CN108494404B - 高精度逐次逼近型模数转换器的电容电压系数校准方法 - Google Patents

高精度逐次逼近型模数转换器的电容电压系数校准方法 Download PDF

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CN108494404B
CN108494404B CN201810258394.9A CN201810258394A CN108494404B CN 108494404 B CN108494404 B CN 108494404B CN 201810258394 A CN201810258394 A CN 201810258394A CN 108494404 B CN108494404 B CN 108494404B
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张勇
李婷
黄正波
倪亚波
付东兵
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Chongqing Jixin Technology Co ltd
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H03M1/1038—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by storing corrected or correction values in one or more digital look-up tables
    • H03M1/1042—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by storing corrected or correction values in one or more digital look-up tables the look-up table containing corrected values for replacing the original digital values
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0602—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic
    • H03M1/0612—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic over the full range of the converter, e.g. for correcting differential non-linearity
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0634—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale
    • H03M1/0636—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the amplitude domain
    • H03M1/0639—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the amplitude domain using dither, e.g. using triangular or sawtooth waveforms
    • H03M1/0641—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the amplitude domain using dither, e.g. using triangular or sawtooth waveforms the dither being a random signal
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
    • H03M1/468—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors in which the input S/H circuit is merged with the feedback DAC array

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Abstract

本发明涉及一种高精度逐次逼近型模数转换器的电容电压系数校准方法，属于半导体集成电路领域。对电压系数进行校准；根据带电压系数的电容模型得到采样的带电电荷，再根据测试得到的INL值，首先验证INL最大值是否发生在式3所示的地方，然后根据式4得到两个非常接近的二阶电容电压系数，取其平均值为二阶电容电压系数，然后在数字域对其进行校准。本发明能够在不添加模拟校准电路的条件下，基于INL提取电容电压系数，并数字后端对电容电压系数进行校准，提高了ADC的转换精度。

Description

高精度逐次逼近型模数转换器的电容电压系数校准方法
技术领域
本发明属于半导体集成电路领域，涉及高精度逐次逼近型模数转换器的电容电压系数校准方法。
背景技术
传统的逐次逼近型模数转换器(SARADC)的电路结构如图1所示，一个N位的SARADC包含N个二进制权重电容，在采样相时，开关S1中与输入信号Vip，Vin相连的开关导通，开关S2导通，电容上极板接输入信号，下极板接共模电平，如果电容具有电压系数，采样得到的电荷同样具有非线性；采样完成以后进入转换相，开关S1中与输入信号Vip，Vin相连的开关断开，开关S2断开，电容下极板浮空，根据比较器的比较结果，逐次逼近逻辑从高位到低位逐位决定电容的上极板接入的电平，电荷完成重分布，如果电容具有电压系数，那么就有非线性电荷参与重分布，转换结果就会产生非线性，降低转换器的转换精度，目前的校准方法是基于添加模拟电路从而测得电容电压系数再加以校准，这增加了电路复杂度。
发明内容
有鉴于此，本发明的目的在于提供一种高精度逐次逼近型模数转换器的电容电压系数校准方法，基于INL提取电容电压系数，在数字后端对电容电压系数进行校准，不需要添加模拟校准电路的，提高ADC的转换精度。
为达到上述目的，本发明提供如下技术方案：
高精度逐次逼近型模数转换器的电容电压系数校准方法，包括以下步骤：
对电压系数进行校准；带电压系数的电容模型如式1所示：
C＝C0*(1+α1*V+α2*V2+·····) (1)
C为电容实际值，C0电容两端电压差为0时的标称值，α1为一阶电容电压系数，V为电容两端电压差，α2为二阶电容电压系数
采样得带电电荷为：
Q＝C0*(V+0.5*α1*V2+1/3*α2*V3+·····) (2)
由于ADC(Analog-to-Digital Converter，模数转换器)采用差分结构，一阶电压系数相关项0.5*α1*V2在采样时会被抵消；如果忽略高阶电容电压系数，那么二阶电容电压系数相关项1/3*α2*V3就成为非线性的主导因素，根据ADC的INL(Integral nonlinearity，积分非线性)曲线来提取二阶电容电压系数并予以校准；INL曲线的形状由二阶电压系数决定，发生最大INL的数字码如式3所示：
Figure BDA0001609583450000021
Dout为ADC的输出数字码，在Dout的负值区间内出现INL最小值处的值设为Dout1，在Dout的正值区间内出现INL最大值处的值设为Dout2，min(Dout)表示取Dout的最小值，max(Dout)表示取Dout的最大值
最大的INL的值为如式4所示：
Figure BDA0001609583450000022
max(INL)表示INL的最大值，min(INL)表示INL的最小值，α21表示由INL极大值推导得到的二阶电压系数值，α22表示由INL极小值处推导得到的二阶电压系数值，
根据测试得到的INL值，首先验证INL最大值是否发生在式3所示的地方，然后根据式4得到两个非常接近的二阶电容电压系数，取其平均值为二阶电容电压系数，如式5所示
Figure BDA0001609583450000023
然后在数字域对其进行校准，校准公式如式6所式：
Dout_cal＝Dout-1/3*α2*Dout3 (6)
Dout_cal为校准后的ADC数字输出码。
本发明的有益效果在于：本发明能够在不添加模拟校准电路的条件下，基于INL提取电容电压系数，并数字后端对电容电压系数进行校准，提高了ADC的转换精度。
附图说明
为了使本发明的目的、技术方案和有益效果更加清楚，本发明提供如下附图进行说明：
图1为一个N位逐次逼近型ADC；
图2为逐次逼近型ADC输入输出特性；
图3为电容电压系数引入的INL曲线图；
图4为电容电压系数校准流程。
具体实施方式
下面将结合附图，对本发明的优选实施例进行详细的描述。
如图1所示，电容电压系数会影响信号的采样精度，由此约束了逐次逼近型ADC的线性度，想要得到更高的信噪比，必须对电压系数进行校准。带电压系数的电容模型如式1所示：
C＝C0*(1+α1*V+α2*V2+·····) (1)
采样得带电电荷为：
Q＝C0*(V+0.5*α1*V2+1/3*α2*V3+·····) (2)
由于ADC采用差分结构，一阶电压系数相关项0.5*α1*V2在采样时会被抵消；如果忽略高阶电容电压系数，那么二阶电容电压系数相关项1/3*α2*V3就成为非线性的主导因素，本发明根据ADC的INL曲线来提取二阶电容电压系数并予以校准。图2是ADC的输入输出特性曲线，如果ADC是一个理想器件，那么其传输特性如虚线f1所示，但如果ADC中的电容带有电压系数，在采样时会对大幅度的输入信号引入很大的误差，其传输曲线如实线f2所示，出现非线性，虚线f3表示两端拟合后的理想转换曲线，INL由f2与f3相减得到，其形状如图3所示，可见INL曲线的形状由二阶电压系数决定，发生最大INL的数字码如式3所示：
Figure BDA0001609583450000031
最大的INL的值为如式4所示：
Figure BDA0001609583450000032
根据测试得到的INL值，首先验证INL最大值是否发生在式3所示的地方，然后根据式4可以得到两个非常接近的二阶电容电压系数，取其平均值为二阶电容电压系数，如式5所示
Figure BDA0001609583450000033
然后在数字域对其进行校准，校准公式如式6所式：
Dout_cal＝Dout-1/3*α2*Dout3 (6)
本发明根据INL测试曲线提取电容电压系数，这要求INL曲线能完全代表电容电压系数的信息，因此在进行电压系数校准之前，必须进行电容权重校准，排除掉电容失配的误差，校准流程如图4所示。第一步采集ADC的原码信息，第二步根据采集到的原码，完成电容失配校准，第三步测试校准失配后的INL曲线，最后一步根据测试得到的INL曲线得到二阶电容电压系数，并在数字域进行校准。
最后说明的是，以上优选实施例仅用以说明本发明的技术方案而非限制，尽管通过上述优选实施例已经对本发明进行了详细的描述，但本领域技术人员应当理解，可以在形式上和细节上对其作出各种各样的改变，而不偏离本发明权利要求书所限定的范围。

Claims (1)

1.高精度逐次逼近型模数转换器的电容电压系数校准方法，其特征在于：该方法包括以下步骤：
对电压系数进行校准；带电压系数的电容模型如式1所示：
C＝C0*(1+α1*V+α2*V2+·····) (1)
C为电容实际值，C0电容两端电压差为0时的标称值，α1为一阶电容电压系数，V为电容两端电压差，α2为二阶电容电压系数
采样得带电电荷为：
Q＝C0*(V+0.5*α1*V2+1/3*α2*V3+·····) (2)
由于模数转换器ADC采用差分结构，一阶电压系数相关项0.5*α1*V2在采样时会被抵消；如果忽略高阶电容电压系数，那么二阶电容电压系数相关项1/3*α2*V3就成为非线性的主导因素，根据ADC的积分非线性INL曲线来提取二阶电容电压系数并予以校准；INL曲线的形状由二阶电压系数决定，发生最大INL的数字码如式3所示：
Figure FDA0002410638700000011
Dout为ADC的输出数字码，在Dout的负值区间内出现INL最小值处的值设为Dout1，在Dout的正值区间内出现INL最大值处的值设为Dout2，min(Dout)表示取Dout的最小值，max(Dout)表示取Dout的最大值
最大的INL的值为如式4所示：
Figure FDA0002410638700000013
max(INL)表示INL的最大值，min(INL)表示INL的最小值，α21表示由INL极大值推导得到的二阶电压系数值，α22表示由INL极小值处推导得到的二阶电压系数值，
根据测试得到的INL值，首先验证INL最大值是否发生在式3所示的地方，然后根据式4得到两个二阶电容电压系数，取其平均值为二阶电容电压系数，如式5所示
Figure FDA0002410638700000012
然后在数字域对其进行校准，校准公式如式6所式：
Dout_cal＝Dout-1/3*α2*Dout3 (6)
Dout_cal为校准后的ADC数字输出码。
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