A kind of optical features PUF system for antifalsification label
Technical field
The present invention relates to a kind of optical features PUF systems, more particularly, to a kind of optical features PUF for antifalsification label
System.
Background technique
With the development of market economy and the raising of scientific and technological level, commercial material abundant is provided to people's life and is provided
Source also brings great convenience.But at the same time, fake and inferior commodities are expanded in geometry speed, have seriously affected economy
Benign development, upset normal market order, hinder enterprise long term growth, damage the legitimate rights and interests of consumer, to people
Physical and mental health and property safety cause to seriously threaten.Antifalsification label is current prevention for the purpose of cheating and without owner
Permit and carries out imitated or replicate movable most effective measure.Traditional antifalsification label includes package anti-counterfeiting, sticks on anti-false sign
And intension anti-counterfeiting mark etc..Package anti-counterfeiting uses disposable wrapping paper or packaging film, can have anti-counterfeiting characteristic
Anti-counterfeiting paper or anti false film;Stick on anti-false sign, using laser hologram, printing is anti-fake, core micropore is anti-fake, the anti-fake sum number of indicia distribution
Code is anti-fake etc., generally uses multiple integrated anti-counterfeit, and the modes such as available phone and mobile phone are representing its unique identities on commodity
Number is input into, and the true and false can be learnt from return information;Intension anti-counterfeiting mark is special using material in commodity or in commodity packaging
Sign, using material can not transfer replication, record and inspection using material characteristics amount reach the uniqueness used.Anti-counterfeiting characteristic
It is the soul of antifalsification label with recognition methods, needs to be tailored according to the characteristics of product, therefore how to choose and realize and is anti-fake
Technology is a great problem in current antifalsification label.
The concept of physics unclonable function (Physical Unclonable Functions, PUF), earliest by Pappu
Equal researchers propose in Science magazine, realize physical one-way function (Physical One- according to optical manipulation principle
Way Functions, POWFs), and identified for the strategic arms of weapon control treaty.PUF by extracts physical mechanism with
Machine build-in attribute generates unlimited number of distinctive data information, has the characteristics such as uniqueness, randomness and nonclonability, can
It is widely used in anti-fake Deng fields.Physics unclonable function is the important supplement of information security field hardware identification technology, will
PUF and antifalsification label fusion application, can be effectively protected the safety of information.PUF is unique random physical mode of taggant,
It cannot be replicated, and must be manufactured by the random process for providing a large amount of steady PUF labels.PUF label has physical patterns, such as
Fruit is read with suitable analysis tool, can be recorded and stored.PUF label is " key ", and storage pattern is " lock ".This group
Conjunction forms PUF key, provides the encryption that can not be cracked and strike is fake and forged.
(Cowburn, R.Laser surface authentication-reading Nature ' the s own of document 2
Security code.Contemp.Phys.49,331-342 (2008)) in disclose a kind of optics for antifalsification label and dissipate
Spot PUF system, the system are constantly to scan back and forth the surface of an object, then using the laser source being mounted on motor
Using diffusing after obtaining picture for non-mode of delivery, these pictures are handled, then go to compare with the result of true object
Compared with, come judgment object whether be forge.The influence by ambient light is easy during this diffusing reflection obtains image,
And it needs the faint acquisition imaging that diffuses, so that the CCD required precision of acquisition image is very high.Because of its scatterer
Surface is easy to be led to error by physical damnification, so stability and reliability be not high when certification.
Summary of the invention
It is higher for antifalsification label that technical problem to be solved by the invention is to provide a kind of stability and reliability
Optical features PUF system.
The technical scheme of the invention to solve the technical problem is: a kind of optical features for antifalsification label
PUF system, including at least one optics PUF sample, image collecting device and image processing apparatus, the optics PUF sample
Including rectangular substrate and the positive laser speckle for being attached to the substrate, the material of the substrate is glass, institute
The laser speckle stated is the black splotch of multiple random distributions, and the partial size of black splotch is 20~60 μm, and ingredient is acrylic acid,
The area of the laser speckle is the 0.45~0.55 of the front face area of the substrate;
The image collecting device includes infrared laser, the first directional hole, the second directional hole, the first reflecting mirror,
Two-mirror, third reflecting mirror, beam expanding lens, collimation lens, half-reflecting half mirror, the first CCD camera and the second CCD camera;It is described
Infrared laser, first directional hole, second directional hole and first reflecting mirror from left to right successively
Setting, first directional hole, second directional hole and first reflecting mirror are located at the infrared laser
Transmitting optical path on, the plane of incidence of the first reflecting mirror and the angle of horizontal direction are 45 degree, the infrared laser
The laser of transmitting pass sequentially through be incident on after the first positioning hole and the second location hole in the horizontal direction it is described
First reflecting mirror, second reflecting mirror are located at behind first reflecting mirror, and second reflecting mirror is located at institute
On the reflected light path for the first reflecting mirror stated, the plane of incidence of the second reflecting mirror and the angle of horizontal plane are 135 degree, described
Beam expanding lens be located at the left side of second reflecting mirror, the third reflecting mirror is located at the left side of the beam expanding lens, institute
The expansion multiplying power for the beam expanding lens stated is 20 times, and the beam expanding lens is located on the reflected light path of second reflecting mirror, described
Third reflecting mirror be located on the emitting light path of the beam expanding lens, the plane of incidence of the third reflecting mirror and horizontal direction
Angle is 135 degree, and the collimation lens is located on the reflected light path of the third reflecting mirror, the half-reflecting half mirror position
In on the emitting light path of the collimation lens, the angle between the reflecting surface and horizontal plane of the half-reflecting half mirror is 135
Degree, optics PUF sample described in one is arranged on the reflected light path of the collimation lens, and the back of optics PUF sample
Facing towards the half-reflecting half mirror, optics PUF sample just facing towards second CCD camera, the first CCD
Camera and second CCD camera are connect with the image processing apparatus respectively;When work, the infrared laser hair
The light beam penetrated is incident on institute at 45 degree in the horizontal direction after passing sequentially through the first positioning hole and the second location hole
The first reflecting mirror stated, light beam is by being incident on second reflecting mirror at 45 degree after the first reflecting mirror reflection and passing through
By entering in the beam expanding lens after the second reflecting mirror reflection, the beam expanding lens puts the beam diameter entered in it
It is incident in the third reflecting mirror at 45 degree again after big 20 times, light beam is incident on the standard by the third reflecting mirror
In straight lens, the light beam taken in it is adjusted to after collimated light beam into half anti-half described in 45 degree of intakes by the collimation lens
In lens, on the one hand the light beam being incident in it is reflected into the back side of the optics PUF sample by the half-reflecting half mirror,
On the one hand it transmits away by the first CCD camera capture, the light beam being incident on the optics PUF sample passes through described
Optics PUF sample on front after form optical features, which is captured and is shot by second CCD camera
To optical features figure, the image processing apparatus handles the optical features figure received, obtains optics PUF.
The material of the optics PUF sample is a length of 76.2mm, width 25.4mm, with a thickness of the clean of 1.0-1.2mm
Dustless transparent glass slide or side length are 22mm, with a thickness of the clean dustless transparent coverslip of 0.13-0.17mm.
The preparation process of the optics PUF sample are as follows:
A. it is placed on substrate is clean on a platform;
B. automatic paint spraying apparatus is used to spray partial size to substrate front at the 20cm height of substrate front for 20~60 μ
The acrylic coating drop of m, acrylic coating drop form the black splotch of multiple random distributions in substrate front;
C. it is placed on and stands 5-6 minutes in dust free room and obtain optics PUF sample.
The image processing apparatus handles the optical features image received, obtains the specific mistake of optics PUF
Journey are as follows:
(1) width is randomly selected from received optical features figure, the pixel of the optical features figure of selection is denoted as N × M,
Wherein, N is the horizontal pixel number of the second CCD camera, and M is longitudinal pixel number of the second CCD camera;
(2) gray processing processing is carried out to the optical features figure of selection, obtains N row × M column pixel grayscale image, and obtain ash
Spend the corresponding gray value of each pixel in figure;
(3) binary conversion treatment is carried out to the grayscale image of obtained N × M pixel, the specific steps are as follows:
I, newly-built one can store N row × M column data two-dimensional array;
II, sets an intermediate variable a, and a is initialized as to be more than or equal to 0 and an integer less than or equal to 255;
The corresponding gray value of pixel that jth row kth in grayscale image arranges is compared by III, with the current value of a, if the ash
Angle value is less than a, then arranges the jth row kth that 0 is stored in two-dimensional array, if the gray value is more than or equal to a, be stored in two for 1
The jth row kth of dimension group arranges, j=1,2 ..., N, k=1,2 ..., M;
IV, calculates the average value of N*M number of binaryzation array storage, which is denoted as b, and * is multiplication symbol,
B is determined:
If b is more than or equal to 0.48 and is less than or equal to 0.52, using currently available two-dimensional array as binaryzation array,
Enter step (4);
If b is not belonging to the number within the scope of 0.48-0.52, the value of first a is updated, regard the updated value of a as a
Current value, repeat step III and IV, until b be more than or equal to 0.48 and be less than or equal to 0.52, the two-dimensional array that will be finally obtained
As binaryzation array, (4) are entered step, wherein the specific renewal process of a are as follows: when b is less than 0.48, and between b and 0.48
When difference is not more than 0.1, the value of a is updated using the value that the current value of a subtracts c, c is the integer less than or equal to 10,
When b is less than 0.48, and the difference between b and 0.48 is greater than 0.1, the value of a is carried out plus the value of d using the current value of a
It updates, d is the integer less than or equal to 10, when b is greater than 0.52, and the difference between b and 0.52 is not more than 0.1, using working as a
The value that preceding value subtracts e is updated the value of a, and e is the integer greater than 10, when b is greater than 0.52, and the difference between b and 0.52
When value is greater than 0.1, the value of a is updated plus the value of f using the current value of a, f is the integer greater than 10;
(4) one is created for storing 1 row × N*M column data one-dimension array, assignment is carried out to the one-dimension array: by two
The number of the 1st row the 1st column of value array is stored in the 1st row the 1st column of the one-dimension array, the 1st row the 2nd column of binaryzation array
Number is stored in the 1st row the 2nd column of the one-dimension array, and so on, it is stored until by the number of the Nth row m column of binaryzation array
The 1st row N*M to the one-dimension array is arranged, and obtained one-dimension array is denoted as B;
(5) von Neumann processing is carried out to one-dimension array B, the specific steps are as follows:
A. judge whether N*M is even number, if N*M is not even number, increase by a column in one-dimension array B as one-dimensional
The 1st row N*M+1 of array B is arranged, and 1 is stored at this, if N*M is even number, is not dealt with, by one-dimension array B's
Current columns is denoted as M1;
B. one is created for storing the one-dimension array of von Neumann processing data, is denoted as Q, sets an intermediate change
P is measured, is assigned to p for 1;
C. using the array of the 1st row 2p-1 of the one-dimension array B number arranged and the 1st row 2p column at two bits, one
The number of the 1st row 2p-1 column of dimension group B is a high position for two bit, and the number of the 1st row 2p column of one-dimension array B is
The low level of two bit, if two bit is 10, in first vacancy from left to right of one-dimension array Q
Place's deposit 0, if two bit is 01, in one-dimension array Q first empty place deposit 1 from left to right, if should
Two bits are 11 or 00, then do not handle one-dimension array Q;
D. determine whether p is equal to N*M1/ 2, if it is not, the value after then adding 1 using the current value of p updates p, then return
Step c is returned, if be equal to, the storage of one-dimension array Q data is completed, using current one-dimension array Q as first time von Neumann
Array is handled, the columns of first time von Neumann processing array is denoted as M2;
(6) von Neumann processing is carried out to first time von Neumann processing array using step (5) identical method, obtained
Second of von Neumann handles array;
(7) second of von Neumann processing array is put into the test of NIST test software, if the P-value value of test item is complete
Both greater than significance 0.01, and this item data of Block Frequency is greater than 0.5, then it represents that second of von Neumann
It handles array to test by NIST, meets the condition of random number, otherwise cannot be tested by NIST, randomly select a width again at this time
The optical features figure of unselected mistake, return step (2) re-start processing, until obtaining second that meets random said conditions
Von Neumann handles array, and the columns of second of von Neumann for meeting random said conditions processing array is denoted as M3;
(8) array is handled to second of von Neumann for meeting random said conditions to recombinate, the specific steps are as follows:
S1. judge M3It can be expressed as square of some integer, if it can, then to second of Feng for meeting random said conditions
Nuo Yiman processing array is not processed, if it is not, increasing by second of von Neumann processing array for meeting random said conditions
Columns, so that its columns is expressed as square of some integer, and increased columns is the minimum columns for the condition that meets, and is being increased
Columns at from left to right according to 010101 ... rule storage data, by the column of current second of von Neumann processing number
It is I that number, which opens the number scale that radical sign obtains,;
S2. one is created for storing the two-dimensional array F, second of the Feng Nuo that will be finally obtained in step S1 of I row xI column
The 1st row the 1st column of two-dimensional array F are stored according to the number of the 1st row the 1st column of graceful processing array, the number of the 1st row the 2nd column is stored in
The 1st row the 2nd of two-dimensional array F arranges, and the number of the 1st row I+1 column is stored in the 2nd row the 1st column of two-dimensional array F, and so on, directly
It is arranged to the I row I that the number of the 1st row I * I column is stored in two-dimensional array F, using two-dimensional array F at this time as speckle number
Group;
(9) one is created for storing I row × I column pixel scatter plot, which is filled: if speckle number
The number of the h row w column of group is 1, then with filled black at the pixel arranged the h row w of scatter plot, if it is 0, with white
Color filling, h=1,2 ..., I, w=1,2 ..., I;
(10) scatter plot obtained after filling is optics PUF.In this method, handled by multiple von Neumann, it can be with
Data volume is reduced, arithmetic speed is improved, and can significantly reduce the accounting of repetition hash, to improve optics
The randomness of PUF increases the difficulty being forged, and enhances reliability.
Compared with the prior art, the advantages of the present invention are as follows swashed by rectangular substrate with the positive of substrate is attached to
Light speckle constructs optics PUF sample, and the material of substrate is glass, and laser speckle is the black splotch of multiple random distributions, black
The partial size of spot is 20~60 μm, and ingredient is acrylic acid, and the area of laser speckle is the 0.45~0.55 of the front face area of substrate,
By infrared laser, the first directional hole, the second directional hole, the first reflecting mirror, the second reflecting mirror, third reflecting mirror, beam expanding lens,
Collimation lens, half-reflecting half mirror, the first CCD camera and the second CCD camera constitute image collecting device, when work, infrared laser
The light beam of device transmitting is incident on the first reflecting mirror at 45 degree in the horizontal direction after passing sequentially through first positioning hole and second location hole,
Light beam is incident on the second reflecting mirror at 45 degree after reflecting by the first reflecting mirror and expands via entering after the reflection of the second reflecting mirror
In mirror, beam expanding lens is incident in third reflecting mirror at 45 degree again after the beam diameter entered in it is amplified 20 times, third reflection
Light beam is incident in collimation lens by mirror, and the light beam taken in it is adjusted to after collimated light beam into 45 degree of intakes half by collimation lens
In anti-pellicle mirror, on the one hand the light beam being incident in it is reflected into the back side of optics PUF sample by half-reflecting half mirror, on the one hand thoroughly
It is shot out and is captured by the first CCD camera, be incident on the light beam on optics PUF sample and pass through shape behind the front on optics PUF sample
At optical features, which is captured by the second CCD camera and shoots to obtain optical features figure, and image processing apparatus is to reception
To optical features figure handled, obtain optics PUF, the material of optics PUF sample is clean dustless transparent coverslip, the
The light that two CCD cameras capture is the transmitted light of laser, for the shadow of transmitted ray when environment light illuminance is less than 10000lx
Sound it is weaker, transmitted ray in the second CCD camera at picture maintain be basically unchanged, reliability is higher, while in optics PUF sample
Laser speckle excellent weather resistance and hard, colour retention is good, and corrosion resistance is strong, and ageing resistance is strong, and versatility is higher under non-adverse circumstances,
The high optics PUF of available stability.
Detailed description of the invention
Fig. 1 is the structure chart of image collecting device of the invention;
Fig. 2 (a) is the optical features figure one of image acquisition device of the invention;
Fig. 2 (b) is that optical features figure one described in Fig. 2 (a) uses at the image processing method of the embodiment of the present invention two
Manage obtained optics PUF;
Fig. 3 (a) is the optical features figure two of image acquisition device of the invention;
Fig. 3 (b) is that optical features figure two described in Fig. 3 (a) uses at the image processing method of the embodiment of the present invention two
Manage obtained optics PUF;
Fig. 4 (a) is the optical features figure three of image acquisition device of the invention;
Fig. 4 (b) is that optical features figure three described in Fig. 4 (a) uses at the image processing method of the embodiment of the present invention two
Manage obtained optics PUF;
Fig. 5 (a) is the optical features figure four of image acquisition device of the invention;
Fig. 5 (b) is that optical features figure four described in Fig. 5 (a) uses at the image processing method of the embodiment of the present invention two
Manage obtained optics PUF.
Specific embodiment
The present invention will be described in further detail below with reference to the embodiments of the drawings.
Embodiment one: as shown, a kind of optical features PUF system for antifalsification label, including at least one optics
PUF sample, image collecting device and image processing apparatus, optics PUF sample include rectangular substrate and are attached to substrate
Positive laser speckle, the material of substrate are glass, and laser speckle is the black splotch of multiple random distributions, the grain of black splotch
Diameter is 20~60 μm, and ingredient is acrylic acid, the area of laser speckle is the 0.45~0.55 of the front face area of substrate;
Image collecting device includes infrared laser 1, the first directional hole 2, the second directional hole 3, the first reflecting mirror 4, second
Reflecting mirror 5, third reflecting mirror 6, beam expanding lens 7, collimation lens 8, half-reflecting half mirror 9, the first CCD camera 10 and the second CCD camera
11;Infrared laser 1, the first directional hole 2, the second directional hole 3 and the first reflecting mirror 4 are set gradually from left to right, the first orientation
Hole 2, the second directional hole 3 and the first reflecting mirror 4 are located in the transmitting optical path of infrared laser 1, the plane of incidence of the first reflecting mirror 4 with
The angle of horizontal direction is 45 degree, after the laser that infrared laser 1 emits passes sequentially through the first directional hole 2 and the second directional hole 3
It is incident on the first reflecting mirror 4 in the horizontal direction, the second reflecting mirror 5 is located at behind the first reflecting mirror 4, and the second reflecting mirror 5 is located at
On the reflected light path of first reflecting mirror 4, the plane of incidence of the second reflecting mirror 5 and the angle of horizontal plane are 135 degree, and beam expanding lens 7 is located at
The left side of second reflecting mirror 5, third reflecting mirror 6 are located at the left side of beam expanding lens 7, and the expansion multiplying power of beam expanding lens 7 is 20 times, beam expanding lens
7 are located on the reflected light path of the second reflecting mirror 5, and third reflecting mirror 6 is located on the emitting light path of beam expanding lens 7, third reflecting mirror 6
The plane of incidence and the angle of horizontal direction are 135 degree, and collimation lens 8 is located on the reflected light path of third reflecting mirror 6, half-reflecting half mirror
9 are located on the emitting light path of collimation lens 8, and the angle between the reflecting surface and horizontal plane of half-reflecting half mirror 9 is 135 degree, one
Optics PUF sample is arranged on the reflected light path of collimation lens 8, and the back side of optics PUF sample is towards half-reflecting half mirror 9,
Optics PUF sample just facing towards the second CCD camera 11, the first CCD camera 10 and the second CCD camera 11 are respectively and at image
Manage device connection;
When work, the light beam that infrared laser 1 emits is passed sequentially through after the first directional hole 2 and the second directional hole 3 along level
The first reflecting mirror 4 is incident at 45 degree in direction, and light beam is by being incident on the second reflecting mirror 5 at 45 degree after the reflection of the first reflecting mirror 4
And via entering in beam expanding lens 7 after the reflection of the second reflecting mirror 5, beam expanding lens 7 will enter after the beam diameter in it amplifies 20 times again
It is incident in third reflecting mirror 6 at 45 degree, light beam is incident in collimation lens 8 by third reflecting mirror 6, and collimation lens 8 will be taken in
Light beam in it is adjusted to after collimated light beam into the light that in 45 degree of intake half-reflecting half mirrors 9, half-reflecting half mirror 9 will be incident in it
On the one hand beam is reflected into the back side of optics PUF sample, on the one hand transmit away and captured by the first CCD camera 10, be incident on optics
Light beam on PUF sample is by forming optical features behind the front on optics PUF sample, and the optical features are by the second CCD camera
11 capture and shoot to obtain optical features figure, and image processing apparatus handles the optical features figure received, obtains optics
PUF。
In the present embodiment, the material of optics PUF sample is a length of 76.2mm, width 25.4mm, with a thickness of 1.0-1.2mm's
Clean dustless transparent glass slide or side length are 22mm, with a thickness of the clean dustless transparent coverslip of 0.13-0.17mm.
In the present embodiment, the preparation process of optics PUF sample are as follows:
A. it is placed on substrate is clean on a platform;
B. automatic paint spraying apparatus is used to spray partial size to substrate front at the 20cm height of substrate front for 20~60 μ
The acrylic coating drop of m, acrylic coating drop form the black splotch of multiple random distributions in substrate front;
C. it is placed on and stands 5-6 minutes in dust free room and obtain optics PUF sample.
In the present embodiment, optics PUF is obtained using the image processing techniques of existing maturation.
Embodiment two: the present embodiment is basically the same as the first embodiment, and difference is:
In the present embodiment, image processing apparatus handles the optical features image received, obtains the tool of optics PUF
Body process are as follows:
(1) width is randomly selected from received optical features figure, the pixel of the optical features figure of selection is denoted as N × M,
Wherein, N is the horizontal pixel number of the second CCD camera 11, and M is longitudinal pixel number of the second CCD camera 11;
(2) gray processing processing is carried out to the optical features figure of selection, obtains N row × M column pixel grayscale image, and obtain ash
Spend the corresponding gray value of each pixel in figure;
(3) binary conversion treatment is carried out to the grayscale image of obtained N × M pixel, the specific steps are as follows:
I, newly-built one can store N row × M column data two-dimensional array;
II, sets an intermediate variable a, and a is initialized as to be more than or equal to 0 and an integer less than or equal to 255;
The corresponding gray value of pixel that jth row kth in grayscale image arranges is compared by III, with the current value of a, if the ash
Angle value is less than a, then arranges the jth row kth that 0 is stored in two-dimensional array, if the gray value is more than or equal to a, be stored in two for 1
The jth row kth of dimension group arranges, j=1,2 ..., N, k=1,2 ..., M;
IV, calculates the average value of N*M number of binaryzation array storage, which is denoted as b, and * is multiplication symbol,
B is determined:
If b is more than or equal to 0.48 and is less than or equal to 0.52, using currently available two-dimensional array as binaryzation array,
Enter step (4);
If b is not belonging to the number within the scope of 0.48-0.52, the value of first a is updated, regard the updated value of a as a
Current value, repeat step III and IV, until b be more than or equal to 0.48 and be less than or equal to 0.52, the two-dimensional array that will be finally obtained
As binaryzation array, (4) are entered step, wherein the specific renewal process of a are as follows: when b is less than 0.48, and between b and 0.48
When difference is not more than 0.1, the value of a is updated using the value that the current value of a subtracts c, c is the integer less than or equal to 10,
When b is less than 0.48, and the difference between b and 0.48 is greater than 0.1, the value of a is carried out plus the value of d using the current value of a
It updates, d is the integer less than or equal to 10, when b is greater than 0.52, and the difference between b and 0.52 is not more than 0.1, using working as a
The value that preceding value subtracts e is updated the value of a, and e is the integer greater than 10, when b is greater than 0.52, and the difference between b and 0.52
When value is greater than 0.1, the value of a is updated plus the value of f using the current value of a, f is the integer greater than 10;
(4) one is created for storing 1 row × N*M column data one-dimension array, assignment is carried out to the one-dimension array: by two
The number of the 1st row the 1st column of value array is stored in the 1st row the 1st column of the one-dimension array, the 1st row the 2nd column of binaryzation array
Number is stored in the 1st row the 2nd column of the one-dimension array, and so on, it is stored until by the number of the Nth row m column of binaryzation array
The 1st row N*M to the one-dimension array is arranged, and obtained one-dimension array is denoted as B;
(5) von Neumann processing is carried out to one-dimension array B, the specific steps are as follows:
A. judge whether N*M is even number, if N*M is not even number, increase by a column in one-dimension array B as one-dimensional
The 1st row N*M+1 of array B is arranged, and 1 is stored at this, if N*M is even number, is not dealt with, by one-dimension array B's
Current columns is denoted as M1;
B. one is created for storing the one-dimension array of von Neumann processing data, is denoted as Q, sets an intermediate change
P is measured, is assigned to p for 1;
C. using the array of the 1st row 2p-1 of the one-dimension array B number arranged and the 1st row 2p column at two bits, one
The number of the 1st row 2p-1 column of dimension group B is a high position for two bit, and the number of the 1st row 2p column of one-dimension array B is
The low level of two bit, if two bit is 10, in first vacancy from left to right of one-dimension array Q
Place's deposit 0, if two bit is 01, in one-dimension array Q first empty place deposit 1 from left to right, if should
Two bits are 11 or 00, then do not handle one-dimension array Q;
D. determine whether p is equal to N*M1/ 2, if it is not, the value after then adding 1 using the current value of p updates p, then return
Step c is returned, if be equal to, the storage of one-dimension array Q data is completed, using current one-dimension array Q as first time von Neumann
Array is handled, the columns of first time von Neumann processing array is denoted as M2;
(6) von Neumann processing is carried out to first time von Neumann processing array using step (5) identical method, obtained
Second of von Neumann handles array;
(7) second of von Neumann processing array is put into the test of NIST test software, if the P-value value of test item is complete
Both greater than significance 0.01, and this item data of Block Frequency is greater than 0.5, then it represents that second of von Neumann
It handles array to test by NIST, meets the condition of random number, otherwise cannot be tested by NIST, randomly select a width again at this time
The optical features figure of unselected mistake, return step (2) re-start processing, until obtaining second that meets random said conditions
Von Neumann handles array, and the columns of second of von Neumann for meeting random said conditions processing array is denoted as M3;
(8) array is handled to second of von Neumann for meeting random said conditions to recombinate, the specific steps are as follows:
S1. judge M3It can be expressed as square of some integer, if it can, then to second of Feng for meeting random said conditions
Nuo Yiman processing array is not processed, if it is not, increasing by second of von Neumann processing array for meeting random said conditions
Columns, so that its columns is expressed as square of some integer, and increased columns is the minimum columns for the condition that meets, and is being increased
Columns at from left to right according to 010101 ... rule storage data, by the column of current second of von Neumann processing number
It is I that number, which opens the number scale that radical sign obtains,;
S2. one is created for storing the two-dimensional array F, second of the Feng Nuo that will be finally obtained in step S1 of I row xI column
The 1st row the 1st column of two-dimensional array F are stored according to the number of the 1st row the 1st column of graceful processing array, the number of the 1st row the 2nd column is stored in
The 1st row the 2nd of two-dimensional array F arranges, and the number of the 1st row I+1 column is stored in the 2nd row the 1st column of two-dimensional array F, and so on, directly
It is arranged to the I row I that the number of the 1st row I * I column is stored in two-dimensional array F, using two-dimensional array F at this time as speckle number
Group;
(9) one is created for storing I row × I column pixel scatter plot, which is filled: if speckle number
The number of the h row w column of group is 1, then with filled black at the pixel arranged the h row w of scatter plot, if it is 0, with white
Color filling, h=1,2 ..., I, w=1,2 ..., I;
(10) scatter plot obtained after filling is optics PUF.