CN108342775A - A kind of tantalum doping beta-oxidation gallium crystalline material and its preparation method and application - Google Patents
A kind of tantalum doping beta-oxidation gallium crystalline material and its preparation method and application Download PDFInfo
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- 239000002178 crystalline material Substances 0.000 title claims abstract description 48
- 238000002360 preparation method Methods 0.000 title claims abstract description 24
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 title abstract description 4
- 229910052733 gallium Inorganic materials 0.000 title abstract description 4
- 238000007254 oxidation reaction Methods 0.000 title abstract description 4
- 229910052715 tantalum Inorganic materials 0.000 title description 3
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 title description 3
- QZQVBEXLDFYHSR-UHFFFAOYSA-N gallium(III) oxide Inorganic materials O=[Ga]O[Ga]=O QZQVBEXLDFYHSR-UHFFFAOYSA-N 0.000 claims abstract description 111
- 239000013078 crystal Substances 0.000 claims abstract description 68
- 238000000034 method Methods 0.000 claims abstract description 32
- PBCFLUZVCVVTBY-UHFFFAOYSA-N tantalum pentoxide Inorganic materials O=[Ta](=O)O[Ta](=O)=O PBCFLUZVCVVTBY-UHFFFAOYSA-N 0.000 claims abstract description 28
- 238000002156 mixing Methods 0.000 claims abstract description 21
- 239000000758 substrate Substances 0.000 claims abstract description 8
- 230000005693 optoelectronics Effects 0.000 claims abstract description 4
- 239000003054 catalyst Substances 0.000 claims abstract 2
- 239000000463 material Substances 0.000 claims description 22
- 239000012298 atmosphere Substances 0.000 claims description 21
- 238000000137 annealing Methods 0.000 claims description 15
- 238000007667 floating Methods 0.000 claims description 13
- 238000005245 sintering Methods 0.000 claims description 9
- 238000000227 grinding Methods 0.000 claims description 4
- 230000001590 oxidative effect Effects 0.000 claims description 4
- 230000003287 optical effect Effects 0.000 claims description 2
- 230000008569 process Effects 0.000 abstract description 7
- 239000002994 raw material Substances 0.000 description 16
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 14
- 150000002500 ions Chemical class 0.000 description 11
- 238000011068 loading method Methods 0.000 description 8
- 230000007423 decrease Effects 0.000 description 7
- 238000001035 drying Methods 0.000 description 7
- 238000000498 ball milling Methods 0.000 description 6
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 6
- 239000004810 polytetrafluoroethylene Substances 0.000 description 6
- 230000007547 defect Effects 0.000 description 5
- 235000019441 ethanol Nutrition 0.000 description 5
- 238000002474 experimental method Methods 0.000 description 5
- 239000003574 free electron Substances 0.000 description 5
- 238000010438 heat treatment Methods 0.000 description 5
- 238000002844 melting Methods 0.000 description 5
- 230000008018 melting Effects 0.000 description 5
- 239000000203 mixture Substances 0.000 description 5
- 239000000126 substance Substances 0.000 description 5
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 4
- 238000000462 isostatic pressing Methods 0.000 description 4
- 239000001301 oxygen Substances 0.000 description 4
- 229910052760 oxygen Inorganic materials 0.000 description 4
- 239000007787 solid Substances 0.000 description 4
- 238000003746 solid phase reaction Methods 0.000 description 4
- 239000002904 solvent Substances 0.000 description 4
- 238000012360 testing method Methods 0.000 description 4
- 229910052718 tin Inorganic materials 0.000 description 4
- 229910052593 corundum Inorganic materials 0.000 description 3
- 239000010431 corundum Substances 0.000 description 3
- 238000005336 cracking Methods 0.000 description 3
- 239000012535 impurity Substances 0.000 description 3
- 239000011812 mixed powder Substances 0.000 description 3
- -1 polytetrafluoroethylene Polymers 0.000 description 3
- 238000011160 research Methods 0.000 description 3
- 238000007789 sealing Methods 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 2
- 239000003153 chemical reaction reagent Substances 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 238000011081 inoculation Methods 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 239000012071 phase Substances 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000005355 Hall effect Effects 0.000 description 1
- 229910004481 Ta2O3 Inorganic materials 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
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- 230000000694 effects Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005496 eutectics Effects 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 239000013081 microcrystal Substances 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 230000006911 nucleation Effects 0.000 description 1
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- 229910052719 titanium Inorganic materials 0.000 description 1
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- 229910052726 zirconium Inorganic materials 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/16—Oxides
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J23/00—Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00
- B01J23/16—Catalysts comprising metals or metal oxides or hydroxides, not provided for in group B01J21/00 of arsenic, antimony, bismuth, vanadium, niobium, tantalum, polonium, chromium, molybdenum, tungsten, manganese, technetium or rhenium
- B01J23/20—Vanadium, niobium or tantalum
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J35/00—Catalysts, in general, characterised by their form or physical properties
- B01J35/30—Catalysts, in general, characterised by their form or physical properties characterised by their physical properties
- B01J35/39—Photocatalytic properties
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B13/00—Single-crystal growth by zone-melting; Refining by zone-melting
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/032—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/032—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312
- H01L31/0321—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312 characterised by the doping material
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Abstract
The invention discloses a kind of tantalums to adulterate beta-oxidation gallium crystalline material and its preparation method and application.The Ta adulterates β Ga2O3Crystalline material belongs to monoclinic system, and space group C2/m, resistivity is 2.0 × 10‑4To 1 × 104Within the scope of Ω cm and/or carrier concentration is 5 × 1012To 7 × 1020/cm3In range.Preparation method includes step:By purity 4N or more Ta2O5And Ga2O3Crystal growth is carried out after mixing.High conductivity can be prepared using common process in the present invention, be in the β Ga of N-shaped conductive characteristic2O3Crystalline material provides basis for its application in power electronic devices, opto-electronic device, photochemical catalyst or conductive substrates.
Description
Technical field
The present invention relates to a kind of tantalum (Ta) doping beta-oxidation gallium (β-Ga2O3) crystalline material and its preparation method and application.
Background technology
β-Ga2O3It is a kind of direct band gap semiconductor material with wide forbidden band, energy gap is about 4.8-4.9eV.It has forbidden band
Many advantages, such as width is big, saturated electron drift velocity is fast, thermal conductivity is high, disruptive field intensity is high, chemical property is stablized, from deep ultraviolet
(DUV) all it is transparent to the infrared region (IR), compared with conventional transparent conductive material (TCOs), it is shorter wavelength can be prepared
New generation of semiconductor photoelectric device.
Pure β-Ga2O3Crystal shows as semi-insulating or weaker N-shaped conduction, the raising β-Ga being currently known2O3Crystal
The main method of N-shaped conductive capability is to carry out the doping of 4 valence ions (IV races element), includes mainly the 4th main group and the 4th subgroup
Si, Hf, Ge, Sn, Zr, Ti plasma doping.By taking Si as an example, the dominant mechanism reaction for improving carrier concentration is as follows:
As can be seen from the above equation, the theoretical limit ability that IV races element doping provides free electron is about 1:1, with doping
Concentration improves, and crystal structure difficulty increases, and conductivity improves limitation.
Wherein, Si and Sn is common two doped chemicals in IV races element.American documentation literature US20070166967A1
It is disclosed using Si doping β-Ga with Japanese documentation JP2015083536A2O3Monocrystalline.Although Si disclosed in above-mentioned two document
Adulterate β-Ga2O3Monocrystalline resistivity is 2.0 × 10-3To 8.0 × 102Within the scope of Ω cm, resistivity can be down to 2.0 × 10-3
Ω cm, but above-mentioned lowest resistivity is only theoretic.It is extremely difficult in practice process, due to Si4+With Ga3+Radius
Difference is very big, so as the doping concentration of the IV elements such as Si greatly improves, it will have Second Phase Precipitation, cause under crystal quality
Drop, as US20070166967A1 and JP2015083536A has finally also only prepared Si doping concentrations in 0.2mol% or so
Doping β-the Ga of (referring to Applied Physics Letters, 2008,92,202120)2O3Monocrystalline, the resistance of the doped crystal
Rate is 2.0 × 10-2Ω cm or so (for details, reference can be made to specification Fig. 2).
Periodical literature (Thin Solid Films, 2008,516 (17), 5763-5767) is disclosed adulterates β-using Sn
Ga2O3Monocrystalline, but since the oxide volatility of tin is very strong, even if having added the Sn of 2-10mol% in usual raw material proportioning, obtained
The content of Sn is also only ppm magnitudes in the crystal obtained, this not only brings great difficulty to controlling its content and its uniformity,
And the volatilization of the oxide of tin can also cause the pollution to Preparation equipment.
Therefore, the doping β-Ga of high conductivity how are prepared in a simple manner2O3At the important research of this field
Project.
Invention content
Problem solved by the invention is to overcome existing IV races element doping crystalline state β-Ga2O3Conductivity improves degree
It is limited, the IV races element doping crystalline state β-Ga of high conductivity are prepared2O3Difficult, process conditions harshness that there are crystal structures
Defect, provide a kind of V group element Ta doping β-Ga2O3Crystalline material and its preparation method and application.The V races member of the present invention
Plain Ta doping β-Ga2O3Crystalline material shows N-shaped conductive characteristic, and the β-of high conductivity can be prepared using common process
Ga2O3Crystalline material.
Usually in crystalline state β-Ga2O3Middle doping valence state ratio Ga3+High ion can improve crystalline state β-Ga to a certain extent2O3's
Conductivity, if however Doped ions valence state is excessively high, charge is difficult to balance, and easily generates more doping defect, and defect can consume
Electronics, enabling free-moving carrier quantity is substantially reduced, and cannot effectively be reached and be improved by adulterating high valence ion
Crystalline state β-Ga2O3The purpose of conductivity can also seriously affect the application performance of material.Therefore, generally use ratio in the prior art
Ga3+The IV races member of high 1 valence usually adulterates crystalline state β-Ga2O3, the report adulterated using V group element is there is no, because being mixed with V group element
Miscellaneous β-Ga2O3More doping defect can be introduced, the application performance of material is influenced, is also still unable to get strong theoretical branch at present
It holds, and is also faced with extreme difficulty in specific experiment.
However, the present inventor by scientific design and experimental verification, is surprised to find using a certain amount of 5 valence Ta
Ion doping crystalline state β-Ga2O3More free electrons are provided than common+4 valence ions, improve carrier concentration, Jin Erli
It is controlled in the raising of conductivity, and by the content of doped chemical Ta, controllable β-Ga2O3The electric conductivity of crystalline material, mainly
Defect qualitative mechanism it is as follows:
As can be seen from the above equation, the theoretical limit ability that V group element Ta doping provides free electron can be 1:2, conductivity
Raising degree is significantly greater than IV races element.Therefore, it can be crystallized under high doping concentration using common process and obtain crystal.
Further, the inventors found that the crystalline state β-Ga adulterated to Ta2O3After annealing, the oxygen in lattice can be removed
Vacancy makes the crystalline state β-Ga after doping2O3Band gap is wider, and foundation is provided for its application.
The final present invention solves above-mentioned technical problem by the following technical programs.
The present invention provides a kind of Ta doping β-Ga2O3Crystalline material belongs to monoclinic system, space group C2/m, the Ta
Adulterate β-Ga2O3The resistivity of crystalline material is 2.0 × 10-4To 1 × 104Within the scope of Ω cm and/or carrier concentration 5 ×
1012To 7 × 1020/cm3In range.
In the present invention, term crystalline state (crystalline) material refers to solid matter and accounts for leading existing forms and internal structure
The material of long-range order state, including solid crystal and the prevailing liquid crystal of solid matter etc. is presented.Wherein, crystalline material
By during its crystal structure macroscopical aggregation situation and size of microcrystal divide, including monocrystalline, twin crystal (twin), polycrystalline (powder
It is brilliant), eutectic, crystallite and nanocrystalline etc..In the present invention, macroscopical existence form of crystalline material is not particularly limited, example
Such as can be powder, particle, film.
In the present invention, the Ta doping β-Ga2O3The molecular formula of crystalline material can be Ga2(1-x)Ta2xO3, 0.000000001<
x<0.01, preferably x is 0.000001<x<0.01.
In the present invention, the Ta doping β-Ga2O3Crystalline material is preferably Ta doping β-Ga2O3Crystal is more preferably Ta
Adulterate β-Ga2O3Monocrystalline.
In the present invention, the Ta doping β-Ga2O3The resistivity of crystalline material preferably 2.0 × 10-3To 3.6 × 102Ω·
Within the scope of cm, more preferably within the scope of 0.004-7.9 Ω cm.
In the present invention, the Ta doping β-Ga2O3The carrier concentration of crystalline material is preferably 3.7 × 1015To 6.3 ×
1019/cm3In range, more preferably 3.7 × 1015To 3.0 × 1019/cm3In range.
The present invention also provides a kind of Ta doping β-Ga2O3The preparation method of crystalline material, the preparation method can be according to these
Field it is conventional by purity 4N or more Ta2O5And Ga2O3Crystal growth is carried out after mixing, wherein the Ta2O5And Ga2O3
Preferably according to molar ratio (0.000000001-0.01):(0.09-0.999999999) is mixed, more preferably according to mole
Than (0.000001-0.01):(0.09-0.999999) is mixed.
In the present invention, term purity refers to Ta in sample2O5Or Ga2O3Shared mass fraction.Purity is that 4N indicates Ta2O5Or
Ga2O3Mass content be 99.99%.Work as Ta2O5Or Ga2O3Material purity less than when requiring purity, can because of the excessive shadow of impurity
Ring the electric conductivity of final crystalline material.
In the present invention, the Ta2O5And Ga2O3Purity be preferably 5N or more, i.e. Ta in sample2O5Or Ga2O3Quality
Content is 99.999%.The Ta doping β-Ga2O3Crystalline material is that Ta adulterates β-Ga2O3When monocrystalline, used in preparation process
Ga2O3Purity be preferably 6N or more, i.e. Ga in sample2O3Mass content be 99.9999%.
In the present invention, the Ta doping β-Ga2O3The operation that crystalline material subsequently can also further anneal, to remove
Lacking oxygen in lattice increases the control range of carrier concentration.The temperature and time of the annealing can be that this field is conventional, example
Such as 1000 DEG C -1200 DEG C 3-10h that anneal.
In the present invention, Ta adulterates β-Ga2O3Crystalline material containing raw material include inevitably in subtractive process it is miscellaneous
Inevitably mixed impurity element on prime element and technique, relative to whole constituents, above-mentioned impurity element contains
Amount is preferably in 10ppm or less.
In the present invention, Ta doping β-Ga are prepared2O3It is special that the growing method and growth conditions that crystalline material uses are not made
It limits, can be the growing method and growth conditions of this field routine.The Ta doping β-Ga2O3Crystalline material is adulterated for Ta
β-Ga2O3When monocrystalline, generally use melt method for growing monocrystalline commonly used in the art, melt growth method is typically in the melt
Seed crystal is introduced, then control monocrystalline nucleation carries out phase transformation on the boundary of seed crystal and melt, crystal is promoted constantly to grow up, and one
As include czochralski method, kyropoulos, Bridgman-Stockbarger method, floating zone method, flame melt method etc., floating zone method is a kind of is simple and efficient
Method uses floating zone method in of the invention.
Wherein, Ta doping β-Ga are prepared using floating zone method2O3The step of monocrystalline generally comprise mixing, stick processed, sintering and
Crystal growth.
Wherein, hybrid mode commonly used in the art, such as wet-mixing can be used in the mixing.The wet-mixing
When the solvent type that uses and dosage be not particularly limited, as long as Ta can be made2O5And Ga2O3It is uniformly mixed and is subsequently easy
It removes, generally uses volatile solvent such as ethyl alcohol.By Ta2O5And Ga2O3Pass through baking after disperseing mixing in volatile solvent
Mode can make solvent volatilize completely.To make Ta2O5And Ga2O3Evenly, wet ball grinding also can be used in the wet-mixing for mixing
Technique is mixed, and the time of the wet ball grinding can be this field routine, such as 12-24h.
Wherein, the mode of operation of this field routine can be used in the pressure bar, and pressure bar is generally carried out using isostatic pressing machine.Ability
Field technique personnel know Ta2O5And Ga2O3Mixture can be easy to suppress in powdered, and compacting can be made uniform, if therefore suppressing
There are caking phenomenons for preceding mixture, can be by lapping mode, such as ball milling method, shape of being clayed into power.
In a certain embodiment of the present invention, Ta of the purity in 4N or more2O5With 6N Ga2O3According to molar ratio (0.000001-
0.01):After (0.09-0.999999) mixing, wet ball grinding, Ball-milling Time 12- are carried out by the way that appropriate absolute ethyl alcohol is added
For 24 hours, so that Ta2O5And Ga2O3It mixes well, gained mixture is toasted into 3-6h at 80-100 DEG C later, ethyl alcohol is made to wave completely
Hair, then by the mixture ball milling after drying at powdered, in case pressure bar is used.
Wherein, the sintering can be carried out according to the sintering temperature of this field routine and time, to remove Ta2O5And Ga2O3
Moisture in mixture, and make Ta2O5And Ga2O3Solid phase reaction occurs, forms polycrystal material.The temperature of the sintering is preferably
1400-1600 DEG C, the time of the sintering is preferably 10-20h.The sintering carries out generally in Muffle furnace.
Wherein, the atmosphere of the crystal growth is preferably inert atmosphere or oxidizing atmosphere, to ensure the valence state of Ta ions
Stablize.The inert atmosphere can be the inert atmosphere of this field routine, such as nitrogen atmosphere or argon gas atmosphere;The oxidizing atmosphere can
For the oxidizing atmosphere of this field routine, such as oxygen atmosphere or air atmosphere.
Wherein, Ta doping β-Ga are prepared using floating zone method2O3Monocrystalline, usually by β-Ga2O3Crystal as seed crystal,
Heating makes seed crystal melt, then with sintered Ta2O5And Ga2O3Polycrystalline charge bar contacts seed crystal, then adjusts turn of charge bar and seed crystal
Speed and direction of rotation, inoculation carry out crystal growth, and cooling separation melting zone is to get Ta doping β-Ga later2O3Monocrystalline.The crystal
The speed of growth be preferably 4.5-6mm/h, the rotating speed is preferably 8-12rpm.The usually Temperature fall that cools down, one
As to be cooled to room temperature.The floating zone method prepares Ta doping β-Ga2O3Monocrystalline generally carries out in the stove of floating region.
In a certain embodiment of the present invention, float-zone method grows Ta doping β-Ga2O3Monocrystalline carries out in accordance with the following steps:It will burn
Ta after knot2O5And Ga2O3Polycrystalline charge bar, which is fitted into the stove of floating region, is used as loading rod,<010>β-the Ga in direction2O3Crystal is as seed
Crystalline substance, heating first make seed crystal melt, and then contact loading rod, adjust rotating speed and the direction of rotation of charge bar and seed crystal, and inoculation starts brilliant
Body is grown, and the speed of growth of crystal is 4.5-6mm/h, and rotating speed 8-12rpm, growth atmosphere is air atmosphere, and crystal growth is complete
Bi Hou pulls melting zone, is slowly dropped to room temperature, takes out crystal.
The present invention also provides Ta made from above-mentioned preparation method to adulterate β-Ga2O3Crystalline material.
The present invention also provides Ta doping β-Ga2O3Crystalline material is urged in power electronic devices, opto-electronic device, light
Application in agent or conductive substrates.
Wherein, the opto-electronic device includes transparent electrode, solar panel, luminescent device, optical detector, sensor
Deng;The conductive substrates include substrate material, the Ga as GaN2O3The substrate material etc. of itself.
On the basis of common knowledge of the art, above-mentioned each optimum condition can be combined arbitrarily to get each preferable reality of the present invention
Example.
The reagents and materials used in the present invention are commercially available.
The positive effect of the present invention is that:
(1) present invention uses 5 valence Ta ion doping crystalline state β-Ga2O3The limit capacity for providing free electron is 1:2, hence it is evident that
Higher than the ability (1 that+4 valence ion dopings provide free electron:1), therefore under identical doping concentration can provide it is more from
By electronics, it is more advantageous to raising carrier concentration, improves conductivity.
(2) present invention uses 5 valence Ta ion doping crystalline state β-Ga2O3It is controlled by the content of doped chemical Ta, controllable β-
Ga2O3The electric conductivity of crystalline material.The Ta doping β-Ga of the present invention2O3Crystalline material resistivity can be 2.0 × 10-4To 1 × 104
Control is realized within the scope of Ω cm, carrier concentration can be 5 × 1012To 7 × 1020/cm3Control is realized in range
(3) Ta of the invention doping β-Ga2O3Crystalline material can be prepared using this field conventional method, without high
Expensive raw material and harsh technique.
(4) crystalline state β-Ga of the present invention to Ta doping2O3After annealing, the Lacking oxygen in lattice can be removed, it is dense to increase carrier
The control range of degree provides foundation for its application.
Description of the drawings
Fig. 1 is that embodiment 1-4Ta adulterates β-Ga2O3The Ta of native transistors2O5Doping concentration and carrier concentration and resistivity
Between relational graph.
Fig. 2 is that the Ta after embodiment 1-3 annealing adulterates β-Ga2O3The Ta of crystal2O5Between doping concentration and carrier concentration
Relational graph.
Specific implementation mode
It is further illustrated the present invention below by the mode of embodiment, but does not therefore limit the present invention to the reality
It applies among a range.In the following examples, the experimental methods for specific conditions are not specified, according to conventional methods and conditions, or according to quotient
Product specification selects.
In following embodiments, raw materials used and reagent is all commercially available.
Embodiment 1
A kind of Ta doping β-Ga2O3Monocrystalline, molecular formula Ga2(1-x)Ta2xO3(x=0.0001%), belong to monoclinic system, it is empty
Between group be C2/m, by being made following preparation method, the specific steps are:
(1) dispensing:According to molar ratio 0.999999:0.000001 weigh purity 6N or more Ga2O3With purity 4N with
On Ta2O5Raw material;
(2) batch mixing:The raw material weighed is put into clean polytetrafluoroethylene (PTFE) ball grinder, is put into high-purity corundum ball,
Enter appropriate absolute ethyl alcohol, after sealing, is put into ball mill, batch mixing 12h;
(3) it dries:By ball grinder as in baking oven, 6h is toasted at 80 DEG C, ethyl alcohol is made to volatilize completely, is then placed again into
Ball mill ball milling 10 minutes clays into power the block stock after drying shape;
(4) pressure bar:Mixed powder after drying is put into organic mold, charge bar is pressed into using isostatic pressing machine;
(5) it is sintered:The charge bar suppressed is put into Muffle furnace, 10h is sintered at 1500 DEG C, removes the water in raw material
Point, and make Ta2O5With Ga2O3Solid phase reaction occurs for raw material, forms polycrystal material;
(6) crystal growth:The polycrystalline charge bar sintered is fitted into the stove of floating region and is used as loading rod, and will<010>Direction
β-Ga2O3Crystal is placed on is used as seed crystal below;Heating first makes seed crystal melt, and then contacts charge bar above, reaches and starts after stablizing
The growth of crystal;Rate of crystalline growth is 5mm/h, and rotating speed 10rpm, growth atmosphere is air atmosphere;After crystal growth,
The decline for stopping loading rod making melting zone be gradually disengaged, is slowly dropped to naturally using about 1h by the natural decline of lower faceted crystal
Room temperature takes out crystal;For gained native transistors completely without cracking, color is uniform;
(7) it anneals:Gained native transistors are annealed 3h at 1000 DEG C.
Embodiment 2
A kind of Ta doping β-Ga2O3Monocrystalline, molecular formula Ga2(1-x)Ta2xO3(x=0.005%), belong to monoclinic system, it is empty
Between group be C2/m, preparation process and condition with embodiment 1, only Ta in step (1)2O5Doping concentration it is different,
Ga2O3And Ta2O5Molar ratio be 0.99995:0.00005.
Embodiment 3
A kind of Ta doping β-Ga2O3Monocrystalline, molecular formula Ga2(1-x)Ta2xO3(x=0.1%), belong to monoclinic system, space
Group is C2/m, preparation process and condition with embodiment 1, only Ta in step (1)2O5Doping concentration it is different,
Ga2O3And Ta2O5Molar ratio be 0.999:0.001, and annealing operation is not carried out.
Embodiment 4
A kind of Ta doping β-Ga2O3Monocrystalline, molecular formula Ga2(1-x)Ta2xO3(x=1%), belong to monoclinic system, space group
For C2/m, preparation process and condition are with embodiment 1, only Ta in step (1)2O5Doping concentration it is different, Ga2O3
And Ta2O5Molar ratio be 0.99:0.01, and annealing operation is not carried out.
Embodiment 5
A kind of Ta doping β-Ga2O3Monocrystalline, molecular formula Ga2(1-x)Ta2xO3(x=0.0001%), belong to monoclinic system, it is empty
Between group be C2/m, by being made following preparation method, the specific steps are:
(1) dispensing:According to molar ratio 0.999999:0.000001 weigh purity 6N or more Ga2O3With purity 4N with
On Ta2O5Raw material;
(2) batch mixing:The raw material weighed is put into clean polytetrafluoroethylene (PTFE) ball grinder, is put into high-purity corundum ball,
Enter appropriate absolute ethyl alcohol, after sealing, be put into ball mill, batch mixing is for 24 hours;
(3) it dries:By ball grinder as in baking oven, 3h is toasted at 100 DEG C, ethyl alcohol is made to volatilize completely, is then put again
Enter ball mill ball milling 10 minutes the block stock after drying is clayed into power shape;
(4) pressure bar:Mixed powder after drying is put into organic mold, charge bar is pressed into using isostatic pressing machine;
(5) it is sintered:The charge bar suppressed is put into Muffle furnace, 20h is sintered at 1400 DEG C, removes the water in raw material
Point, and make Ta2O5With Ga2O3Solid phase reaction occurs for raw material, forms polycrystal material;
(6) crystal growth:The polycrystalline charge bar sintered is fitted into the stove of floating region and is used as loading rod, and will<010>Direction
β-Ga2O3Crystal is placed on is used as seed crystal below;Heating first makes seed crystal melt, and then contacts charge bar above, reaches and starts after stablizing
The growth of crystal;Rate of crystalline growth is 4.5mm/h, and rotating speed 12rpm, growth atmosphere is air atmosphere;Crystal growth finishes
Afterwards, the decline for stopping loading rod, makes melting zone be gradually disengaged by the natural decline of lower faceted crystal, is slowly dropped naturally using about 1h
To room temperature, crystal is taken out;For gained native transistors completely without cracking, color is uniform;
(7) it anneals:Gained native transistors are annealed 4h at 1200 DEG C.
Embodiment 6
A kind of Ta doping β-Ga2O3Monocrystalline, molecular formula Ga2(1-x)Ta2xO3(x=0.0001%), belong to monoclinic system, it is empty
Between group be C2/m, by being made following preparation method, the specific steps are:
(1) dispensing:According to molar ratio 0.999999:0.000001 weigh purity 6N or more Ga2O3With purity 4N with
On Ta2O5Raw material;
(2) batch mixing:The raw material weighed is put into clean polytetrafluoroethylene (PTFE) ball grinder, is put into high-purity corundum ball,
Enter appropriate absolute ethyl alcohol, after sealing, is put into ball mill, batch mixing 18h;
(3) it dries:By ball grinder as in baking oven, 5h is toasted at 90 DEG C, ethyl alcohol is made to volatilize completely, is then placed again into
Ball mill ball milling 10 minutes clays into power the block stock after drying shape;
(4) pressure bar:Mixed powder after drying is put into organic mold, charge bar is pressed into using isostatic pressing machine;
(5) it is sintered:The charge bar suppressed is put into Muffle furnace, 10h is sintered at 1600 DEG C, removes the water in raw material
Point, and make Ta2O5With Ga2O3Solid phase reaction occurs for raw material, forms polycrystal material;
(6) crystal growth:The polycrystalline charge bar sintered is fitted into the stove of floating region and is used as loading rod, and will<010>Direction
β-Ga2O3Crystal is placed on is used as seed crystal below;Heating first makes seed crystal melt, and then contacts charge bar above, reaches and starts after stablizing
The growth of crystal;Rate of crystalline growth is 6mm/h, and rotating speed 8rpm, growth atmosphere is air atmosphere;After crystal growth,
The decline for stopping loading rod making melting zone be gradually disengaged, is slowly dropped to naturally using about 1h by the natural decline of lower faceted crystal
Room temperature takes out crystal;For gained native transistors completely without cracking, color is uniform;
(7) it anneals:Gained native transistors are annealed 10h at 1000 DEG C.
Reference examples
A kind of pure β-Ga2O3Monocrystalline, preparation process and condition do not carry out Ta only with embodiment 12O5Doping.
Effect example 1
By the Ta doping β-Ga obtained by embodiment 1-62O3Pure β-the Ga of monocrystalline and reference examples2O3Monocrystalline (including primary crystal
Crystal after body and annealing) it is cut into 5mm × 5mm × 0.3mm samples respectively, after making indium electrode on quadrangle, imitated using Hall
Tester is answered to be tested.Test result show embodiment 1-6 doped crystals conduction type be N-shaped, wherein embodiment 1-4 and
The carrier concentration and resistivity measurement result of reference examples sample are as shown in table 1 below:
The carrier concentration and resistivity of table 1 embodiment 1-4 and reference examples
By upper table data it is found that pure β-Ga2O3After native transistors annealing, almost insulate.And compared to pure β-Ga2O3
Native transistors, with Ta doping β-Ga2O3Carrier concentration is significantly increased after monocrystalline, and conductivity is obviously improved, wherein carrier concentration
Increasing degree is at least 103More than, resistivity reduces at least 500 times, shows that Ta ions are successfully doped into β-Ga2O3In lattice.
The resistivity and carrier concentration of embodiment 5 and 6 samples are substantially suitable with embodiment 1.
Further, it is the relationship of Ta doping concentrations and carrier concentration and resistivity in research native transistors, the present invention paints
Tas of the embodiment 1-4 without annealing specimen is made2O5The curve of doping concentration-carrier concentration-resistivity, for details, reference can be made to attached
Fig. 1.In addition, for Ta after research annealing2O5The relationship of doping concentration and carrier concentration, the present invention depict embodiment 1-3 annealing
The Ta of sample afterwards2O5Doping concentration-carrier concentration curve, for details, reference can be made to attached drawings 2.
It will be noted from fig. 1 that Ta2O5Doping concentration and carrier concentration and Ta2O5Doping concentration and resistivity it
Between it is substantially in a linear relationship.Within the scope of the doping concentration of the present invention, sample is with Ta before annealing2O5The increase of doping concentration carries
It flows sub- concentration to linearly increase substantially, resistivity linearly declines substantially.From figure 2 it can be seen that carrier after sample annealing
Concentration decline, and anneal after sample Ta2O5It is also substantially in a linear relationship between doping concentration and carrier concentration.
It should be noted that above-mentioned Ta doping β-Ga2O3The carrier concentration and resistivity of monocrystalline are specific experiment of the present invention
It obtains, due to the influence of material purity, preparation process and test condition etc. in practice, the load of actually measured doped crystal can be made
There are gaps with theoretical value for fluid concentrations and resistivity, or in the presence of the case where can not detecting.Therefore, above-described embodiment is only
It is for example, those skilled in the art can deduce Ta according to Ta doping concentrations combination general knowledge known in this field disclosed by the invention
Adulterate β-Ga2O3The carrier concentration of crystalline material substantially can be 5 × 1012To 7 × 1020/cm3Control, electricity are realized in range
Resistance rate can be 2.0 × 10-4To 1 × 104Control is realized within the scope of Ω cm.It is specific to calculate that process is as follows:
β-the Ga obtained according to present invention experiment2O3The maximum value that Ta is mixed in monocrystalline is 1at%,
And 1mol β-Ga2O3Volume be 184.44/5.94cm3=31cm3;
Then 1mol mixes the β-Ga of Ta 1at%2O3In the number of atom containing Ta be:1 × 2 × 1% × 6.023 × 1023=1.2
×1022;
Therefore, the β-Ga of Ta 1at% are mixed2O3The theoretical value of carrier concentration is=2 × 1.2 × 1022/ 31=7.7 ×
1020/cm3。
Furthermore the limiting value of used Hall effects low-resistance module testing resistivity is 105, experiments indicate that 6N is pure
β-Ga2O3Exceed test limits after crystal annealing, illustrates its resistivity>105, therefore use in the pure β-Ga of 6N2O3Mixing Ta completely can be with
By resistivity control to 1 × 104, this numerical value is the 1/1266 of embodiment 1, and the carrier concentration in embodiment is multiplied by 1/
1266 can obtain 3 × 1012/cm3, so Ta doping β-Ga2O3The resistivity of crystalline material realizes 5 × 1012/cm3It is also feasible.
The doping concentration of Ta corresponding with the carrier concentration is then 10-7At%.
Therefore, Ta adulterates β-Ga2O3The Ta dopings of crystalline material can in 0.0000001mol% to 1mol% ranges,
Resistivity can be 2.0 × 10-4To 1 × 104Control is realized within the scope of Ω cm, carrier concentration can be 5 × 1012To 7 × 1020/
cm3Control is realized in range.
Embodiments of the present invention are explained above, the right embodiment is illustrated only for the purposes of explanation, not
To limit the present invention, those skilled in the art can make several changes without departing from the spirit and scope of the present invention
With retouching, the protection domain that the present invention is advocated should be subject to described in claims.
Claims (10)
1. a kind of Ta doping β-Ga2O3Crystalline material belongs to monoclinic system, space group C2/m, the Ta doping β-Ga2O3Crystalline state
The resistivity of material is 2.0 × 10-4To 1 × 104Within the scope of Ω cm and/or carrier concentration is 5 × 1012To 7 × 1020/cm3
In range.
2. Ta doping β-Ga as described in claim 12O3Crystalline material, which is characterized in that the Ta doping β-Ga2O3Crystalline state material
The molecular formula of material is Ga2(1-x)Ta2xO3, 0.000000001<x<0.01.
3. Ta doping β-Ga as claimed in claim 22O3Crystalline material, which is characterized in that 0.000001<x<0.01.
4. Ta doping β-Ga as claimed in claim 22O3Crystalline material, which is characterized in that the Ta doping β-Ga2O3Crystalline state material
Material is that Ta adulterates β-Ga2O3Crystal;
And/or the Ta doping β-Ga2O3The resistivity of crystalline material is 2.0 × 10-3To 3.6 × 102Within the scope of Ω cm;
And/or the Ta doping β-Ga2O3The carrier concentration of crystalline material is 3.7 × 1015To 6.3 × 1019/cm3In range.
5. Ta doping β-Ga as claimed in claim 42O3Crystalline material, which is characterized in that the Ta doping β-Ga2O3Crystalline state material
Material is that Ta adulterates β-Ga2O3Monocrystalline;
And/or the Ta doping β-Ga2O3The resistivity of crystalline material is within the scope of 0.004-7.9 Ω cm;
And/or the Ta doping β-Ga2O3The carrier concentration of crystalline material is 3.7 × 1015To 3.0 × 1019/cm3In range.
6. a kind of Ta doping β-Ga2O3The preparation method of crystalline material, the preparation method include the following steps:By purity in 4N
Above Ta2O5And Ga2O3Crystal growth is carried out after mixing;
Wherein, the Ta2O5And Ga2O3The preferred 5N or more of purity;The Ta doping β-Ga2O3Crystalline material is that Ta adulterates β-
Ga2O3When monocrystalline, the Ga that is used in preparation process2O3Purity is preferably in 6N or more;
Wherein, the Ta2O5And Ga2O3Preferably according to molar ratio (0.000000001-0.01):(0.09-0.999999999),
More preferably according to molar ratio (0.000001-0.01):(0.09-0.999999) is mixed;
Optionally, after crystal growth, gained Ta doping β-Ga2O3Crystalline material also carries out annealing steps.
7. preparation method as claimed in claim 6, which is characterized in that the Ta doping β-Ga2O3Crystalline material is that Ta adulterates β-
Ga2O3When monocrystalline, using melt method for growing monocrystalline, it is preferred to use floating zone method;
Wherein, Ta doping β-Ga are prepared using floating zone method2O3Monocrystalline includes mixing, stick processed, sintering and crystal growth step;
Optionally, the mixing uses wet-mixing, it is preferred to use wet ball grinding technique is mixed;
Optionally, the temperature of the sintering is 1400-1600 DEG C, and the time of the sintering is 10-20h;
Optionally, the atmosphere of the crystal growth is inert atmosphere or oxidizing atmosphere;
Optionally, the speed of growth of the crystal is 4.5-6mm/h, rotating speed 8-12rpm.
8. Ta doping β-Ga made from a kind of preparation method as claimed in claims 6 or 72O3Crystalline material.
9. Ta adulterates β-Ga as described in any one of claim 1-5 and 82O3Crystalline material is in power electronic devices, photoelectron device
Application in part, photochemical catalyst or conductive substrates.
10. application as claimed in claim 9, which is characterized in that the opto-electronic device includes transparent electrode, solar cell
Plate, luminescent device, optical detector and sensor;The conductive substrates include being used as GaN and Ga2O3The substrate material of itself.
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109183151A (en) * | 2018-09-20 | 2019-01-11 | 南京同溧晶体材料研究院有限公司 | Graphene quantum dot adulterates gallium oxide crystalline material and preparation method thereof |
CN109957759A (en) * | 2019-05-13 | 2019-07-02 | 北京镓族科技有限公司 | Cu adulterates β-Ga2O3The preparation method of film and corresponding structure |
CN114059173A (en) * | 2022-01-17 | 2022-02-18 | 浙江大学杭州国际科创中心 | Device and method for preparing gallium oxide material rod |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1754013A (en) * | 2003-02-24 | 2006-03-29 | 学校法人早稻田大学 | B-ga2o3 single crystal growing method, thin-film single crystal growing method, ga2o3 light-emitting device, and its manufacturing method |
TW201144227A (en) * | 2003-02-24 | 2011-12-16 | Univ Waseda | β -Ga2O3 type single crystal growth method |
CN103765593A (en) * | 2011-09-08 | 2014-04-30 | 株式会社田村制作所 | Ga2o3 semiconductor element |
CN103878010A (en) * | 2014-04-15 | 2014-06-25 | 哈尔滨工业大学 | Preparation method of VB-group metal ion doped (Ga<1-x>Znx)(N<1-x>Ox) solid solution photocatalyst |
CN105239162A (en) * | 2015-08-25 | 2016-01-13 | 中国科学院上海光学精密机械研究所 | Aluminum oxide-gallium oxide mixed-crystal material for wide-band-gap semiconductors |
-
2017
- 2017-01-25 CN CN201710061035.XA patent/CN108342775B/en active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1754013A (en) * | 2003-02-24 | 2006-03-29 | 学校法人早稻田大学 | B-ga2o3 single crystal growing method, thin-film single crystal growing method, ga2o3 light-emitting device, and its manufacturing method |
TW201144227A (en) * | 2003-02-24 | 2011-12-16 | Univ Waseda | β -Ga2O3 type single crystal growth method |
CN103765593A (en) * | 2011-09-08 | 2014-04-30 | 株式会社田村制作所 | Ga2o3 semiconductor element |
CN103878010A (en) * | 2014-04-15 | 2014-06-25 | 哈尔滨工业大学 | Preparation method of VB-group metal ion doped (Ga<1-x>Znx)(N<1-x>Ox) solid solution photocatalyst |
CN105239162A (en) * | 2015-08-25 | 2016-01-13 | 中国科学院上海光学精密机械研究所 | Aluminum oxide-gallium oxide mixed-crystal material for wide-band-gap semiconductors |
Non-Patent Citations (2)
Title |
---|
H. SESHADRI • P ET AL.: "Photocatalytic performance of combustion synthesized beta-Ga2O3 for the degradation of tri-n-butyl phosphate in aqueous solution", 《JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY》 * |
马世昌主编: "《化学物质辞典》", 30 April 1999, 陕西科学技术出版社 * |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109183151A (en) * | 2018-09-20 | 2019-01-11 | 南京同溧晶体材料研究院有限公司 | Graphene quantum dot adulterates gallium oxide crystalline material and preparation method thereof |
CN109183151B (en) * | 2018-09-20 | 2023-08-18 | 江苏穿越光电科技有限公司 | Graphene quantum dot doped gallium oxide crystal material and preparation method thereof |
CN109957759A (en) * | 2019-05-13 | 2019-07-02 | 北京镓族科技有限公司 | Cu adulterates β-Ga2O3The preparation method of film and corresponding structure |
CN114059173A (en) * | 2022-01-17 | 2022-02-18 | 浙江大学杭州国际科创中心 | Device and method for preparing gallium oxide material rod |
CN114059173B (en) * | 2022-01-17 | 2022-04-01 | 浙江大学杭州国际科创中心 | Device and method for preparing gallium oxide material rod |
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