CN109151461B - Method for testing angle deviation of focusing optical axis of high-precision tracking camera - Google Patents
Method for testing angle deviation of focusing optical axis of high-precision tracking camera Download PDFInfo
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- CN109151461B CN109151461B CN201811209398.4A CN201811209398A CN109151461B CN 109151461 B CN109151461 B CN 109151461B CN 201811209398 A CN201811209398 A CN 201811209398A CN 109151461 B CN109151461 B CN 109151461B
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Abstract
The invention relates to a test method for high-precision tracking of angle deviation of a focusing optical axis of a camera, wherein the caliber of a reticle of a collimator is smaller than that of a photoelectric autocollimator, the caliber of an optical flat crystal is larger than that of the photoelectric autocollimator, and the optical flat crystal adopts an optical flat crystal with high front and rear parallelism; the method is simple and easy to implement, improves the measurement precision, and can be completed in a laboratory.
Description
Technical Field
The invention relates to the technical field of photoelectric equipment, in particular to a method for testing the angle deviation of a focusing optical axis of a high-precision tracking camera.
Background
The angular deviation of the focusing optical axis of the camera system is a very important index, and particularly, the index is more critical in the camera system for tracking and aiming. The focusing optical axis angle deviation requirement of the high-precision tracking camera is generally within 1 ″, so that the high-precision tracking camera is particularly difficult to test.
Disclosure of Invention
The invention aims to overcome the defects in the prior art, provides a method for testing the angle deviation of the focusing optical axis of the high-precision tracking camera, is simple and feasible, and improves the measurement precision.
The invention is realized by the following technical scheme:
a method for testing the angle deviation of a focusing optical axis of a high-precision tracking camera comprises the following steps:
s1, oppositely placing two photoelectric autocollimators with the measurement accuracy of 0.1' on a stable optical platform to enable the distance between the two autocollimators to be capable of placing a collimator and a measured height precise tracking camera, debugging and coinciding the optical axis of one photoelectric autocollimator with the optical axis of the other photoelectric autocollimator, and debugging and coinciding the geometric axis of one photoelectric autocollimator with the geometric axis of the other photoelectric autocollimator;
s2, placing the collimator into a collimator, wherein the reticle is positioned on the focal plane of the objective lens, the cross center of the reticle is positioned on the optical axis of the objective lens of the collimator by the central offset debugging principle, and the reticle is positioned inside the collimator;
s3, adjusting the integral position and angle of the collimator to make the optical axis of the collimator coincide with the optical axis of the right autocollimator and make the geometric axis of the collimator coincide with the geometric axis of the right autocollimator;
s4, adjusting the pitching deflection angle of the reticle to enable the reticle to be perpendicular to the optical axis of the left autocollimator, and simultaneously ensuring the optical axis of the collimator to coincide with the optical axis of the right autocollimator;
s5, placing the measured height precise tracking camera, focusing to enable the camera to clearly see the reticle image of the collimator, adjusting the position and the angle of the high-precision tracking camera to enable the optical axis of the camera to coincide with the optical axis of the 3 m collimator, and enabling the geometric axis of the camera to coincide with the geometric axis of the 3 m collimator;
s6, putting the optical flat crystal, adjusting the angle of the optical flat crystal to make the optical flat crystal perpendicular to the optical axis of the left photoelectric autocollimator, and simulating a finite distance target by the collimator;
s7, focusing is carried out by the measured height precise tracking camera, so that the camera can clearly see the reticle image, the number of pixels of the optical axis deviation at the moment is read out through a display screen, and the optical axis angle deviation of the optical axis relative to an infinite target at the moment is obtained according to the focal length value of the camera lens;
s8, inserting optical flat crystals with different thicknesses in sequence, repeating the steps S6-S7 aiming at the optical flat crystals with different thicknesses, measuring the optical axis angle deviation with different distances, and finally drawing to obtain the optical axis jitter curve of the high-precision tracking camera.
In a further improvement of the present invention, in step S8, the calculation formula of the optical flat thickness is:
wherein H is the thickness of the optical flat, n is the refractive index of the optical flat material, f is the focal length of the collimator, and L is the simulated distance.
The invention is further improved in that the aperture of the reticle of the collimator is smaller than that of the photoelectric autocollimator.
The invention is further improved in that the aperture of the optical flat is larger than that of the photoelectric autocollimator.
The invention is further improved in that the optical flat crystal adopts an optical flat crystal with high front and back parallelism.
Compared with the prior art, the invention has the beneficial effects that:
the invention provides a method for testing the angle deviation of the focusing optical axis of a high-precision tracking camera, which is simple and easy to implement, improves the measurement precision and can be completed in a laboratory.
Drawings
FIG. 1 is a schematic illustration of the testing principle in one embodiment of the present invention;
FIG. 2 is a schematic diagram illustrating optical flatness parallelism in one embodiment of the present invention;
FIG. 3 is a schematic diagram illustrating the passage of light through an optical flat to a reticle in one embodiment of the present invention;
FIG. 4 is a schematic diagram illustrating the light rays of FIG. 3 after they have been moved across the reticle in one embodiment of the present invention;
the reference numbers are as follows:
1. the device comprises a photoelectric autocollimator 2, a collimator light source 3, a reticle 4, an optical flat crystal 5, a collimator 6, an objective 7 and a high-precision tracking camera.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
As shown in fig. 1, a method for testing an angular deviation of a focusing optical axis of a high-precision tracking camera includes the following steps:
s1, oppositely placing two photoelectric autocollimators with the measurement accuracy of 0.1' on a stable optical platform to enable the distance between the two autocollimators to be capable of placing a collimator and a measured height precise tracking camera, debugging and coinciding the optical axis of one photoelectric autocollimator with the optical axis of the other photoelectric autocollimator, and debugging and coinciding the geometric axis of one photoelectric autocollimator with the geometric axis of the other photoelectric autocollimator;
s2, placing the collimator into a collimator, wherein the reticle is positioned on the focal plane of the objective lens, the cross center of the reticle is positioned on the optical axis of the objective lens of the collimator by the central offset debugging principle, and the reticle is positioned inside the collimator;
s3, adjusting the integral position and angle of the collimator to make the optical axis of the collimator coincide with the optical axis of the right autocollimator and make the geometric axis of the collimator coincide with the geometric axis of the right autocollimator;
s4, adjusting the pitching deflection angle of the reticle to enable the reticle to be perpendicular to the optical axis of the left autocollimator, and simultaneously ensuring the optical axis of the collimator to coincide with the optical axis of the right autocollimator;
s5, placing the measured height precise tracking camera, focusing to enable the camera to clearly see the reticle image of the collimator, adjusting the position and the angle of the high-precision tracking camera to enable the optical axis of the camera to coincide with the optical axis of the 3 m collimator, and enabling the geometric axis of the camera to coincide with the geometric axis of the 3 m collimator;
s6, putting the optical flat crystal, adjusting the angle of the optical flat crystal to make the optical flat crystal perpendicular to the optical axis of the left photoelectric autocollimator, and simulating a finite distance target by the collimator;
s7, focusing is carried out by the measured height precise tracking camera, so that the camera can clearly see the reticle image, the number of pixels of the optical axis deviation at the moment is read out through a display screen, and the optical axis angle deviation of the optical axis relative to an infinite target at the moment is obtained according to the focal length value of the camera lens;
s8, inserting optical flat crystals with different thicknesses in sequence, repeating the steps S6-S7 aiming at the optical flat crystals with different thicknesses, measuring the optical axis angle deviation with different distances, and finally drawing to obtain the optical axis jitter curve of the high-precision tracking camera.
In the technical scheme, the light source of the collimator is the reference number 2 in the figure, the optical flat 4 of 0.1 'photoelectric autocollimator 1, 3' and the 3-meter collimator 5 are selected, the higher the parallelism of the front and back surfaces of the optical flat 4 is, the better the parallelism is, and the material and the thickness of the optical flat are calculated according to the simulation distance target. The more optical flats 4 of different thicknesses, the more accurate the resulting curve.
In specific implementation, in step S8, the calculation formula of the thickness of the optical flat crystal 4 is as follows:
wherein H is the thickness of the optical flat crystal 4, n is the refractive index of the optical flat crystal 4 material, f is the focal length of the collimator, and L is the simulated distance.
In specific implementation, the aperture of the reticle 3 of the collimator 5 is smaller than the aperture of the photoelectric autocollimator 1.
In specific implementation, the aperture of the optical flat crystal 4 is larger than that of the photoelectric autocollimator 1.
In specific implementation, the optical flat 4 adopts an optical flat with high front and back parallelism.
More specifically, on the basis of the above implementation, the optical flat thickness is calculated as:
the most common K9 glass is selected as the material, the refractive index is n 1.51637, and when simulating 500m, the moving amount (Gauss formula) of the reticle of a 3 m collimator is
Δ＝f2/L ①
f is the focal length of the collimator tube of 3000mm, L is the simulated distance of 500m, and delta is the movement of the reticle to the objective lens (adding the flat crystal is equivalent to the movement of the reticle to the objective lens);
the thickness of the flat crystal is H, the corresponding air thickness is H/n, and the generated movement amount is
Δ＝H-H/n ②
Combined with ①② to obtain
The thickness of the optical flat 4 is 52.86mm when simulating 500m, and the rest is analogized.
As a preferred embodiment of the present invention, as shown in fig. 2 to 4, the front and back surfaces of the optical flat 4 may not be absolutely parallel, and generally have a wedge angle θ. The distance from the optical flat crystal 4 to the surface of the reticle is d, the thickness of the optical flat crystal 4 is H, and the angle deviation generated when the light passes through the optical flat crystal 4 is
＝θ(n-1)，
The radial displacement of the light on the reticle plane is
a＝d＝dθ(n-1)，
Then the corresponding optical axis angle deviation gamma (i.e. focusing optical axis stability of the simulation target) on the 3 m collimator is
γ＝a/f＝dθ(n-1)/f，
When in test, the closer the optical flat crystal 4 and the reticle 3 are, the better, and d is 5 mm. The wedge angle of flat crystal processing is easier to be less than 4 ", and the selected value is theta 4 ″, n ═ 1.51637, and f ═ 3000mm, and gamma ═ 0.003 ″.
Namely, the target focusing optical axis angle deviation simulated by the test method reaches 0.003 ' and the precision with the test requirement less than 1 ' is achieved, and the method is far superior to the current commonly used internal focusing collimator target simulation test method (the simulated optical axis angle deviation is more than 3 ').
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.
Claims (5)
1. A method for testing the angle deviation of a focusing optical axis of a high-precision tracking camera is characterized by comprising the following steps:
s1, oppositely placing two photoelectric autocollimators with the measurement accuracy of 0.1' on a stable optical platform to enable the distance between the two autocollimators to be capable of placing a collimator and a measured height precise tracking camera, debugging and coinciding the optical axis of one photoelectric autocollimator with the optical axis of the other photoelectric autocollimator, and debugging and coinciding the geometric axis of one photoelectric autocollimator with the geometric axis of the other photoelectric autocollimator;
s2, placing the collimator into a collimator, wherein the reticle is positioned on the focal plane of the objective lens, the cross center of the reticle is positioned on the optical axis of the objective lens of the collimator by the central offset debugging principle, and the reticle is positioned inside the collimator;
s3, adjusting the integral position and angle of the collimator to make the optical axis of the collimator coincide with the optical axis of the right autocollimator and make the geometric axis of the collimator coincide with the geometric axis of the right autocollimator;
s4, adjusting the pitching deflection angle of the reticle to enable the reticle to be perpendicular to the optical axis of the left autocollimator, and simultaneously ensuring the optical axis of the collimator to coincide with the optical axis of the right autocollimator;
s5, placing the measured height precise tracking camera, focusing to enable the camera to clearly see the reticle image of the collimator, adjusting the position and the angle of the high-precision tracking camera to enable the optical axis of the camera to coincide with the optical axis of the 3 m collimator, and enabling the geometric axis of the camera to coincide with the geometric axis of the 3 m collimator;
s6, putting the optical flat crystal, adjusting the angle of the optical flat crystal to make the optical flat crystal perpendicular to the optical axis of the left photoelectric autocollimator, and simulating a finite distance target by the collimator;
s7, focusing is carried out by the measured height precise tracking camera, so that the camera can clearly see the reticle image, the number of pixels of the optical axis deviation at the moment is read out through a display screen, and the optical axis angle deviation of the optical axis relative to an infinite target at the moment is obtained according to the focal length value of the camera lens;
s8, inserting optical flat crystals with different thicknesses in sequence, repeating the steps S6-S7 aiming at the optical flat crystals with different thicknesses, measuring the optical axis angle deviation with different distances, and finally drawing to obtain the optical axis jitter curve of the high-precision tracking camera.
2. The method for testing the angular deviation of the focusing optical axis of a high-precision tracking camera according to claim 1, wherein in step S8, the calculation formula of the optical flat thickness is as follows:
wherein H is the thickness of the optical flat, n is the refractive index of the optical flat material, f is the focal length of the collimator, and L is the simulated distance.
3. The method for testing the angular deviation of the focusing optical axis of the high-precision tracking camera according to claim 1, characterized in that: the aperture of the reticle of the collimator is smaller than that of the photoelectric autocollimator.
4. The method for testing the angular deviation of the focusing optical axis of the high-precision tracking camera according to claim 1, characterized in that: the aperture of the optical flat crystal is larger than that of the photoelectric autocollimator.
5. The method for testing the angular deviation of the focusing optical axis of the high-precision tracking camera according to claim 1, characterized in that: the optical flat crystal adopts the optical flat crystal with high front and back parallelism.
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