (en) * | 2017-11-06 | 2018-03-06 | 长安大学 | High-frequency resistance welding (HFRW) seam center three-dimensional detection device and detection method are scanned based on line-structured light |
US20180137637A1 (en) * | 2016-11-15 | 2018-05-17 | Industrial Technology Research Institute | Three-dimensional measurement system and method thereof |
CN108072447A (en) * | 2017-11-23 | 2018-05-25 | 北京环境特性研究所 | A kind of three line target of aviation |
US20180293790A1 (en) * | 2017-03-21 | 2018-10-11 | Michael John Darwin | Method and Apparatus for Measuring 3Dimensional Structures |
-
2018
- 2018-12-19 CN CN201811556616.1A patent/CN109443214B/en not_active Expired - Fee Related
Patent Citations (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6101455A (en) * | 1998-05-14 | 2000-08-08 | Davis; Michael S. | Automatic calibration of cameras and structured light sources |
CN101074869A (en) * | 2007-04-27 | 2007-11-21 | 东南大学 | Method for measuring three-dimensional contour based on phase method |
CN101526336A (en) * | 2009-04-20 | 2009-09-09 | 陈炳生 | Calibration method of linear structured light three-dimensional visual sensor based on measuring blocks |
CN101954557A (en) * | 2009-07-16 | 2011-01-26 | 北京石油化工学院 | Two-dimensional location information extracting method for structured light welding line image tracking |
CN101936716A (en) * | 2010-03-23 | 2011-01-05 | 上海复蝶智能科技有限公司 | Contour measuring method |
CN101949693A (en) * | 2010-08-03 | 2011-01-19 | 河北工业大学 | Method for calibrating three-dimensional imaging system |
CN102376089A (en) * | 2010-12-09 | 2012-03-14 | 深圳大学 | Target correction method and system |
CN102063718A (en) * | 2010-12-24 | 2011-05-18 | 江南大学 | Field calibration and precision measurement method for spot laser measuring system |
CN102818523A (en) * | 2012-07-26 | 2012-12-12 | 北京信息科技大学 | Vision measurement method and measurement system of small workpiece |
CN103148865A (en) * | 2013-01-17 | 2013-06-12 | 天津大学 | Camera model standardization method and standardization device |
CN103398660A (en) * | 2013-08-05 | 2013-11-20 | 河北工业大学 | Structured light visual sensor parameter calibration method for acquiring height information of welded joint |
CN104111039A (en) * | 2014-08-08 | 2014-10-22 | 电子科技大学 | Calibrating method for randomly placing fringe projection three-dimensional measuring system |
CN104452556A (en) * | 2014-12-02 | 2015-03-25 | 吉林大学 | Verification system for vehicle-mounted pavement primary crack acquisition system based on line structured light reference |
CN204388802U (en) * | 2015-01-19 | 2015-06-10 | 长春师范大学 | Line-structured light vision system calibration plate |
CN105157604A (en) * | 2015-08-07 | 2015-12-16 | 天津大学 | Rapid calibration method of outfield multi-beam line-structured light vision measuring system |
CN105783773A (en) * | 2016-03-18 | 2016-07-20 | 河北科技大学 | Numerical value calibration method for line structured light vision sensor |
CN105953747A (en) * | 2016-06-07 | 2016-09-21 | 杭州电子科技大学 | Structured light projection full view three-dimensional imaging system and method |
US20180137637A1 (en) * | 2016-11-15 | 2018-05-17 | Industrial Technology Research Institute | Three-dimensional measurement system and method thereof |
US20180293790A1 (en) * | 2017-03-21 | 2018-10-11 | Michael John Darwin | Method and Apparatus for Measuring 3Dimensional Structures |
CN106989695A (en) * | 2017-04-28 | 2017-07-28 | 广东工业大学 | A kind of projector calibrating method |
CN107123148A (en) * | 2017-05-09 | 2017-09-01 | 广东工业大学 | A kind of camera parameter scaling method and device |
CN107167073A (en) * | 2017-05-18 | 2017-09-15 | 浙江四点灵机器人股份有限公司 | A kind of three-dimensional rapid measurement device of linear array structure light and its measuring method |
CN206788927U (en) * | 2017-06-05 | 2017-12-22 | 广东理工学院 | A kind of gridiron pattern caliberating device of no color differnece polishing mode |
CN107121110A (en) * | 2017-06-12 | 2017-09-01 | 中国科学院长春光学精密机械与物理研究所 | The device and uncalibrated image acquisition method gathered applied to uncalibrated image |
CN107764205A (en) * | 2017-11-06 | 2018-03-06 | 长安大学 | High-frequency resistance welding (HFRW) seam center three-dimensional detection device and detection method are scanned based on line-structured light |
CN108072447A (en) * | 2017-11-23 | 2018-05-25 | 北京环境特性研究所 | A kind of three line target of aviation |
Non-Patent Citations (4)
Title |
---|
LIU SIYUAN等: "Research on 3D measurement model by line structure light vision", 《EURASIP JOURNAL ON IMAGE AND VIDEO PROCESSING》 * |
XU JING等: "A simple calibration method for structured light-based 3D profile measurement", 《OPTICS AND LASER TECHNOLOGY》 * |
徐光祐等: "一种新的基于结构光的三维视觉系统标定方法", 《计算机学报》 * |
杨雪荣等: "三坐标测量机与线结构光传感器集成系统的测量模型", 《中国机械工程》 * |
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CN111288928A (en) * | 2020-03-12 | 2020-06-16 | 华侨大学 | Object surface three-dimensional topography feature measuring method, device, equipment and storage medium |
CN111536904A (en) * | 2020-05-27 | 2020-08-14 | 深圳市华汉伟业科技有限公司 | Three-dimensional measurement method and system based on structural illumination and storage medium |
CN111536904B (en) * | 2020-05-27 | 2022-04-15 | 深圳市华汉伟业科技有限公司 | Three-dimensional measurement method and system based on structural illumination and storage medium |
WO2021253940A1 (en) * | 2020-06-19 | 2021-12-23 | Zhejiang Huaray Technology Co., Ltd. | Systems and methods for object measurement |
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