CN108507892A - A kind of organic film Young's modulus standardization measuring method - Google Patents
A kind of organic film Young's modulus standardization measuring method Download PDFInfo
- Publication number
- CN108507892A CN108507892A CN201810225203.9A CN201810225203A CN108507892A CN 108507892 A CN108507892 A CN 108507892A CN 201810225203 A CN201810225203 A CN 201810225203A CN 108507892 A CN108507892 A CN 108507892A
- Authority
- CN
- China
- Prior art keywords
- organic film
- modulus
- young
- load
- curve
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 14
- 238000007906 compression Methods 0.000 claims abstract description 21
- 230000006835 compression Effects 0.000 claims abstract description 17
- 238000012360 testing method Methods 0.000 claims abstract description 7
- 238000004364 calculation method Methods 0.000 claims description 3
- 238000007373 indentation Methods 0.000 claims description 2
- 238000009795 derivation Methods 0.000 abstract 1
- 239000010408 film Substances 0.000 description 36
- 229920000109 alkoxy-substituted poly(p-phenylene vinylene) Polymers 0.000 description 7
- 239000000463 material Substances 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 229920000642 polymer Polymers 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 241000208340 Araliaceae Species 0.000 description 1
- 235000005035 Panax pseudoginseng ssp. pseudoginseng Nutrition 0.000 description 1
- 235000003140 Panax quinquefolius Nutrition 0.000 description 1
- 241000219000 Populus Species 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 235000013399 edible fruits Nutrition 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 235000008434 ginseng Nutrition 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/40—Investigating hardness or rebound hardness
- G01N3/42—Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0058—Kind of property studied
- G01N2203/0069—Fatigue, creep, strain-stress relations or elastic constants
- G01N2203/0075—Strain-stress relations or elastic constants
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
The invention belongs to the mechanical characteristic field of measuring technique of organic film, specially a kind of standardized measuring method of organic film Young's modulus.The step of the method for the present invention is：Single load unloading test is carried out to organic film, obtains the single curve of load of the organic film；Peter Lonard Jones gesture using description molecular separating force and intermolecular distance relationship is theoretical, by the relationship of load and compression distance in derivation unloading curve to explain the curve of load, and is fitted to the curve of load, obtains fitting parameter；Organic film Young's modulus and the relational expression and fitting parameter of load compression distance are obtained according to theory deduction, determines the Young's modulus value of organic film under different compression distances.This method can obtain soft organic film and bounce back into Young's modulus E when stress is zero upon compression0, Young's modulus E0It will not change with the stress or strain of film, be relatively fixed, suitable for mutually comparing and standardized test for organic film Young's modulus.
Description
Technical field
The invention belongs to the mechanical characteristic field of measuring technique of organic film, and in particular to the survey of organic film Young's modulus
Calculation method.
Background technology
Organic film has been widely applied to luminescence display, solar cell, sensor and other types of half
In conductor device.The flexible characteristic of organic film is counted as a unique advantage for being different from inorganic semiconductor.
During bending, the effect that organic film can be undoubtedly stressed, therefore its mechanical characteristic is concerned.Currently, having very much
Work obtains its Young using the mechanical property of nano-hardness tester research organic film especially by its curve of load is tested
Modulus.But current test method does not account for the nonlinear characteristic of its curve of load substantially.Similar research work disagreement
Also bigger, the Young's modulus difference especially tested is bigger, can only often provide a rough range.Separately have one
A little people think that the variation of the Young's modulus of polymer is the problem of causing due to measuring technique.Such as pressure head tilts, sample is coarse
Degree is high, and caused by horizontal positioned etc. reasons, rather than the characteristic for essentially consisting in polymer itself.Therefore, organic film poplar
The standardization measurement of family name's modulus is of great significance.
Invention content
New it to be used for the standardized measuring method of organic film Young's modulus the purpose of the present invention is to provide a kind of.
The standardized measuring method of organic film Young's modulus provided by the invention, the specific steps are：
（1）Single load-unloading is carried out to organic film to test, obtain the single load of the organic film using nano-hardness tester
Curve；
（2）It is theoretical using description molecular separating force and the Peter Lonard of intermolecular distance relationship-Jones's gesture, by deriving in unloading curve
Load and the relationship of compression distance are fitted the curve of load to explain the curve of load, obtain fitting parameter；
（3）Organic film Young's modulus and the relational expression and fitting parameter of load compression distance are obtained according to theory deduction, really
The Young's modulus value of organic film under fixed different compression distances.
When being returned to the equilibrium state that stress is zero after unloading due to film, Young's modulus E0It is relatively fixed, it will not
Change with the stress or strain of film, is conducive to being compared to each other for organic film Young's modulus, can preferably reflect organic thin
The mechanical characteristic of film.So the Young's modulus E by the film in the state of the equilibrium0Ratio for Young's modulus between different films
Compared with.
Step（2）In, it is derived by according to Peter Lonard-Jones's gesture, the formula for being fitted unloading curve is：
In formula, F is the load in unloading curve, and h is the compression distance in unloading curve, hmIndentation when for stress being zero is deep
Degree, ε are parameter to be fitted：Potential well depth, rmFor parameter to be fitted：The film of actual participation deformation is in the state of the equilibrium
Thickness.
Step（3）In, in the unloading curve, compression distance and the calculation formula of film Young's modulus relationship are：
Wherein, E is organic film Young's modulus, and h is practical compression distance, hmCompression distance when for stress being zero, rmFor ginseng
With thickness of the deformation film under equilibrium state, E0For the Young's modulus under equilibrium state, expression formula is：
Wherein, D is the diameter for measuring nano-hardness tester pressure head used in unloading curve.
Advantage of the invention is that：This new measuring method can more reflect the mechanical characteristic of thin-film material itself, row
In addition to applied stress size, influence of the measurement parameters such as film thickness to organic film material Young's modulus, be more suitable for for than
Compared with the mechanical characteristic between different materials, it is of great significance to the standardization measurement of organic film.
Description of the drawings
Fig. 1 is that MEH-PPV film singles test the curve of load, and pressure is 318.5 kPa when load is 0.1 mN.
Fig. 2 is fitting and the meaning that MEH-PPV film singles test the curve of load.Illustration is illustrated for film deformation.
Fig. 3 be the Young's modulus that is obtained according to formula and MEH-PPV film curve of load fitting results with compression distance and
The variation of load.
Specific implementation mode
Embodiment 1
It is further described by taking MEH-PPV organic films as an example and in conjunction with attached drawing below.
Fig. 1 is to carry out single load-unloading to MEH-PPV organic films with nano-hardness tester, the obtained organic film
The single curve of load, pressure is 318.5kPa when wherein load is 0.1mN.
Fig. 2 is the molecular separating force derived using Peter Lonard-Jones's gesture and intermolecular distance relationship to MEH-PPV organic films
The single curve of load is fitted.Relevant parameter can be obtained by fitting, parametric results are, hm=
46nm, rm=600nm。
Fig. 3 is according to formulaWith the fitting knot of Fig. 2
The Young's modulus that fruit obtains with compression distance and load variation functional arrangement.Wherein, D is
The flat pressure head diameter loaded.The match value that the formula obtains as seen from the figure is sufficiently close to experiment value, and error is about
5%。
By above step and as a result, Young's modulus number of the MEH-PPV organic films under different compression distances can be determined
Value.Data h=82.61nm that test is obtained, and it is fitted obtained hm=46nm substitutes into formula, obtains the MPa of E=231, this
Fitting result is compared with 243 MPa of numerical value that machine is tested, and difference is about 5%, and consistency is fairly good.
Above embodiments illustrate the feasibilities and advance of the present invention.In addition, the embodiment is only to explain the present invention,
It is not intended to limit the present invention.
Claims (3)
1. a kind of standardized measuring method of organic film Young's modulus, which is characterized in that the specific steps are：
（1）Single load-unloading is carried out to organic film to test, obtain the single load of the organic film using nano-hardness tester
Curve；
（2）It is theoretical using description molecular separating force and the Peter Lonard of intermolecular distance relationship-Jones's gesture, by deriving in unloading curve
Load and the relationship of compression distance are fitted the curve of load to explain the curve of load, obtain fitting parameter；
（3）Organic film Young's modulus and the relational expression and fitting parameter of load compression distance are obtained according to theory deduction, really
The Young's modulus value of organic film under fixed different compression distances.
2. measuring method according to claim 1, which is characterized in that step（2）In, it is theoretical according to Peter Lonard-Jones's gesture
It obtains, the formula for being fitted unloading curve is：
In formula, F is the load in unloading curve, and h is the compression distance in unloading curve, hmCompression distance when for stress being zero,
ε is parameter to be fitted：Potential well depth, rmFor parameter to be fitted：The thickness of the film of actual participation deformation in the state of the equilibrium
Degree.
3. measuring method according to claim 2, which is characterized in that step（3）In, in the unloading curve, indentation is deep
It spends and is with the calculation formula of film Young's modulus relationship：
Wherein, E is organic film Young's modulus, and h is practical compression distance, hmCompression distance when for stress being zero, rmTo participate in
Thickness of the deformation film under equilibrium state, E0For the Young's modulus under equilibrium state, expression formula is：
Wherein, D is the diameter for measuring nano-hardness tester pressure head used in unloading curve.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810225203.9A CN108507892B (en) | 2018-03-19 | 2018-03-19 | Organic film Young modulus standard measuring and calculating method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810225203.9A CN108507892B (en) | 2018-03-19 | 2018-03-19 | Organic film Young modulus standard measuring and calculating method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108507892A true CN108507892A (en) | 2018-09-07 |
| CN108507892B CN108507892B (en) | 2020-09-01 |
Family
ID=63376755
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810225203.9A Expired - Fee Related CN108507892B (en) | 2018-03-19 | 2018-03-19 | Organic film Young modulus standard measuring and calculating method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108507892B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109520828A (en) * | 2018-10-11 | 2019-03-26 | 西北工业大学 | The elasticity modulus test method of film |
| CN111060414A (en) * | 2019-12-30 | 2020-04-24 | 复旦大学 | Method for measuring and calculating toughness, strength and elasticity of organic material |
| CN116165070A (en) * | 2023-04-21 | 2023-05-26 | 长鑫存储技术有限公司 | Method and device for detecting Young's modulus of film |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101063646A (en) * | 2006-04-24 | 2007-10-31 | 香港理工大学 | Method for testing and determining material or organizational Yang modulus and poisson ratio by impression |
| CN101788420A (en) * | 2010-02-09 | 2010-07-28 | 马德军 | Instrumentation nano press-in method for testing young modulus of material |
| CN101876647A (en) * | 2010-07-05 | 2010-11-03 | 天津大学 | Bidirectional detection method of Young modulus and Poisson constant by ultrasonic surface wave |
| US20170050856A1 (en) * | 2015-08-18 | 2017-02-23 | Massachusetts Institute Of Technology | Re-Dispersible Dry Graphene Powder |
-
2018
- 2018-03-19 CN CN201810225203.9A patent/CN108507892B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101063646A (en) * | 2006-04-24 | 2007-10-31 | 香港理工大学 | Method for testing and determining material or organizational Yang modulus and poisson ratio by impression |
| CN101788420A (en) * | 2010-02-09 | 2010-07-28 | 马德军 | Instrumentation nano press-in method for testing young modulus of material |
| CN101876647A (en) * | 2010-07-05 | 2010-11-03 | 天津大学 | Bidirectional detection method of Young modulus and Poisson constant by ultrasonic surface wave |
| US20170050856A1 (en) * | 2015-08-18 | 2017-02-23 | Massachusetts Institute Of Technology | Re-Dispersible Dry Graphene Powder |
Non-Patent Citations (3)
| Title |
|---|
| XINJUN TAN ET.AL: "Nanoindentation models and Young’s modulus of monolayer graphene:", 《APPLIED PHYSICS LETTERS》 * |
| 刘金娜: "基于纳米级动态载荷测试技术的薄膜力学行为研究", 《中国博士学位论文全文数据库 工程科技I辑》 * |
| 杨晓东等: "石墨烯纳米压痕实验的分子动力学模拟", 《中国科学》 * |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109520828A (en) * | 2018-10-11 | 2019-03-26 | 西北工业大学 | The elasticity modulus test method of film |
| CN109520828B (en) * | 2018-10-11 | 2022-01-11 | 西北工业大学 | Elastic modulus testing method of film |
| CN111060414A (en) * | 2019-12-30 | 2020-04-24 | 复旦大学 | Method for measuring and calculating toughness, strength and elasticity of organic material |
| CN111060414B (en) * | 2019-12-30 | 2022-05-20 | 复旦大学 | Method for measuring and calculating toughness, strength and elasticity of organic material |
| CN116165070A (en) * | 2023-04-21 | 2023-05-26 | 长鑫存储技术有限公司 | Method and device for detecting Young's modulus of film |
| CN116165070B (en) * | 2023-04-21 | 2023-08-04 | 长鑫存储技术有限公司 | Method and device for detecting Young's modulus of film |
Also Published As
| Publication number | Publication date |
|---|---|
| CN108507892B (en) | 2020-09-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN108507892A (en) | A kind of organic film Young's modulus standardization measuring method | |
| CN102323170A (en) | A kind of method of testing of ultrahard diamond thin film mechanical performance | |
| CN113626986B (en) | Asphalt pavement modulus gradient determination method and device and electronic equipment | |
| TW200643392A (en) | Method of calibrating zero offset of a pressure sensor | |
| Sheng et al. | Bulge test method for measuring the hyperelastic parameters of soft membranes | |
| CN108414379A (en) | A method of indentation Test extraction metal elastic-plastic mechanical parameter in situ | |
| CN105956938A (en) | Fracture-vug type oil reservoir dynamic reserve calculation method | |
| Choi et al. | Physical properties of flexible polyurethane foams manufactured by varying toluene diisocyanate contents | |
| CN104181002B (en) | A kind of uniform hydraulic analogue charger for tunnel structural model test and method | |
| CN106247920B (en) | A kind of surface strain detection device based on the sandwich interdigital capacitor of elastic substrates | |
| CN108593460B (en) | Dynamic accurate calculation method for determining shear strength of soil body based on direct shear test | |
| CN1755946A (en) | Stress sensor chip based on SOI | |
| CN105403354B (en) | A kind of vacuum pressure test method based on differential pressure pick-up | |
| CN1779432A (en) | Method for measuring polymer-base foam material elastic modulus by displacement sensor | |
| CN105806707A (en) | High-speed tensile test device for battery film material | |
| CN105716545A (en) | Structural surface roughness coefficient evaluation method based on Dice similarity measurement | |
| CN206095141U (en) | Surface strain detects device based on with filling interdigital capacitor at bottom of elastic medium | |
| CN112284652B (en) | Airship airbag helium leakage rate detection device and detection method | |
| US20220065733A1 (en) | Non-destructive testing method for tightness degree of small cigarette box packaging | |
| Chen et al. | Piezoelectric coefficients measurement for PVDF films with pneumatic pressure rig in a sole cavity | |
| CN102033018A (en) | Method for measuring elastic strain energy of compressed air in static pressure bubble test | |
| CN1963424A (en) | Method and apparatus for testing stress of cavern wall | |
| Al Salman | Comparison and correction of multistage triaxial tests to single stage triaxial test for the rock mechanical testing | |
| Yoshihara et al. | Effect of specimen configuration and lamination construction on the measurement of the in-plane shear modulus of plywood obtained by the asymmetric four-point bending test | |
| CN106291413A (en) | A kind of spin valve structure and the application as giant magnetoresistance strain gauge thereof |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20200901 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |