CN108431544A - 用于测量相元件参数和光纤色散的设备及用于测量相元件参数和光纤色散的方法 - Google Patents

用于测量相元件参数和光纤色散的设备及用于测量相元件参数和光纤色散的方法 Download PDF

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Publication number
CN108431544A
CN108431544A CN201580084639.5A CN201580084639A CN108431544A CN 108431544 A CN108431544 A CN 108431544A CN 201580084639 A CN201580084639 A CN 201580084639A CN 108431544 A CN108431544 A CN 108431544A
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China
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fiber
collimator
fiber coupler
directed
coupler
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Chinese (zh)
Inventor
卡罗尔·施特平
米茶琳娜·久维克
马雷克·那皮尔瑞拉
安娜·泽楼薇姿
卢克斯·斯特克薇姿
米歇尔·穆拉夫斯基
斯坦斯罗·利平斯基
兹比格纽·侯迪斯基
托马斯·斯坦科斯
托马斯·娜斯楼斯基
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Polskie Centrum Fotoniki I Swiatlowodow
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Polskie Centrum Fotoniki I Swiatlowodow
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
    • G01B9/02018—Multipass interferometers, e.g. double-pass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02024—Measuring in transmission, i.e. light traverses the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02062—Active error reduction, i.e. varying with time
    • G01B9/02064—Active error reduction, i.e. varying with time by particular adjustment of coherence gate, i.e. adjusting position of zero path difference in low coherence interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
    • G01B9/02072—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by calibration or testing of interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0271—Testing optical properties by measuring geometrical properties or aberrations by using interferometric methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/331—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by using interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/338—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by measuring dispersion other than PMD, e.g. chromatic dispersion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Geometry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
CN201580084639.5A 2015-09-18 2015-11-30 用于测量相元件参数和光纤色散的设备及用于测量相元件参数和光纤色散的方法 Pending CN108431544A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
PLP.414064 2015-09-18
PL414064A PL237446B1 (pl) 2015-09-18 2015-09-18 Urządzenie do pomiarów parametrów elementów fazowych i dyspersji światłowodów oraz sposób pomiaru parametrów elementu fazowego i dyspersji światłowodów
PCT/PL2015/050065 WO2017048141A1 (en) 2015-09-18 2015-11-30 Device for measuring the parameters of phase elements and optical fiber dispersion and a method of measuring the parameters of phase elements and optical fiber dispersion

Publications (1)

Publication Number Publication Date
CN108431544A true CN108431544A (zh) 2018-08-21

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CN201580084639.5A Pending CN108431544A (zh) 2015-09-18 2015-11-30 用于测量相元件参数和光纤色散的设备及用于测量相元件参数和光纤色散的方法

Country Status (11)

Country Link
US (1) US20200191551A1 (https=)
EP (1) EP3423782B1 (https=)
JP (1) JP2018534547A (https=)
KR (1) KR20180084745A (https=)
CN (1) CN108431544A (https=)
CA (1) CA3000156A1 (https=)
IL (1) IL258173A (https=)
PH (1) PH12018500611A1 (https=)
PL (1) PL237446B1 (https=)
RU (1) RU2713038C2 (https=)
WO (1) WO2017048141A1 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116222390A (zh) * 2022-12-21 2023-06-06 苏州中科行智智能科技有限公司 一种量块测量装置及方法

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CN111901044B (zh) * 2019-11-28 2021-11-02 阳光学院 一种单光束相干光通信装置
CN111258081A (zh) * 2020-02-25 2020-06-09 中国科学院长春光学精密机械与物理研究所 一种基于光纤互联的光学系统装调方法及装置
CN113804405A (zh) * 2021-08-16 2021-12-17 广东工业大学 一种基于双耦合器环行光路结构的微量光纤色散测量装置
CN115035036B (zh) * 2022-05-09 2025-03-11 北京转转精神科技有限责任公司 一种屏幕检测方法以及装置
CN115727890B (zh) * 2022-11-18 2026-03-31 江苏科技大学 一种空间椭圆拟合修正零差对称解调误差的方法
US12442717B2 (en) * 2023-02-03 2025-10-14 Onto Innovation Inc. Interferometer with auxiliary lens for measurement of a transparent test object
CN118936337B (zh) * 2024-09-05 2025-11-14 天津大学 一种透明样品厚度和折射率测量系统及方法

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US20090097036A1 (en) * 2007-10-15 2009-04-16 Michael Galle System and Method to Determine Chromatic Dispersion in Short Lengths of Waveguides Using a Common Path Interferometer
US20100134787A1 (en) * 2008-12-01 2010-06-03 Inha-Industry Partnership Institute Measurement method of chromatic dispersion of optical beam waveguide using interference fringe measurement system
CN102353520A (zh) * 2011-06-10 2012-02-15 北京航空航天大学 一种用于光纤延迟线测量系统的延迟量测量方法及其实现装置
CN103267743A (zh) * 2013-04-08 2013-08-28 辽宁科旺光电科技有限公司 一种折射率测量装置及方法
US20140253907A1 (en) * 2013-03-11 2014-09-11 Lumetrics, Inc. Apparatus and method for evaluation of optical elements
WO2014208572A1 (en) * 2013-06-28 2014-12-31 Canon Kabushiki Kaisha Method for measuring refractive index, refractive index measuring device, and method for producing optical element

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US20090097036A1 (en) * 2007-10-15 2009-04-16 Michael Galle System and Method to Determine Chromatic Dispersion in Short Lengths of Waveguides Using a Common Path Interferometer
US20100134787A1 (en) * 2008-12-01 2010-06-03 Inha-Industry Partnership Institute Measurement method of chromatic dispersion of optical beam waveguide using interference fringe measurement system
CN102353520A (zh) * 2011-06-10 2012-02-15 北京航空航天大学 一种用于光纤延迟线测量系统的延迟量测量方法及其实现装置
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CN103267743A (zh) * 2013-04-08 2013-08-28 辽宁科旺光电科技有限公司 一种折射率测量装置及方法
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CN116222390A (zh) * 2022-12-21 2023-06-06 苏州中科行智智能科技有限公司 一种量块测量装置及方法

Also Published As

Publication number Publication date
WO2017048141A1 (en) 2017-03-23
PH12018500611A1 (en) 2018-10-01
RU2018114296A (ru) 2019-10-18
EP3423782A1 (en) 2019-01-09
EP3423782B1 (en) 2022-01-26
IL258173A (en) 2018-05-31
JP2018534547A (ja) 2018-11-22
RU2713038C2 (ru) 2020-02-03
US20200191551A1 (en) 2020-06-18
PL414064A1 (pl) 2017-03-27
RU2018114296A3 (https=) 2019-10-18
KR20180084745A (ko) 2018-07-25
CA3000156A1 (en) 2017-03-23
PL237446B1 (pl) 2021-04-19

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