CN109359571B - Fingerprint sensor latch recovery mechanism based on status monitoring and handshaking - Google Patents
Fingerprint sensor latch recovery mechanism based on status monitoring and handshaking Download PDFInfo
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- CN109359571B CN109359571B CN201811158162.2A CN201811158162A CN109359571B CN 109359571 B CN109359571 B CN 109359571B CN 201811158162 A CN201811158162 A CN 201811158162A CN 109359571 B CN109359571 B CN 109359571B
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V40/00—Recognition of biometric, human-related or animal-related patterns in image or video data
- G06V40/10—Human or animal bodies, e.g. vehicle occupants or pedestrians; Body parts, e.g. hands
- G06V40/12—Fingerprints or palmprints
- G06V40/13—Sensors therefor
- G06V40/1329—Protecting the fingerprint sensor against damage caused by the finger
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F21/30—Authentication, i.e. establishing the identity or authorisation of security principals
- G06F21/31—User authentication
- G06F21/32—User authentication using biometric data, e.g. fingerprints, iris scans or voiceprints
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Abstract
Devices and methods are provided for recovering from a latched state of a fingerprint sensor device. For example, the disclosed apparatus may be operable to perform operations comprising: receiving, at a microcontroller of a fingerprint sensor device, raw sensor data from a sensor array in communication with the microcontroller; comparing the received raw sensor data to a predetermined threshold; and resetting power to the fingerprint sensor device to recover from the latched state based at least in part on the comparison.
Description
The present application is a divisional application of chinese patent application 201510782897.2 entitled "latch recovery mechanism for fingerprint sensor based on status monitoring and handshaking" filed on 11/16/2015.
Technical Field
The invention relates to latch recovery for sensor pixel circuits used in fingerprint identification.
Background
Various electronic devices or information systems may employ user authentication mechanisms to protect personal data and prevent unauthorized access. User authentication on an electronic device or information system may be performed through one or more forms of personal identification and authentication methods, including one or more biometric identifiers. The biometric identifier may be used alone or in addition to conventional authentication methods such as cryptographic authentication methods. A popular form of biometric identifier is a fingerprint pattern of an individual. The fingerprint sensor may be built into the electronic device to read a fingerprint pattern of the user such that the device can only be unlocked by an authorized user of the device through authentication of the fingerprint pattern of the authorized user. In some implementations, such a fingerprint sensor may include sensor pixel circuitry having pixelated pixel sensor elements for capturing a fingerprint pattern for user identification.
Disclosure of Invention
This document describes techniques for providing devices, systems, and techniques to perform latch recovery of fingerprint sensor circuits based in part on state monitoring and handshaking mechanisms.
The techniques described herein may provide a mechanism for recovering from a latched state of a sensor pixel circuit used in a fingerprint identification system.
In one aspect, a method of recovering from a latched state of a fingerprint sensor device is described. The method includes receiving, at a microcontroller of a fingerprint sensor device, raw sensor data from a sensor array in communication with the microcontroller. The method includes comparing the received raw sensor data to a predetermined threshold. The method includes resetting power to the fingerprint sensor device to recover from the latched state based at least in part on the comparison.
The method can be implemented in various ways to include one or more of the following features. Resetting power to the fingerprint sensor device to recover from the latched state based at least in part on the comparison may include determining that the fingerprint sensor is in the latched state when the received raw sensor data fails to meet a predetermined threshold. Resetting power provided to the fingerprint sensor device includes: turning off a Low Dropout (LDO) regulator to turn off power to the fingerprint sensor device; maintaining the power down for a period of time to recover from the latched state; and turning on the LDO regulator again to restore power to the fingerprint sensor device.
In another aspect, a method of recovering from a latched state of a device including a fingerprint sensor device is described. The method includes reading, at a host processor of the device, an initial check code stored in a memory. The method includes reading, at a host processor, a check code computed by a microcontroller of the fingerprint sensor device. The method includes comparing the two read check codes for matching; and resetting the microcontroller to recover from the latched state based at least in part on the comparison.
The method can be implemented in various ways to include one or more of the following features. Resetting the microcontroller based at least in part on the comparison may include determining that the microcontroller is in a latched state when the compared check codes do not match.
In another aspect, a method of recovering from a latched state of a device including a fingerprint sensor device is described. The method includes requesting, at a host processor of the device, a handshake confirmation with a microcontroller of the fingerprint sensor device. The method includes resetting the microcontroller upon determining that the microcontroller fails to complete the handshake confirmation of the request.
The methods described herein may be implemented in a device that includes a fingerprint sensor device without the use of additional hardware.
In another aspect, a fingerprint sensor device includes a sensor array that detects raw fingerprint sensor data; a power supply controller electrically connected between the sensor array and a power supply to control the transfer of power from the power supply to the sensor array; and a microcontroller in communication with the sensor array and the power controller. The microcontroller may perform the following operations, including: receiving detected raw sensor data from a sensor array; the method further includes comparing the received raw sensor data to a predetermined threshold indicative of a latched state and, based at least in part on the comparison, sending a signal to the power controller to cause the power controller to reset power provided to the fingerprint sensor device to recover from the latched state.
The fingerprint sensor device may be implemented in various ways to include one or more of the following features. For example, the power supply controller may include a Low Dropout (LDO) regulator. The microcontroller may determine that the fingerprint sensor is in a latched state when the received raw sensor data fails to meet a predetermined threshold. The microcontroller may send a signal that includes a signal to shut down the power supply controller to cut off power from the power supply. The microcontroller may cause the power controller to remain off for a period of time during which power is cut off and restored from the latched state. The microcontroller may again turn on the power supply controller to restore power to the fingerprint sensor device.
In yet another aspect, the electronic device may include a fingerprint sensor device. The fingerprint sensor device may include a sensor array configured to detect raw fingerprint sensor data, and a microcontroller in communication with the sensor array, the microcontroller configured to calculate a check code. The electronic device may include a host processor in communication with the microcontroller of the fingerprint sensor device. The host processor may perform operations including: the method includes the steps of reading an initial check code stored in a memory, reading a check code calculated by a microcontroller of the fingerprint sensor device, comparing the two read check codes to obtain an indication that the microcontroller is in a latched state, and resetting the microcontroller to recover from the latched state based at least in part on the comparison.
The electronic device may be implemented in various ways to include one or more of the following features. For example, the host processor may determine that the microcontroller is in a latched state when the compared check codes do not match. The electronic device may comprise a smartphone, tablet, laptop, or wearable device.
In yet another aspect, the electronic device may include a fingerprint sensor device. The fingerprint sensor device may include a sensor array to detect raw fingerprint sensor data and a microcontroller in communication with the sensor array. The electronic device may include a host processor in communication with the microcontroller of the fingerprint sensor device. The host processor may perform operations including: requesting a handshake confirmation with a microcontroller of the fingerprint sensor device, and resetting the microcontroller when it is determined that the microcontroller fails to complete the handshake confirmation of the request.
The electronic device may be implemented to include one or more of the following features. For example, when the host processor determines that the microcontroller fails to complete the handshake acknowledgement of the request, the host processor may determine that the microcontroller is in a latched state.
In some implementations, latch-up detection and recovery described herein may be implemented in a device that includes a fingerprint sensor device and dedicated electrostatic discharge detection circuit hardware.
For example, a fingerprint sensor device for an electronic device may include a sensor array that detects raw fingerprint sensor data; a microcontroller in communication with the sensor array; and an electrostatic discharge detection circuit in communication with the sensor array and the microcontroller. The electrostatic discharge detection circuit may perform operations including: detecting an abnormal voltage or current signal indicative of an electrostatic discharge event, and bypassing the clock signal by the microcontroller to stop device operation.
The fingerprint sensor device may be implemented in various ways to include one or more of the following features. For example, the electrostatic discharge detection circuit may cause the detected abnormal voltage or current signal to be discharged. The electrostatic discharge detection circuit may re-enable the clock signal after the discharge. The electrostatic discharge detection circuit may communicate the electrostatic discharge event with the microcontroller.
In yet another aspect, an electronic device includes a host processor and a fingerprint sensor device in communication with the host processor. The fingerprint sensor device includes: the fingerprint sensor system includes a sensor array configured to detect raw fingerprint sensor data, a microcontroller in communication with the sensor array, and an electrostatic discharge detection circuit in communication with the sensor array and the microcontroller. The electrostatic discharge detection circuit may perform operations including: detecting an abnormal voltage or current signal indicative of an electrostatic discharge event, and bypassing the clock signal by the microcontroller to stop device operation.
The electronic device may be implemented in various ways to include one or more of the following features. For example, the electrostatic discharge detection circuit may cause the detected abnormal voltage or current signal to be discharged. The electrostatic discharge detection circuit may re-enable the clock signal after the discharge. The electrostatic discharge detection circuit may communicate the electrostatic discharge event with the microcontroller and the host processor. The host processor may perform self-tests and restore state and logic processes. The microcontroller may perform self-tests and restore state and logic processes.
In yet another aspect, a method of recovering from a latched state of an electronic device including a fingerprint sensor device is disclosed. The method includes detecting an abnormal voltage or current signal indicative of an electrostatic discharge event at an electrostatic discharge detection circuit; and bypassing the clock signal to stop causing errors in the operation of the electronic device.
The method can be implemented in various ways to include one or more of the following features. For example, the method may include discharging the detected abnormal voltage or current. The method may include re-enabling the clock signal after discharging. The method may include indicating the electrostatic discharge event to a microcontroller and a host processor. The method may include performing self-tests and restoring state and logic processes at the host processor. The method may include performing self-tests and restoring state and logic processes at the microcontroller.
The above and other aspects and implementations thereof are described in more detail in the accompanying drawings, description and claims.
Drawings
FIG. 1 is a block diagram illustrating an exemplary latch recovery mechanism implemented in a device having a fingerprint sensor.
FIG. 2 is a process flow diagram of an exemplary process for comparing detection of a latch-up condition based on raw sensor output data.
FIG. 3 is a process flow diagram of an exemplary process for performing latch detection and recovery based on check code validation.
FIG. 4 is a process flow diagram of an exemplary process for performing latch detection and recovery based on handshake confirmation.
FIG. 5 is a block diagram illustrating another exemplary latch recovery mechanism implemented in a device having a fingerprint sensor.
FIG. 6 is a process flow diagram of an exemplary process for detecting a latch-up condition based on electrostatic discharge (ESD) detection.
Detailed Description
In devices that include fingerprint circuits, electrostatic discharge (ESD) can cause excessive power to flow through the fingerprint circuit and device, causing a latched state of the fingerprint circuit and device. Furthermore, ESD events can damage the fingerprint circuit and the device and even cause injury to a user in contact with the device. Due to an array of sensing electrodes (e.g. capacitive or otherwise) arranged close to a sensing surface of a device where a user's finger is placed to perform fingerprint recognition, ESD may enter the device with fingerprint circuitry. A user's finger touching the sensing surface to initiate fingerprint detection can cause ESD.
Because fingerprint circuits are often disposed at a physical distance from other computing components of a device, such as a processor or controller, ESD that causes excessive power to flow through the fingerprint circuit can flow through a nearby placed processor or controller and cause the processor and controller to malfunction. The technology disclosed in this document describes mechanisms for detecting a latch state and recovering from the detected latch state. The described mechanism for detecting and recovering from a latch condition does not rely on or require additional circuitry or other hardware. The latch detection and recovery mechanism described may be implemented using existing hardware, such as a host processor and a fingerprint sensor device including a microcontroller.
Fig. 1 is a block diagram illustrating an exemplary latch recovery mechanism implemented in a device 100 having a fingerprint sensor. Device 100 may be any electronic device that includes a fingerprint sensor for providing secure access to device 100. For example, device 100 may comprise a portable device, such as a smartphone, tablet, laptop, smart watch, and the like. The device 100 includes various electronic circuits and components, such as a host processor 102 (e.g., a chip) communicatively coupled with a fingerprint sensor device 110. The host processor 102 communicates with the fingerprint sensor device 110 to receive sensor data from the sensor array 106 included in the fingerprint sensor device 110. The host processor communicates with the fingerprint sensor device 110 by performing a handshake with a microcontroller unit (MCU)104 in the fingerprint sensor device 110. Upon completion of a successful handshake between host processor 102 and MCU 104, host processor 102 and fingerprint sensor device 110 may communicate with each other to send and receive various signals including requests, commands, data, and the like. An example of a signal transmitted between host processor 102 and MCU 104 is shown in FIG. 1 as reference numeral 108.
When ESD or other interference causes a latch-up condition, the fingerprint sensor device 110 and the host processor 102 may be affected. FIG. 2 is a process flow diagram of an exemplary process for comparing detection of a latch-up condition based on raw sensor output data. Fingerprint sensors 106 that enter a latched state due to ESD or other interference may be detected based on raw sensor output data from individual sensors in sensor array 106. MCU 104 may receive raw data from sensors in sensor array 106. When MCU 104 determines that the received raw sensor data is greater than a predetermined threshold, fingerprint sensor device 106 is determined not to be in a latched state. This normal operation is shown as a normal loop on the left hand side of the flowchart. When MCU 104 determines that the received raw sensor data is less than the predetermined threshold, MCU 104 determines that fingerprint sensor device 106 is in a latched state and MCU 104 resets the power provided to fingerprint sensor device 106 to recover from the latched state. The process of recovering from the latched state may include turning off the LDO to turn off power to the fingerprint sensor device 106; keeping power off for a period of time required to recover from the latched state; and turning on the LDO again to restore power to the fingerprint sensor device 106.
FIG. 3 is a process flow diagram of an exemplary process for performing latch detection and recovery based on check code validation. When an ESD or other interference affects MCU 104, MCU 104 may itself enter a latch-up state. In the event that MCU 104 is unable to perform latch recovery, host processor 102 may perform latch recovery. When MCU 104 is in the latched state, the SRAM segments with constants will change. The host may determine whether MCU 104 is in a latched state by comparing the initial check code to the check code calculated by MCU 104. The latch recovery process performed by the host processor 102 may include: reading an initial check code; reading the check code calculated by MCU 104; and comparing whether the two check codes match. When the two check codes do not match, host processor 102 determines that MCU 104 is in a latched state and will reset MCU 104. This abnormal or latched state is represented by the abnormal loop on the right hand side of the process flow diagram. When host processor 102 determines that the two check codes match, host processor 102 determines that MCU 104 is not in a latched state and will not reset MCU 104. This normal operation is represented by the normal loop on the left hand side of the process flow diagram. Host processor may continue to compare the two check codes to determine whether MCU 104 is in a latched state.
FIG. 4 is a process flow diagram of an exemplary process for performing latch detection and recovery based on handshake confirmation. In some implementations, host processor 102 may determine whether MCU 104 is in a latched state based on completion of the handshake acknowledgement. When MCU 104 is in a latched state, the code segments of the MCU may be altered due to ESD or other interference. When the code section of the MCU is changed, host processor 102 cannot complete a handshake with MCU 104 if its program runs off. When host processor 102 determines that MCU 104 has not completed the handshake with host processor 102, host processor determines that MCU 104 is in a latched state and will reset MCU 104. This abnormal operation is represented by an abnormal loop on the right hand side of the process flow diagram. When host processor 102 determines that MCU 104 completes the handshake acknowledgement, host processor 102 determines that MCU 104 is not in a latched state and host processor 102 will not reset the MCU.
Fig. 5 is a block diagram illustrating another exemplary latch recovery mechanism implemented in a device 500 having a fingerprint sensor 510. Device 500 may be any electronic device that includes a fingerprint sensor device for providing secure access to device 500. For example, device 500 may include a portable device such as a smartphone, tablet, laptop, smart watch, and the like. The device 500 includes various electronic circuits and components, such as a host processor 502 (e.g., a chip) communicatively coupled with a fingerprint sensor device 510. Host processor 502 communicates with fingerprint sensor device 510 to receive sensor data from sensor array 506 included in fingerprint sensor device 510. The host processor 502 communicates with the fingerprint sensor device 510 by performing a handshake with a microcontroller unit (MCU)504 in the fingerprint sensor device 510 via an input/output (I/O) interface 508. Upon completion of a successful handshake between the host processor 502 and the MCU 504 host, the host processor 502 and the fingerprint sensor device 510 may communicate with each other to send and receive various signals including requests, commands, data, and the like. Several examples of signals transferred between host processor 502 and MCU 504 via I/O interface 508 are shown in FIG. 5.
The MCU 504 controls the operation of the sensor array 506, including controlling power to the sensor array 506. Power control may be performed by utilizing the LDO regulator to turn on and off power from a power supply (VDD) to the sensor array 506. In addition, the transfer of various signals between MCU 504 and sensor array 506 may include TX, RX, and I2C (inter-integrated circuits). For example, sensor output data from each sensor in sensor array 506 may be transmitted to MCU 504 in response to a request from MCU 504. MCU 504 may relay or forward received sensor data to host processor 502 after or before processing.
In addition, ESD detection circuitry 512 communicates with MCU 504 and sensor array 506 to complete the recovery mechanism after a latch-up condition caused by an ESD event. ESD detection circuitry 512 may prevent high voltage signals generated by ESD events from directly interacting with electronic device 500, which may damage device 500. The ESD detection circuit may be implemented with different circuits including ESD discharge tubes or circuits.
For example, an ESD event may cause a high voltage (typically greater than 4000V) signal to enter the I/O interface 508, thereby increasing the voltage of the internal power supply. The ESD discharge tube in ESD detection circuit 512 may limit the voltage increase of the internal power supply beyond a threshold level. The ESD discharge tube in ESD detection circuit 512 may be opened to enable the I/O interface to discharge the previously stored charge and form a large current as an abnormal current or a high voltage as an abnormal voltage.
Fig. 6 is a process flow diagram of an exemplary process 600 for detecting a latch-up condition with an ESD detection circuit. The process 600 shows a normal loop on the left hand side and an abnormal loop on the right hand side. In an abnormal cycle, when ESD detection circuit 512 detects an abnormal voltage or current due to an ESD event, the ESD detection circuit bypasses the system or device clock (digital and analog) to stop system or device 500 from operating to avoid errors that may occur at the abnormal voltage or current. After discharging the abnormal current or voltage for a period of time, when the voltage or current returns to a normal operating range, the ESD detection circuit 512 may re-enable the system or device clock and notify the host processor 502 and MCU 504 of the abnormal condition that occurred. The host processor 502 and the MCU 504 may perform self-tests and restore the respective contexts (e.g., states and logical processes) until the recovery mechanism is completed.
The process 600 operates in a normal cycle when the current or voltage is within a normal operating range.
Various implementations and examples of the disclosed technology have been described. The disclosed technology utilizes an integrator for storing charge accumulated by a touch sensing capacitor, a voltage generator for outputting a variable voltage and adjusting the charge stored in parasitic capacitances, and a sensor pixel circuit with a dedicated integrator for performing integration across a set of parallel sensor pixel circuits to improve SNR. The sensor pixel circuit and fingerprint identification system described in this document provide accurate fingerprint identification without a metal ring.
While this application contains many specifics, these should not be construed as limitations on the scope of any invention or of what may be claimed, but rather as descriptions of features that may be specific to particular embodiments of particular inventions. Certain features that are described in this specification in the context of separate embodiments can also be implemented in combination in a single embodiment. Conversely, various features that are described in the context of a single embodiment can also be implemented in multiple embodiments separately or in any suitable subcombination. Furthermore, although features may be described above as acting in certain combinations and even initially claimed as such, one or more features from a claimed combination can in some cases be excised from the combination, and the claimed combination may be directed to a subcombination or variation of a subcombination.
Similarly, while operations are depicted in the drawings in a particular order, this should not be understood as requiring that such operations be performed in the particular order shown or in sequential order, or that all illustrated operations be performed, to achieve desirable results. Moreover, the separation of various system components in the embodiments described herein should not be understood as requiring such separation in all embodiments.
Only a few implementations and examples are described and other implementations, enhancements and variations can be made based on what is described and illustrated in this document.
Claims (6)
1. A method of recovering from a latched state of a device including a fingerprint sensor device, the method comprising:
requesting, by a host processor of the device, a handshake with a microcontroller of the fingerprint sensor device; and
determining whether the microcontroller is in a latched state based on a result of the handshake;
wherein the handshake comprises:
the host processor writes a preset value into a register of the microcontroller;
the host processor reads the value in the register after a preset time period; and
and comparing the written preset value with the read value to obtain a comparison result as a result of the handshake.
2. The method of claim 1, wherein the host processor determines that the microcontroller is in a latched state if the result indicates that the microcontroller fails to complete the requested handshake, and wherein the host processor causes the microcontroller to reset.
3. The method of claim 1, wherein the host processor determines that the microcontroller is not in a latched state if the result indicates that the microcontroller completes the handshake of the request, and wherein the host processor does not cause the microcontroller to reset.
4. An electronic device, comprising:
fingerprint sensor device, comprising:
a sensor array configured to detect raw fingerprint sensor data, an
A microcontroller in communication with the sensor array; and
a host processor of the electronic device in communication with the microcontroller of the fingerprint sensor device, the host processor configured to perform operations comprising:
requesting a handshake with the microcontroller of the fingerprint sensor device, an
Determining whether the microcontroller is in a latched state based on a result of the handshake;
wherein the handshake comprises:
the host processor writes a preset value into a register of the microcontroller;
the host processor reads the value in the register after a preset time period; and
and comparing the written preset value with the read value to obtain a comparison result as a result of the handshake.
5. The electronic device of claim 4, wherein the host processor is configured to determine that the microcontroller is in a latched state if the result indicates that the microcontroller fails to complete the requested handshake, and wherein the host processor causes the microcontroller to reset.
6. The electronic device of claim 4, wherein the host processor is configured to determine that the microcontroller is not in a latched state if the result indicates that the microcontroller completes the requested handshake, and wherein the host processor does not cause the microcontroller to reset.
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| CN201510782897.2A CN105608413B (en) | 2014-11-14 | 2015-11-16 | Fingerprint sensor latch recovery mechanism based on status monitoring and handshaking |
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| CN109359571A CN109359571A (en) | 2019-02-19 |
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| CN108064436A (en) * | 2017-11-21 | 2018-05-22 | 深圳市汇顶科技股份有限公司 | Biometric information transmission method for building up, device, system and storage medium |
| CN117175498B (en) * | 2023-11-03 | 2024-03-22 | 深圳贝特莱电子科技股份有限公司 | Intelligent door lock fingerprint sensor protection circuit and method |
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Also Published As
| Publication number | Publication date |
|---|---|
| CN105608413A (en) | 2016-05-25 |
| CN108985283A (en) | 2018-12-11 |
| CN109359571A (en) | 2019-02-19 |
| CN105608413B (en) | 2020-04-28 |
| CN108985284A (en) | 2018-12-11 |
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