CN108698813B - Mems器件及电子设备 - Google Patents

Mems器件及电子设备 Download PDF

Info

Publication number
CN108698813B
CN108698813B CN201680078846.4A CN201680078846A CN108698813B CN 108698813 B CN108698813 B CN 108698813B CN 201680078846 A CN201680078846 A CN 201680078846A CN 108698813 B CN108698813 B CN 108698813B
Authority
CN
China
Prior art keywords
mems device
micro
light emitting
emitting diode
movable component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201680078846.4A
Other languages
English (en)
Chinese (zh)
Other versions
CN108698813A (zh
Inventor
邹泉波
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Goertek Inc
Original Assignee
Goertek Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Goertek Inc filed Critical Goertek Inc
Publication of CN108698813A publication Critical patent/CN108698813A/zh
Application granted granted Critical
Publication of CN108698813B publication Critical patent/CN108698813B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P15/093Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by photoelectric pick-up
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81BMICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B5/00Devices comprising elements which are movable in relation to each other, e.g. comprising slidable or rotatable elements
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81CPROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C1/00Manufacture or treatment of devices or systems in or on a substrate
    • B81C1/00015Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
    • B81C1/00134Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems comprising flexible or deformable structures
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81CPROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C1/00Manufacture or treatment of devices or systems in or on a substrate
    • B81C1/00015Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
    • B81C1/00261Processes for packaging MEMS devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P3/00Measuring linear or angular speed; Measuring differences of linear or angular speeds
    • G01P3/36Devices characterised by the use of optical means, e.g. using infrared, visible, or ultraviolet light

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Micromachines (AREA)
  • Mechanical Light Control Or Optical Switches (AREA)
CN201680078846.4A 2016-06-02 2016-06-02 Mems器件及电子设备 Active CN108698813B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CN2016/084544 WO2017206149A1 (fr) 2016-06-02 2016-06-02 Dispositif mems et appareil électronique

Publications (2)

Publication Number Publication Date
CN108698813A CN108698813A (zh) 2018-10-23
CN108698813B true CN108698813B (zh) 2023-01-20

Family

ID=60478314

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201680078846.4A Active CN108698813B (zh) 2016-06-02 2016-06-02 Mems器件及电子设备

Country Status (3)

Country Link
US (1) US11262376B2 (fr)
CN (1) CN108698813B (fr)
WO (1) WO2017206149A1 (fr)

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5689107A (en) * 1995-09-01 1997-11-18 Hughes Aircraft Company Displacement-based opto-electronic accelerometer and pressure sensor
WO2000071981A1 (fr) * 1999-05-19 2000-11-30 Ramot University Authority For Applied Research & Industrial Development Ltd. Capteurs de deplacements et actionneurs micro-usines
CN1740753A (zh) * 2004-08-26 2006-03-01 约翰尼斯海登海恩博士股份有限公司 用于光学编码器的检测器阵列
CN2844881Y (zh) * 2005-03-15 2006-12-06 陆轻锂 高灵敏度振动检测器
CN101533740A (zh) * 2007-12-20 2009-09-16 通用电气公司 具有导电机械停止器的mems微开关
CN101971028A (zh) * 2007-10-22 2011-02-09 高等科研理事会 检测样品中选定类型的分子的方法和系统
CN102130109A (zh) * 2009-12-21 2011-07-20 Lg伊诺特有限公司 发光器件和使用发光器件的灯单元
CN104054167A (zh) * 2011-11-18 2014-09-17 勒克斯维科技公司 微器件传送头
CN104851753A (zh) * 2014-02-18 2015-08-19 亚德诺半导体集团 具有恒定电容的mems器件
CN105493298A (zh) * 2015-07-14 2016-04-13 歌尔声学股份有限公司 微发光二极管的转移方法、制造方法、装置和电子设备

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6494095B1 (en) * 2000-03-28 2002-12-17 Opticnet, Inc. Micro electromechanical switch for detecting acceleration or decelaration
KR100815440B1 (ko) 2006-07-28 2008-03-20 주식회사 나노브릭 마이크로-전자기계 시스템 기반의 광 프로젝션 엔진과 그제조 방법
US7990539B2 (en) * 2008-01-03 2011-08-02 Chian Chiu Li Sensor and method utilizing multiple optical interferometers
US8794501B2 (en) * 2011-11-18 2014-08-05 LuxVue Technology Corporation Method of transferring a light emitting diode
US8791530B2 (en) 2012-09-06 2014-07-29 LuxVue Technology Corporation Compliant micro device transfer head with integrated electrode leads
US9391042B2 (en) 2012-12-14 2016-07-12 Apple Inc. Micro device transfer system with pivot mount
US9087764B2 (en) 2013-07-26 2015-07-21 LuxVue Technology Corporation Adhesive wafer bonding with controlled thickness variation
FR3021309A1 (fr) * 2014-05-26 2015-11-27 Commissariat Energie Atomique Dispositif microelectronique et/ou nanoelectronique capacitif a compacite augmentee
US20160140685A1 (en) * 2014-11-17 2016-05-19 Pixtronix, Inc. Display including sensors
US10553540B2 (en) * 2015-08-20 2020-02-04 Apple Inc. Fabric-based items with electrical component arrays

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5689107A (en) * 1995-09-01 1997-11-18 Hughes Aircraft Company Displacement-based opto-electronic accelerometer and pressure sensor
WO2000071981A1 (fr) * 1999-05-19 2000-11-30 Ramot University Authority For Applied Research & Industrial Development Ltd. Capteurs de deplacements et actionneurs micro-usines
CN1740753A (zh) * 2004-08-26 2006-03-01 约翰尼斯海登海恩博士股份有限公司 用于光学编码器的检测器阵列
CN2844881Y (zh) * 2005-03-15 2006-12-06 陆轻锂 高灵敏度振动检测器
CN101971028A (zh) * 2007-10-22 2011-02-09 高等科研理事会 检测样品中选定类型的分子的方法和系统
CN101533740A (zh) * 2007-12-20 2009-09-16 通用电气公司 具有导电机械停止器的mems微开关
CN102130109A (zh) * 2009-12-21 2011-07-20 Lg伊诺特有限公司 发光器件和使用发光器件的灯单元
CN104054167A (zh) * 2011-11-18 2014-09-17 勒克斯维科技公司 微器件传送头
CN104851753A (zh) * 2014-02-18 2015-08-19 亚德诺半导体集团 具有恒定电容的mems器件
CN105493298A (zh) * 2015-07-14 2016-04-13 歌尔声学股份有限公司 微发光二极管的转移方法、制造方法、装置和电子设备

Also Published As

Publication number Publication date
US20190079110A1 (en) 2019-03-14
CN108698813A (zh) 2018-10-23
US11262376B2 (en) 2022-03-01
WO2017206149A1 (fr) 2017-12-07

Similar Documents

Publication Publication Date Title
US7355720B1 (en) Optical displacement sensor
CN101788569B (zh) 一种光纤加速度传感器探头及加速度传感器系统
US10126321B2 (en) Micro-opto-electromechanical systems (MOEMS) device
CN105431676B (zh) 机动车前灯
US11181734B2 (en) Micromachined mirror assembly having micro mirror array and hybrid driving method thereof
US20080095531A1 (en) Device and method for inspecting optical modulator
EP2663842B1 (fr) Modèle de capteur mems/moems
EP2887026A2 (fr) Module de capteur optique souple
EP2863190A2 (fr) Module de capteur optique
Hofmann et al. Wafer-level vacuum packaged resonant micro-scanning mirrors for compact laser projection displays
CN107555395A (zh) 光电位置传感芯片与电热微镜键合的一体化器件
US11340131B2 (en) Multi-hole probe pressure sensors
CN108698813B (zh) Mems器件及电子设备
EP1056076A3 (fr) Dispositif à micromiroir et système de tête optique
Wang et al. Development of 1× 4 MEMS-based optical switch
Rombach et al. Low power closed-loop driving circuit for piezoelectric microscanners based on tuneable capacitive position sensors
Zandi et al. VOA-based optical MEMS accelerometer
JP2017116531A (ja) 薄膜光センシングネットワークを用いた触覚センシングシステム及び方法
US20150323379A1 (en) Optical Inertial Sensing Module
CA1334630C (fr) Dispositif de mesure
US20150033866A1 (en) Optical Sensor
Cheng et al. An integrated optoelectronic position sensor for MEMS scanning mirrors
CN113167672B (zh) 用于检测动态压力变化的集成光学传感器和方法
Teo et al. Highly sensitive optical motion detector
Erarslan et al. MEMS sensor array platform integrated with CMOS based optical readout

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant