CN108573508A - 信息处理装置、信息处理方法和存储介质 - Google Patents

信息处理装置、信息处理方法和存储介质 Download PDF

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Publication number
CN108573508A
CN108573508A CN201810188718.6A CN201810188718A CN108573508A CN 108573508 A CN108573508 A CN 108573508A CN 201810188718 A CN201810188718 A CN 201810188718A CN 108573508 A CN108573508 A CN 108573508A
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CN
China
Prior art keywords
information
reflected light
illumination light
light
information processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201810188718.6A
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English (en)
Chinese (zh)
Inventor
古贺悠修
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Publication of CN108573508A publication Critical patent/CN108573508A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/90—Determination of colour characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4204—Photometry, e.g. photographic exposure meter using electric radiation detectors with determination of ambient light
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H04N23/71—Circuitry for evaluating the brightness variation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0297—Constructional arrangements for removing other types of optical noise or for performing calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H04N23/76—Circuitry for compensating brightness variation in the scene by influencing the image signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4266—Photometry, e.g. photographic exposure meter using electric radiation detectors for measuring solar light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J2003/2866—Markers; Calibrating of scan
    • G01J2003/2869—Background correcting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J2003/425—Reflectance

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Sustainable Development (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Signal Processing (AREA)
  • Multimedia (AREA)
  • Quality & Reliability (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Image Processing (AREA)
CN201810188718.6A 2017-03-13 2018-03-08 信息处理装置、信息处理方法和存储介质 Pending CN108573508A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017-047327 2017-03-13
JP2017047327A JP2018151832A (ja) 2017-03-13 2017-03-13 情報処理装置、情報処理方法、および、プログラム

Publications (1)

Publication Number Publication Date
CN108573508A true CN108573508A (zh) 2018-09-25

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CN201810188718.6A Pending CN108573508A (zh) 2017-03-13 2018-03-08 信息处理装置、信息处理方法和存储介质

Country Status (3)

Country Link
US (1) US11039076B2 (https=)
JP (1) JP2018151832A (https=)
CN (1) CN108573508A (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3057067B1 (en) * 2015-02-16 2017-08-23 Thomson Licensing Device and method for estimating a glossy part of radiation
JP7313906B2 (ja) 2019-05-28 2023-07-25 キヤノン株式会社 画像処理方法、画像処理装置、撮像システム、および、プログラム
WO2022102295A1 (ja) * 2020-11-10 2022-05-19 ソニーグループ株式会社 撮像装置
CN112329256A (zh) * 2020-11-13 2021-02-05 北京环境特性研究所 一种涂层材质反射偏振特性分析方法及装置
US11741658B2 (en) * 2021-12-28 2023-08-29 Advanced Micro Devices, Inc. Frustum-bounding volume intersection detection using hemispherical projection

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1283272A (zh) * 1997-12-05 2001-02-07 北方数字股份有限公司 用于测定物体的空间位置和取向的系统
CN101751672A (zh) * 2008-11-28 2010-06-23 索尼株式会社 图像处理系统
CN103261836A (zh) * 2010-10-08 2013-08-21 欧姆龙株式会社 形状测量设备及形状测量方法
JP5838355B2 (ja) * 2012-06-20 2016-01-06 パナソニックＩｐマネジメント株式会社 空間情報検出装置、人位置検出装置
CN106134289A (zh) * 2014-02-26 2016-11-16 飞利浦灯具控股公司 基于光反射率的检测

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1504490A (en) * 1975-11-28 1978-03-22 Bowthorpe Hellerman Ltd Optical fibre connector
US4989948A (en) * 1989-05-08 1991-02-05 Minnesota Mining And Manufacturing Company Reflective sheeting material
US4989984A (en) * 1989-11-08 1991-02-05 Environmental Research Institute Of Michigan System for measuring optical characteristics of curved surfaces
JP3595624B2 (ja) 1996-04-09 2004-12-02 キヤノン株式会社 位置計測方法及び位置計測装置
JP2006127539A (ja) 2005-12-05 2006-05-18 Toshiba Corp 画像抽出装置
EP2029961A4 (en) * 2006-05-12 2014-10-22 Univ Northwestern SYSTEMS, METHODS, AND DEVICES FOR LOW COHERENCE-ADVANCED RETURN-SPECTROCTROSCOPY
KR101624758B1 (ko) * 2008-06-30 2016-05-26 코닝 인코포레이티드 마이크로리소그래픽 투사 시스템용 텔레센트릭성 교정기
JP5648483B2 (ja) * 2009-01-27 2015-01-07 日本電気株式会社 カラー画像処理方法、カラー画像処理装置およびカラー画像処理プログラム
US20100259746A1 (en) * 2009-04-10 2010-10-14 Omron Corporation Profilometer
US20110176029A1 (en) * 2010-01-15 2011-07-21 Kenneth Wayne Boydston Multispectral and Colorimetric Imaging System
WO2012086658A1 (ja) 2010-12-24 2012-06-28 日本電気株式会社 画像処理方法、画像処理システムおよび画像処理プログラム
JP5475057B2 (ja) * 2012-04-20 2014-04-16 株式会社 オフィス・カラーサイエンス 変角分光イメージング測定方法およびその装置
US9459820B2 (en) * 2012-11-08 2016-10-04 Ricoh Company, Ltd. Display processing apparatus, display processing method, and computer program product
US10049294B2 (en) * 2015-01-30 2018-08-14 X-Rite Switzerland GmbH Imaging apparatus, systems and methods
DE102015216985A1 (de) * 2015-09-04 2017-03-09 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Projektionsvorrichtung und Verfahren zur Projektion mit optischen Freiformflächen
EP3196633B1 (en) * 2016-01-20 2021-11-17 Canon Kabushiki Kaisha Apparatus and method for measuring a reflection characteristic of an object
JP2017161370A (ja) 2016-03-09 2017-09-14 株式会社ニコン 検出装置、検出システム、検出方法、及び検出プログラム
JP2017198470A (ja) * 2016-04-25 2017-11-02 キヤノン株式会社 計測装置、計測方法、システム及び物品の製造方法
JP6961394B2 (ja) * 2017-05-31 2021-11-05 株式会社キーエンス 画像検査装置、画像検査方法、画像検査装置の設定方法、画像検査プログラム、画像装置の設定検査プログラム及びコンピュータで読み取り可能な記録媒体並びに記録した機器

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1283272A (zh) * 1997-12-05 2001-02-07 北方数字股份有限公司 用于测定物体的空间位置和取向的系统
CN101751672A (zh) * 2008-11-28 2010-06-23 索尼株式会社 图像处理系统
CN103261836A (zh) * 2010-10-08 2013-08-21 欧姆龙株式会社 形状测量设备及形状测量方法
JP5838355B2 (ja) * 2012-06-20 2016-01-06 パナソニックＩｐマネジメント株式会社 空間情報検出装置、人位置検出装置
CN106134289A (zh) * 2014-02-26 2016-11-16 飞利浦灯具控股公司 基于光反射率的检测

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
大蔵 苑子等: ""光源環境と対象物の同時撮影による屋外物体の拡散反射率推定とその評価"", 《情報処理学会論文誌》 *

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US20180262666A1 (en) 2018-09-13
US11039076B2 (en) 2021-06-15

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Application publication date: 20180925