CN108918424A - 一种磁性线材的磁畴成像方法及磁畴壁形状判别方法 - Google Patents
一种磁性线材的磁畴成像方法及磁畴壁形状判别方法 Download PDFInfo
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- CN108918424A CN108918424A CN201810417270.0A CN201810417270A CN108918424A CN 108918424 A CN108918424 A CN 108918424A CN 201810417270 A CN201810417270 A CN 201810417270A CN 108918424 A CN108918424 A CN 108918424A
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
- G01N2021/218—Measuring properties of electrooptical or magnetooptical media
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/061—Sources
- G01N2201/06113—Coherent sources; lasers
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115453434A (zh) * | 2022-08-09 | 2022-12-09 | 云南大学 | 一种多功能微纳聚焦极向纵向一体化磁光克尔效应装置 |
CN116312886A (zh) * | 2023-03-08 | 2023-06-23 | 成都信息工程大学 | 三维任意角度磁光光场分布计算系统、方法以及测试平台 |
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CN101271059A (zh) * | 2008-04-30 | 2008-09-24 | 复旦大学 | 一种大场纵向表面磁光克尔效应测量装置 |
EP2853886A1 (en) * | 2013-09-25 | 2015-04-01 | Toyota Jidosha Kabushiki Kaisha | Magnetic measurement method and its system and apparatus |
CN106442708A (zh) * | 2016-09-29 | 2017-02-22 | 电子科技大学 | 基于磁畴运动阈值磁场的应力评估方法 |
CN107525769A (zh) * | 2016-11-30 | 2017-12-29 | 山东大学 | 一种通过优化偏振器方位角提高磁畴成像质量的方法 |
-
2018
- 2018-04-24 CN CN201810417270.0A patent/CN108918424B/zh active Active
Patent Citations (9)
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US4410277A (en) * | 1978-11-01 | 1983-10-18 | Hitachi, Ltd. | Apparatus for detecting magneto-optical anisotropy |
JPH03185338A (ja) * | 1989-12-15 | 1991-08-13 | Mitsubishi Kasei Corp | 磁区観察用レーザ偏光顕微鏡 |
CN1560594A (zh) * | 2004-02-18 | 2005-01-05 | 山东大学 | 自旋极化隧道原子力显微技术 |
JP2006017557A (ja) * | 2004-06-30 | 2006-01-19 | Japan Science & Technology Agency | 磁気力顕微鏡を利用した垂直磁気記録媒体中の保磁力分布解析法並びにその解析装置 |
CN2886552Y (zh) * | 2005-05-19 | 2007-04-04 | 上海复旦天欣科教仪器有限公司 | 表面磁光克尔效应装置 |
CN101271059A (zh) * | 2008-04-30 | 2008-09-24 | 复旦大学 | 一种大场纵向表面磁光克尔效应测量装置 |
EP2853886A1 (en) * | 2013-09-25 | 2015-04-01 | Toyota Jidosha Kabushiki Kaisha | Magnetic measurement method and its system and apparatus |
CN106442708A (zh) * | 2016-09-29 | 2017-02-22 | 电子科技大学 | 基于磁畴运动阈值磁场的应力评估方法 |
CN107525769A (zh) * | 2016-11-30 | 2017-12-29 | 山东大学 | 一种通过优化偏振器方位角提高磁畴成像质量的方法 |
Non-Patent Citations (6)
Title |
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SOLDATOV, I. V: "Advanced MOKE magnetometry in wide-field Kerr-microscopy", 《JOURNAL OF APPLIED PHYSICS》 * |
WANG, X: "Optimization of polarizer azimuth in improving domain image contrast in magneto-optical Kerr microscope", 《JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS》 * |
宋红章: "磁畴的观察方法", 《材料导报》 * |
张志东: "磁性材料的磁结构、磁畴结构和拓扑磁结构", 《物理学报》 * |
方允樟: "Fe基合金应力退火感生磁各向异性机理的AFM研究", 《中国科学(E辑:技术科学)》 * |
李蒙蒙: "基于磁光克尔效应的磁光材料表征方法", 《中国优秀硕士学位论文全文数据库 工程科技Ⅰ辑》 * |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115453434A (zh) * | 2022-08-09 | 2022-12-09 | 云南大学 | 一种多功能微纳聚焦极向纵向一体化磁光克尔效应装置 |
CN116312886A (zh) * | 2023-03-08 | 2023-06-23 | 成都信息工程大学 | 三维任意角度磁光光场分布计算系统、方法以及测试平台 |
CN116312886B (zh) * | 2023-03-08 | 2023-12-01 | 成都信息工程大学 | 三维任意角度磁光光场分布计算方法 |
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