CN108875099B - Baseline selection method based on long and short baseline interferometer direction-finding system - Google Patents

Baseline selection method based on long and short baseline interferometer direction-finding system Download PDF

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CN108875099B
CN108875099B CN201710327780.4A CN201710327780A CN108875099B CN 108875099 B CN108875099 B CN 108875099B CN 201710327780 A CN201710327780 A CN 201710327780A CN 108875099 B CN108875099 B CN 108875099B
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CN108875099A (en
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马家宁
陈泽礼
何成
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Beijing Institute of Remote Sensing Equipment
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Abstract

The invention discloses a baseline selection method based on a long and short baseline interferometer direction-finding system, which utilizes the long and short baseline interferometer angle-finding principle to combine MATLAB simulation to perform long and short baseline ambiguity resolution angle-finding modeling and simulation, by setting system parameters such as different frequencies and measured angles, the ambiguity resolving capability of the interferometer under different baseline size combinations is analyzed, the optimal baseline size structure configuration of the long and short baseline angle measurement model under the known working frequency band is given, namely under the premise of giving the working frequency range and the angle measurement range of the system, by selecting a proper size relation between a long base line and a short base line, the direction-finding system has the widest base line phase error tolerance, therefore, the success rate of the interferometer without ambiguity in angle measurement under the condition of large phase errors is improved, and the direction measurement performance of a direction measurement system adopting a long-short baseline interferometer direction measurement system under the influence of factors such as a system and an environment in practical application is improved.

Description

Baseline selection method based on long and short baseline interferometer direction-finding system
Technical Field
The invention relates to a baseline selection method, in particular to a baseline selection method based on a long and short baseline interferometer direction-finding system.
Background
The interferometer direction-finding system has the advantages of simple algorithm, high precision and high sensitivity, and becomes a direction-finding system with more international applications. The two-dimensional direction finding device can be used for simultaneously and accurately finding the azimuth angle and the pitch angle in two dimensions, is insensitive to the polarization error and the amplitude of signals, is flexible in antenna layout, and is suitable for various application occasions such as vehicle-mounted and airborne.
The monitoring and receiving of the broadband signal make the direction finding of the interferometer have to face the processing of the high-frequency band signal and ensure the high angle measuring precision of the low-frequency band, and the technical requirements can cause the problem of phase ambiguity, namely, the phase discriminator can not output more than the high angle measuring precision
Figure 699734DEST_PATH_IMAGE002
When the wave path difference between two array elements is larger than half of the wavelength, the measured phase difference exists
Figure 616874DEST_PATH_IMAGE004
An
Figure 396612DEST_PATH_IMAGE006
Blur of (1)
Figure 729504DEST_PATH_IMAGE004
Is an integer). In order to solve such problems, the ambiguity resolution technology of the conventional interferometer is continuously innovated and developed, and a plurality of methods such as a three-dimensional baseline method, a long and short baseline method, an auxiliary baseline method, a virtual baseline method and the like are generated. Each method has advantages and disadvantages, but due to the limitation of application environment, some occasions are only suitable for the antenna layout form of long and short baselines, and the design principle of the interferometer antenna array is that the minimum antenna units are utilized to achieve the direction-finding performance index, the phase noise has good robustness (namely the maximum phase-finding error tolerance under the condition of ensuring a certain ambiguity resolution probability mentioned in a simulation algorithm), and the ambiguity can be resolved correctly in the environment with large interference, wherein the most basic problem to be researched is the ambiguity resolution angle measurement model of the long and short baselines based on double baselines. Although some methods and principles for designing long and short baselines are provided in published works and papers, most of the baselines are provided with the size and the structure of the baselines in certain relations according to the remainder theorem, and the consideration of the relation between the value of the size of the baselines and the value of the margin of error of baseline phase measurement is only insufficient in terms of point-band planes. In combination with practical application, what kind of baseline selection can meet the design requirements of the interferometer, not only can meet the requirement of angle measurement precision, but also can ensure the correct angle measurement range in a large interference environment, and the problem to be solved at present is urgently solved.
Disclosure of Invention
The invention aims to provide a baseline selection method based on a long-short baseline interferometer direction-finding system, and solves the problem of design contradiction between high-precision angle measurement and angle measurement ambiguity resolution of a traditional long-short baseline interferometer side system in a large interference environment in specific engineering application.
A baseline selection method based on a long and short baseline interferometer direction-finding system comprises the following specific steps:
first step, establishing a long-short baseline interferometer direction-finding system baseline selection simulation system
A long and short baseline interferometer direction-finding system baseline selection simulation system comprises: the device comprises a parameter setting module, a phase error generating module, a phase difference determining module, an angle determining module and a result displaying module.
The function of the parameter setting module is as follows: initializing simulation experiment parameters; the phase error generating module has the functions of: generating a phase error; the function of the phase difference determining module is as follows: determining the phase difference generated by the long baseline and the short baseline according to the parameters provided by the parameter setting module and the phase error generated by the phase error generating module; the function of the angle determination module is as follows: determining the corresponding generated signal incidence angles of the long and short baselines according to the phase difference generated by the long and short baselines determined by the phase difference determining module; the function of the result display module is as follows: and displaying a simulation result of the incident angle of the signal.
Second step parameter setting module sets simulation experiment parameters
The parameters to be set by the parameter setting module comprise a baseline size, an operating frequency, an angle measurement range and a constant.
According to the requirements of practical application and with reference to the design requirements of missile-borne radar, the parameter setting module selects a plurality of groups of baseline size, working frequency band and angle measurement range data in a simulation experiment as simulation experiment parameters and transmits the simulation experiment parameters to the phase difference determining module.
The third step is that the phase error generating module generates the phase error
The phase error generation module simulates the phase error caused by phase measurement noise, the magnitude of the generated phase error is determined according to the system design requirement and the statistical result of the actual engineering development process, and the value is set in the range of 10-180 degrees and selected according to the requirement of a simulation experiment. The phase error data generated by the phase error generation module is communicated to the phase difference determination module.
The fourth step phase difference determining module determines the phase difference generated by the long and short baselines
The phase difference determining module determines the phase difference generated by the long and short bases according to the parameters provided by the parameter setting module and the phase error generated by the phase error generating module. The lateral principle of the direction-finding system of the long-short baseline interferometer is as follows:
the single baseline interferometer side equation is:
Figure DEST_PATH_IMAGE008
(1)
in the formula:
Figure DEST_PATH_IMAGE010
-interferometer baseline length;
Figure DEST_PATH_IMAGE012
-a signal wavelength;
Figure DEST_PATH_IMAGE014
-phase difference
Figure DEST_PATH_IMAGE016
Angle of incidence of signal
For the direction-finding system of the long and short baseline interferometer, the direction-finding system consists of three direction-finding antennas, wherein an antenna a and an antenna b form a short baseline, and the dimension of the baseline is
Figure DEST_PATH_IMAGE018
The antenna a and the antenna c form a long base line, and the size of the base line is
Figure DEST_PATH_IMAGE020
. Plane electromagnetic wave
Figure 671440DEST_PATH_IMAGE021
For incidence on three direction-finding antennas at an incident angle, the wave path difference of electromagnetic waves arriving at the antennas is respectively
Figure DEST_PATH_IMAGE023
And
Figure DEST_PATH_IMAGE025
phase due to wave path differenceThe potential difference is
Figure DEST_PATH_IMAGE027
And
Figure DEST_PATH_IMAGE029
namely:
Figure DEST_PATH_IMAGE031
in the formula:
Figure 680853DEST_PATH_IMAGE018
-a short baseline length;
Figure 947886DEST_PATH_IMAGE032
-a short baseline length;
Figure 146786DEST_PATH_IMAGE012
-a signal wavelength;
Figure DEST_PATH_IMAGE034
-a short baseline phase difference;
Figure DEST_PATH_IMAGE036
-a long baseline phase difference;
Figure 753348DEST_PATH_IMAGE016
-signal angle of incidence.
According to the formula (2), the phase difference determining module determines the phase difference generated by the long baseline and the short baseline of the direction-finding system of the long baseline and the short baseline interferometer, and then the phase error generated by the phase error generating module is superposed and transmitted to the angle determining module.
The fifth step angle determining module determines the signal incidence angle generated by the long and short baselines
Because the actual baseline phase difference is directly obtained by the phase discriminator, only the actual baseline phase difference is obtained by the phase discriminator
Figure 746712DEST_PATH_IMAGE002
The phase principal value of the interval, as the incident frequency of the signal increases and the influence of the phase error, phase ambiguity of different degrees appears on the long and short baselines, so that the angle determination is actually a process of angle measurement and ambiguity resolution.
Firstly, in order to simulate the phase output characteristic of the phase detector, the phase value determined by the phase difference determining module needs to be subjected to phase main value, namely, the phase difference is planned to
Figure 687992DEST_PATH_IMAGE002
An interval. Secondly, an angle measurement ambiguity resolution mode is selected. The determination of the ambiguity of angle measurement solution is carried out by adopting an 'improved search method', and the 'improved search method' is represented by the formula:
Figure DEST_PATH_IMAGE038
in the formula:
Figure 425004DEST_PATH_IMAGE018
-a short baseline length;
Figure 948389DEST_PATH_IMAGE032
-a short baseline length;
Figure 315916DEST_PATH_IMAGE012
-a signal wavelength;
Figure DEST_PATH_IMAGE040
-short baseline phase measurement principal value;
Figure DEST_PATH_IMAGE042
-long baseline phase measurement principal value;
Figure 744493DEST_PATH_IMAGE044
-short baseline phase ambiguity;
Figure DEST_PATH_IMAGE046
-short baseline phase ambiguity;
Figure 19616DEST_PATH_IMAGE016
-a signal angle of incidence;
obtaining the main value of the phase measurement generated by the long and short baselines
Figure DEST_PATH_IMAGE047
And
Figure DEST_PATH_IMAGE048
. Then, according to the limiting condition, namely the boundary value of the unambiguous angle measurement range, the incident angle of the signal under the traversal limiting condition is
Figure 663087DEST_PATH_IMAGE049
All phase differences resulting from long and short baselines, i.e.
Figure 935937DEST_PATH_IMAGE051
And
Figure 664858DEST_PATH_IMAGE053
wherein
Figure 743673DEST_PATH_IMAGE055
A set of representations is presented that are,
Figure DEST_PATH_IMAGE057
all of the short baseline phase differences are represented,
Figure DEST_PATH_IMAGE059
means all ofLong baseline phase difference. Then, the incident angle of the signal is inversely calculated according to an interferometer angle measurement formula (2), so that an angle solution space generated by two base lines is obtained
Figure 431530DEST_PATH_IMAGE061
And
Figure 203177DEST_PATH_IMAGE063
wherein
Figure 153816DEST_PATH_IMAGE065
The space of the solution is represented by,
Figure 974004DEST_PATH_IMAGE067
all angle solution values generated by the short baseline are represented,
Figure 326488DEST_PATH_IMAGE069
all angle solution values generated for the long baseline are indicated. Comparing all angle values of the angle solution space of the long and short baselines, namely the difference between two baseline solution angles
Figure 269036DEST_PATH_IMAGE071
When the difference is taken to be minimum, that is
Figure 706971DEST_PATH_IMAGE073
The solution value of the incident angle generated by the long base line is used as an angle measurement result, so that the non-fuzzy angle measurement and the angle measurement precision are ensured. The angle measurement result is transmitted to the result display module.
The sixth step, the result display module displays the simulation result of the incident angle of the signal
The result display module displays the simulation result of the signal incidence angle in a data mapping mode, different experimental parameters are changed every time, the result display module provides a corresponding data curve graph, the simulation algorithm is improved according to the data curve graph, and the result is analyzed.
Thus, the selection of the baseline of the direction-finding system of the interferometer is completed.
The method utilizes mathematical simulation software, adopts an angle search ambiguity-solving method with improved long and short baselines, and performs mathematical simulation on the direction finding process under the conditions of a targeted system working frequency band and antenna receiving aperture by continuously and dynamically setting parameters such as the size of the short baseline, the phase error of the short baseline and the like. The simulation results are compared and analyzed, the accuracy and the feasibility of the baseline selection method are verified, and the method is proved to be capable of well solving the contradiction between the angle measurement precision and the angle measurement ambiguity resolution range of the long and short baseline interferometer direction-finding system, so that the design guarantee which is well closer to practical application is effectively provided for the baseline layout of the long and short baseline interferometer direction-finding system, and the purpose of optimizing the design of the interferometers is achieved.
Drawings
FIG. 1 is a schematic diagram of a baseline selection method based on a long and short baseline interferometer direction-finding system.
Detailed Description
A baseline selection method based on a long and short baseline interferometer direction-finding system comprises the following specific steps:
first step, establishing a long-short baseline interferometer direction-finding system baseline selection simulation system
A long and short baseline interferometer direction-finding system baseline selection simulation system comprises: the device comprises a parameter setting module, a phase error generating module, a phase difference determining module, an angle determining module and a result displaying module.
The function of the parameter setting module is as follows: initializing simulation experiment parameters; the phase error generating module has the functions of: generating a phase error; the function of the phase difference determining module is as follows: determining the phase difference generated by the long baseline and the short baseline according to the parameters provided by the parameter setting module and the phase error generated by the phase error generating module; the function of the angle determination module is as follows: determining the corresponding generated signal incidence angles of the long and short baselines according to the phase difference generated by the long and short baselines determined by the phase difference determining module; the function of the result display module is as follows: and displaying a simulation result of the incident angle of the signal.
Second step parameter setting module sets simulation experiment parameters
The parameters to be set by the parameter setting module comprise a baseline size, an operating frequency, an angle measurement range and a constant.
According to the requirements of practical application and with reference to the design requirements of missile-borne radar, the parameter setting module selects a plurality of groups of baseline size, working frequency band and angle measurement range data in a simulation experiment as simulation experiment parameters and transmits the simulation experiment parameters to the phase difference determining module.
The third step is that the phase error generating module generates the phase error
The phase error generation module simulates the phase error caused by phase measurement noise, the magnitude of the generated phase error is determined according to the system design requirement and the statistical result of the actual engineering development process, and the value is set in the range of 10-180 degrees and selected according to the requirement of a simulation experiment. The phase error data generated by the phase error generation module is communicated to the phase difference determination module.
The fourth step phase difference determining module determines the phase difference generated by the long and short baselines
The phase difference determining module determines the phase difference generated by the long and short bases according to the parameters provided by the parameter setting module and the phase error generated by the phase error generating module. The lateral principle of the direction-finding system of the long-short baseline interferometer is as follows:
the single baseline interferometer side equation is:
Figure 127588DEST_PATH_IMAGE008
(1)
in the formula:
Figure 787108DEST_PATH_IMAGE010
-interferometer baseline length;
Figure 900558DEST_PATH_IMAGE012
-a signal wavelength;
Figure 825789DEST_PATH_IMAGE014
-phase difference
Figure 50097DEST_PATH_IMAGE016
Angle of incidence of signal
For the direction-finding system of the long and short baseline interferometer, the direction-finding system consists of three direction-finding antennas, wherein an antenna a and an antenna b form a short baseline, and the dimension of the baseline is
Figure 49277DEST_PATH_IMAGE018
The antenna a and the antenna c form a long base line, and the size of the base line is
Figure 333627DEST_PATH_IMAGE020
. Plane electromagnetic wave
Figure 746154DEST_PATH_IMAGE021
For incidence on three direction-finding antennas at an incident angle, the wave path difference of electromagnetic waves arriving at the antennas is respectively
Figure 774153DEST_PATH_IMAGE023
And
Figure 142686DEST_PATH_IMAGE025
the phase difference caused by the wave path difference is
Figure 332359DEST_PATH_IMAGE027
And
Figure 232182DEST_PATH_IMAGE029
namely:
Figure 798293DEST_PATH_IMAGE031
in the formula:
Figure 99961DEST_PATH_IMAGE018
-a short baseline length;
Figure 585169DEST_PATH_IMAGE032
short base line lengthDegree;
Figure 972288DEST_PATH_IMAGE012
-a signal wavelength;
Figure DEST_PATH_IMAGE074
short baseline phase difference
Figure 342089DEST_PATH_IMAGE075
Long baseline phase difference
Figure 170368DEST_PATH_IMAGE016
Angle of incidence of signal
According to the formula (2), the phase difference determining module determines the phase difference generated by the long baseline and the short baseline of the direction-finding system of the long baseline and the short baseline interferometer, and then the phase error generated by the phase error generating module is superposed and transmitted to the angle determining module.
The fifth step angle determining module determines the signal incidence angle generated by the long and short baselines
Because the actual baseline phase difference is directly obtained by the phase discriminator, only the actual baseline phase difference is obtained by the phase discriminator
Figure 967423DEST_PATH_IMAGE002
The phase principal value of the interval, as the incident frequency of the signal increases and the influence of the phase error, phase ambiguity of different degrees appears on the long and short baselines, so that the angle determination is actually a process of angle measurement and ambiguity resolution.
Firstly, in order to simulate the phase output characteristic of the phase detector, the phase value determined by the phase difference determining module needs to be subjected to phase main value, namely, the phase difference is planned to
Figure 766139DEST_PATH_IMAGE002
An interval. Secondly, an angle measurement ambiguity resolution mode is selected. The determination of the ambiguity of angular solution is carried out by using an 'improved search method' which is disclosed by the publicFormula (II):
Figure DEST_PATH_IMAGE076
in the formula:
Figure 939631DEST_PATH_IMAGE018
-a short baseline length;
Figure 950313DEST_PATH_IMAGE032
-a short baseline length;
Figure 855952DEST_PATH_IMAGE012
-a signal wavelength;
Figure 952084DEST_PATH_IMAGE040
short baseline phase measurement principal value
Figure 663688DEST_PATH_IMAGE042
Long baseline phase measurement principal value
Figure 528876DEST_PATH_IMAGE044
Short baseline phase ambiguity
Figure 667733DEST_PATH_IMAGE046
Short baseline phase ambiguity
Figure 438112DEST_PATH_IMAGE016
Angle of incidence of signal
Obtaining the main value of the phase measurement generated by the long and short baselines
Figure 687828DEST_PATH_IMAGE047
And
Figure 673101DEST_PATH_IMAGE048
. Then, according to the limiting condition, namely the boundary value of the unambiguous angle measurement range, the incident angle of the signal under the traversal limiting condition is
Figure 982860DEST_PATH_IMAGE049
All phase differences resulting from long and short baselines, i.e.
Figure 991267DEST_PATH_IMAGE051
And
Figure 44674DEST_PATH_IMAGE053
wherein
Figure 884454DEST_PATH_IMAGE055
A set of representations is presented that are,
Figure 365114DEST_PATH_IMAGE077
all of the short baseline phase differences are represented,
Figure DEST_PATH_IMAGE078
all long baseline phase differences are indicated. Then, the incident angle of the signal is inversely calculated according to an interferometer angle measurement formula (2), so that an angle solution space generated by two base lines is obtained
Figure 844505DEST_PATH_IMAGE061
And
Figure 701603DEST_PATH_IMAGE063
wherein
Figure 395889DEST_PATH_IMAGE065
The space of the solution is represented by,
Figure 47451DEST_PATH_IMAGE067
all angle solution values generated by the short baseline are represented,
Figure 30450DEST_PATH_IMAGE069
all angle solution values generated for the long baseline are indicated. Comparing all angle values of the angle solution space of the long and short baselines, namely the difference between two baseline solution angles
Figure 425659DEST_PATH_IMAGE071
When the difference is taken to be minimum, that is
Figure 161403DEST_PATH_IMAGE073
The solution value of the incident angle generated by the long base line is used as an angle measurement result, so that the non-fuzzy angle measurement and the angle measurement precision are ensured. The angle measurement result is transmitted to the result display module.
The sixth step, the result display module displays the simulation result of the incident angle of the signal
The result display module displays the simulation result of the signal incidence angle in a data mapping mode, different experimental parameters are changed every time, the result display module provides a corresponding data curve graph, the simulation algorithm is improved according to the data curve graph, and the result is analyzed.
Thus, the selection of the baseline of the direction-finding system of the interferometer is completed.

Claims (1)

1. A baseline selection method for a direction-finding system of a long and short baseline interferometer is characterized by comprising the following specific steps:
first step, establishing a long-short baseline interferometer direction-finding system baseline selection simulation system
A long and short baseline interferometer direction-finding system baseline selection simulation system comprises: the device comprises a parameter setting module, a phase error generating module, a phase difference determining module, an angle determining module and a result display module;
the function of the parameter setting module is as follows: initializing simulation experiment parameters; the phase error generating module has the functions of: generating a phase error; the function of the phase difference determining module is as follows: determining the phase difference generated by the long baseline and the short baseline according to the parameters provided by the parameter setting module and the phase error generated by the phase error generating module; the function of the angle determination module is as follows: determining the corresponding generated signal incidence angles of the long and short baselines according to the phase difference generated by the long and short baselines determined by the phase difference determining module; the function of the result display module is as follows: displaying a simulation result of the signal incidence angle;
second step parameter setting module sets simulation experiment parameters
The parameters to be set by the parameter setting module comprise baseline size, working frequency, angle measurement range and constant;
according to the requirements of practical application and with reference to the design requirements of missile-borne radar, a parameter setting module selects a plurality of groups of baseline size, working frequency band and angle measurement range data in a simulation experiment as simulation experiment parameters and transmits the simulation experiment parameters to a phase difference determining module;
the third step is that the phase error generating module generates the phase error
The phase error generation module simulates a phase error caused by phase measurement noise, the magnitude of the generated phase error is determined according to the design requirement of a system and the statistical result of the actual engineering development process, and the value is set in the interval of 10-180 degrees and is selected according to the requirement of a simulation experiment; the phase error data generated by the phase error generating module is transmitted to the phase difference determining module;
the fourth step phase difference determining module determines the phase difference generated by the long and short baselines
The phase difference determining module determines the phase difference generated by the long and short bases according to the parameters provided by the parameter setting module and the phase error generated by the phase error generating module; the lateral principle of the direction-finding system of the long-short baseline interferometer is as follows:
the single baseline interferometer side equation is:
Figure FDA0003359621940000011
in the formula:
l-interferometer baseline length;
λ -signal wavelength;
phi-phase difference;
theta-signal incident angle;
for the direction-finding system of the long and short baseline interferometer, the direction-finding system consists of three direction-finding antennas, wherein the antenna a and the antenna b form a short baselineThe size of the base line is D, the antenna a and the antenna c form a long base line, and the size of the base line is D; planar electromagnetic waves enter the three direction-finding antennas at an incident angle theta, the wave path differences of the electromagnetic waves reaching the antennas are Dsin theta and Dsin theta respectively, and the phase difference caused by the wave path differences is
Figure FDA0003359621940000021
And
Figure FDA0003359621940000022
namely:
Figure FDA0003359621940000023
in the formula:
d-short baseline length;
d-long base length;
λ -signal wavelength;
Φd-a short baseline phase difference;
ΦD-a long baseline phase difference;
theta-signal incident angle;
according to the formula (2), the phase difference determining module determines the phase difference generated by the long baseline and the short baseline of the direction-finding system of the long baseline and the short baseline interferometer, and then the phase error generated by the phase error generating module is superposed and transmitted to the angle determining module;
the fifth step angle determining module determines the signal incidence angle generated by the long and short baselines
Because the actual baseline phase difference is directly obtained by the phase discriminator, only the phase main value in the range of [ -pi, pi ], along with the increase of the signal incidence frequency and the influence of the phase error, phase fuzziness with different degrees can occur to the long baseline and the short baseline, so the angle determination is actually a process of angle measurement and ambiguity resolution;
firstly, in order to simulate the phase output characteristic of the phase discriminator, the phase value determined by the phase difference determining module needs to be subjected to phase main value, namely the phase difference is planned to an interval of [ -pi, pi ]; secondly, selecting an angle measurement ambiguity resolution mode; the determination of the ambiguity of angle measurement solution is carried out by adopting an 'improved search method', and the 'improved search method' is represented by the formula:
Figure FDA0003359621940000024
in the formula:
d-short baseline length;
d-long base length;
λ -signal wavelength;
φd-short baseline phase measurement principal value;
φD-long baseline phase measurement principal value;
kd-short baseline phase ambiguity;
kD-short baseline phase ambiguity;
theta-signal incident angle;
obtaining a phase measurement main value phi generated by a long baseline and a short baselinedAnd phiD(ii) a Then, according to the limiting condition, namely the boundary value of the unambiguous angle measurement range, traversing all phase differences generated when the signal incidence angle is theta long and short baselines under the limiting condition, namely traversing all phase differences
Figure FDA0003359621940000031
And
Figure FDA0003359621940000032
wherein T { } represents a set,
Figure FDA0003359621940000033
all of the short baseline phase differences are represented,
Figure FDA0003359621940000034
all long baseline phase differences are represented; then, the incident angle of the signal is inversely calculated according to an interferometer angle measurement formula (2), so that an angle solution space generated by two base lines is obtained
Figure FDA0003359621940000035
And
Figure FDA0003359621940000036
wherein Z { } represents a solution space,
Figure FDA0003359621940000037
all angle solution values generated by the short baseline are represented,
Figure FDA0003359621940000038
all angle solution values generated by the long baseline are represented; comparing all angle values of the angle solution space of the long and short baselines, namely the difference between two baseline solution angles
Figure FDA0003359621940000039
When the difference is minimum, i.e.
Figure FDA00033596219400000310
The solution value of the incident angle generated by the long base line is used as an angle measurement result, so that the angle measurement is ensured to be not blurred, and the angle measurement precision is ensured; the angle measurement result is transmitted to a result display module;
the sixth step, the result display module displays the simulation result of the incident angle of the signal
The result display module displays the simulation result of the signal incidence angle in a data mapping mode, different experimental parameters are changed each time, the result display module provides a corresponding data curve graph, a simulation algorithm is improved according to the data curve graph, and the result is analyzed;
thus, the selection of the baseline of the direction-finding system of the interferometer is completed.
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