CN108318726B - Faraday probe - Google Patents
Faraday probe Download PDFInfo
- Publication number
- CN108318726B CN108318726B CN201810010985.4A CN201810010985A CN108318726B CN 108318726 B CN108318726 B CN 108318726B CN 201810010985 A CN201810010985 A CN 201810010985A CN 108318726 B CN108318726 B CN 108318726B
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- Prior art keywords
- insulation shutter
- lower bottom
- bottom base
- faraday
- faraday probe
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
- G01R15/245—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using magneto-optical modulators, e.g. based on the Faraday or Cotton-Mouton effect
- G01R15/246—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using magneto-optical modulators, e.g. based on the Faraday or Cotton-Mouton effect based on the Faraday, i.e. linear magneto-optic, effect
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
- G01R19/0061—Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/08—Measuring current density
Abstract
The invention discloses a kind of faraday probes, it is related to space flight equipment technology field, to solve movement of the prior art in measurement process with probe in space, location error can also change correspondingly, and can not assess different location beam current density when existing location error is modified the technical issues of.Faraday probe of the present invention, it include: insulation shutter upper bed-plate and insulation shutter lower bottom base, between insulation shutter upper bed-plate and insulation shutter lower bottom base and circumferential direction is equipped with multiple insulating trips, each insulating trip is correspondingly provided with an external tooth planetary gear, and multiple external tooth planetary gears are engaged with an inner tooth planet gear；Bareing faraday probe is installed on insulation shutter lower bottom base.
Description
Technical field
The present invention relates to space flight equipment technology field, in particular to a kind of faraday probe.
Background technique
Currently, the electric thrusters such as ion thruster, hall thruster, because it is than leaping high, the service life is long and mass of system is smaller
The advantages that and be widely used in the attitude and orbit control of spacecraft.The accurate electric thruster Vacuum Plume parameter that obtains is to assessment electricity
Thruster and spacecraft performance are vital.
Specifically, electric thruster Vacuum Plume is plasma, mainly comprising ion, electronics and neutral gas molecule etc.,
Obtaining plume intermediate ion Density Distribution is to assess the important indicator in electric thrust service life and its plume effect, is using faraday probe
A kind of simple means and method that can measure space density profile.
Wherein, the location error of faraday probe different location in the plume of space is different, and the calculating of location error follows
Following formula:
In formula: ε indicates location error, ACFor collector face area, AF(x, β) is the circular cone vertex of a cone x for being β away from the angle of divergence
Space curved surface area.
Movement in measurement process with probe in space, location error can also change correspondingly, this is different in assessment
It needs to be modified existing location error when the beam current density of position.
Therefore, how a kind of faraday probe is provided, can correspond to probe in an experiment different location by by collector
Face area ACIt is changed, and reaches same position error, to more accurately diagnose beam current density, it has also become this field
The technical issues of technical staff's urgent need to resolve.
Summary of the invention
The purpose of the present invention is to provide a kind of faraday probes, to solve the prior art in measurement process with probe
Movement in space, location error can also change correspondingly, and can not be when assessing the beam current density of different location to presence
Location error the technical issues of being modified.
The present invention provides a kind of faraday probe, comprising: insulation shutter upper bed-plate and insulation shutter lower bottom base, the insulation
Between shutter upper bed-plate and the insulation shutter lower bottom base and multiple insulating trips circumferentially are installed, each insulating trip is corresponding to be set
There is an external tooth planetary gear, multiple external tooth planetary gears are engaged with an inner tooth planet gear；Under the insulation shutter
Bareing faraday probe is installed on pedestal.
Wherein, in faraday probe of the present invention, each external tooth planetary gear bottom end is equipped with external gear pad
Piece, the insulation shutter lower bottom base, the external gear gasket, the external tooth planetary gear and the insulation shutter upper bed-plate are worn
There is pedestal attachment screw, and passes through nut check.
Specifically, in faraday probe of the present invention, the bareing faraday probe is inserted into the insulation shutter
Lower bottom base, and fixed by probe pinching screw.
Further, in faraday probe of the present invention, the inner tooth planet gear covers on the insulation shutter
Outside pedestal and the insulation shutter lower bottom base, and inner tooth planet gear clamping element is equipped with by bottom cover, and pass through interior hexagonal cylindrical
Head screw locking.
When practical application, in faraday probe of the present invention, the insulating trip, which uses, to be had certain elasticity and rubs
The small material of coefficient is made.
Wherein, in faraday probe of the present invention, the external tooth planetary gear internal diameter connects slightly larger than the pedestal
Connect screw.
Specifically, in faraday probe of the present invention, the axial dimension of the inner tooth planet gear is greater than described exhausted
Edge shutter upper bed-plate and the insulation shutter lower bottom base.
Further, in faraday probe of the present invention, the inner tooth planet gear is connected with driving motor.
Further, in faraday probe of the present invention, multiple insulating trips include eight.
Compared with the existing technology, faraday probe of the present invention has the advantage that
In faraday probe provided by the invention, comprising: insulation shutter upper bed-plate and insulation shutter lower bottom base, insulate shutter
Between upper bed-plate and insulation shutter lower bottom base and multiple insulating trips circumferentially are installed, each insulating trip is correspondingly provided with an external tooth row
Star gear, multiple external tooth planetary gears are engaged with an inner tooth planet gear；Bareing method is installed on insulation shutter lower bottom base
Draw probe.From this analysis, driving internal tooth planet tooth at remote thruster when using faraday probe provided by the invention
Wheel, insulating trip gradually open, and collector effective cross-section is made to become larger；It is driven in the reverse direction inner tooth planet gear at nearly thruster, insulate
Piece is gradually closed, and collector effective cross-section is made to become smaller.To sum up, faraday probe provided by the invention can pass through external agency
Collector is set to change its effective sectional area, so that the beam current density measurement in space plume different location reaches same position mistake
Difference；Also, faraday probe can change its effective sectional area with the distance change exported apart from thruster, thus obtain compared with
Good location expression performance.
The present invention also provides a kind of faraday probes, comprising: insulation shutter upper bed-plate and insulation shutter lower bottom base, it is described exhausted
Between edge shutter upper bed-plate and the insulation shutter lower bottom base and circumferential direction is equipped with multiple insulating trips, and each insulating trip is corresponding
Equipped with an external tooth planetary gear, multiple external tooth planetary gears are engaged with an inner tooth planet gear；The insulation shutter
Bareing faraday probe is installed on lower bottom base；Each external tooth planetary gear bottom end is equipped with external gear gasket, described
Insulation shutter lower bottom base, the external gear gasket, the external tooth planetary gear and the insulation shutter upper bed-plate are equipped with pedestal
Attachment screw, and pass through nut check；The bareing faraday probe is inserted into the insulation shutter lower bottom base, and passes through probe
Pinching screw is fixed；The inner tooth planet gear covers outside the insulation shutter upper bed-plate and the insulation shutter lower bottom base, and
Inner tooth planet gear clamping element is equipped with by bottom cover, and is locked by hexagon socket cap head screw.
Possessed advantage is identical compared with the existing technology with above-mentioned faraday probe for the faraday probe, herein no longer
It repeats.
Detailed description of the invention
The attached drawing for constituting a part of the invention is used to provide further understanding of the present invention, schematic reality of the invention
It applies example and its explanation is used to explain the present invention, do not constitute improper limitations of the present invention.In the accompanying drawings:
Fig. 1 is the structural schematic diagram of faraday probe provided in an embodiment of the present invention；
Fig. 2 is the structural schematic diagram of section A in Fig. 1；
Fig. 3 is structural schematic diagram when faraday probe provided in an embodiment of the present invention is in the first working condition；
Fig. 4 is structural schematic diagram when faraday probe provided in an embodiment of the present invention is in the second working condition.
In figure: 101- insulation shutter upper bed-plate；102- pedestal attachment screw；103- external tooth planetary gear；Outside 104-
Cog spacers；105- nut；106- inner tooth planet gear；107- bareing faraday probe；108- inner tooth planet gear
Clamping element；109- hexagon socket cap head screw；110- probe pinching screw；111- insulation shutter lower bottom base；112- insulation
Piece.
Specific embodiment
It should be noted that in the absence of conflict, the feature in embodiment and embodiment in the present invention can phase
Mutually combination.The present invention will be described in detail below with reference to the accompanying drawings and embodiments.
Fig. 1 is the structural schematic diagram of faraday probe provided in an embodiment of the present invention；Fig. 2 is that the structure of section A in Fig. 1 is shown
It is intended to；Fig. 3 is structural schematic diagram when faraday probe provided in an embodiment of the present invention is in the first working condition；Fig. 4 is this
The faraday probe that inventive embodiments provide is in structural schematic diagram when the second working condition.
As Figure 1-Figure 4, the embodiment of the present invention provides a kind of faraday probe, comprising: insulation shutter upper bed-plate 101
With insulation shutter lower bottom base 111, insulate between shutter upper bed-plate 101 and insulation shutter lower bottom base 111 and it is circumferential be equipped with it is multiple
Insulating trip 112, each insulating trip 112 are correspondingly provided with an external tooth planetary gear 103, and multiple external tooth planetary gears 103 are engaged with
One inner tooth planet gear 106；Bareing faraday probe 107 is installed on insulation shutter lower bottom base 111.
Compared with the existing technology, faraday probe described in the embodiment of the present invention has the advantage that
In faraday probe provided in an embodiment of the present invention, as Figure 1-Figure 4, comprising: insulation shutter upper bed-plate 101
With insulation shutter lower bottom base 111, insulate between shutter upper bed-plate 101 and insulation shutter lower bottom base 111 and it is circumferential be equipped with it is multiple
Insulating trip 112, each insulating trip 112 are correspondingly provided with an external tooth planetary gear 103, and multiple external tooth planetary gears 103 are engaged with
One inner tooth planet gear 106；Bareing faraday probe 107 is installed on insulation shutter lower bottom base 111.Thus analysis can
Know, when using faraday probe provided in an embodiment of the present invention, inner tooth planet gear 106, insulating trip are driven at remote thruster
112 gradually open, and collector effective cross-section is made to become larger；Inner tooth planet gear 106, insulating trip are driven in the reverse direction at nearly thruster
112 are gradually closed, and collector effective cross-section is made to become smaller.To sum up, faraday probe provided in an embodiment of the present invention, can be by outer
Portion mechanism makes collector change its effective sectional area, so that the beam current density measurement in space plume different location reaches identical
Location error；Also, faraday probe can change its effective sectional area with the distance change exported apart from thruster, thus
Obtain preferable location expression performance.
Wherein, as shown in Fig. 2, in faraday probe provided in an embodiment of the present invention, above-mentioned each external tooth planetary gear 103
Bottom end be equipped with external gear gasket 104, insulation shutter lower bottom base 111, external gear gasket 104, external tooth planetary gear 103 and insulation
Shutter upper bed-plate 101 is equipped with pedestal attachment screw 102, and is locked by nut 105, so that faraday probe is each
Components are fixed well in the axial direction.
Specifically, as shown in Fig. 2, in faraday probe provided in an embodiment of the present invention, above-mentioned bareing faraday probe
107 insertion insulation shutter lower bottom bases 111, and it is fixed by probe pinching screw 110.
Further, as shown in Fig. 2, in faraday probe provided in an embodiment of the present invention, above-mentioned inner tooth planet gear 106
It covers outside insulation shutter upper bed-plate 101 and insulation shutter lower bottom base 111, and is covered with inner tooth planet gear clamping upwards by bottom end
Part 108, and locked by hexagon socket cap head screw 109.
When practical application, as shown in Fig. 2, in faraday probe provided in an embodiment of the present invention, above-mentioned insulating trip 112 can be with
Using having certain elastic and small coefficient of friction material to be made, so that faraday probe be effectively prevent to occur during the work time
Fracture and locking phenomenon.
Wherein, as shown in Fig. 2, in faraday probe provided in an embodiment of the present invention, aforementioned external teeth planetary gear 103 it is interior
Diameter can be slightly larger than pedestal attachment screw 102, so as to pass through clearance fit, external tooth planet in the course of work is effectively ensured
Because of the expansion of pedestal attachment screw 102 deadlock phenomenon will not occur for gear 103.
Specifically, as shown in Fig. 2, in faraday probe provided in an embodiment of the present invention, above-mentioned inner tooth planet gear 106
Axial dimension can be greater than insulation shutter upper bed-plate 101 and insulation shutter lower bottom base 111, so as to pass through clearance fit, with
It effectively reduces inner tooth planet gear 106 and insulation shutter upper bed-plate 101, insulation shutter lower bottom base 111 occurs because of expanded by heating
Stress problem.
Further, as shown in Fig. 2, in faraday probe provided in an embodiment of the present invention, above-mentioned inner tooth planet gear 106
Driving motor is can connect, which can be servo motor, to drive inner tooth planet gear by driving motor
106 rotations, and drive multiple external tooth planetary gears 103 to rotate, and then multiple insulating trips 112 is driven gradually to open or be closed, make
Collector changes its effective sectional area.
Further, as shown in Figure 3 and Figure 4, in faraday probe provided in an embodiment of the present invention, above-mentioned multiple insulation
Piece 112 can preferably comprise eight.Certainly, the insulating trip 112 of other fair amounts, is not restricted by herein.
As Figure 1-Figure 4, a kind of faraday probe that the embodiment of the present invention also provides, comprising: insulation shutter upper bed-plate
101 and insulation shutter lower bottom base 111, insulate between shutter upper bed-plate 101 and insulation shutter lower bottom base 111 and it is circumferential be equipped with it is more
A insulating trip 112, each insulating trip 112 are correspondingly provided with an external tooth planetary gear 103, and multiple external tooth planetary gears 103 engage
There is an inner tooth planet gear 106；Bareing faraday probe 107 is installed on insulation shutter lower bottom base 111；Each external tooth row
The bottom end of star gear 103 is equipped with external gear gasket 104, and insulate shutter lower bottom base 111, external gear gasket 104, external tooth planetary gear
103 are equipped with pedestal attachment screw 102 with insulation shutter upper bed-plate 101, and are locked by nut 105；Bareing faraday visits
The insertion insulation shutter lower bottom base 111 of needle 107, and it is fixed by probe pinching screw 110；106 sets of inner tooth planet gear are insulating
Outside shutter upper bed-plate 101 and insulation shutter lower bottom base 111, and inner tooth planet gear clamping element 108 is equipped with by bottom cover, and pass through
Hexagon socket cap head screw 109 is locked.
When using faraday probe provided in an embodiment of the present invention, inner tooth planet gear 106 is driven at remote thruster, absolutely
Embolium 112 gradually opens, and collector effective cross-section is made to become larger；It is driven in the reverse direction inner tooth planet gear 106 at nearly thruster, insulate
Piece 112 is gradually closed, and collector effective cross-section is made to become smaller.To sum up, faraday probe provided in an embodiment of the present invention can pass through
External agency makes collector change its effective sectional area, so that the beam current density measurement in space plume different location reaches phase
Same location error；Also, faraday probe can change its effective sectional area with the distance change exported apart from thruster, from
And obtain preferable location expression performance.
When practical application, as shown in Fig. 2, in faraday probe provided in an embodiment of the present invention, above-mentioned insulating trip 112 can be with
Using having certain elastic and small coefficient of friction material to be made, so that faraday probe be effectively prevent to occur during the work time
Fracture and locking phenomenon.
Wherein, as shown in Fig. 2, in faraday probe provided in an embodiment of the present invention, aforementioned external teeth planetary gear 103 it is interior
Diameter can be slightly larger than pedestal attachment screw 102, so as to pass through clearance fit, external tooth planet in the course of work is effectively ensured
Because of the expansion of pedestal attachment screw 102 deadlock phenomenon will not occur for gear 103.
Specifically, as shown in Fig. 2, in faraday probe provided in an embodiment of the present invention, above-mentioned inner tooth planet gear 106
Axial dimension can be greater than insulation shutter upper bed-plate 101 and insulation shutter lower bottom base 111, so as to pass through clearance fit, with
It effectively reduces inner tooth planet gear 106 and insulation shutter upper bed-plate 101, insulation shutter lower bottom base 111 occurs because of expanded by heating
Stress problem.
Further, as shown in Fig. 2, in faraday probe provided in an embodiment of the present invention, above-mentioned inner tooth planet gear 106
Driving motor is can connect, which can be servo motor, to drive inner tooth planet gear by driving motor
106 rotations, and drive multiple external tooth planetary gears 103 to rotate, and then multiple insulating trips 112 is driven gradually to open or be closed, make
Collector changes its effective sectional area.
Further, as shown in Figure 3 and Figure 4, in faraday probe provided in an embodiment of the present invention, above-mentioned multiple insulation
Piece 112 can preferably comprise eight.Certainly, the insulating trip 112 of other fair amounts, is not restricted by herein.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in essence of the invention
Within mind and principle, any modification, equivalent replacement, improvement and so on be should all be included in the protection scope of the present invention.
Claims (9)
1. a kind of faraday probe characterized by comprising insulation shutter upper bed-plate (101) and insulation shutter lower bottom base
(111), multiple insulation are circumferentially installed between the insulation shutter upper bed-plate (101) and the insulation shutter lower bottom base (111)
Piece (112), each insulating trip (112) are correspondingly provided with an external tooth planetary gear (103), multiple external tooth planetary gears
(103) it is engaged with an inner tooth planet gear (106)；Bareing faraday is installed on the insulation shutter lower bottom base (111)
Probe (107)；
In use, driving the inner tooth planet gear (106) at remote thruster, the insulating trip (112) gradually opens, makes to receive
Storage effective cross-section becomes larger；Be driven in the reverse direction at nearly thruster the inner tooth planet gear (106), the insulating trip (112) by
It is gradually closed, collector effective cross-section is made to become smaller.
2. faraday probe according to claim 1, which is characterized in that the bottom of each external tooth planetary gear (103)
End is equipped with external gear gasket (104), the insulation shutter lower bottom base (111), the external gear gasket (104), the external tooth row
Star gear (103) and the insulation shutter upper bed-plate (101) are equipped with pedestal attachment screw (102), and are locked by nut (105)
Tightly.
3. faraday probe according to claim 1 or 2, which is characterized in that the bareing faraday probe (107) is inserted
Enter the insulation shutter lower bottom base (111), and fixed by probe pinching screw (110).
4. faraday probe according to claim 3, which is characterized in that the inner tooth planet gear (106) covers described
Insulation shutter upper bed-plate (101) and the insulation shutter lower bottom base (111) outside, and are clamped by bottom cover equipped with inner tooth planet gear
Part (108), and locked by hexagon socket cap head screw (109).
5. faraday probe according to claim 1, which is characterized in that the insulating trip (112) is using with certain bullet
The property and small material of coefficient of friction is made.
6. faraday probe according to claim 2, which is characterized in that the internal diameter of the external tooth planetary gear (103) is slightly
Greater than the pedestal attachment screw (102).
7. faraday probe according to claim 1 or 6, which is characterized in that the axial direction of the inner tooth planet gear (106)
Size is greater than the insulation shutter upper bed-plate (101) and the insulation shutter lower bottom base (111).
8. faraday probe according to claim 1, which is characterized in that the inner tooth planet gear (106) is connected with drive
Dynamic motor.
9. faraday probe according to claim 1, which is characterized in that multiple insulating trips (112) include eight.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810010985.4A CN108318726B (en) | 2018-01-05 | 2018-01-05 | Faraday probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810010985.4A CN108318726B (en) | 2018-01-05 | 2018-01-05 | Faraday probe |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108318726A CN108318726A (en) | 2018-07-24 |
| CN108318726B true CN108318726B (en) | 2019-05-31 |
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ID=62893763
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810010985.4A Active CN108318726B (en) | 2018-01-05 | 2018-01-05 | Faraday probe |
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| CN (1) | CN108318726B (en) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103792566A (en) * | 2013-07-18 | 2014-05-14 | 北京中科信电子装备有限公司 | Faraday device for measuring beam current |
| CN104202894A (en) * | 2014-07-29 | 2014-12-10 | 北京航空航天大学 | Faraday probe for ion thruster measurement |
| CN104730066A (en) * | 2015-04-09 | 2015-06-24 | 北京航空航天大学 | Near-field plume mass-spectroscopic diagnostic E*B probe based on Faraday cup |
| CN105116435A (en) * | 2015-07-13 | 2015-12-02 | 兰州空间技术物理研究所 | Ion thruster beam test method based on Faraday probe array |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7244950B2 (en) * | 2004-06-24 | 2007-07-17 | The Regents Of The University Of California | Trigger probe for determining the orientation of the power distribution of an electron beam |
-
2018
- 2018-01-05 CN CN201810010985.4A patent/CN108318726B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103792566A (en) * | 2013-07-18 | 2014-05-14 | 北京中科信电子装备有限公司 | Faraday device for measuring beam current |
| CN104202894A (en) * | 2014-07-29 | 2014-12-10 | 北京航空航天大学 | Faraday probe for ion thruster measurement |
| CN104730066A (en) * | 2015-04-09 | 2015-06-24 | 北京航空航天大学 | Near-field plume mass-spectroscopic diagnostic E*B probe based on Faraday cup |
| CN105116435A (en) * | 2015-07-13 | 2015-12-02 | 兰州空间技术物理研究所 | Ion thruster beam test method based on Faraday probe array |
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| Publication number | Publication date |
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| CN108318726A (en) | 2018-07-24 |
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Inventor after: Cai Guobiao Inventor after: Yang Zhe Inventor after: Liu Lihui Inventor after: Ren Xiang Inventor after: Weng Huiyan Inventor after: He Bijiao Inventor before: Cai Guobiao Inventor before: Liu Lihui Inventor before: Ren Xiang Inventor before: Weng Huiyan Inventor before: He Bijiao |
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