A kind of silicon solar cell and preparation method thereof
Technical field
The present invention relates to technical field of solar batteries, more particularly to a kind of silicon solar cell and preparation method thereof.
Background technique
Single crystal silicon solar cell can not be widely applied because its cost is prohibitively expensive, though and organic solar batteries
So cost is relatively low, however the efficiency of organic solar batteries is far below inorganic solar cell, can not be also widely applied.?
On the basis of this, people increasingly pay close attention to the development process of hybrid inorganic-organic solar battery, hybrid inorganic-organic solar energy
Battery can avoid respective defect, in conjunction with the advantage of organic material and inorganic material to obtain higher photoelectric conversion efficiency.
Existing Si/PEDOT:The photoelectric conversion efficiency of PSS hybrid inorganic-organic solar battery needs further 10% or so
Improve the internal structure of hybrid inorganic-organic solar battery, to improve its photoelectric conversion efficiency.
Summary of the invention
The purpose of the present invention is overcoming above-mentioned the deficiencies in the prior art, a kind of silicon solar cell and its preparation side are provided
Method.
To achieve the above object, the preparation method of a kind of silicon solar cell proposed by the present invention, includes the following steps:
1) cleaning of N-type silicon chip;
2) silicon nanowire array is prepared on the surface of N-type silicon chip;
3) methylation processing is carried out to the N-type silicon chip that the step 2 obtains;
4) then contain oacetic acid aluminum-diisopropoxide and isopropanol hafnium in the upper surface spin coating of the N-type silicon chip
Organic solution, and be heat-treated, further it is passivated the upper surface of the N-type silicon chip;
5) preparation of Spiro-OMeTAD/ CuPc composite layer:The N-type silicon chip that the step 4 obtains front successively
Spin coating Spiro-OMeTAD solution, thermal evaporation CuPc, spin coating Spiro-OMeTAD solution, thermal evaporation CuPc, spin coating
Spiro-OMeTAD solution, thermal evaporation CuPc carry out first time annealing, then to form the Spiro-OMeTAD/
CuPc composite layer;
6)PEDOT:The preparation of PSS layer:In PEDOT:A certain amount of magnesium chloride is added in PSS aqueous solution, to be formed
PEDOT:PSS mixed solution, the PEDOT described in the positive spin coating for the N-type silicon chip that the step 5 obtains:PSS mixed solution, and
It carries out second to make annealing treatment, to form the PEDOT:PSS modified layer;
7) back side of the N-type silicon chip obtained in the step 6 prepares an alumina flake using atomic layer deposition method,
In, the rate of deposition of aluminium oxide is 1-2 Ethylmercurichlorendimide/period, and the periodicity of deposition is 3-5;
8) preparation of positive gate electrode;
9) preparation of rear electrode.
The preparation method of silicon solar cell as above further in the step (2), by wet etching or is done
Method etching prepares silicon nanowire array on the surface of N-type silicon chip, the length of the single silicon nanowires in the silicon nanowire array
It is 1.5-2 microns, the diameter of the silicon nanowires is 300-500 nanometers, and the spacing of adjacent silicon nanowires is 400-800 nanometers.
The preparation method of silicon solar cell as above further in the step (3), first obtains step (2)
N-type silicon chip immerse in the chlorobenzene solution of saturation phosphorus pentachloride, impregnate 1-2 hours at 120 DEG C, then by the N-type silicon chip from
It is taken out in the chlorobenzene solution of the saturation phosphorus pentachloride, then which is placed in the tetrahydro furan of 1mol/L methyl-magnesium-chloride
It mutters in solution, is impregnated 6-9 hours at 85 DEG C, to form Si-CH on the surface of the N-type silicon chip3Key, to be passivated the N-type
Silicon wafer.
The preparation method of silicon solar cell as above, it is further, described to contain ethyl in the step (4)
The concentration of oacetic acid aluminum-diisopropoxide described in acetic acid aluminum-diisopropoxide and the organic solution of isopropanol hafnium is 0.3-
0.6mg/ml, the concentration of the isopropanol hafnium are 0.3-0.6mg/ml, and the revolving speed of spin coating is 4000-5000 revs/min, spin coating
Time is 1-3 minutes, 200-300 DEG C of the temperature of the heat treatment, and the time of the heat treatment is 10-20 minutes.
The preparation method of silicon solar cell as above, further, in the step (5), the Spiro-OMeTAD
The revolving speed of the concentration 2-4mg/ml of solution, Spiro-OMeTAD solution described in each spin coating are 1500-2500 revs/min, often
The time of Spiro-OMeTAD solution described in secondary spin coating is 1-3 minutes, and the rate of each thermal evaporation CuPc is 1-2 angstroms
Meter per second, the time of each thermal evaporation CuPc are 3-6 seconds, and the annealing temperature of the first time annealing is 100-110
DEG C, the annealing time of the first time annealing is 15-25 minutes.
The preparation method of silicon solar cell as above, further, in the step (6), PEDOT:PSS mixed solution
In the concentration of magnesium chloride be 0.05-0.5mg/ml, PEDOT described in spin coating:The revolving speed of PSS mixed solution be 1800-2500 turn/
Minute, PEDOT described in spin coating:The time of PSS mixed solution is 2-5 minutes, and the annealing temperature of second of annealing is
110-130 DEG C, the annealing time of second of annealing is 20-30 minutes.
The preparation method of silicon solar cell as above further in the step (8), passes through hot evaporation metallic silver
Form the positive gate electrode, the positive gate electrode with a thickness of 180-260 nanometers.
The preparation method of silicon solar cell as above further in the step (9), passes through hot evaporation metallic aluminium
Form the rear electrode, the rear electrode with a thickness of 200-300 nanometers.
The present invention also proposes a kind of silicon solar cell, uses the above method to prepare to be formed.
The present invention has following advantages compared with prior art:
To be passivated silicon face, then in the preparation process of silicon solar cell of the invention, methylation processing is carried out first
Spin coating contains the organic solution of oacetic acid aluminum-diisopropoxide and isopropanol hafnium, and is further passivated silicon table by heat treatment
Face effectively reduces the defect state of silicon face by two step passivation process;It is initially formed on silicon nanowire array surface
Spiro-OMeTAD/ CuPc composite layer re-forms PEDOT:PSS layer is effectively kept away with obtaining the organic compound film of high quality
The top for exempting from silicon nanowires is exposed to PEDOT:PSS layer, ultra-thin Spiro-OMeTAD/ CuPc composite layer improve silicon nanometer
Line and PEDOT:Contact berrier between PSS layer, while PEDOT:PSS layer contains magnesium elements and further improves built in field, N
The back side of type silicon wafer is prepared with a ultra-thin alumina flake, has effectively been passivated the back side of silicon wafer, the phase interworking of above-mentioned each structure
It closes, and then imitates the photoelectric conversion efficiency for improving silicon solar cell of the invention.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of silicon solar cell of the invention.
Specific embodiment
As shown in Figure 1, the present invention proposes that a kind of silicon solar cell, the silicon solar cell include the back side from bottom to up
Electrode 1, backside passivation layer 2, n type single crystal silicon piece 3, silicon nanowire array 4, upper surface passivation layer 5, Spiro-OMeTAD/ phthalocyanine
Copper composite layer 6, PEDOT:PSS layer 7 and positive gate electrode 8.
The present invention also proposes the preparation method of above-mentioned silicon solar cell, includes the following steps:
1) cleaning of N-type silicon chip;
2) silicon nanowire array is prepared on the surface of N-type silicon chip, by wet etching or is dry-etched in the table of N-type silicon chip
Wheat flour is for silicon nanowire array, and the length of the single silicon nanowires in the silicon nanowire array is 1.5-2 microns, and the silicon is received
The diameter of rice noodles is 300-500 nanometers, and the spacing of adjacent silicon nanowires is 400-800 nanometers;
3) methylation processing is carried out to the N-type silicon chip that the step 2 obtains, the N-type silicon chip for first obtaining step (2) is soaked
Enter to be saturated in the chlorobenzene solution of phosphorus pentachloride, be impregnated at 120 DEG C 1-2 hours, it is then that the N-type silicon chip is phosphoric from the saturation
It takes out, is then placed in the N-type silicon chip in the tetrahydrofuran solution of 1mol/L methyl-magnesium-chloride, 85 in the chlorobenzene solution of phosphorus
It is impregnated 6-9 hours at DEG C, to form Si-CH on the surface of the N-type silicon chip3Key, to be passivated the N-type silicon chip;
4) then contain oacetic acid aluminum-diisopropoxide and isopropanol hafnium in the upper surface spin coating of the N-type silicon chip
Organic solution, and be heat-treated, further it is passivated the upper surface of the N-type silicon chip, wherein described to contain oacetic acid
The concentration of oacetic acid aluminum-diisopropoxide described in aluminum-diisopropoxide and the organic solution of isopropanol hafnium is 0.3-0.6mg/
Ml, the concentration of the isopropanol hafnium are 0.3-0.6mg/ml, and the revolving speed of spin coating is 4000-5000 revs/min, and the time of spin coating is
1-3 minutes, 200-300 DEG C of the temperature of the heat treatment, the time of the heat treatment was 10-20 minutes;
5) preparation of Spiro-OMeTAD/ CuPc composite layer:The N-type silicon chip that the step 4 obtains front successively
Spin coating Spiro-OMeTAD solution, thermal evaporation CuPc, spin coating Spiro-OMeTAD solution, thermal evaporation CuPc, spin coating
Spiro-OMeTAD solution, thermal evaporation CuPc carry out first time annealing, then to form the Spiro-OMeTAD/
CuPc composite layer, wherein the concentration 2-4mg/ml of the Spiro-OMeTAD solution, Spiro-OMeTAD described in each spin coating
The revolving speed of solution is 1500-2500 revs/min, and the time of Spiro-OMeTAD solution described in each spin coating is 1-3 minutes,
The rate of each thermal evaporation CuPc is 1-2 angstroms of meter per second, and the time of each thermal evaporation CuPc is 3-6 seconds, and described first
The annealing temperature of secondary annealing is 100-110 DEG C, and the annealing time of the first time annealing is 15-25 minutes;
6)PEDOT:The preparation of PSS layer:In PEDOT:A certain amount of magnesium chloride is added in PSS aqueous solution, to be formed
PEDOT:PSS mixed solution, the PEDOT described in the positive spin coating for the N-type silicon chip that the step 5 obtains:PSS mixed solution, and
It carries out second to make annealing treatment, to form the PEDOT:PSS modified layer, wherein PEDOT:Magnesium chloride in PSS mixed solution
Concentration be 0.05-0.5mg/ml, PEDOT described in spin coating:The revolving speed of PSS mixed solution is 1800-2500 revs/min, spin coating
The PEDOT:The time of PSS mixed solution is 2-5 minutes, and the annealing temperature of second of annealing is 110-130 DEG C,
The annealing time of second of annealing is 20-30 minutes;
7) back side of the N-type silicon chip obtained in the step 6 prepares an alumina flake using atomic layer deposition method,
In, the rate of deposition of aluminium oxide is 1-2 Ethylmercurichlorendimide/period, and the periodicity of deposition is 3-5;
8) preparation of positive gate electrode forms the positive gate electrode, the positive gate electrode by hot evaporation metallic silver
With a thickness of 180-260 nanometers;
9) preparation of rear electrode forms the rear electrode, the thickness of the rear electrode by hot evaporation metallic aluminium
It is 200-300 nanometers.
Embodiment 1:
The present invention also proposes the preparation method of above-mentioned silicon solar cell, includes the following steps:
1) cleaning of N-type silicon chip;
2) silicon nanowire array is prepared on the surface of N-type silicon chip, by wet etching or is dry-etched in the table of N-type silicon chip
Wheat flour is for silicon nanowire array, and the length of the single silicon nanowires in the silicon nanowire array is 1.8 microns, the silicon nanometer
The diameter of line is 400 nanometers, and the spacing of adjacent silicon nanowires is 600 nanometers;
3) methylation processing is carried out to the N-type silicon chip that the step 2 obtains, the N-type silicon chip for first obtaining step (2) is soaked
Enter to be saturated in the chlorobenzene solution of phosphorus pentachloride, be impregnated at 120 DEG C 1.5 hours, it is then that the N-type silicon chip is phosphoric from the saturation
It takes out, is then placed in the N-type silicon chip in the tetrahydrofuran solution of 1mol/L methyl-magnesium-chloride, 85 in the chlorobenzene solution of phosphorus
It is impregnated 8 hours at DEG C, to form Si-CH on the surface of the N-type silicon chip3Key, to be passivated the N-type silicon chip;
4) then contain oacetic acid aluminum-diisopropoxide and isopropanol hafnium in the upper surface spin coating of the N-type silicon chip
Organic solution, and be heat-treated, further it is passivated the upper surface of the N-type silicon chip, wherein described to contain oacetic acid
The concentration of oacetic acid aluminum-diisopropoxide described in aluminum-diisopropoxide and the organic solution of isopropanol hafnium is 0.5mg/ml, institute
The concentration for stating isopropanol hafnium is 0.5mg/ml, and the revolving speed of spin coating is 4500 revs/min, and the time of spin coating is 2 minutes, at the heat
240 DEG C of the temperature of reason, the time of the heat treatment are 18 minutes;
5) preparation of Spiro-OMeTAD/ CuPc composite layer:The N-type silicon chip that the step 4 obtains front successively
Spin coating Spiro-OMeTAD solution, thermal evaporation CuPc, spin coating Spiro-OMeTAD solution, thermal evaporation CuPc, spin coating
Spiro-OMeTAD solution, thermal evaporation CuPc carry out first time annealing, then to form the Spiro-OMeTAD/
CuPc composite layer, wherein the concentration 3mg/ml of the Spiro-OMeTAD solution, Spiro-OMeTAD described in each spin coating are molten
The revolving speed of liquid is 2200 revs/min, and the time of Spiro-OMeTAD solution described in each spin coating is 2 minutes, and heat is steamed every time
The rate for sending out CuPc is 1.8 angstroms of meter per seconds, and the time of each thermal evaporation CuPc is 5 seconds, the first time annealing
Annealing temperature be 105 DEG C, the annealing time of first time annealing is 20 minutes;
6)PEDOT:The preparation of PSS layer:In PEDOT:A certain amount of magnesium chloride is added in PSS aqueous solution, to be formed
PEDOT:PSS mixed solution, the PEDOT described in the positive spin coating for the N-type silicon chip that the step 5 obtains:PSS mixed solution, and
It carries out second to make annealing treatment, to form the PEDOT:PSS modified layer, wherein PEDOT:Magnesium chloride in PSS mixed solution
Concentration be 0.25mg/ml, PEDOT described in spin coating:The revolving speed of PSS mixed solution is 2200 revs/min, PEDOT described in spin coating:
The time of PSS mixed solution is 3 minutes, and the annealing temperature of second of annealing is 125 DEG C, at second of the annealing
The annealing time of reason is 25 minutes;
7) back side of the N-type silicon chip obtained in the step 6 prepares an alumina flake using atomic layer deposition method,
In, the rate of deposition of aluminium oxide is 1.5 Ethylmercurichlorendimides/period, and the periodicity of deposition is 4;
8) preparation of positive gate electrode forms the positive gate electrode, the positive gate electrode by hot evaporation metallic silver
With a thickness of 220 nanometers;
9) preparation of rear electrode forms the rear electrode, the thickness of the rear electrode by hot evaporation metallic aluminium
It is 260 nanometers.
The open-circuit voltage of the silicon solar cell of above method preparation is 0.62V, short circuit current 34.2mA/cm2, filling
The factor is 0.75, photoelectric conversion efficiency 15.9%.
Embodiment 2
The present invention also proposes the preparation method of above-mentioned silicon solar cell, includes the following steps:
1) cleaning of N-type silicon chip;
2) silicon nanowire array is prepared on the surface of N-type silicon chip, by wet etching or is dry-etched in the table of N-type silicon chip
Wheat flour is for silicon nanowire array, and the length of the single silicon nanowires in the silicon nanowire array is 1.5 microns, the silicon nanometer
The diameter of line is 300 nanometers, and the spacing of adjacent silicon nanowires is 500 nanometers;
3) methylation processing is carried out to the N-type silicon chip that the step 2 obtains, the N-type silicon chip for first obtaining step (2) is soaked
Enter to be saturated in the chlorobenzene solution of phosphorus pentachloride, impregnate 2 hours at 120 DEG C, then by the N-type silicon chip from the saturation phosphorus pentachloride
Chlorobenzene solution in take out, then the N-type silicon chip is placed in the tetrahydrofuran solution of 1mol/L methyl-magnesium-chloride, at 85 DEG C
It is lower to impregnate 9 hours, to form Si-CH on the surface of the N-type silicon chip3Key, to be passivated the N-type silicon chip;
4) then contain oacetic acid aluminum-diisopropoxide and isopropanol hafnium in the upper surface spin coating of the N-type silicon chip
Organic solution, and be heat-treated, further it is passivated the upper surface of the N-type silicon chip, wherein described to contain oacetic acid
The concentration of oacetic acid aluminum-diisopropoxide described in aluminum-diisopropoxide and the organic solution of isopropanol hafnium is 0.4mg/ml, institute
The concentration for stating isopropanol hafnium is 0.5mg/ml, and the revolving speed of spin coating is 4000 revs/min, and the time of spin coating is 3 minutes, at the heat
280 DEG C of the temperature of reason, the time of the heat treatment are 20 minutes;
5) preparation of Spiro-OMeTAD/ CuPc composite layer:The N-type silicon chip that the step 4 obtains front successively
Spin coating Spiro-OMeTAD solution, thermal evaporation CuPc, spin coating Spiro-OMeTAD solution, thermal evaporation CuPc, spin coating
Spiro-OMeTAD solution, thermal evaporation CuPc carry out first time annealing, then to form the Spiro-OMeTAD/
CuPc composite layer, wherein the concentration 2mg/ml of the Spiro-OMeTAD solution, Spiro-OMeTAD described in each spin coating are molten
The revolving speed of liquid is 1800 revs/min, and the time of Spiro-OMeTAD solution described in each spin coating is 3 minutes, and heat is steamed every time
The rate for sending out CuPc is 1 angstrom of meter per second, and the time of each thermal evaporation CuPc is 6 seconds, the first time annealing
Annealing temperature is 110 DEG C, and the annealing time of the first time annealing is 15 minutes;
6)PEDOT:The preparation of PSS layer:In PEDOT:A certain amount of magnesium chloride is added in PSS aqueous solution, to be formed
PEDOT:PSS mixed solution, the PEDOT described in the positive spin coating for the N-type silicon chip that the step 5 obtains:PSS mixed solution, and
It carries out second to make annealing treatment, to form the PEDOT:PSS modified layer, wherein PEDOT:Magnesium chloride in PSS mixed solution
Concentration be 0.1mg/ml, PEDOT described in spin coating:The revolving speed of PSS mixed solution is 2500 revs/min, PEDOT described in spin coating:
The time of PSS mixed solution is 4 minutes, and the annealing temperature of second of annealing is 110 DEG C, at second of the annealing
The annealing time of reason is 30 minutes;
7) back side of the N-type silicon chip obtained in the step 6 prepares an alumina flake using atomic layer deposition method,
In, the rate of deposition of aluminium oxide is 2 Ethylmercurichlorendimides/period, and the periodicity of deposition is 5;
8) preparation of positive gate electrode forms the positive gate electrode, the positive gate electrode by hot evaporation metallic silver
With a thickness of 200 nanometers;
9) preparation of rear electrode forms the rear electrode, the thickness of the rear electrode by hot evaporation metallic aluminium
It is 250 nanometers.
The open-circuit voltage of the silicon solar cell of above method preparation is 0.61V, short circuit current 33.8mA/cm2, filling
The factor is 0.73, photoelectric conversion efficiency 15.05%.
The above is a preferred embodiment of the present invention, it is noted that for those skilled in the art
For, various improvements and modifications may be made without departing from the principle of the present invention, these improvements and modifications are also considered as
Protection scope of the present invention.