CN108121004B - Faraday probe - Google Patents
Faraday probe Download PDFInfo
- Publication number
- CN108121004B CN108121004B CN201810010713.4A CN201810010713A CN108121004B CN 108121004 B CN108121004 B CN 108121004B CN 201810010713 A CN201810010713 A CN 201810010713A CN 108121004 B CN108121004 B CN 108121004B
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- China
- Prior art keywords
- collector
- driven shaft
- pedestal
- outer part
- faraday probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/08—Measuring current density
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
- G01T7/02—Collecting means for receiving or storing samples to be investigated and possibly directly transporting the samples to the measuring arrangement; particularly for investigating radioactive fluids
Abstract
The invention discloses a kind of faraday probes, it is related to space flight equipment technology field, to solve movement of the prior art in measurement process with probe in space, location error can also change correspondingly, and can not assess different location beam current density when existing location error is modified the technical issues of.Faraday probe of the present invention, comprising: collector pedestal, the outer sheath of collector pedestal are equipped with ceramics insulator, and the outer sheath of ceramics insulator is equipped with protection ring；On the basis of ceramics insulator, the axial movement of upper limitation collector pedestal, lower and protection ring carry out clearance fit；The outer sheath of collector pedestal is equipped with driven shaft locating sleeve, and the outer part driven shaft of collector sequentially passes through driven gear, driven shaft locating sleeve and collector pedestal, and limits moving radially for the outer part driven shaft of collector；Driven gear is engaged with driving gear, and driving gear is set in the outside of driving shaft.
Description
Technical field
The present invention relates to space flight equipment technology field, in particular to a kind of faraday probe.
Background technique
Currently, the electric thrusters such as ion thruster, hall thruster, because it is than leaping high, the service life is long and mass of system is smaller
The advantages that and be widely used in the attitude and orbit control of spacecraft.The accurate electric thruster Vacuum Plume parameter that obtains is to assessment electricity
Thruster and spacecraft performance are vital.
Specifically, electric thruster Vacuum Plume is plasma, mainly comprising ion, electronics and neutral gas molecule etc.,
Obtaining plume intermediate ion Density Distribution is to assess the important indicator in electric thrust service life and its plume effect, is using faraday probe
A kind of simple means and method that can measure space density profile.
Wherein, the location error of faraday probe different location in the plume of space is different, and the calculating of location error follows
Following formula:
In formula: ε indicates location error, ACFor collector face area, AF(x, β) is the circular cone vertex of a cone x for being β away from the angle of divergence
Space curved surface area.
Movement in measurement process with probe in space, location error can also change correspondingly, this is different in assessment
It needs to be modified existing location error when the beam current density of position.
Therefore, how a kind of faraday probe is provided, can correspond to probe in an experiment different location by by collector
Face area ACIt is changed, and reaches same position error, to more accurately diagnose beam current density, it has also become this field
The technical issues of technical staff's urgent need to resolve.
Summary of the invention
The purpose of the present invention is to provide a kind of faraday probes, to solve the prior art in measurement process with probe
Movement in space, location error can also change correspondingly, and can not be when assessing the beam current density of different location to presence
Location error the technical issues of being modified.
The present invention provides a kind of faraday probe, comprising: the outer sheath of collector pedestal, the collector pedestal is equipped with pottery
The outer sheath of porcelain insulator, the ceramics insulator is equipped with protection ring；On the basis of the ceramics insulator, the upper limitation receipts
The axial movement of storage pedestal, the lower and protection ring carry out clearance fit；The outer sheath of the collector pedestal is equipped with driven
Axis locating sleeve, the outer part driven shaft of collector sequentially pass through driven gear, the driven shaft locating sleeve and the collector
Pedestal, and limit moving radially for the outer part driven shaft of the collector；The driven gear is engaged with driving gear, the master
Moving gear is set in the outside of driving shaft.
Wherein, in faraday probe provided by the invention, the outer part driven shaft of the collector, the driven shaft positioning sleeve
There are two pipe and the driven gear are symmetrical arranged, the driving gear is engaged with two driven gears.
Specifically, it in faraday probe provided by the invention, is in axial direction successively arranged and gasket, collector outer zero is turned up
Part and acorn nut, so that the outer part driven shaft of the collector is stably mounted on the collector pedestal, and there are gaps
Guarantee that the outer part driven shaft of the collector is able to carry out rotation.
Further, in faraday probe provided by the invention, it is solid that collector conducting wire is additionally provided on the collector pedestal
Determine part.
Further, in faraday probe provided by the invention, the collector wire fixing part and the collector
Outer part driven shaft is right-hand thread.
When practical application, in faraday probe provided by the invention, insulating positioning sleeve ring is also cased on the protection ring, and
Equipped with tight split nut.
Wherein, in faraday probe provided by the invention, the collector wire fixing part, the insulating positioning sleeve ring,
It and between the protection ring is clearance fit.
Specifically, in faraday probe provided by the invention, the driving shaft is equipped with active axle key.
Further, in faraday probe provided by the invention, the active axle key uses single key structure.
Compared with the existing technology, faraday probe of the present invention has the advantage that
In faraday probe provided by the invention, comprising: collector pedestal, the outer sheath of collector pedestal are equipped with ceramics absolutely
The outer sheath of edge body, ceramics insulator is equipped with protection ring；On the basis of ceramics insulator, upper the axial of limitation collector pedestal is moved
Dynamic, lower and protection ring carries out clearance fit；The outer sheath of collector pedestal is equipped with driven shaft locating sleeve, the outer part of collector from
Moving axis sequentially passes through driven gear, driven shaft locating sleeve and collector pedestal, and limits the diameter of the outer part driven shaft of collector
To movement；Driven gear is engaged with driving gear, and driving gear is set in the outside of driving shaft.From this analysis, using this
When inventing the faraday probe provided, as probe is toward movement at thruster, servo motor receives control signal and drives driving tooth
Wheel makes the outer part of collector rotate 180 °, is entered by part expansion mode (big collection surface) outside collector and collected to driven gear
The outer part the revenue model (small collection surface) of device；If probe returns at remote thruster, the identical signal of servo motor, collector outer zero are given
It is (big to return to the outer part expansion mode of collector by part the revenue model outside collector (small collection surface) for equidirectional 180 ° of the rotation of part
Collection surface).To sum up, faraday probe provided by the invention can make collector change its effective sectional area by motor, namely
Probe collector can change its effective sectional area with the distance change exported apart from thruster, to reach identical position
Error is able to accurately describe the beam current density of each position, and obtains preferable location expression performance.
The present invention also provides a kind of faraday probes, comprising: the outer sheath of collector pedestal, the collector pedestal is equipped with
The outer sheath of ceramics insulator, the ceramics insulator is equipped with protection ring；On the basis of the ceramics insulator, described in upper limitation
The axial movement of collector pedestal, the lower and protection ring carry out clearance fit；The outer sheath of the collector pedestal be equipped with from
Moving axis locating sleeve, the outer part driven shaft of collector sequentially pass through driven gear, the driven shaft locating sleeve and the collection
Device pedestal, and limit moving radially for the outer part driven shaft of the collector；The driven gear is engaged with driving gear, described
Driving gear is set in the outside of driving shaft；It is in axial direction successively arranged and the outer part of gasket, collector and acorn nut is turned up,
So that the outer part driven shaft of the collector is stably mounted on the collector pedestal, and there are gaps to guarantee the collector
Outer part driven shaft is able to carry out rotation；Collector wire fixing part is additionally provided on the collector pedestal；The collector is led
Line fixing piece and the outer part driven shaft of the collector are right-hand thread；Insulating positioning sleeve ring is also cased on the protection ring, and
Equipped with tight split nut；It is gap between the collector wire fixing part, the insulating positioning sleeve ring and the protection ring
Cooperation；The driving shaft is equipped with active axle key.
Possessed advantage is identical compared with the existing technology with above-mentioned faraday probe for the faraday probe, herein no longer
It repeats.
Detailed description of the invention
The attached drawing for constituting a part of the invention is used to provide further understanding of the present invention, schematic reality of the invention
It applies example and its explanation is used to explain the present invention, do not constitute improper limitations of the present invention.In the accompanying drawings:
Fig. 1 is that faraday probe provided in an embodiment of the present invention is in the big structural schematic diagram for collecting surface state；
Fig. 2 is that faraday probe provided in an embodiment of the present invention is in the small structural schematic diagram for collecting surface state；
Fig. 3 is the structural schematic diagram of section A in Fig. 1；
Fig. 4 is the structural schematic diagram of section B in Fig. 1.
In figure: 101- acorn nut；The outer part of 102- collector；Gasket is turned up in 103-；104- collector pedestal；
105- collector wire fixing part；106- protection ring；107- active axle key；108- driving shaft；The tight split nut of 109-；
110- insulating positioning sleeve ring；111- ceramics insulator；The outer part driven shaft of 112- collector；113- driven shaft positioning sleeve
Pipe；114- driving gear；115- driven gear.
Specific embodiment
It should be noted that in the absence of conflict, the feature in embodiment and embodiment in the present invention can phase
Mutually combination.The present invention will be described in detail below with reference to the accompanying drawings and embodiments.
Fig. 1 is that faraday probe provided in an embodiment of the present invention is in the big structural schematic diagram for collecting surface state；Fig. 2 is this
The faraday probe that inventive embodiments provide is in the small structural schematic diagram for collecting surface state；Fig. 3 is the structure of section A in Fig. 1
Schematic diagram；Fig. 4 is the structural schematic diagram of section B in Fig. 1.
As Figure 1-Figure 4, the embodiment of the present invention provides a kind of faraday probe, comprising: collector pedestal 104 is collected
The outer sheath of device pedestal 104 is equipped with ceramics insulator 111, and the outer sheath of ceramics insulator 111 is equipped with protection ring 106；With ceramics
On the basis of insulator 111, the axial movement of upper limitation collector pedestal 104, lower and protection ring 106 carry out clearance fit；It collects
The outer sheath of device pedestal 104 is equipped with driven shaft locating sleeve 113, and the outer part driven shaft 112 of collector sequentially passes through driven gear
115, driven shaft locating sleeve 113 and collector pedestal 104, and limit moving radially for the outer part driven shaft 112 of collector；From
Moving gear 115 is engaged with driving gear 114, and driving gear 114 is set in the outside of driving shaft 108.
Compared with the existing technology, faraday probe described in the embodiment of the present invention has the advantage that
In faraday probe provided in an embodiment of the present invention, as Figure 1-Figure 4, comprising: collector pedestal 104 is collected
The outer sheath of device pedestal 104 is equipped with ceramics insulator 111, and the outer sheath of ceramics insulator 111 is equipped with protection ring 106；With ceramics
On the basis of insulator 111, the axial movement of upper limitation collector pedestal 104, lower and protection ring 106 carry out clearance fit；It collects
The outer sheath of device pedestal 104 is equipped with driven shaft locating sleeve 113, and the outer part driven shaft 112 of collector sequentially passes through driven gear
115, driven shaft locating sleeve 113 and collector pedestal 104, and limit moving radially for the outer part driven shaft 112 of collector；From
Moving gear 115 is engaged with driving gear 114, and driving gear 114 is set in the outside of driving shaft 108.From this analysis, using
When faraday probe provided in an embodiment of the present invention, as probe is toward movement at thruster, servo motor receives control signal band
Dynamic driving gear makes the outer part of collector rotate 180 ° to driven gear, by part expansion mode outside collector (big collection surface,
Enter the outer part the revenue model of collector (small collection surface, as shown in Figure 2) as shown in Figure 1)；If probe returns at remote thruster,
Give servo motor identical signal, equidirectional 180 ° of the rotation of the outer part of collector, by part the revenue model (small collection outside collector
Face, as shown in Figure 2) return to the outer part expansion mode of collector (big collection surface, as shown in Figure 1).To sum up, the embodiment of the present invention mentions
The faraday probe of confession, can make that collector changes its effective sectional area namely probe collector can be with distance by motor
Thruster outlet distance change and change its effective sectional area, to reach identical location error, accurately described
The beam current density of each position, and obtain preferable location expression performance.
Wherein, in faraday probe provided in an embodiment of the present invention, as shown in Figure 3 and Figure 4, the outer part driven shaft of collector
112, there are two driven shaft locating sleeve 113 and driven gear 115 are symmetrical arranged, driving gear 114 and two driven tooths
115 engagement of wheel.
Specifically, it in faraday probe provided in an embodiment of the present invention, as shown in Figure 3 and Figure 4, in axial direction successively sets
Have and the outer part 102 of gasket 103, collector and acorn nut 101 is turned up, so that the outer part driven shaft 112 of collector stablizes installation
On collector pedestal 104, and there are gaps to guarantee that part driven shaft 112 is able to carry out rotation outside collector.
Further, in faraday probe provided in an embodiment of the present invention, as shown in Figure 3 and Figure 4, collector pedestal 104
On be additionally provided with collector wire fixing part 105；Also, the collector wire fixing part 105 and the outer part driven shaft 112 of collector
It is right-hand thread.
When practical application, in faraday probe provided in an embodiment of the present invention, as shown in Figure 3 and Figure 4, on protection ring 106
It is also cased with insulating positioning sleeve ring 110, and is equipped with tight split nut 109.Above-mentioned collector wire fixing part 105 and the outer part of collector
Driven shaft 112 is right-hand thread, when tight split nut 109 can effectively be avoided to lock, collector wire fixing part 105 and collector
Loose phenomenon occurs for pedestal 104.
Wherein, in faraday probe provided in an embodiment of the present invention, collector wire fixing part 105, insulating positioning sleeve ring
It is clearance fit between 110 and protection ring 106, to effectively prevent material that excessive stress occurs after expanded by heating
And deformation.
Specifically, in faraday probe provided in an embodiment of the present invention, as shown in Figure 3 and Figure 4, driving shaft 108 is equipped with
Active axle key 107.Since the power of motor and the torque of driving shaft 108 are all little, which can be using single
Bond structure.
As Figure 1-Figure 4, a kind of faraday probe that the embodiment of the present invention also provides, comprising: collector pedestal 104,
The outer sheath of collector pedestal 104 is equipped with ceramics insulator 111, and the outer sheath of ceramics insulator 111 is equipped with protection ring 106；With
On the basis of ceramics insulator 111, the axial movement of upper limitation collector pedestal 104, lower and protection ring 106 carry out clearance fit；
The outer sheath of collector pedestal 104 is equipped with driven shaft locating sleeve 113, and the outer part driven shaft 112 of collector sequentially passes through driven
Gear 115, driven shaft locating sleeve 113 and collector pedestal 104, and limit radial the moving of the outer part driven shaft 112 of collector
It is dynamic；Driven gear 115 is engaged with driving gear 114, and driving gear 114 is set in the outside of driving shaft 108；In axial direction according to
The outer part 102 of gasket 103, collector and acorn nut 101 is turned up in secondary be equipped with, so that the outer part driven shaft 112 of collector is stablized
It is mounted on collector pedestal 104, and there are gaps to guarantee that part driven shaft 112 is able to carry out rotation outside collector；Collector
Collector wire fixing part 105 is additionally provided on pedestal 104；Collector wire fixing part 105 and the outer part driven shaft 112 of collector
It is right-hand thread；It is also cased with insulating positioning sleeve ring 110 on protection ring 106, and is equipped with tight split nut 109；Collector conducting wire is fixed
It is clearance fit between part 105, insulating positioning sleeve ring 110 and protection ring 106；Driving shaft 108 is equipped with active axle key
107。
When using faraday probe provided in an embodiment of the present invention, as probe is toward movement at thruster, servo motor is connect
Receiving control signal drives driving gear 114 to driven gear 115, so that the outer part 102 of collector is rotated 180 °, by outside collector zero
Part 102 is unfolded mode (big collection surface) and enters outer 102 the revenue model of part (small collection surface) of collector；If probe returns to remote thrust
At device, the identical signal of servo motor is given, equidirectional 180 ° of the rotation of the outer part 102 of collector takes in mould by part 102 outside collector
Formula (small collection surface) returns to the outer 102 expansion mode of part (big collection surface) of collector.To sum up, farad provided in an embodiment of the present invention
Probe, collector can be made to change its effective sectional area namely probe collector by motor to be gone out with apart from thruster
Mouthful distance change and change its effective sectional area, to reach identical location error, be able to accurately describe each position
Beam current density, and obtain preferable location expression performance.
Wherein, as shown in Figure 3 and Figure 4, in faraday probe provided in an embodiment of the present invention, collector wire fixing part
105 and the outer part driven shaft 112 of collector be right-hand thread, when tight split nut 109 can effectively be avoided to lock, collector conducting wire
Loose phenomenon occurs for fixing piece 105 and collector pedestal 104.
Wherein, as shown in Figure 3 and Figure 4, in faraday probe provided in an embodiment of the present invention, collector wire fixing part
105, it is clearance fit between insulating positioning sleeve ring 110 and protection ring 106, material can be effectively prevent in expanded by heating
Excessive stress and deformation occur afterwards.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in essence of the invention
Within mind and principle, any modification, equivalent replacement, improvement and so on be should all be included in the protection scope of the present invention.
Claims (10)
1. a kind of faraday probe, comprising: the outer sheath of collector pedestal (104), the collector pedestal (104) is equipped with ceramics
The outer sheath of insulator (111), the ceramics insulator (111) is equipped with protection ring (106)；With the ceramics insulator (111)
On the basis of, the axial movement of the upper limitation collector pedestal (104), lower and the protection ring (106) carry out clearance fit；Its
It is characterized in that,
The outer sheath of the collector pedestal (104) is equipped with driven shaft locating sleeve (113), the outer part driven shaft of collector
(112) driven gear (115), the driven shaft locating sleeve (113) and the collector pedestal (104) are sequentially passed through, and is limited
Make moving radially for the collector outer part driven shaft (112)；The driven gear (115) is engaged with driving gear (114),
The driving gear (114) is set in the outside of driving shaft (108).
2. faraday probe according to claim 1, which is characterized in that the collector outer part driven shaft (112), institute
State driven shaft locating sleeve (113) and the driven gear (115) be symmetrical arranged there are two, the driving gear (114)
It is engaged with two driven gears (115).
3. faraday probe according to claim 2, which is characterized in that be in axial direction successively arranged height-regulating gasket
(103), the outer part (102) of collector and acorn nut (101), so that the outer part driven shaft (112) of the collector stablizes peace
On the collector pedestal (104), and it is able to carry out and turns there are part driven shaft (112) outside the gap guarantee collector
It is dynamic.
4. faraday probe according to claim 2 or 3, which is characterized in that be additionally provided on the collector pedestal (104)
Collector wire fixing part (105).
5. faraday probe according to claim 4, which is characterized in that the collector wire fixing part (105) and institute
Stating the outer part driven shaft (112) of collector is right-hand thread.
6. faraday probe according to claim 4, which is characterized in that it is fixed to be also cased with insulation on the protection ring (106)
Position lantern ring (110), and it is equipped with tight split nut (109).
7. faraday probe according to claim 6, which is characterized in that the collector wire fixing part (105), described
It is clearance fit between insulating positioning sleeve ring (110) and the protection ring (106).
8. faraday probe according to claim 1, which is characterized in that the driving shaft (108) is equipped with active axle key
(107)。
9. faraday probe according to claim 8, which is characterized in that the active axle key (107) uses single key structure.
10. a kind of faraday probe characterized by comprising collector pedestal (104), the collector pedestal (104) it is outer
Side is arranged with ceramics insulator (111), and the outer sheath of the ceramics insulator (111) is equipped with protection ring (106)；With the ceramics
On the basis of insulator (111), the axial movement of the upper limitation collector pedestal (104), lower and the protection ring (106) are carried out
Clearance fit；
The outer sheath of the collector pedestal (104) is equipped with driven shaft locating sleeve (113), the outer part driven shaft of collector
(112) driven gear (115), the driven shaft locating sleeve (113) and the collector pedestal (104) are sequentially passed through, and is limited
Make moving radially for the collector outer part driven shaft (112)；The driven gear (115) is engaged with driving gear (114),
The driving gear (114) is set in the outside of driving shaft (108)；
It is in axial direction successively arranged and gasket (103), the outer part (102) of collector and acorn nut (101) is turned up, so that described
The outer part driven shaft (112) of collector is stably mounted on the collector pedestal (104), and there are gaps to guarantee the collection
The outer part driven shaft (112) of device is able to carry out rotation；
Collector wire fixing part (105) are additionally provided on the collector pedestal (104)；The collector wire fixing part
(105) and the outer part driven shaft (112) of the collector is right-hand thread；Insulation positioning is also cased on the protection ring (106)
It covers (110), and is equipped with tight split nut (109)；The collector wire fixing part (105), the insulating positioning sleeve ring ring
It (110) and between the protection ring (106) is clearance fit；The driving shaft (108) is equipped with active axle key (107).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810010713.4A CN108121004B (en) | 2018-01-05 | 2018-01-05 | Faraday probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810010713.4A CN108121004B (en) | 2018-01-05 | 2018-01-05 | Faraday probe |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108121004A CN108121004A (en) | 2018-06-05 |
| CN108121004B true CN108121004B (en) | 2019-05-24 |
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ID=62232723
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810010713.4A Active CN108121004B (en) | 2018-01-05 | 2018-01-05 | Faraday probe |
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Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111257001B (en) * | 2020-02-25 | 2021-02-02 | 北京航空航天大学 | Ring probe and combined probe |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1384525A (en) * | 2001-05-01 | 2002-12-11 | 日新电机株式会社 | Faraday device |
| CN103616154A (en) * | 2013-11-29 | 2014-03-05 | 北京航空航天大学 | Vacuum plume aerodynamic force measuring system and method |
| CN104202894A (en) * | 2014-07-29 | 2014-12-10 | 北京航空航天大学 | Faraday probe for ion thruster measurement |
| CN105116435A (en) * | 2015-07-13 | 2015-12-02 | 兰州空间技术物理研究所 | Ion thruster beam test method based on Faraday probe array |
| CN105116436A (en) * | 2015-07-13 | 2015-12-02 | 兰州空间技术物理研究所 | Ion thruster beam test system based on Faraday probe array |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013254723A (en) * | 2012-05-11 | 2013-12-19 | Hitachi High-Technologies Corp | Plasma processing apparatus |
-
2018
- 2018-01-05 CN CN201810010713.4A patent/CN108121004B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1384525A (en) * | 2001-05-01 | 2002-12-11 | 日新电机株式会社 | Faraday device |
| CN103616154A (en) * | 2013-11-29 | 2014-03-05 | 北京航空航天大学 | Vacuum plume aerodynamic force measuring system and method |
| CN104202894A (en) * | 2014-07-29 | 2014-12-10 | 北京航空航天大学 | Faraday probe for ion thruster measurement |
| CN105116435A (en) * | 2015-07-13 | 2015-12-02 | 兰州空间技术物理研究所 | Ion thruster beam test method based on Faraday probe array |
| CN105116436A (en) * | 2015-07-13 | 2015-12-02 | 兰州空间技术物理研究所 | Ion thruster beam test system based on Faraday probe array |
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| CN108121004A (en) | 2018-06-05 |
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