CN101937502A - Testing method of multichip RFID (Radio Frequency Identification) - Google Patents

Testing method of multichip RFID (Radio Frequency Identification) Download PDF

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Publication number
CN101937502A
CN101937502A CN2010102781248A CN201010278124A CN101937502A CN 101937502 A CN101937502 A CN 101937502A CN 2010102781248 A CN2010102781248 A CN 2010102781248A CN 201010278124 A CN201010278124 A CN 201010278124A CN 101937502 A CN101937502 A CN 101937502A
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CN
China
Prior art keywords
rfid
card
reading apparatus
testing
card reading
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Pending
Application number
CN2010102781248A
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Chinese (zh)
Inventor
韩嘉
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Shanghai Beiling Co Ltd
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Shanghai Beiling Co Ltd
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Publication date
Application filed by Shanghai Beiling Co Ltd filed Critical Shanghai Beiling Co Ltd
Priority to CN2010102781248A priority Critical patent/CN101937502A/en
Publication of CN101937502A publication Critical patent/CN101937502A/en
Pending legal-status Critical Current

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Abstract

The invention relates to a testing method of multichip RFID, wherein the method is realized through a card reading facility, and the RFID comprises a tag chip and a tag antenna, the card reading facility comprises a coil, and the testing method comprises the following steps of: a preparation step: respectively dismantling the tag antenna of the RFID and the coil of the card reading facility, and respectively installing an inductor at the corresponding positions of the RFID and the card reading facility; and an installation step: connecting a plurality of card reading facilities subjected to the preparation step in parallel and then simultaneously connecting with an outer computer through a serial port, and respectively coupling each card reading facility with the inductor of the RFID subjected to the preparation step. The invention not only thoroughly solves the mutual interference problem among the coils of the card reading facilities, but also can realize the simultaneous testing of eight RFID tag chips, thereby greatly lowering the testing time and cost.

Description

The method of testing of a kind of multicore sheet RFID
Technical field
The present invention relates to the method for testing of a kind of multicore sheet RFID (electronic tag).
Background technology
As everyone knows, RFID can be divided into active (active) and passive type (passive) two big classes according to working method, wherein, passive type RFID is made up of label chip and label antenna or coil, utilize inductive coupling or electromagnetic backscatter coupling principle realize and read write line between communication.Unique coding of storage is generally 64bits, 96bits even higher among the RFID, and its address space is much higher than the space that bar code can provide, and therefore can realize the article code of single grade.Enter the zone of action of read write line as RFID, just can produce the induced electricity potential difference at the label antenna two ends according to inductive coupling principle (in the reach of near field) or electromagnetic backscatter coupling principle (in the reach of far field), and in the label chip path, form weak current, if this strength of current surpasses a threshold value, just will activate RFID label chip circuit working, thereby the storer in the label chip will be carried out read/write operation.
Antenna (or coil) is to realize the radiofrequency signal spatial transmission between RFID and the read write line and set up the equipment that wireless telecommunications are connected.Comprise two class antennas in the rfid system, a class is the antenna on the RFID, and another kind of is reading and writing device antenna, and this type of antenna both can be built in the read write line, also can link to each other with the radio-frequency (RF) output end mouth of read write line by concentric cable.Yet in actual use, because the area of card reader antenna coil is bigger, and produce interference easily each other, therefore, the label chip test for RFID can't realize the test of many label chips RFID.
Summary of the invention
In order to solve the problem that above-mentioned prior art exists, the present invention aims to provide the method for testing of a kind of multicore sheet RFID, replaces the purpose that wireless mode is tested multicore sheet RFID simultaneously to reach with wired mode.
Of the present invention.。。
Owing to adopted above-mentioned technical solution, the present invention is by replacing the label antenna of RFID and the coil of card-reading apparatus respectively with inductance, RFID directly is connected with the form of transformer with card-reading apparatus, make some card-reading apparatus in parallel realize on computers controlling simultaneously by serial ports simultaneously, thereby realized replacing the test of the multicore sheet RFID of wireless mode with wired mode; The present invention has not only thoroughly solved the mutual interference problem between the card-reading apparatus coil, but also can realize eight RFID label chips time test, thereby greatly reduce test duration and cost.
Embodiment
The present invention, the method for testing of promptly a kind of multicore sheet RFID, this method realize that by card-reading apparatus RFID comprises label chip and label antenna, card-reading apparatus comprises coil.Method of testing of the present invention comprises the following steps,
Preparation process is removed the label antenna of RFID and the coil of card-reading apparatus respectively, and at the correspondence position of this RFID and card-reading apparatus inductance is installed respectively;
Set-up procedure is adjusted the inductance number of turn on the RFID of preparation process, makes the label chip of RFID have enough operating voltage;
Installation steps are connected several by serial ports through card-reading apparatus of preparation process back that is connected in parallel simultaneously with an outer computer, and each card-reading apparatus respectively with the RFID inductive coupling of a process preparation process; Test when so far, can realize multicore sheet RFID smoothly.
In the present embodiment, the quantity of the card-reading apparatus in the installation steps is eight, i.e. test when the present invention can realize eight RFID label chips.
In sum, the present invention has not only thoroughly solved the mutual interference problem between the card-reading apparatus coil, but also greatly reduces test duration and the cost of RFID.
Below in conjunction with the embodiments the present invention is had been described in detail, those skilled in the art can make the many variations example to the present invention according to the above description.Thereby some details among the embodiment should not constitute limitation of the invention, and the scope that the present invention will define with appended claims is as protection scope of the present invention.

Claims (3)

1. the method for testing of a multicore sheet RFID, this method realizes that by card-reading apparatus described RFID comprises label chip and label antenna, and described card-reading apparatus comprises coil, it is characterized in that, and described method of testing comprises the following steps,
Preparation process is removed the label antenna of described RFID and the coil of card-reading apparatus respectively, and at the correspondence position of this RFID and card-reading apparatus inductance is installed respectively;
Installation steps are connected several by serial ports through card-reading apparatus of described preparation process back that is connected in parallel simultaneously with an outer computer, and each card-reading apparatus respectively with the RFID inductive coupling of the described preparation process of a process.
2. the method for testing of multicore sheet RFID according to claim 1, it is characterized in that, described method of testing also is included in the set-up procedure before the described installation steps, adjusts through the inductance number of turn on the RFID of described preparation process, makes the label chip of this RFID have enough operating voltage.
3. the method for testing of multicore sheet RFID according to claim 1 and 2 is characterized in that, in the described installation steps, the quantity of card-reading apparatus is eight.
CN2010102781248A 2010-09-10 2010-09-10 Testing method of multichip RFID (Radio Frequency Identification) Pending CN101937502A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2010102781248A CN101937502A (en) 2010-09-10 2010-09-10 Testing method of multichip RFID (Radio Frequency Identification)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2010102781248A CN101937502A (en) 2010-09-10 2010-09-10 Testing method of multichip RFID (Radio Frequency Identification)

Publications (1)

Publication Number Publication Date
CN101937502A true CN101937502A (en) 2011-01-05

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN2010102781248A Pending CN101937502A (en) 2010-09-10 2010-09-10 Testing method of multichip RFID (Radio Frequency Identification)

Country Status (1)

Country Link
CN (1) CN101937502A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102721917A (en) * 2012-07-09 2012-10-10 上海华岭集成电路技术股份有限公司 Test method and device for tag chip without clock circuit
CN105954690A (en) * 2016-06-13 2016-09-21 公安部第研究所 Magnetic field intensity metering method for energy testing simulation card
CN108828430A (en) * 2018-06-01 2018-11-16 北京智芯微电子科技有限公司 The mostly same test macro and method for surveying reliability of ultra-high frequency RFID label chip

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102721917A (en) * 2012-07-09 2012-10-10 上海华岭集成电路技术股份有限公司 Test method and device for tag chip without clock circuit
CN102721917B (en) * 2012-07-09 2014-08-13 上海华岭集成电路技术股份有限公司 Test method and device for tag chip without clock circuit
CN105954690A (en) * 2016-06-13 2016-09-21 公安部第研究所 Magnetic field intensity metering method for energy testing simulation card
CN108828430A (en) * 2018-06-01 2018-11-16 北京智芯微电子科技有限公司 The mostly same test macro and method for surveying reliability of ultra-high frequency RFID label chip
CN108828430B (en) * 2018-06-01 2020-09-11 北京智芯微电子科技有限公司 System and method for testing multi-simultaneous-test reliability of ultrahigh frequency RFID (radio frequency identification) tag chip

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Application publication date: 20110105