CN108982932A - Concealed printed circuit board test fixture - Google Patents
Concealed printed circuit board test fixture Download PDFInfo
- Publication number
- CN108982932A CN108982932A CN201810891429.2A CN201810891429A CN108982932A CN 108982932 A CN108982932 A CN 108982932A CN 201810891429 A CN201810891429 A CN 201810891429A CN 108982932 A CN108982932 A CN 108982932A
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- CN
- China
- Prior art keywords
- dials
- probe
- support
- circuit board
- printed circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
Present invention discloses a kind of concealed printed circuit board test fixtures, including probe, dials and support；The dials is located above the support, is provided with elastomeric element between the dials and the support；The probe is vertically arranged in the dials and can be along the dials vertical direction activity, the first end of the probe protrudes from the dials bottom and supports with the upper surface of the support and contacts, and the end face of the second end of the probe is lower than or the concordant dials upper surface；When exerting a force vertically downwards to the dials, the elastomeric element stress moves downward and then the dials is driven to move downward, and the probe is made to protrude from the upper surface of the dials.Drive dials up and down using the elastomeric element of setting on the support; and then control bulge quantity of the probe with respect to dials upper surface; effectively probe is hidden in dials when not testing; it plays a protective role; in test; probe accurately contacts the test point of printed circuit board, improves accurate testing degree.
Description
Technical field
The present invention relates to electronic product testing field, specially a kind of concealed printed circuit board test fixture.
Background technique
With the continuous development of large-scale production, electronic component various in style and integrated circuit obtain very big volume production,
Printed circuit board test fixture to online device electric performance test by directly finding the defect and component of manufacturing process
It is bad.For the quality for ensuring product, printed wiring board testing requirement is careful, and traditional test fixture is limited due to fineness
System, can not effectively be tested.
Traditional printed circuit board detection jig is tested using the exposed mode of probe, can not play the effect of protection probe.
Summary of the invention
The main object of the present invention is to provide a kind of concealed printed circuit board test fixture.
The present invention proposes a kind of concealed printed circuit board test fixture, including probe, dials and support；
The dials is located above the support, is provided with elastomeric element between the dials and the support；
The probe is vertically arranged in the dials and can be movable along the dials vertical direction, and the first of the probe
End protrudes from the dials bottom and supports with the upper surface of the support and contacts, the end face of the second end of the probe be lower than or
The concordant dials upper surface of person；
When exerting a force vertically downwards to the dials, the elastomeric element stress is moveed downward described in drive in turn
Dials moves downward, and the probe is made to protrude from the upper surface of the dials.
Further, the elastomeric element includes multiple, and the elastomeric element is uniformly distributed on the support.
Further, the elastomeric element includes one of leaf spring, bourdon tube or helical spring.
It further, further include guide post, the guide post is perpendicularly fixed at the upper surface of support；
The dials is provided with the pilot hole for just corresponding to the guide post, and the pilot hole pierces into the guide post and can edge
The pilot hole axis direction back and forth movement.
Further, the support is equipped with multiple guide posts, and the guide post is uniformly distributed on the support.
Further, the probe includes concentric setting and first, second be fixedly connected sequentially and third
Portion；
Described first is resisted against the upper surface of support far from second end face；
Second outer surface is coated with insulating film.
Further, the dials includes the first plate layer and the second plate layer, and the first plate layer is fixedly installed on described the
Two plate layers are backwards to the side of the support；
The first plate layer is equipped with the first through hole for being adapted to the probe, and the second plate layer, which is equipped with, is adapted to the probe
Second through-hole, and second through-hole is just corresponding to the first through hole；
The first through hole aperture is greater than the outer diameter in the third portion, and is less than and is coated with described the second of the insulating film
Portion's outer diameter.
Further, it is equipped with identical as number of probes in the support and is corresponding in turn to the electric connection probe base
Copper wire.
It further, further include connecting line and electric logging equipment, the copper wire passes through the company far from one end of the probe
Wiring is electrically connected the electric logging equipment.
Further, the support includes upper bracket, support column and undersetting, and described support column one end is fixedly connected described
Undersetting, the other end are fixedly connected with the upper bracket.
Concealed printed circuit board test fixture of the invention has the beneficial effect that, utilizes the elastomeric element of setting on the support
It drives dials up and down, and then controls bulge quantity of the probe with respect to dials upper surface, it is effectively that probe is hidden when not testing
It ensconces in dials, plays a protective role, in test, probe accurately contacts the test point of printed circuit board, improves test essence
Accuracy.
Detailed description of the invention
Fig. 1 is the concealed printed circuit board test fixture schematic diagram of one embodiment of the invention；
Fig. 2 is the concealed printed circuit board test fixture probe schematic diagram of one embodiment of the invention.
The embodiments will be further described with reference to the accompanying drawings for the realization, the function and the advantages of the object of the present invention.
Specific embodiment
It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, it is not intended to limit the present invention.
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiment is only a part of the embodiments of the present invention, instead of all the embodiments.Base
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts it is all its
His embodiment, shall fall within the protection scope of the present invention.
It is to be appreciated that the directional instruction (such as up, down, left, right, before and after ...) of institute is only used in the embodiment of the present invention
In explaining in relative positional relationship, the motion conditions etc. under a certain particular pose (as shown in the picture) between each component, if should
When particular pose changes, then directionality instruction also correspondingly changes correspondingly, and the connection, which can be, to be directly connected to,
It can be and be indirectly connected with.
In addition, the description for being such as related to " first ", " second " in the present invention is used for description purposes only, and should not be understood as
Its relative importance of indication or suggestion or the quantity for implicitly indicating indicated technical characteristic.Define as a result, " first ",
The feature of " second " can explicitly or implicitly include at least one of the features.In addition, the technical side between each embodiment
Case can be combined with each other, but must be based on can be realized by those of ordinary skill in the art, when the combination of technical solution
Conflicting or cannot achieve when occur will be understood that the combination of this technical solution is not present, also not the present invention claims guarantor
Within the scope of shield.
As shown in Figs. 1-2, a kind of concealed printed circuit board test fixture of one embodiment of the present invention is proposed, including
Probe 1, dials 3 and support 4；Dials 3 is located at 4 top of support, and elastomeric element 8 is provided between dials 3 and support 4；Probe 1 is perpendicular
Directly be set in dials 3, and can be up and down along 3 vertical direction of dials, the first end of probe 1 protrude from 3 bottom of dials and with
Contact is supported in the upper surface of support 4, and the end face of the second end of probe 1 is lower than or concordant 3 upper surface of dials；When to 3 edge of dials
When vertical direction exerts a force downwards, 8 stress of elastomeric element moves downward and then dials 3 is driven to move downward, and probe 1 is made to protrude from needle
The upper surface of disk 3.
In the present embodiment, before concealed printed circuit board test fixture test, probe 1 is set in dials 3, and probe
1 first end is resisted against the upper surface of support far from the end face of second end, and the end face of second end flushes in the upper surface of dials 3, bullet
Property component 8 be set on support, and elastomeric element 8 far from support one end connect 3 lower surface of dials, formed between dials 3 and support
The elastic space that elastomeric element 8 is supported, not by external force, dials 3, elastomeric element 8 and support are remain stationary,
1 second end of probe is hidden in dials 3, and 1 first end of probe is resisted against on support and is located in elastic space.Work as printed circuit board
When test, by concealed printed circuit board test fixture loaded on external equipment, external equipment is in combination with concealed printed circuit
Plate test fixture applies an external force, which is the power that detection device applies automatically, and circuit board under test is placed in and the circuit
Compatible 3 upper surface of dials of plate, external equipment apply an external force on dials 3, external force direction along probe 1 it is axial vertically to
Under, dials 3 is supported elastomeric element 8 and is moved straight down, and the probe 1 in dials 3 remains stationary, and 1 second end of probe is relative to needle
The protrusion of disk 3, the end face of 1 second end of probe is contacted with circuit board under test at this time, is applied to the big of power on dials 3 by suitably adjusting
The small and time can control the projection amount of probe 1, and realization is precisely controlled needle trace of the probe 1 on circuit board under test, when dials 3
When lower surface is resisted against upper surface of support, probe 1 is best relative to the projection amount of dials 3.
In another embodiment, 1 second end of probe is lower than the upper surface of dials 3, probe 1 first far from the end face of first end
End is resisted against on support and is located in elastic space, when printed circuit board test, by concealed printed circuit board test fixture
Loaded on external equipment, external equipment applies an external force in combination with concealed printed circuit board test fixture, which is inspection
The power that measurement equipment applies automatically, circuit board under test are placed in 3 upper surface of dials compatible with the circuit board 1, and external equipment is applied
Add an external force on dials 3, external force direction straight down along 1 axial direction of probe, support elastomeric element 8 and move straight down by dials 3,
Probe 1 in dials 3 remains stationary, 1 second end of probe relative to the protrusion of dials 3, at this time the end face of 1 second end of probe with it is to be measured
Circuit board contacts are applied to the size of power and time on dials 3 by suitably adjusting, can control the projection amount of probe 1, realize
Be precisely controlled needle trace of the probe 1 on circuit board under test, when 3 lower surface of dials is resisted against upper surface of support, probe 1 relative to
The projection amount of dials 3 is best.
In the present embodiment, elastomeric element 8 includes multiple, and elastomeric element 8 is uniformly distributed on support.Elastomeric element
8 include one of leaf spring, bourdon tube or helical spring.Elastomeric element 8 is bourdon tube in the present embodiment, and fixed on support
Equipped with four bourdon tubes, four bourdon tubes are uniformly arranged on the upper surface of support, and the setting of 3 uniform and stable of dials can be made to prop up
The top of seat, bourdon tube are connected to the lower surface of dials 3 far from one end of support, before printed circuit board test, four springs
Pipe both ends are separately connected dials 3 and support, and bourdon tube keeps balance and forms elastic space between dials 3 and support, printing
When circuit board testing, dials 3 by external force straight down when, bourdon tube compression, elastic space between dials 3 and support reduces, and visits
For the second end of needle 1 relative to 3 protrusion of dials, 1 second end end face of probe touches the circuit under test for being placed on 3 upper surface of dials
Plate.
It in the present embodiment, further include guide post 9, guide post 9 is perpendicularly fixed at upper surface of support；Dials 3 is provided with just
The pilot hole of corresponding guide post 9, pilot hole pierce into guide post 9 and can be along pilot hole axis direction back and forth movements.Support is equipped with
Multiple guide posts 9, and guide post 9 is uniformly distributed on support.Four are equipped in the present embodiment to fix and be uniformly arranged on branch
The guide post 9 of seat upper surface, sets that there are four be adapted and corresponding pilot hole, pilot hole pierce into guiding with guide post 9 on dials 3
Column 9 can be along pilot hole axis direction back and forth movement.Guiding axis is set among dials 3 and support, dials 3 can be supported on
Seat top, when applying an external force along guide post 9 axially downwardly on dials 3, the pilot hole on dials 3 is vertical along guide post 9
It moves downward, and 3 compressed spring pipe of dials is moved towards support direction, when dials 3 is resisted against on support, probe 1 is raised to
Highest point, probe 1 is supported with circuit board under test to be contacted, and starts printed circuit board test.Four guide posts 9 are uniformly fixedly installed
In on support, the pilot hole on dials 3 can be up and down along guide post 9, and guide post plays position-limiting action, saves the pressure of detection,
Energy conservation but also detection efficiency can be improved.
In the present embodiment, probe 1 includes concentric first 11, second 12 and for being arranged and being fixedly connected sequentially
Third portion 13；It is resisted against upper surface of support far from second 12 end face for first 11；Second 12 outer surface is coated with insulation
Film.In the present embodiment, probe 1 divides for first 11, second 12 and third portion 13, and first 11 is is resisted against one end on support
Probe 1, second 12 is successively fixedly connected along first 11 axle center with third portion 13, and third portion 13 is far from second 12 one end
Face is lower than or concordant with 3 upper surface of dials, and 1 second 12 outer surface of probe are coated with insulating film, and the probe 1 for being coated with insulating film is arranged
In in dials 3, dials 3 is supported on support upper end by spring and guide post 9, and 1 first 11 one end of probe are resisted against on support
Surface, probe 1 first 11 in the elastic space for the support intercolumniation that dials 3 and support are formed by bourdon tube, is worked as beginning
When detecting to circuit board under test, apply an external force straight down in pilot hole in 3 upper surface of dials, dials 3 along fixed
It is movable straight down in the guide post 9 on support, 3 lower surface compressed spring pipe of dials, until 3 lower end surface of dials is resisted against support
Upper surface, opposite 3 upper surfaces of the dials protrusion in 1 third portion 13 of probe, and third portion 13 far from second 12 end face be resisted against to
Slowdown monitoring circuit plate, when circuit board under test and probe 1 are supported when contacting, circuit board under test brings pressure to bear on 1 upper surface of probe, in probe
When 1 second 12 outer surface are coated with insulating film and can be avoided probe 1 and be bent, contacts with each other between probe 1 and cause to test circuit
It cause short circuit, mentions the precision of test fixture.Insulating film material used by the present embodiment is Parylene, is gathered
Paraxylene is a kind of material with excellent electrical property, heat resistance weatherability and chemical stability, in electronic component
There is stronger performance on electric insulating medium, protectiveness material and encapsulating material.
In the present embodiment, dials 3 includes the first plate layer and the second plate layer, and the first plate layer is fixedly installed on the second plate layer back
To the side of support；First plate layer is equipped with the first through hole of compatible probe 1, and the second plate layer is equipped with the second through-hole of compatible probe 1,
And second through-hole just correspond to first through hole；First through hole aperture is greater than the outer diameter in third portion 13, and is less than and is coated with insulating film
Second 12 outer diameter.Dials 3 is equipped with the identical plate of six thickness degree in a preferred embodiment, and every laminate material passes sequentially through branch
Column is stacked, and pillar is set as copper post 2, and every laminate material has been equipped with and circuit under test with the closely sealed connection of copper post 2 on every laminate material
The compatible pin hole of plate, surface, which is coated with, passes through pin hole to the probe 1 of polyxylene, if close to 3 plate of dials of circuit board under test
For the first plate, dials 3 is set gradually as the second plate, third plate, the 4th plate, the 5th plate and the 6th plate,
The position of pin hole of six plates on support, the first plate is according to the edition type design of circuit board under test, the first plate and the
The pinhole aperture of two plates is greater than probe 1 directly and is less than 1 outer diameter of probe being coated with to polyxylene, the aperture of third plate
Greater than probe 1 diameter and with being suitable for being coated with 1 outer diameter of probe of insulating film, the probe 1 for being coated with insulating film can pass through third plate
Pin hole on material, pin hole on the 4th plate, the 5th plate and the 6th plate with the pinhole aperture size one on third plate
It causes, the pin hole on the first plate, the second plate, third plate, the 4th plate, the 5th plate and the 6th plate is respectively provided with coaxially
The heart, by probe 1, pin hole is successively passed to the 5th plate, the 4th plate, third plate, second along the 6th plate when installing probe 1
In the pin hole of plate and the first plate, second 12 of probe 1 and third portion 13 are stuck between the second plate and third plate, are coated with
Second 12 probe 1 of insulating film can not pass through the pin hole of the second plate, and the probe 1 that third portion 13 is not coated with insulating layer may pass through
First plate, by be arranged six laminate materials dials 3, can guarantee probe 1 pass through every layer of plate, it is ensured that probe 1 by
Circuit board under test bends when pressing without will cause short circuit phenomenon.By by the pin hole hole on the first plate and the second plate
Diameter setting, which is greater than 1 diameter of probe and is less than, is coated with insulation 1 outer diameter of membrane probe, by third plate, the 4th plate, the 5th plate and the
The aperture setting of six plates, which is matched, to be suitable for being coated with insulating film outer diameter, while guaranteeing that probe 1 effectively can pass through every layer of plate,
It can prevent dials 3 from falling in inversion process middle probe 1 again.In the present embodiment, probe 1 passes through the dials 3 equipped with six laminate materials
In pin hole, with the closely sealed support of copper post 2, the 6th plate lower end is fixedly connected by bourdon tube with upper surface of support every laminate material,
Support is equipped with four bourdon tubes, and four bourdon tubes are uniformly arranged on upper surface of support, smoothly the 6th plate of support connection, branch
Uniformly four guide posts 9 of fixed setting, the 4th plate, the 5th plate and the 6th plate are equipped with and are connected on support base on seat
The compatible pilot hole of guide post 9, and the pilot hole on the 4th plate, the 5th release and the 6th plate is coaxially disposed, dials 3
Can be up and down by the guide post 9 that pilot hole passes through on support, circuit board under test is placed in the first plate upper surface and is carried out
When test, dials 3 by external force straight down, pilot hole in the 4th plate, the 5th plate and the 6th plate along guide post 9 to
Lower activity, the 4th plate drive third plate, the second plate and the first plate to move together downwards by copper post 2, probe 1
Contact upper surface of support is supported in holding, and dials 3 is moved down with respect to probe 1, and probe 1 is with respect to the first plate protrusion, 1 third of probe
Portion 13 supports contact measured circuit board far from first 11 end face, therefore carries out circuit board under test open-short circuit.In another implementation
In example, guide post 9 is set to bourdon tube axle center, and 9 one end of guide post is fixedly installed on support, the 4th plate of dials 3, the 5th plate
Be equipped with the pilot hole that is adapted to guide post 9 with the 6th plate, guide post 9 is externally provided with bourdon tube, when dials 3 by external force to moving down
When dynamic, the relative position of the compressed support dials 3 of bourdon tube can control the pressure being applied on dials 3 and then control spring
Decrement, to control the relative position of probe 1 and the first plate, control probe 1 reaches essence with respect to the projection amount of dials 3
The testing needle trace of quasi- control printed circuit board.
In the present embodiment, it is equipped with identical as 1 quantity of probe in support and is corresponding in turn to the copper for being electrically connected 1 bottom of probe
Line.It is equipped in support mostly with copper wire, copper wire end is concordant with support both ends of the surface, the quantity of copper wire and the quantity setting one of probe 1
It causes, copper wire is electrically connected close to 3 one end of dials and probe 1, and the abutment surface that copper wire end face is formed is gold-plated, can increase probe 1
It is conductance between copper wire.By will be equipped with copper wire in support, the information on the circuit board under test that can be touched probe 1 is passed
It is defeated by copper wire, and then carries out data transmission obtaining testing result again.
It in the present embodiment, further include connecting line 5 and electric logging equipment 6, copper wire passes through connecting line 5 far from one end of probe 1
It is electrically connected electric logging equipment 6.Support includes upper bracket 4, support column and undersetting 7, and support column one end is fixedly connected with undersetting 7,
The other end is fixedly connected with upper bracket 4.Support is classified as upper bracket 4 and undersetting 7 by intermediate support column, by upper bracket 4
Hollow space is formed between undersetting 7, copper wire identical with 1 edition type of probe, copper wire both ends and support two are equipped in upper bracket 4
End face is concordant, and one end of copper wire is supported with probe 1 to be contacted, and the other end of copper wire is connect with connecting line 5,；Connecting line 5 is far from copper wire
One end connect with electric logging equipment 6, can according to different 6 interfaces of electric logging equipment in connecting line 5 end setting flat cable connect
Device or terminal pad are connect, convenient for the connection of connecting line 5 and connector, in a preferred embodiment, probe 1 is set in dials 3, is visited
Contact measured circuit board is supported in 1 one end of needle, and 1 other end of probe, which is supported, is contacted with upper surface of support, and guiding is fixed on support
Column 9 and spring, dials 3 is equipped with the pilot hole that be adapted to guide post 9, and dials 3 is fixedly connected with spring, support equipped with
The identical copper wire of 1 edition type of probe, copper wire both ends are concordant with 4 both ends of the surface of upper bracket, and probe 1 is electrical close to one end of support and copper wire
The other end of connection, copper wire is connect by connecting line 5 with electric logging equipment 6, when circuit board under test is placed on dials 3, dials 3
It is moved down by external force straight down, probe 1 is relative to 3 upper surface of dials protrusion, the circuit board under test being placed on dials 3
Contact and tested with raised probe 1, test data connect by the other end with copper wire by probe 1, copper wire pass through connecting line 5 and
Electric logging equipment 6 connects, and test data is transferred to electric logging equipment 6 by connecting line 5 by copper wire, and electric logging equipment 6 judges to be measured in turn
Whether circuit board has out short circuit phenomenon.
The concealed printed circuit board test fixture of the present invention is driven on dials 3 using the elastomeric element 8 of setting on the support
Lower activity, and then bulge quantity of the probe 1 with respect to 3 upper surface of dials is controlled, probe 1 is effectively hidden in dials when not testing
It is interior, it plays a protective role, in test, probe 1 accurately contacts the test point of printed circuit board, improves accurate testing degree.
The above description is only a preferred embodiment of the present invention, is not intended to limit the scope of the invention, all utilizations
Equivalent structure or equivalent flow shift made by description of the invention and accompanying drawing content is applied directly or indirectly in other correlations
Technical field, be included within the scope of the present invention.
Claims (10)
1. a kind of concealed printed circuit board test fixture, which is characterized in that including probe, dials and support；
The dials is located above the support, is provided with elastomeric element between the dials and the support；
The probe is vertically arranged in the dials and can be along the dials vertical direction activity, one end protrusion of the probe
It is contacted in the dials bottom and being supported with the upper surface of the support, the end face of the other end of the probe is lower than or concordantly
The dials upper surface；
When exerting a force vertically downwards to the dials, the elastomeric element stress moves downward and then drives the dials
It moves downward, the probe is made to protrude from the upper surface of the dials.
2. concealed printed circuit board test fixture according to claim 1, which is characterized in that the elastomeric element includes
It is multiple, and the elastomeric element is uniformly distributed on the support.
3. concealed printed circuit board test fixture according to claim 2, which is characterized in that the elastomeric element includes piece
One of spring, bourdon tube or helical spring.
4. concealed printed circuit board test fixture according to claim 1, which is characterized in that it further include guide post, it is described
Guide post is perpendicularly fixed at the upper surface of support；
The dials is provided with the pilot hole for just corresponding to the guide post, and the pilot hole pierces into the guide post and can be along described
Pilot hole axis direction back and forth movement.
5. concealed printed circuit board test fixture according to claim 4, which is characterized in that the support is equipped with multiple
Guide post, and the guide post is uniformly distributed on the support.
6. concealed printed circuit board test fixture according to claim 1, which is characterized in that the probe includes coaxial
Heart setting and first, second be fixedly connected sequentially and third portion；
Described first is resisted against the upper surface of support far from second end face；
Second outer surface is coated with insulating film.
7. concealed printed circuit board test fixture according to claim 6, which is characterized in that the dials includes the first plate
Layer and the second plate layer, the first plate layer are fixedly installed on the second plate layer backwards to the side of the support；
The first plate layer is equipped with the first through hole for being adapted to the probe, and the second plate layer, which is equipped with, is adapted to the second of the probe
Through-hole, and second through-hole is just corresponding to the first through hole；
The first through hole aperture is greater than the outer diameter in the third portion, and is less than outside described second for being coated with the insulating film
Diameter.
8. concealed printed circuit board test fixture according to claim 1, which is characterized in that be equipped with and spy in the support
Needle quantity is identical and is corresponding in turn to the copper wire for being electrically connected the probe base.
9. concealed printed circuit board test fixture according to claim 8, which is characterized in that further include connecting line and electrical measurement
Equipment, the one end of the copper wire far from the probe are electrically connected the electric logging equipment by the connecting line.
10. concealed printed circuit board test fixture according to claim 1, which is characterized in that the support includes upper branch
Seat, support column and undersetting, described support column one end are fixedly connected with the undersetting, and the other end is fixedly connected with the upper bracket.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810891429.2A CN108982932A (en) | 2018-08-07 | 2018-08-07 | Concealed printed circuit board test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810891429.2A CN108982932A (en) | 2018-08-07 | 2018-08-07 | Concealed printed circuit board test fixture |
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| Publication Number | Publication Date |
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| CN108982932A true CN108982932A (en) | 2018-12-11 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810891429.2A Pending CN108982932A (en) | 2018-08-07 | 2018-08-07 | Concealed printed circuit board test fixture |
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| CN2775663Y (en) * | 2005-02-03 | 2006-04-26 | 芽庄科技股份有限公司 | Improved detector for real mounting board |
| CN101576571A (en) * | 2008-05-06 | 2009-11-11 | 深圳麦逊电子有限公司 | Density conversion method and density conversion device for PCB test machine |
| CN203191515U (en) * | 2013-04-03 | 2013-09-11 | 深圳市森力普电子有限公司 | Testing tool |
| CN204302417U (en) * | 2014-12-22 | 2015-04-29 | 深圳市芽庄电子有限公司 | Linear film-coated probe measurement jig |
| CN204740323U (en) * | 2015-06-29 | 2015-11-04 | 深圳市芽庄电子有限公司 | Automatic insulating four terminal detection tool of probe counterpoint |
| CN206618832U (en) * | 2017-02-28 | 2017-11-07 | 珠海拓优电子有限公司 | A kind of floating type circuit board testing jig |
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Application publication date: 20181211 |