CN108845157B - Photoelectric speed measuring chip - Google Patents
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- CN108845157B CN108845157B CN201810468907.9A CN201810468907A CN108845157B CN 108845157 B CN108845157 B CN 108845157B CN 201810468907 A CN201810468907 A CN 201810468907A CN 108845157 B CN108845157 B CN 108845157B
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- 206010070834 Sensitisation Diseases 0.000 description 16
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- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P3/00—Measuring linear or angular speed; Measuring differences of linear or angular speeds
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Abstract
The invention discloses a photoelectric speed measurement chip which comprises a first photosensitive detection module, a second photosensitive detection module, a third photosensitive detection module and a fourth photosensitive detection module, wherein the four photosensitive detection modules are the same in shape and size; the chip also comprises a first comparator, a second comparator, a time sequence control module and a voltage-controlled oscillator; the output end of the voltage-controlled oscillator is connected with the time sequence control module, the output ends of the first photosensitive detection module and the third photosensitive detection module are connected with the positive and negative input ends of the first comparator, the output ends of the second photosensitive detection module and the fourth photosensitive detection module are connected with the positive and negative input ends of the second comparator, and the output ends of the first comparator and the second comparator respectively output a first output signal and a second output signal. The photoelectric speed measuring chip provided by the invention has a simple structure and occupies a small area, and the rotating speed of the code wheel can be accurately judged according to the output structure of the comparator.
Description
Technical Field
The invention relates to the field of photoelectric speed measurement, in particular to a photoelectric speed measurement chip.
Background
The photoelectric speed measuring chip is used for detecting the change frequency of light irradiated on the chip so as to obtain the rotating speed of the code wheel or the moving speed of the code bar for shielding incident light. The method is widely applied to electromechanical products and realizes the detection of the rotating speed of the workpiece. Such as detecting the rotational speed of the motor, detecting the rotational speed of the sensing part, etc.
At present, a BJT (bipolar junction transistor) process is mostly adopted in a photoelectric speed measurement chip product, and two photosensitive diodes are used for detecting the light and shade change of incident light passing through a coded disc. The photocurrent generated by the corresponding photodiode changes, and then high and low pulse signals are output, and further the rotating speed of the code wheel is calculated. However, in the CMOS process, the offset and process variation are large, and this circuit architecture cannot be used under the CMOS process.
Disclosure of Invention
The invention provides a photoelectric speed measuring chip which is simple in structure and small in occupied area and can accurately judge the rotating speed of a code disc according to the output structure of a comparator.
In order to achieve the purpose, the invention adopts the following technical scheme: a photoelectric speed measurement chip comprises a first photosensitive detection module, a second photosensitive detection module, a third photosensitive detection module and a fourth photosensitive detection module which are sequentially adjacent and convert the light intensity change of incident light into voltage change, wherein the four photosensitive detection modules are the same in shape and size; the chip also comprises a first comparator, a second comparator, a time sequence control module and a voltage-controlled oscillator; the output end of the voltage-controlled oscillator is connected with the time sequence control module and is used for generating a clock signal on the chip, the time sequence control module outputs a control signal I and a control signal II, the control signal I is simultaneously connected with the first photosensitive detection module, the second photosensitive detection module, the third photosensitive detection module and the fourth photosensitive detection module, the control signal II is simultaneously connected with the first comparator and the second comparator, the output ends of the first photosensitive detection module and the third photosensitive detection module are respectively connected with the positive input end and the negative input end of the first comparator, the output ends of the second photosensitive detection module and the fourth photosensitive detection module are respectively connected with the positive input end and the negative input end of the second comparator, the output end of the first comparator outputs a first output signal, the output end of the second comparator outputs a second output signal, and the frequency and the duration of the first output signal and the second output signal are the same.
Further, the input end of the voltage-controlled oscillator is connected with a positive temperature coefficient voltage generator, and the positive temperature coefficient voltage generator is used for providing control voltage positively correlated with the temperature on the chip for the voltage-controlled oscillator.
Furthermore, the first photosensitive detection module, the second photosensitive detection module, the third photosensitive detection module and the fourth photosensitive detection module have the same structure and respectively comprise a photodiode, a first NMOS transistor, a second NMOS transistor, a third NMOS transistor and a current source, wherein the cathode of the photodiode is connected with the negative electrode of the power supply, and the anode of the photodiode is connected with the drain of the first NMOS transistor; the source electrode of the first NMOS tube is connected with the source electrode of the second NMOS tube and the grid electrode of the third NMOS tube; the drain electrode of the second NMOS tube and the drain electrode of the third NMOS tube are both connected with the positive electrode of the power supply; the source electrode of the third NMOS tube is connected with the positive electrode of the current source and serves as the output end of the photosensitive detection module; and the cathode of the current source is connected with the cathode of the power supply.
Further, the source electrode and the drain electrode of the first NMOS tube, the second NMOS tube and the third NMOS tube can be interchanged.
Further, the control signal i includes an S1 control signal and an S2 control signal, and the S1 control signal is respectively connected to the gates of the first NMOS transistors in the first photodetection module, the second photodetection module, the third photodetection module, and the fourth photodetection module; and the S2 control signal is respectively connected with the grid electrodes of the second NMOS tubes in the first photosensitive detection module, the second photosensitive detection module, the third photosensitive detection module and the fourth photosensitive detection module.
Further, the timing control module is at t1Time of day, S1The control signal being high, S2The control signal and the control signal II are low level; at t2Time of day, S1The control signal changes from high level to low level and, at the same time, S2The control signal is changed from low level to high level, and the control signal II keeps on keeping low level; at t3Time of day, S2The control signal changes from high level to low level, and simultaneously the control signal II changes from low level to high level, S1The control signal keeps keeping low level; at t4At the moment, the control signal II changes from high level to low level, S1The control signal changes from low level to high level, S2The control signal and the control signal II are in low level, the steps are repeated, wherein t is1Time t4The time interval of the time is the period of the time sequence control module, and the period of the time sequence control module isAnd the duration of the first output signal or the second output signal is 1/X, wherein X is a positive integer.
Further, the first comparator and the second comparator have an output holding function, when the control signal II is at a low level, the output of the first comparator and the output of the second comparator hold the previous output, and when the control signal II is at a high level, the first comparator and the second comparator output the result of real-time comparison.
Further, the output of first sensitization detection module is connected the positive input of first comparator, the output of second sensitization detection module is connected the negative input of second comparator, the output of third sensitization detection module is connected the negative input of first comparator, the output of fourth sensitization detection module is connected the positive input of second comparator, when the light source shines on the sensitization detection module, its output is the low level, when not having the light source to shine on the sensitization detection module, its output is the high level.
Furthermore, the chip is used for testing the rotating speed of the code disc, the edge of the code disc comprises N light through holes with equal distance, the distance between each light through hole and the rotating shaft of the code disc is the same, the positions between the light through holes are light shielding blocks, the shapes and the sizes of the light through holes and the light shielding blocks are the same, and the total area of the four photosensitive detection modules is equal to the total area of one light through hole and one light shielding block on the code disc; the chip is fixed below the light through hole and the shading block at the edge of the code wheel to be tested, and when the code wheel rotates, the light through hole at the edge of the code wheel passes through the upper part of the chip in sequence; when the first detection photosensitive module and the second detection photosensitive module are positioned at the light through hole and the third detection photosensitive module and the fourth detection photosensitive module are positioned at the light shielding block, the first output signal is at a low level and the second output signal is at a high level; when the second detection photosensitive module and the third detection photosensitive module are positioned at the light through hole and the first detection photosensitive module and the fourth detection photosensitive module are positioned at the light shielding block, the first output signal is at a high level, and the second output signal is at a high level; when the third detection photosensitive module and the fourth detection photosensitive module are positioned at the light through hole and the first detection photosensitive module and the second detection photosensitive module are positioned at the light shielding block, the first output signal is at a high level and the second output signal is at a low level; when the first detection photosensitive module and the fourth detection photosensitive module are located at the light through hole, and the second detection photosensitive module and the third detection photosensitive module are located at the shading block, the first output signal is at a low level, the second output signal is at a low level, wherein N is an integer greater than or equal to 4.
Further, the rotating speed of the code disc is
Wherein f is1The frequency of the first output signal or the second output signal is shown, R is the distance between the light through holes on the code disc and the rotating shaft of the code disc, and N is the number of the light through holes on the code disc.
The invention has the beneficial effects that: the four same and adjacent photosensitive detection modules are respectively connected with the input ends of the two comparators, the frequency of an output signal is judged according to the output results of the two comparators, and the rotating speed of the code wheel is further calculated, so that the calculating method is simple and quick; the photoelectric speed measuring chip has simple structure and low cost, can be widely applied to various speed measuring occasions, and is particularly suitable for devices needing speed measurement in a CMOS (complementary metal oxide semiconductor) process.
Drawings
Fig. 1 is a specific schematic diagram of an optoelectronic velocity measuring chip according to the present invention.
FIG. 2 is a specific circuit diagram of the light sensing module of the present invention.
Fig. 3 shows the mounting position of the photoelectric speed measuring chip in the code wheel.
Fig. 4 is a plan view of the photoelectric speed measuring chip applied in the code wheel.
Fig. 5 is a waveform diagram of the output of the optoelectronic velocity measuring chip of the present invention.
FIG. 6 is a timing diagram of the output of the timing control module according to the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, embodiments of the present invention are described in detail below with reference to the accompanying drawings.
As shown in fig. 1, the optoelectronic speed measuring chip provided by the present invention includes a first photosensitive detection module, a second photosensitive detection module, a third photosensitive detection module, and a fourth photosensitive detection module which are adjacent to each other in sequence, and the four photosensitive detection modules have the same shape and size, and are used for converting the light intensity variation of incident light into voltage variation. The photoelectric speed measurement chip also comprises a first comparator, a second comparator, a time sequence control module and a voltage-controlled oscillator; the output end of the voltage-controlled oscillator is connected with a time sequence control module and used for generating a clock signal on a chip, the time sequence control module outputs a control signal I and a control signal II, the control signal I is simultaneously connected with a first photosensitive detection module, a second photosensitive detection module, a third photosensitive detection module and a fourth photosensitive detection module, the control signal II is simultaneously connected with a first comparator and a second comparator, the output ends of the first photosensitive detection module and the third photosensitive detection module are respectively connected with the positive input end and the negative input end of the first comparator, the output ends of the second photosensitive detection module and the fourth photosensitive detection module are respectively connected with the positive input end and the negative input end of the second comparator, the output end of the first comparator outputs a first output signal, and the output end of the second comparator outputs a second output signal. It should be noted that, the specific connection mode in the present invention may be: the positive input of first comparator is connected to the output of first sensitization detection module, the negative input of second comparator is connected to the output of second sensitization detection module, the negative input of first comparator is connected to the output of third sensitization detection module, the positive input of second comparator is connected to the output of fourth sensitization detection module, also can make the hookup location of first sensitization detection module and third sensitization detection module opposite etc. specifically only need to guarantee that first sensitization detection module and third sensitization detection module connect two inputs of a comparator, second sensitization detection module and fourth sensitization detection module connect two inputs of another comparator can.
Referring to fig. 1, the input terminal of the voltage controlled oscillator of the present invention is connected to a positive temperature coefficient voltage generator. The voltage-controlled oscillator is used for generating a high-frequency clock and controlling the time sequence control module to generate a corresponding time sequence control signal. The positive temperature coefficient voltage generator is used for generating a voltage which is in positive correlation change with temperature. The voltage is applied to the voltage controlled oscillator to cause the voltage controlled oscillator to generate a clock signal that is insensitive to temperature variations.
As shown in fig. 2, the first photosensitive detection module, the second photosensitive detection module, the third photosensitive detection module and the fourth photosensitive detection module of the present invention have the same structure, and each of the photosensitive detection modules includes a photodiode PD, a first NMOS transistor M1, a second NMOS transistor M2, a third NMOS transistor M3 and a current source I0The cathode of the photodiode is connected with the negative electrode of a power supply, and the anode of the photodiode is connected with the drain electrode of the first NMOS tube; the source electrode of the first NMOS tube is connected with the source electrode of the second NMOS tube and the grid electrode of the third NMOS tube; the drain electrode of the second NMOS tube and the drain electrode of the third NMOS tube are both connected with the positive electrode of the power supply; the source electrode of the third NMOS tube is connected with the positive electrode of the current source and serves as the output end of the photosensitive detection module; the negative pole of the current source is connected with the negative pole of the power supply. Wherein, the sources and the drains of M1, M2 and M3 can be interchanged.
Referring to fig. 1 and fig. 2, the control signal i of the present invention includes an S1 control signal and an S2 control signal, and the S1 control signal is respectively connected to the gates of the first NMOS transistors in the first photodetection module, the second photodetection module, the third photodetection module, and the fourth photodetection module; s2 control signals are respectively connected with the grid electrodes of the second NMOS tubes in the first photosensitive detection module, the second photosensitive detection module, the third photosensitive detection module and the fourth photosensitive detection module; the control signal II is simultaneously connected with the first comparator and the second comparator. The first comparator and the second comparator have an output holding function, when the control signal II is at a low level, the first comparator and the second comparator output outputs before holding, and when the control signal II is at a high level, the first comparator and the second comparator output a real-time comparison result.
Referring to fig. 3 and 4, the chip of the present invention is used for measuring the rotation speed of the code wheel, the code wheel has a rotation shaft and a circumferential disc using the rotation shaft as a center of circle, N light passing holes 202 are provided at the edge of the code wheel, where N is an integer greater than or equal to 4, the distances between the N light passing holes are equal, the distances from the light passing holes to the rotation shaft of the code wheel are the same, the part between the light passing holes is a light blocking block 201, and the shape and size of the light passing holes and the light blocking block are the same. The chip is arranged below the light through holes and the shading block at the edge of the code wheel, and when the code wheel starts to rotate, the light through holes at the edge of the code wheel sequentially pass through the upper part of the chip. In the invention, because the total area of the four photosensitive detection modules is equal to the total area of one light through hole and one light shielding block on the code disc, and because the areas of the four photosensitive detection modules are the same, the areas of the light through hole and the light shielding block are also the same, the areas of the two photosensitive detection modules in the invention are equal to the areas of the light shielding block or the light through hole, namely, in the process of rotating the code disc, because the photoelectric speed measurement chip is arranged below the light through hole and the light shielding block of the code disc, only two photosensitive detection modules in the photoelectric speed measurement chip are always positioned below the light through block, and the other two photosensitive detection modules are positioned below the light shielding block.
Referring to fig. 3, 4 and 5, when the light source irradiates the photosensitive detection module, the output is at a low level, and when the photosensitive detection module does not irradiate the light source, the output is at a high level. When the first detection photosensitive module and the second detection photosensitive module are positioned at the light through hole and the third detection photosensitive module and the fourth detection photosensitive module are positioned at the light shielding block, the first output signal is at a low level and the second output signal is at a high level; when the second detection photosensitive module and the third detection photosensitive module are positioned at the light through hole and the first detection photosensitive module and the fourth detection photosensitive module are positioned at the light shielding block, the first output signal is at a high level and the second output signal is at a high level; when the third detection photosensitive module and the fourth detection photosensitive module are positioned at the light through hole and the first detection photosensitive module and the second detection photosensitive module are positioned at the light shielding block, the first output signal is at a high level and the second output signal is at a low level; when the first detection photosensitive module and the fourth detection photosensitive module are positioned at the light through hole, and the second detection photosensitive module and the third detection photosensitive module are positioned at the light shading block, the first output signal is at a low level, and the second output signal is at a low level. Therefore, when the code wheel is rotated, the period of change of the second output signal of the first output signal in the chip is as shown in FIG. 5.
Thus, the rotational speed of the code wheel is
Wherein f is1The frequency of the first output signal or the second output signal is shown, R is the distance between the light through holes on the code disc and the rotating shaft of the code disc, and N is the number of the light through holes on the code disc. In addition, when the mounting positions of the code disc and the chip are fixed, the rotating direction of the code disc can be obtained through the sequence of the first output signal and the second output signal. According to the working principle of the chip, the frequency and the time length of each output of the first output signal and the second output signal are the same, as shown in fig. 5.
As shown in FIG. 6, the timing control module is at t1Time of day, S1The control signal being high, S2The control signal and the control signal II are low level; at t2Time of day, S1The control signal changes from high level to low level and, at the same time, S2The control signal is changed from low level to high level, and the control signal II keeps on keeping low level; at t3Time of day, S2The control signal changes from high level to low level, and simultaneously the control signal II changes from low level to high level, S1The control signal keeps keeping low level; at t4At the moment, the control signal II changes from high level to low level, S1The control signal changes from low level to high level, S2And the control signal II are in low level, and the steps are repeated. We define: t is t1Time t4The time interval of the time is one period of the time sequence control module, and the working principle of the chip shows that the output time lengths of the first output signal and the second output signal of the chip are the same, and the output time length of each time is related to the rotating speed of the code disc. The period of the time sequence control module is 1/X of the duration of the first output signal or the second output signal, wherein X is a positive integer, namely, the period of the time sequence control module is less than that of the first output signalThe duration of each output of the signal or second output signal.
The above description is only a preferred embodiment of the present invention, and the embodiment is not intended to limit the scope of the present invention, so that all equivalent structural changes made by using the contents of the specification and the drawings of the present invention should be included in the scope of the appended claims.
Claims (9)
1. A photoelectric speed measurement chip is characterized in that the chip comprises a first photosensitive detection module, a second photosensitive detection module, a third photosensitive detection module and a fourth photosensitive detection module which are sequentially adjacent and convert the light intensity change of incident light into voltage change, and the four photosensitive detection modules are the same in shape and size; the chip also comprises a first comparator, a second comparator, a time sequence control module and a voltage-controlled oscillator; the output end of the voltage-controlled oscillator is connected with the time sequence control module and is used for generating a clock signal on the chip, the time sequence control module outputs a control signal I and a control signal II, the control signal I is simultaneously connected with the first photosensitive detection module, the second photosensitive detection module, the third photosensitive detection module and the fourth photosensitive detection module, the control signal II is simultaneously connected with the first comparator and the second comparator, the output ends of the first photosensitive detection module and the third photosensitive detection module are respectively connected with the positive input end and the negative input end of the first comparator, the output ends of the second photosensitive detection module and the fourth photosensitive detection module are respectively connected with the positive input end and the negative input end of the second comparator, the output end of the first comparator outputs a first output signal, the output end of the second comparator outputs a second output signal, and the frequency and the time length of the first output signal and the second output signal are the same;
the first photosensitive detection module, the second photosensitive detection module, the third photosensitive detection module and the fourth photosensitive detection module have the same structure and respectively comprise a photodiode, a first NMOS (N-channel metal oxide semiconductor) tube, a second NMOS tube, a third NMOS tube and a current source; the control signal I comprises an S1 control signal and an S2 control signal, and the S1 control signal is respectively connected with the grid electrodes of first NMOS tubes in the first photosensitive detection module, the second photosensitive detection module, the third photosensitive detection module and the fourth photosensitive detection module; and the S2 control signal is respectively connected with the grid electrodes of the second NMOS tubes in the first photosensitive detection module, the second photosensitive detection module, the third photosensitive detection module and the fourth photosensitive detection module.
2. An optoelectronic speed measuring chip according to claim 1, wherein the input terminal of the voltage controlled oscillator is connected to a positive temperature coefficient voltage generator, and the positive temperature coefficient voltage generator is configured to provide a control voltage positively correlated to the temperature on the chip for the voltage controlled oscillator.
3. The optoelectronic speed measuring chip of claim 1, wherein a cathode of said photodiode is connected to a negative electrode of a power supply, and an anode thereof is connected to a drain of said first NMOS transistor; the source electrode of the first NMOS tube is connected with the source electrode of the second NMOS tube and the grid electrode of the third NMOS tube; the drain electrode of the second NMOS tube and the drain electrode of the third NMOS tube are both connected with the positive electrode of the power supply; the source electrode of the third NMOS tube is connected with the positive electrode of the current source and serves as the output end of the photosensitive detection module; and the cathode of the current source is connected with the cathode of the power supply.
4. An optoelectronic speed measuring chip according to claim 3, wherein the source and drain of said first NMOS transistor, said second NMOS transistor and said third NMOS transistor are interchangeable.
5. An optoelectronic speed measuring chip according to claim 1, wherein said timing control module is configured to control said timing of said optoelectronic speed measuring chip at t1Time of day, S1The control signal being high, S2The control signal and the control signal II are low level; at t2Time of day, S1The control signal changes from high level to low level and, at the same time, S2The control signal is changed from low level to high level, and the control signal II keeps on keeping low level; at t3Time of day, S2The control signal changes from high level toLow level, and at the same time, the control signal II changes from low level to high level, S1The control signal keeps keeping low level; at t4At the moment, the control signal II changes from high level to low level, S1The control signal changes from low level to high level, S2The control signal and the control signal II are in low level, the steps are repeated, wherein t is1Time t4The time interval of the time is the period of the time sequence control module, the period of the time sequence control module is 1/X of the duration of the first output signal or the second output signal, wherein X is a positive integer.
6. An optoelectronic speed measuring chip according to claim 5, wherein the first comparator and the second comparator have an output hold function, when the control signal II is at a low level, the first comparator and the second comparator output the output before hold, and when the control signal II is at a high level, the first comparator and the second comparator output the result of real-time comparison.
7. An optoelectronic tachometer chip according to claim 1 wherein the output of the first photosensitive detection module is connected to the positive input of the first comparator, the output of the second photosensitive detection module is connected to the negative input of the second comparator, the output of the third photosensitive detection module is connected to the negative input of the first comparator, and the output of the fourth photosensitive detection module is connected to the positive input of the second comparator, and when the photosensitive detection module is illuminated by a light source, the output is at a low level, and when the photosensitive detection module is not illuminated by a light source, the output is at a high level.
8. The optical speed measuring chip according to claim 7, wherein the chip is used for measuring the rotation speed of a code disc, the edge of the code disc comprises N light passing holes with equal distance between each other, the distance between each light passing hole and a code disc rotating shaft is the same, the position between the light passing holes is provided with a light shielding block, the shape and the size of the light passing holes are the same as those of the light shielding blocks, and the total area of four photosensitive detection modules is equal to the total area of one light passing hole and one light shielding block on the code disc; the chip is fixed below the light through hole and the shading block at the edge of the code wheel to be tested, and when the code wheel rotates, the light through hole at the edge of the code wheel passes through the upper part of the chip in sequence; when the first detection photosensitive module and the second detection photosensitive module are positioned at the light through hole and the third detection photosensitive module and the fourth detection photosensitive module are positioned at the light shielding block, the first output signal is at a low level and the second output signal is at a high level; when the second detection photosensitive module and the third detection photosensitive module are positioned at the light through hole and the first detection photosensitive module and the fourth detection photosensitive module are positioned at the light shielding block, the first output signal is at a high level, and the second output signal is at a high level; when the third detection photosensitive module and the fourth detection photosensitive module are positioned at the light through hole and the first detection photosensitive module and the second detection photosensitive module are positioned at the light shielding block, the first output signal is at a high level and the second output signal is at a low level; when the first detection photosensitive module and the fourth detection photosensitive module are located at the light through hole, and the second detection photosensitive module and the third detection photosensitive module are located at the shading block, the first output signal is at a low level, the second output signal is at a low level, wherein N is an integer greater than or equal to 4.
9. An optoelectronic speed measuring chip according to claim 8, wherein the rotation speed of said code disc is
Wherein f is1The frequency of the first output signal or the second output signal is shown, R is the distance between the light through holes on the code disc and the rotating shaft of the code disc, and N is the number of the light through holes on the code disc.
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