CN108507892B - Organic film Young modulus standard measuring and calculating method - Google Patents
Organic film Young modulus standard measuring and calculating method Download PDFInfo
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- CN108507892B CN108507892B CN201810225203.9A CN201810225203A CN108507892B CN 108507892 B CN108507892 B CN 108507892B CN 201810225203 A CN201810225203 A CN 201810225203A CN 108507892 B CN108507892 B CN 108507892B
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- 238000000034 method Methods 0.000 title claims abstract description 10
- 238000007373 indentation Methods 0.000 claims abstract description 14
- 238000012360 testing method Methods 0.000 claims abstract description 9
- 238000009795 derivation Methods 0.000 claims abstract description 3
- 239000010408 film Substances 0.000 claims description 41
- 239000010409 thin film Substances 0.000 claims description 7
- 230000035515 penetration Effects 0.000 claims description 5
- 238000004364 calculation method Methods 0.000 claims description 2
- 238000005259 measurement Methods 0.000 abstract description 5
- 229920000109 alkoxy-substituted poly(p-phenylene vinylene) Polymers 0.000 description 7
- 239000000463 material Substances 0.000 description 3
- 230000035882 stress Effects 0.000 description 3
- 229920000642 polymer Polymers 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000005452 bending Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000006355 external stress Effects 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/40—Investigating hardness or rebound hardness
- G01N3/42—Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0058—Kind of property studied
- G01N2203/0069—Fatigue, creep, strain-stress relations or elastic constants
- G01N2203/0075—Strain-stress relations or elastic constants
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Abstract
The invention belongs to the technical field of mechanical property measurement of organic films, and particularly relates to a measuring and calculating method for organic film Young modulus standardization. The method comprises the following steps: carrying out single loading-unloading test on the organic film to obtain a single loading curve of the organic film; applications to describe intermolecular forces and intermolecular distancesAccording to the system Lonard-Jones potential theory, a load curve is explained by deducing the relation between the load in an unloading curve and the pressing depth, and the load curve is fitted to obtain a fitting parameter; and (4) obtaining a relation between the Young modulus of the organic film and the load indentation depth and fitting parameters according to theoretical derivation, and determining the Young modulus value of the organic film under different indentation depths. The method can obtain the Young modulus E of the soft organic film when the soft organic film rebounds to zero stress after being compressed0The Young's modulus E0The film can not change along with the stress or strain of the film, is relatively fixed, and is suitable for mutual comparison and standardized test of the Young modulus of the organic film.
Description
Technical Field
The invention belongs to the technical field of mechanical property measurement of organic films, and particularly relates to a measuring and calculating method of Young modulus of an organic film.
Background
Organic thin films have been widely used in light emitting displays, solar cells, sensors, and other types of semiconductor devices. The ability of organic thin films to bend is seen as a distinct advantage over inorganic semiconductors. The organic thin film is naturally stressed during bending, and thus its mechanical properties are of great interest. At present, a lot of work is carried out to research the mechanical properties of the organic film by using a nanoindenter, and particularly, the Young modulus of the organic film is obtained by testing the load curve of the organic film. However, the non-linear characteristic of the load curve of the current test method is not basically considered. Similar research work is also more diverged, and particularly, the tested Young modulus has larger difference, and often only an approximate range can be given. There are also some beliefs that the change in young's modulus of polymers is a problem due to measurement techniques. Such as head tilt, high sample roughness, and lack of horizontal placement, rather than primarily due to the properties of the polymer itself. Therefore, standardized measurement of the Young's modulus of organic thin films is of great significance.
Disclosure of Invention
The invention aims to provide a novel measuring and calculating method for organic thin film Young modulus standardization.
The invention provides a measuring and calculating method for organic film Young modulus standardization, which comprises the following steps:
(1) carrying out single loading-unloading test on the organic film by using a nano indenter to obtain a single loading curve of the organic film;
(2) applying a Ronald-Jones potential theory describing the relationship between intermolecular force and intermolecular distance, interpreting a load curve by deducing the relationship between the load in an unloading curve and the pressing depth, and fitting the load curve to obtain fitting parameters;
(3) and (4) obtaining a relation between the Young modulus of the organic film and the load indentation depth and fitting parameters according to theoretical derivation, and determining the Young modulus value of the organic film under different indentation depths.
The Young's modulus E of the membrane returns to the equilibrium state of zero stress after unloading0The organic film is relatively fixed and cannot change along with the stress or strain of the film, which is beneficial to the comparison of the Young modulus of the organic film and can better reflect the mechanical property of the organic film. Therefore, the film has a Young's modulus E in an equilibrium state0For comparison of young's modulus between different films.
In the step (2), the formula for fitting the unloading curve is derived according to the Ronneard-Jones potential and is as follows:
where F is the load in the unloading curve, h is the penetration depth in the unloading curve, hmThe indentation depth when the stress is zero is taken as a parameter to be fitted: depth of potential well, rmFor the parameters to be fitted: the thickness of the film actually participating in the deformation is at equilibrium.
In the step (3), in the unloading curve, a calculation formula of the relationship between the indentation depth and the Young modulus of the film is as follows:
wherein E is Young's modulus of the organic thin film, h is actual indentation depth, and hmThe depth of penetration when the force is zero, rmTo take part in the thickness of the deformed film in equilibrium, E0The Young's modulus in an equilibrium state is expressed as:
wherein D is the diameter of the nanoindenter indenter used to measure the unloading curve.
The invention has the advantages that: the new measuring and calculating method can better reflect the mechanical properties of the film material, eliminates the influence of the measurement parameters such as the magnitude of external stress and the thickness of the film on the Young modulus of the organic film material, is more suitable for comparing the mechanical properties of different materials, and has great significance for the standardized measurement of the organic film.
Drawings
FIG. 1 is a single test load curve of a MEH-PPV film at a pressure of 318.5kPa with a load of 0.1 mN.
FIG. 2 shows the fitting and significance of the MEH-PPV film single test load curve. The inset is a schematic of the film deformation.
FIG. 3 is a graph showing the variation of Young's modulus with depth of penetration and load according to the equation and the fitting result of MEH-PPV film load curve.
Detailed Description
Example 1
The MEH-PPV organic film is taken as an example and is further explained by combining the attached drawing.
FIG. 1 is a single load curve of an MEH-PPV organic film obtained by single loading-unloading the film with a nanoindenter, wherein the pressure is 318.5kPa when the load is 0.1 mN.
FIG. 2 is a fitting of a single-loading curve of MEH-PPV organic films using the relationship between intermolecular forces and intermolecular distances derived from the Roneder-Jones potential. The relevant parameters can be obtained through fitting, and the parameter result is
，hm=46nm，rm=600nm。
FIG. 3 is a graph showing the equation
And figure 2, a plot of young's modulus as a function of indentation depth and load. Wherein
And D is the diameter of the flat pressing head for loading. It can be seen from the figure that the fitting value obtained by the formula is very close to the experimental value, and the error is about 5%.
From the above steps and results, the values of Young's modulus of the MEH-PPV organic film at different indentation depths can be determined. Data obtained by testing h =82.61nm, and h obtained by fittingmSubstituting the formula for 46nm gives E =231 MPa, which is about 5% different from the machine test value 243 MPa, with fairly good consistency.
The above examples illustrate the feasibility and advancement of the present invention. In addition, the examples are only for explaining the present invention, and are not intended to limit the present invention.
Claims (1)
1. A method for measuring and calculating the Young modulus standardization of an organic film is characterized by comprising the following specific steps:
(1) carrying out single loading-unloading test on the organic film by using a nano indenter to obtain a single loading curve of the organic film;
(2) applying a Ronald-Jones potential theory describing the relationship between intermolecular force and intermolecular distance, interpreting a load curve by deducing the relationship between the load in an unloading curve and the pressing depth, and fitting the load curve to obtain fitting parameters;
(3) obtaining a relation between the Young modulus of the organic film and the load indentation depth and fitting parameters according to theoretical derivation, and determining the Young modulus value of the organic film under different indentation depths;
in the step (2), a formula for fitting the unloading curve, which is obtained according to the Ronald-Jones potential theory, is as follows:
where F is the load in the unloading curve, h is the penetration depth in the unloading curve, hmThe indentation depth when the stress is zero is taken as a parameter to be fitted: depth of potential well, rmFor the parameters to be fitted: the thickness of the film actually participating in deformation in a balanced state;
in the step (3), in the unloading curve, a calculation formula of the relationship between the indentation depth and the Young modulus of the film is as follows:
wherein E is Young's modulus of the organic thin film, h is actual indentation depth, and hmThe depth of penetration when the force is zero, rmTo take part in the thickness of the deformed film in equilibrium, E0The Young's modulus in an equilibrium state is expressed as:
wherein D is the diameter of the nanoindenter indenter used to measure the unloading curve.
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| CN108507892B true CN108507892B (en) | 2020-09-01 |
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| CN109520828B (en) * | 2018-10-11 | 2022-01-11 | 西北工业大学 | Elastic modulus testing method of film |
| CN111060414B (en) * | 2019-12-30 | 2022-05-20 | 复旦大学 | Method for measuring and calculating toughness, strength and elasticity of organic material |
| CN116165070B (en) * | 2023-04-21 | 2023-08-04 | 长鑫存储技术有限公司 | Method and device for detecting Young's modulus of film |
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| CN101063646A (en) * | 2006-04-24 | 2007-10-31 | 香港理工大学 | Method for testing and determining material or organizational Yang modulus and poisson ratio by impression |
| CN101788420B (en) * | 2010-02-09 | 2011-11-02 | 马德军 | Instrumentation nano press-in method for testing young modulus of material |
| CN101876647A (en) * | 2010-07-05 | 2010-11-03 | 天津大学 | Bidirectional detection method of Young modulus and Poisson constant by ultrasonic surface wave |
| US20170050856A1 (en) * | 2015-08-18 | 2017-02-23 | Massachusetts Institute Of Technology | Re-Dispersible Dry Graphene Powder |
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