CN109151860B - Test configuration method and system of wireless chip - Google Patents
Test configuration method and system of wireless chip Download PDFInfo
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- CN109151860B CN109151860B CN201810843147.5A CN201810843147A CN109151860B CN 109151860 B CN109151860 B CN 109151860B CN 201810843147 A CN201810843147 A CN 201810843147A CN 109151860 B CN109151860 B CN 109151860B
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Abstract
The invention provides a test configuration method and a system of a wireless chip, wherein the test configuration method of the wireless chip comprises the following steps: step S1, configuring the test parameters of the wireless chip according to the agreed grammar of the script to obtain the test command corresponding to the test parameters; step S2, starting the test software and realizing initialization; step S3, constructing a test task list according to the configured test command; step S4, starting a test, and applying for test command analysis through a script analysis module to obtain a control command; and step S5, issuing a control command and realizing the test. The invention configures the test parameters of the wireless chip according to the appointed grammar of the script to obtain the test command corresponding to the test parameters, and realizes the flexible configuration of the test command through the form of the script, thereby solving the problem that the code of the test control module of the equipment to be tested needs to be modified due to the command change of different chip schemes, reducing the development complexity and improving the test development efficiency.
Description
Technical Field
The present invention relates to a test configuration method, and more particularly, to a test configuration method for a wireless chip, and a test configuration system including the test configuration method for the wireless chip.
Background
In recent years, the internet of things has been rising along with the rapid development of smart homes and smart wearing industries, and popularization of communication products such as wireless APs, wireless network cards, smart wearing and bluetooth headsets has been brought. In the emerging industry, the business opportunities change instantly and the market demands change dramatically, so how to respond to the market changes and make the market serve is the subject of continuous pursuit, promotion and perfection of the production and service industries of various large manufacturing industries, scheme providers and the like.
Radio frequency quality of products such as WIFI and BT in the Internet of things follows related agreements of international IEEE. Therefore, in the production and manufacturing process of each product, professional testing equipment needs to be used, and matched testing software supports the rapid detection and judgment of product indexes to test the radio frequency indexes so as to meet the requirement of manufacturing capacity. Therefore, in response to market demand, manufacturers are closely linked in their entire flow of material supply, product development, production and manufacture, quality inspection, and product delivery. Quality inspection in the manufacturing process is also an important part; rapid development of production automation software and use of production lines are also becoming more important. Therefore, how to provide a complete and efficient test solution is an essential key factor in the above problems.
Because the wireless products are based on different wireless chip implementation schemes, various interface functions are provided to meet market demands; the interface includes the form including: common hardware interfaces such as an Ethernet port, a serial port, a USB, a PCIE, an SDIO and the like, wherein different hardware interfaces embody different communication control modes; moreover, the SDK software is inevitably different among different chip vendors in the same communication mode, and different communication command protocols are used.
Therefore, the test software for matching the production solution scheme is developed separately according to different chips. Generally, a mature production software provider has a mature software framework, and the most varied part of the whole production software is the DUT control part. Chips of different chip manufacturers are different in control modes and content forms, so development of production test software is time-consuming in debugging and verification of a DUT control part.
The traditional production software is developed in the form of: when the chip a is used, test software for the a _ SDK instruction set is developed when the a _ SDK software is used. When the chip B is used, test software aiming at the B _ SDK instruction set is developed when B _ SDK software is used. When using the chip C and the C _ SDK software, test software for the C _ SDK instruction set is developed.
That is, because of the diversity of chip control formats of wireless products, and the SDK procedure issued by each chip solution maker is not the same. When different chip schemes are used for each product, the existing production test software must be newly developed, and the efficiency and the cost are low for production test.
Disclosure of Invention
The technical problem to be solved by the present invention is to provide a test configuration method for a wireless chip, which can simplify the development process of production test software and greatly improve the development efficiency of software, so as to achieve a stable, flexible and efficient test effect, and further provide a test configuration system including the test configuration method for the wireless chip.
In view of the above, the present invention provides a test configuration method for a wireless chip, comprising the steps of:
step S1, configuring the test parameters of the wireless chip according to the agreed grammar of the script to obtain the test command corresponding to the test parameters;
step S2, starting the test software and realizing initialization;
step S3, constructing a test task list according to the configured test command;
step S4, starting a test, and applying for test command analysis through a script analysis module to obtain a control command;
and step S5, issuing a control command and realizing the test.
In a further improvement of the present invention, in the step S1, the test parameters of the wireless chip are defined and configured commonly by the standard syntax of the object representation script.
In a further improvement of the present invention, the test parameters include any one or more of channel, bandwidth, rate, mode, antenna, power factor, and frequency offset factor.
A further refinement of the invention is that said step S4 comprises the following sub-steps:
step S401, starting a test, and issuing test item information in a test task list to a test control module of the equipment to be tested;
step S402, the test control module of the device to be tested applies for test command analysis to the script analysis module;
step S403, the script parsing module parses the test command according to the agreed grammar of the script;
step S404, acquiring a control command corresponding to the current device to be tested.
In step S403, the test parameters related to the test item information are downloaded to the script parsing module for parameter parsing, and parsed into control command character strings that can be recognized by the current device under test according to the agreed syntax of the script.
The invention further improves that after the control command character string is obtained, the command format of the control command character string is customized and constructed.
A further refinement of the invention is that said step S5 comprises the following sub-steps:
step S501, the test control module of the device to be tested issues the acquired control command to the corresponding device to be tested;
step S502, confirming that the control command is successfully sent;
step S503, setting a test instrument to perform parameter test and signal measurement;
and step S504, analyzing and judging the test result, and finishing the test.
A further improvement of the present invention is that in step S503, the measurement of the signal includes measurement of a radio frequency signal.
The invention is further improved in that the wireless chip comprises at least one of a WIFI chip, a Bluetooth chip and a Zigbee chip.
The invention also provides a test configuration system of the wireless chip, which adopts the test configuration method of the wireless chip.
Compared with the prior art, the invention has the beneficial effects that: the test parameters of the wireless chip are configured according to the agreed grammar of the script to obtain the test commands corresponding to the test parameters, namely, the test commands for controlling the test are configured in the form of the script to realize the flexible configuration of the test commands, so that the problem that the test control module codes of the equipment to be tested need to be modified due to the command change of different chip schemes is solved, the development complexity of the test software of the wireless chip is reduced, the test development efficiency of the wireless chip is improved, and the stability of the software test is ensured by further adopting a platform mode of a test configuration system.
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FIG. 1 is a schematic workflow diagram of one embodiment of the present invention;
FIG. 2 is a detailed workflow diagram of one embodiment of the present invention;
FIG. 3 is a diagram of a software framework according to an embodiment of the present invention.
Detailed Description
Preferred embodiments of the present invention will be described in further detail below with reference to the accompanying drawings.
This example explains the terms first: the DUT is a Device Under Test (Device Under Test), the USB is a Universal Serial Bus (Universal Serial Bus), the PC is a personal computer (personal computer), the API is an Application Programming Interface (Application Programming Interface), the IEEE is the Institute of Electrical and Electronics Engineers (Institute of Electrical and Electronics Engineers), the WIFI is a technology that allows an electronic Device to connect to a Wireless local area network (Wireless Fidelity), the BT is Bluetooth technology, and the Zigbee is a Wireless network protocol for low-speed short-distance transmission. JSON is a lightweight data exchange format, also called Object Notation, and is an abbreviation for JavaScript Object Notation. SDK is a Software Development Kit, the English abbreviation of Software Development Kit.
As shown in fig. 1 and fig. 2, this example provides a test configuration method for a wireless chip, including the following steps:
step S1, configuring the test parameters of the wireless chip according to the agreed grammar of the script to obtain the test command corresponding to the test parameters;
step S2, starting the test software and realizing initialization;
step S3, constructing a test task list according to the configured test command; the test task list is mainly constructed based on test requirements of the DUT, and the content of the test task list comprises: testing parameters such as item types, test modes, test rates, channels, antennas and the like; the combination of different values of these parameters represents different testing requirements, thereby constituting a sequence of items to be tested.
Step S4, starting a test, and applying for test command analysis through a script analysis module to obtain a control command;
and step S5, issuing a control command and realizing the test.
The method aims at places where commonalities exist among devices to be tested (DUTs) controlled in a command form, and the method utilizes the characteristics of the commonalities, so that the development process of producing test software is simplified, and the development efficiency of the software is greatly improved; and aims to provide a stable, flexible and efficient test program through the platform operation.
Correspondingly, the optimization of the software platform framework in this embodiment is to abstract and integrate the test control module (DUT control part) of the device under test in the conventional scheme with the universal DUT control module, and configure the test command for test control in the form of script by using JSON technology, so as to implement a method for flexibly configuring the control command, so as to solve the problem that the code of the test control module (DUT control part) of the device under test needs to be modified due to the command change of different chip schemes, as shown in fig. 3.
In step S1 in this example, the method for universally defining and configuring the test parameters of the wireless chip through the standard syntax of the object representation script includes the following steps:
step S101, determining variables needing to be defined according to the test requirements of a test object; the variables include: channel, bandwidth, rate, mode, antenna, power factor, frequency offset factor, etc.;
step S102, after defining the variables, assigning values to the variables according to the actual command of the DUT, wherein the rule of the assignment accords with the standard syntax of the object representation script, or the assignment is realized by user customization;
step S103, the variables are configured in each DUT control instruction line, and further a variable parameter general command for controlling the DUT is formed.
(ii) a The test parameters comprise any one or more of channel, bandwidth, rate, mode, antenna, power factor and frequency offset factor.
The wireless chip described in this example includes at least one of a WIFI chip, a bluetooth chip, and a Zigbee chip. In the chip schemes of WIFI, BT and Zigbee, when carrying out production test, all need carry out parameter setting, wherein the package trades: channel, BandWidth, Rate, Mode, Antenna, power factor, and frequency offset factor. In this embodiment, the user configures the layers of the test parameters in the software platform, and uses the standard syntax of Object representation script (JSON) as the writing rule of the unified syntax.
While the present example stipulates the expression of various test parameters in the test items in step S1, it is needless to say that the present example is preferably realized by using a standard syntax of object notation script (JSON), and actually, it can be realized by another script, and it is sufficient to set in advance and associate the stipulated rules and standards with the analysis in step S4. The test parameters are downloaded to a script parsing module (script command parsing module) of the JSON for parameter parsing to parse into control command character strings which can be identified by the DUT, and preferably, a command format is constructed, that is, the command format is unified, and the unified command format can be set by user according to user requirements.
In step S2, the test software is started and initialized, where the initialization refers to initializing the resources of the test software. Step S3, constructing a test task list according to the configured test command; the step of constructing the test task list refers to the step of constructing a task list comprising test items, test parameters, test objects and the like, so that guidance and feedback on subsequent tests are facilitated.
As shown in fig. 2, step S4 in this example includes the following sub-steps:
step S401, starting a test, and issuing test item information in a test task list to a test control module of the equipment to be tested;
step S402, the test control module of the device to be tested applies for test command analysis to the script analysis module;
step S403, the script parsing module parses the test command according to the agreed grammar of the script;
step S404, a control command corresponding to the current device to be tested is obtained, wherein the control command refers to a control test command for controlling the current device to be tested.
In step S403 in this example, the test parameters related to the test item information are downloaded to the script parsing module for parameter parsing, and parsed into control command character strings that can be recognized by the current device under test according to the agreed syntax of the script; after the control command character string is obtained, self-defining construction is carried out on the command format of the control command character string; or, carrying out command analysis construction on the command format through a JSON script analysis module according to a command model of the script; the command model of the script refers to a default command model of an object representation script.
After the test command is read, the test control module (DUT control module) of the device under test issues the command to the Device Under Test (DUT) through the communication connection established with the Device Under Test (DUT), thereby implementing flexible configuration of the control test command of the Device Under Test (DUT).
Step S5 in this example includes the following substeps:
step S501, the test control module of the device to be tested issues the acquired control command to the corresponding device to be tested;
step S502, confirming that the control command is successfully sent;
step S503, setting a test instrument to perform parameter test and signal measurement;
and step S504, analyzing and judging the test result, and finishing the test.
In step S503 of this example, the measurement of the signal includes measurement of a radio frequency signal. The step S504 is to feed back the results of the parameter test and the signal measurement to see whether the preset requirements are met, and automatically end the test after the result is fed back.
The present embodiment also provides a test configuration system of a wireless chip, which adopts the above-mentioned test configuration method of a wireless chip.
In summary, in this embodiment, the test parameters of the wireless chip are configured according to the agreed syntax of the script to obtain the test commands corresponding to the test parameters, that is, the test commands for controlling the test are configured in the form of the script to implement flexible configuration of the test commands, thereby solving the problem that the test control module codes of the device to be tested need to be modified due to command changes of different chip schemes, reducing the development complexity of the test software of the wireless chip, improving the test development efficiency of the wireless chip, and further ensuring the stability of the software test through a platform-based manner of the test configuration system.
The foregoing is a more detailed description of the invention in connection with specific preferred embodiments and it is not intended that the invention be limited to these specific details. For those skilled in the art to which the invention pertains, several simple deductions or substitutions can be made without departing from the spirit of the invention, and all shall be considered as belonging to the protection scope of the invention.
Claims (7)
1. A test configuration method of a wireless chip is characterized by comprising the following steps:
step S1, configuring the test parameters of the wireless chip according to the agreed grammar of the script to obtain the test command corresponding to the test parameters, wherein the test parameters comprise any one or more of channels, bandwidths, rates, modes, antennas, power factors and frequency offset factors;
step S2, starting the test software and realizing initialization;
step S3, constructing a test task list according to the configured test command;
step S4, starting a test, and applying for test command analysis through a script analysis module to obtain a control command;
step S5, issuing control command and implementing test,
in step S1, the method generally defines and configures the test parameters of the wireless chip through the standard syntax of the object representation script, including the following steps:
step S101, determining variables needing to be defined according to the test requirements of a test object;
step S102, after defining the variables, assigning values to the variables according to the actual command of the DUT, wherein the rule of the assignment accords with the standard syntax of the object representation script, or the assignment is realized by user customization;
step S103, configuring the variable into each DUT control instruction line, further forming a variable parameter general command for controlling the DUT,
the step S4 includes the following sub-steps:
step S401, starting a test, and issuing test item information in a test task list to a test control module of the equipment to be tested;
step S402, the test control module of the device to be tested applies for test command analysis to the script analysis module;
step S403, the script parsing module parses the test command according to the agreed grammar of the script;
step S404, acquiring a control command corresponding to the current device to be tested.
2. The method for testing configuration of a wireless chip according to claim 1, wherein in step S403, the test parameters related to the test item information are downloaded to the script parsing module for parameter parsing, and parsed into the control command character string recognizable by the current device under test according to the agreed syntax of the script.
3. The method according to claim 2, wherein a command format of the control command string is customized after the control command string is obtained.
4. The method for testing configuration of a wireless chip according to claim 1, wherein the step S5 includes the following sub-steps:
step S501, the test control module of the device to be tested issues the acquired control command to the corresponding device to be tested;
step S502, confirming that the control command is successfully sent;
step S503, setting a test instrument to perform parameter test and signal measurement;
and step S504, analyzing and judging the test result, and finishing the test.
5. The method for testing configuration of wireless chip according to claim 4, wherein in step S503, the measurement of signal includes measurement of radio frequency signal.
6. The method for testing and configuring the wireless chip according to claim 1, wherein the wireless chip comprises at least one of a WIFI chip, a bluetooth chip, and a Zigbee chip.
7. A test configuration system of a wireless chip, wherein the test configuration method of a wireless chip according to any one of claims 1 to 6 is adopted, and the test configuration system of a wireless chip comprises:
the test command configuration module: the wireless chip testing device is used for configuring the testing parameters of the wireless chip according to the appointed grammar of the script to obtain the testing command corresponding to the testing parameters;
starting an initialization module: the test software is started and initialized;
the test task list building module: the test task list is constructed according to the configured test command;
an analysis module: the script analysis module is used for applying test command analysis to obtain a control command;
a test module: used for issuing control commands and realizing tests.
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| CN111999707A (en) * | 2020-08-19 | 2020-11-27 | 无锡威孚高科技集团股份有限公司 | Automatic testing method, device and system for millimeter wave radar |
| CN112291798B (en) * | 2020-10-15 | 2022-07-15 | 南京奇元科技有限公司 | Factory test pairing method and system for VR equipment |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101557598A (en) * | 2008-04-07 | 2009-10-14 | 中兴通讯股份有限公司 | Device and method for testing wireless baseband chips in base station side |
| CN105004984A (en) * | 2015-06-25 | 2015-10-28 | 深圳市芯海科技有限公司 | Automatic chip testing method |
| CN105827336A (en) * | 2016-04-21 | 2016-08-03 | 深圳市共进电子股份有限公司 | Wireless test system and method |
| CN106443602A (en) * | 2016-08-31 | 2017-02-22 | 贵州航天电子科技有限公司 | Miniaturized wireless control test equipment |
| CN106874174A (en) * | 2015-12-11 | 2017-06-20 | 阿里巴巴集团控股有限公司 | Interface testing and the implementation method and device of functional test |
| CN107229542A (en) * | 2016-03-25 | 2017-10-03 | 中兴通讯股份有限公司 | A kind of method of testing and device |
| CN107517436A (en) * | 2017-08-18 | 2017-12-26 | 深圳市小瑞科技股份有限公司 | A kind of bluetooth equipment test system, device and method |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI453693B (en) * | 2011-12-16 | 2014-09-21 | Universal Scient Ind Shanghai | Method for automatically testing communication functionality of device under test and computer-readable media thereof |
-
2018
- 2018-07-27 CN CN201810843147.5A patent/CN109151860B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101557598A (en) * | 2008-04-07 | 2009-10-14 | 中兴通讯股份有限公司 | Device and method for testing wireless baseband chips in base station side |
| CN105004984A (en) * | 2015-06-25 | 2015-10-28 | 深圳市芯海科技有限公司 | Automatic chip testing method |
| CN106874174A (en) * | 2015-12-11 | 2017-06-20 | 阿里巴巴集团控股有限公司 | Interface testing and the implementation method and device of functional test |
| CN107229542A (en) * | 2016-03-25 | 2017-10-03 | 中兴通讯股份有限公司 | A kind of method of testing and device |
| CN105827336A (en) * | 2016-04-21 | 2016-08-03 | 深圳市共进电子股份有限公司 | Wireless test system and method |
| CN106443602A (en) * | 2016-08-31 | 2017-02-22 | 贵州航天电子科技有限公司 | Miniaturized wireless control test equipment |
| CN107517436A (en) * | 2017-08-18 | 2017-12-26 | 深圳市小瑞科技股份有限公司 | A kind of bluetooth equipment test system, device and method |
Non-Patent Citations (1)
| Title |
|---|
| RNSS射频基带一体化芯片测试方法研究;夏天 等;《计测技术》;20151120;全文 * |
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