CN108648672B - Probe module and lighting test system - Google Patents
Probe module and lighting test system Download PDFInfo
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- CN108648672B CN108648672B CN201810718981.1A CN201810718981A CN108648672B CN 108648672 B CN108648672 B CN 108648672B CN 201810718981 A CN201810718981 A CN 201810718981A CN 108648672 B CN108648672 B CN 108648672B
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Abstract
The utility model provides a probe module and test system of lighting a lamp relates to panel test field. The probe module of this disclosure includes: a plurality of probes; a plurality of first lines respectively connected to the probes; the second lines are connected with the lighting signal source and are arranged in one-to-one correspondence with the first lines; the resistance measuring unit is used for measuring the resistance among the first lines when the resistance measuring unit is communicated with the first lines; the control unit is connected with the first lines, the second lines and the resistance measuring unit and used for controlling the resistance measuring unit to be communicated with the plurality of first lines when the probe is connected with the contact of the display panel and controlling the plurality of second lines to be correspondingly communicated with the plurality of first lines when the resistance between the first lines meets a preset condition. The present disclosure can prevent damage to the probe or the display panel line due to a short circuit phenomenon.
Description
Technical Field
The disclosure relates to the technical field of panel testing, in particular to a probe module and a lighting test system comprising the probe module.
Background
With the development of optical technology and semiconductor technology, flat panel displays represented by liquid crystal display panels and organic light emitting diode display panels have been widely used in the display field.
In the manufacturing process of flat panel displays, a plurality of inspection processes are usually performed to check for defects in the process in time. Taking a liquid crystal display panel as an example, a lighting test is required after the display panel is formed into a box. During the lighting test, each Data (Data) signal and Gate (Gate) signal need to be transmitted to each corresponding contact (Pad) on the display panel through the lighting test system. During detection of the lighting test device, probes in a probe module (Block) in the lighting test system can be abutted against corresponding contacts on the display panel, so that transmission of a lighting signal from a conducting wire to the display panel is realized.
However, since the internal wiring of the probe module and the display panel is precise, when a short circuit occurs during the lighting test, the probe module or the display panel may be damaged, which may reduce the service life of the probe module or cause poor electrical properties of the display panel.
It is to be noted that the information disclosed in the above background section is only for enhancement of understanding of the background of the present disclosure, and thus may include information that does not constitute prior art known to those of ordinary skill in the art.
Disclosure of Invention
The invention aims to provide a probe module and a lighting test system comprising the same, so that the problem of device damage caused by line short circuit in the lighting test process is solved at least to a certain extent.
According to an aspect of the present disclosure, there is provided a probe module including:
a plurality of probes;
a plurality of first lines respectively connected to the probes;
the second lines are connected with the lighting signal source and are arranged in one-to-one correspondence with the first lines;
the resistance measuring unit is used for measuring the resistance among the first lines when the resistance measuring unit is communicated with the first lines;
the control unit is connected with the first lines, the second lines and the resistance measuring unit and used for controlling the resistance measuring unit to be communicated with the plurality of first lines when the probe is connected with the contact of the display panel and controlling the plurality of second lines to be correspondingly communicated with the plurality of first lines when the resistance between the first lines meets a preset condition.
In an exemplary embodiment of the present disclosure, the resistance measuring unit is configured to measure a resistance between any two adjacent first lines when communicating with the plurality of first lines.
In an exemplary embodiment of the disclosure, the preset condition is that the resistance between any two adjacent first lines is greater than a preset resistance.
In an exemplary embodiment of the present disclosure, the probe module further includes:
the switching device comprises a control end, a first end, a second end and a third end; the control end of the switching device is connected with the control unit, the first end of the switching device is connected with the first lines, the second end of the switching device is connected with the second lines, and the third end of the switching device is connected with the resistance measuring unit.
In an exemplary embodiment of the disclosure, the control unit is further connected to the lighting signal source, and configured to trigger the lighting signal source to output the lighting signal when the probe is connected to the contact of the display panel.
In an exemplary embodiment of the present disclosure, the probe module further includes:
and the time delay circuit is connected with the plurality of second lines and is used for delaying the lighting signal output by the lighting signal source.
In an exemplary embodiment of the disclosure, the control unit is further connected to the lighting signal source, and configured to trigger the lighting signal source to output the lighting signal when a resistance between the first lines satisfies a preset condition.
In an exemplary embodiment of the present disclosure, the probe module further includes:
and the pressure sensing unit is connected with the probe and the control unit and is used for outputting a pressure sensing signal to the control unit when the probe is abutted against the contact.
In an exemplary embodiment of the present disclosure, the probe module further includes:
and the alarm unit is connected with the control unit and used for generating an alarm signal when the control unit judges that the resistance between the first lines does not meet the preset condition.
According to an aspect of the present disclosure, there is provided a lighting test system comprising at least one probe module as described in any one of the above.
In the probe module and the lighting test system in the exemplary embodiment of the disclosure, the resistance measurement unit is arranged to measure the resistance between the first lines, and the control unit outputs the lighting signal to the display panel when judging that the resistance between the first lines meets the preset condition, namely when confirming that no short circuit phenomenon occurs; correspondingly, when the short circuit occurs, the lighting signal is not output to the display panel. Therefore, on one hand, based on the scheme in the exemplary embodiment of the disclosure, damage to the probe or the display panel circuit caused by a short circuit phenomenon can be avoided, and thus the service life of the probe module can be prolonged or poor electrical properties of the display panel can be reduced; on the other hand, the influence of the short circuit phenomenon on the display result is reduced, so that the accuracy and the detection efficiency of the lighting test can be improved, the production defects are reduced, the product defects are reduced, and the production cost is reduced.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the disclosure.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and together with the description, serve to explain the principles of the disclosure. It is to be understood that the drawings in the following description are merely exemplary of the disclosure, and that other drawings may be derived from those drawings by one of ordinary skill in the art without the exercise of inventive faculty.
Fig. 1 is a schematic structural diagram of a lighting test system in the related art.
Fig. 2 is a schematic structural diagram of an appearance of a probe module in the related art.
FIG. 3 is a schematic diagram of a probe module in an embodiment of the disclosure.
Fig. 4 is a schematic diagram of an internal structure of a probe module according to an embodiment of the present disclosure.
Fig. 5 is an external structural schematic diagram of a probe module according to an embodiment of the present disclosure.
Description of reference numerals:
110: a probe module substrate; 120: a connection operation member; 130: a probe module; 131: a probe; 132: an FPC layer; 133: a COF layer; 134: a drive circuit; 150: a display panel; 230: a probe module; 231: a probe; 232: a first line; 233: a second line; 234: lighting a signal source; 235: a resistance measuring unit; 236: a control unit; 237: a switching device; 238: a pressure sensing unit; 239: a delay circuit; 240: and an alarm unit.
Detailed Description
Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of example embodiments to those skilled in the art. The same reference numerals in the drawings denote the same or similar structures, and thus their detailed description will be omitted.
Although relative terms, such as "upper" and "lower," may be used in this specification to describe one element of an icon relative to another, these terms are used in this specification for convenience only, e.g., in accordance with the orientation of the examples described in the figures. It will be appreciated that if the device of the icon were turned upside down, the element described as "upper" would become the element "lower". When a structure is "on" another structure, it may mean that the structure is integrally formed with the other structure, or that the structure is "directly" disposed on the other structure, or that the structure is "indirectly" disposed on the other structure via another structure.
The terms "a," "an," "the," "said," and "at least one" are used to indicate the presence of one or more elements/components/parts/etc.; the terms "comprising" and "having" are intended to be inclusive and mean that there may be additional elements/components/etc. other than the listed elements/components/etc.; the terms "first," "second," and "third," etc. are used merely as labels, and are not limiting on the number of their objects.
Fig. 1 is a schematic structural diagram of a lighting test system in the related art. The lighting test system includes a Probe Unit Base 110(Probe Unit Base), a connection operation member 120 (MNP), and a Probe module 130 (Block). The connection operation member 120 is fixed to the probe module substrate 110, and the probe module 130 is connected to the connection operation member 120. During the lighting test, the probes in the probe module 130 collide with corresponding contacts on the display panel 150, and the lighting signal is transmitted to the display panel 150 from the conducting wire, so that the display panel 150 is lighted; moreover, the display screen can be changed by different lighting signals, and whether the display panel 150 is defective or not can be determined.
The structure of the probe module 130 is precise, and the appearance structure is as shown in fig. 2. The package structure includes an FPC (Flexible Printed Circuit) layer 132, a COF (Chip On Flex) layer 133, a driving Circuit 134, and a probe 131. Since the thickness and width of the probe 131 are relatively small, the contact and separation between the probe 131 and the contact points in each lighting test may damage the probe 131 to some extent, resulting in a short service life. If the probes 131 are not aligned with the contacts or a Particle is located between two lines of the display panel 150 during the lighting test, a short circuit may occur. If a short circuit occurs, a high current may be instantaneously generated to damage the probe 131 or the circuit of the display panel 150, thereby further reducing the service life of the probe module or causing poor electrical characteristics of the display panel 150.
Based on the foregoing, the present exemplary embodiment first provides a probe module. The probe module may include a plurality of probes, a plurality of first lines, a plurality of second lines, a resistance measurement unit, and a control unit. Wherein, a plurality of first lines are respectively correspondingly connected with the probes; the plurality of second lines are connected with the lighting signal source and are arranged in one-to-one correspondence with the first lines; the resistance measuring unit is used for measuring the resistance among the first lines when the resistance measuring unit is communicated with the first lines; the control unit is connected with the first circuit, the second circuit and the resistance measuring unit. The probe module is described in detail below with reference to fig. 3:
in the present exemplary embodiment, the number of the probes may be set according to specific requirements, for example, in fig. 3, 4 probes 231 are included as an example, but may also be 2, 3, 5, and so on. The number of the first lines 232 is the same as the number of the probes 231, and each probe 231 is correspondingly connected with one of the first lines 232. The number of the second lines 233 is the same as the number of the first lines 232, for example, the number of the first lines 232 and the number of the second lines 233 are both 4; moreover, the second lines 233 are arranged in one-to-one correspondence with the first lines 232, so that each subsequent second line 233 can be connected with one second line 233. Each of the second lines 233 is connected to the lighting signal source 234 to receive lighting signals such as a Data (Data) signal and a Gate (Gate) signal output from the lighting signal source 234. In this example embodiment, the first line 232 and the second line 233 may be both lines of a COF layer, but are not limited to this order.
The control unit 236 is connected to the first lines 232, the second lines 233 and the resistance measuring unit 235, and can be used to control the resistance measuring unit 235 to communicate with the plurality of first lines 232 when the probe 231 is connected to a contact of a display panel; the resistance measuring unit 235 may be configured to measure the resistance between the first lines 232 when the control unit 236 controls the communication with the first lines 232.
Further, the control unit 236 may be further configured to determine whether the resistance between the first lines 232 satisfies a preset condition, and determine that a short circuit phenomenon does not occur when the resistance between the first lines 232 is determined to satisfy the preset condition, so that the plurality of second lines 233 are controlled to be correspondingly communicated with the plurality of first lines 232, and the lighting signal output by the lighting signal source 234 may be transmitted to the display panel 150 through the second lines 233, the first lines 232, and the probe 231.
Accordingly, when the control unit 236 determines that the resistance between the first lines 232 does not satisfy the preset condition, it may be determined that a short circuit occurs, so that the plurality of second lines 233 and the plurality of first lines 232 are kept in a disconnected state, thereby preventing damage to the probes 231 or the lines of the display panel 150, further prolonging the service life of the probe module, or reducing electrical defects of the display panel 150.
Referring to fig. 4, a specific implementation architecture of the probe module in the exemplary embodiment is shown. As shown in fig. 4, the probe module may further include a switching device 237. The switching device 237 may include a control terminal, a first terminal, a second terminal, and a third terminal. A control terminal of the switching device 237 may be connected to the control unit 236, a first terminal of the switching device 237 is connected to the first lines 232, a second terminal of the switching device 237 is connected to the second lines 233, and a third terminal of the switching device 237 is connected to the resistance measuring unit 235. In this exemplary embodiment, the switch device 237 may be formed by one or more semiconductor switches, for example, the switch device 237 may be formed by one or more silicon controlled switches, field effect transistor switches, insulated gate bipolar transistors, and the like. Of course, in other exemplary embodiments of the present disclosure, the switching device 237 may have other components, and this is not particularly limited in this exemplary embodiment.
With continued reference to fig. 4, in order to timely know whether the probe 231 is connected to the contact 152 of the display panel 150, in this example embodiment, the probe module may further include a pressure sensing unit 238. The pressure sensing unit 238 is connected to the probe 231 and the control unit 236, for example, at the tail end of the probe 231, i.e., the end connected to the first line 232. The pressure sensing unit 238 may be configured to output a pressure sensing signal to the control unit 236 when the probe 231 abuts the contact. In the present exemplary embodiment, the pressure sensing unit 238 may be composed of a pressure sensitive element and a signal processing unit. The pressure-sensitive element may be, for example, a piezoresistive force sensor, a ceramic pressure sensor, a diffused silicon pressure sensor, a piezoelectric pressure sensor, or the like, which is not particularly limited in this exemplary embodiment.
In the present exemplary embodiment, the Control Unit 236 may be an ECU (Electronic Control Unit, Electronic Controller), an MCU (Micro Controller Unit, Micro Control Unit 236), or the like. The control unit 236, receiving the pressure sensing signal, may determine that the probe 231 is connected to the contact 152 of the display panel 150, and further may send a control signal to the control terminal of the switch device 237, control the connection between the first terminal and the third terminal of the switch device 237, and implement the connection between the resistance measuring unit 235 and the plurality of first lines 232. In the present exemplary embodiment, in order to reduce the measurement time, the resistance measurement unit may measure only the resistance between any two adjacent first lines 232; for example, for the four first lines L1, L2, L3, L4, only the resistance between L1 and L2, the resistance between L2 and L3, and the resistance between L3 and L4 may be measured. However, in other exemplary embodiments of the present disclosure, the resistance between any two of the first lines 232 may also be measured, for example, the resistance between L1 and L2, the resistance between L1 and L3, the resistance between L1 and L4, the resistance between L2 and L3, the resistance between L2 and L4, and the resistance between L3 and L4 are all measured; this is not particularly limited in the present exemplary embodiment. The resistance measuring unit may be a device that directly outputs a resistance value, such as a micro resistance meter or an integrated micro resistance measuring instrument, or may be a device that indirectly measures a resistance value, such as an ammeter, and this is not particularly limited in this exemplary embodiment.
After the control unit receives the resistance between the first lines 232 collected by the resistance measuring unit 235, it may be determined whether the resistance between the first lines 232 satisfies a preset condition. In the present exemplary embodiment, the preset condition may be, for example, that the resistance between the first lines 232 is greater than a preset resistance; the preset resistance may be determined according to a resistance when no short circuit occurs, for example, 1000 ohms, 2000 ohms, or the like. In other exemplary embodiments of the present disclosure, the preset condition may also be that the resistances between any two first lines 232 are the same value, and the like, which is not particularly limited in this exemplary embodiment.
When determining that the resistance between the first lines 232 meets the preset condition, the control unit 236 determines that the short circuit phenomenon does not occur, and may send a control signal to the control end of the switch device 237, control the connection between the first end and the second end of the switch device 237, and correspondingly communicate the second line 233 with the first line 232. Further, in the present exemplary embodiment, the control unit 236 may be connected to the lighting signal source 234, and further control a timing at which the lighting signal source 234 outputs the lighting signal. For example:
in an exemplary embodiment, the control unit 236 may trigger the lighting signal source 234 to output the lighting signal when the resistance between the first lines 232 is determined to satisfy a preset condition, that is, when it is determined that the short circuit phenomenon does not occur, which does not require excessive circuit improvement and has a simple structure.
In another exemplary embodiment, the control unit 236 may also trigger the lighting signal source 234 to output the lighting signal when the probe 231 is determined to be connected to the contact of the display panel. Meanwhile, in order to ensure the timing sequence of the lighting signal, the probe module may further include a delay circuit 239; the delay circuit 239 is connected to the second lines 233, and is configured to delay the lighting signal output by the lighting signal source 234. The time of the delay should be longer than the time of the resistance measuring unit and the control unit 236 for short circuit judgment. The scheme can control the output time of the spot light signal more accurately.
After the lighting signal outputted from the lighting signal source 234 is transmitted to the display panel 150 through the second line 233, the first line 232 and the probe 231, a lighting test can be performed according to the actual display effect of the display panel 150.
Further, as shown in fig. 4, when the conductive particles 153 exist between the two lines 150 of the display panel 150, a short circuit phenomenon may occur. Accordingly, when the control unit 236 determines that the resistance between the first lines 232 does not satisfy the preset condition, it may be determined that a short circuit occurs, so that the plurality of second lines 233 and the plurality of first lines 232 are kept in a disconnected state, thereby preventing damage to the probes 231 or the lines of the display panel 150, further prolonging the service life of the probe module, or reducing electrical defects of the display panel 150.
Meanwhile, in order to prompt a short circuit to a tester or an upper computer, in this example embodiment, the probe module may further include an alarm unit 240. The alarm unit 240 is connected to the control unit 236, and may be configured to generate an alarm signal when the control unit 236 determines that the resistance between the first lines 232 does not satisfy the preset condition. The alarm unit 240 may be an alarm that emits a sound signal, an optical signal, or an electrical signal, or may be a software module that sends an error prompt message to the upper computer, which is not particularly limited in this exemplary embodiment.
Referring to fig. 5, an external structural view of the probe module 230 in fig. 4 after packaging is shown. In contrast to fig. 2, the probe module 230 in the present exemplary embodiment is externally provided with a resistance measuring unit 235, such as a micro resistance meter or the like. It will be readily appreciated that the resistance measuring unit 235 may alternatively be housed within the probe module 230, and remain within the scope of this disclosure.
In addition, in the present exemplary embodiment, there is also provided a lighting test system which can be used for lighting test of displays such as a liquid crystal display panel and an organic light emitting diode display panel. The lighting test system comprises one or more probe modules in the above exemplary embodiments; in addition, similar to fig. 1, the lighting test system may further include other parts such as the probe module substrate 110 and the connection operation member 120, which are not described herein again.
In the probe module and the lighting test system in the present exemplary embodiment, the resistance measurement unit is provided to measure the resistance between the first lines, and the control unit outputs the lighting signal to the display panel when determining that the resistance between the first lines satisfies the preset condition, that is, when it is determined that no short-circuit phenomenon occurs; correspondingly, when the short circuit occurs, the lighting signal is not output to the display panel. Therefore, on one hand, based on the scheme in the exemplary embodiment of the disclosure, damage to the probe or the display panel circuit caused by a short circuit phenomenon can be avoided, and thus the service life of the probe module can be prolonged or poor electrical properties of the display panel can be reduced; on the other hand, the influence of the short circuit phenomenon on the display result is reduced, so that the accuracy and the detection efficiency of the lighting test can be improved, the defects of products are reduced, and the production cost is reduced.
Other embodiments of the disclosure will be apparent to those skilled in the art from consideration of the specification and practice of the disclosure disclosed herein. This application is intended to cover any variations, uses, or adaptations of the disclosure following, in general, the principles of the disclosure and including such departures from the present disclosure as come within known or customary practice within the art to which the disclosure pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the disclosure being indicated by the following claims.
Claims (9)
1. A probe module, comprising:
a plurality of probes;
a plurality of first lines respectively connected to the probes;
the second lines are connected with the lighting signal source and are arranged in one-to-one correspondence with the first lines;
the resistance measuring unit is used for measuring the resistance among the first lines when the resistance measuring unit is communicated with the first lines;
the switching device comprises a control end, a first end, a second end and a third end; the first end of the switch device is connected with the plurality of first lines, the second end of the switch device is connected with the plurality of second lines, and the third end of the switch device is connected with the resistance measuring unit;
the control unit is connected with the control end of the switching device; the control end is used for sending a control signal to the switching device when the probe is connected with the contact of the display panel, and controlling the first end and the third end of the switching device to be communicated so as to realize the communication between the resistance measuring unit and the plurality of first lines; and the control end is used for sending a control signal to the control end of the switch device when the resistance between the first lines meets a preset condition, and controlling the first end and the second end of the switch device to be communicated so as to realize the corresponding communication of the plurality of second lines and the plurality of first lines.
2. The probe module according to claim 1, wherein the resistance measuring unit is configured to measure the resistance between any two adjacent first lines when communicating with the plurality of first lines.
3. The probe module of claim 1, wherein the predetermined condition is that the resistance between any two adjacent first lines is greater than a predetermined resistance.
4. The probe module according to claim 1, wherein the control unit is further connected to the lighting signal source for triggering the lighting signal source to output the lighting signal when the probe is connected to the contact of the display panel.
5. The probe module of claim 4, further comprising:
and the time delay circuit is connected with the plurality of second lines and is used for delaying the lighting signal output by the lighting signal source.
6. The probe module according to claim 1, wherein the control unit is further connected to the lighting signal source, and configured to trigger the lighting signal source to output the lighting signal when the resistance between the first lines satisfies a preset condition.
7. The probe module of claim 1, further comprising:
and the pressure sensing unit is connected with the probe and the control unit and is used for outputting a pressure sensing signal to the control unit when the probe is abutted against the contact.
8. The probe module of claim 1, further comprising:
and the alarm unit is connected with the control unit and used for generating an alarm signal when the control unit judges that the resistance between the first lines does not meet the preset condition.
9. A lighting test system comprising at least one probe module according to any one of claims 1 to 8.
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104865493A (en) * | 2015-06-11 | 2015-08-26 | 武汉精测电子技术股份有限公司 | CELL panel open-short circuit detection device and method |
| CN106933426A (en) * | 2017-05-09 | 2017-07-07 | 京东方科技集团股份有限公司 | A kind of touch-control display panel, its method of testing and display device |
| CN206961492U (en) * | 2017-04-25 | 2018-02-02 | 南京创维信息技术研究院有限公司 | Tool is searched in one kind electric leakage |
| CN108053782A (en) * | 2017-12-08 | 2018-05-18 | 京东方科技集团股份有限公司 | A kind of display panel test method and signal generator |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101174038B (en) * | 2006-11-01 | 2010-05-26 | 群康科技(深圳)有限公司 | LCD device |
| CN101847357A (en) * | 2009-03-23 | 2010-09-29 | 友达光电股份有限公司 | Display panel, display device and test method thereof |
| CN101958093A (en) * | 2009-07-17 | 2011-01-26 | 友达光电(厦门)有限公司 | Testing device and testing method for display panel |
| TWI470332B (en) * | 2012-06-29 | 2015-01-21 | Au Optronics Corp | Display panel and method for inspecting thereof |
| JP2015049435A (en) * | 2013-09-03 | 2015-03-16 | 株式会社ジャパンディスプレイ | Driver ic, display device and inspection system of the same |
-
2018
- 2018-07-03 CN CN201810718981.1A patent/CN108648672B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104865493A (en) * | 2015-06-11 | 2015-08-26 | 武汉精测电子技术股份有限公司 | CELL panel open-short circuit detection device and method |
| CN206961492U (en) * | 2017-04-25 | 2018-02-02 | 南京创维信息技术研究院有限公司 | Tool is searched in one kind electric leakage |
| CN106933426A (en) * | 2017-05-09 | 2017-07-07 | 京东方科技集团股份有限公司 | A kind of touch-control display panel, its method of testing and display device |
| CN108053782A (en) * | 2017-12-08 | 2018-05-18 | 京东方科技集团股份有限公司 | A kind of display panel test method and signal generator |
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