CN108444378A - A kind of resistance strain - Google Patents
A kind of resistance strain Download PDFInfo
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- CN108444378A CN108444378A CN201810556672.9A CN201810556672A CN108444378A CN 108444378 A CN108444378 A CN 108444378A CN 201810556672 A CN201810556672 A CN 201810556672A CN 108444378 A CN108444378 A CN 108444378A
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- strain
- resistance
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- resistor
- curved configuration
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/16—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
- G01B7/18—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in resistance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B1/00—Measuring instruments characterised by the selection of material therefor
Abstract
The present invention provides a kind of resistance strains that can accurately measure larger range ability, including：Strain resistor and substrate, the strain resistor is fixed on the substrate, and the substrate is made of insulating materials, is curved configuration, the central axes of the strain resistor are located at the side of the central axes of the substrate, realize the increase of the range of the resistance strain.Compared to common type metal foil type resistance strain gage, the range scope of design for the strain transducer that this programme is provided can be thousands of from a few percent to percent, can effectively solve the problems, such as that credible range is smaller due to the limitation of extensibility for tinsel cord.
Description
Technical field
The invention belongs to strain transducer design fields, and in particular to one kind can accurately measure larger range ability
The resistance strain with curved shape electric resistance structure.
Background technology
The strain of object is a very important geometric parameter, accurately measures and has a very important significance.It answers
It is for measuring a kind of sensor strained caused by object receiving force deformation to become sensor.Resistance strain gage is then that it is most often adopted
Sensing element.It is a kind of sensing element that the variation strained on mechanical component can be converted to resistance variations.Strain passes
The type of sensor is more, by principle point, have resistance-type, it is capacitive, piezoelectric type, inductance type and optical profile type etc..
Resistance strain, resistance material can be divided into metal, semiconductor, solution, conducting polymer, graphite etc. again.
In test, foil gauge is pasted onto on the surface of determinand securely with adhesive, with test specimen stress deformation,
The sensitive grid of foil gauge also obtains same deformation, and to make its resistance change therewith, and this resistance variations is and test specimen
Strain it is proportional, so if this resistance variations are converted to voltage or curent change by centainly measuring circuit, then
It is shown and is recorded with display recorder table again, just can know that the size of determinand dependent variable.
Resistance strain used at present is most widely used with metallic resistance, however due to metal stretching rate
Limitation, surveyed range of strain is also smaller.Such as constantan, it can only generally ensure that the strain measured within 2% is believable.
Invention content
The object of the present invention is to provide it is a kind of can accurately measure larger range ability with curved shape electric resistance structure
Resistance strain.
In order to achieve the above object, the specific technical solution of the present invention is as follows：
A kind of resistance strain, including：Strain resistor and substrate, the strain resistor are fixed on the substrate
On, the substrate is made of insulating materials, is curved configuration, the central axes of the strain resistor are located at the axis of the substrate
The increase of the range of the resistance strain is realized in the side of line.
Further, the width of the substrate is 2 times or 2 times or more of the strain resistor width.
The curved configuration is the composite structure of one or more of circular arc, elliptic arc, sine curve.
Further, further include linkage section, the curved configuration includes one or more, multiple curved configurations
It is connected with each other by the linkage section, the head and the tail both ends of multiple curved configurations of interconnection are respectively equipped with and determinand
Connected paste-side；
Before and after the strain transducer is stretched, the average curvature variable quantity of the linkage section is less than the curved configuration
Average curvature variable quantity.
Further, the resistance value of the strain resistor on the linkage section is less than the strain resistor in the curved configuration
Resistance value.
Further, multiple curved configurations are set up in parallel, and end is commonly connected to a paste-side.
Further, further include substrate limit band, limit the curved configuration and be maintained at preset length state.
Further, the substrate limit band is set up in parallel with one or more curved configurations, and end is common
It is connected to a paste-side.
Further, the structure of the substrate limit band is linear, and length is viscous with the curved configuration both ends
The spacing pasted between end is equal.
Further, the structure of the substrate limit band is curved shape, and maximal tensility is less than the curved configuration
Maximal tensility, assist the compressive strain for detecting test specimen to be measured.
Further, the material of the substrate is one kind in polyimides, phenolic resin, epoxy resin.
Further, the material of the strain resistor is constantan or new constantan.
Further, the material of the strain resistor is nichrome, nichrome aluminum alloy, Aludirome, platinum, the conjunction of platinum tungsten
One kind in gold, single crystal silicon semiconductor, graphene.
Further, further include packaging film, the packaging film is coated in the resistance strain.
Further, the material of the packaging film is dimethyl silicone polymer or Ecoflex series silicon rubber.
Resistance strain provided by the invention, substrate is curved configuration, and then defines electrostrictive strain thereon
The structure of resistance is also curved configuration, compares common type metal foil type resistance strain gage, the strain transducer that this programme is provided
Range scope of design can be thousands of from a few percent to percent, can effectively solve limitation of the tinsel cord due to extensibility
And the problem that credible range is smaller.Meanwhile the central axes that strain resistor is arranged are located at the side of substrate central axes, can effectively protect
The sensitivity that strain transducer measures is demonstrate,proved, and then ensures the accuracy of measurement result.
Description of the drawings
Fig. 1 a are a kind of structural schematic diagrams of resistance strain provided by the invention；
Fig. 1 b are the partial enlarged views in the upper left corners Fig. 1 a；
Fig. 2 a are the structural schematic diagrams of another resistance strain provided by the invention；
Fig. 2 b are the partial enlarged views in the upper left corners Fig. 2 a；
Fig. 3 is the resistance strain structural schematic diagram of another structure provided by the invention；
Fig. 4 is that the radian of the arc segment of substrate provided by the invention is more than the resistance strain structure that π is less than 2 π
Schematic diagram；
Fig. 5 is the structural schematic diagram that the curvature of the arc segment in substrate does not wait；
Fig. 6 is the identical structural schematic diagram of opening direction of adjacent arc segment in substrate；
Fig. 7 is the structural schematic diagram for the resistance strain that curved section in substrate is elliptic arc；
Fig. 8 a are that the radian of the arc segment in substrate is less than the structural schematic diagram of π；
Fig. 8 b are the partial enlarged views of Fig. 8 a left ends；
Fig. 9 a are the structural schematic diagrams that strain resistor is located on the outside of the pliable tune curvature of substrate；
Fig. 9 b are the partial enlarged views in the upper left corners Fig. 9 a；
Figure 10 is provided with the structural schematic diagram of the resistance strain of linear substrate limit band；
Figure 11 is provided with the structural schematic diagram of the resistance strain of curved shape substrate limit band；
Figure 12 is the structural schematic diagram of resistance strain shown in embodiment 1；
Figure 13 a are the structural schematic diagrams of resistance strain shown in embodiment 2；
Figure 13 b are the partial enlarged views in the upper left corners Figure 13 a；
Displacement loading curve when Figure 13 c are test performances；
The resistivity-time curve that multimeter measures in real time when Figure 13 d are displacement loads；
Figure 13 e are the curves by the curve shifting in 10 periods in Figure 13 e together；
Figure 13 f are that Figure 13 f are converted into resistance change rate-strain curve；
1. substrate, 2. strain resistors, 3. paste-sides, 4. linkage sections, 5. linear substrates limit band, 6. curved shape substrates limit
Position band.
Specific implementation mode
Present invention problem, technical solution and advantage are illustrated by reference to exemplary embodiment.However, the present invention is not
It is limited to exemplary embodiment as disclosed below, it can be realized by different form.
In the following contents described range be strain resistor reach its can normal use maximum strain when strain sensing
The extensibility of device.
A kind of resistance strain, as seen in figure la and lb, wherein Fig. 1 b are the upper left corner partial enlarged view of Fig. 1 a,
It is mainly made of strain resistor 2 and substrate 1, strain resistor 2 is fixed on the base 1, and substrate 1 is connect or direct with test specimen to be measured
It is pasted onto on test specimen to be measured, strain resistor 2 and substrate are deformed together in company with test specimen to be measured, strain resistor while deformation
Resistance value change therewith, the resistance of variation exports as electronic signals after processing of circuit, is measured, final according to answering
Relationship obtains the strain value of test specimen to be measured between the resistance demarcated and strain on change sensor.
In the present solution, the substrate of strain transducer is made of insulating materials, it is curved configuration, and the base of curved configuration
It is curved shape that bottom, which can determine the structure of strain resistor thereon also, compared to the sheet type strain transducer being commonly used,
The range of strain transducer can effectively be increased.Actual measurement, the useful range of strain transducer provided by the invention can be from percentage
It is several thousands of to percent.And strain resistor disposed thereon, central axes are located at the side of substrate central axes, can ensure to answer
Become the sensitivity of sensor measurement.And across the strain resistor of substrate central axes, in deformation process, resistance variations are minimum,
It is not easy to capture, is unfavorable for improving the measurement accuracy of strain transducer.Wherein, strain resistor can be located at the song of substrate curvilinear structures
It on the outside of rate, can also be located on the inside of the curvature of curvilinear structures, as illustrated in figures 9 a and 9b, be located on the outside of substrate curvature.
In one embodiment of the present invention, in order to improve measurement accuracy and sensitivity coefficient, the width of preferred substrate is extremely
Few is 2 times of strain resistor width thereon.When the width of strain resistor is more than the half of base widths, then the one of strain resistor
Subregion can cross the central axes of substrate, at this point, strain resistor is symmetrically positioned in the resistance on the part of substrate central axes both sides
Due to part tensile strain, resistance increases, and partial compression strain, resistance reduces, the positive and negative counteracting of partial ohmic variation meeting thereon,
Cause the measured value of the actually active resistance variations of strain resistor to become smaller, and then external measuring circuitry is caused to measure increased resistance value
It is smaller, it can then cause strain result precision smaller, error is larger.Therefore, the strain transducer provided according to this programme, substrate
Width be at least 2 times of strain resistor width thereon, to ensure the precision of strain measurement.In the present solution, more preferably substrate is wide
Degree is 6 times or 6 times or more of strain resistor width thereon, can ensure that strain transducer can obtain in measurement process in this way
Preferable sensitivity and splendid measurement accuracy.
In one embodiment of the present invention, in order to simplify calculating process, preference curve shape structure be circular arc, elliptic arc,
The composite structure of one or more of sine curve or cosine curve, for change the more circular arc, elliptic arc of rule or
Sine curve, predetermined electrical resistance changing value and strain between relational process in comparatively be easy.Certainly, this programme is not limited to
The above-mentioned several curved configurations enumerated can also be selected and change more irregular asymmetric curvilinear structures.
In one embodiment of the present invention, curved configuration therein may be considered individual circular arc, an ellipse
King-size large scale curved configuration can also be arranged according to the length of practical test specimen to be measured, by two in arc or sine curve
A or more than two circular arcs or elliptic arc or sine curve head and the tail connect and compose large scale curved configuration, or can also be by
Two kinds or more of head and the tail respectively in circular arc, elliptic arc or sine curve connect, and constitute large scale curved configuration, meet
The length requirement of practical test specimen to be measured.Certainly, when multiple curved configuration settings, it can join end to end and constitute king-size big ruler
Multiple curved configurations can also be set up in parallel by very little curved configuration, and two ends are connected jointly by the same paste-side
To test specimen to be measured.
It is the curved configuration that multiple semicircle camber line head and the tail connect and compose, phase if Fig. 1 a and 2a structures are substantially approximate
The opening of adjacent two semicircle camber lines is on the contrary, Fig. 1 b and Fig. 2 b are respectively the partial enlarged view of Fig. 1 a and Fig. 2 a.Fig. 3 is multiple small
In the curved configuration that 1/2 circular arc head and the tail connect and compose, and Fig. 4 joins end to end for 3/4 circular arc, and adjacent circular arc opening is opposite.Fig. 5
It is arranged to two row for an independent circular arc to be symmetrical arranged, Fig. 6 is the single-row song that multiple semi arches are sequentially connected end to end composition side by side
Linear structure；Fig. 7 is the two row symmetrical structures that multiple elliptic arcs are sequentially connected end to end composition, the opening phase of two neighboring elliptic arc
Instead.And Fig. 8 a, Fig. 9 a are similar with Fig. 3, the single-row curved configuration for the composition that joins end to end for multiple arc segments, Fig. 8 b are Fig. 8 a's
Partial enlarged view, Fig. 9 b are the partial enlarged view of Fig. 9 a.Fig. 1 a therein, 2a, Fig. 3, Fig. 4, Fig. 6, Fig. 7, Fig. 8 a, Fig. 9 a, figure
10, Figure 11 and Figure 12 is king-size large scale curved configuration, and Fig. 5 may be considered two curved configuration monomers
Symmetrical structure.The extended type large scale curve connected and composed such as multiple curved configurations head and the tail that Fig. 6 and Fig. 8 a are single-row setting
Shape structure, and the curvilinear structures of the strain transducer in remaining attached drawing are the structure of two Lie Bielie settings.It is of course also possible to simultaneously
Three row of row setting, four row or more array structures.Above-mentioned attached drawing is only partial trace structure provided by the invention.
In the radius of the semicircle camber line of setting, the basic width ratio according to the sweep and substrate 1 that are substrate is got over
Greatly, then the range of strain transducer is bigger, and sweep is arranged according to default range.Sweep in curved configuration can be with
It is equal can not also be equal, when multiple sweeps of setting are equal, advance calculating can be easier.If curved shape is arranged
Multiple sweeps in structure are unequal, then can be relatively complicated in numerical computations, and can reduce the sensitive system of measurement
Number.
In one embodiment of the present invention, since two neighboring curved configuration is after head and the tail connect, junction
Resistance change is more complicated, in order to reduce the resistance value of junction strain resistor for the strain resistor in curved configuration
The influence of resistance change, excessively reduces to avoid sensitivity coefficient, while further increasing the range of strain transducer, preferably exists
Linkage section is arranged in junction, is stretched in strain transducer front and back, and the average curvature variable quantity of the linkage section is less than curved shape knot
The average curvature variable quantity of structure.It is preferred that the resistance value of the strain resistor on the linkage section is less than the strain resistor in curved configuration
Resistance value.
It is preferred that linkage section is straightway, simple in structure, range is easily designed.Such as Fig. 1 to Fig. 3, shown in Fig. 8 to Figure 12,
Each attached drawing middle connecting segment is linear, when the resistance value of strain resistor on linkage section is sufficiently small, is actually measuring and was calculating
The influence of the partial ohmic can then be ignored in journey, improve sensitivity coefficient.Certainly, when the resistance value on linkage section it is smaller then for
The sensitivity of this strain transducer is more advantageous.When specific setting, the resistance value of strain resistor should be much smaller than on curved section on linkage section 4
The resistance value of strain resistor, since the deformation of straightway is smaller, resistance variations are smaller, if its resistance is larger, can reduce entire biography
The sensitivity coefficient of sensor.It is answered so the width of strain resistor of the setting on linkage section 4 is much larger than in curved portion substrate 1
Become the width of resistance, actual measurement, strain transducer can reach ideal sensitivity, need on linkage section 4 resistance value of strain resistor with
The resistance value of strain resistor differs at least one order of magnitude in curved portion substrate 1, while needing the electrostrictive strain being arranged on linkage section
Resistance width is equal with the width of the part of substrate 1 or is slightly less than its width.
Further include being protected for restrictive curve shape structure or large scale curved configuration in one embodiment of the present invention
The substrate held in preset length state limits band.In specific setting, above-mentioned substrate can be limited band and multiple curved shape knots
Structure or large scale curved configuration are set up in parallel.The substrate limits the difference of band according to requirements, and shape and structure is also different.
Such as, it can be provided rectilinear structure is served only for limitation strain transducer and will not arbitrarily be stretched before being used, ensures to answer
Become the measurement accuracy of sensor.Or curved shape can be arranged to, and then stretching strain and the pressure of test specimen to be measured can be detected simultaneously
Strain.
As shown in Figure 10, the structure of substrate limit band is linear, the curved configuration of length and both sides it is original
Equal length.Substrate limit band can prevent strain transducer from influencing its measurement accuracy arbitrarily being stretched before, base
The both ends of lowest limit position band are connect respectively at the both ends of strain transducer with paste-side.In use, strain transducer is according to original shape
State is pasted onto on test specimen to be measured, later, before starting test, substrate limit line 5 is cut, you can normally measured.Or
Can substrate be limited line to cut completely, release the limitation of its pair of strain sensors.
As shown in figure 11, the structure of substrate limit band is that strain transducer is first stretched to by curved shape when actually measuring
Curved shape substrate limits the degree that band is straightened, and at this moment the substrate of strain transducer is also stretched, and pastes again later tested
On part, if at this moment test specimen has compressive strain, strain transducer also can be deformed and then, and then measure the compressive strain of test specimen to be measured.
The maximal tensility that curved shape substrate limits band 6 is arranged according to the range of test specimen to be measured, first will strain before pasting
Sensor stretches so that intermediate curved shape substrate limit band 6 is extended to maximum position, is pasted later, will after pasting
Intermediate curved shape substrate limit band 6 is cut.Since when pasting, strain transducer is pre-stretched, so, when measurement,
Both the stretching strain that test specimen to be measured can have been measured can also measure the compressive strain of test specimen to be measured, and high certainty of measurement.
In the above embodiment, as seen in figure la and lb, in attached drawing, oblique line fill part is made of polymer material
The substrate 1 of curved configuration, filled black part are strain resistor 2, remaining Structure Figure is identical as Fig. 1 a.Wherein, for compared with
Good one kind being selected as in polyimides, phenolic resin, epoxy resin, which not only insulate but also soft texture, and
Elastic stretching rate is higher than metal and non-aging.
In the above embodiment, wherein the material of the strain resistor used is preferably constantan or new constantan, due to constantan
It is low with the temperature coefficient of resistivity of new constantan, be not easy to be affected by temperature, so, on the basis of this programme, using constantan or
New material of the constantan as strain resistor, can effectively improve the thermal stability of strain transducer.Therefore, present embodiment provides
Resistance strain have larger range while, also have good thermal stability, be not easy influenced by ambient temperature.
Actual measurement display, using constantan or new constantan as strain resistor material, each degree Celsius of ambient temperature variation only influences strain
Sensor generates the resistance change rate of ten a ten thousandth magnitudes.
Certainly, the material of strain resistor can also select conventional nichrome, nichrome aluminum alloy, Aludirome, platinum,
One kind in platinum-tungsten alloys.Or single crystal silicon semiconductor or graphene can also be selected.And single crystal silicon semiconductor therein and stone
The sensitivity coefficient of black alkene is high, helps to improve measurement accuracy in measurement process；And platinum and platinum-tungsten alloys chemical stability are high, energy
Enough improve the service life of strain resistor.
In one embodiment of the present invention, according to the difference of the use environment of strain transducer, it can also be passed in strain
Packaging film for protecting strain transducer is set outside sensor.When the use environment of strain transducer is relatively closed
When, it may not be necessary to carry out surface encapsulation.And when strain transducer use environment influenced by extraneous factor it is more or larger
When, it needs to protect strain resistor, can coat packaging film in the outer surface of strain transducer at this time.When what is used answers
When change sensor needs encapsulation, the both ends of strain transducer can be pasted onto on test specimen to be measured and be tested, it can also be direct
Strain transducer after encapsulation is integrally pasted onto on test specimen to be measured and is tested.Because of the curved shape of strain transducer after encapsulation
Substrate and strain resistor will not strictly be consolidated with the surface of test specimen.It, can also directly will not if measured object surface is softer
The strain transducer of encapsulation elastic film, which is integrally pasted onto on determinand, to be tested.In order to not influence measurement accuracy, preferably should
Packaging film is spring packaging film.The spring packaging film can be prepared using General Purpose Rubber, or can also use poly- two
Methylsiloxane (PDMS) and Ecoflex series silicon rubber, and two kinds of materials have high-insulativity, high resiliency, high extensibility,
The performance of low elastic modulus, elastic recovery capability is good, does not interfere with the stability of strain transducer.Certainly, according to practical measurement
The difference needed can also use other silica gel or rubber material.
Resistance strain provided by the invention can be made by the following method：Finite element software mould is used first
The model structure for intending the strain transducer, obtains the range of the strain transducer；Secondly, right according to practical measurement demand
The range passes through the curvature half for the pliable tune for changing the substrate into adjusting when the default range of the range ratio is less than normal
Diameter, close to the central axes and then will increase the range at the line width for reducing the substrate positioned at the strain resistor of pliable tune；
When the default range of the range ratio is bigger than normal, then can be adjusted by opposite approach, until the strain transducer reaches pre-
If range；Again, using foil resistance foil gauge manufacture craft, according to simulating successful strain transducer model in step 2,
The strain resistor of whole substrate and curved configuration is produced, then the base is cut by the curved configuration with laser
The profile at bottom.When making the strain resistor of whole substrate and curved configuration, it can be etched using etching process preset
The strain resistor of curved configuration, or peel off the excess metal foil except profile using laser and form preset curved configuration
Strain resistor pattern.Finally, welding lead, packaging protection layer encapsulate elastic film, and the resistance of calibration sensor and strain are closed
System.
Resistance strain provided by the invention, compared to current conventional use of foil strain transducer, Neng Gouyou
Effect promotes the range of strain transducer, and range scope of design can be thousands of from a few percent to percent, efficiently solve gold
Category tinsel cord smaller problem of credible range due to the limitation of extensibility, while high certainty of measurement.Meanwhile using the strain sensing
Device carries out multiplicating measurement, and measurement result can keep good consistency, has preferable stability.
The characteristics of illustrating resistance strain in the present invention below by specific embodiment.In following embodiment, base
Bottom 1 is all made of PI films, and strain resistor 2 is constantan tinsel cord.
Embodiment 1：For the embodiment of the resistance strain of structure shown in Figure 12.
The PI film thickness 0.26mm of the strain transducer, PI thin-film widths are 0.2mm, mean radius at semicircle camber line
1.4mm, straight line segment length 6.37mm.Constantan foil is 5 μm thick, and the constantan tinsel cord width of curved section is 0.03mm, distance PI curvature inner side edges
Edge 0.05mm.The constantan foil most width of linkage section is 0.2mm.The both ends of strain transducer are used to paste the PI film lengths of measured object
For 3.1mm, width 2.0mm.
Conservative prediction is credible, and range reaches 50% (being limited to 0.3% calculating by constantan maximum strain).
Embodiment 2：For the embodiment of the resistance strain of structure shown in Figure 13 a, Figure 13 b are the upper left corners Figure 13 a
Partial enlarged view.
The PI film thickness 0.06mm of the strain transducer, PI thin-film widths are 0.18mm, mean radius at semicircle camber line
1.28mm, straight line segment length 0.32mm.Constantan foil is 5 μm thick, and the constantan tinsel cord width of curved section is 0.03mm, distance PI curvature inner side edges
Edge 0.03mm.The constantan foil width of linkage section is 0.12mm, in middle position on PI films.The both ends of strain transducer are for gluing
The PI film lengths for pasting measured object are 4.16mm, width 1.7mm.
The resistance strain is finally encapsulated, and packaging film is silicon rubber, has encapsulated overall thickness 2mm,
Width about 1cm, is about 4cm, and it is 3cm that when experiment test, which removes the remaining drift of gripping section,.
It is 202.95 Europe that experiment, which measures initial resistivity value, and credible range reaches 10%, and precision is preferable, can be with dynamic stability
Work.
Displacement loading curve when Figure 13 c are resistance strain performance tests shown in Figure 13 a, displacement at the uniform velocity add
It carries, period 20s, maximum tension amount is 3mm, i.e., 10% strain is repeated 10 times.When Figure 13 d are that the displacement shown in Figure 13 c loads
The resistivity-time curve that multimeter measures in real time, nature initial value are 202.95 ohm, peak value is stable in 203.81 ±
0.02 ohm, the relative variation of nature and 10% strain regime resistance is 4/1000ths.
Figure 13 e are the resistivity-time curves by the curve shifting in 10 periods in Figure 13 d together, it can be seen from the figure that
Resistance strain provided in this embodiment, the repeatability of many experiments result is preferably.Figure 13 f are to convert Figure 13 e
At resistance change rate-strain curve, it can be seen from the figure that the resistance strain of the present invention is in drawing process and unloading
Resistance variations overlap very well in the process, without hesitation.Hesitation herein refers to that strain transducer is once being drawn
After stretching release completion, resistance value cannot recover immediately initial value, and the regular hour is needed to restore.
More than, although the description of several embodiments of the invention, but these embodiments are intended only as example proposition
, it is not intended to limit the scope of the present invention.For these new embodiments, can be implemented with various other ways,
In the range of not departing from the gist of the invention, various omissions, displacement and change can be carried out.These embodiments and its change
Shape while being contained in scope and spirit of the present invention, is also contained in invention described in claim and its impartial model
In enclosing.
Claims (15)
1. a kind of resistance strain, including：Strain resistor and substrate, the strain resistor are fixed on the substrate,
It is characterized in that,
The substrate is made of insulating materials, is curved configuration, the central axes of the strain resistor are located in the substrate
The increase of the range of the resistance strain is realized in the side of axis.
2. resistance strain according to claim 1, which is characterized in that
The width of the substrate is 2 times or 2 times or more of the strain resistor width.
3. resistance strain according to claim 1, which is characterized in that
The curved configuration is the composite structure of one or more of circular arc, elliptic arc, sine curve.
4. according to claim 1-3 any one of them resistance strains, which is characterized in that
Further include linkage section, the curved configuration includes one or more, and multiple curved configurations pass through the connection
Section is connected with each other, and the head and the tail both ends of multiple curved configurations of interconnection are respectively equipped with the stickup being connected with determinand
End；
Before and after the strain transducer is stretched, the average curvature variable quantity of the linkage section is less than the flat of the curved configuration
Equal Curvature varying amount.
5. resistance strain according to claim 4, which is characterized in that
The resistance value of strain resistor on the linkage section is less than the resistance value of the strain resistor in the curved configuration.
6. resistance strain according to claim 4, which is characterized in that
Multiple curved configurations are set up in parallel, and end is commonly connected to a paste-side.
7. resistance strain according to claim 4, which is characterized in that
Further include substrate limit band, limits the curved configuration and be maintained at preset length state.
8. resistance strain according to claim 7, which is characterized in that
The substrate limit band is set up in parallel with one or more curved configurations, and end is commonly connected to described in one
Paste-side.
9. resistance strain according to claim 7, which is characterized in that
The structure of the substrate limit band is linear, the spacing between length and the paste-side at the curved configuration both ends
It is equal.
10. resistance strain according to claim 7, which is characterized in that
The structure of the substrate limit band is curved shape, and maximal tensility is less than the maximal tensility of the curved configuration,
Assist the compressive strain of detection test specimen to be measured.
11. according to claim 1-10 any one of them resistance strains, which is characterized in that
The material of the substrate is one kind in polyimides, phenolic resin, epoxy resin.
12. according to claim 1-10 any one of them resistance strains, which is characterized in that
The material of the strain resistor is constantan or new constantan.
13. according to claim 1-10 any one of them resistance strains, which is characterized in that
The material of the strain resistor is nichrome, nichrome aluminum alloy, Aludirome, platinum, platinum-tungsten alloys, semiconductor monocrystal
One kind in silicon, graphene.
14. according to claim 1-10 any one of them resistance strains, which is characterized in that
Further include packaging film, the packaging film is coated in the resistance strain.
15. resistance strain according to claim 14, which is characterized in that
The material of the packaging film is dimethyl silicone polymer or Ecoflex series silicon rubber.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/CN2018/089866 WO2019148726A1 (en) | 2018-01-30 | 2018-06-05 | Resistive strain sensor |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2018100888073 | 2018-01-30 | ||
| CN201810088807.3A CN107990822A (en) | 2018-01-30 | 2018-01-30 | A kind of wide range resistance strain and preparation method thereof |
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| CN108444378B CN108444378B (en) | 2024-03-15 |
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| CN201810556672.9A Active CN108444378B (en) | 2018-01-30 | 2018-06-01 | Resistance type strain sensor |
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| CN110333013A (en) * | 2019-07-15 | 2019-10-15 | 承德石油高等专科学校 | A kind of embedded strain gauge |
| CN111521106A (en) * | 2020-03-09 | 2020-08-11 | 江苏柔世电子科技有限公司 | Resistance type strain sensor |
| JP2021004829A (en) * | 2019-06-27 | 2021-01-14 | 日本電産シンポ株式会社 | Torque detection sensor and motive power transmission device |
| JP2021096104A (en) * | 2019-12-16 | 2021-06-24 | 日本電産シンポ株式会社 | Torque detection sensor and power transmission device |
| CN113358016A (en) * | 2021-05-11 | 2021-09-07 | 电子科技大学 | Flexible strain sensor based on piezoelectric effect and preparation method thereof |
| CN113551791A (en) * | 2021-07-02 | 2021-10-26 | 中国科学院力学研究所 | Resistance type strain sensor capable of being rapidly prepared and preparation method thereof |
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| CN107990822A (en) * | 2018-01-30 | 2018-05-04 | 中国科学院力学研究所 | A kind of wide range resistance strain and preparation method thereof |
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Also Published As
| Publication number | Publication date |
|---|---|
| CN107990822A (en) | 2018-05-04 |
| CN108444378B (en) | 2024-03-15 |
| WO2019148726A1 (en) | 2019-08-08 |
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