CN109031064B - High-voltage binary test method for wire tester - Google Patents
High-voltage binary test method for wire tester Download PDFInfo
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- CN109031064B CN109031064B CN201810815965.4A CN201810815965A CN109031064B CN 109031064 B CN109031064 B CN 109031064B CN 201810815965 A CN201810815965 A CN 201810815965A CN 109031064 B CN109031064 B CN 109031064B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
- G01R31/1272—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of cable, line or wire insulation, e.g. using partial discharge measurements
Abstract
The invention relates to a high-voltage bisection test method for a wire tester, which comprises the following steps: the method comprises the following steps that a system scans pins of a wire, wherein the pins which are short-circuited together are regarded as 1 pin, the pins which are mutually open-circuited are numbered as 1, 2, 3, n, and n is assumed to be the power of m power of 2; dividing n into two parts: 1-n/2 is connected with the high end to be tested, and n/2+ 1-n is connected with the low end to be tested until the second point is not two points; listing a pin position setting list of each test according to the binary method, and carrying out high-voltage test; in the testing process, the high-pressure parameter of the wire rod is judged to be unqualified only by one time of unqualified testing, and the high-pressure parameter of the wire rod can be judged to be qualified only when the testing results of all the steps are qualified. The high-voltage bisection test method for the wire tester can greatly reduce the test times of high-voltage parameters, thereby greatly improving the test efficiency, testing accurately and reliably and ensuring the quality of products.
Description
The technical field is as follows:
the invention relates to the technical field of electronic testing, in particular to a high-voltage binary testing method for a wire tester.
Background art:
in the electronic age today, the development of wires is faster and more, and the variety is more and more. The number of the feet of the wire is quite large, for example, 46 feet are formed by adding two ends of a Typec wire. The wire foot position is too much, must influence the complexity of wire test. The high-voltage parameter of the wire rod usually consumes the longest time, and if the pin positions are more, the testing efficiency is lower.
If there is a wire with 8 pins, it is necessary to test the high voltage parameters. Judging whether the high-voltage parameter of one wire is qualified, and then requiring that: the high voltage parameters between any two legs of the wire are acceptable. Then the theoretical number of tests can be derived from the formula of permutation and combination as: n (n-1)/2 is 28, so 28 times of tests are needed to complete the test of the whole high-voltage parameter of the wire.
The invention content is as follows:
the invention aims to provide a high-voltage binary test method for a wire tester, which can be used for rapidly detecting whether a high-voltage parameter between any two pins of a wire is qualified or not, aiming at the defects of the prior art.
The invention is realized by the following technical scheme: a high-voltage bisection test method for a wire tester comprises the following steps:
1) the method comprises the following steps that a system scans pins of a wire, wherein the pins which are short-circuited together are regarded as 1 pin, the pins which are mutually open-circuited are numbered as 1, 2, 3, n, and n is assumed to be the power of m power of 2; if n is not the m power of 2, then the value is taken according to the list;
2) dividing n into two parts: 1-n/2 is connected with the high end to be tested, n/2+ 1-n is connected with the low end to be tested, and the two divisions are continued: 1-n/4 is connected with the high end to be tested, n/4+ 1-n/2 is connected with the low end to be tested, n/2+ 1-3 n/4 is connected with the high end to be tested, 3n/4+ 1-n is connected with the low end to be tested, and the rest is done until the second division is not two;
3) listing a pin position setting list of each test according to the binary method, and carrying out high-voltage test;
4) in the testing process, the testing is immediately stopped as long as one unqualified wire rod is produced, the high-pressure parameter of the wire rod is judged to be unqualified, and the high-pressure parameter of the wire rod can be judged to be qualified only when the testing results of all the steps are qualified;
5) and when the test result is unqualified, the system displays the unqualified pin number.
Preferably, in the step 2), the pin positions of the wire rod are divided into two parts one by one, a pin position setting list of each test is listed, and the high-voltage test is carried out.
In addition, in the step 2), the system can also adopt random numbers, randomly divide two pins of the wire into two parts, list pin setting lists for each test, and perform high-voltage test, so long as each random pin is ensured not to be repeated, and all pin tests are completed.
The high-voltage parameters of the invention comprise alternating current withstand voltage, direct current withstand voltage and insulation resistance.
The invention has the beneficial effects that: the high-voltage bisection test method for the wire tester can greatly reduce the test times of high-voltage parameters, thereby greatly improving the test efficiency, being accurate and reliable in test and ensuring the quality of products.
Description of the drawings:
FIG. 1 is a pin position setting list of the high voltage binary test method for the wire tester of the present invention;
FIG. 2 is a pin setting list according to a preferred embodiment of the present invention;
FIG. 3 is a schematic diagram of a binary process of the present invention;
FIG. 4 is a comparison of the test method of the present invention with that of the prior art;
FIG. 5 shows the value of the pin number n according to the present invention.
The specific implementation mode is as follows:
the following detailed description of the preferred embodiments of the present invention, taken in conjunction with the accompanying drawings, will make the advantages and features of the invention more readily understood by those skilled in the art, and thus will more clearly and distinctly define the scope of the invention.
A high-voltage bisection test method for a wire tester comprises the following steps:
firstly, scanning pins of a wire, wherein the pins which are short-circuited together are regarded as 1 pin, and the pins which are mutually open-circuited are numbered in sequence as follows: 1. 2, 3, · · n, assuming that n is a power of 2 to the m-th power, and if n is not a power of 2 to the m-th power, the values are taken according to the table of fig. 5.
Then by the binary test method of the present invention:
step 1: dividing n into two parts: 1-n/2 is connected with the high end of the test; n/2+ 1-n is connected with the testing low end;
step 2: and (4) continuously dividing into two parts: 1-n/4 is connected with the high end of the test; n/4+ 1-n/2 is connected with the low end to be tested, and n/2+ 1-3 n/4 is connected with the high end to be tested; 3n/4+ 1-n is connected with the testing low end;
until the number is two to two, namely the mth step: + - + -. C.C..
The pin-setting list for each test is listed according to the above dichotomy method, as shown in fig. 1, +: represents the test high end, -: the representation is connected to the low end of the test.
Then, according to the sequence listed in fig. 1, the pin positions of the wires are divided into two parts one by one, and high-voltage test is carried out;
at the same time, we can also not follow the order in fig. 1, and out-of-order is also possible, as long as all tests listed in fig. 1 are completed.
In the testing process, as long as one unqualified wire rod occurs, the testing is immediately stopped, and the high-pressure parameter of the wire rod is judged to be unqualified; and judging that the high-pressure parameter of the wire rod is qualified only if the test results of all the steps are qualified.
However, when the test result is fail, the binary test method cannot find out which pin fails.
The following description takes a wire with 8 pins as an example:
because the relationship between the pins in the wire has short circuit and open circuit, several pins with short circuit should be regarded as 1 pin, i.e. the pins have equal potential in the whole process of testing and are treated as one pin.
In the case of the wire having 8 pins, the relationship between the pins is all open circuit.
The high-voltage parameters comprise 3 test items of alternating-current voltage resistance, direct-current voltage resistance and insulation resistance.
Step 1: dividing 8 pins into two parts, connecting pins 1, 2, 3 and 4 with high end to be tested, connecting pins 5, 6, 7 and 8 with low end to be tested,
test pass represents: the high voltage parameters between any one of the pins 1, 2, 3, 4 and any one of the pins 5, 6, 7, 8 are all qualified.
That is, through the test of step 1, 1 wire with 8 pins is divided into 2 wires with 4 pins which are independent from each other, and the wires are respectively named as the wire 14 and the wire 58, if the 2 wires are insulated and qualified, the high voltage parameter of the whole wire is qualified.
Step 2: firstly testing whether the wire 14 is qualified, dividing the wire 14 into 2 parts for testing by the same method, wherein the pin positions 1 and 2 are connected with the high end of the test, and the pin positions 3 and 4 are connected with the low end of the test;
the same wire 58 is processed in the same way, and is divided into two pins 5, 6 connected to the high end of the test and two pins 7, 8 connected to the low end of the test.
If the test is qualified, the insulation between the pins 1 and 2 and the pins 3 and 4 is qualified, and the insulation between the pins 5 and 6 and the pins 7 and 8 is qualified.
In other words, 2 4-pin wires were continuously divided into 4 independent 2-pin wires by the 2 nd test.
And 3, step 3: the wire rods with 2 pins are divided into two again, and then one wire rod is just connected with the high end of the test, and the other wire rod is connected with the low end of the test. That is, pin 1 is connected to the high end, and pin 2 is connected to the low end; the pin 3 is connected with the high end, and the pin 4 is connected with the low end; the pin position 5 is connected with the high end, and the pin position 6 is connected with the low end; pin 7 is connected to the high end, and pin 8 is connected to the low end.
The process described above, organized as a table, as shown in fig. 2, +: representation is connected with the high end of the test: the representation is connected to the low end of the test.
We plot the above binary process as shown in fig. 3:
1. the test of step 1, the complete 8pin wire (number 1) is divided into two 2 independent parts:
2.1 ( feet 1, 2, 3, 4)
2.2 ( pins 5, 6, 7, 8).
We can see that the whole wire 1 is qualified as long as the high pressure parameters of 2.1 and 2.2 are qualified.
2. The 2.1 and 2.2 continued to be divided into two 4 independent parts by the 2 nd test:
3.1 (foot 1, 2)
3.2 (foot 3, 4)
3.3 (foot positions 5, 6)
3.4 (pins 7, 8).
We can see that 2.1 is qualified as long as the high pressure parameters of 3.1 and 3.2 are qualified; as long as the high pressure parameters of 3.3 and 3.4 are acceptable, then 2.2 is acceptable.
3. After step 3, we continue to divide by two, dividing 3.1, 3.2, 3.3, 3.4 into 8 independent parts:
i.e. single pin 1, 2, 3, 4, 5, 6, 7, 8.
We can derive:
the high-voltage parameter between the pin 1 and the pin 2 is qualified, and then 3.1 is qualified;
the high-voltage parameter between the pin 3 and the pin 4 is qualified, and then 3.2 is qualified;
the high-voltage parameter between the pin 5 and the pin 6 is qualified, and then 3.3 is qualified;
the high-voltage parameter between the pin 7 and the pin 8 is qualified, and then 3.4 is qualified;
therefore, when the test result of each step is qualified, the high-pressure parameter of the wire rod is qualified, namely, the following conditions are met: the high voltage parameters between any two legs of the wire are acceptable.
However, if there is a single failure, the wire rod is determined to be failed.
To summarize: after 28 times of tests according to theoretical requirements, a binary test method is usedAfter the method, only 3 times are needed, and the testing efficiency is greatly improved. As the number of pins increases, the algorithm has more superiority, and as shown in FIG. 4, the invention can reduce the test times to
Then, the test requirement of high pressure parameters can be met.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention.
Claims (4)
1. A high-voltage bisection test method for a wire tester is characterized by comprising the following steps:
1) the pin positions of the wire rod are scanned by the system, wherein the pin positions which are short-circuited together are regarded as 1 pin position, and the pin positions which are mutually disconnected are numbered as 1, 2, 3, · · n in sequence;
2) dividing n into two parts: 1-n/2 is connected with the high end to be tested, n/2+ 1-n is connected with the low end to be tested, and the two divisions are continued: 1-n/4 is connected with the high end to be tested, n/4+ 1-n/2 is connected with the low end to be tested, n/2+ 1-3 n/4 is connected with the high end to be tested, 3n/4+ 1-n is connected with the low end to be tested, and the rest is done until the second division is not two;
3) listing a pin position setting list of each test according to the binary method, and carrying out high-voltage test;
4) in the testing process, the testing is immediately stopped as long as one unqualified wire rod is produced, the high-pressure parameter of the wire rod is judged to be unqualified, and the high-pressure parameter of the wire rod can be judged to be qualified only when the testing results of all the steps are qualified;
5) and when the test result is unqualified, the system displays the unqualified pin number.
2. The high-voltage bisection test method for the wire tester as claimed in claim 1, wherein in the step 2), the pin positions of the wire are bisected one by one, and a pin position setting list for each test is listed for performing the high-voltage test.
3. The high-voltage bisection test method for the wire tester as claimed in claim 1, wherein in the step 2), all the pins of the wire are randomly bisected, and a pin setting list for each test is listed to perform the high-voltage test.
4. The high voltage binary test method for the wire tester according to claim 1, wherein the high voltage parameters include an alternating current withstand voltage, a direct current withstand voltage and an insulation resistance.
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| CN102565616B (en) * | 2012-01-31 | 2014-07-02 | 常州市同惠电子有限公司 | Circuit on-off rapid testing method on basis of bisection method |
| CN103675565B (en) * | 2014-01-09 | 2016-09-14 | 武汉大学 | Ultra-high/extra-high voltage transmission line of alternation current power frequency parameters measuring method |
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