CN109141646A - The scaling method and caliberating device of infrared temperature measurement system - Google Patents
The scaling method and caliberating device of infrared temperature measurement system Download PDFInfo
- Publication number
- CN109141646A CN109141646A CN201810847873.4A CN201810847873A CN109141646A CN 109141646 A CN109141646 A CN 109141646A CN 201810847873 A CN201810847873 A CN 201810847873A CN 109141646 A CN109141646 A CN 109141646A
- Authority
- CN
- China
- Prior art keywords
- temperature
- measurement system
- target
- temperature measurement
- infrared
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000009529 body temperature measurement Methods 0.000 title claims abstract description 129
- 238000000034 method Methods 0.000 title claims abstract description 44
- 239000012634 fragment Substances 0.000 claims abstract description 53
- 238000013480 data collection Methods 0.000 claims abstract description 22
- 239000012141 concentrate Substances 0.000 claims abstract description 9
- 238000010438 heat treatment Methods 0.000 claims description 28
- 238000005259 measurement Methods 0.000 claims description 28
- 238000001816 cooling Methods 0.000 claims description 24
- 238000004590 computer program Methods 0.000 claims description 12
- 239000003245 coal Substances 0.000 claims description 8
- 239000004575 stone Substances 0.000 claims description 8
- 238000003860 storage Methods 0.000 claims description 7
- 238000004364 calculation method Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 12
- 230000008859 change Effects 0.000 description 7
- 238000012545 processing Methods 0.000 description 5
- 238000010276 construction Methods 0.000 description 4
- 238000012937 correction Methods 0.000 description 4
- 239000011159 matrix material Substances 0.000 description 4
- 230000005855 radiation Effects 0.000 description 4
- 230000006870 function Effects 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 230000001419 dependent effect Effects 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 230000001788 irregular Effects 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000005057 refrigeration Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010891 electric arc Methods 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012067 mathematical method Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000012634 optical imaging Methods 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 230000008685 targeting Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 230000005619 thermoelectricity Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/80—Calibration
Abstract
The invention discloses a kind of scaling method of infrared temperature measurement system and caliberating devices, this method comprises: obtaining fitting data collection, fitting data collection includes the output voltage of target actual temperature and infrared temperature measurement system, it is fitted using the data that method of gradual regression concentrates fitting data, determine the matched curve model of relationship between reflection target actual temperature and the output voltage of infrared temperature measurement system, the matched curve model is the curve model of Taylor series polynomial form, wherein, infrared temperature measurement system is arranged in target normal direction.The present invention is fitted using output voltage of the method for gradual regression to target actual temperature and infrared temperature measurement system that fitting data is concentrated, it can reduce error of fitting caused by infrared temperature measurement system is fitted because of nominal data, the stated accuracy of infrared temperature measurement system is improved, realizes the high-acruracy survey to non-fragment orbit plate temperature.
Description
Technical field
The present invention relates to railway construction technical field more particularly to the scaling methods and caliberating device of infrared temperature measurement system.
Background technique
This part intends to provides background or context for the embodiment of the present invention stated in claims.Description herein
Recognize it is the prior art not because not being included in this section.
The stability of railway track structure directly affects railway security, and fragment-free track slab is as main railroad track knot
Structure will cause non-uniform temperature point because of the influence of the environmental factors such as atmospheric temperature, solar radiation, precipitation in external environment
Cloth generates biggish temperature stress, to cause the deformation of fragment-free track slab structure, seriously endangers the operational safety of train.Cause
This, needs to be measured the temperature change of fragment-free track slab, to guarantee train operating safety.It can be with based on infrared measurement of temperature principle
Realize the measurement contactless to fragment-free track slab, and before being measured using infrared temperature measurement system to fragment-free track slab,
Need to demarcate infrared temperature measurement system that (so-called calibration refers to and detects to the accuracy (precision) for using instrument, to sentence
It is disconnected whether to comply with standard), to realize the accurate measurement to fragment-free track slab temperature change.The calibration of infrared temperature measurement system is accurate
Measure the prerequisite of non-fragment orbit plate temperature.
Currently, when being demarcated using target to infrared temperature measurement system, generally using linear model, parabola model or
Person's exponential model carries out data fitting to the output voltage of target temperature and infrared temperature measurement system, obtains the defeated of infrared temperature measurement system
Relationship between voltage and target temperature out.But it is quasi- to carry out data using linear model, parabola model or exponential model
It closes, can not indicate the relationship between target temperature and the output voltage of infrared temperature measurement system well, there are biggish data
Thus error of fitting causes the infrared temperature measurement system temperature measurement accuracy of calibration lower, cannot achieve the height to non-fragment orbit plate temperature
Precision measure.
Therefore, the scaling method of existing infrared temperature measurement system exists and can not achieve because of data error of fitting to non-fragment orbit
The problem of plate temperature high-acruracy survey.
Summary of the invention
The embodiment of the present invention provides a kind of scaling method of infrared temperature measurement system, to solve existing infrared temperature measurement system
Existing the problem of can not achieve because of nominal data error of fitting to non-fragment orbit plate temperature high-acruracy survey, this method packet
It includes:
Fitting data collection is obtained, fitting data collection includes the output voltage of target actual temperature and infrared temperature measurement system;
Be fitted using the data that method of gradual regression concentrates fitting data, determine reflection target actual temperature with it is infrared
The matched curve model of relationship between the output voltage of temp measuring system, the matched curve model are Taylor series polynomial form
Curve model;
Wherein, infrared temperature measurement system is arranged in target normal direction.
The embodiment of the present invention also provides a kind of caliberating device of infrared temperature measurement system, to solve existing infrared measurement of temperature system
The problem of can not achieve because of nominal data error of fitting to non-fragment orbit plate temperature high-acruracy survey existing for system, the device packet
It includes:
Data acquisition module, for obtaining fitting data collection, fitting data collection includes target actual temperature and infrared measurement of temperature
The output voltage of system;
Data fitting module is fitted using the data that method of gradual regression concentrates fitting data, determines reflection target
The matched curve model of relationship between actual temperature and the output voltage of infrared temperature measurement system, the matched curve model are Taylor
The curve model of series polynomial form;
Wherein, infrared temperature measurement system is arranged in target normal direction.
In the embodiment of the present invention, fitting data collection is obtained, fitting data collection includes target actual temperature and infrared measurement of temperature system
The output voltage of system is fitted using the data that method of gradual regression concentrates fitting data, determines reflection target actual temperature
The matched curve model of relationship between the output voltage of infrared temperature measurement system, the matched curve model are that Taylor series are multinomial
The curve model of formula form.The embodiment of the present invention, the target actual temperature that fitting data is concentrated using method of gradual regression and red
The output voltage of outer temp measuring system is fitted, and be can reduce infrared temperature measurement system calibration and is missed because being fitted caused by data fitting
Difference improves the stated accuracy of infrared temperature measurement system, realizes the high-acruracy survey to non-fragment orbit plate temperature.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of invention for those of ordinary skill in the art without creative efforts, can be with
It obtains other drawings based on these drawings.In the accompanying drawings:
Fig. 1 is the flow chart of the scaling method of infrared temperature measurement system provided in an embodiment of the present invention;
Fig. 2 is the structural schematic diagram of target provided in an embodiment of the present invention;
Fig. 3 is the structural schematic diagram of temperature control device 2 in target provided in an embodiment of the present invention;
Fig. 4 is another structural schematic diagram of temperature control device 2 in target provided in an embodiment of the present invention;
Fig. 5 a is the schematic diagram provided in an embodiment of the present invention demarcated using target to infrared temperature measurement system;
Fig. 5 b is the schematic diagram provided in an embodiment of the present invention demarcated using target to infrared temperature measurement system;
Fig. 6 is the structural schematic diagram of target provided in an embodiment of the present invention;
Fig. 7 is the modular structure of the caliberating device of infrared temperature measurement system provided in an embodiment of the present invention.
Specific embodiment
Understand in order to make the object, technical scheme and advantages of the embodiment of the invention clearer, with reference to the accompanying drawing to this hair
Bright embodiment is described in further details.Here, the illustrative embodiments of the present invention and their descriptions are used to explain the present invention, but simultaneously
It is not as a limitation of the invention.
Fig. 1 shows the scaling method of infrared temperature measurement system provided in an embodiment of the present invention, for ease of description, only shows
Part related to the embodiment of the present invention, details are as follows:
As shown in Figure 1, the scaling method of infrared temperature measurement system, comprising:
Step 101, fitting data collection is obtained, fitting data collection includes the output of target actual temperature and infrared temperature measurement system
Voltage.
In embodiments of the present invention, when being demarcated using target to infrared temperature measurement system, the infrared measurement of temperature
System is arranged in the normal direction of target, and target just facing towards the infrared temperature measurement system.Infrared temperature measurement system is basic
Principle is: the object that all temperature are higher than absolute zero is all ceaselessly issuing infrared energy to surrounding space, object
Infrared energy size presses its Wavelength distribution, has very close relationship, infrared temperature measurement system inspection with its surface temperature
It surveys the infrared energy of object, and establishes corresponding relationship in infrared energy and body surface temperature, and then by object
Infrared energy reflected by optical imaging objective on the light-sensitive element of infrared detector, to obtain red with object
The corresponding voltage value of external radiation energy (i.e. the output voltage of infrared temperature measurement system).
When obtaining fitting data, it is first determined target actual temperature, infrared temperature measurement system under the target actual temperature,
The infrared energy of the target is detected, and then obtains voltage value corresponding with the infrared energy of target,
The voltage value is the output voltage of infrared temperature measurement system corresponding with the target actual temperature.The fitting data collection includes
The output voltage of multiple target actual temperatures and corresponding infrared temperature measurement system.
Step 102, it is fitted using the data that method of gradual regression concentrates fitting data, determines the practical temperature of reflection target
The matched curve model of relationship between degree and the output voltage of infrared temperature measurement system, the matched curve model are that Taylor series are more
The curve model of item formula form.
In embodiments of the present invention, the fitting data got is fitted using method of gradual regression, is determined to anti-
The matched curve model for answering relationship between target actual temperature and the output voltage of infrared temperature measurement system, that is, complete to infrared survey
The calibration of warm system.
It is the introducing by variable one by one that gradually law of return, which carries out the mathematical method of data fitting, introduces the condition of variable
Be variable sum of squares of partial regression (regression sum of square is the sum of square of deviations for reflecting degree of correlation between independent variable and dependent variable,
If the part of regression sum of square reduction is known as the independent variable to the inclined of dependent variable after multivariate regression models cancels an independent variable
Regression sum of square) through examine be significant;If the sum of squares of partial regression of variable through examine be it is inapparent, by non-limiting change
Amount is rejected, and guarantees that the sum of squares of partial regression of each variable in matched curve model is significant.
In embodiments of the present invention, it is fitted using fitting data of the method for gradual regression to acquisition, can reduce data
Error of fitting improves the stated accuracy of infrared temperature measurement system, and then infrared temperature measurement system realizes the height to non-fragment orbit plate temperature
Precision measure.
In a further embodiment, the acquisition fitting data collection includes:
The set temperature for determining target is target actual temperature;
The output voltage of the infrared temperature measurement system under the set temperature is obtained using the infrared temperature measurement system;
It repeats the above steps, obtains the output voltage of multiple groups target actual temperature and corresponding infrared temperature measurement system.
In embodiments of the present invention, when obtaining fitting data, the target temperature of setting is considered as target actual temperature.It is red
Outer temp measuring system detects the infrared energy of target under the target actual temperature, and then obtains the infrared energy with target
Measure the output voltage that corresponding voltage value is infrared temperature measurement system.
For example, the temperature of target is set first as -40 °, after control target actual temperature is basically stable at -40 °,
It is V1 using the output voltage that infrared temperature measurement system obtains the infrared temperature measurement system at -40 °;Then it repeats the above steps, if
Targeting target temperature is respectively -30 °, -20 °, -10 °, 0 °, 10 °, 20 °, 30 °, 40 °, and controlling, target actual temperature is substantially steady
After being scheduled on -30 °, -20 °, -10 °, 0 °, 10 °, 20 °, 30 °, 40 °, using infrared temperature measurement system obtain -30 °, -20 °, -10 °,
The output voltage of infrared temperature measurement system at 0 °, 10 °, 20 °, 30 °, 40 ° is V2, V3, V4, V5, V6, V7, V8, V9.So far, i.e.,
The output voltage of multiple groups target actual temperature and corresponding infrared temperature measurement system can be obtained.What is certain is that acquisition
Fitting data is more, and the fitting effect of data is better.
In a further embodiment, in order to further increase the stated accuracy of infrared temperature measurement system, the infrared measurement of temperature
The scaling method of system further include:
The measurement temperature of fragment-free track slab is obtained using calibrated infrared temperature measurement system;
The stated accuracy of the infrared temperature measurement system is verified according to the actual temperature of fragment-free track slab and measurement temperature.
In the present embodiment, using standard couple, (standard couple refers to the resistance value based on metallic conductor with temperature
Increase and increase the temperature detector of principle, precision is higher, physics, chemically good, good in oxidation resistance under high temperature, thermoelectricity
The stability and repdocutbility of kinetic potential are fine) detection fragment-free track slab temperature, and by standard couple detect without tiny fragments of stone, coal, etc. rail
The temperature of guidance tape is determined as the actual temperature of fragment-free track slab.In addition, calibrated infrared temperature measurement system is to fragment-free track slab
When measuring, the infrared energy of fragment-free track slab is detected, and then according to the infra-red radiation with fragment-free track slab
The corresponding voltage value of energy, and the matched curve mould based on relationship between reflection temperature and the output voltage of infrared temperature measurement system
Type obtains the measurement temperature of fragment-free track slab, therefore, when calibrated infrared temperature measurement system measures fragment-free track slab,
What is obtained is the measurement temperature of fragment-free track slab.It in turn, can be according to the reality for the fragment-free track slab that standard couple detects
The measurement temperature that temperature and calibrated infrared temperature measurement system measurement fragment-free track slab obtain, to the calibration essence of infrared temperature measurement system
Degree is verified.
When the stated accuracy to infrared temperature measurement system is verified, the measurement temperature of multiple groups fragment-free track slab can be used
The temperature measurement accuracy of infrared temperature measurement system is indicated with the maximum value of the absolute difference of actual temperature, it was determined that above-mentioned
The maximum value of absolute difference is smaller, and the temperature measurement accuracy of infrared temperature measurement system is higher.For example, it is assumed that standard couple inspection
The actual temperature of the fragment-free track slab measured is respectively 25 °, 35 °, 45 °, the nothing obtained using calibrated infrared temperature measurement system
It is respectively 25.08 °, 35.02 °, 44.9 ° that the measurement temperature of tiny fragments of stone, coal, etc. track plates is corresponding, then absolute difference be respectively 0.08 °,
0.02 °, 0.1 °, the maximum value of absolute difference are 0.1 ° of temperature measurement accuracy that can be used to indicate infrared temperature measurement system, i.e., this is infrared
The temperature measurement accuracy of temp measuring system is 0.1 °.The calibrated error of infrared temperature measurement system is smaller, then the temperature measurement accuracy of infrared temperature measurement system
It is higher.
Applicant pass through further investigation revealed that, during being demarcated using target to infrared temperature measurement system,
Generally use black matrix target (object that absorptivity is zero for one, reflectivity and transmitance is generally known as ideal black-body) to infrared
Temp measuring system is demarcated.In view of emissivity (the radiation out-degree of fragment-free track slab and the synthermal lower black matrix spoke of fragment-free track slab
The ratio of injection degree, the referred to as emissivity of fragment-free track slab) it can change with the variation of non-fragment orbit plate temperature, and it is existing
Black matrix target cannot effectively, accurately reflect the emissivity of fragment-free track slab, using black matrix target to infrared temperature measurement system into
When rower is determined, needs to be modified based on emissivity of the emissivity empirical value to non-fragment orbit plate, therefore, usually generate
Emittance correction error, and then cause the stated accuracy of infrared temperature measurement system lower, it can not achieve to the high-precision of fragment-free track slab
Degree measurement.Therefore, a kind of target is further proposed, the target is when demarcating infrared temperature measurement system, without carrying out nothing
The emittance correction of tiny fragments of stone, coal, etc. track plates can not achieve caused by can solve infrared temperature measurement system because of emittance correction error to nothing
The problem of high-acruracy survey of tiny fragments of stone, coal, etc. track plate temperature.
Fig. 2 shows the structural representations of target provided in an embodiment of the present invention, for ease of description, illustrate only and this hair
The relevant part of bright embodiment, details are as follows:
As shown in Fig. 2, target comprising:
Non-fragment orbit plate 1, temperature control device 2, film thermocouple 3, control panel 4 and PID controller 5.
The non-fragment orbit plate 1 is bonded to each other fixation with the temperature control device 2, and the film thermocouple 3 is arranged in institute
It states in the narrow layer of non-fragment orbit plate 1, the PID controller 5 is arranged in the control panel 4, the temperature control device 2, institute
It states control panel 4 and the film thermocouple 3 is all connected with the PID controller 5, the temperature control device 2 connects the control plane
Plate 4.
Control panel 4 is used to adjust target temperature, the temperature according to the temperature adjustment instructions control temperature control device 2 received
Device 2 is controlled for the control and regulation target temperature according to the control panel 4, the film thermocouple 3 is for detecting target temperature
Degree, and target temperature is fed back to PID controller 5, PID controller 5 is used to control the deviation of target temperature and set temperature pre-
If in deviation.
In the present embodiment, non-fragment orbit plate 1 wherein with temperature control device 2 wherein while be bonded to each other it is solid
Fixed, the another side of non-fragment orbit plate 1 and the another side of temperature control device 2 are being respectively formed 1 target of non-fragment orbit plate just
Face and the back side.The predetermined deviation is preset deviation, for example, it can be set to the predetermined deviation is 0.5 °.Alternatively, institute
Controller 5 is stated for controlling the deviation ratio of target temperature and set temperature in predetermined deviation ratio.The predetermined deviation ratio
Example is preset deviation ratio, for example, it can be set to the predetermined deviation ratio is 2% or 5% etc..The control plane
Plate includes controller, such as embedded computer or single-chip microcontroller or microprocessor etc..
In embodiments of the present invention, the non-fragment orbit plate 1 further includes a narrow layer, is arranged for detecting target temperature
Film thermocouple 3.In other examples, for convenience of the film thermocouple 3 of replacement damage, the target includes two layers of fitting
Adjacent non-fragment orbit plate 1 is provided with a narrow layer between two layers of non-fragment orbit plate 1, for film thermocouple to be arranged
3, two layers of non-fragment orbit plate 1 can be connected by flange arrangement, and can free-open-close.Certainly, in other embodiments
In, film thermocouple 3 can also be arranged in the surface of the positive non-fragment orbit plate 1 of target.Furthermore it is also possible to by film heat
Galvanic couple 3 is fixed at the inside of non-fragment orbit plate 1.
In embodiments of the present invention, target includes non-fragment orbit plate 1, temperature control device 2, film thermocouple 3, PID control
Device 5 and control panel 4, non-fragment orbit plate 1 and temperature control device 2 are bonded to each other fixation, and film thermocouple 3 is arranged in no tiny fragments of stone, coal, etc. rail
In the narrow layer of road plate 1, temperature control device 2, control panel 4 and film thermocouple 3 are all connected with PID controller 5, and temperature control device 2 connects
Connect control panel 4.Target includes non-fragment orbit plate, and fragment-free track slab is mainly made of non-fragment orbit plate, therefore, this hair
Target in bright embodiment can emissivity that is effective, accurately reflecting fragment-free track slab.
In a further embodiment, the plate face shape of the non-fragment orbit plate 1 includes rectangular or round or just polygon
Shape;And/or the plate face shape of the temperature control device 2 includes rectangular or round or regular polygon.Certainly, those skilled in the art
It is understood that the plate face shape of the non-fragment orbit plate 1 or the plate face shape of the temperature control device 2, can also be
Except above-mentioned rectangular, in addition to round and regular polygon other shapes, such as Pentagram shape and irregular polygon etc.,
The embodiment of the present invention is not construed as limiting this, and relevant change case should all fall into protection scope of the present invention.
In a further embodiment, the target further includes the outer of inner hollow, the package target side and the back side
Shell.
In a further embodiment, in order to improve the temperature uniformity of target, the temperature control device 2 including at least one plus
Backing and/or N × M cooling piece, the N × M cooling piece are arranged in N × M groove of an at least heating sheet,
In, N and M are positive integer.
In addition, the temperature control device 2 includes a heating sheet and a cooling piece, described in the case where the N and M are 1
One cooling piece is arranged in a groove of one heating sheet, and the shape of cooling piece is consistent with the shape of groove, with
The setting for alloing the cooling piece to be suitable for is in the groove.In addition, the shape and above-mentioned temperature control of heating sheet or cooling piece
As device 2, direction, circle, regular polygon and pentalpha and irregular polygon etc. can be set to.
In a further embodiment, in order to improve the temperature uniformity of the target, the temperature control device 2 includes one
Heating sheet and N × M cooling piece, the N × M cooling piece are arranged in N × M groove of one heating sheet.In N and
In the case that M is 4, the temperature control device 2 includes a heating sheet and 16 cooling pieces, and 16 cooling pieces are arranged in institute
It states in 16 grooves of a heating sheet.
Fig. 3 shows the schematic construction of temperature control device 2 in target provided in an embodiment of the present invention, for ease of description, only
Part related to the embodiment of the present invention is shown, details are as follows:
In embodiments of the present invention, as shown in figure 3, N and M are 3, the temperature control device 2 includes a heating sheet 201
With 9 cooling pieces 202,9 cooling pieces 202 are arranged in 9 grooves of one heating sheet 201.
In addition, in other examples, the temperature control device 2 includes N × M heating sheet and/or at least one refrigeration
Piece, the N × M heating sheet are arranged in N × M groove of at least one cooling piece.For example, it is in N and M
In the case where 3, the temperature control device 2 includes 9 heating sheets and a cooling piece, and 9 heating sheets are arranged one
In 9 grooves of cooling piece.
Certainly, it will be appreciated by persons skilled in the art that the temperature control device 2 further include other quantity heating sheet and
The cooling piece of other quantity, the embodiment of the present invention are not construed as limiting this, and relevant change case should all fall into protection model of the invention
It encloses.
Fig. 4 shows the schematic construction of temperature control device 2 in target provided in an embodiment of the present invention, for ease of description, only
Part related to the embodiment of the present invention is shown, details are as follows:
In the present embodiment, temperature control device 2 includes several heating sheets and several cooling pieces, the heating sheet and the refrigeration
The setting of piece interleaved.For example, as shown in figure 3, the temperature control device 2 includes 8 heating sheet 301 and 8 cooling pieces
302,8 heating sheets 301 and 8 cooling pieces, 302 interleaved are arranged.
In a further embodiment, heating sheet is Resistance Heating Film or electric arc heated piece or electron beam heating sheet or infrared
Line heating sheet.
In a further embodiment, the heating sheet includes crawler type heating sheet, and the cooling piece includes semiconductor system
Cold.
In a further embodiment, the film thermocouple 3 is patch type platinum resistance.
Fig. 5 a shows the signal provided in an embodiment of the present invention demarcated using target to infrared temperature measurement system, in order to
Convenient for explanation, only parts related to embodiments of the present invention are shown, and details are as follows:
In the present embodiment, as shown in Figure 5 a, infrared temperature measurement system is demarcated using non-fragment orbit plate target
When, infrared temperature measurement system is in the normal direction of the target, for detecting the infrared energy of target, infrared temperature measurement system
Meet the following conditions with the non-fragment orbit plate 1 in fragment-free track slab target:
Wherein, a is the diameter of the round non-fragment orbit plate 1 in fragment-free track slab target, and d is infrared temperature measurement system to nothing
The distance of tiny fragments of stone, coal, etc. track plate 1, α are the field angle of infrared temperature measurement system.
Figure 5b shows that another signal provided in an embodiment of the present invention demarcated using target to infrared temperature measurement system,
For ease of description, only parts related to embodiments of the present invention are shown, and details are as follows:
In the present embodiment, as shown in Figure 5 b, infrared temperature measurement system is demarcated using non-fragment orbit plate target
When, infrared temperature measurement system is in the normal direction of the target, for detecting the infrared energy of target, infrared temperature measurement system
Meet the following conditions with the non-fragment orbit plate 1 in fragment-free track slab target:
Wherein, a is the diameter of the rectangular non-fragment orbit plate 1 in fragment-free track slab target, and d is infrared temperature measurement system to nothing
The distance of tiny fragments of stone, coal, etc. track plate 1, α are the field angle of infrared temperature measurement system.
Fig. 6 shows another schematic construction of target provided in an embodiment of the present invention, for ease of description, illustrate only with
The relevant part of the embodiment of the present invention, details are as follows:
As shown in fig. 6, in embodiments of the present invention, the target further include:
Display module 6 is connect with film thermocouple 3, the target temperature detected for real-time display film thermocouple 3.
In other examples, the display module 6 includes the first display screen and second display screen, and first display screen is for showing
Show the set temperature of target, the second display screen is used for the target temperature that real-time display film thermocouple 3 detects.
Alarm module 7 is connect with film thermocouple 3, is more than preset temperature uniformity for the temperature uniformity in target
Alarm, wherein the temperature uniformity of target includes multiple target temperature that the multiple film thermocouples 3 of synchronization detect
Variance.
In embodiments of the present invention, the preset temperature uniformity is predetermined temperature uniformity, for example, in target
Temperature uniformity when being the variance of multiple target temperature for detecting of the multiple film thermocouples 3 of synchronization, the default temperature
Spending uniformity is default variance yields.The alarm module 7 includes a buzzer, is used for when alarm module 7 is alarmed according to default
Frequency sounding, the predeterminated frequency is preset audible frequency, such as can be redefined for 2 times/second, certainly, ability
Field technique personnel can also carry out other settings according to the actual situation, not do special limitation herein.
In a further embodiment, as shown in fig. 6, the target further includes the mobile mechanism 8 that target bottom is arranged in.
In a further embodiment, the mobile mechanism 8 includes idler wheel.Certainly, those skilled in the art can be with root
Other mobile mechanisms are set as according to actual conditions, relevant change case should all be fallen within the scope of the invention, this hair
Bright embodiment does not do special limitation to this.
In a further embodiment, the non-fragment orbit plate 1 with a thickness of 1~2 millimeter.
In embodiments of the present invention, can be by the switch on control panel 4 and by the temperature of key assignments target, and pass through
The first display screen in display module 6 shows that film thermocouple 3 detects the target temperature of the target, and passes through display module 6
In second display screen show, the target temperature feedback that the film thermocouple 3 will test to PID controller 5.In target
When target temperature is lower than the temperature set, PID controller 5 controls the heating sheet work in temperature control device 2, in the target temperature of target
When degree is higher than the temperature of setting, PID controller 5 controls the cooling piece work in temperature control device 2, so that target temperature and setting temperature
The deviation of degree finally makes the target temperature of target level off to set temperature as far as possible in predetermined deviation.
When being demarcated using target described in any of the above-described embodiment to infrared temperature measurement system, without carrying out emissivity
Amendment, will not generate emittance correction error, use the calibrated infrared temperature measurement system of target in above-described embodiment, Ke Yishi
Now to the high-acruracy survey of non-fragment orbit plate temperature.
A kind of caliberating device of infrared temperature measurement system is additionally provided in the embodiment of the present invention, as described in the following examples.
Since the principle that these devices solve the problems, such as is similar to the scaling method of infrared temperature measurement system, the implementation of these devices can be with
Referring to the implementation of method, overlaps will not be repeated.
Fig. 7 shows the structural representation of the caliberating device of infrared temperature measurement system provided in an embodiment of the present invention, for the ease of
Illustrate, only parts related to embodiments of the present invention are shown, and details are as follows:
With reference to Fig. 7, for executing, Fig. 1 is corresponding to be implemented the modules that the caliberating device of the infrared temperature measurement system is included
Each step in example, referring specifically to the associated description in Fig. 1 and Fig. 1 corresponding embodiment, details are not described herein again.The present invention
In embodiment, the caliberating device of the infrared temperature measurement system includes data acquisition module 701 and data fitting module 702.
The data acquisition module 701, for obtaining fitting data collection, fitting data collection includes target actual temperature and red
The output voltage of outer temp measuring system.
The data fitting module 702, is fitted using the data that method of gradual regression concentrates fitting data, is determined anti-
Reflect the matched curve model of relationship between target actual temperature and the output voltage of infrared temperature measurement system, the matched curve model
For the curve model of Taylor series polynomial form.
Wherein, infrared temperature measurement system is arranged in target normal direction.
In embodiments of the present invention, data acquisition module 701 obtain fitting data collection, data fitting module 702 using by
The step Return Law is fitted the fitting data of acquisition, can reduce data error of fitting, improves the calibration of infrared temperature measurement system
Precision, and then infrared temperature measurement system realizes the high-acruracy survey to non-fragment orbit plate temperature.
In a further embodiment, the data acquisition module includes determination unit and acquiring unit.
The determination unit, for determining that the set temperature of target is target actual temperature.
The acquiring unit, for obtaining the infrared measurement of temperature system under the set temperature using the infrared temperature measurement system
The output voltage of system.
In a further embodiment, in order to further increase the stated accuracy of infrared temperature measurement system, the infrared measurement of temperature
The caliberating device of system further includes that measurement obtains module and authentication module.
The measurement obtains module, for obtaining the measurement temperature of fragment-free track slab using calibrated infrared temperature measurement system
Degree.
The authentication module, for verifying the infrared measurement of temperature system according to the actual temperature and measurement temperature of fragment-free track slab
The stated accuracy of system.
The embodiment of the present invention also provides a kind of computer equipment, including memory, processor and storage are on a memory simultaneously
The computer program that can be run on a processor, the processor realize above-mentioned infrared measurement of temperature system when executing the computer program
The scaling method of system.
The embodiment of the present invention also provides a kind of computer readable storage medium, and the computer-readable recording medium storage has
Execute the computer program of the scaling method of above-mentioned infrared temperature measurement system.
In conclusion the embodiment of the present invention, fitting data collection is obtained, fitting data collection includes target actual temperature and infrared
The output voltage of temp measuring system is fitted using the data that method of gradual regression concentrates fitting data, determines that reflection target is real
The matched curve model of relationship between border temperature and the output voltage of infrared temperature measurement system, the matched curve model are Taylor's grade
The curve model of number polynomial form.The embodiment of the present invention, the practical temperature of target that fitting data is concentrated using method of gradual regression
The output voltage of degree and infrared temperature measurement system is fitted, and can reduce infrared temperature measurement system because intending caused by nominal data fitting
Error is closed, the stated accuracy of infrared temperature measurement system is improved, realizes the high-acruracy survey to non-fragment orbit plate temperature.
It should be understood by those skilled in the art that, the embodiment of the present invention can provide as method, system or computer program
Product.Therefore, complete hardware embodiment, complete software embodiment or reality combining software and hardware aspects can be used in the present invention
Apply the form of example.Moreover, it wherein includes the computer of computer usable program code that the present invention, which can be used in one or more,
The computer program implemented in usable storage medium (including but not limited to magnetic disk storage, CD-ROM, optical memory etc.) produces
The form of product.
The present invention be referring to according to the method for the embodiment of the present invention, the process of equipment (system) and computer program product
Figure and/or block diagram describe.It should be understood that every one stream in flowchart and/or the block diagram can be realized by computer program instructions
The combination of process and/or box in journey and/or box and flowchart and/or the block diagram.It can provide these computer programs
Instruct the processor of general purpose computer, special purpose computer, Embedded Processor or other programmable data processing devices to produce
A raw machine, so that being generated by the instruction that computer or the processor of other programmable data processing devices execute for real
The device for the function of being specified in present one or more flows of the flowchart and/or one or more blocks of the block diagram.
These computer program instructions, which may also be stored in, is able to guide computer or other programmable data processing devices with spy
Determine in the computer-readable memory that mode works, so that it includes referring to that instruction stored in the computer readable memory, which generates,
Enable the manufacture of device, the command device realize in one box of one or more flows of the flowchart and/or block diagram or
The function of being specified in multiple boxes.
These computer program instructions also can be loaded onto a computer or other programmable data processing device, so that counting
Series of operation steps are executed on calculation machine or other programmable devices to generate computer implemented processing, thus in computer or
The instruction executed on other programmable devices is provided for realizing in one or more flows of the flowchart and/or block diagram one
The step of function of being specified in a box or multiple boxes.
Particular embodiments described above has carried out further in detail the purpose of the present invention, technical scheme and beneficial effects
Describe in detail it is bright, it should be understood that the above is only a specific embodiment of the present invention, the guarantor being not intended to limit the present invention
Range is protected, all within the spirits and principles of the present invention, any modification, equivalent substitution, improvement and etc. done should be included in this
Within the protection scope of invention.
Claims (10)
1. a kind of scaling method of infrared temperature measurement system characterized by comprising
Fitting data collection is obtained, fitting data collection includes the output voltage of target actual temperature and infrared temperature measurement system;
It is fitted using the data that method of gradual regression concentrates fitting data, determines reflection target actual temperature and infrared measurement of temperature
The matched curve model of relationship between the output voltage of system, the matched curve model are the song of Taylor series polynomial form
Line model;
Wherein, infrared temperature measurement system is arranged in target normal direction.
2. the method as described in claim 1, which is characterized in that the acquisition fitting data collection includes:
The set temperature for determining target is target actual temperature;
The output voltage of the infrared temperature measurement system under the set temperature is obtained using infrared temperature measurement system;
It repeats the above steps, obtains the output voltage of multiple groups target actual temperature and corresponding infrared temperature measurement system.
3. the method as described in claim 1, which is characterized in that further include:
The measurement temperature of fragment-free track slab is obtained using calibrated infrared temperature measurement system;
The stated accuracy of the infrared temperature measurement system is verified according to the actual temperature of fragment-free track slab and measurement temperature.
4. method as described in any one of claims 1 to 3, which is characterized in that the target includes:
Non-fragment orbit plate, temperature control device, film thermocouple, control panel and PID controller;
The non-fragment orbit plate and the temperature control device are bonded to each other fixation, and the film thermocouple is arranged in the no tiny fragments of stone, coal, etc. rail
In the narrow layer of road plate, the PID controller is arranged in control panel, the temperature control device, the control panel and described
Film thermocouple is all connected with the PID controller;
The temperature control device connects the control panel;Control panel is used for according to the temperature adjustment instructions control temperature control received
Device adjusts target temperature, and the temperature control device is used for the control and regulation target temperature according to the control panel, the film
Thermocouple feeds back target temperature to PID controller for detecting target temperature, PID controller for control target temperature with
The deviation of set temperature is in predetermined deviation.
5. method as claimed in claim 4, which is characterized in that the temperature control device includes at least a heating sheet and/or N × M
A cooling piece, the N × M cooling piece are arranged in N × M groove of an at least heating sheet, wherein N and M are positive
Integer.
6. method as claimed in claim 4, which is characterized in that the plate face shape of the non-fragment orbit plate includes rectangular or circle
Shape or regular polygon;And/or
The plate face shape of the temperature control device includes rectangular or round or regular polygon.
7. method as claimed in claim 4, which is characterized in that infrared when being demarcated using target to infrared temperature measurement system
Temp measuring system and non-fragment orbit plate meet the following conditions:
Wherein, a is the side length of rectangular non-fragment orbit plate or the diameter of round non-fragment orbit plate, and d is infrared temperature measurement system
To the distance of non-fragment orbit plate, α is the field angle of infrared temperature measurement system.
8. a kind of caliberating device of infrared temperature measurement system characterized by comprising
Data acquisition module, for obtaining fitting data collection, fitting data collection includes target actual temperature and infrared temperature measurement system
Output voltage;
Data fitting module is fitted using the data that method of gradual regression concentrates fitting data, determines that reflection target is practical
The matched curve model of relationship between temperature and the output voltage of infrared temperature measurement system, the matched curve model are Taylor series
The curve model of polynomial form;
Wherein, infrared temperature measurement system is arranged in target normal direction.
9. a kind of computer equipment including memory, processor and stores the meter that can be run on a memory and on a processor
Calculation machine program, which is characterized in that the processor realizes any side of claim 1 to 7 when executing the computer program
Method.
10. a kind of computer readable storage medium, which is characterized in that the computer-readable recording medium storage has perform claim
It is required that the computer program of 1 to 7 any the method.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810847873.4A CN109141646B (en) | 2018-07-27 | 2018-07-27 | The scaling method and caliberating device of infrared temperature measurement system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810847873.4A CN109141646B (en) | 2018-07-27 | 2018-07-27 | The scaling method and caliberating device of infrared temperature measurement system |
Publications (2)
Publication Number | Publication Date |
---|---|
CN109141646A true CN109141646A (en) | 2019-01-04 |
CN109141646B CN109141646B (en) | 2019-08-16 |
Family
ID=64798177
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201810847873.4A Active CN109141646B (en) | 2018-07-27 | 2018-07-27 | The scaling method and caliberating device of infrared temperature measurement system |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN109141646B (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108709644A (en) * | 2018-07-27 | 2018-10-26 | 中国铁道科学研究院集团有限公司 | The scaling method of fragment-free track slab target and infrared temperature measurement system |
CN110646099A (en) * | 2019-09-20 | 2020-01-03 | 中国飞行试验研究院 | Method and device for inverting target infrared radiation image based on measured data |
CN111256835A (en) * | 2020-03-13 | 2020-06-09 | 西北工业大学 | Temperature measurement thermal infrared imager calibration method and device of hyper-parameter polynomial physical model |
CN111814313A (en) * | 2020-06-15 | 2020-10-23 | 航天东方红卫星有限公司 | Method for designing regression orbit in high-precision gravitational field |
CN112304436A (en) * | 2020-10-23 | 2021-02-02 | 北京百度网讯科技有限公司 | Method, apparatus, electronic device, and medium for creating temperature correction model |
CN113447131A (en) * | 2020-03-25 | 2021-09-28 | 山东大学 | Infrared thermal imaging field temperature measurement calibration device and method |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101183032A (en) * | 2007-12-14 | 2008-05-21 | 北京航空航天大学 | Temperature simple calibrating method suitable for reflection-type polarization-preserving fiber temperature sensor |
US20140314118A1 (en) * | 2013-04-19 | 2014-10-23 | Joseph D. LaVeigne | Blackbody function |
-
2018
- 2018-07-27 CN CN201810847873.4A patent/CN109141646B/en active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101183032A (en) * | 2007-12-14 | 2008-05-21 | 北京航空航天大学 | Temperature simple calibrating method suitable for reflection-type polarization-preserving fiber temperature sensor |
US20140314118A1 (en) * | 2013-04-19 | 2014-10-23 | Joseph D. LaVeigne | Blackbody function |
Non-Patent Citations (3)
Title |
---|
崔建峰 等: ""高超声速飞行器曲线拟合建模方法"", 《飞行力学》 * |
贾雅竹 等: ""自制温度传感器的标定与研究"", 《张家口职业技术学院学报》 * |
韩志刚 等: ""CRTSⅡ型板式轨道轨道板温度测量与变形分析"", 《铁道标准设计》 * |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108709644A (en) * | 2018-07-27 | 2018-10-26 | 中国铁道科学研究院集团有限公司 | The scaling method of fragment-free track slab target and infrared temperature measurement system |
CN110646099A (en) * | 2019-09-20 | 2020-01-03 | 中国飞行试验研究院 | Method and device for inverting target infrared radiation image based on measured data |
CN111256835A (en) * | 2020-03-13 | 2020-06-09 | 西北工业大学 | Temperature measurement thermal infrared imager calibration method and device of hyper-parameter polynomial physical model |
CN111256835B (en) * | 2020-03-13 | 2022-07-19 | 西北工业大学 | Temperature measurement thermal infrared imager calibration method and device of hyper-parameter polynomial physical model |
CN113447131A (en) * | 2020-03-25 | 2021-09-28 | 山东大学 | Infrared thermal imaging field temperature measurement calibration device and method |
CN111814313A (en) * | 2020-06-15 | 2020-10-23 | 航天东方红卫星有限公司 | Method for designing regression orbit in high-precision gravitational field |
CN111814313B (en) * | 2020-06-15 | 2024-03-26 | 航天东方红卫星有限公司 | Regression orbit design method in high-precision gravitational field |
CN112304436A (en) * | 2020-10-23 | 2021-02-02 | 北京百度网讯科技有限公司 | Method, apparatus, electronic device, and medium for creating temperature correction model |
Also Published As
Publication number | Publication date |
---|---|
CN109141646B (en) | 2019-08-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN109141646B (en) | The scaling method and caliberating device of infrared temperature measurement system | |
CN108709644A (en) | The scaling method of fragment-free track slab target and infrared temperature measurement system | |
US8353626B2 (en) | Emissivity independent non-contact high temperature measurement system and method | |
CN103512728B (en) | Total-range multi-optical-axis consistency calibration device and method | |
CN101806957B (en) | Wave-front sensor and corrector aligning device in self-adaptive optical system | |
US5621525A (en) | Apparatus and method for measuring the power density of a laser beam with a liquid crystal | |
CN101910782B (en) | Method of and apparatus for detecting change in shape of a moving substrate | |
CN102257352B (en) | 3d scanner | |
JP2018025560A (en) | Thermal diffusivity measuring apparatus | |
CN208488176U (en) | Fragment-free track slab target | |
CN105223229A (en) | A kind of infrared wave transparent window radiation measurement of transmission characterist platform | |
CN106441593A (en) | Temperature detecting head, temperature detection equipment and temperature detection method | |
Pfänder et al. | Pyrometric temperature measurements on solar thermal high temperature receivers | |
CN103411914A (en) | Temperature-controlled grazing incidence reflection infrared spectroscopy device | |
CN106546560B (en) | The measurement method of optical material refractive index under a kind of low temperature | |
Ndlovu et al. | Analysis of the fluctuations of a laser beam due to thermal turbulence | |
CN106918576A (en) | A kind of non-contact type thin film temperature refraction rate measurement apparatus and method | |
JPH0663848B2 (en) | How to measure the surface temperature of an object | |
Denisenko et al. | Measurement of the morphological forms of polarization singularities and their statistical weights in optical vector fields | |
JPH01113102A (en) | Method for edging thick steel plate | |
CN205246582U (en) | Material polarised direction emissivity measurement device | |
Vitkovskii et al. | Measurement of spectral directional emissivity of materials and coatings in the infrared region of spectrum | |
CN106091862A (en) | A kind of glass size utilizing glass-reflected characteristic and location measurement method | |
JPS6184528A (en) | Temperature measuring instrument | |
McMahon | Quantitative Nonlinear Optical Sum‐Frequency Experiments using Incoherent Light |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |