CN108445301A - Metallization film capacitor discharging efficiency measuring device and method under a kind of high field intensity - Google Patents
Metallization film capacitor discharging efficiency measuring device and method under a kind of high field intensity Download PDFInfo
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- CN108445301A CN108445301A CN201810283544.1A CN201810283544A CN108445301A CN 108445301 A CN108445301 A CN 108445301A CN 201810283544 A CN201810283544 A CN 201810283544A CN 108445301 A CN108445301 A CN 108445301A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
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Abstract
The invention discloses metallization film capacitor discharging efficiency measuring device and methods under a kind of high field intensity, this method charges to setting voltage by charging resistor with High-accuracy direct current voltage source to metallization film capacitor, it is then turned off power supply, capacitor is discharged by discharge resistance；The energy stored in the capacitance and voltage calculable capacitor of measurement capacitor, acquire the discharge current of capacitor, and the product of the quadratic sum resistance of discharge current is integrated, the energy of capacitor release is obtained, the energy stored in the energy divided by capacitor of capacitor release can be obtained the discharging efficiency of capacitor.The present invention also provides the devices for realizing the above method：Include mainly High-accuracy direct current voltage source, charging resistor, climatic chamber, discharge resistance, voltmeter, relay and electrometer.Experimental rig of the present invention is simple, measurement method is convenient, operability is strong, requires sample size low.
Description
Technical field
The invention belongs to capacitor energy storage testing fields, more particularly, to metallization film capacitor under a kind of high field intensity
Discharging efficiency measuring device and method.
Background technology
As accumulation power supply, metallization film capacitor plays an important role in pulse power system.Metalized film electricity
Most of container uses thin polymer film as energy-accumulating medium, on the one hand, under high field intensity, the loss of the conductance of thin polymer film compared with
Greatly；On the other hand, thin polymer film can generate polarization process under electric field action, and slow polarization process can consume energy.Therefore, electric
The energy stored in container cannot be supplied to load completely, affect the efficiency of capacitor.
Currently, in the measurement of capacitor discharge efficiency, usually with Sawyer-Tower circuit measuring thin polymer films
Ferroelectric hysteresis loop calculates the discharging efficiency of energy-accumulating medium.But this method can only measure the discharging efficiency of energy-accumulating medium, it cannot
Reflect the discharging efficiency of capacitor element.In addition, this method calculating is discharging efficiency of the energy-accumulating medium under fixed frequency,
It cannot reflect the discharging efficiency that capacitor (charges at a slow speed, repid discharge) under actual operating conditions.
Invention content
For the disadvantages described above or Improvement requirement of the prior art, the present invention provides metalized film capacitances under a kind of high field intensity
Device discharging efficiency measuring device and method, thus solving cannot be according to practical work present in existing capacitor discharge efficiency measurement
The technical issues of making conditioned measurement capacitor element discharging efficiency.
To achieve the above object, according to one aspect of the present invention, metallization film capacitor under a kind of high field intensity is provided
Discharging efficiency measuring device, including：High-accuracy direct current voltage source 1, charging resistor 3, climatic chamber 4, is put first relay 2
Resistance 6, electrometer 7, the second relay 8 and voltmeter 9；
The climatic chamber 4 includes the first terminals 5 and the second terminals 5', for electric with metalized film to be measured respectively
The positive and negative anodes of container are electrically connected, first terminals 5 and the charging resistor 3, the discharge resistance 6 and described second after
The first end of electric appliance 8 is electrically connected, and the second terminals 5' and the electrometer 7, the voltmeter 9 and the high-precision are straight
The first end of galvanic electricity potential source 1 is electrically connected, and is grounded；
The second end of the High-accuracy direct current voltage source 1 is electrically connected with the first end of first relay 2, and described first
The second end of relay 2 is electrically connected with the second end of the charging resistor 3, the second end of the discharge resistance 6 and the electrostatic
The second end electrical connection of meter 7, the second end of second relay 8 are electrically connected with the second end of the voltmeter 9.
Preferably, the data output end of the electrometer 7 with exterior terminal equipment for being connected, with by the exterior terminal
Equipment records the reading of the electrometer 7.
It is another aspect of this invention to provide that providing metalized film under a kind of high field intensity based on described in above-mentioned any one
Metallization film capacitor discharging efficiency measurement method under the high field intensity of capacitor discharge Installation for Efficiency Measurement of Hydro, including：
Metallization film capacitor to be measured is placed in the climatic chamber 4, and by the temperature of the climatic chamber 4
20 DEG C -120 DEG C are set as, humidity is set as 20% to 40%, then by the metallization film capacitor to be measured in the constant temperature
It is kept for 2 hours or more in constant humidity cabinet 4；
By the positive and negative anodes for the metallization film capacitor to be measured being placed in the climatic chamber 4 respectively with the perseverance
The terminals of constant temperature and humidity case 4 are electrically connected；
It is closed first relay 2 and second relay 8, is passed through by the High-accuracy direct current voltage source 1 described
Charging resistor 3 monitors the metalized film to be measured in real time to the metallization film capacitor charging to be measured by the voltmeter 9
The voltage at capacitor both ends；
When voltage at the metallization film capacitor both ends to be measured reaches predeterminated voltage, the metalized film to be measured is obtained
The energy stored in capacitor, and first relay 2 and second relay 8 are disconnected, so that the metallization to be measured
Membrane capacitance is discharged by the discharge resistance 6, and by the electrometer 7 to the electric discharge electricity of the metallization film capacitor to be measured
Stream measures；
After electric discharge, by the discharge current and electric discharge electricity of the metallization film capacitor to be measured measured
The resistance value of resistance 6 obtains the energy of the metallization film capacitor release to be measured, and then is released by the metallization film capacitor to be measured
The energy stored in the energy and the metallization film capacitor to be measured put obtains putting for the metallization film capacitor to be measured
Electrical efficiency.
Preferably, the predeterminated voltage is the output voltage of the High-accuracy direct current voltage source 1, the metalized film to be measured
The energy stored in capacitor is W=CU2/ 2, wherein C is the capacitance of the metallization film capacitor to be measured, and U is described waits for
Survey the voltage at metallization film capacitor both ends.
Preferably, the energy of the metallization film capacitor release to be measured is：Wherein, idIt is described
The discharge current of metallization film capacitor to be measured, R are the resistance value of the discharge resistance 6, tdTo terminate to electric discharge since electric discharge
Duration.
Preferably, the discharging efficiency of the metallization film capacitor to be measured is：η=Weff/W。
In general, through the invention it is contemplated above technical scheme is compared with the prior art, can obtain down and show
Beneficial effect：
(1) discharging efficiency that the present invention can be with calculable capacitor element under actual operating conditions；
(2) temperature range and field strength range that experimental rig of the present invention can measure are wider；
(3) experimental rig of the present invention is simple, measurement method is convenient, operability is strong, requires capacitor sizes low.
Description of the drawings
Fig. 1 is that metallization film capacitor discharging efficiency measuring device is shown under a kind of high field intensity provided in an embodiment of the present invention
It is intended to；
Fig. 2 is the stream of metallization film capacitor discharging efficiency measurement method under a kind of high field intensity provided in an embodiment of the present invention
Cheng Tu.
Specific implementation mode
In order to make the purpose , technical scheme and advantage of the present invention be clearer, with reference to the accompanying drawings and embodiments, right
The present invention is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, and
It is not used in the restriction present invention.As long as in addition, technical characteristic involved in the various embodiments of the present invention described below
It does not constitute a conflict with each other and can be combined with each other.
It is that metallization film capacitor discharging efficiency measures dress under a kind of high field intensity provided in an embodiment of the present invention as shown in Figure 1
The schematic diagram set, including：High-accuracy direct current voltage source 1, the first relay 2, charging resistor 3, climatic chamber 4, discharge resistance
6, electrometer 7, the second relay 8 and voltmeter 9；
Climatic chamber 4 include the first terminals 5 and the second terminals 5', for respectively with metallization film capacitor to be measured
Positive and negative anodes electrical connection, the first terminals 5 are electrically connected with the first end of charging resistor 3, discharge resistance 6 and the second relay 8,
Second terminals 5' is electrically connected with the first end of electrometer 7, voltmeter 9 and High-accuracy direct current voltage source 1, and is grounded；
The second end of High-accuracy direct current voltage source 1 is electrically connected with the first end of the first relay 2, and the of the first relay 2
Two ends are electrically connected with the second end of charging resistor 3, and the second end of discharge resistance 6 is electrically connected with the second end of electrometer 7, second after
The second end of electric appliance 8 is electrically connected with the second end of voltmeter 9.
High field intensity in the embodiment of the present invention refers to：Electric field strength is more than 10MV/m.
High-accuracy direct current voltage source in the embodiment of the present invention refers to：The ripple factor of the DC voltage of output is less than
0.002% voltage source.
In an optional embodiment, the data output end of electrometer 7 for being connected with exterior terminal equipment, with by
Exterior terminal equipment records the reading of electrometer 7.
It is metallization film capacitor discharging efficiency measurement method under a kind of high field intensity provided in an embodiment of the present invention shown in Fig. 2
Flow chart, realized based on metallization film capacitor discharging efficiency measuring device under above-mentioned high field intensity, this method includes：
S1：Metallization film capacitor to be measured is placed in climatic chamber 4, and by the temperature setting of climatic chamber 4
It it is 20 DEG C -120 DEG C, humidity is set as 20% to 40%, then keeps metallization film capacitor to be measured in climatic chamber 4
2 hours or more；
S2：By the positive and negative anodes for the metallization film capacitor to be measured being placed in climatic chamber 4 respectively with climatic chamber 4
Terminals electrical connection；
S3：It is closed the first relay 2 and the second relay 8, is waited for by charging resistor 3 by High-accuracy direct current voltage source 1
Metallization film capacitor charging is surveyed, and monitors the voltage at metallization film capacitor both ends to be measured in real time by voltmeter 9；
S4：When voltage at metallization film capacitor both ends to be measured reaches predeterminated voltage, metalized film capacitance to be measured is obtained
The energy stored in device, and the first relay 2 and the second relay 8 are disconnected, so that metallization film capacitor to be measured passes through electric discharge
Resistance 6 discharges, and is measured to the discharge current of metallization film capacitor to be measured by electrometer 7；
In an optional embodiment, predeterminated voltage is the output voltage of High-accuracy direct current voltage source 1, metal to be measured
It is W=CU to change the energy stored in membrane capacitance2/ 2, wherein C is the capacitance of metallization film capacitor to be measured, and U is gold to be measured
The voltage at categoryization membrane capacitance both ends.
In an optional embodiment, the capacitance C (test frequencies of bridge test metallization film capacitor can be used
For 100Hz).
S5：After electric discharge, by the discharge current of metallization film capacitor to be measured that measures and discharge resistance 6
Resistance value obtains the energy of metallization film capacitor to be measured release, and then the energy that is discharged by metallization film capacitor to be measured and waits for
It surveys the energy stored in metallization film capacitor and obtains the discharging efficiency of metallization film capacitor to be measured.
In an optional embodiment, the energy of metallization film capacitor release to be measured is：Its
In, idFor the discharge current of metallization film capacitor to be measured, R is the resistance value of discharge resistance 6, tdTo be tied to electric discharge since electric discharge
Beam duration.
In an optional embodiment, the discharging efficiency of metallization film capacitor to be measured is：η=Weff/W。
It, can be by electrometer 7 by the metallization film capacitor to be measured measured in an optional embodiment
Discharge current is transmitted to the terminal device being connected with electrometer 7, and the electric discharge of metallization film capacitor to be measured is calculated by terminal device
Efficiency.
It, can be to same a collection of metallization film capacitor under same test conditions due to dispersed present in measurement result
Discharging efficiency measurement is carried out, the measurement data as capacitor discharge efficiency is averaged.Test method of the present invention is suitable for electricity
The discharging efficiency of container component measures.
Application example 1：
The rated capacitance of the metallization film capacitor used in the embodiment of the present invention is 17 μ F, the electric discharge to the capacitor
Efficiency measures.Selected voltage is 1kV, and charging resistor is 0.1k Ω, and discharge resistance is 100M Ω, climatic chamber temperature
20 DEG C are set as, humidity is set as 20%.After metallization film capacitor places 2h in climatic chamber, the electricity of capacitor is measured
Container amount (test frequency 100Hz).Then capacitor is accessed in circuit, High-accuracy direct current voltage source is given by charging resistor
After capacitor charges to 1kV, off voltage source, capacitor is discharged by discharge resistance, and electrometer acquisition discharge current simultaneously records.
Formula W=CU is used respectively2/ 2 HesThe energy of the energy and release that are stored in calculable capacitor, then passes through public affairs
Formula η=WeffThe discharging efficiency of/W calculable capacitors is 97%.
Application example 2：
The rated capacitance of the metallization film capacitor used in the embodiment of the present invention is 17 μ F, the electric discharge to the capacitor
Efficiency measures.Selected voltage is 1kV, and charging resistor is 0.1k Ω, and discharge resistance is 100M Ω, climatic chamber temperature
20 DEG C are set as, humidity is set as 40%.After metallization film capacitor places 2h in climatic chamber, the electricity of capacitor is measured
Container amount (test frequency 100Hz).Then capacitor is accessed in circuit, High-accuracy direct current voltage source is given by charging resistor
After capacitor charges to 1kV, off voltage source, capacitor is discharged by discharge resistance, and electrometer acquisition discharge current simultaneously records.
Formula W=CU is used respectively2/ 2 HesThe energy of the energy and release that are stored in calculable capacitor, then passes through public affairs
Formula η=WeffThe discharging efficiency of/W calculable capacitors is 95%.
Application example 3：
The rated capacitance of the metallization film capacitor used in the embodiment of the present invention is 17 μ F, the electric discharge to the capacitor
Efficiency measures.Selected voltage is 1kV, and charging resistor is 0.1k Ω, and discharge resistance is 100M Ω, climatic chamber temperature
80 DEG C are set as, humidity is set as 40%.After metallization film capacitor places 2h in climatic chamber, the electricity of capacitor is measured
Container amount (test frequency 100Hz).Then capacitor is accessed in circuit, High-accuracy direct current voltage source is given by charging resistor
After capacitor charges to 1kV, off voltage source, capacitor is discharged by discharge resistance, and electrometer acquisition discharge current simultaneously records.
Formula W=CU is used respectively2/ 2 HesThe energy of the energy and release that are stored in calculable capacitor, then passes through public affairs
Formula η=WeffThe discharging efficiency of/W calculable capacitors is 90%.
Application example 4：
The rated capacitance of the metallization film capacitor used in the embodiment of the present invention is 17 μ F, the electric discharge to the capacitor
Efficiency measures.Selected voltage is 1kV, and charging resistor is 0.1k Ω, and discharge resistance is 100M Ω, climatic chamber temperature
120 DEG C are set as, humidity is set as 40%.After metallization film capacitor places 2h in climatic chamber, capacitor is measured
Capacitance tolerance (test frequency 100Hz).Then capacitor is accessed in circuit, High-accuracy direct current voltage source passes through charging resistor
After charging to 1kV to capacitor, off voltage source, capacitor is discharged by discharge resistance, and electrometer acquisition discharge current is simultaneously remembered
Record.Formula W=CU is used respectively2/ 2 HesThe energy of the energy and release that are stored in calculable capacitor, then passes through
Formula η=WeffThe discharging efficiency of/W calculable capacitors is 83%.
As it will be easily appreciated by one skilled in the art that the foregoing is merely illustrative of the preferred embodiments of the present invention, not to
The limitation present invention, all within the spirits and principles of the present invention made by all any modification, equivalent and improvement etc., should all include
Within protection scope of the present invention.
Claims (6)
1. metallization film capacitor discharging efficiency measuring device under a kind of high field intensity, which is characterized in that including：High-accuracy direct current electricity
Potential source (1), the first relay (2), charging resistor (3), climatic chamber (4), discharge resistance (6), electrometer (7), second after
Electric appliance (8) and voltmeter (9)；
The climatic chamber (4) include the first terminals (5) and the second terminals (5'), be used for respectively with metalized film to be measured
The positive and negative anodes of capacitor are electrically connected, first terminals (5) and the charging resistor (3), the discharge resistance (6) and institute
State the second relay (8) first end electrical connection, second terminals (5') with the electrometer (7), the voltmeter (9)
And the first end electrical connection of the High-accuracy direct current voltage source (1), and be grounded；
The second end of the High-accuracy direct current voltage source (1) is electrically connected with the first end of first relay (2), and described first
The second end of relay (2) is electrically connected with the second end of the charging resistor (3), the second end of the discharge resistance (6) and institute
State the second end electrical connection of electrometer (7), the second end of second relay (8) and the second end electricity of the voltmeter (9)
Connection.
2. the apparatus according to claim 1, which is characterized in that the data output end of the electrometer (7) is used for and outside
Terminal device is connected, to record the reading of the electrometer (7) by the exterior terminal equipment.
3. a kind of High-Field based on metallization film capacitor discharging efficiency measuring device under high field intensity as claimed in claim 1 or 2
Lower metallization film capacitor discharging efficiency measurement method by force, which is characterized in that including：
Metallization film capacitor to be measured is placed in the climatic chamber (4), and by the temperature of the climatic chamber (4)
20 DEG C -120 DEG C are set as, humidity is set as 20% to 40%, then by the metallization film capacitor to be measured in the constant temperature
Kept for 2 hours in constant humidity cabinet (4) or more；
To be placed on the positive and negative anodes of the metallization film capacitor to be measured in the climatic chamber (4) respectively with the constant temperature
The terminals of constant humidity cabinet (4) are electrically connected；
It is closed first relay (2) and second relay (8), institute is passed through by the High-accuracy direct current voltage source (1)
Charging resistor (3) is stated to the metallization film capacitor charging to be measured, and the gold to be measured is monitored by the voltmeter (9) in real time
The voltage at categoryization membrane capacitance both ends；
When voltage at the metallization film capacitor both ends to be measured reaches predeterminated voltage, the metalized film capacitance to be measured is obtained
The energy stored in device, and first relay (2) and second relay (8) are disconnected, so that the metallization to be measured
Membrane capacitance is discharged by the discharge resistance (6), and is put to the metallization film capacitor to be measured by the electrometer (7)
Electric current measures；
After electric discharge, by the discharge current of the metallization film capacitor to be measured measured and the discharge resistance
(6) resistance value obtains the energy of the metallization film capacitor release to be measured, and then is released by the metallization film capacitor to be measured
The energy stored in the energy and the metallization film capacitor to be measured put obtains putting for the metallization film capacitor to be measured
Electrical efficiency.
4. according to the method described in claim 3, it is characterized in that, the predeterminated voltage is the High-accuracy direct current voltage source
(1) output voltage, the energy stored in the metallization film capacitor to be measured are W=CU2/ 2, wherein C is the gold to be measured
The capacitance of categoryization membrane capacitance, U are the voltage at the metallization film capacitor both ends to be measured.
5. according to the method described in claim 4, it is characterized in that, the energy of the metallization film capacitor release to be measured is：Wherein, idFor the discharge current of the metallization film capacitor to be measured, R is the resistance of the discharge resistance (6)
Value, tdTo terminate duration to electric discharge since electric discharge.
6. according to the method described in claim 5, it is characterized in that, the discharging efficiency of the metallization film capacitor to be measured is：η
=Weff/W。
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| Application Number | Priority Date | Filing Date | Title |
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| CN201810283544.1A CN108445301A (en) | 2018-04-02 | 2018-04-02 | Metallization film capacitor discharging efficiency measuring device and method under a kind of high field intensity |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810283544.1A CN108445301A (en) | 2018-04-02 | 2018-04-02 | Metallization film capacitor discharging efficiency measuring device and method under a kind of high field intensity |
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Family
ID=63198698
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109374975A (en) * | 2018-11-26 | 2019-02-22 | 华中科技大学 | The resistivity test device and method of thin polymer film under a kind of high field intensity |
| CN110580382A (en) * | 2019-08-16 | 2019-12-17 | 华中科技大学 | Capacitance prediction method for metallized film capacitor |
| CN111398709A (en) * | 2020-03-20 | 2020-07-10 | 中国科学院上海硅酸盐研究所 | Method for testing energy storage density of energy storage capacitor |
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| CN109374975B (en) * | 2018-11-26 | 2021-08-20 | 华中科技大学 | Method for measuring resistivity of polymer film under high field intensity |
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| CN111398709A (en) * | 2020-03-20 | 2020-07-10 | 中国科学院上海硅酸盐研究所 | Method for testing energy storage density of energy storage capacitor |
| CN111398709B (en) * | 2020-03-20 | 2021-11-02 | 中国科学院上海硅酸盐研究所 | Method for testing energy storage density of energy storage capacitor |
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