CN109257595A - The system of Photo-Response Non-Uniformity in a kind of testing image sensor pixel - Google Patents
The system of Photo-Response Non-Uniformity in a kind of testing image sensor pixel Download PDFInfo
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- CN109257595A CN109257595A CN201811407348.7A CN201811407348A CN109257595A CN 109257595 A CN109257595 A CN 109257595A CN 201811407348 A CN201811407348 A CN 201811407348A CN 109257595 A CN109257595 A CN 109257595A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
- H04N17/002—Diagnosis, testing or measuring for television systems or their details for television cameras
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/50—Constructional details
- H04N23/54—Mounting of pick-up tubes, electronic image sensors, deviation or focusing coils
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Abstract
The invention discloses a kind of systems of Photo-Response Non-Uniformity in testing image sensor pixel, comprising: asterism projection arrangement, imaging sensor, micro-displacement platform, image collecting device, processor；Asterism is projected to described image sensor surface programming region using the asterism projection arrangement；Relative displacement of the asterism on described image sensor surface is adjusted using the micro-displacement platform；Described image acquisition device is used to work as the every increase preset step-length of relative displacement of the asterism on described image sensor surface, acquires and stores a width asterism image；The processor tests and assesses to Photo-Response Non-Uniformity in the pixel of described image sensor according to the image patch ellipticity for the every width asterism image being calculated for handling several collected asterism images.System provided by the present invention projects image sensor surface using asterism and controls its movement, and measurement imaging sensor assesses Photo-Response Non-Uniformity in its pixel to the ellipticity of asterism imaging spot.
Description
Technical field
The present invention relates to image sensor performance the field of test technology, more particularly to a kind of testing image sensor device picture
The system of Photo-Response Non-Uniformity in member.
Background technique
The photoresponse heterogeneity of imaging sensor includes Photo-Response Non-Uniformity in Photo-Response Non-Uniformity and pixel between pixel
Two aspects.Wherein, Photo-Response Non-Uniformity index is relatively conventional between pixel (Photo-Response Non-Uniformity in the pixel being usually previously mentioned,
Photoresponse heterogeneity, PRNU etc. refer both to Photo-Response Non-Uniformity between pixel), be by quantum efficiency different between different pixels,
Caused by fill factor etc., for evaluating the responsiveness difference that imaging sensor difference pixel irradiates same light；And in pixel
Photo-Response Non-Uniformity is constructed of by the unsymmetrical knot of pixel photosensitive region, i.e., same small asterism is incident upon in pixel
Different zones are had differences by the amount of charge that photoelectric effect generates, thus can be by calculating imaging sensor to continuous
The ellipticity of mobile asterism imaging spot evaluates the Photo-Response Non-Uniformity in its pixel.
In application fields such as deep space exploration camera, star sensors, target being observed projects image by optical system and passes
The picture of sensor surfaces usually only covers a few pixel.It is right due to the presence of Photo-Response Non-Uniformity in imaging sensor pixel
The geometry of asterism target imaging can be changed, and the image patch of ellipse, and then influence pair are such as likely to be obtained to round asterism
The discriminance analysis of target, and the resolution to the target that partly overlaps.When Photo-Response Non-Uniformity is larger in pixel, this influence will
It is more significant, it is therefore desirable to which that test assessment is carried out to Photo-Response Non-Uniformity in the pixel of imaging sensor.
In summary as can be seen that how to carry out test to Photo-Response Non-Uniformity in the pixel of imaging sensor is to have at present
Problem to be solved.
Summary of the invention
The object of the present invention is to provide a kind of systems of Photo-Response Non-Uniformity in testing image sensor pixel, existing to solve
There is the influence that imaging sensor is imaged in heterogeneity in pixel in technology.
In order to solve the above technical problems, the present invention Photo-Response Non-Uniformity in a kind of testing image sensor pixel is provided be
System, comprising: asterism projection arrangement, imaging sensor to be detected, micro-displacement platform, image collecting device, processor；Wherein, institute
Asterism projection arrangement is stated for projecting asterism to the predeterminable area on described image sensor surface；The micro-displacement platform is for adjusting
Save the position between the asterism projection arrangement and described image sensor；, sensed to adjust the asterism in described image
Relative displacement on device surface；Described image acquisition device is used for when the asterism is opposite on described image sensor surface
It is displaced every increase preset step-length, acquire and stores a width asterism image；The processor is used for several collected asterism figures
As being handled, rung according to the image patch ellipticity for the every width asterism image being calculated in the pixel of described image sensor
Heterogeneity is answered to test and assess.
Preferably, the asterism projection arrangement includes:
Asterism target, parallel light tube, object lens；
Wherein, the parallel light tube is installed on the right side of the asterism target, and the object lens are installed on the parallel light tube
Right side, the object lens are installed on the left side of described image sensor；
The star target is located on the focal plane of the parallel light tube, and vertical with the optical axis of the parallel light tube entrance pupil；
The optical axis coincidence of the parallel light tube emergent pupil and the object lens entrance pupil；Described image sensor is perpendicular to the object lens
The optical axis of emergent pupil；
After incident light source light beam passes through the asterism target, it is transmitted through into the parallel light tube, and after the object lens
Described image sensor surface.
Preferably, the asterism target is fixed on the micro-displacement platform, mobile in order to control the asterism target, from
And move the asterism on described image sensor surface.
Preferably, the micro-displacement platform is specifically used for: controlling the asterism target to be parallel to described image sensor picture
The row/column direction of member is mobile.
Preferably, the micro-displacement platform is for controlling the asterism target with preset step-length gradually to described image sensor
It is mobile, so that controlling the step-length that the asterism moves on described image sensor surface is less than or equal to the 1/ of the pixel width
10, and the asterism is in the distance for the pixel width that the mobile distance in the movable sensor surface is preset quantity.
Preferably, the processor is specifically used for:
Several described collected asterism images are handled, described image in every width asterism image is calculated and senses
Image patch flow of the device to the asterism imaging spot；
Calculate the centroid position of image patch in every width asterism image；
Using the image patch flow and the centroid position of image patch in every width asterism image, it is calculated described every
The image patch ellipticity of image patch in width asterism image；
Using the maximum value in the image patch ellipticity of image patch in every width asterism image, in described image sensor pixel
Photo-Response Non-Uniformity carries out assessment test.
Preferably, the described image sensor that is calculated in every width asterism image is to the picture of the asterism imaging spot
Spot flow includes:
It utilizesDescribed image sensor is calculated in every width asterism image to the picture of the asterism imaging spot
Spot flow；Wherein, IiFor the pixel of serial number i, i ∈ S, S are light-measuring hole diameter set, and the coordinate value of pixel is (xi,yi)。
Preferably, the centroid position for calculating image patch in every width asterism image includes:
It utilizesMeasure the mass center of image patch described in every width asterism image
Position (X, Y).
Preferably, the image patch flow and the centroid position using image patch in every width asterism image, meter
It calculates and obtains the image patch ellipticity of image patch in every width asterism image and include:
It utilizesCalculate the image patch ellipticity of the image patch；
Wherein,
σ1For the average value of the standard deviation of every row pixel gray value in the set S, σ2For each column picture in the set S
The average value of the standard deviation of first gray value.
Preferably, described image sensor is fixed on the micro-displacement platform, in order to control described image sensor with
And the driving circuit of described image sensor is moved along the direction perpendicular to the asterism projection arrangement optical axis.
The system of Photo-Response Non-Uniformity in testing image sensor pixel provided by the present invention, comprising: asterism projection dress
It sets, imaging sensor to be detected, micro-displacement platform, image collecting device and processor.Using the asterism projection arrangement by star
In point projection to the predeterminable area on described image sensor surface.Using the micro-displacement platform control the asterism projection arrangement and
Relative displacement between described image sensor, so that it is mobile on described image sensor surface to control the asterism.The figure
As acquisition device is used to acquire simultaneously when the every increase preset step-length of relative displacement of the asterism on described image sensor surface
Store a width asterism image.The processor is used to calculate separately the image patch ellipticity of image patch in several collected asterism images,
Evaluation and test to the image patch ellipticity using each width asterism image to Photo-Response Non-Uniformity in described image sensor pixel.This
System provided by inventing, projects image sensor surface using asterism and controls its movement, measures imaging sensor to star
The ellipticity of point imaging spot is to assess Photo-Response Non-Uniformity in its pixel.
Detailed description of the invention
It, below will be to embodiment or existing for the clearer technical solution for illustrating the embodiment of the present invention or the prior art
Attached drawing needed in technical description is briefly described, it should be apparent that, the accompanying drawings in the following description is only this hair
Bright some embodiments for those of ordinary skill in the art without creative efforts, can be with root
Other attached drawings are obtained according to these attached drawings.
Fig. 1 is a kind of knot of the system of Photo-Response Non-Uniformity in testing image sensor pixel provided in an embodiment of the present invention
Structure block diagram；
Fig. 2 is the another kind of the system of Photo-Response Non-Uniformity in testing image sensor pixel provided in an embodiment of the present invention
Structural block diagram；
Specific embodiment
The system that core of the invention is to provide Photo-Response Non-Uniformity in a kind of testing image sensor pixel, utilizes asterism
It projects image sensor surface and controls its movement, measurement imaging sensor assesses it to the ellipticity of asterism imaging spot
Photo-Response Non-Uniformity in pixel.
In order to enable those skilled in the art to better understand the solution of the present invention, with reference to the accompanying drawings and detailed description
The present invention is described in further detail.Obviously, described embodiments are only a part of the embodiments of the present invention, rather than
Whole embodiments.Based on the embodiments of the present invention, those of ordinary skill in the art are not making creative work premise
Under every other embodiment obtained, shall fall within the protection scope of the present invention.
Referring to FIG. 1, Fig. 1 is Photo-Response Non-Uniformity in a kind of testing image sensor pixel provided in an embodiment of the present invention
System structural block diagram.The system packet of Photo-Response Non-Uniformity in the testing image sensor pixel of offer described in the present embodiment
It includes: asterism projection arrangement, imaging sensor to be detected, micro-displacement platform, image collecting device, processor；Wherein, the asterism
Projection arrangement is for projecting asterism to the predeterminable area on described image sensor surface；The micro-displacement platform is described for adjusting
Position between asterism projection arrangement and described image sensor；, to adjust the asterism on described image sensor surface
On relative displacement；Described image acquisition device is used for when relative displacement of the asterism on described image sensor surface is every
Increase preset step-length, acquires and store a width asterism image；The processor is used to carry out several collected asterism images
Processing, it is non-equal to being responded in the pixel of described image sensor according to the image patch ellipticity for the every width asterism image being calculated
Even property is tested and assessed.
As shown in Fig. 2, the asterism projection arrangement includes: asterism target in another embodiment provided by inventing, put down
Row light pipe, object lens；Wherein, the parallel light tube is installed on the right side of the asterism target, and the object lens are installed on described parallel
The right side of light pipe, the object lens are installed on the left side of described image sensor；The star target is located at the coke of the parallel light tube
On face, and it is vertical with the optical axis of the parallel light tube entrance pupil；The optical axis coincidence of the parallel light tube emergent pupil and the object lens entrance pupil；
Optical axis of the described image sensor perpendicular to the object lens emergent pupil；After incident light source light beam passes through the asterism target, into institute
Parallel light tube is stated, and is transmitted through described image sensor surface after the object lens.
The asterism is projected to the predeterminable area on described image sensor surface, image patch by the asterism projection arrangement
The control of size concentrates in 4 pixels being advisable with its 80% light energy.
In the present embodiment, the asterism target can be fixed on the micro-displacement platform, to control the star
Point target is mobile with the row/column direction for being parallel to described image sensor pixel.Described image sensor can also be fixed on
On the micro-displacement platform, in order to control the driving circuit of described image sensor and described image sensor along perpendicular to institute
The direction for stating asterism projection arrangement optical axis is mobile.
If the asterism target is fixed on the micro-displacement platform, the asterism target is controlled with preset step-length gradually
It is mobile to described image sensor, it is less than or equal to control the step-length that the asterism moves on described image sensor surface
The 1/10 of the pixel width, and the asterism is wide in the pixel that the mobile distance in the movable sensor surface is preset quantity
The distance of degree.
Incident light source light beam enters the parallel light tube after the asterism target, is incident upon figure using the object lens
As sensor surface.The asterism target is fixed on the micro-displacement platform, the asterism can control by precision displacement table
Target is mobile.Using computer as the processor in the present embodiment.The driving circuit and power supply, the figure of imaging sensor
As collector and the computer are connected, the micro-displacement platform is connected with the computer, powers on booting respectively.It is described
Power supply is the drive circuitry.The computer can control micro-displacement platform mobile or control described image sensor and its drive
Dynamic circuit is mobile, and obtains image data by described image collector, is further processed and operation, obtains image sensing
Photo-Response Non-Uniformity measurement result in device pixel.
Since the initial position of serial number 0, it is gradually that the asterism is mobile that the computer controls the micro-displacement platform
To k-th of position of serial number k, until moving distance of the asterism in described image sensor reaches the picture of preset quantity
The distance of first width.At a distance from the asterism and the pixel width for being moved to preset quantity, K step is moved altogether.The asterism and institute
It states one step of every completion between imaging sensor to relatively move, the figure layer collector acquires a width asterism image and stores, and root
It is 0~K to the asterism picture number according to the quantity of moving step length.
The computer utilizesDescribed image sensor is calculated in every width asterism image to the asterism institute
At the image patch flow of image patch；Wherein, IiFor the pixel of serial number i, i ∈ S, S are light-measuring hole diameter set, and the coordinate value of pixel is
(xi,yi).It utilizesMeasure the mass center position of image patch described in every width asterism image
Set (X, Y).
It utilizesIt utilizesCalculate the image patch ellipticity of the image patch；
Wherein,
σ1For the average value of the standard deviation of every row pixel gray value in the set S, σ2For each column picture in the set S
The average value of the standard deviation of first gray value.
The ellipticity of whole asterism image image patches of acquisition, and with the asterism shift position serial number abscissa, corresponding picture
Spot ellipticity measured value is that ordinate draws curve, and periodic relief tendency will be presented in curve.Take wherein maximum value conduct evaluation image
In sensor pixels Photo-Response Non-Uniformity index as a result, the numerical value of the maximum value is bigger, then the picture of described image sensor
Photo-Response Non-Uniformity is more significant in member.
In the present embodiment, round asterism is projected by the asterism target, the parallel light tube and the object lens scheming
As sensor surface, and using the micro-displacement platform control its by a fixed step size, perpendicular to optical axis and along imaging sensor pixel
Row or column direction move linearly the distances of several pixel width；Described image collector acquires a width after the completion of every moved further
Image simultaneously stores；It is handled using image sequence of the computer to acquisition, by imaging sensor to asterism imaging
The intermediate quantities such as flow, the centroid position of spot further calculate to obtain the measurement result of image patch ellipticity, for evaluating imaging sensor
Pixel in Photo-Response Non-Uniformity.
Each embodiment in this specification is described in a progressive manner, the highlights of each of the examples are with it is other
The difference of embodiment, same or similar part may refer to each other between each embodiment.For being filled disclosed in embodiment
For setting, since it is corresponded to the methods disclosed in the examples, so being described relatively simple, related place is referring to method part
Explanation.
The system of Photo-Response Non-Uniformity in a kind of testing image sensor pixel provided by the present invention is carried out above
It is discussed in detail.Used herein a specific example illustrates the principle and implementation of the invention, above embodiments
Illustrate to be merely used to help understand method and its core concept of the invention.It should be pointed out that for the common skill of the art
, without departing from the principle of the present invention, can be with several improvements and modifications are made to the present invention for art personnel, these change
It is also fallen within the protection scope of the claims of the present invention into modification.
Claims (10)
1. the system of Photo-Response Non-Uniformity in a kind of testing image sensor pixel characterized by comprising
Asterism projection arrangement, imaging sensor to be detected, micro-displacement platform, image collecting device, processor；
Wherein, the asterism projection arrangement is for projecting asterism to the predeterminable area on described image sensor surface；
The micro-displacement platform is used to adjust the position between the asterism projection arrangement and described image sensor, to adjust institute
State relative displacement of the asterism on described image sensor surface；
Described image acquisition device is used for when the every increase of relative displacement of the asterism on described image sensor surface is default
Step-length acquires and stores a width asterism image；
The processor is for handling several collected asterism images, according to the every width asterism figure being calculated
The image patch ellipticity of picture tests and assesses to Photo-Response Non-Uniformity in the pixel of described image sensor.
2. the system as claimed in claim 1, which is characterized in that the asterism projection arrangement includes:
Asterism target, parallel light tube, object lens；
Wherein, the parallel light tube is installed on the right side of the asterism target, and the object lens are installed on the right side of the parallel light tube
Side, the object lens are installed on the left side of described image sensor；
The star target is located on the focal plane of the parallel light tube, and vertical with the optical axis of the parallel light tube entrance pupil；
The optical axis coincidence of the parallel light tube emergent pupil and the object lens entrance pupil；Described image sensor is perpendicular to the object lens emergent pupil
Optical axis；
After incident light source light beam passes through the asterism target, into the parallel light tube, and it is transmitted through after the object lens described
Image sensor surface.
3. system as claimed in claim 2, which is characterized in that the asterism target is fixed on the micro-displacement platform, so as to
It is mobile in controlling the asterism target, so that the asterism be made to move on described image sensor surface.
4. system as claimed in claim 3, which is characterized in that the micro-displacement platform is specifically used for: controlling the asterism target
It is mobile with the row/column direction for being parallel to described image sensor pixel.
5. system as claimed in claim 4, which is characterized in that the micro-displacement platform is for controlling the asterism target with default
Step-length is gradually mobile to described image sensor, to control the step-length that the asterism moves on described image sensor surface
Less than or equal to the 1/10 of the pixel width, and the asterism is preset quantity in the mobile distance in the movable sensor surface
Pixel width distance.
6. the system as claimed in claim 1, which is characterized in that the processor is specifically used for:
Several described collected asterism images are handled, described image sensor pair in every width asterism image is calculated
The image patch flow of the asterism imaging spot；
Calculate the centroid position of image patch in every width asterism image；
Using the image patch flow and the centroid position of image patch in every width asterism image, every width star is calculated
The image patch ellipticity of image patch in point image；
Using the maximum value in the image patch ellipticity of image patch in every width asterism image, to being responded in described image sensor pixel
Heterogeneity carries out assessment test.
7. system as claimed in claim 6, which is characterized in that described that described image sensing in every width asterism image is calculated
Device includes: to the image patch flow of the asterism imaging spot
It utilizesDescribed image sensor is calculated in every width asterism image to the image patch stream of the asterism imaging spot
Amount；Wherein, IiFor the pixel of serial number i, i ∈ S, S are light-measuring hole diameter set, and the coordinate value of pixel is (xi,yi)。
8. system as claimed in claim 7, which is characterized in that the mass center position for calculating image patch in every width asterism image
It sets and includes:
It utilizesMeasure the centroid position of image patch described in every width asterism image
(X,Y)。
9. system as claimed in claim 8, which is characterized in that the picture using image patch in every width asterism image
Spot flow and the centroid position, the image patch ellipticity that image patch in every width asterism image is calculated include:
It utilizesCalculate the image patch ellipticity of the image patch；
Wherein,
σ1For the average value of the standard deviation of every row pixel gray value in the set S, σ2For each column pixel ash in the set S
The average value of the standard deviation of angle value.
10. the system as claimed in claim 1, which is characterized in that described image sensor is fixed on the micro-displacement platform, with
Convenient for the driving circuit of control described image sensor and described image sensor along perpendicular to the asterism projection arrangement light
The direction of axis is mobile.
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Application publication date: 20190122 |