CN108828430B - System and method for testing multi-simultaneous-test reliability of ultrahigh frequency RFID (radio frequency identification) tag chip - Google Patents
System and method for testing multi-simultaneous-test reliability of ultrahigh frequency RFID (radio frequency identification) tag chip Download PDFInfo
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- CN108828430B CN108828430B CN201810557233.XA CN201810557233A CN108828430B CN 108828430 B CN108828430 B CN 108828430B CN 201810557233 A CN201810557233 A CN 201810557233A CN 108828430 B CN108828430 B CN 108828430B
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- 238000012360 testing method Methods 0.000 title claims abstract description 102
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- 239000011521 glass Substances 0.000 claims abstract description 54
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- 229910052751 metal Inorganic materials 0.000 claims description 46
- 239000002184 metal Substances 0.000 claims description 46
- 230000005855 radiation Effects 0.000 claims description 7
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- 229910052782 aluminium Inorganic materials 0.000 claims description 6
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 6
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- 238000012986 modification Methods 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
- G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
- G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
- G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips
- G06K19/077—Constructional details, e.g. mounting of circuits in the carrier
- G06K19/07745—Mounting details of integrated circuit chips
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
- G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
- G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
- G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips
- G06K19/077—Constructional details, e.g. mounting of circuits in the carrier
- G06K19/07749—Constructional details, e.g. mounting of circuits in the carrier the record carrier being capable of non-contact communication, e.g. constructional details of the antenna of a non-contact smart card
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
- G06K7/10—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation
- G06K7/10009—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation sensing by radiation using wavelengths larger than 0.1 mm, e.g. radio-waves or microwaves
- G06K7/10316—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation sensing by radiation using wavelengths larger than 0.1 mm, e.g. radio-waves or microwaves using at least one antenna particularly designed for interrogating the wireless record carriers
- G06K7/10346—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation sensing by radiation using wavelengths larger than 0.1 mm, e.g. radio-waves or microwaves using at least one antenna particularly designed for interrogating the wireless record carriers the antenna being of the far field type, e.g. HF types or dipoles
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Abstract
The invention discloses a system and a method for testing the multi-simultaneous-test reliability of an ultrahigh frequency RFID (radio frequency identification) tag chip, wherein the system for testing the multi-simultaneous-test reliability of the ultrahigh frequency RFID tag chip comprises the following steps: host computer, read write line, incubator and far field antenna. The upper computer is internally provided with control software; one end of the reader-writer is in communication connection with the upper computer; the temperature is arranged in the incubator, and one side of the incubator is provided with a glass window; the far-field antenna is in communication connection with the other end of the reader-writer and faces towards a glass window of the incubator; the RFID tag chips are placed in the incubator, and the control software of the upper computer can control the reader-writer to conduct reliability test on the RFID tag chips in the incubator through the far-field antenna and the glass window. Therefore, the test system for the multi-simultaneous-test reliability of the ultrahigh frequency RFID tag chip improves the test efficiency and the reliability test capability.
Description
Technical Field
The invention relates to the field of chip testing, in particular to a system and a method for testing multi-simultaneous-testing reliability of an ultrahigh frequency RFID (radio frequency identification) tag chip.
Background
In order to ensure that the chip can complete the specified functions within the specified time under the specified conditions, namely the chip reliability meets the design requirements, the chip is required to be tested and verified for reliability performance according to the design requirements and the related reliability test standards. In order to verify the working life performance of the ultrahigh frequency RFID tag chip, JEDEC STANDARD (JESD47) requires a high temperature working life test (HTOL) to be carried out on the ultrahigh frequency RFID tag chip. The JESD47 generally specifies the test conditions of high temperature working life test (HTOL) as temperature T ≥ 125 deg.C, and voltage VCC≥VCCMAXAnd 3 lots of Lot were selected and 77 samples were taken from each Lot for 1000 hour testing.
The existing ultrahigh frequency RFID tag chip high temperature service life test adopts a near field test system (as shown in figure 1), and the system is tested by combining an upper computer 1 (with built-in control software), a reader-writer 2, a near field antenna 3, an RFID tag chip 7 and an incubator 5. In the test system, the RFID tag chip 7 is placed on the near-field antenna 3 and is placed in the incubator 5 together, and the control software of the upper computer 1 issues an instruction to control the reader-writer 2 to test the RFID tag chip 7 through the near-field antenna 3. Because the ultrahigh frequency RFID label chips 7 to be tested have mutual interference, only 10 samples can be tested at most simultaneously, and because the mutual interference of the near field antennas 3 causes that only one near field antenna 3 can be placed in the same incubator 5 at most, 24 sets of near field testing hardware resources (dozens of sets of near field testing hardware resources) are required to be tested at least at the same time to finish the high-temperature working life test of the ultrahigh frequency RFID label in one period, or the use number of the hardware resources is reduced to increase the test period. In addition, due to the material of the near-field antenna 3, the antenna cannot work in an environment above 90 ℃, so that the near-field test method cannot meet the test requirement of the integrated circuit in the environment of 125 ℃.
According to the analysis, the reliability of the ultrahigh frequency RFID label chip has a plurality of defects by the near field test method: 1. the test period is long; 2. the demand of test resources is overlarge; 3. the test temperature range does not meet the requirements of a common test interval.
The information disclosed in this background section is only for enhancement of understanding of the general background of the invention and should not be taken as an acknowledgement or any form of suggestion that this information forms the prior art already known to a person skilled in the art.
Disclosure of Invention
The invention aims to provide a system and a method for testing multi-simultaneous-test reliability of an ultrahigh frequency RFID (radio frequency identification) tag chip, so that the defects that the existing testing period is long, the testing resource requirement is overlarge and the testing temperature range cannot meet the requirement of a common testing interval are overcome.
In order to achieve the above object, an aspect of the present invention provides a system for testing reliability of multiple simultaneous tests of an ultrahigh frequency RFID tag chip, including: host computer, read write line, incubator and far field antenna. The upper computer is internally provided with control software; one end of the reader-writer is in communication connection with the upper computer; the temperature is arranged in the incubator, and one side of the incubator is provided with a glass window; the far-field antenna is in communication connection with the other end of the reader-writer and faces towards a glass window of the incubator; the RFID tag chips are placed in the incubator, and the control software of the upper computer can control the reader-writer to conduct reliability test on the RFID tag chips in the incubator through the far-field antenna and the glass window.
Preferably, in the above technical scheme, the system for testing the multi-simultaneous-measurement reliability of the ultrahigh frequency RFID tag chip further includes a metal back plate, the multiple RFID tag chips are uniformly distributed and fixed on the metal back plate, and the metal back plate is placed in the incubator at a position close to the glass window.
Preferably, in the above technical solution, the metal back plate is parallel to the plane of the glass window and is perpendicular to the plane of the glass window with a distance of 5 cm to 10 cm.
Preferably, in the above technical solution, the size of the glass window is larger than that of the metal back plate, and the effective radiation signal area of the far-field antenna can cover the plurality of RFID tag chips on the metal back plate through the glass window.
Preferably, in the above technical solution, the temperature of the incubator ranges from-40 ℃ to 150 ℃, and the metal back plate is made of aluminum or steel.
Preferably, in the above technical solution, the far field antenna is plate-shaped, and the size of the far field antenna is 450 mm × 450 mm, and the signal gain value is 12 dBi.
The invention also provides a method for testing the multi-simultaneous-test reliability of the ultrahigh frequency RFID label chip, which comprises the following steps: the method comprises the following steps: uniformly distributing and fixing a plurality of RFID tag chips on a metal back plate; step two: placing a metal back plate in a warm box with a glass window at one side, wherein the metal back plate is close to the glass window, and the metal back plate is parallel to the plane of the glass window and is 5-10 cm away from the plane of the glass window; step three: the control software of the upper computer controls the reader-writer to carry out reliability test on a plurality of RFID label chips in the incubator through the far-field antenna and the glass window; wherein, the inside temperature that has of incubator.
Preferably, in the above technical solution, the size of the glass window is larger than that of the metal back plate, and the effective radiation signal area of the far-field antenna can cover the plurality of RFID tag chips on the metal back plate through the glass window.
Preferably, in the above technical solution, the temperature range of the incubator is-40 ℃ to 150 ℃, and the metal back plate is made of aluminum or steel.
Preferably, in the above technical solution, the far field antenna is plate-shaped, and the size of the far field antenna is 450 mm × 450 mm, and the signal gain value is 12 dBi.
Compared with the prior art, the invention has the following beneficial effects: the system and the method for testing the multi-simultaneous-testing reliability of the ultrahigh frequency RFID tag chip can simultaneously test a large number of ultrahigh frequency RFID tag chips, the reliability single test is completed in one test period, and the ultrahigh frequency RFID tag chip can perform related reliability test in a wider temperature range (-40 ℃ to 150 ℃), so that the reliability test capability is improved.
Drawings
Fig. 1 is a schematic diagram of a conventional near field test system.
Fig. 2 is a schematic diagram of a metal back plate in a testing system for multi-simultaneous testing reliability of an ultra-high frequency RFID tag chip according to the present invention.
Fig. 3 is a schematic diagram of a test system for multi-simultaneous test reliability of uhf RFID tag chips in accordance with the present invention.
Description of the main reference numerals:
the method comprises the following steps of 1-an upper computer, 2-a reader-writer, 3-a near-field antenna, 4-a far-field antenna, 5-a warm box, 51-a glass window, 6-a metal back plate, 7-an RFID (radio frequency identification) tag chip, 8-a data line and 9-a radio frequency line.
Detailed Description
The following detailed description of the present invention is provided in conjunction with the accompanying drawings, but it should be understood that the scope of the present invention is not limited to the specific embodiments.
Throughout the specification and claims, unless explicitly stated otherwise, the word "comprise", or variations such as "comprises" or "comprising", will be understood to imply the inclusion of a stated element or component but not the exclusion of any other element or component.
As shown in fig. 2 to 3, fig. 2 is a schematic diagram of the metal back plate 6 in the testing system for multi-test reliability of the uhf RFID tag chip according to the present invention, and fig. 3 is a schematic diagram of the testing system for multi-test reliability of the uhf RFID tag chip according to the present invention.
According to a specific embodiment of the present invention, a system for testing reliability of multiple simultaneous tests of an ultrahigh frequency RFID tag chip comprises: host computer 1, read write line 2, incubator 5 and far field antenna 4. The upper computer 1 is internally provided with control software; one end of the reader-writer 2 is in communication connection with the upper computer 1; the temperature is arranged in the incubator 5, and one side of the incubator 5 is provided with a glass window 51; the far-field antenna 4 is in communication connection with the other end of the reader-writer 2, and the far-field antenna 4 faces the glass window 51 of the incubator 5; the RFID tag chips 7 are placed in the incubator 5, and the control software of the upper computer 1 can control the reader-writer 2 to perform reliability test on the RFID tag chips 7 in the incubator 5 through the far-field antenna 4 and the glass window 51.
Preferably, the number of the plurality of RFID tag chips 7 is 77; the system for testing the multi-simultaneous-testing reliability of the ultrahigh frequency RFID tag chips further comprises a metal back plate 6, 77 RFID tag chips 7 are uniformly distributed and fixed on the metal back plate 6, the metal back plate 6 is placed in the incubator 5 and close to the glass window 51, and the metal back plate 6 is parallel to the plane of the glass window 51 and is 5 cm to 10 cm away from the plane of the glass window 51.
Preferably, the size of the glass window 51 is larger than that of the metal back plate 6, and the effective radiation signal area of the far-field antenna 4 can cover 77 RFID tag chips 7 on the metal back plate 6 through the glass window 51; the temperature of the incubator 5 ranges from minus 40 ℃ to 150 ℃, and the metal back plate 6 is made of aluminum or steel; the far-field antenna 4 has a plate shape, and the size of the far-field antenna 4 is 450 mm × 450 mm, and the signal gain value is 12 dBi.
According to another embodiment of the invention, the method for testing the reliability of multiple simultaneous tests of the ultrahigh frequency RFID tag chip comprises the following steps: the method comprises the following steps: uniformly distributing and fixing 77 RFID tag chips 7 on a metal back plate 6; step two: placing a metal back plate 6 in an incubator 5 with a glass window 51 on one side, wherein the metal back plate 6 is close to the glass window 51, and the metal back plate 6 is parallel to the plane of the glass window 51 and is 5 cm to 10 cm away from the plane of the glass window 51; step three: the control software of the upper computer 1 controls the reader-writer 2 to carry out reliability test on 77 RFID tag chips 7 in the incubator 5 through the far-field antenna 4 through the glass window 51; wherein the interior of the incubator 5 has a temperature.
Preferably, the size of the glass window 51 is larger than that of the metal back plate 6, and the effective radiation signal area of the far-field antenna 4 can cover 77 RFID tag chips 7 on the metal back plate 6 through the glass window 51.
Preferably, the temperature range of the incubator 5 is-40 ℃ to 150 ℃, and the metal back plate 6 is made of aluminum or steel; the far-field antenna 4 has a plate shape, and the size of the far-field antenna 4 is 450 mm × 450 mm, and the signal gain value is 12 dBi.
In practical application, the system and the method for testing the reliability of multiple simultaneous tests of the ultrahigh frequency RFID tag chip adopt the plate-shaped far field antenna 4 with large size (length multiplied by width: 450 mm multiplied by 450 mm) and large signal gain value (12dBi) and match with the incubator 5 adopting large-size glass as a window, so that the simultaneous test quantity of the far field testing system and the method can reach 77 RFID tag chips 7, the testing temperature can be improved to be more than 125 ℃, and the high temperature working life test (HTOL) of the ultrahigh frequency RFID tag chip can be completed in one period (namely 1000 hours) only by a small amount of incubators 5, thereby greatly improving the testing efficiency of the reliability test of the ultrahigh frequency RFID tag chip. The metal back plate 6 has a size of 69 cm × 73 cm, and the glass window 51 has a size of 75 cm × 79 cm, but the invention is not limited thereto. Wherein, the far-field antenna 4 is placed to be flush with the height of the glass window 51 of the incubator 5, and is parallel to the plane of the glass window 51 with a distance of 0.15 m to 1.5 m, so that the effective radiation signal area of the far-field antenna 4 can cover all the RFID tag chips 7 through the glass window 51. The far-field antenna 4 is connected to the reader-writer 2 through a radio frequency line, and the reader-writer 2 is connected with the upper computer 1 (with built-in control software) through a data line. The control software of the upper computer 1 sets relevant parameters, mainly including working frequency, communication protocol, radio frequency emission power and the like. The control software of the upper computer 1 controls the reader-writer 2 to perform related tests on the RFID tag chip 7 in the incubator 5 through the far-field antenna 4 and the glass window 51 of the incubator 5, and the temperature range of the incubator 5 is-40 ℃ to 150 ℃.
In a word, the system and the method for testing the multi-simultaneous-testing reliability of the ultrahigh frequency RFID tag chip can simultaneously test a large number of ultrahigh frequency RFID tag chips, the reliability single test is completed in one test period, and the ultrahigh frequency RFID tag chip can perform related reliability tests in a wider temperature range (-40 ℃ to 150 ℃), so that the reliability test capability is improved.
The foregoing descriptions of specific exemplary embodiments of the present invention have been presented for purposes of illustration and description. It is not intended to limit the invention to the precise form disclosed, and obviously many modifications and variations are possible in light of the above teaching. The exemplary embodiments were chosen and described in order to explain certain principles of the invention and its practical application to enable one skilled in the art to make and use various exemplary embodiments of the invention and various alternatives and modifications as are suited to the particular use contemplated. It is intended that the scope of the invention be defined by the claims and their equivalents.
Claims (9)
1. A test system for multi-simultaneous-test reliability of an ultrahigh frequency RFID tag chip is characterized by comprising:
the upper computer is internally provided with control software;
one end of the reader-writer is in communication connection with the upper computer;
a metal back plate;
the temperature box is internally provided with temperature, and one side of the temperature box is provided with a glass window; and
the far-field antenna is in communication connection with the other end of the reader-writer and faces the glass window of the incubator;
the RFID tag chips are placed in the incubator, and the control software of the upper computer can control the reader-writer to perform reliability test on the RFID tag chips in the incubator through the far-field antenna and the glass window;
the RFID tag chips are uniformly distributed and fixed on the metal back plate, and the metal back plate is placed in the temperature box and close to the glass window.
2. The system for testing multiple simultaneous testing reliability of uhf RFID tag chips of claim 1, wherein said metal back plate is parallel to and perpendicular to the plane of said glass window at a distance of 5 cm to 10 cm.
3. The system for testing multi-simultaneous-measurement reliability of UHF RFID tag chips of claim 2, wherein the size of the glass window is larger than that of the metal back plate, and the effective radiation signal area of the far-field antenna can cover the RFID tag chips on the metal back plate through the glass window.
4. The system for testing multi-simultaneous-testing reliability of the UHF RFID tag chip of claim 1, wherein the temperature of the incubator ranges from-40 ℃ to 150 ℃, and the metal back plate is made of aluminum or steel.
5. The system for testing reliability of multiple simultaneous tests of UHF RFID tag chips of claim 1 wherein said far field antenna is plate shaped and has dimensions of 450 mm x 450 mm and a signal gain value of 12 dBi.
6. A method for testing multi-simultaneous-test reliability of an ultrahigh frequency RFID tag chip is characterized by comprising the following steps:
the method comprises the following steps: uniformly distributing and fixing a plurality of RFID tag chips on a metal back plate;
step two: placing the metal back plate in a warm box with a glass window at one side, wherein the metal back plate is close to the glass window, and the metal back plate is parallel to the plane of the glass window and is 5-10 cm away from the plane of the glass window;
step three: the control software of the upper computer controls a reader-writer to perform reliability test on the RFID tag chips in the incubator through the far-field antenna and the glass window;
wherein the inside of the incubator has a temperature.
7. The method of claim 6, wherein the glass window has a size larger than that of the metal back plate, and the effective radiation signal area of the far-field antenna can cover the plurality of RFID tag chips on the metal back plate through the glass window.
8. The method for testing the reliability of multiple simultaneous tests of the UHF RFID tag chip of claim 6, wherein the temperature range of the incubator is-40 ℃ to 150 ℃, and the metal back plate is made of aluminum or steel.
9. The method of claim 6, wherein the far field antenna is plate-shaped, has a size of 450 mm x 450 mm, and has a signal gain of 12 dBi.
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| CN110501632A (en) * | 2019-08-27 | 2019-11-26 | 北京智芯微电子科技有限公司 | The reliability test system of chip |
| CN113051942A (en) * | 2021-03-25 | 2021-06-29 | 南京航空航天大学 | Method for measuring UHF-RFID tag reading distance in salt spray environment |
| CN114295961B (en) * | 2021-12-30 | 2024-01-16 | 上海季丰电子股份有限公司 | Power temperature cycle test method and device for high-power chip and electronic equipment |
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