CN109358075A - The detection device and its detection method of transparent material internal flaw - Google Patents
The detection device and its detection method of transparent material internal flaw Download PDFInfo
- Publication number
- CN109358075A CN109358075A CN201810994612.5A CN201810994612A CN109358075A CN 109358075 A CN109358075 A CN 109358075A CN 201810994612 A CN201810994612 A CN 201810994612A CN 109358075 A CN109358075 A CN 109358075A
- Authority
- CN
- China
- Prior art keywords
- detection
- transparent material
- detection platform
- rotary shaft
- product
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 56
- 239000012780 transparent material Substances 0.000 title claims abstract description 22
- 230000007547 defect Effects 0.000 claims abstract description 7
- 206010021703 Indifference Diseases 0.000 claims description 3
- 239000000284 extract Substances 0.000 claims description 3
- 238000007689 inspection Methods 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 abstract description 6
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8809—Adjustment for highlighting flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
- G01N2201/102—Video camera
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
The present invention provides the detection devices and its detection method of a kind of transparent material internal flaw, the detection device includes detection platform, photographing module, lighting module and rotation adjustment module, wherein rotation adjustment module adjusts the angle of detection platform, and take pictures in different angles, judge whether interiors of products has defect by photo that different angle is taken.The present invention has many advantages, such as structure accuracy rate that is simple, ingenious in design, easy to produce, reducing production cost, raising identification.
Description
Technical field
The present invention relates to a kind of technical field of optical detection, especially in regard to a kind of detection device of transparent material internal flaw
And its detection method.
Background technique
In the prior art, for transparent or light-transmitting materials surface defect detection, industry is carried out using optical principle
Detection, present industry often take two kinds of approach to be detected: the first, it is scanned using the quick light source of radium-shine or high energy；
It second, is recognized with human eye.It is expensive for the first, and major technique is controlled by foreign manufacturer, it is right
In second, accuracy rate is low, and human cost rises.
Summary of the invention
An object of the present invention be to provide a kind of structure it is simple, it is ingenious in design, easy to produce, reduce production cost, mention
The detection device of the transparent material internal flaw of the accuracy rate of height identification.
To reach above-mentioned purpose, the present invention adopts the following technical scheme: a kind of detection device of transparent material internal flaw,
It includes
The product of transparent material is placed on detection platform, surface；
Photographing module, is fixed on the top of the detection platform, the product below face,；
Lighting module is fixed on the lower section of the detection platform, the just opposite product of light source direction；Mould is adjusted with rotation
Block comprising rotary shaft and rotating electric machine, the rotary shaft are connected with the detection platform, the rotating electric machine and the rotation
Axis is connected, and the rotating electric machine drives the rotary shaft rotation, and the rotary shaft drives the detection platform rotation.
Further, the rotational angle of the detection platform is the angle with -90 ° to 90 ° of horizontal plane.
Further, fixed device is additionally provided in the detection platform, the fixed device sets up both sides separately, and described solid
Determine the adjustable distance of device.
Further, the light source of the lighting module is pencil light source.
That it is a further object of the present invention to provide a kind of structures is simple, ingenious in design, easy to produce, reduces production cost, mentions
The detection method of the transparent material internal flaw of the accuracy rate of height identification.
To reach above-mentioned purpose, the present invention adopts the following technical scheme: a kind of detection method of transparent material internal flaw,
It includes the following steps:
(1) standard sample is placed on the fixation device of detection platform and is fixed, then adjusted by rotation rotary shaft
The angle of detection platform is saved, the photo of at least three different angle is shot, as standard film；
(2) product of transparent material to be measured is placed on fixed device, then detection platform equally shoots at least three
The photo of different angle；
(3) photo of product is calculated with convolution algorithm, and extracts feature, then by the form of expression of feature and mark
Quasi- piece is compared；
(4) if difference occur reaches the type and severity that can determine that defect to a certain degree, if indifference exclusive or difference
It is smaller to be then believed that product is qualified.
Compared with prior art, the invention has the following beneficial effects:
1. simple in sturcture, ingenious in design, components needed for device itself are less and easy for installation, promote convenient for a wide range of
It uses.
2. manufacture easy to produce, can large-scale serial production, and spare and accessory parts structure is simple.
3. reducing production cost, the cost needs of equipment itself are reduced, while cost of labor also decreases.
4. improve accuracy rate, using multi-angle illumination and take pictures, different types of defect can all be strengthened, then
It is compared using convolution algorithm, it is more accurate to the inspection of defect.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of the detection device of transparent material internal flaw of the present invention.
Appended drawing reference are as follows: detection platform 20, photographing module 30, lighting module 40, rotation adjustment module 50, fixed device
21, rotary shaft 51 and rotating electric machine 52.
Specific embodiment
Technological means used by for the present invention is further explained and the beneficial effect reached, below in conjunction with attached drawing and implementation
Example elaborates.
The present invention provides a kind of detection devices of transparent material internal flaw, with reference to Fig. 1 comprising there is detection platform
20, photographing module 30, lighting module 40 and rotation adjustment module 50.Place the product of transparent material, inspection in 20 surface of detection platform
The rotational angle of platform 20 is surveyed as the angle with -90 ° to 90 ° of horizontal plane.Fixed device 21 is additionally provided in detection platform 20,
Fixed device 21 sets up both sides, and the fixed adjustable distance of device 21 separately.Photographing module 30 is fixed on the top of detection platform 20,
Product below its face.Lighting module 40 is fixed on the lower section of detection platform 20, and the just opposite product of light source direction illuminates mould
The light source of block 40 is pencil light source.Rotating adjustment module 50 includes rotary shaft 51 and rotating electric machine 52, and rotary shaft 51 and detection are flat
Platform 20 is connected, and rotating electric machine 52 is connected with rotary shaft 51, and rotating electric machine 52 drives rotary shaft 51 to rotate, and rotary shaft 51 drives detection
Platform 20 rotates.
The present invention also provides a kind of detection methods of transparent material internal flaw comprising following steps:
(1) standard sample is placed on the fixation device of detection platform and is fixed, then adjusted by rotation rotary shaft
The angle of detection platform is saved, the photo of at least three different angle is shot, as standard film；
(2) product of transparent material to be measured is placed on fixed device, then detection platform equally shoots at least three
The photo of different angle；
(3) photo of product is calculated with convolution algorithm, and extracts feature, then by the form of expression of feature and mark
Quasi- piece is compared；
(4) if difference occur reaches the type and severity that can determine that defect to a certain degree, if indifference exclusive or difference
It is smaller to be then believed that product is qualified.
Above description sufficiently discloses a specific embodiment of the invention.It should be pointed out that being familiar with the field
Range of any change that technical staff does a specific embodiment of the invention all without departing from claims of the present invention.
Correspondingly, the scope of the claims of the invention is also not limited only to previous embodiment.
Claims (5)
1. a kind of detection device of transparent material internal flaw, it is characterised in that: it includes
The product of transparent material is placed on detection platform, surface；
Photographing module is fixed on the top of the detection platform, the product below face；
Lighting module is fixed on the lower section of the detection platform, the just opposite product of light source direction；With
Rotate adjustment module comprising rotary shaft and rotating electric machine, the rotary shaft are connected with the detection platform, the rotation
Motor is connected with the rotary shaft, and the rotating electric machine drives the rotary shaft rotation, and the rotary shaft drives the detection flat
Platform rotation.
2. the detection device of transparent material internal flaw according to claim 1, it is characterised in that: the detection platform
Rotational angle is the angle with -90 ° to 90 ° of horizontal plane.
3. the detection device of transparent material internal flaw according to claim 1, it is characterised in that: in the detection platform
It is additionally provided with fixed device, the fixed device sets up both sides, and the adjustable distance of fixed device separately.
4. the detection device of transparent material internal flaw according to claim 1, it is characterised in that: the lighting module
Light source is pencil light source.
5. a kind of detection method of transparent material internal flaw comprising following steps:
(1) standard sample is placed on the fixation device of detection platform and is fixed, inspection is then adjusted by rotation rotary shaft
The angle of platform is surveyed, the photo of at least three different angle is shot, as standard film；
(2) product of transparent material to be measured is placed on fixed device, then detection platform equally shoots at least three difference
The photo of angle；
(3) photo of product is calculated with convolution algorithm, and extracts feature, then by the form of expression of feature and standard film
It is compared；
(4) if difference occur reaches the type and severity that can determine that defect to a certain degree, if indifference exclusive or difference is smaller
Then it is believed that product is qualified.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810994612.5A CN109358075A (en) | 2018-08-28 | 2018-08-28 | The detection device and its detection method of transparent material internal flaw |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810994612.5A CN109358075A (en) | 2018-08-28 | 2018-08-28 | The detection device and its detection method of transparent material internal flaw |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109358075A true CN109358075A (en) | 2019-02-19 |
Family
ID=65350078
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810994612.5A Pending CN109358075A (en) | 2018-08-28 | 2018-08-28 | The detection device and its detection method of transparent material internal flaw |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109358075A (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012122753A (en) * | 2010-12-06 | 2012-06-28 | Fujifilm Corp | Defect examination apparatus, defect examination method and manufacturing apparatus for lens sheets |
| CN202502057U (en) * | 2012-03-16 | 2012-10-24 | 北京大恒图像视觉有限公司 | Transparent capsule quality inspection machine |
| CN106932406A (en) * | 2017-04-28 | 2017-07-07 | 许迪 | A kind of device for detecting transparent substance defect |
| CN108267460A (en) * | 2018-02-26 | 2018-07-10 | 湖南科创信息技术股份有限公司 | For the matrix form vision detection system and method for transparent material defects detection |
| CN108344751A (en) * | 2018-03-20 | 2018-07-31 | 湖南科创信息技术股份有限公司 | Plate of material shape defect detecting system and method based on multichannel light source |
| CN209182266U (en) * | 2018-08-28 | 2019-07-30 | 盐城华科智造数据科技有限公司 | The detection device of transparent material internal flaw |
-
2018
- 2018-08-28 CN CN201810994612.5A patent/CN109358075A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012122753A (en) * | 2010-12-06 | 2012-06-28 | Fujifilm Corp | Defect examination apparatus, defect examination method and manufacturing apparatus for lens sheets |
| CN202502057U (en) * | 2012-03-16 | 2012-10-24 | 北京大恒图像视觉有限公司 | Transparent capsule quality inspection machine |
| CN106932406A (en) * | 2017-04-28 | 2017-07-07 | 许迪 | A kind of device for detecting transparent substance defect |
| CN108267460A (en) * | 2018-02-26 | 2018-07-10 | 湖南科创信息技术股份有限公司 | For the matrix form vision detection system and method for transparent material defects detection |
| CN108344751A (en) * | 2018-03-20 | 2018-07-31 | 湖南科创信息技术股份有限公司 | Plate of material shape defect detecting system and method based on multichannel light source |
| CN209182266U (en) * | 2018-08-28 | 2019-07-30 | 盐城华科智造数据科技有限公司 | The detection device of transparent material internal flaw |
Non-Patent Citations (2)
| Title |
|---|
| 熊长炜;舒雨锋;范四立;刘志伟;梅阳寒;: "基于Canny算子的透明物质缺陷检测", 信息与电脑(理论版) * |
| 苑玮琦;毕天宇;: "玻璃质量在线视觉检测系统光源的设计", 应用光学 * |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104375293B (en) | Automatic LCD screen detecting cabinet based on machine vision | |
| CN203824934U (en) | Optical system for mirror appearance inspection of trademark | |
| CN202330294U (en) | Surface defect detection device based on machine vision | |
| CN107607549A (en) | Glass defect detection device | |
| CN209406712U (en) | A kind of five axis dispenser systems | |
| CN110567973B (en) | Piston detection platform and method based on image acquisition | |
| CN105304541A (en) | Automatic semiconductor wafer positioning device | |
| CN206399628U (en) | A kind of shot detection system that position is linked for mechanical part | |
| CN106597704A (en) | Rotating device and display panel detection device | |
| CN110044926A (en) | A kind of lens defect detection device | |
| CN206411025U (en) | A kind of workpiece, defect automatic checkout system | |
| CN209182266U (en) | The detection device of transparent material internal flaw | |
| TWM443850U (en) | Automated optical inspection mechanism | |
| CN109358074B (en) | Device and method for detecting internal defects of transparent material | |
| CN109358075A (en) | The detection device and its detection method of transparent material internal flaw | |
| CN108393276A (en) | A kind of external diameter detection device for auto parts and components | |
| KR101758647B1 (en) | Inspection apparatus of non-planar display panel | |
| CN219162002U (en) | Multi-angle image acquisition device | |
| CN209356385U (en) | A kind of adjustable-angle glass check plate apparatus for placing | |
| CN114509442A (en) | 3D morphology acquisition method and device applied to article surface defect detection | |
| CN218766689U (en) | Transmission and detection device for detecting appearance defects of cover plate glass | |
| CN208066784U (en) | A kind of external diameter detection device for auto parts and components | |
| CN206095970U (en) | Planar defect specular reflection detection device in ABS ring gear | |
| CN209182265U (en) | The detection device of transparent material internal flaw | |
| CN203385675U (en) | Gear surface defect detection device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| TA01 | Transfer of patent application right | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20200605 Address after: 215000 room 908, building 1, building 188, Wang Dun Road, Suzhou Industrial Park, Jiangsu, China Applicant after: SUZHOU JIAZHAN TECHNOLOGY Co.,Ltd. Address before: 224100 Oriental No. 1 Creative Industrial Park, Dafeng District, Yancheng City, Jiangsu Province Applicant before: YANCHENG HUAKE ZHIZAO DATA TECHNOLOGY Co.,Ltd. |
|
| WD01 | Invention patent application deemed withdrawn after publication | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20190219 |