CN109283190B - Electronic component detection equipment - Google Patents
Electronic component detection equipment Download PDFInfo
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- CN109283190B CN109283190B CN201811294861.XA CN201811294861A CN109283190B CN 109283190 B CN109283190 B CN 109283190B CN 201811294861 A CN201811294861 A CN 201811294861A CN 109283190 B CN109283190 B CN 109283190B
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- 238000001514 detection method Methods 0.000 title claims abstract description 86
- 230000007246 mechanism Effects 0.000 claims abstract description 39
- 230000005540 biological transmission Effects 0.000 claims abstract description 21
- 239000000463 material Substances 0.000 claims abstract description 3
- 238000006073 displacement reaction Methods 0.000 claims description 12
- 238000007689 inspection Methods 0.000 claims description 8
- 238000007599 discharging Methods 0.000 claims description 5
- 238000004891 communication Methods 0.000 claims description 3
- 238000012544 monitoring process Methods 0.000 claims description 3
- 239000003990 capacitor Substances 0.000 claims description 2
- 230000002787 reinforcement Effects 0.000 abstract description 7
- 238000013461 design Methods 0.000 abstract description 5
- 238000000034 method Methods 0.000 abstract description 4
- 238000003384 imaging method Methods 0.000 description 7
- 230000007547 defect Effects 0.000 description 5
- 238000012360 testing method Methods 0.000 description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 4
- 229910052802 copper Inorganic materials 0.000 description 4
- 239000010949 copper Substances 0.000 description 4
- 230000000694 effects Effects 0.000 description 2
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000005375 photometry Methods 0.000 description 1
- 230000003014 reinforcing effect Effects 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8835—Adjustable illumination, e.g. software adjustable screen
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8838—Stroboscopic illumination; synchronised illumination
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
The invention discloses electronic component detection equipment which comprises a material loading unit, a transmission unit, a detection unit and a sorting unit, wherein the transmission unit comprises a transparent transmission disc, a motor, an encoder and an initial sensor; the detection unit comprises at least eight detection positions, six detection positions are basic detection positions aiming at six sides, and the rest detection positions are selective enhancement positions of any surface. The invention innovatively designs the selective reinforcement machine position, can perform multi-machine position detection on one side, can obtain comprehensive detection data at one time, has more accurate detection, and meets the detection efficiency. The camera shooting mechanism, the angle adjusting mechanism and the stroboscopic light source are all multi-axis adjustable structures, can be adaptively adjusted according to different passive elements, and particularly have wider applicability for detecting unconventional six surfaces. The whole design of the equipment is strict, the detection process is smooth, and the equipment is suitable for popularization and application.
Description
Technical Field
The invention relates to detection equipment, in particular to electronic component detection equipment, and belongs to the technical field of electronic passive component detection equipment.
Background
Passive components (passive components) are the electronic industry's call for certain electronic components, as distinguished from active components. In china, they are called passive devices and active devices. Passive components (capacitance, resistance, inductance) and active components (integrated circuits) are also commonly used in China.
Generally, the passive element is a substantially hexahedral structure, and six surfaces of the passive element need to be inspected by inspection equipment, including breakage, crack, rust, copper exposure, size, and the like.
The traditional passive element detection equipment comprises double-sided detection, four-sided detection or six-sided detection, and has the defects of incomplete detection data, inaccurate detection and the like because the detection machine position is fixed and the detection light source is constant.
Disclosure of Invention
The invention aims to solve the defects of the prior art, and provides electronic component detection equipment aiming at the problems of incomplete and inaccurate detection data of the traditional passive component.
In order to achieve the above purpose, the technical scheme adopted by the invention is as follows:
an electronic component detection device, wherein the electronic component comprises a capacitor, a resistor and an inductor,
the detection apparatus includes:
the material loading unit is used for loading the electronic components and discharging the electronic components;
the transmission unit comprises a transparent transmission disc for bearing the electronic components and transmitting, a motor for driving the transparent transmission disc to rotate, an encoder for controlling the rotation amount of the transparent transmission disc, and an initial sensor which is in communication connection with the encoder and is used for monitoring the initial position of the electronic components;
the detection unit is used for detecting six sides of the electronic component and comprises at least eight detection positions, wherein six detection positions are basic detection positions, the basic detection positions correspond to the six sides of the electronic component, and the other detection positions are selective enhancement positions of any surface;
and the sorting unit is used for sorting and collecting the electronic components according to the detection condition of the detection unit.
Preferably, the detecting machine position comprises an image pick-up mechanism and an angle adjusting mechanism for adjusting the image pick-up angle,
the camera shooting mechanism comprises a base and a camera shooting module arranged on the base, wherein the base is provided with radial displacement along the transparent transmission disc, horizontal displacement vertical to the radial displacement and vertical lifting displacement.
Preferably, the detector station includes a detachable strobe light source for camera operations.
Preferably, the basic detection position is different from the type of the image pickup mechanism of the selectively enhanced position, the type of the strobe light source is different or the irradiation angle is different.
Preferably, the image pickup mechanism of the basic detection machine position is a color image pickup mechanism, and the image pickup mechanism of the enhanced machine position is a black-and-white image pickup mechanism.
Preferably, the depth of field of the image capturing mechanism is adjustable.
Preferably, the angle adjusting mechanism comprises a triaxial adjusting base, and a photographing angle adjusting piece is arranged on the triaxial adjusting base.
Preferably, the image capturing angle adjusting member is a mirror surface or a triangular prism.
The beneficial effects of the invention are mainly as follows:
1. the selective reinforcement machine position is innovatively designed, multi-machine position detection can be carried out on a single face, comprehensive detection data can be obtained at one time, detection is more accurate, and detection efficiency is met.
2. The camera shooting mechanism, the angle adjusting mechanism and the stroboscopic light source are all multi-axis adjustable structures, can be adaptively adjusted according to different passive elements, and particularly have wider applicability for detecting unconventional six surfaces.
3. The whole design of the equipment is strict, the detection process is smooth, and the equipment is suitable for popularization and application.
Drawings
Fig. 1 is a schematic structural view of an electronic component inspection apparatus of the present invention.
Fig. 2 is an enlarged schematic view of the portion a in fig. 1.
Description of the embodiments
The invention provides an electronic component inspection apparatus. The following detailed description of the present invention is provided in connection with the accompanying drawings, so as to facilitate understanding and grasping thereof.
Electronic component check out test set, electronic component includes electric capacity, resistance, inductance, as shown in fig. 1 and 2, and check out test set includes: the device comprises a loading unit 1, a transmission unit 2, a detection unit 3 and a sorting unit 4.
The loading unit 1 is used for loading electronic components and discharging, and generally consists of a loading cabin, a vibration disc and a discharging guide rail.
The transmission unit 2 comprises a transparent transmission disc 21 for carrying the electronic components 5 and transmitting, a motor for driving the transparent transmission disc 21 to rotate, an encoder for controlling the rotation amount of the transparent transmission disc 21, and a start sensor 22 which is in communication connection with the encoder and is used for monitoring the start position of the electronic components 21.
Specifically, the encoder outputs an electric pulse, that is, controls the angle signal output of the transparent transmission disk 21, and triggers the detection unit 3 to respond. The transparent driving disc 21 is used for bearing the electronic components 5, the electronic components 5 are transported to the periphery of the transparent driving disc 21 from the discharging guide rail of the loading unit 1, and the detection positions are switched by the rotation of the transparent driving disc 21 and finally enter the sorting unit 4.
The detecting unit 3 is used for detecting six sides of the electronic component 5, and comprises at least eight detecting units 6, wherein six detecting units 6 are base detecting units 61, the base detecting units 61 correspond to six sides of the electronic component 5, and the other detecting units 6 are selective reinforcing units 62 with any surface.
Specifically, the conventional inspection unit 3 includes only six fixing positions at most, and can independently inspect six surfaces of the electronic component 5 at one time, so that all defects on one surface cannot be inspected accurately at one time no matter how precisely an image pickup mechanism is adopted.
The scheme adopts the selective reinforcement machine 62 to carry out supplementary accurate detection, can carry out secondary or even tertiary detection on certain surfaces with higher specific requirements, and accurately detects the conditions of breakage, crack, color, copper exposure and size. The detection precision of the equipment is improved, and the detection efficiency is not affected.
And the sorting unit 4 is used for sorting and collecting the electronic components 5 according to the detection condition of the detection unit 3.
The detector position 6 is described in detail, and comprises a camera shooting mechanism 7 and an angle adjusting mechanism 8 for adjusting a camera shooting angle, wherein the camera shooting mechanism 7 comprises a base 71 and a camera shooting module 72 arranged on the base 71, and the base 71 is provided with radial displacement along a transparent transmission disc, horizontal displacement vertical to the radial displacement and vertical lifting displacement.
The position of the camera module 72 can be adjusted through the base 71, so that the requirements of different types of product specifications can be met.
Furthermore, the detection station 6 comprises a detachable strobe light source 9 for camera operations. Namely, the light source is realized without natural light source and natural light interference.
In a specific embodiment, the base detector station 61 is different from the type of camera mechanism of the selectively enhanced station 62, the type of strobe light source or the illumination angle,
namely, the detection difference exists between the basic detection machine position 61 and the selective reinforcement machine position 62, and different test effects are obtained through different types of camera mechanisms and different types of stroboscopic light sources or different irradiation angles.
In one embodiment of the present disclosure, the imaging mechanism of the base detection camera 61 is a color imaging mechanism, and the imaging mechanism of the enhancement camera 62 is a black-and-white imaging mechanism.
The concrete principle is explained:
it is known that there are large differences in imaging by different imaging mechanisms, and that passive elements typically detect defects by means of surface inspection, i.e. 2D inspection.
In the aspect of forming and developing, the color and the black and white are different, the angle of the projection light source is different, the brightness of the light source is different, and the like.
Therefore, it is difficult to realize all defect detection on one side by one machine position and matching with a light source.
In the scheme, aiming at special surfaces, such as the top surface and the bottom surface with coils, detection and screening can be performed by adopting multiple machine positions.
For such a surface, various machine position detection can be adopted, for example, a high-definition color camera and an annular vertical light source are adopted as a basic detection machine position 61, and a high-definition black-and-white camera and a planar photometry light source are adopted as a selective enhancement machine position 62, wherein the two are focused for detection. The basic detection machine position 61 mainly detects the damage, crack depth, rust color, copper exposure and size, the selective reinforcement machine position 62 mainly detects the damage outer edge, crack transverse and longitudinal length and size, and the detection is carried out through multi-machine position combination.
Of course, in this example, a high-definition color camera and an annular cohesive light source can be added as the second selective reinforcement machine 62, so as to provide more accurate reference of broken outer edges, crack outer edges and exposed copper, and comprehensive detection.
The irradiation angles of the base detection machine position 61 and the stroboscopic light source 9 of the selective reinforcement machine position 62 are different, and different detection image data are obtained through different irradiation angles, so that comprehensive analysis and detection are easy.
The depth of field of any image capturing mechanism 7 is adjustable, which is the prior art and will not be described here.
The angle adjusting mechanism 8 includes a triaxial adjusting base 81, and a photographing angle adjusting member 82 is provided on the triaxial adjusting base 81. The imaging angle adjuster 82 is a mirror or a triangular prism.
So designed, the shooting angles of all the detecting machine positions 6 can be perpendicular to the transparent transmission disc 21, and the sight line of each surface is converted through the adjusting positions of the shooting angle adjusting pieces 82, so that the design of the detecting machine positions 6 is easy.
In addition, aiming at the unexpected effect of a special electronic component, an electronic contact is arranged on any surface of the special electronic component, and the shooting angle of any property can be adjusted through the shooting angle adjusting piece 82, so that the shooting angle is vertical to the irregular electronic contact, and the situation of the root of the electronic contact can be detected. Specifically speaking, the angle can be adjusted manually to some electronic contact, and because the manual operation can have the tired damage of electronic contact, traditional check out test set can't detect this condition at all, and the check out test set of present case can detect this minutiae through adjusting the angle of making a video recording, satisfies actual demand.
Through the description, the electronic component detection equipment provided by the invention is innovatively designed with a selectively enhanced machine position, can perform multi-machine position detection on one side, can obtain comprehensive detection data at one time, is more accurate in detection, and meets detection efficiency. The camera shooting mechanism, the angle adjusting mechanism and the stroboscopic light source are all multi-axis adjustable structures, can be adaptively adjusted according to different passive elements, and particularly have wider applicability for detecting unconventional six surfaces. The whole design of the equipment is strict, the detection process is smooth, and the equipment is suitable for popularization and application.
While the foregoing has been described in terms of embodiments of the present invention, it will be appreciated that the embodiments of the invention are not limited by the foregoing description, but rather, all embodiments of the invention may be modified in structure, method or function by one skilled in the art to incorporate the teachings of this invention, as expressed in terms of equivalent or equivalent embodiments, without departing from the scope of the invention.
Claims (3)
1. An electronic component detection device, wherein the electronic component comprises a capacitor, a resistor and an inductor,
characterized in that the detection device comprises:
the material loading unit is used for loading the electronic components and discharging the electronic components;
the transmission unit comprises a transparent transmission disc for bearing the electronic components and transmitting, a motor for driving the transparent transmission disc to rotate, an encoder for controlling the rotation amount of the transparent transmission disc, and an initial sensor which is in communication connection with the encoder and is used for monitoring the initial position of the electronic components;
the detection unit is used for detecting six sides of the electronic component and comprises at least eight detection positions, wherein six detection positions are basic detection positions, the basic detection positions correspond to the six sides of the electronic component, and the other detection positions are selective enhancement positions of any surface;
a sorting unit for sorting and collecting the electronic components according to the detection condition of the detection unit,
the detecting machine position comprises a camera shooting mechanism and an angle adjusting mechanism for adjusting the camera shooting angle,
the camera shooting mechanism comprises a base and a camera shooting module arranged on the base, wherein the base is provided with radial displacement along the transparent transmission disc, horizontal displacement vertical to the radial displacement and vertical lifting displacement;
the detector comprises a detachable stroboscopic light source for camera bellows operation;
the basic detection machine position is different from the type of the pick-up mechanism of the selective enhancement machine position and the type of the stroboscopic light source;
the angle adjusting mechanism comprises a triaxial adjusting base, and a shooting angle adjusting piece is arranged on the triaxial adjusting base;
the image pickup angle adjusting piece is a mirror surface or a triangular prism.
2. The electronic component inspection apparatus according to claim 1, wherein: the camera shooting mechanism of the basic detection machine position is a color camera shooting mechanism, and the camera shooting mechanism of the enhanced machine position is a black-and-white camera shooting mechanism.
3. The electronic component inspection apparatus according to claim 1, wherein: the depth of field of the camera shooting mechanism is adjustable.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811294861.XA CN109283190B (en) | 2018-11-01 | 2018-11-01 | Electronic component detection equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811294861.XA CN109283190B (en) | 2018-11-01 | 2018-11-01 | Electronic component detection equipment |
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| Publication Number | Publication Date |
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| CN109283190A CN109283190A (en) | 2019-01-29 |
| CN109283190B true CN109283190B (en) | 2024-02-23 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811294861.XA Active CN109283190B (en) | 2018-11-01 | 2018-11-01 | Electronic component detection equipment |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN112547536B (en) * | 2020-11-20 | 2022-12-16 | 广东工业大学 | LED chip sorting system and method |
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| CN207751898U (en) * | 2017-10-30 | 2018-08-21 | 无锡和博永新科技有限公司 | Electronic component hexahedron visual inspection machine |
| CN108636820A (en) * | 2018-03-30 | 2018-10-12 | 中国科学院自动化研究所 | The precision component automatic detection of view-based access control model and sorting system and method |
| CN209198340U (en) * | 2018-11-01 | 2019-08-02 | 昆山市泽荀自动化科技有限公司 | Electronic component detection device |
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2018
- 2018-11-01 CN CN201811294861.XA patent/CN109283190B/en active Active
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| Publication number | Priority date | Publication date | Assignee | Title |
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| KR100725485B1 (en) * | 2005-12-28 | 2007-06-07 | 윈텍 주식회사 | Electronic parts inspection system |
| CN105352962A (en) * | 2015-11-19 | 2016-02-24 | 肇庆市宏华电子科技有限公司 | Appearance detector for electronic chip element |
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| CN109283190A (en) | 2019-01-29 |
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Address after: 215300 Room 15, Building 4, Mould Equipment Zone, International Mould City, Yushan Town, Kunshan City, Suzhou City, Jiangsu Province Patentee after: Suzhou Zexun Intelligent Technology Co.,Ltd. Country or region after: China Address before: 215300 Room 15, Building 4, Mould Equipment Zone, International Mould City, Yushan Town, Kunshan City, Suzhou City, Jiangsu Province Patentee before: KUNSHAN ZEXUN AUTOMATION TECHNOLOGY Co.,Ltd. Country or region before: China |