CN109308986A - A kind of ion implantation apparatus chip cooling device - Google Patents

A kind of ion implantation apparatus chip cooling device Download PDF

Info

Publication number
CN109308986A
CN109308986A CN201710621105.2A CN201710621105A CN109308986A CN 109308986 A CN109308986 A CN 109308986A CN 201710621105 A CN201710621105 A CN 201710621105A CN 109308986 A CN109308986 A CN 109308986A
Authority
CN
China
Prior art keywords
chip
cooling
ion implantation
implantation apparatus
target disc
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201710621105.2A
Other languages
Chinese (zh)
Inventor
赵叶军
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beijing Zhongkexin Electronic Equipment Co Ltd
Original Assignee
Beijing Zhongkexin Electronic Equipment Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beijing Zhongkexin Electronic Equipment Co Ltd filed Critical Beijing Zhongkexin Electronic Equipment Co Ltd
Priority to CN201710621105.2A priority Critical patent/CN109308986A/en
Publication of CN109308986A publication Critical patent/CN109308986A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H01J37/3171Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment
    • H01L21/67103Apparatus for thermal treatment mainly by conduction
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment
    • H01L21/67109Apparatus for thermal treatment mainly by convection
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/002Cooling arrangements

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

The invention discloses a kind of ion implantation apparatus chip cooling devices.A kind of ion implantation apparatus chip carrier adsorbs chip by electrostatic adsorption force, to make its normal work invent a kind of chip cooling device, to reduce temperature of the chip in injection process.The device mainly includes: target disc pedestal (1), gas cooling pipeline (2), thermal plastic insulation (3), static sucker component (4), chip (5), vacuum chamber (6), cooling water pipeline (7).The device characteristic is, static sucker component (4) is Nian Jie with target disc pedestal (1) by thermal plastic insulation (3), chip (5) passes through Electrostatic Absorption on the surface of static sucker component (4), target disc pedestal (1) designs cooling water pipeline (7) and gas cooling line (2), and whole device is located in vacuum chamber (6).Device working principle is described in detail in specification, and gives specific embodiment.The present invention relates to ion implantation apparatus, are under the jurisdiction of field of semiconductor manufacture.

Description

A kind of ion implantation apparatus chip cooling device
Technical field
The present invention relates to a kind of chip cooling devices, particularly suitable for the ion implantation apparatus in semiconductor manufacturing equipment.
Background technique
Ion implantation apparatus is the exemplary apparatus of semiconductor technology intermediate ion doping, and ion source generates the ion for needing to adulterate Beam, ion beam are transferred to the silicon chip surface in target chamber end process cavity using quality analysis, correction, acceleration.
With the development of semiconductor technology, and with the diminution of speciality line width, the raising of complex process degree, to chip Technique injection temperature also proposed increasingly higher demands.One of an important factor for having become device win or lose.Broadband from Sub- implanter beam-out energy is higher, line and when very big implantation dosage, and the technique injection temperature of wafer surface can be very high, must Effectively measure must be taken to reduce the temperature in wafer technique injection process, the present invention is based on such demand and designs.
Summary of the invention
1. a kind of ion implantation apparatus chip cooling device.The device mainly includes: target disc pedestal (1), gas cooling pipeline (2), thermal plastic insulation (3), static sucker component (4), chip (5), vacuum chamber (6), cooling water pipeline (7).
2. a kind of ion implantation apparatus chip cooling device according to claim 1, the device characteristic are, electrostatic is inhaled Disk component (4) is Nian Jie with target disc pedestal (1) by thermal plastic insulation (3), and chip (5) is by Electrostatic Absorption in static sucker component (4) surface, target disc pedestal (1) design cooling water pipeline (7) and gas cooling line (2), whole device are located at vacuum chamber (6) in.
3. a kind of ion implantation apparatus chip cooling device according to claim 1, the device characteristic are, electrostatic is inhaled Disk component (4) is Nian Jie by thermal plastic insulation (3) with target disc pedestal (1), has while playing high-voltage isulation preferable thermally conductive Performance.
4. a kind of ion implantation apparatus chip cooling device according to claim 1, the device characteristic are, target disc bottom Seat (1) design cooling water pipeline (7) passes through the chip (5) on the surface of conduction of heat cooling static sucker component (4).
5. a kind of ion implantation apparatus chip cooling device according to claim 1, the device characteristic are, target disc bottom Seat (1) design gas cooling pipeline (2) is passed through between static sucker component (4) and chip (5) in vacuum chamber (6) Micro inert gas increases medium heat conduction rate, implements to cool down to chip (5).
The present invention has the following obvious advantages:
1. definite functions, with strong points.
2. structure is simple, easy to manufacture.
3. designing cooling water and gas cooling dual-cooled mode, cooling effect being significant.
Detailed description of the invention
Fig. 1 is assembly effect diagram of the invention.
Fig. 2 is the cross-sectional view of target disc pedestal of the invention.
1- target disc pedestal, 2- gas cooling pipeline, 3- thermal plastic insulation, 4- static sucker component, 5- chip, 6- vacuum Chamber, 7- cooling water pipeline.
Specific embodiment
It 1 is further introduced with reference to the accompanying drawing to 2 couples of present invention of attached drawing, but not as a limitation of the invention.
The invention discloses a kind of ion implantation apparatus chip cooling devices.The device mainly includes: target disc pedestal (1), gas Body cooling line (2), thermal plastic insulation (3), static sucker component (4), chip (5), vacuum chamber (6), cooling water pipeline (7)。
Specific implementation step is as follows:
Static sucker component (4) is Nian Jie with target disc pedestal (1) by thermal plastic insulation (3), and chip (5) passes through Electrostatic Absorption On the surface of static sucker component (4), target disc pedestal (1) designs cooling water pipeline (7) and gas cooling line (2), entire to fill Setting in vacuum chamber (6).
Static sucker component (4) is Nian Jie by thermal plastic insulation (3) with target disc pedestal (1), is playing the same of high-voltage isulation When have preferable heating conduction.Target disc pedestal (1) designs cooling water pipeline (7), passes through the cooling electrostatic chuck group of conduction of heat The chip (5) on the surface of part (4).Meanwhile target disc pedestal (1) design gas cooling pipeline (2), in vacuum chamber (6), quiet It is passed through micro inert gas between electric Suction cup assembly (4) and chip (5), increases medium heat conduction rate, chip (5) are implemented to cool down.
The above description is only an embodiment of the present invention, is not intended to limit the scope of the present invention, but for illustrating The present invention.All within the spirits and principles of the present invention, any modification, equivalent replacement, improvement and so on should be included in this Within the protection scope of invention.

Claims (5)

1. a kind of ion implantation apparatus chip cooling device.The device mainly includes: target disc pedestal (1), gas cooling pipeline (2), Thermal plastic insulation (3), static sucker component (4), chip (5), vacuum chamber (6), cooling water pipeline (7).
2. a kind of ion implantation apparatus chip cooling device according to claim 1, the device characteristic are, electrostatic chuck group Part (4) is Nian Jie with target disc pedestal (1) by thermal plastic insulation (3), and chip (5) is by Electrostatic Absorption in static sucker component (4) Surface, target disc pedestal (1) design cooling water pipeline (7) and gas cooling line (2), whole device be located at vacuum chamber (6) It is interior.
3. a kind of ion implantation apparatus chip cooling device according to claim 1, the device characteristic are, electrostatic chuck group Part (4) is Nian Jie by thermal plastic insulation (3) with target disc pedestal (1), there is preferable heating conduction while playing high-voltage isulation.
4. a kind of ion implantation apparatus chip cooling device according to claim 1, the device characteristic are, target disc pedestal (1) cooling water pipeline (7) are designed, passes through the chip (5) on the surface of conduction of heat cooling static sucker component (4).
5. a kind of ion implantation apparatus chip cooling device according to claim 1, the device characteristic are, target disc pedestal (1) gas cooling pipeline (2) are designed, in vacuum chamber (6), is passed through between static sucker component (4) and chip (5) micro Inert gas increases medium heat conduction rate, implements to cool down to chip (5).
CN201710621105.2A 2017-07-26 2017-07-26 A kind of ion implantation apparatus chip cooling device Pending CN109308986A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201710621105.2A CN109308986A (en) 2017-07-26 2017-07-26 A kind of ion implantation apparatus chip cooling device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201710621105.2A CN109308986A (en) 2017-07-26 2017-07-26 A kind of ion implantation apparatus chip cooling device

Publications (1)

Publication Number Publication Date
CN109308986A true CN109308986A (en) 2019-02-05

Family

ID=65202778

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201710621105.2A Pending CN109308986A (en) 2017-07-26 2017-07-26 A kind of ion implantation apparatus chip cooling device

Country Status (1)

Country Link
CN (1) CN109308986A (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101946316A (en) * 2008-03-28 2011-01-12 S.O.I.Tec绝缘体上硅技术公司 Temperature control injects
US20140054280A1 (en) * 2012-08-23 2014-02-27 Lam Research Ag Method and apparatus for liquid treatment of wafer shaped articles
CN105845613A (en) * 2015-01-16 2016-08-10 中芯国际集成电路制造(上海)有限公司 Electrostatic chuck and manufacturing method thereof

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101946316A (en) * 2008-03-28 2011-01-12 S.O.I.Tec绝缘体上硅技术公司 Temperature control injects
US20140054280A1 (en) * 2012-08-23 2014-02-27 Lam Research Ag Method and apparatus for liquid treatment of wafer shaped articles
CN105845613A (en) * 2015-01-16 2016-08-10 中芯国际集成电路制造(上海)有限公司 Electrostatic chuck and manufacturing method thereof

Similar Documents

Publication Publication Date Title
US9417138B2 (en) Gas coupled probe for substrate temperature measurement
US9905449B2 (en) Electrostatic chuck
KR101790103B1 (en) Plasma processing apparatus
US9960025B1 (en) Cold-matter system having ion pump integrated with channel cell
TWI557527B (en) Micro-electromechanical temperature control system with thermal reservoir
CN103107119B (en) Substrate cooling system, substrate board treatment, electrostatic chuck and substrate cooling method
JP6239894B2 (en) Electrostatic chuck
TWI437617B (en) Electrostatic chuck and apparatus for processing a substrate including the same
JP6165452B2 (en) Plasma processing equipment
WO2011157814A3 (en) Power semiconductor device
CN103489760A (en) SiC substrate homoepitaxy carbon silicon double-atomic-layer film method
CN104428878B (en) Sic semiconductor device and its manufacture method
CN109308986A (en) A kind of ion implantation apparatus chip cooling device
CN208384071U (en) A kind of test platform and test device
JP6639940B2 (en) Holding device and method of manufacturing holding device
CN208655742U (en) Power battery module
CN103474332B (en) Promote the lithographic method of netted growth Web Growth
CN202058689U (en) Heating device for plasma processor
JP6248458B2 (en) Bonded wafer manufacturing method and bonded wafer
DE502004003341D1 (en) DEVICE FOR PRODUCING ELECTRICALLY CONDUCTIVE PASSAGES IN A SEMICONDUCTOR WAFER BY THERMOMIGRATION
TWI771587B (en) Holding device and method of manufacturing the same
US20140132296A1 (en) Heat sink blade pack for device under test testing
CN117790391A (en) Deformable electrostatic chuck and wafer adsorption method
JP2009147118A (en) Method of manufacturing silicon carbide semiconductor device
CN105214917A (en) Air flow controller in baking chamber

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20190205