CN108333529B - Power supply test system and test method thereof - Google Patents
Power supply test system and test method thereof Download PDFInfo
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- CN108333529B CN108333529B CN201710039980.XA CN201710039980A CN108333529B CN 108333529 B CN108333529 B CN 108333529B CN 201710039980 A CN201710039980 A CN 201710039980A CN 108333529 B CN108333529 B CN 108333529B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
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- Charge And Discharge Circuits For Batteries Or The Like (AREA)
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Abstract
A power supply test system and a test method thereof are provided, the power supply test system comprises a power supply test device, a plurality of electronic devices, a switching device and a management device, and the power supply test device comprises a control unit and a power supply unit. Each electronic device is electrically connected with the power supply unit and comprises a substrate control unit, an execution unit and a memory unit. The management device comprises a processing unit. The power supply unit of the power supply testing device is controlled by the control unit to start and stop supplying power to the electronic device, so that the power supply can be simultaneously supplied and the electronic device can be tested, and the processing unit is connected with the substrate control unit through the exchange device, can receive and compare the reply message and generate an acknowledgement message, and is powered off after being transmitted to the control unit. And after a power-off time, the control unit controls the power supply unit to supply power to the electronic device again.
Description
Technical Field
The present invention relates to a testing system, and more particularly, to a power testing system and a testing method thereof.
Background
Generally, electronic devices such as computers and servers are required to be verified and tested, such as: the power switch cycle test of multiple startup/shutdown tests and restart tests or other power signal tests and the like are carried out for detection and verification, so as to ensure the reliability and stability of the power switch cycle test. However, most of the test and verification methods are manually performed to perform the power switch cycle test, and the number of electronic devices to be verified is large, which is time-consuming and labor-consuming, and also does not meet economic benefits, so how to save labor and improve testing efficiency greatly needs to be researched and discussed by practitioners.
Disclosure of Invention
Therefore, the present invention is directed to a power testing system with time saving, labor saving and efficiency.
Therefore, the power supply testing system comprises a power supply testing device, a plurality of electronic devices respectively electrically connected with the power supply testing device, an exchange device and a management device capable of remotely managing the electronic devices.
The power supply testing device comprises a power supply unit connected with an external power supply, a control unit connected with the power supply unit, a power supply unit electrically connected with the power supply unit and the control unit and controlled by the control unit to start and stop power transmission, and a serial port connected with the control unit.
Each electronic device comprises a substrate control unit with a connection port, an execution unit connected with the substrate control unit, and a memory unit which is connected with the execution unit and has a test mode.
The switching device comprises a first serial port and a plurality of second serial ports which are respectively connected with the connecting ports of the substrate control unit.
The management device is connected with the external power supply and comprises a first serial port connected with the serial port of the power supply testing device, a second serial port connected with the first serial port of the switching device and a processing unit connected with the first serial port and the second serial port.
After the power supply testing device is started and the electronic devices are started, the execution unit of each electronic device executes the testing mode of the memory unit to generate a response message, the response message is transmitted to the corresponding second serial port through the connecting port of the substrate control unit and is transmitted to the second serial port of the management device through the first serial port. The processing unit of the management device receives the reply messages, compares each reply message with a built-in check file, generates a confirmation message when the processing unit completely compares the received reply messages, transmits the confirmation message to the control unit from the first sequence port through the serial port of the power supply testing device, controls the power supply unit not to supply power to the electronic device, and controls the power supply unit to supply power to the electronic device again through a power-off time.
Therefore, another objective of the present invention is to provide a time-saving, labor-saving and efficient method for testing a power switch.
Therefore, the testing method of the power switch is applied to a power testing system, and the power testing system comprises a power testing device, a plurality of electronic devices, an exchange device and a management device. The power supply testing device comprises a power supply unit, a control unit, a power supply unit and a serial port. Each electronic device is electrically connected with the power supply unit and comprises a substrate control unit with a connection port, an execution unit and a memory unit. The switching device comprises a first serial port and a plurality of second serial ports. The management device comprises a first sequence port, a second sequence port and a processing unit. The testing method of the power switch comprises a step (A), a step (B), a step (C) and a step (D).
In the step (a), the power unit of the power testing device and the management device are connected to an external power source and the power testing device and the management device are turned on, and the control unit controls the power supply unit to supply power to the electronic device and to turn on the electronic device.
In the step (B), the execution unit of each electronic device executes the test mode of the memory unit to generate a response message, and the response message is transmitted to the second serial port of the management device through the first serial port after being transmitted to the second serial port of the corresponding switching device through the connection port of the substrate control unit.
In the step (C), the processing unit receives the reply messages from the second serial port and compares each reply message with a built-in check file, and when the processing unit completely compares the received reply messages, the processing unit generates an acknowledgement message and transmits the acknowledgement message from the first serial port to the control unit through the serial port of the power test device.
In the step (D), the control unit controls the power supply unit not to supply power to the electronic device, and after a power-off time, the control unit controls the power supply unit to supply power to the electronic device again and to start up the electronic device, and returns to the step (B).
Compared with the prior art, the power supply testing device has the advantages that the power supply unit of the power supply testing device is controlled to be turned on and turned off to supply power to the electronic device, so that the power can be supplied simultaneously and the electronic device can be tested, after the electronic device is tested, the control unit controls the power supply unit not to supply power to the electronic device, and after a power-off time, the control unit controls the power supply unit to supply power to the electronic device again to perform the circular test.
[ description of the drawings ]
FIG. 1 is a block diagram illustrating an embodiment of a power test system of the present invention; and
fig. 2 is a flowchart illustrating a method for testing a power switch according to an embodiment of the present invention.
[ detailed description ] embodiments
Before the present invention is described in detail, it should be noted that in the following description, similar components are denoted by the same reference numerals.
Referring to fig. 1 and fig. 2, the power testing system of the present invention includes a power testing apparatus 1, a plurality of electronic apparatuses 2 electrically connected to the power testing apparatus 1, an exchanging apparatus 3, and a management apparatus 4 capable of remotely managing the electronic apparatuses 2.
The power testing device 1 includes a power unit 11 connected to an external power source 50, a control unit 12 connected to the power unit 11, a power supply unit 13 electrically connected to the power unit 11 and the control unit 12 and controlled by the control unit 12 to turn on and off power transmission, and a serial port 14 connected to the control unit 12. The serial port 14 of the power testing device 1 has a set of handshaking pins (not shown).
Each electronic device 2 includes a substrate control unit 21 having a connection port 211, an execution unit 22 connected to the substrate control unit 21, and a memory unit 23 connected to the execution unit 22 and having a test mode.
The switching device 3 includes a first serial port 31 and a plurality of second serial ports 32 respectively connected to the connection ports 211 of the substrate control unit 21.
The management device 4 is connected to the external power source 50 and includes a first serial port 41 connected to the serial port 14 of the power testing device 1, a second serial port 42 connected to the first serial port 31 of the switching device 3, and a processing unit 43 connected to the first serial port 41 and the second serial port 42. The first serial port 41 is connected to the serial port 14. The processing unit 43 of the management device 4 is built with a configuration file (not shown) and a check file (not shown). In this embodiment, each reply message is transmitted from the connection port 211 of the substrate control unit 21 to the corresponding second serial port 32 in the form of a packet, the configuration file of the processing unit 43 records a packet acknowledgement data corresponding to each reply message to be received, and the processing unit 43 matches each received reply message with the packet acknowledgement data corresponding to the configuration file to identify and acknowledge each received reply message.
When in use, the power unit 11 of the power testing device 1 and the management device 4 are connected to the external power source 50, and then the power testing device 1 and the management device 4 are turned on. After the power testing device 1 is turned on, the control unit 12 controls the power supply unit 13 to supply power to the electronic devices 2 and turns on the electronic devices 2, and after each electronic device 2 enters an operating system, the execution unit 22 executes the test mode of the memory unit 23 to generate a response message. In the present embodiment, the test pattern is stored in the memory unit 23, but not limited thereto, and can be stored in, for example: in a storage device of a hard disk or a portable access device (USB), it is only necessary that each electronic device 2 is powered on and the corresponding execution unit 22 can execute the test mode in time.
Each reply message is transmitted to the second serial port 32 corresponding to the switch device 3 through the connection port 211 of the substrate control unit 21, and is transmitted to the second serial port 42 of the management device 4 through the first serial port 31, and the processing unit 43 of the management device 4 receives the reply messages through the second serial port 42 and compares each reply message with the check file. In this embodiment, the Switch device 3 is a network Switch (Switch), and can perform data transmission with the second serial port 32 through the first serial port 31. In addition, each reply message is sent in the form of a packet from the connection port 211 of each board control unit 21 to the first serial port 31 through the second serial port 32 corresponding to the switch device 3, and further sent to the processing unit 43 of the management device 4. In other words, the processing unit 43 is connected to the connection port 211 of the substrate control unit 21 through the switch device 3, and can communicate with each substrate control unit 21 and transmit messages. Furthermore, the configuration file of the processing unit 43 records the packet acknowledgement data corresponding to each reply message that needs to be received, and the processing unit 43 matches each received reply message with the packet acknowledgement data corresponding to the configuration file to identify and acknowledge each received reply message. The processing unit 43 matches the reply message with the data of the inspection file for comparison and stores the comparison result as an inspection Log (Log) (not shown). In this embodiment, the check record table records a plurality of record fields (not shown) respectively corresponding to the electronic device 2, and after the processing unit 43 matches each received reply message with the data of the check file for comparison check and verification, the processing unit 43 records and stores the comparison result data in the corresponding record fields in the check record table, for example: the successful number of booting times, etc. is favorable for the subsequent administrator to confirm the data and analyze, but not limited thereto.
When the processing unit 43 completes the comparison of all the reply messages, an acknowledgement message is generated and the processing unit 43 transmits the acknowledgement message from the first serial port 41 to the control unit 12 through the serial port 14 of the power testing apparatus 1. At this time, the control unit 12 controls the power supply unit 13 not to supply power to the electronic device 2, and after a power-off time, the control unit 12 controls the power supply unit 13 to supply power to the electronic device 2 again, so that the electronic device 2 is turned on and executes the test mode. In this embodiment, the control unit 12 is configured to be switchable between a conductive position and a non-conductive position through a switch 15, in the conductive position, the power unit 11 conducts power to the power unit 13, and the power unit 13 can supply power to the electronic device 2; in the non-conductive position, the power unit 11 cannot conduct electricity to the power unit 13, and the power unit 13 cannot supply electricity to the electronic device 2, but not limited thereto.
It should be noted that, when the processing unit 43 has compared the received reply message to generate the acknowledgement message, after the group of handshake pins of the first serial port 41 and the serial port 14 generate a handshake confirmation signal and transmit the handshake confirmation signal to the control unit 12, the processing unit 43 transmits the acknowledgement message from the first serial port 41 to the control unit 12 through the serial port 14, and the control unit 12 controls the power supply unit 13 not to supply power to the electronic device 2. In this embodiment, the serial port 14 is an RS232 connector, and the handshake pins and the first serial port 41 are hardware handshake pins and utilize cts (clear to send) and rts (request to send) of the handshake pins to generate the handshake confirmation signal, so as to confirm signal transmission, thereby achieving that the processing unit 43 completely compares the reply messages to complete the generation of the acknowledgement message and transmits the acknowledgement message to the control unit 12. And the control unit 12 can know that the data of the acknowledgement message is received through the handshake acknowledgement signal, and further control the power supply unit 13 not to supply power to the electronic device 2, and after a power-off time, the control unit 12 controls the power supply unit 13 to supply power to the electronic device 2 again.
By the design that the power supply unit 13 of the power supply testing device 1 is controlled to start and stop supplying power to the electronic device 2, power can be supplied simultaneously, and the electronic device 2 can be started for testing. After the testing of the electronic device 2 is completed, the processing unit 43 is connected to the connection port 211 of the substrate control unit 21 through the switch device 3 to receive and compare the response message, and transmit the acknowledgement message to the control unit 12. Furthermore, after the control unit 12 receives the acknowledgement message through the handshake mechanism of the handshake acknowledgement signal, the control unit 12 controls the power supply unit 13 not to supply power to the electronic device 2, and after a power-off time, the control unit 12 controls the power supply unit 13 to supply power to the electronic device 2 again.
Referring to fig. 1 and 2, the embodiment of the testing method of the power switch of the invention is applied to the power testing system described above, and the testing method of the power switch includes a step (a), a step (B), a step (C), and a step (D).
First, in the step (a), the power unit 11 of the power testing apparatus 1 and the management apparatus 4 are connected to an external power source 50, the power testing apparatus 1 and the management apparatus 4 are turned on, and the control unit 12 controls the power supply unit 13 to supply power to the electronic apparatus 2 and turn on the electronic apparatus 2. Briefly, the power testing apparatus 1 and the management apparatus 4 are powered on and powered on, and the control unit 12 of the power testing apparatus 1 controls the power supply unit 13 to simultaneously supply power to the electronic apparatus 2 and power on the electronic apparatus 2.
Next, in the step (B), the execution unit 22 of each electronic device 2 executes the test mode of the memory unit 23 to generate a corresponding response message, and transmits the response message to the corresponding second serial port 32 through the connection port 211 of the substrate control unit 21, and then transmits the response message to the second serial port 42 of the management device 4 through the first serial port 31. In detail, each electronic device 2 is turned on and enters the operating system, each execution unit 22 automatically executes the test mode of the memory unit 23 and performs the test, and after the test is finished, each execution unit 22 generates a corresponding reply message and transmits the reply message to the corresponding substrate control unit 21, transmits the reply message to the second serial port 32 of the corresponding switching device through the connection port 211, and then transmits the reply message to the second serial port 42 of the management device 4 through the first serial port 31, so that the processing unit 43 of the management device 4 can receive the reply message. In the embodiment, the Switch device 3 is a network Switch (Switch), and can perform data transmission with the second serial port 32 through the first serial port 31. In addition, each reply message is sent in the form of a packet from the connection port 211 of each board control unit 21 to the first serial port 31 through the second serial port 32 corresponding to the switch device 3, and further sent to the processing unit 43 of the management device 4.
In the step (C), the processing unit 43 receives the response messages from the second serial port 42 and compares each response message with the built-in check file, when the processing unit 43 completely compares all the received response messages, the processing unit 43 generates the acknowledgement message and transmits the acknowledgement message from the first serial port 41 to the control unit 12 through the serial port 14 of the power testing apparatus 1. Further, the step (C) includes a step (C1), and a step (C2). In step (C1), the processing unit 43 receives the reply message from the second serial port 42, and identifies and acknowledges the received reply message in association with the packet acknowledgment data of the configuration file. In the step (C2), when the processing unit 43 matches all the received reply messages with the check file, the processing unit 43 generates the acknowledgement message and transmits the acknowledgement message from the first serial port 41 to the control unit 12 via the serial port 14 of the power testing apparatus 1. In the present embodiment, in the step (B), each reply message is a corresponding test file generated after each electronic device 2 completes the test mode, each test file records a square wave signal data of the test result, in the step (C2), the check file of the processing unit 43 has a standard square wave signal data, the processing unit 43 compares the square wave signal data of the reply message with the built-in standard square wave signal data of the check file and completes the confirmation to generate the confirmation message, but not limited thereto, the required comparison mechanism can be designed according to the actual situation.
It should be noted that, in the present embodiment, the first serial port 41 of the management device 4 is connected to the set of handshake pins of the serial port 14, and in the step (C2), when the processing unit 43 of the management device 4 confirms that all the reply messages required to be received have been received according to the configuration file and completes the comparison of the reply messages with the check file, the acknowledgement message is generated. At this time, after the processing unit 43 controls the first serial port 41 and the set of handshake pins of the serial port 14 to handshake and generate the handshake confirmation signal to be transmitted to the control unit 12, the processing unit 43 then transmits the confirmation message from the first serial port 41 to the control unit 12 through the serial port 14. After receiving the handshake confirmation signal, the control unit 12 starts to receive the confirmation message. In short, the processing unit 43 knows which of all the reply messages to be received through the configuration file, and the processing unit 43 will wait for all the reply messages to be received and generate the acknowledgement message after matching with the check file, and the processing unit 43 generates the handshake confirmation signal by using the first serial port 41 and the set of handshake pins and transmits the handshake confirmation signal to the control unit 12, but not limited thereto. For example, the processing unit 43 may complete the comparison of the received reply message with the check file and generate the acknowledgement message within a predetermined receiving time, and control the first serial port 41 to handshake with the set of handshake pins to generate the handshake acknowledgement signal and transmit the handshake acknowledgement signal to the control unit 12, and then transmit the acknowledgement message to the control unit 12. In other words, the processing unit 43 does not need to wait for all the reply messages to be received, and the processing unit 43 generates the acknowledgement message to be transmitted to the control unit 12 as long as the predetermined receiving time is reached.
Finally, in the step (D), the control unit 12 controls the power supply unit 13 not to supply power to the electronic device 2, and after the power-off time, the control unit 12 controls the power supply unit 13 to supply power to the electronic device 2 again and starts up the electronic device 2, and the step (B) is returned. By the design that the power supply unit 13 of the power supply testing device 1 is controlled by the control unit 12 to start and stop supplying power to the electronic device 2, power can be supplied simultaneously and the electronic device 2 can be started for testing. After the testing of the electronic device 2 is completed, the processing unit 43 is connected to the connection port 211 of the substrate control unit 21 through the switch device 3 to receive and compare the response message, and then transmits the acknowledgement message to the control unit 12. Furthermore, after the control unit 12 can confirm that the acknowledgement message is received through the handshake mechanism of the handshake confirmation signal, the control unit 12 controls the power supply unit 13 not to supply power to the electronic device 2, and after a power-off time, the control unit 12 controls the power supply unit 13 to supply power to the electronic device 2 again.
In summary, the power testing system and the testing method thereof of the present invention can achieve the purpose of supplying power simultaneously and powering off the electronic device 2 after the electronic device 2 is powered on for testing through the design that the power supply unit 13 of the power testing device 1 is controlled to turn on and off the power supply to the electronic device 2, and the control unit 12 controls the power supply unit 13 to supply power to the electronic device 2 again after the power off time, so as to save time and labor and improve the testing efficiency, thereby achieving the purpose of the present invention.
However, the above description is only a preferred embodiment of the present invention, and the scope of the present invention should not be limited thereby, and all the simple equivalent changes and modifications made according to the claims and the contents of the patent specification should be included in the scope of the present invention.
Claims (10)
1. A power supply test system characterized by: comprises the following steps:
the power supply testing device comprises a power supply unit connected with an external power supply, a control unit connected with the power supply unit, a power supply unit connected with the power supply unit and the control unit and controlled by the control unit to start and stop power transmission, and a serial port connected with the control unit;
a plurality of electronic devices respectively electrically connected with the power supply unit, wherein each electronic device comprises a substrate control unit with a connection port, an execution unit connected with the substrate control unit, and a memory unit connected with the execution unit and provided with a test mode;
the switching device comprises a first serial port and a plurality of second serial ports which are respectively connected with the connecting ports of the substrate control unit; and
a management device for remotely managing the electronic device and connecting the external power supply, and including a first serial port connected to the serial port of the power supply testing device, a second serial port connected to the first serial port of the switching device, and a processing unit connected to the first serial port and the second serial port, after the power supply testing device is started and the electronic device is started, the execution unit of each electronic device executes the test mode of the memory unit to generate a reply message, transmits the reply message to the corresponding second serial port through the connection port of the substrate control unit, and transmits the reply message to the second serial port of the management device through the first serial port, and the processing unit of the management device receives the reply message and compares each reply message with a built-in check file, and when the processing unit completely compares the received reply messages, and generating a receiving message and transmitting the receiving message from the first sequence port to the control unit through the serial port of the power test device, wherein the control unit controls the power supply unit not to supply power to the electronic device, and controls the power supply unit to supply power to the electronic device again after a power-off time.
2. The power supply test system of claim 1, wherein: the serial port of the power supply testing device is provided with a group of handshake pins, the first sequence port of the management device is connected to the serial port, when the processing unit generates the acknowledgement message, the first sequence port and the group of handshake pins of the serial port generate a handshake acknowledgement signal and transmit the handshake acknowledgement signal to the control unit, and then the processing unit transmits the acknowledgement message to the control unit from the first sequence port through the serial port.
3. The power supply test system of claim 2, wherein: the processing unit of the management device is also internally provided with a configuration file, each response message is transmitted to the corresponding second serial port from the connecting port of the substrate control unit in a packet form, the configuration file of the processing unit records a packet confirmation data corresponding to each response message required to be received, and the processing unit identifies each received response message by matching each received response message with the packet confirmation data corresponding to the configuration file.
4. A power supply testing method is applied to a power supply testing system which comprises a power supply testing device, a plurality of electronic devices, an exchange device and a management device, wherein the power supply testing device comprises a power supply unit, a control unit connected with the power supply unit, a power supply unit connected with the power supply unit and the control unit and controlled by the control unit to start and stop power transmission, and a serial port connected with the control unit, each electronic device is electrically connected with the power supply unit of the power supply testing device and comprises a substrate control unit with a connection port, an execution unit connected with the substrate control unit and a memory unit connected with the execution unit and provided with a testing mode, the exchange device comprises a first serial port and a plurality of second serial ports respectively connected with the connection port of the substrate control unit, the management device comprises a first serial port connected with the serial port of the power supply testing device, a second serial port connected with the first serial port of the switching device, and a processing unit connected with the first serial port and the second serial port, and is characterized in that: the testing method of the power switch comprises the following steps:
(A) connecting a power supply unit of the power supply testing device and the management device with an external power supply and starting the power supply testing device and the management device, wherein the control unit controls the power supply unit to supply power to the electronic device and starts the electronic device;
(B) the execution unit of each electronic device executes the test mode of the memory unit to generate a response message, and the response message is transmitted to the second serial port corresponding to the exchange device through the connection port of the substrate control unit and then transmitted to the second serial port of the management device through the first serial port;
(C) the processing unit receives the reply messages from the second sequence port and compares each reply message with a built-in check file, and when the processing unit completely compares the received reply messages, the processing unit generates an acknowledgement message and transmits the acknowledgement message from the first sequence port to the control unit through the serial port of the power supply testing device; and
(D) the control unit controls the power supply unit not to supply power to the electronic device, and after a power-off time, the control unit controls the power supply unit to supply power to the electronic device again and starts up the electronic device, and the step (B) is returned.
5. The method for testing a power switch of claim 4, wherein: the processing unit of the management device further has a configuration file built therein, wherein in the step (B), each reply message is transmitted from the connection port of the baseboard control unit to the corresponding second serial port in the form of a packet, and the configuration file of the processing unit records a packet acknowledgement corresponding to each reply message to be received, the step (C) includes a step (C1) and a step (C2):
(C1) the processing unit receives the reply message from the second serial port and identifies the received reply message in cooperation with the packet acknowledgement data of the configuration file;
(C2) when the processing unit matches the received reply message with the check file, the processing unit generates the acknowledgement message and transmits the acknowledgement message from the first sequence port to the control unit through the serial port of the power test device.
6. The method for testing a power switch of claim 5, wherein: in the step (C2), the processing unit compares the received reply messages within a predetermined receiving time to generate the acknowledgement message, and transmits the acknowledgement message from the first serial port to the control unit via the serial port of the power test device.
7. The method for testing a power switch of claim 5, wherein: in the step (C2), when the processing unit of the management device matches the check file to complete the comparison and confirm that all the reply messages required to be received have been received to generate the acknowledgement message, the processing unit controls the first serial port and the group of handshake pins of the serial port to handshake to generate a handshake confirmation signal and transmits the handshake confirmation signal to the control unit, and then the processing unit transmits the acknowledgement message from the first serial port to the control unit through the serial port.
8. The method for testing a power switch of claim 6, wherein: in the step (C2), the processing unit matches the received reply message with the check file to generate the acknowledgement message when the comparison is completed, and the processing unit controls the first serial port and the group of handshake pins of the serial port to handshake and generate a handshake acknowledgement signal to be transmitted to the control unit, and then the processing unit transmits the acknowledgement message from the first serial port to the control unit through the serial port.
9. The method for testing a power switch of claim 5, wherein: in the step (B), each reply message is a corresponding test file generated after each electronic device has executed the test mode, each test file records a square wave signal data of the test result, in the step (C2), the check file of the processing unit has a standard square wave signal data, and the processing unit compares the square wave signal data of the reply message with the standard square wave signal data of the built-in check file and generates the acknowledgement message after completing the acknowledgement.
10. The method for testing a power switch of claim 9, wherein: in the step (C2), the check file of the processing unit further has a check record table, and the processing unit stores the comparison result of the received reply message in the check record table.
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1773942A (en) * | 2004-11-10 | 2006-05-17 | 英保达股份有限公司 | Testing apparatus and method |
| CN103163490A (en) * | 2013-02-19 | 2013-06-19 | 瑞斯康达科技发展股份有限公司 | Detecting device and detecting method of device power supply performance |
| CN103795583A (en) * | 2012-10-30 | 2014-05-14 | 英业达科技有限公司 | Testing device |
| CN105044496A (en) * | 2015-06-30 | 2015-11-11 | 株洲南车时代电气股份有限公司 | Auxiliary power system module test device and method |
-
2017
- 2017-01-18 CN CN201710039980.XA patent/CN108333529B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1773942A (en) * | 2004-11-10 | 2006-05-17 | 英保达股份有限公司 | Testing apparatus and method |
| CN103795583A (en) * | 2012-10-30 | 2014-05-14 | 英业达科技有限公司 | Testing device |
| CN103163490A (en) * | 2013-02-19 | 2013-06-19 | 瑞斯康达科技发展股份有限公司 | Detecting device and detecting method of device power supply performance |
| CN105044496A (en) * | 2015-06-30 | 2015-11-11 | 株洲南车时代电气股份有限公司 | Auxiliary power system module test device and method |
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