CN102435852A - Method and device for measuring insulation resistance of metalized film capacitor under high field strength - Google Patents
Method and device for measuring insulation resistance of metalized film capacitor under high field strength Download PDFInfo
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- CN102435852A CN102435852A CN2011102994516A CN201110299451A CN102435852A CN 102435852 A CN102435852 A CN 102435852A CN 2011102994516 A CN2011102994516 A CN 2011102994516A CN 201110299451 A CN201110299451 A CN 201110299451A CN 102435852 A CN102435852 A CN 102435852A
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Abstract
The invention discloses a method and a device for measuring insulation resistance of a metalized film capacitor. The method comprises the following steps: placing the capacitor in an environment with constant temperature and humidity; serially connecting a mega-ohm level sampling resistor RS with the capacitor; applying direct-current high voltage to the capacitor and the sampling resistor; and calculating the insulation resistance of the metalized film capacitor under high field strength according to an intrinsic standoff ratio of the sampling resistor and the capacitor under the direct-current high voltage. The invention also provides the device for realizing the method, which mainly comprises a constant temperature humidity chamber, a capacitance measuring meter, a direct current high voltage resistance meter, a mega-ohm level sampling resistor, a direct current high voltage bleeder and a high voltage probe. The device can be used for accurately measuring the insulation resistance of the metalized film capacitor under the high field strength. The defects of a conventional insulation resistance measuring meter that the size of output voltage is limited, a voltage-resistance time is insufficient, the measurement of the insulation resistance is unstable, and the like, are overcome.
Description
Technical field
The invention belongs to the resistance measurement field, be specifically related to a kind of metallization film capacitor insulation measurement method and device, be applicable to the measurement of large value capacitor insulation resistance under constant temperature, constant humidity, the high electric field intensity.
Background technology
The existence of the metallization film capacitor leakage current under the high field intensity is the key factor that influences energy-storage capacitor performance in the impulse power electrical source system, and insulation resistance is the basic electric parameter that reflection is leaked.
Insulation resistance is the ratio that puts on the insulator DC voltage and the leakage current that flows through insulator between two conductors.Under certain damp condition, insulating material is applied DC voltage, will produce following electric current in insulating material inside and surface: 1) displacement current, the electric current that promptly geometric capacitance of insulating material is charged; 2) ABSORPTION CURRENT is promptly because the electric current that the absorption of insulating medium produces; 3) leakage current refers to because insulating material is inner or surperficial charged particle moves the conduction current of generation.Leakage current does not generally change in time and changes, and displacement current and ABSORPTION CURRENT prolong in time and decay.
The insulation resistance of insulator is made up of two parts, i.e. volume resistance and surface resistance, and insulator resistance is that volume resistance and surface resistance compose in parallel.In insulation measurement, need to get rid of the influence of surface leakage current.Therefore the leakage current that obtains the capacitor of flowing through under the certain voltage is the key of measurement insulation resistance.
Because the insulation resistance of metallized polypropylene film capacitor is up to hundreds of even go up begohm, equivalent time constant was up to tens thousand of seconds even hundreds thousand of seconds, and its insulation resistance differs huge under the different field intensity, under the different temperatures.Present conventional insulation measurement appearance is measured the metallization film capacitor insulation resistance and is had problems such as measuring voltage limited size, pressure-resistant time deficiency and insulation measurement instability, the accurately insulation resistance of Measurement of capacitor.
Summary of the invention
The object of the present invention is to provide metallization film capacitor insulation measurement method and device under a kind of high field intensity, accurately measure the insulation resistance of metallization film capacitor under the different field intensity of different temperatures.
Metallization film capacitor insulation measurement method places capacitor under the constant-temperature constant-humidity environment under a kind of high field intensity, to capacitor series one mega-ohms sampling resistor R
S, again capacitor and sampling resistor are applied high direct voltage, measure the voltage U of sampling resistor after the entering stable state
SWith high direct voltage actual value U
0, the calculable capacitor insulation resistance
R
GFor measuring the sampling resistor voltage U
SThe input resistance of the high-voltage probe that is adopted.
Further, also comprise the capacitance meter that is used for Measurement of capacitor electric capacity.
Further, calculable capacitor equivalence insulation resistance τ=R
PC (M Ω μ F), wherein C is the electric capacity of capacitor; With the parameter of equivalent insulation resistance as same batch of metallization film capacitor of measurement.
Further, also pass through lead, eliminate of the influence of capacitor surface electric current insulation resistance with capacitor surface ground connection.
Further, comprise climatic chamber, with the mega-ohms sampling resistor of capacitor series, be used for to capacitor and sampling resistor apply high direct voltage the withstand voltage appearance of high direct voltage, be used to measure the divider of the withstand voltage appearance output valve of high direct voltage and the high-voltage probe that is used to measure sampling resistor voltage.
Further, comprise that also letting out of the capacitor energy that is used to release can circuit.
Technique effect of the present invention is embodied in:
This measuring method calculates the insulation resistance of metallization film capacitor under the high field intensity through the intrinsic standoff ratio of high direct voltage down-sampling resistance and capacitor.Because the voltage that the insulation resistance of metallization film capacitor bears with it is closely related; And the capacitor equivalent time constant is very long; Capacitor charges to and need reach dozens of hour even longer time under a certain voltage, so accurately the measuring appliance insulation resistance needs long-term pressurization.The present invention can be through long-term applied voltage test to obtain its insulation resistance.
The present invention can accurately measure the insulation resistance of metallization film capacitor under the high field intensity, has solved shortcomings such as conventional insulation measurement appearance output voltage limited size, pressure-resistant time deficiency and insulation measurement instability.This measuring method has advantages such as test method is simple, measuring repeatability is good, can accurately measure metallization film capacitor insulation resistance under different temperatures, different humidity, the different field intensity, has solved for a long time capacitor insulation resistance and has measured an inaccurate difficult problem.
Description of drawings
Fig. 1 is the synoptic diagram of measuring method of the present invention;
Fig. 2 is for measuring the equivalent circuit diagram in loop.
Embodiment
Hereinafter specifies the present invention according to accompanying drawing and instance.
As shown in Figure 1, the present invention measures the loop and comprises: the withstand voltage appearance of high direct voltage is used for to measured equipment the stable DC high pressure being provided; Mega-ohms sampling resistor (R
S), be used to obtain capacitor leakage electric current under the high direct voltage; The high direct voltage voltage divider is used to measure the output voltage (U of the withstand voltage appearance of high direct voltage
0); Capacitance meter is used to measure the electric capacity of metallization film capacitor; High-voltage probe is used to measure the voltage (U on the sampling resistor
S).In order to eliminate of the influence of capacitor surface electric current to insulation measurement, with capacitor surface ground connection, surface current is introduced ground through lead, prevent that the capacitor surface electric current from flowing into sampling resistor and producing error.Fig. 2 has provided the equivalent circuit diagram of measuring the loop.
When the withstand voltage appearance of high direct voltage applies voltage, the voltage on the capacitor can raise gradually, and finally reaches stable state.Owing to be used to measure the input resistance (100M Ω) of the high-voltage probe of sampling resistor voltage in the test, its numerical value and sampling resistor (tens of M Ω) comparable size is intended, and therefore the sampling resistor of reality should be the parallelly connected value of high-voltage probe and sampling resistor
R
GFor measuring the sampling resistor voltage U
SThe input resistance of the high-voltage probe that is adopted.
For the capacitor test product, condenser voltage arrives the stable state time often needs several hrs even tens of hours or longer time, and the time constant that can pass through the empirical value estimation circuit is with pressure-resistant time in the confirmed test roughly.Need time recording sampling resistor voltage in the measurement.When sampling resistor voltage no longer changes, can calculate capacitor insulation resistance according to the intrinsic standoff ratio of sampling resistor and capacitor:
Because capacitors of different capacitance insulation resistance appearance not of uniform size is for unified criterion, with condenser capacity C and insulation resistance R
pProduct as weighing capacitor parameters, promptly equivalent insulation resistance (the insulation resistance M Ω that every μ F electric capacity is corresponding) or equivalent time constant (s):
τ＝R
PC (2)
Before the test, earlier with capacitance meter Measurement of capacitor test specimen electric capacity.According to the wiring schematic diagram wiring among Fig. 1.Wherein high direct voltage pressure-resistant tester, sampling resistor low pressure end, capacitor surface ground connection and capacitor are let out and can be connected altogether by device.Capacitor places climatic chamber in the experimental measurement, frame of broken lines as shown in Figure 1, and the temperature and humidity through setting climatic chamber is to guarantee the capacitor experimental enviroment.Need before the test to guarantee that capacitor high-low pressure A, B end reliably insulate with climatic chamber.It is parallel to the pressure-resistant tester output terminal to measure the pressure-resistant tester output voltage divider, and high-voltage probe and oscillograph cooperate appearance to measure voltage on the sampling resistor.With the cylindrical capacitor surface earthing, surface current is introduced ground through lead, prevent that the capacitor surface electric current from flowing into sampling resistor and producing error.
Wiring finishes the back through regulating the magnitude of voltage U that pressure-resistant tester is set with output
0, sampling resistor voltage U after this
SBy U
0Beginning descends gradually, and the capacitor two ends are raise by 0 beginning voltage gradually.Need to guarantee the pressure-resistant tester output voltage stabilization in the test.Through treating behind the certain hour that sampling resistor voltage reads the voltage divider voltage U after stable
0With the high-voltage probe voltage U
S, can calculate capacitor insulation resistance R according to summary of the invention Chinese style (1)
p, through type (1) can calculate equivalent insulation resistance.
The withstand voltage measuring instrument voltage in test back returns zero, and voltage is still kept in the capacitor at this moment, need can discharge to capacitor by circuit through letting out.Let out and to adopt the mode of a water resistance ground connection to realize (being not limited to this) by circuit.Concrete operations are following: with reference to figure 1, at first pass through the ground connection hook with capacitor low pressure end A point ground connection; Secondly through letting out ability circuit E point contacting capacitor high-pressure side B point, capacitor energy will can be released by device through letting out; When the voltage divider registration is let out and can be finished for capacitor after reducing to zero.For safety, repeatedly let out and to finish to guarantee that capacitor energy is fully released.
Clearness test was on-the-spot after experiment finished.
Be the precision that guarantees to measure, this measuring method requires to confirm according to the insulation resistance of measured capacitor the size of sampling resistor, makes at the two at the same order of magnitude; If the relative sampling resistor of single capacitor insulation resistance resistance is excessive, can adopt a plurality of capacitor parallel connections as test specimen to reduce the insulation resistance of sample electric capacity, make itself and sampling resistor at the same order of magnitude.
Because there is dispersiveness in capacitor insulation resistance in measuring, and can under same voltage, take multiple measurements, and averages as the insulation measurement data.The withstand voltage appearance output voltage of high direct voltage is adjustable in 0～12kV scope in this measuring method, is to be changed by the electric current that change in voltage causes to compare and can ignore with stable state capacitor leakage electric current to the stability requirement of power supply.This measuring method can be measured metallization film capacitor and bear in the field intensity 500V/ μ m, and 100 ℃ of test temperatures are with interior insulation resistance.
Claims (6)
1. metallization film capacitor insulation measurement method and device under the high field intensity: capacitor is placed under the constant-temperature constant-humidity environment, to capacitor series one mega-ohms sampling resistor R
S, again capacitor and sampling resistor are applied high direct voltage, measure the voltage U of sampling resistor after the entering stable state
SWith high direct voltage actual value U
0, the calculable capacitor insulation resistance
R
GFor measuring the sampling resistor voltage U
SThe input resistance of the high-voltage probe that is adopted.
2. resistance measurement method according to claim 1 is characterized in that, goes back calculable capacitor equivalence insulation resistance τ=R
PC, C are the electric capacity of capacitor.
3. resistance measurement method according to claim 1 and 2 is characterized in that, also passes through lead with capacitor surface ground connection.
4. realize the device of the said resistance measurement method of claim 1, comprise climatic chamber, with the mega-ohms sampling resistor of capacitor series, be used for to capacitor and sampling resistor apply high direct voltage the withstand voltage appearance of high direct voltage, be used to measure the divider of the withstand voltage appearance output valve of high direct voltage and the high-voltage probe that is used to measure sampling resistor voltage.
5. device according to claim 4 is characterized in that, also comprises the capacitance meter that is used for Measurement of capacitor electric capacity.
6. according to claim 4 or 5 described devices, it is characterized in that, comprise that also letting out of the capacitor energy that is used to release can circuit.
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| CN201110299451.6A CN102435852B (en) | 2011-09-30 | 2011-09-30 | Method and device for measuring insulation resistance of metalized film capacitor under high field strength |
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Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103487177A (en) * | 2013-09-05 | 2014-01-01 | 华中科技大学 | Method and device for measuring metallized film capacitor interlayer pressure intensity |
| CN104375010A (en) * | 2014-11-06 | 2015-02-25 | 陕西华星电子开发有限公司 | Device for measuring capacitance of ceramic capacitor under high voltage (DC<=3KV) |
| CN104520726A (en) * | 2012-06-01 | 2015-04-15 | 艾思玛太阳能技术股份公司 | Insulation resistance measurement for inverters |
| CN105929243A (en) * | 2016-06-24 | 2016-09-07 | 深圳大学 | Method used for measuring optical glass resistance and device using same |
| CN107478940A (en) * | 2017-07-06 | 2017-12-15 | 华中科技大学 | A kind of detection method of capacitor-end contact condition |
| CN108445301A (en) * | 2018-04-02 | 2018-08-24 | 华中科技大学 | Metallization film capacitor discharging efficiency measuring device and method under a kind of high field intensity |
| CN109374975A (en) * | 2018-11-26 | 2019-02-22 | 华中科技大学 | The resistivity test device and method of thin polymer film under a kind of high field intensity |
| CN110441609A (en) * | 2019-08-30 | 2019-11-12 | 国家电网有限公司 | Capacitor insulation resistance detection device, system and method |
| CN110927460A (en) * | 2019-12-05 | 2020-03-27 | 芜湖航天特种电缆厂股份有限公司 | Insulation resistance measuring method |
| CN113376465A (en) * | 2021-06-16 | 2021-09-10 | 桂林电力电容器有限责任公司 | Circuit and method for testing current carrying performance of metallized film capacitor element |
| CN114441905A (en) * | 2021-12-17 | 2022-05-06 | 浙江八达电子仪表有限公司时通电气分公司 | Device for detecting insulation of electric secondary equipment |
| CN116840629A (en) * | 2023-05-11 | 2023-10-03 | 成都产品质量检验研究院有限责任公司 | Polymer insulating material conductivity characteristic test system |
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Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104520726A (en) * | 2012-06-01 | 2015-04-15 | 艾思玛太阳能技术股份公司 | Insulation resistance measurement for inverters |
| CN103487177A (en) * | 2013-09-05 | 2014-01-01 | 华中科技大学 | Method and device for measuring metallized film capacitor interlayer pressure intensity |
| CN103487177B (en) * | 2013-09-05 | 2015-07-08 | 华中科技大学 | Method and device for measuring metallized film capacitor interlayer pressure intensity |
| CN104375010A (en) * | 2014-11-06 | 2015-02-25 | 陕西华星电子开发有限公司 | Device for measuring capacitance of ceramic capacitor under high voltage (DC<=3KV) |
| CN105929243A (en) * | 2016-06-24 | 2016-09-07 | 深圳大学 | Method used for measuring optical glass resistance and device using same |
| CN107478940A (en) * | 2017-07-06 | 2017-12-15 | 华中科技大学 | A kind of detection method of capacitor-end contact condition |
| CN108445301A (en) * | 2018-04-02 | 2018-08-24 | 华中科技大学 | Metallization film capacitor discharging efficiency measuring device and method under a kind of high field intensity |
| CN109374975A (en) * | 2018-11-26 | 2019-02-22 | 华中科技大学 | The resistivity test device and method of thin polymer film under a kind of high field intensity |
| CN110441609A (en) * | 2019-08-30 | 2019-11-12 | 国家电网有限公司 | Capacitor insulation resistance detection device, system and method |
| CN110927460A (en) * | 2019-12-05 | 2020-03-27 | 芜湖航天特种电缆厂股份有限公司 | Insulation resistance measuring method |
| CN113376465A (en) * | 2021-06-16 | 2021-09-10 | 桂林电力电容器有限责任公司 | Circuit and method for testing current carrying performance of metallized film capacitor element |
| CN113376465B (en) * | 2021-06-16 | 2024-04-26 | 桂林电力电容器有限责任公司 | Circuit and method for testing current-carrying performance of metallized film capacitor element |
| CN114441905A (en) * | 2021-12-17 | 2022-05-06 | 浙江八达电子仪表有限公司时通电气分公司 | Device for detecting insulation of electric secondary equipment |
| CN116840629A (en) * | 2023-05-11 | 2023-10-03 | 成都产品质量检验研究院有限责任公司 | Polymer insulating material conductivity characteristic test system |
| CN116840629B (en) * | 2023-05-11 | 2024-06-04 | 成都产品质量检验研究院有限责任公司 | Polymer insulating material conductivity characteristic test system |
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