CN109270400A - The test circuit of infrared receiving terminal - Google Patents
The test circuit of infrared receiving terminal Download PDFInfo
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- CN109270400A CN109270400A CN201811297169.2A CN201811297169A CN109270400A CN 109270400 A CN109270400 A CN 109270400A CN 201811297169 A CN201811297169 A CN 201811297169A CN 109270400 A CN109270400 A CN 109270400A
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- Prior art keywords
- infrared
- receiving terminal
- infrared receiving
- module
- measured
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
Abstract
The embodiment of the invention discloses a kind of test circuits of infrared receiving terminal, comprising: infrared transmission module sends the infrared emission signal of multiple and different intensity for timesharing；Infrared receiving module, for connecting infrared receiving terminal to be measured, the infrared receiving terminal to be measured receives the infrared emission signal of the multiple varying strength to generate different pulse signals；Control module works for controlling infrared transmission module and receives the pulse signal, and the control module detects the width of the pulse signal and display.The test circuit of infrared receiving terminal of the invention is simple and convenient.
Description
Technical field
The present embodiments relate to electronic product detection field more particularly to the test circuits of infrared receiving terminal.
Background technique
Infrared receiving terminal is widely used in various electronic products as a kind of input terminal device of electronic product, example
In domestic electrical equipment remote controller.Although short haul connection of new generation and control technology, such as Bluetooth technology, start in remote controler
It is universal, but since the corresponding codec functions module of infrared remote control has simply, response is fast, feature at low cost, so far
Still most of market share of domestic consumer device product remote controler is occupied.
In the life cycle of electronic product, the use of any component in addition to main control chip is impossible to be single
One supplier considers that the reasons such as cost, quality or deliverability can carry out material to original electronic component with new electronic component
Replacement.Due to the technique of different manufacturers, the difference of design scheme, even identical two devices of function, performance indicator
May be not exactly the same, therefore, the problem of compatibility is just produced during material replacement.
Similarly there is compatibility, i.e., the remote control reception of two different manufacturers in replacement process in infrared receiving terminal
Head still cannot be remotely controlled phenomenon, the basic reason of this phenomenon there may be a certain proportion of after main parameter has been determined
One of be different producer receive head under different remote control distances, output pulse width variation range it is not identical, and then with production
The pulse width variation range that product can allow is inconsistent, has led to the case where cannot being remotely controlled in different remote control distances.It is not simultaneous
Hold the anti-interference ability difference that also another reason is different infrared receiving terminal to light or electromagnetic wave.
In infrared receiving terminal in replacement process, prior art means of testing is still mainly manually completed.Reception
The output of head is connected on oscillograph, and then the mobile different distance of tester observes and records the output pulse that head is received on oscillograph
Width.Then judge whether compatibility of the infrared receiving terminal in material replacement process conforms to according to the pulse width of record
It asks.
This means of testing depends on people, and not only testing efficiency is low, and artificial reading value error is big, and once sample
The time that quantity increases or needs to expend when repeatedly test is averaged is just especially long.
For foregoing problems, a kind of test circuit of simple accurately infrared receiving terminal is provided, it is convenient to infrared receiving terminal
It is a prior art technical problem urgently to be solved that compatibility test is carried out in material replacement process.
Summary of the invention
The embodiment of the present invention provides a kind of test circuit of simply and easily infrared receiving terminal.
The embodiment of the invention provides a kind of test circuits of infrared receiving terminal, comprising:
Infrared transmission module sends the infrared emission signal of multiple and different intensity for timesharing；
Infrared receiving module, for connecting infrared receiving terminal to be measured, the infrared receiving terminal reception to be measured is the multiple not
With the infrared emission signal of intensity to generate different pulse signals；
Control module works for controlling infrared transmission module and receives the pulse signal, the control module detection
The width of the pulse signal and display.
Further, the infrared transmission module includes resistive module and infrared transmitter, and the resistive module is for mentioning
For the resistance of a variety of different resistance values, one end of the resistive module is connected to infrared transmitter；
The infrared receiving module includes detection circuit board, and the detection circuit board is one few for being detachably connectable to
Infrared receiving terminal to be measured；
The control module includes micro-control unit, and the micro-control unit includes output end and input terminal, the micro-control
The output end of unit processed is connected to the other end of the resistive module, and the receiving end of the micro-control unit is connected to the detection
Circuit board, wherein the control signal that the micro-control unit is supplied to infrared transmitter is adjusted to multiple by the resistive module
Different driving electric current, to drive the infrared emission signal of infrared transmitter transmitting varying strength, the micro-control unit passes through inspection
It surveys the width of the pulse signal and judges whether infrared receiving terminal to be measured meets material and replace according to preset reference pulse width
The preset condition changed.
Further, the test circuit of the infrared receiving terminal further includes display device, and the display device is for showing
Whether the numerical value and/or the display infrared receiving terminal to be measured of the width of the pulse signal meet the default item of material replacement
Part.
Further, the test circuit of the infrared receiving terminal further includes control circuit board, the micro-control unit, resistance
Module, infrared transmitter and display device are all set in control circuit board.
Further, the resistive module includes the resistance of multiple and different resistance values.
Further, the test circuit of the infrared receiving terminal further includes multiple switch, and each resistance is via the switch
It is connected serially to infrared transmitter.
Further, the quantity of the infrared receiving terminal to be measured is identical with the quantity of the resistance.
Further, the resistive module is a variable resistance, and the test circuit of the infrared receiving terminal further comprises
Switch, the variable resistance are connected serially to infrared transmitter via the switch.
Further, detection circuit board is connected to the control circuit board by soft arranging wire.
Further, the test circuit of the infrared receiving terminal further includes interference signal module, the interference signal module
For testing the performance and/or jamming light source module of the anti-wireless signal interference of infrared remote control head, the jamming light source module is used for
Test the performance of the anti-light interference of infrared remote control head.
Compared with the existing technology, the test circuit of the infrared receiving terminal provided in the embodiment of the present invention passes through infrared emission mould
Block sends the infrared emission signal of multiple and different intensity；Described in the infrared receiving terminal to be measured reception installed by infrared receiving module
The infrared emission signal of multiple and different intensity is to generate different pulse signals；By control module, infrared transmission module work is controlled
Make and receive the pulse signal, the control module detects the width of the pulse signal and display, can be easily
Compatibility test is carried out in material replacement process to infrared receiving terminal.The test circuit of the infrared receiving terminal of the present embodiment is not only
Structure is simply at low cost, and easy to use, considerably reduces the complicated processes of test, improves infrared receiving terminal in material
The efficiency of compatibility test is carried out in replacement process.
The micro-control unit of control module described in the embodiment of the present invention, which also passes through, to be detected the width of the pulse signal and sentences
Whether the infrared receiving terminal to be measured that breaks meets the preset condition of material replacement, further proposes entire test process automation degree
Height reduces the error artificially tested.
The present embodiment additionally provides display device, and the numerical value of the width for showing the pulse signal is omitted and is surveying
Using complex devices such as oscillographs during examination, the display of test result is simple and clear, easy to use.
The embodiment of the present invention can simultaneously test multiple infrared receiving terminals, can't be because of the infrared receiver of test
Head quantity increase test time, test it is high-efficient, the average value of test result can also be calculated automatically, further increased
The accuracy of test.
Detailed description of the invention
Fig. 1 is the module map of the test circuit for the infrared receiving terminal that the embodiment of the present invention one provides；
Fig. 2 is the test circuit structure figure of infrared receiving terminal provided by Embodiment 2 of the present invention；
Fig. 3 be infrared receiving terminal provided by Embodiment 2 of the present invention test circuit evolving infrared receiving terminal to be measured away from
From pulse width variation relation curve；
Fig. 4 is the embodiment of the present invention two according to range pulse change width affinity criterions curve setting a*L, b*L, c*L tri-
The preset reference pulse width of a detecting distance is respectively PA’、PB' and Pc' schematic diagram；
Fig. 5 is the test circuit structure figure for the infrared receiving terminal that the embodiment of the present invention three provides；
Fig. 6 is the test circuit structure figure for the infrared receiving terminal that the embodiment of the present invention four provides.
Fig. 7 is the test circuit structure figure for the infrared receiving terminal that the embodiment of the present invention five provides.
Fig. 8 is that the infrared receiving terminal that one embodiment of the invention provides shows in the signal strength that different location receives infrared signal
It is intended to.
Specific embodiment
The present invention is described in further detail with reference to the accompanying drawings and examples.It is understood that this place is retouched
The specific embodiment stated is used only for explaining the present invention rather than limiting the invention.It also should be noted that in order to just
Only the parts related to the present invention are shown in description, attached drawing rather than entire infrastructure.
It should be mentioned that some exemplary embodiments are described as before exemplary embodiment is discussed in greater detail
The processing or method described as flow chart.Although each step is described as the processing of sequence by flow chart, many of these
Step can be implemented concurrently, concomitantly or simultaneously.In addition, the sequence of each step can be rearranged.When its operation
The processing can be terminated when completion, it is also possible to have the additional step being not included in attached drawing.The processing can be with
Corresponding to method, function, regulation, subroutine, subprogram etc..
Embodiment one
Fig. 1 is a kind of module map of the test circuit for infrared receiving terminal that the embodiment of the present invention one provides, the present embodiment
The test circuit of infrared receiving terminal in material replacement process for carrying out compatibility test to infrared receiving terminal.The present embodiment is red
The outer test circuit for receiving head includes infrared transmission module 11, infrared receiving module 12 and control module 13.
Infrared transmission module 11 sends the infrared emission signal of multiple and different intensity for timesharing.It is infrared in the present embodiment
Transmitting module 11 includes at least the infrared transmitter of one or more transmittings or UV light.Can by preset time interval,
Such as 10 seconds or 20 seconds, the operating current of infrared transmitter is adjusted, infrared transmitter is made to be sent out the infrared hair of varying strength
Signal is penetrated, to simulate the infrared emission signal that there is infrared receiving terminal relatively to be measured the infrared transmitter of different distance to emit.Its
In, preset time interval can be any value in 1-30 seconds, and the present embodiment is with no restrictions.
Infrared receiving module 12, for connecting infrared receiving terminal to be measured, infrared receiving terminal to be measured receives aforesaid plurality of difference
The infrared emission signal of intensity is to generate different pulse signals.In the present embodiment, infrared receiving module 12 may include detection electricity
Road plate is used to install the infrared receiving terminal to be measured of one or more transmitting infrared lights, and infrared receiving terminal to be measured is received different strong
The infrared emission signal of degree is respectively used to simulate what infrared receiving terminal relatively to be measured emitted with the infrared transmitter of different distance
Infrared emission signal, infrared receiving terminal to be measured can produce different pulses letters after receiving the infrared emission signals of these varying strengths
Number.
Control module 13, for controlling the work of infrared transmission module 11 and return pulse signal, control module 13 detects arteries and veins
Rush the width of signal and display.In the present embodiment, control module 13 may include micro-control unit, micro-control unit can with it is red
Outer transmitting module 11 is integrated in a control circuit board, and by the route in control circuit board, micro-control unit can be with one
Or multiple infrared transmitter connections, to make infrared transmitter in the operating current of preset time interval adjustment infrared transmitter
It is sent out the infrared emission signal of varying strength.Winding displacement is arranged in the present embodiment between control circuit board and detection circuit board,
Different pulse signals that infrared receiving terminal to be measured is generated according to the infrared emission signal of varying strength are simultaneously transmitted to micro- by winding displacement
Control unit, micro-control unit detection pulse signal width are simultaneously shown.Display can be by being integrated in control module 13
Digital display tube is realized, can also be realized by being connected to the external display of micro-control unit, can also be passed through network connection
The display included to the terminal device of micro-control unit realizes that terminal device can be laptop, desktop computer, mobile phone
Or the electronic equipments such as plate, the present embodiment is with no restrictions.
In one embodiment, for preset time interval for 10 seconds, micro-control unit controls infrared transmission module 11 can be with
The infrared emission signal that intensity is A, B, C was successively sent at interval of 10 seconds, successively receiving intensity is A, B, C to infrared receiving terminal to be measured
Infrared emission signal after respectively generate have PA、PB、PCThe pulse signal of pulse width has PA、PB、PCThe arteries and veins of pulse width
It rushes signal and micro-control unit, the width P for the pulse signal that micro-control unit detection receives is transmitted to by winding displacementA、PB、PCIt goes forward side by side
Row is displayed for test man's reference.Specifically, first the actual range between infrared receiving terminal to be measured and infrared transmitter is arranged
For L, the first moment, micro-control unit controls infrared transmitter emissive porwer is the infrared emission signal of A, infrared transmitter transmitting
Infrared emission signal intensity be A when, indicate dummy spacers distance be a*L infrared transmitter and infrared receiving terminal between pass
Defeated infrared emission signal, if the pulse signal that the infrared emission signal that infrared receiving terminal receiving intensity to be measured is A at this time generates
The pulse width having is PA, the width P for the pulse signal that micro-control unit detection receivesAAnd it carries out being displayed for test man's ginseng
It examines；Second moment, micro-control unit controls infrared transmitter emissive porwer are the infrared emission signal of B, infrared transmitter transmitting
Infrared emission signal intensity be B when, indicate dummy spacers distance be b*L infrared transmitter and infrared receiving terminal between pass
Defeated infrared emission signal, if the pulse signal that the infrared emission signal that infrared receiving terminal receiving intensity to be measured is B at this time generates
The pulse width having is PB, the width P for the pulse signal that micro-control unit detection receivesBAnd it carries out being displayed for test man's ginseng
It examines；Third moment, micro-control unit controls infrared transmitter emissive porwer are the infrared emission signal of C, infrared transmitter transmitting
Infrared emission signal intensity be C when, indicate dummy spacers distance be c*L infrared transmitter and infrared receiving terminal between pass
Defeated infrared emission signal, if the pulse signal that the infrared emission signal that infrared receiving terminal receiving intensity to be measured is C at this time generates
The pulse width having is Pc, the width P for the pulse signal that micro-control unit detection receivescAnd it carries out being displayed for test man's ginseng
It examines, test man judges whether infrared receiving terminal to be measured meets material and replace according to the preset reference pulse width under respective distances
Preset condition, specifically, if the preset reference pulse width of detecting distance a*L be PA', then it is wide according to the pulse of display
Spend PA, judge the width P of the pulse signal of infrared receiving terminal to be measuredAWith reference pulse width PA' whether match；If detection away from
Preset reference pulse width from b*L is PB', the width P of received pulse signal at dummy spacers distance b*LB, then survey
Examination person judges the width P of the pulse signal of infrared receiving terminal to be measuredBWith reference pulse width PB' whether match；If detecting distance
The preset reference pulse width of c*L is PC', the width P of received pulse signal at dummy spacers distance c*Lc, test man
Then judge the width P of the pulse signal of infrared receiving terminal to be measuredCWith reference pulse width PC' whether match, if all matchings
Indicate that infrared receiving terminal to be measured meets the requirements, if there is the width of the pulse signal of any one infrared receiving terminal to be measured and with reference to arteries and veins
Rushing width mismatch then indicates that infrared receiving terminal to be measured is undesirable.In the present embodiment, the first moment, the second moment and third
Interval between moment can be 10 seconds or 20 seconds or 30 seconds.The intensity of infrared emission signal successively increases for A, B, C and difference
Correspond to successively linearly increasing simulated range a*L, b*L and c*L.
Compared with the existing technology, the test circuit of the infrared receiving terminal provided in the embodiment of the present invention passes through infrared emission mould
Block 11 sends the infrared emission signal of multiple and different intensity；It is received by the infrared receiving terminal to be measured that infrared receiving module 12 is installed
The infrared emission signal of multiple and different intensity is to generate different pulse signals；By control module 13, infrared transmission module is controlled
11 work and return pulse signal, control module 13 detect the width of pulse signal and display, can easily realize pair
Infrared receiving terminal carries out compatibility test in material replacement process.The test circuit of the infrared receiving terminal of the present embodiment is not only tied
Structure is simply at low cost, and easy to use, considerably reduces the complicated processes of test, improves infrared receiving terminal and replaces in material
The efficiency of compatibility test is carried out during changing.
Embodiment two
Fig. 2 is a kind of module map of the test circuit of infrared receiving terminal provided by Embodiment 2 of the present invention, the present embodiment
The test circuit of infrared receiving terminal provides different resistance for controlling the intensity of infrared emission signal, to realize to infrared receiving terminal
Compatibility test is carried out in material replacement process.The test circuit of the present embodiment infrared receiving terminal includes infrared transmission module
11, infrared receiving module 12 and control module 13.
Infrared transmission module 11 includes resistive module 111 and infrared transmitter 112, and resistive module 111 is a variety of for providing
The resistance of different resistance values, one end of resistive module 111 are connected to infrared transmitter 112.In the present embodiment, resistive module 111 is
The different resistance of multiple resistance values, such as 3 resistance R1, R2 and R3.
Infrared receiving module 12 includes detection circuit board 121, and detection circuit board 121 is one few for being detachably connectable to
Infrared receiving terminal to be measured, the present embodiment infrared receiving terminal to be measured are 3 IR1-IR3.The quantity and resistance of infrared receiving terminal to be measured
Quantity it is identical.
Control module 13 includes micro-control unit 131, and micro-control unit 131 includes output end and input terminal, microcontroller list
The output end of member 131 is connected to the other end of resistive module 111, and the receiving end of micro-control unit 131 is connected to detection circuit board
121.Micro-control unit 131 is supplied to the control signal of infrared transmitter 112 by resistance R1, R2 and R3 tune of resistive module 111
Whole is multiple and different driving currents, to drive the infrared emission signal of infrared transmitter transmitting varying strength, micro-control unit 131
Width by detecting pulse signal judges whether infrared receiving terminal IR1-IR3 to be measured meets the preset condition of material replacement.
In one embodiment, the infrared transmitter 112 of micro-control unit controls infrared transmission module 11 can be at interval of 10 seconds
The infrared emission signal that intensity is A, B, C is successively sent, successively receiving intensity is A, B, C to infrared receiving terminal IR1-IR3 to be measured
Generating respectively after infrared emission signal has PA、PB、PCThe pulse signal of pulse width.With PA、PB、PCThe pulse of pulse width
Signal is transmitted to micro-control unit 131 by winding displacement 18, and micro-control unit 131 detects the width of the pulse signal received and progress
Show PA、PB、PCFor test man's reference.It specifically, first will be between infrared receiving terminal IR1-IR3 to be measured and infrared transmitter 112
Actual range be set as L, the first moment, micro-control unit 131 controls the infrared hair that 112 emissive porwer of infrared transmitter is A
Signal is penetrated, when the intensity for the infrared emission signal that infrared transmitter 112 emits is A, indicates that dummy spacers distance is the infrared of a*L
The infrared emission signal transmitted between transmitter 112 and infrared receiving terminal IR1-IR3 to be measured, if infrared receiving terminal to be measured at this time
The pulse width that the pulse signal that the infrared emission signal that IR1-IR3 receiving intensity is A generates has is PA, micro-control unit
The width for the pulse signal that 131 detections receive simultaneously carries out display PAFor test man's reference；Second moment, micro-control unit 131
The infrared emission signal that 112 emissive porwer of infrared transmitter is B is controlled, the infrared emission signal that infrared transmitter 112 emits
When intensity is B, indicate to transmit between infrared transmitter 112 and infrared receiving terminal IR1-IR3 to be measured that dummy spacers distance is b*L
Infrared emission signal, if at this time infrared receiving terminal IR1-IR3 receiving intensity to be measured be B infrared emission signal generate pulse
The pulse width that signal has is PB, micro-control unit 131 detects the width of pulse signal received and simultaneously carries out display PBFor surveying
Examination person's reference；At the third moment, micro-control unit 131 controls the infrared emission signal that 112 emissive porwer of infrared transmitter is C, red
When the intensity for the infrared emission signal that external transmitter 112 emits is C, the infrared transmitter 112 that dummy spacers distance is c*L is indicated
The infrared emission signal transmitted between infrared receiving terminal IR1-IR3 to be measured, if infrared receiving terminal IR1-IR3 to be measured is received at this time
The pulse width that the pulse signal that the infrared emission signal that intensity is C generates has is Pc, micro-control unit 131 detects and receives
The width of pulse signal simultaneously carries out display PcFor test man's reference.In the present embodiment when the first moment, the second moment and third
It is successively spaced between quarter 10 seconds, the intensity of infrared emission signal is that A, B, C are successively increased and respectively corresponded the simulation successively increased
Distance a*L, b*L and c*L.According to dummy spacers distance a*L, b*L, c*L and corresponding simulated range pulse width PA、PBAnd PcIt can
To obtain the range pulse change width relation curve of infrared receiving terminal IR1-IR3 to be measured, as shown in figure 3, and judging to be measured red
Whether the outer range pulse change width relation curve for receiving head matches with preset standard curve.
In alternate embodiment, the reference pulse width of multiple detecting distances can also be set according to preset standard curve,
Micro-control unit 131 detect the width of the pulse signal of infrared receiving terminal to be measured and according to preset reference pulse width judge to
Survey infrared receiving terminal IR1-IR3 whether meet material replacement preset condition, specifically, if according to standard curve be arranged a*L,
The preset reference pulse width of tri- detecting distances of b*L, c*L is respectively PA’、PB' and Pc', as shown in figure 4, then microcontroller list
The width of received pulse signal at dummy spacers distance a*L of 131 detection infrared receiving terminal to be measured of member is respectively PA, then sentence
Break infrared receiving terminal IR1-IR3 to be measured pulse signal width PAIt is respectively P with reference pulse widthA' whether match；In mould
The width of received pulse signal is respectively P under quasi- spacing distance b*LB, then judge the pulse of infrared receiving terminal IR1-IR3 to be measured
The width P of signalBIt is respectively P with reference pulse widthB' whether match；The received pulse signal at dummy spacers distance c*L
Width be respectively Pc, then judge the width P of the pulse signal of infrared receiving terminal IR1-IR3 to be measuredCDistinguish with reference pulse width
For PC' whether match, indicate that infrared receiving terminal IR1-IR3 to be measured meets the requirements if all matchings, if there is any one is waited for
The width and reference pulse width mismatch for surveying the pulse signal of infrared receiving terminal IR1-IR3 then indicate infrared receiving terminal to be measured
IR1-IR3 is undesirable.In alternate embodiment, micro-control unit 131 can also calculate infrared receiving terminal IR1- to be measured automatically
Three pulse width P of the pulse signal of IR3CAverage value and matched with reference pulse width, reduce systematic calculation
Fault.
Compared with the existing technology, the infrared emission signal of varying strength is generated in the present embodiment using resistive module 111, no
Only structure is simple and is easy to implement.In addition, the microprocessing unit for stating control module 13 can also be by judging to be measured infrared connect
Receive the width P of the pulse signal of head IR1-IR3AIt is respectively P with reference pulse widthA' whether match it is to be measured infrared to automatically confirm that
Receive the preset condition whether head IR1-IR3 meets material replacement；Or the range pulse by judging infrared receiving terminal to be measured
Whether change width relation curve is matched with preset standard curve to automatically confirm that whether infrared receiving terminal IR1-IR3 to be measured accords with
The preset condition for closing material replacement, further reduces the work load of test man, improves the degree of automation.In addition it can
The average value for calculating the pulse width of infrared receiving terminal IR1-IR3 to be measured is matched, and test accuracy is improved.
Embodiment three
Fig. 5 is a kind of module map of the test circuit for infrared receiving terminal that the embodiment of the present invention three provides, the present embodiment
The test circuit of infrared receiving terminal provides display device to for showing that infrared receiving terminal is compatible in material replacement process
Property test result.The test circuit of the present embodiment infrared receiving terminal includes infrared transmission module 11, infrared receiving module 12, control
Molding block 13 and display device 14.
Infrared receiving module 12 includes detection circuit board 121, and detection circuit board 121 is one few for being detachably connectable to
Infrared receiving terminal to be measured, the present embodiment infrared receiving terminal to be measured are 3 IR1-IR3.
Infrared transmission module 11 includes resistive module 111, infrared transmitter 112 and switch module 113.
The present embodiment resistive module 111 includes three resistance R1-R3, and the resistance of respectively different resistance value, the present embodiment is to be measured
The quantity of infrared receiving terminal and the quantity of resistance are identical.Switch module 113 includes three switch Q1-Q3.The switch of the present embodiment
Q1-Q3 is also possible to micro-control unit 131 automatically according to default timing control either the physical switch that test man is manually operated
One of electronic switch of system, such as triode, thyristor or MOS transistor are a variety of.
Control module 13 includes micro-control unit 131, and micro-control unit 131 includes at least three output end out1-out3.
Each output end of control unit, which is connected, to be grounded after a resistance, switch and infrared transmitter 112 or each of control unit
One resistance of output end series connection, switch and infrared transmitter 112 are followed by test power supply.The present embodiment output end out1 series electrical
It is grounded after resistance R1, switch Q1 and infrared transmitter 112；That is output end out2 series resistance R2, switch Q2 and infrared emission
It is grounded after device 112；It is grounded after output end out3 series resistance R3, switch Q3 and infrared transmitter 112.Corresponding switch
When Q1-Q3 is connected, micro-control unit 131 be supplied to the control signal of infrared transmitter 112 by the resistance R1 of resistive module 111,
R2 and R3 is adjusted to multiple and different driving currents, to drive the infrared emission signal of infrared transmitter transmitting varying strength, micro-control
Unit 131 processed judges whether infrared receiving terminal IR1-IR3 to be measured meets the pre- of material replacement by detecting the width of pulse signal
If condition, specifically, the reference pulse width of multiple detecting distances, micro-control unit 131 are set according to preset standard curve
It detects the width of the pulse signal of infrared receiving terminal to be measured and infrared receiving terminal to be measured is judged according to preset reference pulse width
Whether IR1-IR3 meets the preset condition of material replacement.The corresponding current-limiting resistance of three switch Q1-Q3 of the present embodiment generation respectively
Table manual testing distance is remote, in, it is close, actually can be according to the needs for testing different measuring distances, in design control circuit board 10
When can reserve the current-limiting resistances of more switches and different resistance values, to increase the situations of more simulation manual testing's distances.
Test man very easily the pulse by different reception heads under various signal strengths can export width.It is received when needing replacing
When head, original sample only need to be pulled up, changes new sample.The software of microprocessing unit 131 can also be according to actual test
New function is continued to optimize and increased to situation.
Display device 14 and microprocessing unit 131 connect, for show test as a result, the display device of present embodiment
Whether 14 for the numerical value for showing the width of pulse signal and/or can show infrared receiving terminal to be measured with electron display tube
Meet the preset condition of material replacement.
Compared with the existing technology, the present embodiment controls the infrared hair for generating varying strength using multiple switch Q1-Q3 respectively
Signal is penetrated, be not only simple in structure and inspector is facilitated to be manually operated.
Example IV
Fig. 6 is a kind of module map of the test circuit of the infrared receiving terminal that provides of the embodiment of the present invention four, the present embodiment and
Aforementioned embodiments the difference is that: infrared transmission module 11 include resistive module 111, infrared transmitter 112 and switch
Module 113.Resistive module 111 is variable resistance R4.Switch module 113 includes switch Q1.Micro-control unit 131 includes output end
Out1 and control terminal Con1 and control terminal Con2.Output end out1 connects after variable resistance R4, switch Q1 and infrared transmitter 112
Ground connection.Control terminal Con1 is connected with variable resistance R4.Control terminal Con2 is connected with the control terminal of switch Q1.Three pole of the present embodiment
One of pipe, thyristor or MOS transistor.In the present embodiment
Microprocessing unit 131 provides control signal while different moments control switch Q1 is connected and changes variable resistance R4
Resistance value, with drive infrared transmitter transmitting varying strength infrared emission signal, micro-control unit 131 by detection pulse letter
Number width judge infrared receiving terminal IR1-IR3 to be measured whether meet material replacement preset condition, specifically, according to preset
The reference pulse width of multiple detecting distances is arranged in standard curve, and micro-control unit 131 detects the pulse of infrared receiving terminal to be measured
The width of signal simultaneously judges whether infrared receiving terminal IR1-IR3 to be measured meets material replacement according to preset reference pulse width
Preset condition.
A variable resistance is used only just in the test circuit of infrared receiving terminal provided in this embodiment compared with the existing technology
The automatic test to infrared receiving terminal to be measured is realized, not only circuit structure is simple but also more convenient to use.
In alternate embodiment, the test circuit of above-mentioned infrared receiving terminal may further include control circuit board 10, such as Fig. 6
Shown in, the micro-control unit 131, resistive module 111, infrared transmitter 112, switch module 113 and display device 14 are all
It is set in control circuit board 10.
Compared with the existing technology, infrared transmission module, control module and display device are all integrated by this alternate embodiment
Together, the volume of the test circuit of entire infrared receiving terminal is reduced, more convenient test man carries and operation, the display
The width that device is applied not only to display detection pulse signal is also used to show the various controls operation needed in test.
Embodiment five
Fig. 7 is a kind of module map of the test circuit of the infrared receiving terminal that provides of the embodiment of the present invention five, the present embodiment and
Aforementioned embodiments the difference is that: infrared receiving module 12 includes detection circuit board 121, interference signal module 123, dry
Light source module 125 is disturbed, detection circuit board 121 is waited for for being detachably connectable to a few infrared receiving terminal to be measured, the present embodiment
Survey infrared receiving terminal is 3 IR1-IR3.
The present embodiment, interference signal module 123 include at least the transmitting antenna 1231 that is arranged in detection circuit board 121 with
And the router 1232 connected with transmitting antenna 1231, for testing the performance of the anti-wireless signal interference of infrared remote control head.Routing
Device 1232 emits signal by the WIFI that transmitting antenna 1231 provides 2.4G and 5G.After router 1232 and mobile phone networking, in hand
Generator terminal has one APP of installation to realize data traffic exchange in advance.The present embodiment, setting 123 purpose of interference signal module is to give way
A stronger WIFI interference signal is provided by device 1232.The WIFI transmitting antenna 1231 of router 1232 is very close to be measured red
Outer reception head IR1-IR3.Infrared receiving terminal to be measured is detected during 1232 receiving and transmitting signal of router by micro-control unit 131
Generate pulse signal whether have clutter, come determine infrared receiving terminal to be measured wireless signal interference performance.
The jamming light source module 125 of the present embodiment includes being collected in jamming light source in the market to infrared receiving terminal to be measured
Several lamps being affected, for testing the performance of the anti-light interference of infrared remote control head.The jamming light source of the present embodiment mainly includes
Two classes, one kind are incandescent lamps, and another kind of is energy-saving lamp.Energy-saving lamp in the market is relatively complicated, and the switching frequency of work compares
Close to infrared carrier wave modulating frequency, the Wavelength distribution in spectrum is wider, some can fall in the wave-length coverage of infrared remote control,
Interference more stronger than incandescent lamp can be generated to infrared signal.In the case where infrared emission unit 112 does not emit infrared signal, lead to
Cross the pulse that detection receiving unit 121 exports during jamming light source module 125 emits jamming light source of micro-control unit 131
Whether signal has clutter, come determine infrared receiving terminal to be measured anti-light interference performance；On the other hand, infrared emission unit is allowed
112 transmitting infrared signals, the output signal by detecting receiving unit 121 can judge infrared receiver from pulse width
Ability to work of the head under strong infrared environmental.
With reference to Fig. 8, in alternate embodiment, due to the intensity and launch angle φ of the infrared signal of infrared transmitter F1 transmitting
It is related, under identical transmitting signal strength, the pulse width W2 meeting of the infrared receiving terminal IR2 to be measured generation of launch angle center
Slightly larger than pulse width W1, W3 that two infrared receiving terminal IR1, IR3 to be measured of launch angle two sides are generated, therefore in order to accurate
Test whether the pulse width that each infrared receiving terminal to be measured generates meets the requirements, it can be previously according to infrared receiving terminal phase to be measured
Reference pulse compensation is carried out for the placed angle range φ of infrared transmitter F1, is joined in the settable previous embodiment of the present embodiment
Examining pulse width is respectively PA' and Pc' it is slightly less than PB’。
In another alternate embodiment, also different rule can be provided by infrared transmitter F1 for different types of infrared receiving terminal
The pulse transmission signals of lattice, in order to which more accurately whether the performance parameter of the infrared receiving terminal of test corresponding types conforms to
It asks, specifically, for the infrared receiving terminal using RCMM agreement, can be believed with the infrared emission that fire pulse width is 200 microseconds
Number, it can be the infrared emission signal of 500 microseconds with fire pulse width for the infrared receiving terminal using NEC agreement.
Note that the above is only a better embodiment of the present invention and the applied technical principle.It will be appreciated by those skilled in the art that
The present invention is not limited to specific embodiments here, be able to carry out for a person skilled in the art it is various it is apparent variation, again
Adjustment and substitution are without departing from protection scope of the present invention.Therefore, although by above embodiments to the present invention carried out compared with
For detailed description, but the present invention is not limited to the above embodiments only, without departing from the inventive concept, can be with
Including more other equivalent embodiments, and the scope of the invention is determined by the scope of the appended claims.
Claims (10)
1. a kind of test circuit of infrared receiving terminal characterized by comprising
Infrared transmission module sends the infrared emission signal of multiple and different intensity for timesharing；
Infrared receiving module, for connecting infrared receiving terminal to be measured, the infrared receiving terminal to be measured receives the multiple different strong
The infrared emission signal of degree is to generate different pulse signals；
Control module works for controlling infrared transmission module and receives the pulse signal, described in the control module detection
The width of pulse signal and display.
2. the test circuit of infrared receiving terminal according to claim 2, which is characterized in that
The infrared transmission module includes resistive module and infrared transmitter, and the resistive module is for providing a variety of different resistance values
Resistance, one end of the resistive module is connected to infrared transmitter；
The infrared receiving module includes detection circuit board, and the detection circuit board is to be measured for being detachably connectable to few one
Infrared receiving terminal；
The control module includes micro-control unit, and the micro-control unit includes output end and input terminal, the microcontroller list
The output end of member is connected to the other end of the resistive module, and the receiving end of the micro-control unit is connected to the detection circuit
Plate, wherein the control signal that the micro-control unit is supplied to infrared transmitter is adjusted to multiple and different by the resistive module
Driving current, to drive the infrared emission signal of infrared transmitter transmitting varying strength, the micro-control unit passes through detection institute
It states the width of pulse signal and judges whether infrared receiving terminal to be measured meets material replacement according to preset reference pulse width
Preset condition.
3. the test circuit of infrared receiving terminal according to claim 2, which is characterized in that it further comprise display device,
The display device is used to show whether the numerical value of the width of the pulse signal and/or the display infrared receiving terminal to be measured to accord with
Close the preset condition of material replacement.
4. the test circuit of infrared receiving terminal according to claim 2, which is characterized in that further comprise control circuit
Plate, the micro-control unit, resistive module, infrared transmitter and display device are all set in control circuit board.
5. the test circuit of infrared receiving terminal according to claim 2, which is characterized in that the resistive module includes multiple
The resistance of different resistance values.
6. the test circuit of infrared receiving terminal according to claim 5, which is characterized in that it further comprise multiple switch,
Each resistance is connected serially to infrared transmitter via the switch.
7. the test circuit of infrared receiving terminal according to claim 6, which is characterized in that the infrared receiving terminal to be measured
Quantity is identical with the quantity of the resistance.
8. the test circuit of infrared receiving terminal according to claim 2, which is characterized in that the resistive module is one variable
Resistance, the test circuit of the infrared receiving terminal further comprise switch, and the variable resistance is connected serially to red via the switch
External transmitter.
9. the test circuit of infrared receiving terminal according to claim 4, which is characterized in that detection circuit board passes through soft arranging wire
It is connected to the control circuit board.
10. the test circuit of -9 any infrared receiving terminals according to claim 1, which is characterized in that further comprise doing
Signaling module is disturbed, the interference signal module is used to test the performance of the anti-wireless signal interference of infrared remote control head, and/or interference light
Source module, the jamming light source module are used to test the performance of the anti-light interference of infrared remote control head.
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