CN107167073A - A kind of three-dimensional rapid measurement device of linear array structure light and its measuring method - Google Patents
A kind of three-dimensional rapid measurement device of linear array structure light and its measuring method Download PDFInfo
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- CN107167073A CN107167073A CN201710357337.1A CN201710357337A CN107167073A CN 107167073 A CN107167073 A CN 107167073A CN 201710357337 A CN201710357337 A CN 201710357337A CN 107167073 A CN107167073 A CN 107167073A
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- linear array
- image
- structure light
- array structure
- height
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
- G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
Abstract
The invention discloses a kind of three-dimensional rapid measurement device of linear array structure light and its measuring method, the present invention passes through the principle with linear array structure light and inquiry table, simple and efficient completion object surface tri-dimensional profile measurement.The intrinsic parameter and distortion parameter of camera are obtained first with traditional scaling method；The linear array structure light image of different spaces height is gathered again, and distortion correction is carried out to image using calibrating parameters；Then the corresponding relation of every laser rays image coordinate location and height is obtained using interpolation calculation, corresponding retrieval table is generated and preserves；Inquiry table only needs to generation once, keeps camera and light source relative position constant, then when measuring other objects, it is only necessary to object under test is placed on datum plane, image of the linear array structure light on its surface is obtained using image acquisition device；The image coordinate of laser rays is drawn using image procossing, the retrieval table before directly searching can be obtained by the depth information of laser rays；And then the quick three-D profile for restoring object.
Description
Technical field
The present invention relates to three-dimensional values, three-dimensionalreconstruction field, the side that particularly a kind of linear array structure light three-dimensional is quickly measured
Method.
Background technology
Three-dimensional measurement technology is a kind of technology for obtaining object under test surface each point space coordinate.Threedimensional model is anti-well
The real topography of object is reflected, quick three-dimensional e measurement technology is in necks such as many military affairs, historical relic, medical science, education, industrial detections
Domain suffers from huge application prospect.
Three-dimensional measurement technology is long-standing, and technology has reached its maturity.Conventional method for three-dimensional measurement difference contact and
Contactless, contact type measurement, which represents technology, mainly CMM (three coordinate measuring machine), tomoscan and chromatography etc..Its advantage
It is that precision is of a relatively high, but helpless to some non-contact surfaces, and is only suitable for measuring more small-sized object and field
Scape, for the three-dimensional measurement of large scene, its measuring speed is slower.Non-contact measurement has：1. binocular stereo vision method：Based on regarding
Poor principle.By shooting the two images of testee in diverse location, and calculate by way of Digital Image Processing image
Position between pixel and object corresponding points, so as to obtain body surface three-dimensional information；2. time-of-flight method：By launching
One laser pulse signal, by receiving the pulse signal that body surface is reflected, calculates the time difference of reception, just may be used
To obtain physics to the distance of measuring instrument；3. phase measuring profilometer：One kind of Structure light method, its principle is by projection
Several have the stripe grating of certain phase difference to body surface, and phase is calculated by the grating fringe figure of deformation, is finally led to
Cross the mapping relations of phase and height and be distributed to obtain the height of object, and then realize the three-dimensional reconstruction of object；4. laser rays is swept
Retouch：Using principle of triangulation, a horizontal laser light line is projected, object under test is uniformly moved, laser rays is passed through object
Surface, so as to measure the surface tri-dimensional profile for obtaining object.
Being combined with look-up table with linear array structure light does not occur also in prior art, simple and efficient completion body surface three-dimensional
The method of profile measurement, the problem of present invention solves such.
The content of the invention
To solve the deficiencies in the prior art, it is an object of the invention to provide a kind of three-dimensional quick measurement dress of linear array structure light
Put and its measuring method, the present invention passes through the principle with linear array structure light and look-up table, simple and efficient completion body surface
Measuring three-dimensional profile.
In order to realize above-mentioned target, the present invention is adopted the following technical scheme that：
A kind of three-dimensional rapid measurement device of linear array structure light, including：Place the datum plane of object under test, IMAQ
Device, the chessboard calibration plate demarcated to image acquisition device, the linear array structure light being placed on datum plane.
A kind of three-dimensional rapid measurement device of foregoing linear array structure light, linear array structure light is produced by linear array diode laser.
A kind of three-dimensional rapid measurement device of foregoing linear array structure light, linear array structure light is to be given birth to by projecting apparatus as light source
Into projected image.
A kind of three-dimensional rapid measurement device of foregoing linear array structure light, linear array structure light is the diffraction pattern generated by grating
Picture.
A kind of three-dimensional rapid measurement device of foregoing linear array structure light, image acquisition device is monocular camera.
A kind of three-dimensional rapid measurement device of foregoing linear array structure light, axis and the linear array laser of image acquisition device occur
Angular range between the light source line of device arrives 180 degree for 0.
A kind of three-dimensional rapid measurement device of foregoing linear array structure light, the angle between the axis of camera and light source line is
90 degree.
A kind of three-dimensional method for fast measuring of foregoing linear array structure light, including：Following steps：
Step one：Image acquisition device is demarcated using chessboard calibration plate, image acquisition device is obtained using calibration algorithm
Obtain the Intrinsic Matrix of image acquisition device, radial distortion parameter k1, k2, k3, tangential distortion parameter p1, p2 and image acquisition device
Relative to the outer parameter of plane to be measured, i.e. rotating vector and translation vector；
Step 2：Image acquisition device and array laser generator are fixed respectively using mechanical fastening system；
Step 3：Array laser line is projected into datum plane, the height of datum plane at least one times is improved, image is gathered
And record corresponding height value；
Step 4：The position for fitting every laser rays using interpolation method is generated corresponding with the relation of height change
Retrieval table and preserve；Assuming that the coordinate that certain is put on height h1 plane light is (x1, y1), its correspondence
Height h2 coordinate be (x2, y2), it is assumed that light along the x-axis direction, using interpolation method can obtain pixel sit
The relation of mark and height：
According to the formula, can by y1, between y2, all points are fitted comes, and generate corresponding inquiry table and preserve
Get up.
Step 5：Object is placed on the plane that altitude datum is 0, the linear array light of its plane is gathered by image acquisition device,
Image procossing is carried out to the picture collected, the position for extracting laser rays obtains surface laser line coordinates (x1, y1), according to relation
Table W, goes to search (x1, y1) corresponding height h, and then restore the three-D profile of object；
The method of image procossing is specially：A) pending image, and the distortion of correction chart picture are opened；B) gray-scale map is generated
Picture, and carry out the pretreatment such as smothing filtering, Gauss denoising, opening operation, closed operation；C) thresholding is carried out to gray level image；D) look into
The position of laser rays is looked for, the centre coordinate of laser rays is determined using gravity model appoach；
Relation table W manufacturing process is：
A) datum plane is determined, its spatial altitude regards 0 as, gathers the linear array images of this plane, after image procossing
To the coordinate position (x, y) of laser rays；
B) datum plane is risen into h height, same collection linear array images are simultaneously handled, gone out using interpolation calculation in height
In the range of 0 to h, the relation of light coordinate and spatial altitude H；
C) plane is risen to h height, in the range of similarly obtaining h to 2h, the relation of light coordinate and spatial altitude H again；
D), in the successive range that just can obtain 0 to H, light coordinate with spatial height variations relation table W
(x, y, h), the table is saved.
The present invention is advantageous in that：The present invention provides a kind of three-dimensional rapid measurement device of linear array structure light and its measurement
Method, the present invention is surveyed by the principle with linear array structure light and inquiry table, simple and efficient completion object surface tri-dimensional profile
Amount.The intrinsic parameter and distortion parameter of camera are obtained first with traditional scaling method；The linear array knot of different spaces height is gathered again
Structure light image, distortion correction is carried out using calibrating parameters to image；Then every laser line image seat is obtained using interpolation calculation
The corresponding relation of cursor position and height, generates corresponding retrieval table and preserves；Inquiry table only need to generation once, keep camera and
Light source relative position is constant, then when measuring other objects, it is only necessary to object under test is placed on datum plane, image acquisition device is utilized
Obtain image of the linear array structure light on its surface；The image coordinate of laser rays is drawn using image procossing, before directly searching
Retrieval table can be obtained by the depth information of laser rays；And then the quick three-D profile for restoring object.
Brief description of the drawings
Fig. 1 is a kind of structural representation of embodiment of the present invention；
Fig. 2 is the schematic diagram that the present invention makes relation table W；
The implication of reference in figure：
When h is the plane of collection different height, the distance risen every time；, H is the final height of plane after repeatedly rising.
Embodiment
Make specific introduce to the present invention below in conjunction with the drawings and specific embodiments.
A kind of three-dimensional rapid measurement device of linear array structure light, including：Place the datum plane of object under test, IMAQ
Device, the chessboard calibration plate demarcated to image acquisition device, the linear array structure light being placed on datum plane.As a preferred embodiment,
Image acquisition device is monocular camera, and the Pixel size minimum 5um of camera is required during measurement accuracy 0.2mm, when required precision is higher,
Pixel needs smaller.
As a kind of embodiment, linear array structure light is produced by linear array diode laser；Linear array structure light can also be by throwing
The projected image that shadow instrument is generated as light source；Linear array structure light can also be the diffraction image generated by grating.
Angular range between the axis of image acquisition device and the light source line of linear array laser generator arrives 180 degree for 0；Angle
Its smaller depth survey scope of degree is smaller, and angle is bigger, and depth survey scope is bigger, and for measurement accuracy, angle is closer to nine
Ten degree, measurement accuracy is higher.As a preferred embodiment, the angle between the axis of camera and light source line is 90 degree.
A kind of three-dimensional method for fast measuring of linear array structure light, including：Following steps：
Step one：Image acquisition device is demarcated using chessboard calibration plate, image acquisition device is obtained using calibration algorithm
Obtain the Intrinsic Matrix of image acquisition device, radial distortion parameter k1, k2, k3, tangential distortion parameter p1, p2 and image acquisition device
Relative to the outer parameter of plane to be measured, i.e. rotating vector and translation vector；
Step 2：Image acquisition device and array laser generator are fixed respectively using mechanical fastening system；
Step 3：Array laser line is projected into datum plane, the height of datum plane at least one times is improved, image is gathered
And record corresponding height value；
Step 4：The position for fitting every laser rays using interpolation method generates corresponding inspection with the relation of height change
Rope table is simultaneously preserved；Assuming that the coordinate that certain is put on height h1 plane light is (x1, y1), its corresponding height h2 coordinate is
(x2, y2), it is assumed that light along the x-axis direction, the relation of pixel coordinate and height can be obtained using interpolation method：
According to the formula, can by y1, between y2, all points are fitted comes, and generate corresponding inquiry table and save.
Step 5：Object is placed on the plane that altitude datum is 0, the linear array light of its plane is gathered by image acquisition device,
Image procossing is carried out to the picture collected, the position for extracting laser rays obtains surface laser line coordinates (x1, y1), according to relation
Table W, goes to search (x1, y1) corresponding height h, and then restore the three-D profile of object；
The method of image procossing is specially：A) pending image, and the distortion of correction chart picture are opened；B) gray-scale map is generated
Picture, and carry out the pretreatment such as smothing filtering, Gauss denoising, opening operation, closed operation；C) thresholding is carried out to gray level image；D) look into
The position of laser rays is looked for, the centre coordinate of laser rays is determined using gravity model appoach；
Relation table W manufacturing process is：
A) datum plane is determined, its spatial altitude regards 0 as, gathers the linear array images of this plane, after image procossing
To the coordinate position (x, y) of laser rays；
B) datum plane is risen into h height, same collection linear array images are simultaneously handled, gone out using interpolation calculation in height
In the range of 0 to h, the relation of light coordinate and spatial altitude H；
C) plane is risen to h height, in the range of similarly obtaining h to 2h, the relation of light coordinate and spatial altitude H again；
D), in the successive range that just can obtain 0 to H, light coordinate with spatial height variations relation table W
(x, y, h), the table is saved.
Inquiry table only needs to generation once, keeps camera and light source relative position constant, then when measuring other objects, can be with
The method measured using quick three-dimensional：
Build after inquiry table, the relative position of camera and linear array structure light keeps constant, places object under test, gathers it
The linear array structure light image on surface, image procossing obtains surface laser line point coordinates (x, y), according to the relation table preserved before
Or inquiry table W is, go to search (x, y) corresponding height h, three-dimensional surface is carried out also finally according to a series of D coordinates value
It is former.
The present invention provides a kind of three-dimensional rapid measurement device of linear array structure light and its measuring method, and the present invention is by using line
The principle of battle array structure light and inquiry table, simple and efficient completion object surface tri-dimensional profile measurement.First with traditional demarcation side
Method obtains the intrinsic parameter and distortion parameter of camera；The linear array structure light image of different spaces height is gathered again, utilizes calibrating parameters
Distortion correction is carried out to image；Then the correspondence for obtaining every laser rays image coordinate location and height using interpolation calculation is closed
System, generates corresponding retrieval table and preserves；Inquiry table only needs to generation once, keeps camera and light source relative position constant, then
When measuring other objects, it is only necessary to which object under test is placed on into datum plane, linear array structure light is obtained at it using image acquisition device
The image on surface；The image coordinate of laser rays is drawn using image procossing, the retrieval table before directly searching can be obtained by sharp
The depth information of light；And then the quick three-D profile for restoring object.
The basic principles, principal features and advantages of the present invention have been shown and described above.The technical staff of the industry should
Understand, the invention is not limited in any way for above-described embodiment, it is all to be obtained by the way of equivalent substitution or equivalent transformation
Technical scheme, all falls within protection scope of the present invention.
Claims (8)
1. a kind of three-dimensional rapid measurement device of linear array structure light, it is characterised in that including：The datum plane of object under test is placed,
Image acquisition device, the chessboard calibration plate demarcated to image acquisition device, the linear array structure light being placed in said reference plane.
2. a kind of three-dimensional rapid measurement device of linear array structure light according to claim 1, it is characterised in that above-mentioned linear array knot
Structure light is produced by linear array diode laser.
3. a kind of three-dimensional rapid measurement device of linear array structure light according to claim 1, it is characterised in that above-mentioned linear array knot
Structure light is the projected image generated by projecting apparatus as light source.
4. a kind of three-dimensional rapid measurement device of linear array structure light according to claim 1, it is characterised in that above-mentioned linear array knot
Structure light is the diffraction image generated by grating.
5. the three-dimensional rapid measurement device of a kind of linear array structure light according to claim 1, it is characterised in that above-mentioned image is adopted
Storage is monocular camera.
6. the three-dimensional rapid measurement device of a kind of linear array structure light according to claim 1, it is characterised in that above-mentioned image is adopted
Angular range between the axis of storage and the light source line of linear array laser generator arrives 180 degree for 0.
7. a kind of three-dimensional rapid measurement device of linear array structure light according to claim 6, it is characterised in that the axis of camera
Angle between line and light source line is 90 degree.
8. the three-dimensional method for fast measuring of a kind of linear array structure light according to claim 1, it is characterised in that including：It is as follows
Step：
Step one：Image acquisition device is demarcated using chessboard calibration plate, obtaining image acquisition device using calibration algorithm obtains
The Intrinsic Matrix of image acquisition device, radial distortion parameter k1, k2, k3, tangential distortion parameter p1, p2 and image acquisition device are relative
In the outer parameter of plane to be measured, i.e. rotating vector and translation vector；
Step 2：Image acquisition device and array laser generator are fixed respectively using mechanical fastening system；
Step 3：Array laser line is projected into datum plane, the height of datum plane at least one times is improved, image is gathered and remembers
Picture recording answers height value；
Step 4：The position for fitting every laser rays using interpolation method generates corresponding retrieval table with the relation of height change
And preserve；Assuming that the coordinate that certain is put on height h1 plane light is (x1, y1), its corresponding height h2 coordinate for (x2,
Y2), it is assumed that light along the x-axis direction, the relation of pixel coordinate and height can be obtained using interpolation method：
According to the formula, can by y1, between y2, all points are fitted comes, and generate corresponding inquiry table and save.
Step 5：Object is placed on the plane that altitude datum is 0, the linear array light of its plane is gathered by image acquisition device, to adopting
The picture collected carries out image procossing, and the position for extracting laser rays obtains surface laser line coordinates (x1, y1), according to relation table W,
Go to search (x1, y1) corresponding height h, and then restore the three-D profile of object；
The method of image procossing is specially：A) pending image, and the distortion of correction chart picture are opened；B) gray level image is generated,
And carry out the pretreatment such as smothing filtering, Gauss denoising, opening operation, closed operation；C) thresholding is carried out to gray level image；D) search and swash
The position of light, the centre coordinate of laser rays is determined using gravity model appoach；
Relation table W manufacturing process is：
A) datum plane is determined, its spatial altitude regards 0 as, gathers the linear array images of this plane, swashed after image procossing
The coordinate position (x, y) of light；
B) datum plane is risen into h height, same collection linear array images are simultaneously handled, gone out using interpolation calculation and arrive h in height 0
In the range of, the relation of light coordinate and spatial altitude H；
C) plane is risen to h height, in the range of similarly obtaining h to 2h, the relation of light coordinate and spatial altitude H again；
D), in the successive range that just can obtain 0 to H, light coordinate with spatial height variations relation table W (x, y,
H), the table is saved.
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| CN107655536A (en) * | 2017-10-24 | 2018-02-02 | 浙江华睿科技有限公司 | A kind of object volume measuring system and method |
| CN108629840A (en) * | 2018-05-10 | 2018-10-09 | 苏州大学 | A kind of method, apparatus and equipment for establishing LOGO three-D profiles |
| CN109443214A (en) * | 2018-12-19 | 2019-03-08 | 广东工业大学 | A kind of scaling method of structured light three-dimensional vision, device and measurement method, device |
| CN109751973A (en) * | 2017-11-01 | 2019-05-14 | 欧姆龙株式会社 | Three-dimensional measuring apparatus, method for three-dimensional measurement and storage medium |
| CN109813718A (en) * | 2018-12-30 | 2019-05-28 | 江苏四点灵机器人有限公司 | A kind of LED chip module defect detecting device and method |
| CN111090103A (en) * | 2019-12-25 | 2020-05-01 | 河海大学 | Three-dimensional imaging device and method for dynamically and finely detecting underwater small target |
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| CN112147625A (en) * | 2020-09-22 | 2020-12-29 | 深圳市道通科技股份有限公司 | Calibration method and device, monocular laser measuring equipment and calibration system |
| CN112504126A (en) * | 2020-12-14 | 2021-03-16 | 国科光芯(海宁)科技股份有限公司 | Three-dimensional scanning distance measuring device and method |
| CN112964178A (en) * | 2021-02-07 | 2021-06-15 | 佛山科学技术学院 | Amorphous strip transmission position measuring method and device |
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| WO2022143796A1 (en) * | 2020-12-29 | 2022-07-07 | 杭州海康机器人技术有限公司 | Calibration method and calibration device for line structured light measurement system, and system |
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| CN107655536B (en) * | 2017-10-24 | 2019-09-17 | 浙江华睿科技有限公司 | A kind of object volume measuring system and method |
| CN109751973B (en) * | 2017-11-01 | 2020-12-11 | 欧姆龙株式会社 | Three-dimensional measuring device, three-dimensional measuring method, and storage medium |
| CN109751973A (en) * | 2017-11-01 | 2019-05-14 | 欧姆龙株式会社 | Three-dimensional measuring apparatus, method for three-dimensional measurement and storage medium |
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| CN109813718A (en) * | 2018-12-30 | 2019-05-28 | 江苏四点灵机器人有限公司 | A kind of LED chip module defect detecting device and method |
| CN111090103A (en) * | 2019-12-25 | 2020-05-01 | 河海大学 | Three-dimensional imaging device and method for dynamically and finely detecting underwater small target |
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| CN112147625A (en) * | 2020-09-22 | 2020-12-29 | 深圳市道通科技股份有限公司 | Calibration method and device, monocular laser measuring equipment and calibration system |
| CN112147625B (en) * | 2020-09-22 | 2024-03-01 | 深圳市道通科技股份有限公司 | Calibration method, device, monocular laser measurement equipment and calibration system |
| CN114383499A (en) * | 2020-10-21 | 2022-04-22 | 南京牧镭激光科技有限公司 | Method for measuring ceramic tile in full size by adopting laser linear array means |
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| CN114620091A (en) * | 2022-04-11 | 2022-06-14 | 南京拓控信息科技股份有限公司 | Train wheel out-of-roundness detection method based on three-dimensional information |
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