CN109060831B - 一种基于底板拟合的自动脏污检测方法 - Google Patents
一种基于底板拟合的自动脏污检测方法 Download PDFInfo
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
- G01N2021/945—Liquid or solid deposits of macroscopic size on surfaces, e.g. drops, films, or clustered contaminants
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CN109060831B true CN109060831B (zh) | 2021-01-15 |
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CN113989666B (zh) * | 2021-10-26 | 2023-01-31 | 中科海拓(无锡)科技有限公司 | 一种高铁受电弓异常检测方法 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
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CN103245676A (zh) * | 2013-03-23 | 2013-08-14 | 明基材料有限公司 | 光学镜片脏污检测方法 |
CN104093016A (zh) * | 2014-06-12 | 2014-10-08 | 华南理工大学 | 一种摄像头模组脏污检测方法及系统 |
CN104135660A (zh) * | 2014-08-14 | 2014-11-05 | 广东光阵光电科技有限公司 | 一种摄像模组脏污检测方法及检测系统 |
CN106226270A (zh) * | 2016-07-01 | 2016-12-14 | 深圳市顶点视觉自动化技术有限公司 | 检测图像传感器表面脏污缺陷的方法 |
CN106959076A (zh) * | 2017-02-20 | 2017-07-18 | 广州视源电子科技股份有限公司 | 基于摄像头的人像距离检测方法及系统 |
CN108320275A (zh) * | 2018-02-07 | 2018-07-24 | 深圳市恒晨电器有限公司 | 一种检测相机模组暗斑的方法 |
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- 2018-08-09 CN CN201810903743.8A patent/CN109060831B/zh active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103245676A (zh) * | 2013-03-23 | 2013-08-14 | 明基材料有限公司 | 光学镜片脏污检测方法 |
CN104093016A (zh) * | 2014-06-12 | 2014-10-08 | 华南理工大学 | 一种摄像头模组脏污检测方法及系统 |
CN104135660A (zh) * | 2014-08-14 | 2014-11-05 | 广东光阵光电科技有限公司 | 一种摄像模组脏污检测方法及检测系统 |
CN106226270A (zh) * | 2016-07-01 | 2016-12-14 | 深圳市顶点视觉自动化技术有限公司 | 检测图像传感器表面脏污缺陷的方法 |
CN106959076A (zh) * | 2017-02-20 | 2017-07-18 | 广州视源电子科技股份有限公司 | 基于摄像头的人像距离检测方法及系统 |
CN108320275A (zh) * | 2018-02-07 | 2018-07-24 | 深圳市恒晨电器有限公司 | 一种检测相机模组暗斑的方法 |
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