CN109406882B - Inductance testing device and method for wave-absorbing material - Google Patents
Inductance testing device and method for wave-absorbing material Download PDFInfo
- Publication number
- CN109406882B CN109406882B CN201811469202.5A CN201811469202A CN109406882B CN 109406882 B CN109406882 B CN 109406882B CN 201811469202 A CN201811469202 A CN 201811469202A CN 109406882 B CN109406882 B CN 109406882B
- Authority
- CN
- China
- Prior art keywords
- coil
- inductance
- wave
- absorbing material
- table top
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 64
- 239000011358 absorbing material Substances 0.000 title claims abstract description 30
- 238000000034 method Methods 0.000 title claims description 7
- 238000003825 pressing Methods 0.000 claims abstract description 48
- 239000002184 metal Substances 0.000 claims abstract description 9
- 229910052751 metal Inorganic materials 0.000 claims abstract description 9
- 229920002799 BoPET Polymers 0.000 claims description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 3
- 229910052802 copper Inorganic materials 0.000 claims description 3
- 239000010949 copper Substances 0.000 claims description 3
- 230000001681 protective effect Effects 0.000 claims description 3
- 230000000087 stabilizing effect Effects 0.000 claims description 3
- 238000010998 test method Methods 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000012544 monitoring process Methods 0.000 description 5
- 239000000463 material Substances 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000002745 absorbent Effects 0.000 description 1
- 239000002250 absorbent Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000013329 compounding Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 238000009658 destructive testing Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000004154 testing of material Methods 0.000 description 1
- 230000003313 weakening effect Effects 0.000 description 1
- 229910000859 α-Fe Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention discloses an inductance testing device and a testing method of a wave-absorbing material, wherein the device comprises an LCR testing instrument, a coil and a testing jig; the LCR test instrument is connected with the coil through a metal wire. The test fixture is divided into an upper layer and a lower layer, namely a lower table surface is fixed, a middle groove is formed to fix a coil in the groove, a film is placed on the lower table surface, a lower pressing cylinder drives an upper pressing plate to move up and down and bring certain pressure, the upper pressing plate and the lower pressing plate are in close contact with each other, an LCR test instrument is used for connecting the coil through a metal wire, the inductance value of a wave-absorbing material is measured, and whether the inductance value of the wave-absorbing material is qualified or not is judged by referring to an inductance value and thickness standard correspondence table so as to detect the product performance.
Description
Technical Field
The invention relates to an inductance testing device and an inductance testing method for a wave-absorbing material, and belongs to the technical field of wave-absorbing material testing.
Background
The development and preparation of a material capable of resisting and weakening electromagnetic wave radiation, namely a wave absorbing material, are a great direction in the current material manufacturing industry.
The common coating type wave absorbing material is formed by compounding a binder and an absorbent, and is simple to manufacture, practical and wide. However, the coated wave-absorbing material has rough surface, large brittleness, too thick thickness and poor performance, and cannot be directly applied to the radiation-proof field, a series of production processes are needed to change the appearance and performance of the ferrite wave-absorbing material, so that the quality requirement of customers is met, the product performance is required to be monitored in the processing process, the traditional monitoring method is to conduct destructive permeability measurement on the wave-absorbing material to achieve quality monitoring, the product is only subjected to spot check in the production process due to destructive testing, unstable factors appear in the quality of the product due to fluctuation of process factors, 100% quality monitoring cannot be conducted at the moment, defective products are caused to flow into the customer end, and finally, the product is not damaged and can reach 100% quality monitoring, so that the method has great practical significance on quality monitoring in the production process.
Disclosure of Invention
The invention aims to provide an inductance testing device for a wave-absorbing material, which can avoid product damage.
In order to solve the technical problems, the invention provides the following technical scheme:
The invention discloses an inductance testing device of a wave-absorbing material, which comprises an LCR testing instrument, a coil and a testing jig; the LCR test instrument is connected with the coil through a metal wire; the coil is arranged in the test jig;
The test fixture comprises a base, a lower table top, an upper pressing plate, a lower pressing cylinder, an upright post, a top plate, a groove and a film; the lower table top is fixed above the base; the base is provided with a fixed bracket at the rear of the lower table top; the fixed support comprises an upright post fixedly arranged at the rear end of the base and a top plate fixedly arranged at the top of the upright post; the top plate is positioned right above the lower table top; the lower table top is provided with a groove; a coil is arranged in the groove; a lower air cylinder is fixedly arranged on the top plate; an upper pressing plate is arranged between the top plate and the lower table top; a piston rod of the lower pressing cylinder penetrates through the top plate to be fixedly connected with the upper pressing plate and drives the upper pressing plate to move up and down; the lower table top is provided with a film.
Further, the upper pressing plate comprises an upper plate body, a lower plate body and a pressure spring; the upper plate body and the lower plate body are connected through five pressure springs; the five pressure springs are respectively arranged at the center of the upper pressing plate and at the four corners.
The line width of the coil is 1.0-2.0mm, the line distance is 0.1-0.2mm, the number of turns is 10-20, and the thickness is 1.0-2.0o/z; the coil is a PI+copper+protective film double-sided board product.
Further, the thickness of the film is in the range of 0.10-0.50mm.
Further, the film is a PET film or a PI film.
The invention also discloses an inductance test method of the wave-absorbing material, which comprises the following steps:
Step one: turning on a power supply main switch of the LCR test instrument, turning on an air pressure switch, and setting the applied pressure and the pressing time;
Step two: and (3) coil installation: selecting a coil with the line width of 1.0-2.0mm, the line distance of 0.1-0.2mm, the number of turns of 10-20 turns and the thickness of 1.0-2.0o/z, connecting the coil with an LCR test instrument through a metal wire, fixing the coil in a groove of a lower table top on the test instrument after connecting the coil, and opening the LCR test instrument;
step three: placing a film with the thickness of 0.10-0.50mm on the lower table top of the test fixture, confirming the value of the inductance Ls, and stabilizing the value at 7.951uh normal;
Step four: placing a piece of wave-absorbing material with known thickness on the lower table surface of the test fixture, pressing down the upper pressing plate through a lower pressing cylinder, reading out inductance value data by an LCR test instrument, and rising the upper pressing plate to judge and refer to an inductance value and thickness standard correspondence table;
step five: repeating the above step four can continuously determine whether the inductance value of the wave-absorbing material with known thickness is qualified or not through a plurality of times of single Zhang Celiang.
Further, the pressure applied in the first step is 2-5kg/cm2, and the pressing time is 2-5s.
The beneficial effects achieved by the invention are as follows:
The test fixture is divided into an upper layer and a lower layer, namely a lower table surface is fixed, a middle groove is formed to fix a coil in the groove, a film is placed on the lower table surface, a lower pressing cylinder drives an upper pressing plate to move up and down and bring certain pressure, the upper pressing plate and the lower pressing plate are in close contact with each other, an LCR test instrument is used for connecting the coil through a metal wire, the inductance value of a wave-absorbing material is measured, and whether the inductance value of the wave-absorbing material is qualified or not is judged by referring to an inductance value and thickness standard correspondence table so as to detect the product performance.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are needed in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments described in the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of the connection of a coil and an LCR test instrument of the present invention.
Fig. 2 is a side view of the test fixture.
Fig. 3 is a front view of the test fixture.
Fig. 4 is a cross-sectional view of the lower mesa.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention.
Example 1
As shown in fig. 1-4, the inductance testing device of the wave-absorbing material is used for detecting the inductance value of the wave-absorbing material, and comprises an LCR testing instrument 1, a coil 2 and a testing jig; the model of the LCR test instrument 1 is taiwan weft fixing LCR-8110G, and the structure and the working principle of the LCR test instrument 1 are the prior art and are not described in detail herein; the LCR test instrument 1 is connected with the coil 2 through a metal wire 4; the coil 2 is arranged in the test jig;
The test fixture comprises a base 301, a lower table top 302, an upper pressing plate 303, a lower pressing cylinder 304, an upright post 305, a top plate 306, a groove 307 and a film 308; the lower table top 302 is fixed above the base 301; the base 301 is provided with a fixed bracket at the rear of the lower table top 302; the fixing bracket comprises an upright post 305 fixedly arranged at the rear end of the base 301 and a top plate 306 fixedly arranged at the top of the upright post 305; the top plate 306 is located directly above the lower table 302; the lower table top 302 is provided with a groove 307; the coil 2 is arranged in the groove 307; a lower pressure cylinder 304 is fixedly arranged on the top plate 306; an upper pressing plate 303 is arranged between the top plate 306 and the lower table top 302; a piston rod of the lower pressing cylinder 304 penetrates through the top plate 306 to be fixedly connected with the upper pressing plate 303, and drives the upper pressing plate 303 to move up and down; the lower mesa 302 is provided with a membrane 308.
Further, the upper platen 303 includes an upper plate body 401, a lower plate body 402, and a pressure spring 403; the upper plate body 401 and the lower plate body 402 are connected through five pressure springs 403; the five pressure springs 403 are respectively disposed at the center and four corners of the upper pressure plate 303.
Further, the line width of the coil 2 is 1.0-2.0mm, the line distance is 0.1-0.2mm, the number of turns is 10-20, and the thickness is 1.0-2.0o/z; the coil 2 is a PI+copper+protective film double-sided board product.
Further, the thickness of the film 308 is in the range of 0.10-0.50mm.
Further, the film 308 is a PET film or a PI film.
Example 2
An inductance test method of a wave-absorbing material comprises the following steps:
step one: turning on a power supply main switch of the LCR test instrument 1, turning on an air pressure switch, setting an application pressure and a pressing time, wherein the application pressure range is 2-5kg/cm < 2 >, and the pressing time is 2-5s;
Step two: and (2) installing a coil 2: selecting a coil 2 with a line width of 1.0-2.0mm, a line distance of 0.1-0.2mm, a number of turns of 10-20 and a thickness of 1.0-2.0o/z, connecting the coil 2 with an LCR test instrument 1 through a metal wire 4, fixing the coil 2 in a groove 307 of a lower table top 302 on a test fixture after connecting, and opening the LCR test instrument 1;
Step three: placing a film 308 with the thickness of 0.10-0.50mm on the lower table top 302 of the test fixture, confirming the value of the inductance Ls, and stabilizing at 7.951uh to be normal;
Step four: placing a piece of wave-absorbing material with known thickness on a lower table top 302 on a test fixture, pressing an upper pressing plate 303 by a lower pressing cylinder 304, reading out inductance value data by an LCR test instrument 1, and lifting the upper pressing plate 303 to judge and refer to an inductance value and thickness standard correspondence table (shown in the following table 1);
step five: repeating the above step four can continuously determine whether the inductance value of the wave-absorbing material with known thickness is qualified or not through a plurality of times of single Zhang Celiang.
Table 1 shows the correspondence between inductance and thickness
The above embodiments are merely illustrative of the preferred embodiments of the present invention, and the present invention is not limited to the above embodiments, and various modifications and improvements made by those skilled in the art to the technical solutions of the present invention without departing from the design concept of the present invention should fall within the protection scope of the present invention, and the claimed technical content of the present invention is fully described in the claims.
Claims (7)
1. An inductance testing device of a wave-absorbing material, which is characterized in that: comprises an LCR test instrument (1), a coil (2) and a test jig; the LCR test instrument (1) is connected with the coil (2) through a metal wire (4); the coil (2) is arranged in the test jig;
The testing jig comprises a base (301), a lower table top (302), an upper pressing plate (303), a lower pressing cylinder (304), an upright post (305), a top plate (306), a groove (307) and a film (308); the lower table top (302) is fixed above the base (301); the base (301) is provided with a fixed bracket behind the lower table top (302); the fixed support comprises an upright post (305) fixedly arranged at the rear end of the base (301) and a top plate (306) fixedly arranged at the top of the upright post (305); the top plate (306) is positioned right above the lower table top (302); a groove (307) is formed in the lower table top (302); a coil (2) is arranged in the groove (307); a lower pressure cylinder (304) is fixedly arranged on the top plate (306); an upper pressing plate (303) is arranged between the top plate (306) and the lower table top (302); a piston rod of the lower pressing cylinder (304) penetrates through the top plate (306) to be fixedly connected with the upper pressing plate (303) and drives the upper pressing plate (303) to move up and down; the lower table top (302) is provided with a film (308).
2. The inductance testing device of claim 1, wherein: the upper pressing plate (303) comprises an upper plate body (401), a lower plate body (402) and a pressure spring (403); the upper plate body (401) and the lower plate body (402) are connected through five pressure springs (403); the five pressure springs (403) are respectively arranged at the center and four corners of the upper pressing plate (303).
3. The inductance testing device of claim 1, wherein: the line width of the coil (2) is 1.0-2.0mm, the line distance is 0.1-0.2mm, the number of turns is 10-20, and the thickness is 1.0-2.0o/z; the coil (2) is a PI+copper+protective film double-sided board product.
4. The inductance testing device of claim 1, wherein: the film (308) has a thickness in the range of 0.10-0.50mm.
5. The inductance testing device of claim 1, wherein: the film (308) is a PET film or a PI film.
6. The inductance test method of the wave-absorbing material is characterized by comprising the following steps of: an inductance testing device applied to the wave-absorbing material according to any one of claims 1 to 5, comprising the steps of:
Step one: turning on a power supply main switch of the LCR test instrument (1), turning on an air pressure switch, and setting the application pressure and the pressing time;
Step two: and (3) installing a coil (2): selecting a coil (2) with a line width of 1.0-2.0mm, a line distance of 0.1-0.2mm, a number of turns of 10-20 and a thickness of 1.0-2.0o/z, connecting with an LCR test instrument (1) through a metal wire (4), fixing the coil (2) in a groove (307) of a lower table top (302) on a test fixture after connecting, and opening the LCR test instrument (1);
Step three: placing a film (308) with the thickness of 0.10-0.50mm on a lower table top (302) on the test jig, confirming the value of the inductance Ls, and stabilizing at 7.951uh normal;
Step four: placing a piece of wave-absorbing material with known thickness on a lower table top (302) on a test fixture, pressing down an upper pressing plate (303) through a lower pressing cylinder (304), reading out inductance value data by an LCR test instrument (1), and lifting the upper pressing plate (303), so as to judge and refer to an inductance value and thickness standard correspondence table;
reference to the following table is made to the table corresponding to the inductance value and thickness standard:
；
step five: repeating the above step four can continuously determine whether the inductance value of the wave-absorbing material with known thickness is qualified or not through a plurality of times of single Zhang Celiang.
7. The method for testing the inductance of a wave-absorbing material according to claim 6, wherein: the pressure applied in the first step is 2-5kg/cm < 2 >, and the pressing time is 2-5s.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811469202.5A CN109406882B (en) | 2018-12-03 | 2018-12-03 | Inductance testing device and method for wave-absorbing material |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811469202.5A CN109406882B (en) | 2018-12-03 | 2018-12-03 | Inductance testing device and method for wave-absorbing material |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109406882A CN109406882A (en) | 2019-03-01 |
| CN109406882B true CN109406882B (en) | 2024-04-16 |
Family
ID=65456757
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811469202.5A Active CN109406882B (en) | 2018-12-03 | 2018-12-03 | Inductance testing device and method for wave-absorbing material |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109406882B (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111366882A (en) * | 2018-12-26 | 2020-07-03 | 江苏蓝沛新材料科技有限公司 | Method for testing electromagnetic performance of wave-absorbing material |
| CN111505547B (en) * | 2020-05-11 | 2022-06-28 | 苏州超弦新材料有限公司 | Rapid detection method for magnetic permeability of wave-absorbing powder |
| CN111487482A (en) * | 2020-05-22 | 2020-08-04 | 苏州天准科技股份有限公司 | Nanocrystalline material electrical property detection device and nanocrystalline material detection system |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4507602A (en) * | 1982-08-13 | 1985-03-26 | The United States Of America As Represented By The Secretary Of The Air Force | Measurement of permittivity and permeability of microwave materials |
| JPS61134677A (en) * | 1984-12-06 | 1986-06-21 | Yokohama Rubber Co Ltd:The | Electric wave absorbing performance measuring device |
| DE3626034A1 (en) * | 1986-08-01 | 1988-02-11 | Siemens Ag | Method for automatically testing pot-core coils |
| CN1790046A (en) * | 2004-12-16 | 2006-06-21 | 刘林生 | Online test structure for magnetism characteristic of MEMS film |
| WO2015043347A1 (en) * | 2013-09-25 | 2015-04-02 | Byd Company Limited | Wave absorbing material and method of preparing the same |
| CN105911365A (en) * | 2016-06-18 | 2016-08-31 | 南京先磁新材料科技有限公司 | Wave absorbing material performance testing method |
| CN107918057A (en) * | 2016-10-11 | 2018-04-17 | 联合汽车电子有限公司 | The measuring method and its measuring system of ignition coil primary inductance |
| CN108362948A (en) * | 2018-03-10 | 2018-08-03 | 葛理想 | Full-automatic LCR inductance measurements device and its test method |
| CN209280811U (en) * | 2018-12-03 | 2019-08-20 | 江苏蓝沛新材料科技有限公司 | A kind of inductance measurement device of absorbing material |
-
2018
- 2018-12-03 CN CN201811469202.5A patent/CN109406882B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4507602A (en) * | 1982-08-13 | 1985-03-26 | The United States Of America As Represented By The Secretary Of The Air Force | Measurement of permittivity and permeability of microwave materials |
| JPS61134677A (en) * | 1984-12-06 | 1986-06-21 | Yokohama Rubber Co Ltd:The | Electric wave absorbing performance measuring device |
| DE3626034A1 (en) * | 1986-08-01 | 1988-02-11 | Siemens Ag | Method for automatically testing pot-core coils |
| CN1790046A (en) * | 2004-12-16 | 2006-06-21 | 刘林生 | Online test structure for magnetism characteristic of MEMS film |
| WO2015043347A1 (en) * | 2013-09-25 | 2015-04-02 | Byd Company Limited | Wave absorbing material and method of preparing the same |
| CN105911365A (en) * | 2016-06-18 | 2016-08-31 | 南京先磁新材料科技有限公司 | Wave absorbing material performance testing method |
| CN107918057A (en) * | 2016-10-11 | 2018-04-17 | 联合汽车电子有限公司 | The measuring method and its measuring system of ignition coil primary inductance |
| CN108362948A (en) * | 2018-03-10 | 2018-08-03 | 葛理想 | Full-automatic LCR inductance measurements device and its test method |
| CN209280811U (en) * | 2018-12-03 | 2019-08-20 | 江苏蓝沛新材料科技有限公司 | A kind of inductance measurement device of absorbing material |
Non-Patent Citations (2)
| Title |
|---|
| 一种电感测试辅助夹具制作技术探讨;代伟;;印制电路信息(第09期);69-70 * |
| 吸波材料吸波性能的评价测试方法研究进展;贠凯迪等;合成纤维;第47卷(第11期);41-44、51 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN109406882A (en) | 2019-03-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN109406882B (en) | Inductance testing device and method for wave-absorbing material | |
| CN202661489U (en) | Electric core size and insulating property detection fixture | |
| CN103389452B (en) | Manual fast lifting pressing formula probe test instrument | |
| CN105424590A (en) | Sensor and detection method for atmosphere corrosion detection of steel member or test piece | |
| CN103293430B (en) | Method for detecting short-circuit fault occurring between iron cores of main transformer with stacked iron cores | |
| CN204631176U (en) | A kind of battery short circuit test machine | |
| CN204424222U (en) | Photovoltaic module electric performance testing device | |
| CN209280811U (en) | A kind of inductance measurement device of absorbing material | |
| CN206671370U (en) | A kind of multi-functional clamp for chip capacitor electric performance test | |
| CN203658494U (en) | Chip tantalum capacitor independent current limiting aging plate | |
| CN203377839U (en) | Manual voltage boosting and reducing pin-type probe detector | |
| CN211785654U (en) | Single-layer chip type ceramic dielectric capacitor test fixture | |
| CN209486246U (en) | A kind of testing piece and test device for SMD power device | |
| CN209342773U (en) | A kind of mobile phone center resistance detection equipment | |
| CN203502443U (en) | Chip solid capacitor test fixture | |
| CN203745573U (en) | ICT test needle bed | |
| CN209707634U (en) | The detection device of insulation performance under a kind of environment for cable high-temperature | |
| CN205920013U (en) | A anchor clamps for obtaining AGMI effect | |
| CN207779679U (en) | Intelligent measurement clamp spring mechanism | |
| CN205120645U (en) | Gas sensor chip | |
| CN206410675U (en) | A kind of circuit board strip surveys pressure-resistant calibrator | |
| WO2011154910A2 (en) | System and method for monitoring pv device | |
| CN206253551U (en) | A kind of forcing press punching press tonnage monitoring device | |
| CN205595310U (en) | Semiconductor device is with test seat | |
| CN110794245A (en) | Detection system and detection method for electromagnetic interference resistance of pressure sensor |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20210312 Address after: 578-1, Yanxin Road, Huishan Economic Development Zone, Wuxi City, Jiangsu Province Applicant after: Wuxi lanpei New Material Technology Co.,Ltd. Address before: No. 280, Fumin Road, Changzhou Economic Development Zone, Changzhou City, Jiangsu Province 213025 Applicant before: JIANGSU LINEPRINTING MATERIALS Co.,Ltd. |
|
| TA01 | Transfer of patent application right | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |