CN108844980A - A kind of device measuring internal structure under material at low temperature environment - Google Patents
A kind of device measuring internal structure under material at low temperature environment Download PDFInfo
- Publication number
- CN108844980A CN108844980A CN201810739164.4A CN201810739164A CN108844980A CN 108844980 A CN108844980 A CN 108844980A CN 201810739164 A CN201810739164 A CN 201810739164A CN 108844980 A CN108844980 A CN 108844980A
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- China
- Prior art keywords
- workbench
- insulation cover
- ray source
- low temperature
- cover
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/06—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring the deformation in a solid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/03—Investigating materials by wave or particle radiation by transmission
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Radiology & Medical Imaging (AREA)
- Biochemistry (AREA)
- Theoretical Computer Science (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Pulmonology (AREA)
- General Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Electromagnetism (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The invention discloses a kind of devices of internal structure under measurement material at low temperature environment, it includes x-ray source (1) and the X-ray detector (3) and workbench (8) opposite with x-ray source (1)；The x-ray source (1) and X-ray detector (3) is arranged at the two sides outside insulation cover (2), insertion is equipped with rotating platform (7) on the workbench (8), the insulation cover (2), which can integrally cover, to be buckled on workbench (8), the insulation cover (2) is integrally made of the double-deck organic glass sealed, and one end of the insulation cover (2) is equipped with the vacuum lead communicated with inside it (5).The configuration of the present invention is simple is scanned sample by x-ray source and X-ray detector, can rebuild the three-dimensional appearance of material in sample, and the deformation information of material in sample can be calculated by the variation that comparison loads front and back material internal three-dimensional appearance.
Description
Technical field
The present invention relates to the relevant technical fields of testing of materials, and in particular to be a kind of measurement material at low temperature environment
The device of lower internal structure.
Background technique
Material internal structure has great importance to the engineer application of material under low temperature environment, it had both reflected material and has existed
Property under low temperature environment also reflects degree of impairment of the material in temperature-fall period.It is existing to be based on surface deformation measuring technology,
It is difficult to characterize material internal damage germinating and Microstructure Evolution process under low temperature environment.
Summary of the invention
It is an object of the present invention to provide a kind of devices of internal structure under measurement material at low temperature environment, it can efficiently solve back
The problem of in the presence of scape technology.
In the presence of solving the problems, such as background technique, it includes x-ray source 1 and the X-ray opposite with x-ray source 1
Detector 3 and workbench 8；The x-ray source 1 and X-ray detector 3 is arranged at the two sides of 2 outside of insulation cover, described
Workbench 8 on insertion rotating platform 7 is installed, whole can cover of the insulation cover 2 is buckled on workbench 8, the heat preservation
Cover 2 is whole to be made of the double-deck organic glass sealed, and it is true that one end of the insulation cover 2 is equipped with the pumping that one communicates with inside it
Vacant duct 5 is equipped with nitrogen flow in pipes 9 in the workbench 8, and one end of the nitrogen flow in pipes 9 extends to rotating platform 7
Side and be located in insulation cover 2, the other end of the nitrogen flow in pipes 9 injects container with nitrogen and docks.
Due to using above technical scheme, the invention has the advantages that：Structure is simple, passes through x-ray source and X
Ray detector is scanned sample, can rebuild the three-dimensional appearance of material in sample, is loaded in the material of front and back by comparison
The deformation information of material in sample can be calculated in the variation of portion's three-dimensional appearance.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of invention without any creative labor, may be used also for those of ordinary skill in the art
To obtain other drawings based on these drawings.
Fig. 1 is structural schematic diagram of the invention.
Specific embodiment
In order to be easy to understand the technical means, the creative features, the aims and the efficiencies achieved by the present invention, below will
In conjunction with the attached drawing in the embodiment of the present invention, technical scheme in the embodiment of the invention is clearly and completely described.
Referring to Fig. 1, present embodiment, which adopts the following technical solutions, to be achieved, it includes x-ray source 1 and and X
Radiographic source 1 opposite X-ray detector 3 and workbench 8；The x-ray source 1 and X-ray detector 3 is arranged at heat preservation
The two sides of 2 outsides are covered, insertion is equipped with rotating platform 7 on the workbench 8, and whole can cover of the insulation cover 2 is buckled in
On workbench 8, the insulation cover 2 is whole to be made of the double-deck organic glass sealed, and one end of the insulation cover 2 is equipped with one
A vacuum lead 5 communicated with inside it is equipped with nitrogen flow in pipes 9 in the workbench 8, the nitrogen flow in pipes 9
One end extend to the side of rotating platform 7 and be located in insulation cover 2, the other end of the nitrogen flow in pipes 9 and nitrogen inject
Container docking.
The application method and its principle of technical solution part in present embodiment are made with reference to the accompanying drawing further
Elaboration：
Sample 4 is directly placed on rotating platform 7 first, then whole can cover of insulation cover 2 is buckled on workbench 8, it is first
First starting rotating platform 7 is by x-ray source 1 and X-ray detector 3 to 4360 degree of scanning computed tomography images of sample；Then by air pump
Pipeline docks with vacuum lead 5 and carries out vacuumize process to insulation cover 2, while injecting liquid nitrogen by nitrogen flow in pipes 9, makes
4 surrounding of sample is formed into low temperature environment, then starts rotating platform 7 and is rotated by 360 ° scanned sample CT image, it, can by rebuilding
With information such as the Morphology Evolution, the damages that obtain material internal, and then internal change can be calculated by digital body the relevant technologies
Shape develops, and can obtain other mechanics parameters by internal modification information, such as strains, stress etc..
Finally it should be noted that：The above embodiments are merely illustrative of the technical solutions of the present invention, rather than its limitations；Although
Present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that, still may be used
To modify the technical solutions described in the foregoing embodiments or equivalent replacement of some of the technical features；
And these are modified or replaceed, technical solution of various embodiments of the present invention that it does not separate the essence of the corresponding technical solution spirit and
Range.
Claims (1)
1. the device of internal structure under a kind of measurement material at low temperature environment, it is opposite comprising x-ray source (1) and with x-ray source (1)
X-ray detector (3) and workbench (8)；It is characterized in that the x-ray source (1) is all provided with X-ray detector (3)
The two sides outside insulation cover (2) are set, insertion is equipped with rotating platform (7), the insulation cover on the workbench (8)
(2) whole can cover is buckled on workbench (8), and the insulation cover (2) is integrally made of the double-deck organic glass sealed, the guarantor
One end of temperature cover (2) is equipped with the vacuum lead communicated with inside it (5), is equipped with nitrogen in the workbench (8)
Flow in pipes (9), one end of the nitrogen flow in pipes (9) extend to the side of rotating platform (7) and are located in insulation cover (2),
The other end of the nitrogen flow in pipes (9) is docked with nitrogen injection container.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810739164.4A CN108844980A (en) | 2018-07-06 | 2018-07-06 | A kind of device measuring internal structure under material at low temperature environment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810739164.4A CN108844980A (en) | 2018-07-06 | 2018-07-06 | A kind of device measuring internal structure under material at low temperature environment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108844980A true CN108844980A (en) | 2018-11-20 |
Family
ID=64200450
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810739164.4A Pending CN108844980A (en) | 2018-07-06 | 2018-07-06 | A kind of device measuring internal structure under material at low temperature environment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108844980A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110487645A (en) * | 2019-08-22 | 2019-11-22 | 山东大学 | It is applicable in the Miniature temperature control unsaturated soil triaxial tester and method of industrial CT scan |
| CN111007092A (en) * | 2020-01-02 | 2020-04-14 | 中国科学院化学研究所 | Low-temperature XRD testing device, testing equipment and testing system |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103630560A (en) * | 2013-11-04 | 2014-03-12 | 大连理工大学 | Device and method for CT (Computed Tomography) scanning of low-temperature sample |
| CN206583829U (en) * | 2017-03-30 | 2017-10-24 | 河南理工大学 | Coal containing methane gas microstructure change experimental system under cold service |
-
2018
- 2018-07-06 CN CN201810739164.4A patent/CN108844980A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103630560A (en) * | 2013-11-04 | 2014-03-12 | 大连理工大学 | Device and method for CT (Computed Tomography) scanning of low-temperature sample |
| CN206583829U (en) * | 2017-03-30 | 2017-10-24 | 河南理工大学 | Coal containing methane gas microstructure change experimental system under cold service |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110487645A (en) * | 2019-08-22 | 2019-11-22 | 山东大学 | It is applicable in the Miniature temperature control unsaturated soil triaxial tester and method of industrial CT scan |
| US11119056B2 (en) | 2019-08-22 | 2021-09-14 | Shandong University | Miniature temperature-controlled triaxial tester for testing unsaturated soil suitable for micro-computed tomography (CT) scanning and method thereby |
| CN111007092A (en) * | 2020-01-02 | 2020-04-14 | 中国科学院化学研究所 | Low-temperature XRD testing device, testing equipment and testing system |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20181120 |