CN108693489A - A kind of magnetic field temperature dual sampling device based on photonic crystal - Google Patents
A kind of magnetic field temperature dual sampling device based on photonic crystal Download PDFInfo
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- CN108693489A CN108693489A CN201810320487.XA CN201810320487A CN108693489A CN 108693489 A CN108693489 A CN 108693489A CN 201810320487 A CN201810320487 A CN 201810320487A CN 108693489 A CN108693489 A CN 108693489A
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- layer
- refractive index
- magnetic field
- dielectric layer
- sampling device
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/032—Measuring direction or magnitude of magnetic fields or magnetic flux using magneto-optic devices, e.g. Faraday or Cotton-Mouton effect
- G01R33/0325—Measuring direction or magnitude of magnetic fields or magnetic flux using magneto-optic devices, e.g. Faraday or Cotton-Mouton effect using the Kerr effect
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
- G01K11/32—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in transmittance, scattering or luminescence in optical fibres
Abstract
The invention discloses a kind of magnetic field temperature dual sampling device based on photonic crystal includes One Dimension Periodic structure, defect layer and the metallic diaphragm formed by high refractive index medium layer and low refractive index dielectric layer;The defect layer is interspersed among One Dimension Periodic structure, and defect layer upper and lower surface is contacted with low refractive index dielectric layer;Metallic diaphragm is covered in high refractive index medium layer outer surface in outermost layer;The high refractive index medium layer is TiO2Layer, low refractive index dielectric layer are Al2O3Layer, defect layer are water base Fe3O4Magnetic fluid, metallic diaphragm are silver metal layer;Defect layer, high refractive index medium layer, low refractive index dielectric layer, metallic diaphragm are arranged along Z-direction, are put in order as (HL)5MF(LH)5-Ag.Temperature dual sampling device in magnetic field provided by the invention, high sensitivity, anti-interference, simple in structure, small, light weight can realize the measurement respectively of magnetic field and temperature.
Description
Technical field
It is brilliant to belong to optical sensing, photon for the present invention relates to a kind of magnetic field temperature dual sampling device based on photonic crystal
Body device arts.
Background technology
Sensor is a kind of detection device, can experience measured information, and the information that can will be experienced, by a set pattern
Rule is for conversion into the information output of photosignal or other required forms, to meet the transmission of information, processing, storage, display, note
The requirements such as record and control.
Photonic crystal is a kind of structure that the dielectric material by different refractivity is spatially formed at periodic distribution, and
And space periodic is in same magnitude with operation wavelength.There is the forbidden photon band of photon energy and frequency inside photonic crystal,
Photon in forbidden band region is prohibited to propagate.Defect mode is formed in photonic crystal filling magnetic fluid, magnetic fluid has uniqueness
Magneto-optic effect, while there is preferable temperature-sensing property, therefore there are good sensing characteristics.In photonic crystal defect structure
One side surface introduces metal, and metal and the electric field local of 1-D photon crystal interface enhance excited optics Tamm states, utilize
Defect state and both independent patterns of optics Tamm states are realized double parameters in magnetic field and temperature while being measured.
Invention content
Purpose:In order to overcome the deficiencies in the prior art, the present invention to provide a kind of magnetic field temperature based on photonic crystal
Spend dual sampling device.
Technical solution:In order to solve the above technical problems, the technical solution adopted by the present invention is:
A kind of magnetic field temperature dual sampling device based on photonic crystal, including by high refractive index medium layer and low-refraction
One Dimension Periodic structure, defect layer and the metallic diaphragm that dielectric layer is formed;The defect layer is interspersed in One Dimension Periodic structure
Between, defect layer upper and lower surface is contacted with low refractive index dielectric layer;Metallic diaphragm is covered in high refractive index in outermost layer
Dielectric layer outer surface.
Further, the defect layer, high refractive index medium layer, low refractive index dielectric layer, metallic diaphragm are arranged along Z-direction
Row, put in order as (HL)nMF(LH)nMetal, wherein H are high refractive index dielectric layer, and L is low-refraction dielectric layer, MF
For defect layer, n is the number of plies of high refractive index medium layer and low refractive index dielectric layer.
Further, n is equal to 5, i.e., respectively has five floor height index dielectric layers to be situated between with low-refraction above and below defect layer
The overlapping fitting of matter layer.
Further, the high refractive index medium layer is TiO2Layer, low refractive index dielectric layer are Al2O3Layer, high refractive index are situated between
Matter layer and the optical thickness of low refractive index dielectric layer are λ0/4。
Further, the defect layer is water base Fe3O4Magnetic fluid, optical thickness λ0/2。
Further, the metallic diaphragm is silver metal layer, thickness 60nm.
Advantageous effect:Temperature dual sampling device in magnetic field provided by the invention, high sensitivity, anti-interference, simple in structure, body
The small, light weight of product, can realize the measurement respectively of magnetic field and temperature.It is lacked by being introduced in the periodic structure of 1-D photon crystal
Sunken layer introduces metal to change bandgap structure in a side surface, utilizes the electric field of metal and 1-D photon crystal interface
Local enhances laser optics Tamm states, is measured while realizing magnetic field and temperature.By adjusting 1-D photon crystal periodicity,
The thickness of defect layer and metallic diaphragm changes the output spectrum structure of 1-D photon crystal dual sampling device, to make sensing
Device obtains higher detection sensitivity.
Description of the drawings
Fig. 1 is the structural diagram of the present invention;
Fig. 2 is the light of wideband light source output by Polarization Controller, single mode conical fiber, sensor probe, multimode fibre
It is ultimately incident upon the reflection spectrogram obtained in spectrometer;
Fig. 3 a be temperature fix, the corresponding reflection spectrograms of reflection peak d1 under the conditions of different magnetic field;
Fig. 3 b be temperature fix, the corresponding reflection spectrograms of reflection peak d2 under the conditions of different magnetic field;
Fig. 4 a be magnetic field fix, the corresponding reflection spectrograms of reflection peak d1 under condition of different temperatures;
Fig. 4 b be magnetic field fix, the corresponding reflection spectrograms of reflection peak d2 under condition of different temperatures.
Specific implementation mode
The present invention is further described below in conjunction with the accompanying drawings.
As shown in Figure 1, a kind of magnetic field temperature dual sampling device based on photonic crystal, including by high refractive index medium layer
1 One Dimension Periodic structure, defect layer 3 and the metallic diaphragm 4 formed with low refractive index dielectric layer 2;The defect layer 3 is interspersed in
Among One Dimension Periodic structure, 3 upper and lower surface of defect layer is contacted with low refractive index dielectric layer 2;Metallic diaphragm 4 is most
Outer layer is covered in 1 outer surface of high refractive index medium layer.
The defect layer 3, high refractive index medium layer 1, low refractive index dielectric layer 2, metallic diaphragm 4 are arranged along Z-direction, row
Row sequence is (HL)nMF(LH)nMetal, wherein H are high refractive index dielectric layer, and L is low-refraction dielectric layer, and MF is defect
Layer, n are the number of plies of high refractive index medium layer and low refractive index dielectric layer.N=5 in the present embodiment, i.e., above and below defect layer
Respectively there are five floor height index dielectric layers to overlap with low refractive index dielectric layer to be bonded.
The high refractive index medium layer 1 is TiO2Layer, low refractive index dielectric layer 2 are Al2O3Layer, high refractive index medium layer with
The optical thickness of low refractive index dielectric layer is λ0/4。
The defect layer 3 is water base Fe3O4Magnetic fluid, optical thickness λ0/2。
The metallic diaphragm 4 is silver metal layer, thickness 60nm.
Magnetic field temperature dual sampling device provided by the invention based on photonic crystal, measurement process are as follows:
1-D photon crystal dual sampling device is placed in magnetic field, temperature an environment to be measured;In the optical path, wide
Light with light source output becomes linearly polarized light by Polarization Controller, and linearly polarized light enters sensing by single mode conical fiber and visits
In head, outgoing light wave is incident on by multimode fibre in spectrometer, two reflection peaks d1, d2 is can see from spectrometer, such as
Shown in Fig. 2, then the data of spectrometer collection are compared and analyzed using computer, to obtain magnetic field to be measured in environment
And temperature.
Measuring principle:The variation of external magnetic field or temperature can cause the change of magnetic fluid refractive index, cause to export light reflection
The change of spectrum;Under the defect state of metal excitation and the mixing sensor mechanism of optics Tamm states, magnetic field and Temperature cross-over sensitivity quilt
It eliminates, generates two reflectance spectrums;When external magnetic field or temperature change, the drift of reflection peak can be observed in reflectance spectrum, profit
The data of spectrometer collection are compared and analyzed with computer, finally realizes and is measured while magnetic field and temperature.
Data analysing method:By comsol structure simulations, first fixed temperature, change magnetic field, with the variation in magnetic field,
The centre wavelength of reflection peak can drift about, as shown in Figure 3a and Figure 3b shows, to extrapolate the centre wavelength of reflection peak with magnetic field
Variation relation;Fixed magnetic field changes temperature, and likewise as the variation of temperature, the centre wavelength of reflection peak can also occur centainly
Drift, as shown in figures 4 a and 4b, to extrapolate reflection peak center wavelength with temperature variation relation;According to reflection peak
Centre wavelength and the variation relation in temperature, magnetic field establish corresponding data model by linear fit.When actually measuring, obtain
To reflection spectrogram shown in Fig. 2 data model is substituted into so as to obtain the centre wavelength of reflection peak, you can calculate and survey instantly
Measure the corresponding temperature of environment and magnetic field.
The above is only a preferred embodiment of the present invention, it should be pointed out that:For the ordinary skill people of the art
For member, various improvements and modifications may be made without departing from the principle of the present invention, these improvements and modifications are also answered
It is considered as protection scope of the present invention.
Claims (6)
1. a kind of magnetic field temperature dual sampling device based on photonic crystal, it is characterised in that:Including by high refractive index medium layer
One Dimension Periodic structure, defect layer and the metallic diaphragm formed with low refractive index dielectric layer;The defect layer is interspersed in one-dimensional week
Among phase property structure, defect layer upper and lower surface is contacted with low refractive index dielectric layer;Metallic diaphragm is in outermost layer, covering
In high refractive index medium layer outer surface.
2. the magnetic field temperature dual sampling device according to claim 1 based on photonic crystal, it is characterised in that:It is described to lack
It falls into layer, high refractive index medium layer, low refractive index dielectric layer, metallic diaphragm to arrange along Z-direction, put in order as (HL)nMF
(LH)nMetal, wherein H are high refractive index dielectric layer, and L is low-refraction dielectric layer, and MF is defect layer, and n is high refractive index
The number of plies of dielectric layer and low refractive index dielectric layer.
3. the magnetic field temperature dual sampling device according to claim 2 based on photonic crystal, it is characterised in that:N is equal to
5, i.e., respectively there are five floor height index dielectric layers to be overlapped with low refractive index dielectric layer above and below defect layer and is bonded.
4. the magnetic field temperature dual sampling device according to any one of claims 1 to 3 based on photonic crystal, feature exist
In:The high refractive index medium layer is TiO2Layer, low refractive index dielectric layer are Al2O3Layer, high refractive index medium layer and low-refraction
The optical thickness of dielectric layer is λ0/4。
5. the magnetic field temperature dual sampling device according to claim 1 based on photonic crystal, it is characterised in that:It is described to lack
It is water base Fe to fall into layer3O4Magnetic fluid, optical thickness λ0/2。
6. the magnetic field temperature dual sampling device according to claim 1 based on photonic crystal, it is characterised in that:The gold
Category film layer is silver metal layer, thickness 60nm.
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| CN201810320487.XA CN108693489A (en) | 2018-04-11 | 2018-04-11 | A kind of magnetic field temperature dual sampling device based on photonic crystal |
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| CN201810320487.XA CN108693489A (en) | 2018-04-11 | 2018-04-11 | A kind of magnetic field temperature dual sampling device based on photonic crystal |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110618322A (en) * | 2019-09-29 | 2019-12-27 | 南京邮电大学 | Electromagnetic cascade sensor based on two-dimensional photonic crystal |
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| CN103196488A (en) * | 2013-03-12 | 2013-07-10 | 东北大学 | Photonic crystal fiber grating sensing method for detecting magnetic field and temperature simultaneously |
| CN103616046A (en) * | 2013-11-26 | 2014-03-05 | 沈阳工程学院 | Method for detecting temperature and magnetic field simultaneously based on magnetofluid-filled crystal fiber loop mirror |
| CN104075754A (en) * | 2014-06-27 | 2014-10-01 | 东北大学 | Magnetic field and temperature simultaneous measurement method based on photonic crystal micro-cavities filled with magnetic fluid |
| CN104280152A (en) * | 2014-09-03 | 2015-01-14 | 上海大学 | Dynamic tuning type temperature sensor |
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2018
- 2018-04-11 CN CN201810320487.XA patent/CN108693489A/en active Pending
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|---|---|---|---|---|
| CN103196488A (en) * | 2013-03-12 | 2013-07-10 | 东北大学 | Photonic crystal fiber grating sensing method for detecting magnetic field and temperature simultaneously |
| CN103616046A (en) * | 2013-11-26 | 2014-03-05 | 沈阳工程学院 | Method for detecting temperature and magnetic field simultaneously based on magnetofluid-filled crystal fiber loop mirror |
| CN104075754A (en) * | 2014-06-27 | 2014-10-01 | 东北大学 | Magnetic field and temperature simultaneous measurement method based on photonic crystal micro-cavities filled with magnetic fluid |
| CN104280152A (en) * | 2014-09-03 | 2015-01-14 | 上海大学 | Dynamic tuning type temperature sensor |
Non-Patent Citations (4)
| Title |
|---|
| P. S. PANKIN 等: ""hybrid states formed by the optical tamm and defect modes in a one-dimensional photonic crystal"", 《2016 PROGRESS IN ELECTROMAGNETIC RESEARCH SYMPOSIUM (PIERS)》 * |
| 成心怡: ""光学Tamm态的理论与应用研究"", 《中国优秀硕士学位论文全文数据库 基础科学辑》 * |
| 董晶: ""基于光学Tamm态耦合的光子晶体传感特性研究"", 《中国优秀硕士学位论文全文数据库 信息科技辑》 * |
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| CN110618322A (en) * | 2019-09-29 | 2019-12-27 | 南京邮电大学 | Electromagnetic cascade sensor based on two-dimensional photonic crystal |
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