CN108933183A - Preparation method based on silicon-graphene photodetector - Google Patents

Preparation method based on silicon-graphene photodetector Download PDF

Info

Publication number
CN108933183A
CN108933183A CN201810715873.9A CN201810715873A CN108933183A CN 108933183 A CN108933183 A CN 108933183A CN 201810715873 A CN201810715873 A CN 201810715873A CN 108933183 A CN108933183 A CN 108933183A
Authority
CN
China
Prior art keywords
silicon
metal electrode
graphene
layer
top layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201810715873.9A
Other languages
Chinese (zh)
Other versions
CN108933183B (en
Inventor
狄增峰
马喆
薛忠营
张苗
梅永丰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fudan University
Shanghai Institute of Microsystem and Information Technology of CAS
University of Chinese Academy of Sciences
Original Assignee
Fudan University
Shanghai Institute of Microsystem and Information Technology of CAS
University of Chinese Academy of Sciences
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fudan University, Shanghai Institute of Microsystem and Information Technology of CAS, University of Chinese Academy of Sciences filed Critical Fudan University
Priority to CN201810715873.9A priority Critical patent/CN108933183B/en
Publication of CN108933183A publication Critical patent/CN108933183A/en
Application granted granted Critical
Publication of CN108933183B publication Critical patent/CN108933183B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/1804Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic Table
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/0256Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
    • H01L31/0264Inorganic materials
    • H01L31/028Inorganic materials including, apart from doping material or other impurities, only elements of Group IV of the Periodic Table
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/0352Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
    • H01L31/035272Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions characterised by at least one potential jump barrier or surface barrier
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
    • H01L31/101Devices sensitive to infrared, visible or ultraviolet radiation
    • H01L31/102Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
    • H01L31/109Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier being of the PN heterojunction type
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Light Receiving Elements (AREA)

Abstract

Preparation method provided by the invention based on silicon-graphene photodetector, the substrate using soft fixing layer as photodetector, improves the flexibility of device;In addition using SOI substrate as the forerunner for preparing detector, the top layer silicon and graphene for using SOI substrate are as hetero-junctions, only one atomic thickness of graphene, the thickness also very little of top layer silicon simultaneously, so the flexible better effect of detector further improves the flexibility of entire device after release, the usage scenario for expanding detector can be applied to detector in following wearable device;Finally, the graphical processing and the formation of the first metal electrode and the second metal electrode of SOI substrate are compatible with CMOS technology, to enormously simplify preparation process, cost is reduced.

Description

Preparation method based on silicon-graphene photodetector
Technical field
The invention belongs to semiconductor fields and photoelectricity integration field, more particularly to a kind of based on silicon-graphene flexibility The preparation method of photodetector.
Background technique
The detection of optical signal is the important ring in spectral measurement, is used in different occasions and for different purposes Detector it is also different, it is most important consideration be detector application wave-length coverage, detectivity and response time.Light is visited Surveying device is the device that radiation energy is changed into another physical quantity convenient for measurement, it of a great variety, in general can be with According to generated physical effect on the detector, it is divided into optothermal detector, photodetector and optical pressure detector.
Photodetector is that radiation energy is changed into current or voltage signal to measure, and is most-often used optical signal Detector.It is mainly characterized by: detectivity is high, and time response is fast, can carry out to the transient change of optical radiation power Measurement, but there is apparent optical wavelength to select characteristic for it.Photodetector divides inner photoeffect device and external photoeffect device again Part, inner photoeffect are to cause electron motion state in material by the interaction of light and detector target surface solid material Variation, and then cause the variation of material electrical properties.
Photodetector has extensive use in military and national economy every field.In visible light or near infrared band master It is used for radionetric survey and detection, industry automatic control, Photometric Measurement etc.;It is mainly used for missile guidance, infrared in infrared band Thermal imaging, infrared remote sensing etc..
Graphene (Graphene) is a kind of carbon atom with sp2Hybridized orbit forms hexagon, in honeycomb lattice arrangement Single layer two dimensional crystal.2004, the team of Novoselov and Geim, which are prepared to stablize at room temperature with micromechanics stripping method, to deposit Graphene, started graphene research upsurge.In recent years, the material of graphene prepares, transfer, characterizes and partly leading A series of researchs of body, the application on the function elements such as chemistry are unfolded in succession, and progress is rapid.Due to unique zero band gap of graphene Band structure, the electron mobility of superelevation is (theoretically up to 200,000cm at room temperature2·V-1·s-1), the electricity of nearly ballistic transport It the features such as sub- property (mean free path of electronics reaches sub-micrometer scale), high-termal conductivity, from transistor to chemical sensor, then arrives There is very big application potential in the fields such as nano-electromechanical device;Since its unique optical absorption characteristics (only has the absorptivity of light 2.3%, and light absorbing wave-length coverage covers infrared light, it is seen that light and ultraviolet light), application of the graphene on photoelectric device Gradually realized by people, and is considered as most potential one of application direction.
Excellent detection performance, but the substrate due to using have been achieved currently based on silicon-graphene photodetector The generally thickness of rigid substrate or the silicon used is very big, causes photodetector not have flexibility, limits usage scenario, nothing Method is integrated into following wearable device.
For these reasons, it is necessary to which a kind of can effectively improve based on silicon-graphene photodetector flexibility is provided Preparation method be necessary.
Summary of the invention
In view of the foregoing deficiencies of prior art, the purpose of the present invention is to provide a kind of based on silicon-graphene light The preparation method of electric explorer, the silicon that the substrate for solving photodetector in the prior art is generally rigid substrate or uses Thickness is very big, causes photodetector not have flexibility, limits the problem of usage scenario of photodetector etc..
In order to achieve the above objects and other related objects, the present invention provides a kind of based on silicon-graphene photodetector Preparation method, the preparation method includes at least:
1) SOI substrate is provided, the SOI substrate includes body silicon substrate, insulating layer and top layer silicon, the thickness of the top layer silicon Degree is in 500nm or less;
2) spaced first opening and the second opening are etched in the top layer silicon, wherein first opening And second opening runs through the top layer silicon;
3) in forming the first metal electrode in first opening and in the top layer silicon of part, in second opening The second metal electrode is formed, second metal electrode and the side wall of the top layer silicon have gap;
4) graphene layer is formed, the graphene layer is formed in the top layer silicon, and across the gap and described the Two metal electrodes connection, wherein the graphene layer and first metal electrode are spaced apart;
5) fixing layer is formed in the body structure surface that step 4) obtains;
6) the body silicon substrate and the insulating layer are removed, to appear the top layer silicon, first metal electrode and institute State the second metal electrode.
Preferably, the thickness of the top layer silicon is in 200nm or less.
Preferably, step 3) grows first metal electrode and second metal electrode using lift-off technique, Comprising steps of
3-1) in the top layer silicon, first opening is upper and described second is open upper spin coating photoresist, utilize photoetching Define the position of first metal electrode and second metal electrode;
The position of first metal electrode and second metal electrode will 3-2) be needed to form using developing technique The photoresist removal;
Metal layer 3-3) is formed in the body structure surface that step 3-2) is obtained in the way of electron beam evaporation or radio-frequency sputtering, And be put into acetone or N-Methyl pyrrolidone, the metal layer on the photoresist and the photoresist is removed, nothing is retained The metal layer at photoresist.
Preferably, step 4) comprising steps of
4-1) using chemical vapour deposition technique in forming the graphene layer in a target substrate;
The graphene layer 4-2) is transferred to using PMMA secondary transfer method the body structure surface of step 3) acquisition;
4-3) the graphical graphene layer, only retain in the top layer silicon of remaining part, the top layer silicon with it is described The graphene layer on the insulating layer between second metal electrode and on second metal electrode.
Preferably, step 5) comprising steps of
5-1) in step 4) obtain body structure surface spin coating fixer, spin speed between 1000 revs/min~1500 turns/ Between minute;
5-2) in heating the fixer on hot plate, so that the fixer is cured as the fixing layer and attaches to described In SOI substrate, heating temperature is between 230 DEG C~250 DEG C, and heating time is between 40min~60min.
Preferably, step 5) comprising steps of
5-1) in step 4) obtain body structure surface spin coating fixer, spin speed between 1000 revs/min~1500 turns/ Between minute;
5-2) in heating the fixer on hot plate, so that the fixer is cured as film and attaches to the SOI lining On bottom, heating temperature is between 140 DEG C~160 DEG C, and heating time is between 2min~3min;
Step 5-1 5-3) is repeated several times) and step 5-2) reach thickness requirement to the film;
5-4) in heating the film on the hot plate, so that the film hardening is the fixing layer and attaches to described In SOI substrate, heating temperature is between 230 DEG C~250 DEG C, and heating time is between 40min~60min.
Preferably, step 6) comprising steps of
The window until insulating layer 6-1) is etched in the body silicon substrate;
Wet etching 6-2) is used, by insulating layer described in the opening etch, until the insulating layer is etched completely, The body silicon substrate is also completely removed simultaneously.
Further, step 6-1) in, etch multiple windows, the diameter of the window between 5 μm~10 μm, The circle center distance of adjacent two window is between 100 μm~200 μm.
Further, the insulating layer includes silica, and the etching solution of the wet etching includes 10% hydrofluoric acid Solution.
Preferably, the material of first metal electrode includes gold or chromium gold, the material of second metal electrode include Gold or chromium gold.
Preferably, the material of the fixing layer includes polyimides.
As described above, the preparation method provided by the invention based on silicon-graphene photodetector, is consolidated using soft Substrate of the given layer as photodetector, improves the flexibility of device;In addition before using SOI substrate as detector is prepared It drives, the top layer silicon and graphene for using SOI substrate are as hetero-junctions, only one atomic thickness of graphene, while top layer silicon Thickness also very little expand so the flexible better effect of detector further improves the flexibility of entire device after release The usage scenario of detector can be applied to detector in following wearable device;Finally, SOI substrate is graphical Processing and the formation of first metal electrode and second metal electrode are compatible with CMOS technology, to enormously simplify Preparation process reduces cost.
Detailed description of the invention
Fig. 1 is shown as the flow chart of the preparation method of the invention based on silicon-graphene photodetector.
Fig. 2 is shown as the knot that the step 1) of the preparation method of the invention based on silicon-graphene photodetector is presented Structure schematic diagram.
Fig. 3 is shown as the knot that the step 2) of the preparation method of the invention based on silicon-graphene photodetector is presented Structure schematic diagram.
The step 3) that Fig. 4 a- Fig. 4 d is shown as the preparation method of the invention based on silicon-graphene photodetector is in Existing structural schematic diagram.
The step 4) that Fig. 5 a- Fig. 5 c is shown as the preparation method of the invention based on silicon-graphene photodetector is in Existing structural schematic diagram.
Fig. 6 is shown as the knot that the step 5) of the preparation method of the invention based on silicon-graphene photodetector is presented Structure schematic diagram.
The step 6) that Fig. 7 a- Fig. 7 b is shown as the preparation method of the invention based on silicon-graphene photodetector is in Existing structural schematic diagram.
Component label instructions
1 SOI substrate
11 body silicon substrates
12 insulating layers
13 top layer silicons
2 first openings
3 second openings
4 first metal electrodes
41 photoresists
42 metal layers
5 second metal electrodes
6 graphene layers
61 target substrates
7 fixing layers
8 windows
S1~S6 step
Specific embodiment
Illustrate embodiments of the present invention below by way of specific specific example, those skilled in the art can be by this specification Other advantages and efficacy of the present invention can be easily understood for disclosed content.The present invention can also pass through in addition different specific realities The mode of applying is embodied or practiced, the various details in this specification can also based on different viewpoints and application, without departing from Various modifications or alterations are carried out under spirit of the invention.
Please refer to FIG. 1 to FIG. 7 b.It should be noted that diagram provided in the present embodiment only illustrates this in a schematic way The basic conception of invention, only shown in schema then with related component in the present invention rather than package count when according to actual implementation Mesh, shape and size are drawn, when actual implementation kenel, quantity and the ratio of each component can arbitrarily change for one kind, and its Assembly layout kenel may also be increasingly complex.
The present invention provides a kind of preparation method based on silicon-graphene photodetector, as shown in Figure 1, the preparation Method at least includes the following steps:
S1, provides a SOI substrate, and the SOI substrate includes body silicon substrate, insulating layer and top layer silicon, the top layer silicon Thickness is in 500nm or less;
S2 etches spaced first opening and the second opening in the top layer silicon, wherein first opening And second opening runs through the top layer silicon;
S3, in forming the first metal electrode in first opening and in the top layer silicon of part, in second opening The side wall of the second metal electrode of interior formation, second metal electrode and the top layer silicon has gap;
S4 forms graphene layer, and the graphene layer is formed in the top layer silicon, and across the gap and described the Two metal electrodes connection, wherein the graphene layer and first metal electrode are spaced apart;
S5 forms fixing layer in the body structure surface that step 4) obtains;
S6 removes the body silicon substrate and the insulating layer, to appear the top layer silicon, first metal electrode and institute State the second metal electrode.
The preparation method of the invention based on silicon-graphene photodetector is made to be situated between in detail below with reference to specific attached drawing It continues.
Step S1 is first carried out, as shown in Fig. 2, provide a SOI substrate 1, the SOI substrate 1 include body silicon substrate 11, absolutely Edge layer 12 and top layer silicon 13, the thickness of the top layer silicon 13 is in 500nm or less.
Preferably, the thickness of the top layer silicon 13 200nm once.Select the thickness of the top layer silicon 13 thinner, it is subsequent After the body silicon substrate 11 and the insulating layer 12 discharge, the flexibility of the top layer silicon 13 is better.
Then execute step S2, as shown in figure 3, etched in the top layer silicon 13 it is spaced first opening 2 and Second opening 3, wherein first opening 2 and second opening 3 run through the top layer silicon 13.
In the step, first opening 2 and second opening 3, i.e., the graphical top layer silicon 13, purpose are etched It is in order to form the region based on silicon-graphene photodetector described in subsequent preparation, wherein by the top layer silicon 13 by institute It states the first opening 2 and second opening 3 is spaced apart.Can be obtained using existing any method first opening 2 and Second opening 3.The first opening 2 and second opening 3 are obtained using the method for chemical wet etching in this implementation.
Then step S3 is executed, as shown in figure 4d, in forming the in first opening 2 and in the top layer silicon 13 of part One metal electrode 4, in forming the second metal electrode 5 in second opening 3, second metal electrode 5 and the top layer silicon 13 side wall has gap.
Need exist for explanation, after being subsequently formed the hetero-junctions of top layer silicon and graphene, first metal electrode 4 Effect is is electrically connected with the bottom silicon 13 realization, the extraction electrode as the top layer silicon 13;Second metal electrode 5 Effect is is electrically connected with graphene realization, the extraction electrode as the graphene.So second metal electrode 5 needs It is spaced apart with the top layer silicon 13, to keep electric isolution between the two.
As an example, the material of first metal electrode 4 includes gold or chromium gold, the material of second metal electrode 5 Including gold or chromium gold.
First metal electrode 4 and second metal electrode 5 can be grown using lift-off technique, as Fig. 4 a~ Shown in Fig. 4 d, step is specifically included:
As shown in fig. 4 a, step 3-1), in the top layer silicon 13, in first opening 2 and in second opening 3 Spin coating photoresist 41 goes out the position of first metal electrode 4 and second metal electrode 5 using lithographic definition.
As shown in Figure 4 b, step 3-2), first metal electrode 4 and described second will be needed to form using developing technique The photoresist 41 of the position of metal electrode 5 removes.
It should be noted that according to different situations, the position of first metal electrode 4 and second metal electrode 5 Can be different, i.e., described first metal electrode 4 can be partially filled with first opening 2, can also be filled up completely described first Opening 2, coverage area of first metal electrode 4 in the top layer silicon 13 is also adjustable, second metal electrode 5 Filling range in second opening 3 is also adjustable.
As shown in Fig. 4 c~Fig. 4 d, step 3-3), obtained in the way of electron beam evaporation or radio-frequency sputtering in step 3-2) The body structure surface obtained forms metal layer 42 (as illustrated in fig. 4 c), and is put into acetone or N-Methyl pyrrolidone, removes the light The metal layer 42 in photoresist 41 and the photoresist 41 retains the metal layer 42 at unglazed photoresist 41 (such as Fig. 4 d institute Show).
Since photoresist 41 is dissolved in acetone or N-Methyl pyrrolidone, so there is the place of photoresist 41, thereon described Metal layer also can Automatic-falling, unglazed photoresist 41 place can then retain the metal layer 42.What needs to be explained here is that After removing the extra metal layer 42, shaping can be carried out to the remaining metal layer 42, to form the institute of necessary requirement shape State the first metal electrode 4 and second metal electrode 5 (as shown in figure 4d).
Then step S4 is executed, as shown in Figure 5 c, forms graphene layer 6, the graphene layer 6 is formed in the top layer silicon It on 13, and is connect across the gap with second metal electrode 5, wherein the graphene layer 6 and the first metal electricity Pole 4 is spaced apart.
The graphene layer 6 is formed in the present embodiment with the following method:
As shown in Figure 5 a, step 4-1), using chemical vapour deposition technique in forming the graphene in a target substrate 61 Layer 6.
As shown in Figure 5 b, step 4-2), the graphene layer 6 is transferred to by step 3) using PMMA secondary transfer method and is obtained Body structure surface.
It should be noted that the method for shifting the graphene layer 6 can also be using any existing except the present embodiment Transfer method, such as the method that can be directly by mechanically pulling off, it is not limited here.The present embodiment preferably uses PMMA to assist Transfer method realizes the transfer of the graphene layer 6.
As shown in Figure 5 c, step 4-3), the graphical graphene layer 6 only retains the remaining part top layer silicon 13 On the insulating layer 12 between the upper, top layer silicon 13 and second metal electrode 5 and on second metal electrode 5 The graphene layer 6.
It should be noted that the needs of graphene layer 6 are spaced apart with first metal electrode 4, to keep Electric isolution between the two.
Then step S5 is executed, as shown in fig. 6, forming fixing layer 7 in the body structure surface that step 4) obtains.
The fixing layer 7 is for the fixed hetero-junctions being subsequently formed, and the substrate as entire device uses, so needing institute Fixing layer is stated with cementability, flexibility and non-conductive.In the present embodiment, the material of the fixing layer 7 includes polyimides.
Preparing the fixing layer 7 can be obtained using spin coating heating.That is, the body structure surface spin coating obtained prior to step 4) Fixer, spin speed is between 1000 revs/min~1500 revs/min, and preferably 1000 revs/min of the present embodiment;Then In heating the fixer on hot plate, so that the fixer is cured as the fixing layer 7 and attaches in the SOI substrate 1, Heating temperature is between 230 DEG C~250 DEG C, and heating time, the present embodiment preferably heated temperature between 40min~60min Degree is 250 DEG C, heating time 60min.Based on the thickness requirement of the fixing layer 7, can also repeat the above steps to increase The thickness of the fixing layer 7.
Preparing the fixing layer 7 can also be obtained using another spin coating heating.That is, the structure obtained prior to step 4) Surface spin coating fixer, spin speed is between 1000 revs/min~1500 revs/min, and preferably 1000 revs/min of the present embodiment Clock;Then in heating the fixer on hot plate, so that the fixer is cured as film and attaches in the SOI substrate 1, Heating temperature between 140 DEG C~160 DEG C, heating time between 2min~3min, the preferred heating temperature of the present embodiment It is 150 DEG C, heating time 2min;Upper two step to the film is repeated several times and reaches thickness requirement;Finally on the hot plate Heat the film so that the film hardening is the fixing layer 7 and to attach in the SOI substrate 1, heating temperature between Between 230 DEG C~250 DEG C, heating time is between 40min~60min.
It finally executes step S6 and removes the body silicon substrate 11 and the insulating layer 12 as shown in Figure 7b, to appear described Top layer silicon 13, first metal electrode 4 and second metal electrode 5.
In the present embodiment, the body silicon substrate 11 and the insulating layer 12 are removed using following step, the specific steps are as follows:
As shown in Figure 7a, step 6-1), the window 8 until insulating layer 12 is etched in the body silicon substrate 11.
Preferably, multiple windows can be equably etched in the body silicon substrate 11, uniform multiple windows are advantageous In the uniform removal of the subsequent insulating layer 12.Preferably, the window can be formed using photoetching and reactive ion etching method 8。
As an example, the diameter of the window 8, between 5 μm~10 μm, the circle center distance of adjacent two window 8 is situated between Between 100 μm~200 μm, in the present embodiment, the diameter of the window 8 is 10 μm, the circle center distance of adjacent two window 8 It is 100 μm.
As shown in Figure 7b, step 6-2), using wet etching, the insulating layer 12 is etched by the window 8, until institute It states insulating layer 12 to be etched completely, while the body silicon substrate 11 is also completely removed.
As an example, the insulating layer includes silica, the etching solution of the wet etching includes 10% hydrofluoric acid Solution.
In conclusion the present invention provides a kind of preparation method based on silicon-graphene photodetector, comprising: provide One SOI substrate, the SOI substrate include body silicon substrate, insulating layer and top layer silicon, and the thickness of the top layer silicon is in 500nm or less; Spaced first opening and the second opening are etched in the top layer silicon, wherein first opening and described second Opening runs through the top layer silicon;In forming the first metal electrode in first opening and in the top layer silicon of part, in described The second metal electrode is formed in second opening, second metal electrode and the side wall of the top layer silicon have gap;Form stone Black alkene layer, the graphene layer are formed in the top layer silicon, and are connect across the gap with second metal electrode, In, the graphene layer and first metal electrode are spaced apart;Fixation is formed in the body structure surface that step 4) obtains Layer;The body silicon substrate and the insulating layer are removed, to appear the top layer silicon, first metal electrode and second gold medal Belong to electrode.Substrate of the present invention using soft fixing layer as photodetector, improves the flexibility of device;In addition it uses SOI substrate is as the forerunner for preparing detector, and the top layer silicon for using SOI substrate and graphene are as hetero-junctions, and graphene is only There is an atomic thickness, while the thickness of top layer silicon also very little, thus after release, the flexible better effect of detector, further The flexibility for improving entire device expands the usage scenario of detector, so that detector is can be applied to the wearable of future and sets In standby;Finally, the graphical processing and the formation of first metal electrode and second metal electrode of SOI substrate with CMOS technology is compatible, to enormously simplify preparation process, reduces cost.So the present invention effectively overcomes in the prior art Various shortcoming and have high industrial utilization value.
The above-described embodiments merely illustrate the principles and effects of the present invention, and is not intended to limit the present invention.It is any ripe The personage for knowing this technology all without departing from the spirit and scope of the present invention, carries out modifications and changes to above-described embodiment.Cause This, institute is complete without departing from the spirit and technical ideas disclosed in the present invention by those of ordinary skill in the art such as At all equivalent modifications or change, should be covered by the claims of the present invention.

Claims (11)

1. a kind of preparation method based on silicon-graphene photodetector, which is characterized in that the preparation method is at least wrapped It includes:
1) SOI substrate is provided, the SOI substrate includes body silicon substrate, insulating layer and top layer silicon, and the thickness of the top layer silicon exists 500nm or less;
2) spaced first opening and the second opening are etched in the top layer silicon, wherein first opening and institute The second opening is stated through the top layer silicon;
3) it in forming the first metal electrode in first opening and in the top layer silicon of part, is formed in second opening The side wall of second metal electrode, second metal electrode and the top layer silicon has gap;
4) graphene layer is formed, the graphene layer is formed in the top layer silicon, and across the gap and second gold medal Belong to electrode connection, wherein the graphene layer and first metal electrode are spaced apart;
5) fixing layer is formed in the body structure surface that step 4) obtains;
6) the body silicon substrate and the insulating layer are removed, to appear the top layer silicon, first metal electrode and described the Two metal electrodes.
2. the preparation method according to claim 1 based on silicon-graphene photodetector, it is characterised in that: described The thickness of top layer silicon is in 200nm or less.
3. the preparation method according to claim 1 based on silicon-graphene photodetector, it is characterised in that: step 3) first metal electrode and second metal electrode are grown using lift-off technique, comprising steps of
3-1) in the top layer silicon, first opening is upper and described second is open upper spin coating photoresist, utilize lithographic definition The position of first metal electrode and second metal electrode out;
It will 3-2) be needed to form described in the position of first metal electrode and second metal electrode using developing technique Photoresist removal;
Metal layer 3-3) is formed in the body structure surface that step 3-2) is obtained in the way of electron beam evaporation or radio-frequency sputtering, and is put Enter in acetone or N-Methyl pyrrolidone, remove the metal layer on the photoresist and the photoresist, retains non-lithography The metal layer of Jiao Chu.
4. the preparation method according to claim 1 based on silicon-graphene photodetector, it is characterised in that: step 4) comprising steps of
4-1) using chemical vapour deposition technique in forming the graphene layer in a target substrate;
The graphene layer 4-2) is transferred to using PMMA secondary transfer method the body structure surface of step 3) acquisition;
4-3) the graphical graphene layer, only retains in the top layer silicon of remaining part, the top layer silicon and described second The graphene layer on the insulating layer between metal electrode and on second metal electrode.
5. the preparation method according to claim 1 based on silicon-graphene photodetector, it is characterised in that: step 5) comprising steps of
5-1) the body structure surface spin coating fixer obtained in step 4), spin speed is between 1000 revs/min~1500 revs/min Between;
5-2) in heating the fixer on hot plate, so that the fixer is cured as the fixing layer and attaches to the SOI On substrate, heating temperature is between 230 DEG C~250 DEG C, and heating time is between 40min~60min.
6. the preparation method according to claim 1 based on silicon-graphene photodetector, it is characterised in that: step 5) comprising steps of
5-1) the body structure surface spin coating fixer obtained in step 4), spin speed is between 1000 revs/min~1500 revs/min Between;
5-2) in heating the fixer on hot plate, so that the fixer is cured as film and attaches in the SOI substrate, Heating temperature is between 140 DEG C~160 DEG C, and heating time is between 2min~3min;
Step 5-1 5-3) is repeated several times) and step 5-2) reach thickness requirement to the film;
5-4) in heating the film on the hot plate, so that the film hardening is the fixing layer and attaches to the SOI On substrate, heating temperature is between 230 DEG C~250 DEG C, and heating time is between 40min~60min.
7. the preparation method according to claim 1 based on silicon-graphene photodetector, it is characterised in that: step 6) comprising steps of
The window until insulating layer 6-1) is etched in the body silicon substrate;
Wet etching 6-2) is used, by insulating layer described in the opening etch, until the insulating layer is etched completely, simultaneously The body silicon substrate is also completely removed.
8. the preparation method according to claim 7 based on silicon-graphene photodetector, it is characterised in that: step In 6-1), multiple windows are etched, the diameter of the window is between 5 μm~10 μm, the center of circle of adjacent two window Distance is between 100 μm~200 μm.
9. the preparation method according to claim 7 based on silicon-graphene photodetector, it is characterised in that: described Insulating layer includes silica, and the etching solution of the wet etching includes 10% hydrofluoric acid solution.
10. the preparation method according to claim 1 based on silicon-graphene photodetector, it is characterised in that: described The material of first metal electrode includes gold or chromium gold, and the material of second metal electrode includes gold or chromium gold.
11. the preparation method according to claim 1 based on silicon-graphene photodetector, it is characterised in that: described The material of fixing layer includes polyimides.
CN201810715873.9A 2018-07-03 2018-07-03 Preparation method of photoelectric detector based on silicon-graphene Active CN108933183B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201810715873.9A CN108933183B (en) 2018-07-03 2018-07-03 Preparation method of photoelectric detector based on silicon-graphene

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201810715873.9A CN108933183B (en) 2018-07-03 2018-07-03 Preparation method of photoelectric detector based on silicon-graphene

Publications (2)

Publication Number Publication Date
CN108933183A true CN108933183A (en) 2018-12-04
CN108933183B CN108933183B (en) 2020-07-31

Family

ID=64446588

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201810715873.9A Active CN108933183B (en) 2018-07-03 2018-07-03 Preparation method of photoelectric detector based on silicon-graphene

Country Status (1)

Country Link
CN (1) CN108933183B (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111180546A (en) * 2019-12-30 2020-05-19 浙江大学 Multilayer monocrystalline silicon nano-film/graphene photoelectric detector and preparation method thereof
CN111180540A (en) * 2019-12-30 2020-05-19 浙江大学 Flexible photoelectric detector based on monocrystalline silicon nano-film/graphene and preparation method
CN111180392A (en) * 2019-12-30 2020-05-19 浙江大学 Method for obtaining large-size monocrystalline silicon nano-film on basis of silicon on insulator in large batch
WO2020155810A1 (en) * 2019-01-29 2020-08-06 西安工业大学 Infrared-transmitting high sensitivity visible light detector and preparation method thereof

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005292420A (en) * 2004-03-31 2005-10-20 Dainippon Printing Co Ltd Base film for liquid crystal panel, functional film for the liquid crystal panel, manufacturing method for functional film and manufacturing apparatus for the functional film
JP2006130877A (en) * 2004-11-09 2006-05-25 Hitachi Maxell Ltd Film base material for wiring substrate, manufacturing method of film base material for wiring substrate, and flexible printed board
CN101082523A (en) * 2007-06-27 2007-12-05 中国科学院上海微系统与信息技术研究所 Method for making flexibility temperature sensor
US9099305B2 (en) * 2013-04-30 2015-08-04 Stmicroelectronics S.R.L. Method for coupling a graphene layer and a substrate and device comprising the graphene/substrate structure obtained
CN105206689A (en) * 2015-09-18 2015-12-30 中国科学院上海微系统与信息技术研究所 Photoelectric detector preparation method based on thin-film semiconductor-graphene heterojunction
US10147630B2 (en) * 2014-06-11 2018-12-04 John Cleaon Moore Sectional porous carrier forming a temporary impervious support

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005292420A (en) * 2004-03-31 2005-10-20 Dainippon Printing Co Ltd Base film for liquid crystal panel, functional film for the liquid crystal panel, manufacturing method for functional film and manufacturing apparatus for the functional film
JP2006130877A (en) * 2004-11-09 2006-05-25 Hitachi Maxell Ltd Film base material for wiring substrate, manufacturing method of film base material for wiring substrate, and flexible printed board
CN101082523A (en) * 2007-06-27 2007-12-05 中国科学院上海微系统与信息技术研究所 Method for making flexibility temperature sensor
US9099305B2 (en) * 2013-04-30 2015-08-04 Stmicroelectronics S.R.L. Method for coupling a graphene layer and a substrate and device comprising the graphene/substrate structure obtained
US10147630B2 (en) * 2014-06-11 2018-12-04 John Cleaon Moore Sectional porous carrier forming a temporary impervious support
CN105206689A (en) * 2015-09-18 2015-12-30 中国科学院上海微系统与信息技术研究所 Photoelectric detector preparation method based on thin-film semiconductor-graphene heterojunction

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
SARAH RIAZIMEHR等: "Spectral sensitivity of a grapheme/silicon pn-junction photodetector", 《EUROSOI-ULIS 2015: 2015 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON》 *

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020155810A1 (en) * 2019-01-29 2020-08-06 西安工业大学 Infrared-transmitting high sensitivity visible light detector and preparation method thereof
US11810994B2 (en) 2019-01-29 2023-11-07 Xi An Technological University Infrared-transmitting high-sensitivity visible light detector and preparation method thereof
CN111180546A (en) * 2019-12-30 2020-05-19 浙江大学 Multilayer monocrystalline silicon nano-film/graphene photoelectric detector and preparation method thereof
CN111180540A (en) * 2019-12-30 2020-05-19 浙江大学 Flexible photoelectric detector based on monocrystalline silicon nano-film/graphene and preparation method
CN111180392A (en) * 2019-12-30 2020-05-19 浙江大学 Method for obtaining large-size monocrystalline silicon nano-film on basis of silicon on insulator in large batch
CN111180546B (en) * 2019-12-30 2021-07-13 浙江大学 Multilayer monocrystalline silicon nano-film/graphene photoelectric detector and preparation method thereof
CN111180540B (en) * 2019-12-30 2021-10-22 浙江大学 Flexible photoelectric detector based on monocrystalline silicon nano-film/graphene and preparation method

Also Published As

Publication number Publication date
CN108933183B (en) 2020-07-31

Similar Documents

Publication Publication Date Title
CN108933183A (en) Preparation method based on silicon-graphene photodetector
CN105206689B (en) A kind of photodetector preparation method based on thin film semiconductor's Graphene hetero-junctions
CN103682176B (en) The manufacture method of rigid substrate substrate and flexible display device, rigid substrate substrate
CN104638049B (en) A kind of p-type Graphene/N-type germanium nano-cone array schottky junction infrared photoelectric detector and preparation method thereof
CN107907251B (en) Pressure sensor and preparation method thereof
CN105655473B (en) thermoelectric generator
CN104075811B (en) TCR high absorbs the THz detecting structures and preparation method of sensitive laminated film
CN106129135A (en) Terahertz detector based on graphene field effect transistor and preparation method thereof
CN105118887B (en) Graphene/zinc selenide nanobelt schottky junction blue light photoswitch that a kind of indium nanometer particle array is modified and preparation method thereof
CN104038173B (en) Method for preparing graphene high frequency nano electro mechanical system (NEMS) on the basis of flexible substrate
CN104637789A (en) Method for preparing patterned graphene and graphene flexible transparent electrothermal film
CN105811120A (en) Continuously adjustable degradable terahertz meta-material based on optical driving and preparation method thereof
CN105428435A (en) High-sensitivity ultraviolet light detector and manufacturing method thereof
CN103943713A (en) Quantum dot and graphene photosensitive field-effect transistor and manufacturing method thereof
CN104591074B (en) Flexible silicon film based on sandwich structure and preparation method thereof
CN108400247A (en) The method for preparing the stretchable device with regular fold using mask pattern transfer
CN105957955A (en) Photoelectric detector based on graphene planar junction
CN106653891A (en) Indium selenide/silicon-based photoelectric detector and preparation method thereof
CN103280404B (en) A kind of graphical preparation method of the field emission electrode based on vertical Graphene
CN113540154B (en) Flexible photoelectric detector of double heterostructure based on two-dimensional material and preparation process thereof
CN110246914A (en) A kind of enhanced terahertz detector of etching based on indium antimonide and preparation method
CN103730535B (en) The un-cooled infrared focal plane array pixel manufacture method of applying silicon germanium film
CN111916524B (en) Molybdenum sulfide photodetector imitating retina imaging and preparation method thereof
CN111180540B (en) Flexible photoelectric detector based on monocrystalline silicon nano-film/graphene and preparation method
CN113193070A (en) Two-dimensional palladium diselenide flexible self-driven wide-spectrum photoelectric sensor and preparation method thereof

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant