CN109414232A - For carrying out the device of x-ray imaging to object - Google Patents
For carrying out the device of x-ray imaging to object Download PDFInfo
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- CN109414232A CN109414232A CN201780021013.9A CN201780021013A CN109414232A CN 109414232 A CN109414232 A CN 109414232A CN 201780021013 A CN201780021013 A CN 201780021013A CN 109414232 A CN109414232 A CN 109414232A
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Abstract
The device (10) that the present invention relates to a kind of for object to be imaged.It describes and positions (210) X-ray detector relative at least one x-ray source, so that region between at least one described x-ray source and the X-ray detector is at least partly inspection area for accommodating object.In the first mode of operation, utilize at least one described x-ray source, generate (220) first focal spots, so that at least some first X-rays generated at first focal spot pass through the first grating of interferometer arrangement, and at least some first X-rays is made to pass through the second grating of interferometer arrangement, first grating is positioned at first position, and second grating is positioned in the second place.In the first operator scheme, at least some first X-rays detect (230) using the X-ray detector at detector position.In this second mode of operation, using at least one described x-ray source, (240) second focal spots are generated, so that at least some second X-rays generated at second focal spot avoid first grating at the first position.In the second operator scheme, at least some second X-rays detect (250) using the X-ray detector at the detector position.
Description
Technical field
The present invention relates to the devices for carrying out x-ray imaging to object, the system for carrying out x-ray imaging to object
With the method and computer program element and computer-readable medium for carrying out x-ray imaging to object.
Background technique
In addition to decaying imaging, differential phase comparison imaging and dark-field imaging (DPCI and DFI) are will likely to add additionally
Diagnostic value promising technology, such as mammogram or for the preclinical applications about toy.Conventional X
Radiographic source can be used together with Talbot-Lau interferometer with customary X-ray detectors.However, do not need wherein DPCI and
In the task class of DFI, interferometer is moved to the outside of beamline.This is troublesome, and when needing DPCI and DFI again
It can result in misalignment issues when interferometer is moved back into again.
US2007/0183559A1 discloses X-ray CT system and is used to generate tomography phase-contrast and absorption image,
Wherein, it is accordingly used in the pattern displacement of phase-contrast.
Summary of the invention
With for combining the improved technology for providing normal attenuation image offer dark field and/or phase contrast image will
It is advantageous.
Target exploitation subject matter of the independent claims of the invention solve, wherein other embodiments are comprised in appurtenance
During benefit requires.It should be noted that aspect discussed below of the invention is further adapted for the dress for carrying out x-ray imaging to object
It sets, for the system to object progress x-ray imaging and method and the calculating for carrying out x-ray imaging to object
Machine program unit and the computer-readable medium.
According in a first aspect, providing a kind of for carrying out the device of x-ray imaging to object, comprising:
At least one x-ray source；
X-ray interferometer arrangement；And
X-ray detector.
The X-ray detector is configured as being positioned relative at least one described x-ray source, so that described at least one
At least part in the region between a x-ray source and the X-ray detector is the inspection area for accommodating object.It is described
X-ray interferometer arrangement includes the first grating and the second grating.In the first mode of operation, at least one described x-ray source quilt
It is configured to generate the first focal spot.At least one described x-ray source is configured as generating X-ray, so that at first focal spot
At least some first X-rays generated pass through first grating at first position and pass through described the of the second place
Two gratings.The X-ray detector at detector position is configured as detecting at least some first X-rays.Second
In operation mode, at least one described x-ray source is configured as generating the second focal spot.At least one described x-ray source is configured
To generate X-ray, so that at least some second X-rays generated at second focal spot avoid the institute at the first position
State the first grating.The X-ray detector at detector position is configured as detecting at least some second X-rays.
In other words, using the first focal spot, X-ray can be sent through object and pass through interferometer and arrange and by visiting
It surveys device detection and compares imaging (DPCI) and/or dark-field imaging (DFI) in order to provide differential phase.Then, additional focal spot is provided,
It can pass through electronics or magnetic devices (mesh switch or magnetic deflection of such as electron beam) or any combination thereof electronics
Ground switching at different positions generate X-radiation, allow X-ray by object send and at identical position by
Detector detection, and X-ray avoids the interferometer arrangement in the case where not requiring the movement of at least one grating
At least one of the grating.This makes it possible to be switched to normal attenuation operation mode from DPCI/DFI operation mode, and
Movement without at least one grating is required that this is switched by the electronics that focal spot operates and is promoted.
In this way, when first grating should not be switched to attenuation operations mode from DPCI/DFI operation mode
When mobile, mechanical simplicity is provided.
In other words, at least one described grating should not DPCI/DFI function opportunity in "off" X-ray apparatus
Tool it is mobile.
In this way, by electronically switching focal spot position, at least one optical grating construction is bypassed, this makes the dress
It sets and is able to use the single detector of fixed position from DPCI/DFI pattern switching.
In example, first grating at the first position is positioned in the inspection area and first coke
Between spot.
In this way, provide mechanical simplicity, wherein for first grating movement in the inspection area
The source do not require mechanical shifting mechanism.This discharges the space of the side of the inspection area.In addition, described by having
First grating of the side of inspection area, if second focal spot need not be spaced far apart so as to institute with first focal spot
It states the first grating and then avoids first grating in the distal side of the inspection area.Extraly or alternatively, the first diffraction light
Grid can be bigger, can be its distal side for whether being positioned in the inspection area.
In example, in the second operator scheme, at least some second X-rays avoid the second place
Second grating.
In this way, mechanical simplicity in addition is provided, because of both the first diffraction grating and the second diffraction grating
It need not all be moved when being switched to attenuation operations mode from such as DPCI/DFI operation mode.
In example, second grating of the second place is positioned in described first at the first position
Between grating and the inspection area.
In this way, provide mechanical simplicity, wherein for grating movement the inspection area source not
It is required that mechanical shifting mechanism.When not requiring mobile mechanism, the space of the side of this release inspection area.In addition, by having
Second grating of the side of the inspection area, second focal spot need not be spaced far apart to avoid with first focal spot
State the first grating and the second grating.Extraly or alternatively, second diffraction grating can be bigger, can be it
Whether the distal side of the inspection area is positioned in.
In example, in the second operator scheme, second grating is configured as being positioned in except described second
At position except position, and wherein, at least some second X-rays generated at second focal spot are avoided except institute
State second grating at the position except the second position.
In other words, in the second operator scheme, second grating is moved out the access so that X-ray is not worn
It crosses it and then described device can operate in normal attenuation mode.
Therefore, switch with the electronics of the position of the mobile combined focal spot of a grating so that the mode of described device is subtracting
Change from such as DPCI/DFI to evanescent mode in the case where few mechanical complexity, because of at least one described grating and described
Detector does not move.
In example, the X-ray interferometer arrangement includes third grating.In the first operator scheme, described
At least some X-rays generated at first focal spot pass through the third grating at the third place.In second operation
In mode, the third grating is configured as at the position being positioned in addition to the third place, and wherein, described
In second operator scheme, at least some second X-rays generated at second focal spot are avoided except the third place
Except the position at the third grating.
Therefore, switch with the electronics of the position of the mobile combined focal spot of a grating so that described device is for example can be with
It operates and is then switched in the case where the mechanical complexity of reduction using in the DPCI/DFI mode of incoherent source operation
To evanescent mode, because the only one grating of the arrangement is required to move.
In example, in the first operator scheme, at least one described x-ray source is configured as except described first
Third focal spot is generated at position except the position of focal spot.At least one described x-ray source is configured, so that described
At least some third X-rays generated at three focal spots pass through first grating at the first position and pass through described the
Second grating at two positions.The X-ray detector at detector position is configured as detecting described at least some
Third X-ray.
In this way, when described device for example operates in DPCI/DFI operation mode, the view of described device
Field can increase in one direction.
In example, in the first operator scheme, at least one described x-ray source is configured as except described first
The 4th is generated at position except the position of focal spot and at the position in addition to the position of the third focal spot
Focal spot.At least one described x-ray source is configured, so that at least some 4th X generated at the 4th focal spot are penetrated
Line passes through first grating at the first position and passes through second grating of the second place.Detector
The X-ray detector at position is configured as detecting at least some 4th X-rays.Institute's rheme of first focal spot
Set the position of the axis and first focal spot between the position of the third focal spot and the institute of the 4th focal spot
Rheme set between axis is orthogonal or the institute between the position of first focal spot and the position of the third focal spot
The axis stated between axis and the position of the third focal spot and the position of the 4th focal spot is orthogonal.
In this way, when described device operates in DPCI/DFI operation mode, the visual field of described device can
To increase in two directions.
In example, at least one described x-ray source includes two X-ray tubes.
In this way, the different focal spots at different positions can be generated effectively and efficiently.
In example, at least one described x-ray source is configured as generating X-ray in the first operator scheme,
Pass through the different spectral characterizations of x-ray photon energy to the X-ray generated in the second operator scheme.
In other words, the X-ray emitted from first focal spot and other focal spots generated in the first operator scheme
The X-ray spectrum penetrated with the X emitted from second focal spot and other focal spots generated in the second operator scheme
The X-ray spectrum of line is different.
Advantage is discussed below: the current interferometer with " coarse " optical grating construction causes to utilize short wavelength's (high photon energy
Amount and tube voltage) the difficulty and being limited to of X-ray utilize such as the tube voltage of 80kV operates, however, for decaying
For imaging, when being worked using harder X-ray (such as in 120kV tube voltage) for specific clinical investigation
It is efficient to can be most dosage.Therefore, at least one described x-ray source is configured as to solve which of this point and generate not
Same X-ray spectrum.
In example, at least one described x-ray source is configured as generating X-ray in the first operator scheme,
Pass through different focal spot point spread function characterization to the X-ray generated in the second operator scheme.
In other words, changing focal spot characteristic relative to the rated power of the spatial image resolution of realization and two focal spots can
To be beneficial.Electron current density in the focal spot can be different, and the sky of the X-ray is generated using it
Between intensity distribution.In other words, the point spread function of the focal spot can be different.For example, using for DPCI and DFI
Than smaller focal spot is imaged for decaying so as to the visibility for enhancing for the operation mode can be it is optimal.Give tough cause spoke
The limited electrical power density in the focal spot on the anode in source is penetrated, is used on the contrary in another situation bigger for DPCI and DFI
Focal spot can be more useful with enhancing the x-ray flux.When some absorption photons in the grating, the coke is come from
The larger input of the initial X-ray of spot can avoid photon starvation at the detector and too high in described image is made an uproar
Sound is horizontal.
In second aspect, a kind of system for carrying out x-ray imaging to object is provided, comprising:
According to the device for object to be imaged of first aspect；
Processing unit；And
Output unit.
The processing unit is configured as control described device, and is configured as controlling the output unit.The X is penetrated
Line detector is configured as providing data related with the detection of X-ray to the processing unit.The output unit quilt
It is configured as output to indicate the data of the object.
In example, the output data includes attenuation data and/or phase-contrast data and/or dark field data.
In a third aspect, a kind of method for carrying out x-ray imaging to object is provided, comprising:
X-ray detector is positioned relative at least one x-ray source, so that at least one described x-ray source and the X
At least part in the region between ray detector is the inspection area for accommodating object；
In the first mode of operation, the first focal spot is generated using at least one described x-ray source, so that described first
At least some first X-rays generated at focal spot pass through the first grating of interferometer arrangement, and make described at least some the
One X-ray passes through the second grating of interferometer arrangement, and first grating is positioned at first position, second light
Grid are positioned in the second place；
In the first operator scheme, described at least one is detected using the X-ray detector at detector position
A little first X-rays；
In this second mode of operation, the second focal spot is generated using at least one described x-ray source, so that described second
At least some second X-rays generated at focal spot avoid first grating at the first position；And
It is described extremely using the X-ray detector detection at the detector position in the second operator scheme
Few some second X-rays.
The computer program element of control device as described in previously is provided according to another aspect, described
The method and step as described in previously is adapted for carrying out when computer program element is run by processing unit.
The computer-readable medium for having stored the computer components as described in previously is provided according to another aspect,.
Advantageously, the benefit as provided by any of the above and example is equally applicable to every other aspect
And example, and vice versa.
The above and example will be apparent from the embodiment being described below and illustrated.
Detailed description of the invention
Exemplary embodiment will be described below with reference to the following drawings:
- Fig. 1 shows the example of the device for carrying out x-ray imaging to object；
Fig. 2 shows the examples of the system for carrying out x-ray imaging to object；
- Fig. 3 shows the example of the method for carrying out x-ray imaging to object；
- Fig. 4 shows schematically showing for the Talbot-Lau interferometer for DPCI and DFI；
- Fig. 5 shows the example of the device for carrying out x-ray imaging to object in an operation mode；And
- Fig. 6 shows the example of the device of Fig. 5 in another operating mode.
Specific embodiment
Fig. 1 shows the device 10 for carrying out x-ray imaging to object.Device 10 include at least one x-ray source 20,
X-ray interferometer arrangement 30 and X-ray detector 40.X-ray detector is configured as relative to 20 quilt of at least one x-ray source
It positions, so that the region between at least one x-ray source 20 and X-ray detector 40 is at least partly for accommodating object
Inspection area 50.X-ray interferometer arrangement 30 includes the first grating 32 and the second grating 34.In the first mode of operation, at least
One x-ray source 20 is configured as generating the first focal spot 21.At least one x-ray source 20 is configured as generating X-ray, so that
At least some first X-rays generated at first focal spot 21 pass through the first grating 32 at first position and pass through the second position
Second grating 34 at place.X-ray detector 40 at detector position is configured as detecting at least some first X-rays.?
In two operation modes, at least one x-ray source 20 is configured as generating the second focal spot 22.At least one x-ray source 20 is configured
To generate X-ray, so that at least some second X-rays 22 generated at the second focal spot 22 avoid the first light at first position
Grid 32.X-ray detector 40 at detector position is configured as detecting at least some second X-rays.
In example, device is configured to supply differential phase comparison imaging (DPCI).In example, device is configured as
There is provided with and without object in inspection area it is related with the detection of concentration (intensity) value of X-ray decay at
Picture.In example, device generates related with the detection of the phase of X-ray with and without object in inspection area
Phase-contrast (or differential phase) image.In example, device is configured as with and without the object in inspection area
In the case where related with the detection of the fringe visibility of X-ray dark field (or decoherence) be provided be imaged.In example, device
It is configured to supply any combination of these image modes.For example, decaying image can be generated in device, and generate phase-contrast
Image, and generate darkfield image.
Other details about phase contrast imaging can be found in the following terms: the publication of Pfeiffer et al.
Nature Physics (volume 2,258-261, in April, 2006)；The publication Phil.Trans.R.Soc.A. of Roessl et al.
(volume 372,1-15, in January, 2014)；And the publication Medical Physics Letters the (the 42nd (6) of Weber et al.
Volume, 2892-2896, in June, 2015).
In example, interferometer arrangement includes Talbot-Lau interferometer.In example, interferometer arrangement includes being configured
It is modulated in the X-ray emitted by least one source for that will can be detected by X-ray detector for the interference pattern of X-ray striped
Diffraction grating, this can be referred to as modulated grating.In example, interferometer arrangement includes being configured as analyzing the another of interference pattern
One diffraction grating, this can be referred to as analysis grating.In example, another diffraction grating is absorption grating.In example, two
Grating is manually arranged in the opposite side of inspection area.In example, two gratings are disposed in the same side of inspection area.
In example, in addition to one or more gratings by discussion, interferometer includes source grating.In this example, source grating quilt
It is positioned as relatively close first focal spot and for making the X-ray propagated after source grating partly be concerned with.In other words, at least
One x-ray source can be adjusted so that the transmitting ratio radiation more relevant in the case where source grating is not present.Therefore, some
In example, source grating is not needed, for example, when x-ray source has generated compatibly relevant X-ray.In example, interferometer
Arrangement, which is configured as generating, does not arrange (Moir é) striped.In example, interferometer arrangement is intentionally detuning, so that some stripeds are deposited
It is in detector area.In example, interferometer, which is arranged through, has inclined first grating at the small angle with the second grating
It is intentionally detuning.In example, the generation of the detuning not column striped caused on detector.
In example, the first grating is source grating.In example, the second grating is modulated grating.In example, the first light
Grid are modulated gratings.In example, the second grating is analysis grating.
In example, the device in first mode includes scan arrangement.In example, scanning includes that object passes through test zone
The movement in domain.In example, scanning includes movement of the object by inspection area, while the element and/or the of interferometer arrangement
One focal spot is fixed.In example, scanning includes movement of the grating relative to the first focal spot.In example, scanning includes the
The movement of one focal spot, while object is fixed or intentionally movement does not pass through inspection area.In example, scanning includes a light
Movement of the grid relative to the second grating.In example, the movement of movement and second grating of the scanning including the first grating, so that the
The relative position of one grating and the second grating has not been changed.For example, interferometer arrangement can be translated and/or rotate.In example,
Scanning includes the movement of the first focal spot.In example, scanning includes the movement of the first focal spot, while the element of interferometer arrangement is
Fixed.In other words, the movement of the first focal spot for example can laterally lead to the projection of the object images on X-ray detector
It is mobile.For example, may exist relative shift between the not column striped for projecting and arranging for particular example of image.Change speech
It, the device in first mode can be based on the adjustment of the scanning phase-contrast and/or dark-field system that are recently proposed.However, the
Device in one mode especially can be such as embodied in MicroDose system based on the adjustment of other scan-geometries
" classical " scan-geometries or adjustment by Kottler et al. geometry used, wherein object is moved logical
Cross the fixed setting of pipe, grating and detector.Device in first mode is also based on whole audience dark field and/or full field phase pair
Than the adjustment of system.
In example, at least one x-ray source is configured as emitting the X-ray of different intensity.In example, at least one
A x-ray source is configured as in two different operated at voltages.
In example, device has the useful application in the clinical setting of such as hospital.In example, device can be by
Mammogram, diagnostic roentgenology and interventional radiology for the medical inspection for patient.In example, device has industry
(for example, in nondestructive testing (analysis about biology and the composition, structure and/or quality of abiotic sample) in environment
And in safety scanning (for example, scanning of the luggage in airport)) useful application.
In addition, the first focal spot and the second focal spot can be alternately provided, allow device in first operator scheme and the
Easily and quickly switch between two operation modes, that is, in DPCI/DFI mode and decaying (absorption or radiophotography)
Easily and quickly switch between operation mode.
In example, in the first mode of operation, the first focal spot is configured as being moved small distance.Herein, it is small mean it is small
At a distance from the distance between the first focal spot position and the second focal spot position.In this way it is possible to improve image resolution ratio.
In example, in this second mode of operation, the second focal spot is configured as being moved small distance.Herein, it is small mean it is small
At a distance from the distance between the first focal spot position and the second focal spot position.In this way it is possible to improve image resolution ratio.
In example, at least one x-ray source is configurable to generate the X-ray with different characteristic X-ray spectrum.?
In example, this is realized by the offer of different acceleration voltages.In example, this is realized (all by the offer of filtering appropriate
Such as with the material filter in X-ray beam).In example, this passes through the different acceleration voltages for combining filtering appropriate
Offer realize.In example, the position of the second focal spot is at a distance from the location interval 1cm of the first focal spot.In example, third
The location interval of the position of focal spot and the first focal spot: 0.5cm, 1.5cm, 2cm, 2.5cm, 3cm, 4cm, 5cm, 6cm, 7cm, 8cm,
Any distance between 9cm, 10cm, 12cm, 15cm, 20cm or these distances.
According to example, the first grating 32 at first position is positioned between inspection area 50 and the first focal spot 21.
In example, the first grating is configured as the source grating being partly concerned with across its X-ray.In example,
When the X-ray generated at the first focal spot is sufficiently concerned with, the first grating is modulated grating.
According to example, in this second mode of operation, at least some second X-rays avoid the second grating of the second place
34。
According to example, the second grating 34 of the second place is positioned in the first grating 32 and test zone at first position
Between domain 50.
According to example, in this second mode of operation, the second grating 34 is configured as being positioned in addition to the second position
At position.At least some second X-rays generated at the second focal spot 22 avoid second at the position in addition to the second position
Grating.
In example, the second grating is fixedly installed in suitable frame or cage and the frame is fixedly by cloth
It sets in scan arm or other movable frames structures.In other words, the second grating can wave disengaging position, so that device can
To be operated in DPCI mode and in both conventional planning photograph modes.In DPCI mode, arm can be translated or be rotated, and be made
Obtaining can be at least part of sweep object.
According to example, X-ray interferometer arrangement 30 includes third grating 36.In the first mode of operation, in the first focal spot
At least some X-rays generated at 21 pass through the third grating 36 at the third place.In this second mode of operation, third grating 36
It is configured as being positioned at the position in addition to the third place.In this second mode of operation, it is generated at the second focal spot 22
At least some second X-rays avoid the third grating at the position in addition to the third place.
In example, the first grating is source grating, and the second grating is modulated grating, and third grating is analysis grating.
In example, third grating be can be positioned between inspection area and detector.Then, in this second mode of operation, third grating
It is moved out that access does not pass through it so as to X-ray and then device can operate in normal attenuation mode.
In example, third grating is fixedly installed in suitable frame or cage and the frame is fixedly by cloth
It sets in scan arm or other moveable rack constructions.In other words, third grating can wave disengaging position, so that device
It can be operated in DPCI mode and in both conventional planning photograph modes.In DPCI mode, arm can be translated or be rotated,
Allow to sweep object at least partly.
In example, the second grating and third grating are installed in suitable frame or cage with being fixed relative to each other
And the frame is fixedly disposed in scan arm or other moveable rack constructions.In other words, the second grating and
Three gratings can wave disengaging position, and device is operated in DPCI mode and in both conventional planning photograph modes.
In DPCI mode, arm can be translated or be rotated, and allow to sweep object at least partly.
According to example, in the first mode of operation, at least one x-ray source 20 is configured as in the position for removing the first focal spot 21
Third focal spot 23 is generated at position except setting.At least one x-ray source 20 is configured such that the generation at third focal spot 23
At least some third X-rays pass through the first grating 32 at first position and pass through the second grating 34 of the second place.It visits
The X-ray detector 40 surveyed at device position is configured as detecting at least some third X-rays.
In example, the position of third focal spot is at a distance from the location interval 0.5mm of the first focal spot.In example, third
The location interval of the position of focal spot and the first focal spot: 1mm, 1.5mm, 2mm, 2.5mm, 3mm, 3.5mm, 4mm, 4.5, mm,
Any distance between 0.5cm, 1cm, 2cm, 3cm, 5cm or these distances.
According to example, in the first mode of operation, at least one x-ray source 24 is configured as in the position for removing the first focal spot 21
The 4th focal spot 24 is generated at position except setting and at the position in addition to the position of third focal spot 23.At least one X is penetrated
Line source 20 is configured such that at least some 4th X-rays generated at the 4th focal spot 24 pass through the first light at first position
Grid 32 and the second grating 34 for passing through the second place.X-ray detector 40 at detector position is configured as detection extremely
Few some 4th X-rays.The position of axis and the first focal spot 21 between the position of first focal spot 21 and the position of third focal spot 23
Axis between the position of the 4th focal spot 24 is orthogonal or the axis between the position of the first focal spot 21 and the position of third focal spot 23
Axis between the position of third focal spot and the position of the 4th focal spot 24 is orthogonal.
In example, position and the third of the position of the 4th focal spot and the location interval of the first focal spot or the 4th focal spot
The distance of the location interval 0.5mm of focal spot.In example, separation is: 1mm, 1.5mm, 2mm, 2.5mm, 3mm, 3.5mm, 4mm,
Any distance between 4.5mm, 0.5cm, 1cm, 2cm, 3cm, 5cm or these distances.
In example, in this second mode of operation, at least one x-ray source is configured as in the position for removing the second focal spot (22)
The 5th focal spot (25) is generated at position except setting, and at least one x-ray source is configured such that and passes through place in the 5th focal spot
At least some 5th X-rays generated avoid the first grating at first position, wherein the X-ray detection at detector position
Device is configured as detecting at least some 5th X-rays.
In this way, when device operates in attenuation operations mode, the visual field of device can increase in one direction
Add.
In example, the position of the 5th focal spot is at a distance from the location interval 0.5mm of the second focal spot.In example, the 5th
The location interval of the position of focal spot and the second focal spot: 1mm, 1.5mm, 2mm, 2.5mm, 3mm, 3.5mm, 4mm, 4.5mm, 0.5cm,
Any distance between 1cm, 2cm, 3cm, 5cm or these distances.
In example, in this second mode of operation, at least one x-ray source is configured as in the position for removing the second focal spot 22
Except position at and at the position in addition to the position of the 5th focal spot 25 generate the 6th focal spot 26.At least one X-ray
The first grating that source is configured such that at least some 6th X-rays generated at the 6th focal spot are avoided at first position passes through.
X-ray detector at detector position is configured as detecting at least some 6th X-rays.The position of second focal spot is burnt with the 5th
Axis between the position of spot is orthogonal with the axis between the position of the second focal spot and the position of the 6th focal spot or the position of the second focal spot
It sets axis between the position of the 5th focal spot and the position of the 5th focal spot is orthogonal with the axis between the position of the 6th focal spot.
In this way, when device operates in attenuation operations mode, the visual field of device can increase in two directions
Add.
In example, the position of the second focal spot and the location interval of the 6th focal spot or the position and the 6th of the 5th focal spot
The distance of the location interval 0.5mm of focal spot.In example, separation is: 1mm, 1.5mm, 2mm, 2.5mm, 3mm, 3.5mm, 4mm,
Any distance between 4.5mm, 0.5cm, 1cm, 2cm, 3cm, 5cm or these distances.
According to example, at least one x-ray source 20 includes two X-ray tubes.
According to example, at least one x-ray source is configured as generating X-ray in the first mode of operation, passes through X-ray
The different spectral characterizations of photon energy are to the X-ray generated in this second mode of operation.
In example, this by using in the case where the influence to target generate bremsstrahlung electronics acceleration not
Same tube voltage is realized.For example, for (one or more) focal spot for calling all gratings of interferometer, at least one
A x-ray source can use the electronic operation of the kinetic energy of 80keV, however when generate the generation for image of decaying (one or
It is multiple) other focal spot (it at least electronically avoid the first grating) when can be operated at 120keV.By using (at least) two
A different cathode, this will by using 80kV by the first cathode (DPCI) and utilization such as 120kV (uses the second cathode
It is imaged in decaying) charging realization.
In example, at least one x-ray source includes two X-ray tubes in different operated at voltages.
In example, at least one x-ray source using X-ray is electronically generated, does not use different energy source lifes
At X-ray.For example, the X-ray itself focused on target, which can produce X-ray or other optical wavelength, can be focused onto target
On to generate X-ray.
According to example, at least one x-ray source 20 is configured as generating X-ray in the first mode of operation, by not
Same focal spot point spread function is characterized to the X-ray generated in this second mode of operation.
Fig. 2 shows for carrying out the system 100 of x-ray imaging to object.System 100 includes as described with reference to fig. 1
Device 10, processing unit 110 and the output unit 120 for object to be imaged.Processing unit 110 is configured as controlling
Device 10, and it is configured as control output unit 120.X-ray detector 40 is configured as to the offer of processing unit 110 and X
The related data of the detection of ray.Output unit 120, which is configured as output, indicates the data of object.
In example, output unit is configured as the data that output indicates at least part of x-ray transmission of object.
In example, output unit is configured as in the first mode and exports the X for indicating object in a second mode
The data of ray.
In example, output unit is configured as output and absorbs (or decaying) image.In example, output unit is matched
It is set to output phase comparison (or differential phase) image.In example, output unit is configured as output darkfield image.In model
In example, output unit is configured as any combination of output attenuatoin, phase-contrast and darkfield image.
According to example, output data includes attenuation data, and/or phase-contrast data, and/or dark field data.
Fig. 3 is shown in its basic step for carrying out the method 200 of x-ray imaging to object.Method includes:
In the positioning step 210 for being also known as step a), X-ray detector is positioned relative at least one x-ray source
(210), so that region between at least one x-ray source and X-ray detector is at least partly inspection for accommodating object
Look into region；
In the generation step 220 for being also known as step b), in the first mode of operation, at least one x-ray source is utilized
The first focal spot is generated, so that at least some first X-rays generated at the first focal spot pass through the first grating of interferometer arrangement,
First grating is positioned at first position, and at least some first X-rays is made to pass through the second grating that interferometer is arranged,
Second grating is positioned in the second place；
In the detection steps 230 for being also known as step c), in the first mode of operation, the X at detector position is utilized
Ray detector detects at least some first X-rays；
In the generation step 240 for being also known as step d), in this second mode of operation, at least one x-ray source is utilized
The second focal spot is generated, so that at least some second X-rays generated at the second focal spot avoid the first grating at first position；
And
In the detection steps 250 for being also known as step g), in this second mode of operation, the X at detector position is utilized
Ray detector detects at least some X-rays.
In the example of method, step b) and d) include by the first grating positioning between inspection area and the first focal spot
At first position.
In example, step d) includes the second grating that at least some second X-rays avoid the second place.
In the example of method, step b) and d) include the first grating by the second grating positioning at first position and inspection
Look into the second place between region.
In example, step d) include by the second grating positioning 242 at the position in addition to the second position, and its
In, at least some second X-rays generated at the second focal spot avoid the second grating at the position in addition to the second position.
In example, step b) includes that will be passed through in the first focal spot by least some first X-rays that place generates
The third grating of interferometer arrangement, third grating is positioned at the third place, and step d) includes by third grating positioning
244 at the position in addition to the third place.At least some second X-rays generated at the second focal spot are avoided except the third place
Except position at third grating.
In example, method includes step e): in the first mode of operation, removing first using at least one x-ray source
260 third focal spots are generated at position except focal spot, so that at least some third X-rays generated at third focal spot pass through the
The first grating at one position and the second grating across the second place.X-ray detector at detector position is matched
It is set at least some third X-rays of detection.
In example, method includes step f): in the first mode of operation, removing first using at least one x-ray source
270 the 4th focal spots are generated at position except the position of focal spot and at the position in addition to the position of third focal spot, so that
At least some 4th X-rays generated at the 4th focal spot pass through the first grating at first position and pass through the second place
The second grating.X-ray detector at detector position is configured as detecting at least some 4th X-rays.First focal spot
Axis between position and the position of third focal spot is orthogonal with the axis between the position of the first focal spot and the position of the 4th focal spot, or
Between the position of axis and third focal spot and the position of the 4th focal spot between the position of first focal spot and the position of third focal spot
Axis is orthogonal.
In example, method includes providing data related with the detection of X-ray, and export the data for indicating object.
The devices, systems, and methods for carrying out x-ray imaging to object are more fully described referring now to Fig. 4-6.
Fig. 4 shows the example of the device for object to be imaged in an operation mode, wherein device is in phase
It is operated in position comparison and/or dark field mode.In brief, it is not shown in Fig. 4 device characteristic related with second operator scheme,
Wherein, device operates in normal attenuation or absorption operation mode.It shows and discusses and second relative to Fig. 5 and Fig. 6
The related feature of operation mode.
The device shown in Fig. 4 is configured for acquisition X-ray dark field and/or phase contrast image.Device being capable of needle
The spatial distribution imaging (phase contrast imaging) of birefringence and can also for the small-angle scattering in object spatial distribution at
As (dark-field imaging).Device has can be across the interferometer based on grating of fixed x-ray imaging detector scanning.In the example
In, interferometer includes two optical grating constructions G1 and G2, but in other examples, (is only had single using single grating interferometer
A grating G1).Under the specific condition of single grating interferometer, x-ray imaging detector keeps spacing sufficiently small, therefore space
Resolution ratio is sufficiently big, for detecting (that is, sufficiently parsing) for differential phase comparison imaging and/or the mesh of dark-field imaging
The interference pattern generated by grating G1.For this purpose, x-ray imaging detector can be high-resolution X-ray detector,
It has such as 50 microns or more of spatial resolution.
In Fig. 4, grating G1 is either absorption grating or phase shift grating, however G2 is absorption grating.Grating by
Suitable substrate (such as Silicon Wafer) manufacture of photoetching treatment.The pattern of periodical scale is formed on by the ditch of different length-width ratios
In those of slot formation silicon " card ".Scale pattern can be it is one-dimensional, and can be it is two-dimensional, such as with give check plate figure
Sample.
Device further include: x-ray source generates electron beam focal spot on the anode of transmitting X-ray；With X-ray at
As detector.X-ray imaging detector can be the full view X-ray detector of 2D, be either plane or curved.It is multiple
Detector pixel is arranged to array with row and column to form the X-ray spoke for being able to record the X-ray radiation by x-ray source transmitting
Penetrate sensing surface.
X-ray imaging detector and x-ray source are spaced apart to form inspection area.Inspection area is compatibly spaced to connect
Receive the object to be imaged.Object can be abiotic or lived.For example, object can be the luggage to be imaged or
Other samples, perhaps object can be the solution of the mankind or animal patient or at least mankind or animal under medical ground
Cut open part.
Interferometry optical grating construction G1 and G2 are disposed in the inspection area between x-ray source and x-ray imaging detector
In.The focal spot for being laterally extended v that there is x-ray source X-ray radiation beam to occur from it.It is the spoke of focal spot and X-ray detector
Penetrate the space between sensing surface: where two or three optical grating constructions are arranged.Grating G1 be phase grating (or modulation
Grating), and grating G2 is analysis grating.In the device shown in Fig. 4, except interferometer interferometry grating G1, G2 it
Outside, there is another grating G0 as source grating.
Source grating G0 is disposed near x-ray source focal spot, for example, at the exit window of the shell of X-ray tube.Source light
The function of grid G0 is that the radiation of transmitting is made at least partly to be concerned with.In other words, if using the X-ray that can generate coherent radiation
Source can then exempt source grating G0.
In operation, at least partly coherent radiation passes through inspection area and interacts with object.Then object will
Refraction and small-angle scattering modulates information to can then by gratings in series G1 and G2 operation extract radiation on.Grating G1, G2
Cause interference pattern, the striped of not column pattern can be detected as at x-ray imaging detector.If in inspection area
There is no objects, then the interference pattern of observable at x-ray imaging detector still will be present, referred to as usually in calibration process
The reference pattern of period acquisition.This is by causing slight bending (such as making two gratings ideally not parallel) by particularly
Adjust or " detuning " two gratings G1 and G2 between mutual spatial relationship and occur.Now, if object is positioned in inspection
Look into region and with radiation interaction as mentioned, then not column pattern (it is more suitably referred to as object pattern now)
It is construed as the interference version of reference pattern.The difference from reference pattern can be then used to calculate two images
A width or whole in (phase-contrast or dark field).This means to acquire dark field plot at the time identical with phase contrast image
Picture.In order to acquire the suitable signal that can calculate image from it, scanning motion is executed by gratings in series G1-G2.As
The movement as a result, at each pixel of x-ray imaging detector, detect a series of intensity values.It is appreciated that realizing the scanning
Mobile mechanical system be configured as the mechanical motion system of the completely out access of one or more gratings is very different.
In order to it is good as a result, the detuning period for making not column pattern of grating G1, G2 should extend on the direction of scanning motion it is several
Its period (two or three).For each X-ray detector pixel, then which can be fitted to (sine) letter
Number forwarding model, such as to export the respective contribution of refraction and small-angle scattering.Be not shown in Fig. 4 but technical staff
The signal processing of the type is completed in the signal processing unit known.X-ray imaging detector is directed to the optical axis extended along Z axis
Any given orientation is kept fixed.In other words, x-ray imaging detector keeps solid relative to any reference point in inspection area
Fixed (at least during Image Acquisition operation).It is dry that interferometry setting as described above is commonly referred to as Talbot-Lau
The things of interferometer.G0 and G1 and the distance between G1 and G2 must finely tune the requirement to be suitble to Taibo (Talbot) distance, after
But the function of " spacing " (that is, space periodic of grating scale) of corresponding grating.It is mobile dry relative to x-ray imaging detector
Interferometer can cause the slight change being attributed in the fringe distribution of stripe drifting.However, stripe drifting can be by making in this way
Drift with as using reference scan obtain stripe drifting compensate.Such reference scan can be in x-ray imaging device
Installation place execute blank scanning.This for explain with by such Talbot-Lau interferometer be changed into conventional absorption or
One of associated problem of attenuating device, wherein in addition to by the mobile mechanical complexity opened of grating, be placed back into identical
It is very difficult in position.The present apparatus alleviates this point.
Interferometer, which can be, substantially has two be installed in being fixed relative to each other in suitable frame or cage
" the grating packet " and the frame of a grating G1 and G2 is fixedly installed in scan arm or other moveable frame structures
In (be not shown in Fig. 4).Arm and interferometer execute the pendulum of the movement such as across X-ray detector surface using it.Scanning
The pivoting point of arm movement extends through the focal spot of x-ray source, but does not need the focal spot of x-ray source.The grating G1 of interferometer
With G2 scan it is mobile during be maintained at relative to each other in fixed relationship always and keep substantial parallel or extremely with G0
Less in fixed spatial relationship.However, one or more of grating can independently fully movement be opened.Suitable tracking electricity
Road (not shown) keeps interferometer position related to X-ray detector location of pixels to trigger the sequence for reading burst in time with true
It protects each pixel and is supplied with the series mentioned above of measurement result correctly to sample to interference pattern.In Fig. 4
In, grating G1 is shown in the detector side of object, however, its source that can be similarly positioned in object.
Fig. 5 shows the other details of the device of Fig. 4, but it is operated in different decaying imaging patterns now.X
Radiographic source includes two X-ray tubes, wherein an X-ray tube generates focal spot as shown in FIG. 4, is shown in Fig. 5
For focal spot 2.When the first focal spot is not generated, the second X-ray tube generates the second focal spot, wherein the second focal spot is shown as
Focal spot 1 in Fig. 5.New focal spot at focal spot position 1 as shown in FIG. 5 escape to the one of the focal spot for being used for DPCI/DFI
Side and be used for normal attenuation imaging.In the case where no grating G0 or detector need to be moved, produced from new focal spot
Then raw X-ray avoids source grating G0 but passes through object and interact with x-ray imaging detector.In Fig. 5, light
Mechanically movement is opened by grid G1 and G2.When wherein when correctly determining size and positioning and in the feelings for being properly positioned focal spot
Grating G1 is in the embodiment of the detector side of object under condition, X-ray passed through in DPCI/DFI mode all grating G0, G1 and
G2, but grating G0 and G1 are avoided in evanescent mode in the case where those gratings need not be moved.In this way, make system
It is more mechanical simple, because less element must be moved open and then be moved back to.In addition, alignment becomes easier to manage, because
It needs fully to move out to reduce the element of number, and then other non-moving elements are fixed relative to each other.As above
What text was discussed, device can exempt grating G2 and the in this arrangement G0 and G1 of the source of object, need without grating
It is moved and device can be from DPCI/DFI pattern switching to evanescent mode, and returned again to, simply by emitting X from it
The electronics of the position of the electric focal spot of ray switches.Electronics switching can be by such as the switching of the grid of electron beam or magnetic deflection
Electric or magnetic device is provided by any combination thereof.
Then Fig. 6 shows the device with the grating moved back in position, wherein x-ray source will be again in its original
Electric focal spot is generated at beginning position, so that device operates in DPCI/DFI mode again.As discussed above, shown in
In embodiment, two gratings need to be to be moved, but in another embodiment, only one grating need to be to be moved, and another
In one embodiment, needed without grating to be moved.
In this way, by the electron-beam position of electronically switching focusing, X-ray can be made to avoid one or two light
Grid can be kept fixed in position together with detector.
In another exemplary embodiment, computer program or computer program element are provided, which is characterized in that its
It is configured as executing the method and step of the method according to one of previous embodiment in system appropriate.
Therefore computer program element can be stored on computer unit, can also be a part of embodiment.
The step of computing unit is configurable to the step of executing method as described above or causes method as described above
Execution.In addition, its component that can be configured as operation devices described above.Computing unit can be configured as automatically
Ground operation and/or the order of operation user.Computer program can be loaded into the working storage of data processor.Cause
This, data processor can be equipped as executing the method according to one of previous embodiment.
The exemplary embodiment of the invention covers from the beginning using computer program of the invention and by means of more
Newly existing program is changed into and uses both computer programs of program of the invention.
Further, the computer program element, which is capable of providing, realizes that the demonstration of method as described above is real
Apply all required steps of the process of example.
Another exemplary embodiment according to the present invention, proposes a kind of computer-readable medium, such as CD-ROM,
In, the computer-readable medium has the computer program element being stored on the computer-readable medium, the calculating
Machine program unit is described by previous section.
Computer program can be stored/distributed on suitable medium, such as offer or conduct together with other hardware
The optical storage medium or solid state medium that the part of other hardware provides, but computer program can also can divide otherwise
Cloth, such as via internet or other wired or wireless telecommunication systems.
However, the computer program can also exist on the network of such as WWW and can be from such network
It downloads in the working storage of data processor.Another exemplary embodiment according to the present invention provides a kind of for making
Obtain the medium that computer program element can be used for downloading, wherein the computer program element is arranged to execute according to this hair
Method described in one of embodiment described before bright.
It must be noted that the embodiment of the present invention is described with reference to different themes.Specifically, some embodiment reference sides
The claim of method type is described, and the claim of other embodiments reference device type is described.However, ability
Field technique personnel will recognize from the description of above and below, unless otherwise noted, in addition to belonging to a type of theme
Except any combination of feature, it is related to any combination between the feature of different themes and is recognized as to be disclosed by this application.However,
All features can be combined to provide the synergistic effect simply summed it up more than feature.
It is such to illustrate and describe although the present invention is illustrated and described in detail in the drawings and the preceding description
Be considered as it is illustrative or exemplary and not restrictive.The present invention is not limited to the disclosed embodiments.By research attached drawing,
Specification and dependent claims, those skilled in the art is when practicing the claimed present invention it will be appreciated that and realization institute
Other modifications of disclosed embodiment.
In the claims, word " comprising " does not exclude other units or steps, also, word "a" or "an" is not
It excludes multiple.Single processor or other units can fulfil the function for some projects recorded in claims.Although
It is mutually different to be recited in mutually different dependent certain measures, but this does not indicate that and these measures cannot be used to advantage
Combination.Any appended drawing reference in claim is not necessarily to be construed as the limitation to range.
Claims (15)
1. a kind of for carrying out the device (10) of x-ray imaging to object, comprising:
At least one x-ray source (20)；
X-ray interferometer arranges (30)；
X-ray detector (40)；
Wherein, the X-ray detector is configured as being positioned relative at least one described x-ray source so that it is described at least
Region between one x-ray source and the X-ray detector is at least partly for accommodating the inspection area of object (50)；
Wherein, the X-ray interferometer arrangement includes the first grating (32) and the second grating (34)；
Wherein, in the first mode of operation, at least one described x-ray source is configured as generating the first focal spot (21), and institute
It states at least one x-ray source to be configured as generating X-ray, so that at least some first X generated at first focal spot are penetrated
Line passes through first grating at first position and passes through second grating of the second place, wherein detector position
The X-ray detector at the place of setting is configured as detecting at least some first X-rays；And
Wherein, in this second mode of operation, at least one described x-ray source is configured as generating the second focal spot (22), and institute
It states at least one x-ray source to be configured as generating X-ray, so that at least some 2nd X generated at second focal spot are penetrated
Line avoids first grating at the first position, wherein the X-ray detector at the detector position is matched
It is set to detection at least some second X-rays.
2. the apparatus according to claim 1, wherein first grating (32) at the first position is positioned in institute
It states between inspection area (50) and first focal spot (21).
3. the apparatus of claim 2, wherein in second operation, at least some second X-rays are avoided
Second grating (34) of the second place.
4. device according to claim 3, wherein second grating (34) of the second place is positioned in institute
It states between first grating (32) at first position and the inspection area (50).
5. device described in any one of -2 according to claim 1, wherein in the second operator scheme, described second
Grating (34) is configured as at the position being positioned in addition to the second position, and wherein, in second focal spot
(22) at least some second X-rays generated at avoid described second at the position in addition to the second position
Grating.
6. device according to any one of claims 1 to 5, wherein X-ray interferometer arrangement (30) includes the
Three gratings (36), wherein in the first operator scheme, at least some X of generation at first focal spot (21)
Ray passes through the third grating at the third place, and wherein, in the second operator scheme, the third grating quilt
It is configured at the position being positioned in addition to the third place, and wherein, in the second operator scheme, described
At least some second X-rays generated at second focal spot (22) are avoided at the position in addition to the third place
The third grating.
7. the device according to any one of claims 1 to 6, wherein in the first operator scheme, it is described at least
One x-ray source (20) is configured in generation third focal spot (23) at the position in addition to the position of first focal spot (21),
And at least one described x-ray source is configured such that at least some third X-rays generated at the third focal spot are worn
It crosses first grating (32) at the first position and passes through second grating (34) of the second place,
In, the X-ray detector (40) at the detector position is configured as detecting at least some third X-rays.
8. device according to claim 7, wherein in the first operator scheme, at least one described x-ray source
(20) it is configured as at the position in addition to the position of first focal spot (21) and except the third focal spot
(23) the 4th focal spot (24) is generated at the position except the position, and at least one described x-ray source is configured as making
Obtain first grating (32) of at least some 4th X-rays generated at the 4th focal spot at the first position
And pass through second grating (34) of the second place, wherein the X-ray detection at the detector position
Device (40) is configured as detecting at least some 4th X-rays, and wherein, the position of first focal spot with it is described
Axis between the position of third focal spot is orthogonal to the position of first focal spot and institute's rheme of the 4th focal spot
The position of axis or first focal spot between setting is orthogonal with the axis between the position of the third focal spot
Axis between the position of the third focal spot and the position of the 4th focal spot.
9. device described in any one of -8 according to claim 1, wherein at least one described x-ray source (20) includes two
A X-ray tube.
10. device according to any one of claims 1-9, wherein at least one described x-ray source (20) is configured
To generate X-ray in the first operator scheme, the X-ray is characterized by the different spectrum of x-ray photon energy
To the X-ray generated in the second operator scheme.
11. device described in any one of -10 according to claim 1, wherein at least one described x-ray source (20) is matched
It is set in the first operator scheme and generates X-ray, the X-ray is characterized by different focal spot point spread functions
The X-ray generated in the second operator scheme.
12. a kind of for carrying out the system (100) of x-ray imaging to object, comprising:
Device (10) according to any preceding claims for object to be imaged；
Processing unit (110)；And
Output unit (120)；
Wherein, the processing unit is configured as control described device, and is configured as controlling the output unit；
Wherein, the X-ray detector (40) is configured as providing number related with the detection to X-ray to the processing unit
According to；
Wherein, the output unit, which is configured as output, indicates the data of the object.
13. system according to claim 12, wherein the data exported include attenuation data and/or phase-contrast number
According to and/or dark field data.
14. a kind of for carrying out the method (200) of x-ray imaging to object, comprising:
(210) X-ray detector is positioned relative at least one x-ray source, so that at least one described x-ray source and the X
Region between ray detector is at least partly inspection area for accommodating object；
In the first mode of operation, (220) first focal spots are generated using at least one described x-ray source, so that described first
At least some first X-rays generated at focal spot pass through the first grating of interferometer arrangement, and make described at least some the
One X-ray passes through the second grating of interferometer arrangement, and first grating is positioned at first position, second light
Grid are positioned in the second place；
In the first operator scheme, it is described extremely that (230) are detected using the X-ray detector at detector position
Few some first X-rays；
In this second mode of operation, (240) second focal spots are generated using at least one described x-ray source, so that described second
At least some second X-rays generated at focal spot avoid first grating at the first position；And
In the second operator scheme, (250) institute is detected using the X-ray detector at the detector position
State at least some second X-rays.
15. a kind of computer program element, for control according to claim 1 to device described in any one of 11 and/or
For controlling system described in any one of 2-13 according to claim 1, the computer program element is worked as to be transported by processor
It is configured as executing the method according to claim 11 when row.
Applications Claiming Priority (3)
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| EP16174828.0 | 2016-06-16 | ||
| EP16174828 | 2016-06-16 | ||
| PCT/EP2017/064788 WO2017216354A1 (en) | 2016-06-16 | 2017-06-16 | Apparatus for x-ray imaging an object |
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| CN109414232A true CN109414232A (en) | 2019-03-01 |
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| US (1) | US10660595B2 (en) |
| EP (1) | EP3405112B1 (en) |
| JP (1) | JP2019523876A (en) |
| CN (1) | CN109414232A (en) |
| WO (1) | WO2017216354A1 (en) |
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|---|---|---|---|---|
| JP6753342B2 (en) * | 2017-03-15 | 2020-09-09 | 株式会社島津製作所 | Radiation grid detector and X-ray inspection equipment |
| WO2019130848A1 (en) * | 2017-12-26 | 2019-07-04 | 株式会社島津製作所 | X-ray imaging device |
| EP3508128A1 (en) * | 2018-01-05 | 2019-07-10 | Koninklijke Philips N.V. | Apparatus for generating dual energy imaging data |
| WO2019220410A1 (en) * | 2018-05-17 | 2019-11-21 | Institut National De La Recherche Scientifique (Inrs) | Method and system for sampling and denoising amplification of a signal |
| JP2021156578A (en) * | 2018-06-27 | 2021-10-07 | 株式会社ニコン | X-ray apparatus, x-ray image generation method and structure manufacturing method |
| EP3922180A1 (en) * | 2020-06-09 | 2021-12-15 | Koninklijke Philips N.V. | Apparatus for processing data acquired by a dark-field and/or phase contrast x-ray imaging system |
| EP4145117A1 (en) * | 2021-09-01 | 2023-03-08 | Malvern Panalytical B.V. | Adaptable x-ray analysis apparatus |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20070183560A1 (en) * | 2006-02-01 | 2007-08-09 | Stefan Popescu | Method for producing projective and tomographic phase contrast images with the aid of an x-ray system |
| CN101044987A (en) * | 2006-02-01 | 2007-10-03 | 西门子公司 | X-ray ct system for producing projecting and tomography contrast phase contrasting photo |
| CN101416268A (en) * | 2006-04-07 | 2009-04-22 | 皇家飞利浦电子股份有限公司 | Dual spectrum x-ray tube with switched focal spots and filter |
| US20090154640A1 (en) * | 2005-12-27 | 2009-06-18 | Joachim Baumann | Focus detector arrangement and method for generating contrast x-ray images |
| CN101873828A (en) * | 2007-11-26 | 2010-10-27 | 皇家飞利浦电子股份有限公司 | Detection setup for x-ray phase contrast imaging |
| CN102365052A (en) * | 2009-03-27 | 2012-02-29 | 皇家飞利浦电子股份有限公司 | Differential phase-contrast imaging with circular gratings |
| CN102781327A (en) * | 2009-12-10 | 2012-11-14 | 皇家飞利浦电子股份有限公司 | Phase contrast imaging |
| CN103718251A (en) * | 2011-06-06 | 2014-04-09 | 皇家飞利浦有限公司 | Multiple focal spot x-ray radiation filtering |
| CN105338901A (en) * | 2013-06-28 | 2016-02-17 | 皇家飞利浦有限公司 | Correction in slit-scanning phase contrast imaging |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05135722A (en) * | 1991-11-08 | 1993-06-01 | Rigaku Corp | Wavelength selection type x-ray generator |
| JP2001351551A (en) * | 2000-06-06 | 2001-12-21 | Kazuo Taniguchi | X-ray tube |
| DE102006046034A1 (en) | 2006-02-01 | 2007-08-16 | Siemens Ag | X-ray CT system for producing projective and tomographic phase-contrast images |
| WO2010150136A1 (en) | 2009-06-22 | 2010-12-29 | Koninklijke Philips Electronics N. V. | Grating-based phase contrast x-ray imaging apparatus and methods |
| US9025725B2 (en) * | 2009-09-16 | 2015-05-05 | Konica Minolta Medical & Graphic, Inc. | X-ray image capturing apparatus, X-ray imaging system and X-ray image creation method |
| JP5702586B2 (en) * | 2010-02-04 | 2015-04-15 | 富士フイルム株式会社 | Radiography system |
| JP2011224329A (en) * | 2010-03-30 | 2011-11-10 | Fujifilm Corp | Radiation imaging system and method |
| US8995614B2 (en) * | 2010-09-29 | 2015-03-31 | Konica Minolta Medical & Graphic, Inc. | Method for displaying medical images and medical image display system |
| JP5331940B2 (en) * | 2010-10-27 | 2013-10-30 | 富士フイルム株式会社 | Radiation imaging system and radiation image generation method |
| JP5796908B2 (en) * | 2010-10-29 | 2015-10-21 | 富士フイルム株式会社 | Radiation phase imaging device |
| JP2012143396A (en) * | 2011-01-12 | 2012-08-02 | Fujifilm Corp | Radiographic grating unit and radiographic system |
| JP5475737B2 (en) * | 2011-10-04 | 2014-04-16 | 富士フイルム株式会社 | Radiation imaging apparatus and image processing method |
| US9135728B2 (en) * | 2012-04-04 | 2015-09-15 | General Electric Company | System and method for multi-energy computed tomography imaging |
| JP6079204B2 (en) * | 2012-12-18 | 2017-02-15 | コニカミノルタ株式会社 | Medical imaging system |
| CN105190823B (en) | 2013-02-13 | 2017-11-17 | 皇家飞利浦有限公司 | multi X-ray beam tube |
| JPWO2015015851A1 (en) * | 2013-07-30 | 2017-03-02 | コニカミノルタ株式会社 | Medical image system and articular cartilage state score determination method |
| JP2016054045A (en) * | 2014-09-03 | 2016-04-14 | 株式会社東芝 | X-ray diagnostic apparatus and X-ray tube |
-
2017
- 2017-06-16 JP JP2018565043A patent/JP2019523876A/en active Pending
- 2017-06-16 CN CN201780021013.9A patent/CN109414232A/en active Pending
- 2017-06-16 EP EP17730182.7A patent/EP3405112B1/en not_active Not-in-force
- 2017-06-16 WO PCT/EP2017/064788 patent/WO2017216354A1/en active Application Filing
- 2017-06-16 US US16/309,956 patent/US10660595B2/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20090154640A1 (en) * | 2005-12-27 | 2009-06-18 | Joachim Baumann | Focus detector arrangement and method for generating contrast x-ray images |
| US20070183560A1 (en) * | 2006-02-01 | 2007-08-09 | Stefan Popescu | Method for producing projective and tomographic phase contrast images with the aid of an x-ray system |
| CN101044987A (en) * | 2006-02-01 | 2007-10-03 | 西门子公司 | X-ray ct system for producing projecting and tomography contrast phase contrasting photo |
| CN101416268A (en) * | 2006-04-07 | 2009-04-22 | 皇家飞利浦电子股份有限公司 | Dual spectrum x-ray tube with switched focal spots and filter |
| CN101873828A (en) * | 2007-11-26 | 2010-10-27 | 皇家飞利浦电子股份有限公司 | Detection setup for x-ray phase contrast imaging |
| CN102365052A (en) * | 2009-03-27 | 2012-02-29 | 皇家飞利浦电子股份有限公司 | Differential phase-contrast imaging with circular gratings |
| CN102781327A (en) * | 2009-12-10 | 2012-11-14 | 皇家飞利浦电子股份有限公司 | Phase contrast imaging |
| CN103718251A (en) * | 2011-06-06 | 2014-04-09 | 皇家飞利浦有限公司 | Multiple focal spot x-ray radiation filtering |
| CN105338901A (en) * | 2013-06-28 | 2016-02-17 | 皇家飞利浦有限公司 | Correction in slit-scanning phase contrast imaging |
Also Published As
| Publication number | Publication date |
|---|---|
| US10660595B2 (en) | 2020-05-26 |
| JP2019523876A (en) | 2019-08-29 |
| EP3405112A1 (en) | 2018-11-28 |
| WO2017216354A1 (en) | 2017-12-21 |
| US20190159742A1 (en) | 2019-05-30 |
| EP3405112B1 (en) | 2019-06-12 |
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