CN1083111C - Liquid crystal panel and its examining method - Google Patents
Liquid crystal panel and its examining method Download PDFInfo
- Publication number
- CN1083111C CN1083111C CN97113725A CN97113725A CN1083111C CN 1083111 C CN1083111 C CN 1083111C CN 97113725 A CN97113725 A CN 97113725A CN 97113725 A CN97113725 A CN 97113725A CN 1083111 C CN1083111 C CN 1083111C
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- China
- Prior art keywords
- inspection
- electrode
- electrodes
- liquid crystal
- test zone
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1345—Conductors connecting electrodes to cell terminals
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Liquid Crystal (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Mathematical Physics (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
- Liquid Crystal Display Device Control (AREA)
Abstract
The invention provides a liquid-crystal display device capable of inspecting all electrodes without trouble by using multi-purpose inspection probes spaced at a specific interval without difficulty even when the electrodes spaced at a different interval are included among electrodes to be inspected. A inspection region 14a is set for stripe electrodes 7a on a transparent substrate 2 included in the liquid crystal display panel and a second inspection region 14b is set for electrodes 21. The inspection region 14a includes a stripe electrode 7a arranged at a regular inspection interval D1 and a plurality of stripe-shaped electrodes 7c, 7d and 7e arranged at intervals different from the inspection interval D1, with the stripe-shaped electrodes 7c, 7d and 7e connected to inspection electrode 19 included in the second inspection region 14b. Inspection electrodes 19 are arranged at a proper regular inspection interval D2 in the second inspection region, thus can be inspected by inspection needle 17.
Description
The present invention relates to have the liquid crystal panel of a pair of relative transparency carrier that liquid crystal is clipped in the middle and a plurality of electrodes that on these transparency carriers, form.In addition, the inspection method that also relates to a plurality of electrodes that form on the transparency carrier of inspection in this liquid crystal panel.
Generally speaking, liquid crystal panel is to make like this, promptly utilizes sealant to be bonded together leaving certain interval between a pair of transparency carrier, and liquid crystal is enclosed in this gap.And, make liquid crystal indicator by liquid crystal drive is installed on this liquid crystal panel with subsidiary devices such as IC, back of the body irradiation, boxes.
In this liquid crystal panel, voltage is added in the transparency electrode of using on the liquid crystal on each transparency carrier, forms respectively.It is banded that these transparency electrodes are, or be numeral, character, specific special shapes such as pattern.Because these transparency electrodes are very tiny, be short-circuited so tend to contact with each other, therefore, when making liquid crystal panel, must check between a plurality of transparency electrodes whether be short-circuited in advance.
When carrying out this inspection, be to make spaced in accordance with regulations 2 inspection probes in the past, and checked between the two whether conducting and be short-circuited respectively with 11 transparency electrode, normally contact with adjacent 2 transparency electrodes.For example, it is to make to check that probe contacts with figure with the inspection of arrangement at regular intervals that the spy opens the disclosed inspection method of clear 61-194484 communique, carries out the inspection of short circuit etc.
, in above-mentioned existing inspection method, the figure that complete inspection is used all is with certain spaced, specifically, all is to arrange with the certain intervals consistent with the interval of checking probe, does not expect the situation that it changes at interval.Therefore, when being separated with deviation between the figure of checking usefulness, the interval of checking between the probe is changed corresponding to this deviation., be very difficult with checking that probe disposes like this.And, though the inspection probe of this particular arrangement form can be applicable to the special electrode figure, can not be used for other electrode pattern, versatility significantly descends.
As using the inspection method of checking probe, be to scan the method for checking that moves with respect to a plurality of transparency electrodes as the inspection object by 2 inspection probes that make inspection intervals configuration in accordance with regulations.This inspection method in complete inspection with figure by checking that interval between the probe is can check without barrier under the inspection intervals situation of arranging, if but when being to exist in the inspection area when using figure in checking the scanning area of probe by the spaced inspection different with this inspection intervals, 2 inspection probes are contacted with figure with these inspections, thereby can not check with figure these inspections.
The present invention develops in view of the problems referred to above that exist in the existing inspection method, even when its purpose is to exist the different transparency electrode of spacing in checking the transparency electrode of object, also can check without barrier whole electrodes with the general inspection probe of arranging at regular intervals.
In order to achieve the above object, liquid crystal panel of the present invention has a pair of transparency carrier that liquid crystal is clipped in the middle and a plurality of electrodes that form on these transparency carriers, and this liquid crystal panel is characterised in that:
(1) above-mentioned a plurality of electrodes are set one or more test zones,
(2) in one or more test zones, comprise the 1st electrode arranged by certain inspection intervals with by spaced a plurality of 2nd electrodes different with this inspection intervals,
(3) these the 2nd electrodes are connected with electrode with the inspection that is comprised in the test zone that comprises them or other test zone in addition,
(4) this inspection is arranged by certain inspection intervals intrinsic in the test zone that comprises them with electrode.
In said structure, said " test zone " with for example make 2 inspection probes to scanning as a plurality of electrodes of checking object this scanning turnover zone when mobile consistent.In addition, during testing fixture that use is arranged a plurality of inspection probes at regular intervals, these zones of checking that probe is arranged are called the test zone, and, said " inspection intervals " is equivalent to the interval between these 2 inspection probes when using 2 inspection probes, on the other hand, when using a plurality of inspection probe, be equivalent to each and check interval between probe.
When comprising in 1 test zone when at interval being the different electrode of spacing, available this inspection probe is to checking by the electrode group of the arranged spaced consistent with the interval of inspection probe.And, though can not check probe inspection with this, can check with electrode with the inspection that is connected with these electrodes to other different electrode group of interval.These check that yes by inspection intervals arrangement intrinsic in the test zone that comprises them, so can check without barrier with electrode.
The inspection that connects the 2nd electrode can form in the test zone that comprises the 2nd electrode with electrode, perhaps also can form in the test zone of the other setting different with the test zone that comprises the 2nd electrode.
The inspection method of liquid crystal panel of the present invention is a kind of inspection method that liquid crystal panel with above-mentioned such electrode pattern structure is carried out, and specifically, it is characterized in that:
(1) a plurality of inspection probes of arranging according to inspection intervals in accordance with regulations form one or more test zones,
(2) 1 a plurality of electrodes that the test zone contains make above-mentioned inspection probe contact with a plurality of the 1st electrodes of arranging by above-mentioned inspection intervals and check,
(3) in this test zone when existing by different with above-mentioned inspection intervals spaced a plurality of the 2nd electrode,
(4) just use the inspection that in the test zone that comprises these the 2nd electrodes or other test zone in addition, comprises promptly to check with electrode with the inspection that above-mentioned the 2nd electrode is connected with electrode, and
(5) these are checked with electrode according to comprising consistent being spaced of inspection intervals of inspection probe of their test zone with formation.
Fig. 1 is the exploded perspective view of an example of liquid crystal panel of the present invention.
Fig. 2 is the oblique view of the state after liquid crystal panel shown in Figure 1 is assembled in expression.
Fig. 3 is the vertical view that expression constitutes the configuration figure of the transparency electrode on 1 transparency carrier of liquid crystal panel shown in Figure 1.
Fig. 4 is the vertical view that expression constitutes the configuration figure of the transparency electrode on 1 transparency carrier in addition of liquid crystal panel shown in Figure 1.
Fig. 1 represents an example of liquid crystal panel of the present invention.This liquid crystal panel has the 1st transparency carrier and same the 2nd transparency carrier that is formed by transparent glass that is for example formed by transparent glass.Coat sealant 3 with methods such as printings on 1 substrate therein, sealing agent 3 is clipped in the middle and the 1st transparency carrier 1 and the 2nd transparency carrier 2 are bonded together.And liquid crystal is enclosed between the 1st transparency carrier 1 and the 2nd transparency carrier 2 gap that forms, in the promptly brilliant box.
With bonding agent etc. polaroid 4a is bonded on the outside surface of the 1st transparency carrier 1, with bonding agent etc. polaroid 4b is bonded on the outside surface of the 2nd transparency carrier 2 again.Here said bonding not being meant carried out the firm bonding of the sort of degree that can not take off, but by the degree that just can easily it be peeled off with little power it sticked.As above make liquid crystal panel shown in Figure 25.Then liquid crystal drive is bonded in IC13 on the IC installation site 9 of extension of the 2nd substrate 2 of this liquid crystal panel 5.This is bonding to be by for example ACF (Anisotropic conductive film: anisotropic conductive film) be clipped between substrate 2 and the IC13, again they carried out hot pressing and carry out.
As shown in Figure 3, the special graph electrode 6b that on the surface of the 1st transparency carrier 1, forms a plurality of band electrode 6a and form as specific pattern.These electrodes are connected with the terminal 8 that forms in the end of substrate 1.On the other hand, as shown in Figure 4, on the surface of the 2nd transparency carrier 2, form a plurality of band electrode 7a and a plurality of special graph electrode 7b.These electrodes are connected with the terminal 11 that forms on IC installation site 9.In addition, the leading section at the 2nd transparency carrier 2 forms the input terminal 12 that extends to IC installation site 9.
As shown in Figure 2, the 1st transparency carrier 1 and the 2nd transparency carrier 2 by bonding state under, each intersection point place that the band electrode 7a on band electrode 6a on the 1st transparency carrier 1 and the 2nd transparency carrier 2 intersects forms 1 pixel.In addition, the special graph electrode 7b on special graph electrode 6b on the 1st transparency carrier 1 and the 2nd transparency carrier 2 coincides, and forms each special graph.
In Fig. 2, not shown flexible wiring for example is welding on the input terminal 12, liquid crystal drive partly is fed to the drive signal that liquid crystal drive is sent here with the IC13.IC13 basis with electric power and drive signal by this melting welding, by voltage being added on the desirable suitable electrode, and voltage is added on the desirable special graph electrode, thereby desirable the elephant is presented on the liquid crystal panel.
, resemble normally,, require whole electrodes not to be short-circuit condition no matter be band electrode 6a and 7a or special graph electrode 6b and 7b in order on liquid crystal panel, to form.In order to check whether electrode is short-circuit condition, in this example, the electrode wiring graph of following formation liquid crystal panel.And considered to check the situation of the transparency electrode that on the 2nd transparency carrier 2, forms in the following description.
In Fig. 4, at first at 1 test zone 14a of set positions of crosscut band electrode 7a, again at the set positions different 1 test zone 14b in addition with it.The 1st test zone 14a is equivalent to make 2 inspection probes 16 arranging by inspection intervals D1 to scan turnover zone when mobile with respect to substrate 2.In addition, the 2nd test zone 14b is equivalent to make 2 inspection probes 17 arranging by inspection intervals D2 to scan turnover zone when mobile with respect to substrate 2.
Check that probe 16 and 17 has the front end contact portion than the area area little or about equally of checking the object electrode, and be connected with not shown check circuit.These check that probes are that electrode contacts with its front end contact portion with the inspection object, and with the form of electric signal with electric state that these electrodes were had, for example whether state transfer such as short circuit to check circuit.This check circuit comprises can detect at least whether be short-circuited promptly whether flow through the circuit of the electric current more than the setting between a pair of inspection probe.Such circuit can adopt well-known various circuit structures now, so its detailed description is omitted.
The band electrode 7a that comprises in the 1st test zone 14a (the 1st electrode) substantially by with the inspection intervals D1 identical distance of checking probe 16 be spacing arrangement, but the interval between 3 electrode 7c, the 7d in left side, the 7e (the 2nd electrode) is different with this inspection intervals.And circuit 18 extends from these electrodes 7c, 7d, 7e, checks with electrode 19 in the front end formation of these circuits.
These inspections are comprised among the 2nd test zone 14b different with the 1st test zone 14a with electrode 19.In the 2nd test zone 14b, the interval D 2 of pressing the inspection probe 17 that forms the 2nd test zone 14b with the electrode 21 that IC is connected with terminal 11 is inspection intervals D2 arrangement intrinsic among the 2nd test zone 14b.And 3 inspections also equate with this inspection intervals D2 with the interval between the electrode 19.
When checking, check probe 16 and check that probe 17 is placed in conveying by set inspection spacing and checks the i.e. position of the regulation of the 2nd transparency carrier 2 of object.Check probe 16 and 17 with respect to substrate 2 parallel moving by making then, or make substrate 2, make and check that respectively probe 16 and 17 moves along each test zone 14a, 14b with respect to checking probe 16 and 17 parallel moving.
If being short-circuited between the electrode arbitrarily in a plurality of band electrode 7a, just then when the inspection probe 16 that moves in the 14a of test zone arrives the electrode place that is short-circuited, this short-circuit conditions is detected.In addition, if the electrode 21 that is connected with IC terminal 11 is short-circuited, just then when the inspection probe 17 that moves in the 14b of test zone arrives the electrode place that is short-circuited, this short-circuit conditions is detected.
, in the 1st test zone 14a, moved to electrode 7c, 7d and the 7e place of left part, can not check the inspection that probe 16 carries out between these electrodes with this even check probe 16.This be because check the inspection intervals D1 of probe 16 different with the interval between these electrodes due to.In this example, the inspection that is connected with these electrodes 7c, 7d and 7e is extended the 2nd test zone 14b with electrode 19, and these inspections promptly the 2nd check that the inspection intervals of probe 17 is consistent with the inspection intervals of interval between the electrode 19 and the 2nd test zone 14b.Therefore, though can not can check with the 2nd inspection probe 17 with checking that probe 16 directly carries out the inspection between electrode 7c, 7d and the 7e.
In addition, in this example, the inspection that will be connected with electrode 7c, 7d and 7e extends to the 2nd test zone 14b with electrode 19, checks with the 2nd inspection probe 17.But also can replace with following method, promptly configuration inspection is included among the 1st test zone 14a it with electrode 19, and formation makes the consistent electrode pattern of inspection intervals D1 of interval and the 1st test zone 14a between these electrodes 19.If do like this, just can check that probe 16 is by checking the inspection of carrying out between electrode 7c, 7d and the 7e with electrode 19 with the 1st.In other words, do not need a plurality of test zones are set, if having one just passable.
More than be that example has illustrated the present invention with preferred example, but the present invention is not limited by this example, can carry out various changes in technical scope of the present invention.
For example, in example shown in Figure 4, in 1 test zone 14a, used 2 inspection probes 16, but also can adopt such replacement method, promptly arrange a plurality of inspection probes continuously by certain inspection intervals D1, also can check a plurality of electrodes simultaneously along test zone 14a.In addition, in example shown in Figure 1, be to apply the present invention to liquid crystal drive is directly installed in the liquid crystal of so-called COG (the Chip On Glass) form on the transparency carrier with IC, but the present invention also can be applied in the liquid crystal panel of arbitrary form in addition certainly.
In the above description, show inspection that electrode 7c, 7d that inspection forms on the 2nd transparency carrier 2 shown in Figure 4 and 7e the use situation with electrode 19 is set, and the inspection electrode that electrode that inspection forms on the 1st transparency carrier 1 shown in Figure 3 is used is not set.But, if desired, the inspection electrode of relevant the 1st transparency carrier 1 usefulness can be set also.
If adopt the inspection method of liquid crystal panel of the present invention and liquid crystal panel,, also can check without barrier with the general inspection probe of arranging at regular intervals even when then in as the transparency electrode of checking object, having the different transparency electrode of spacing.
Claims (3)
1. liquid crystal panel, it has a pair of relative transparency carrier that liquid crystal is clipped in the middle and a plurality of electrodes that form on these transparency carriers, and this liquid crystal panel is characterised in that:
Above-mentioned a plurality of electrodes are set one or more test zones,
In one or more test zones, comprise the 1st electrode arranged by certain inspection intervals with by spaced a plurality of 2nd electrodes different with this inspection intervals,
The inspection that is comprised in these the 2nd electrodes and the test zone that comprises them or other test zone in addition is connected with electrode,
This inspection is arranged by certain inspection intervals intrinsic in the test zone that comprises them with electrode.
2. liquid crystal panel according to claim 1 is characterized in that: above-mentioned inspection intervals is equivalent to check with the interval between the probe, this inspections with probe have can only with 1 contact portion that electrode contacts of inspection object.
3. the inspection method of a liquid crystal panel is used for checking these electrodes in the liquid crystal panel with a pair of relative transparency carrier that liquid crystal is clipped in the middle and a plurality of electrodes that form on these transparency carriers, it is characterized in that:
A plurality of inspection probes according to inspection intervals is in accordance with regulations arranged form one or more test zones,
A plurality of the 1st electrodes that a plurality of electrodes that above-mentioned inspection probe and 1 test zone are contained are promptly arranged by above-mentioned inspection intervals contact to be checked,
In this test zone when existing by different with above-mentioned inspection intervals spaced a plurality of the 2nd electrode,
Just use the inspection that in the test zone that comprises these the 2nd electrodes or other test zone in addition, comprises promptly to check with electrode with the inspection that above-mentioned the 2nd electrode is connected with electrode,
These are checked with electrode and arrange by certain inspection intervals intrinsic in the test zone that comprises them.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP264947/96 | 1996-10-04 | ||
| JP26494796 | 1996-10-04 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1178916A CN1178916A (en) | 1998-04-15 |
| CN1083111C true CN1083111C (en) | 2002-04-17 |
Family
ID=17410410
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN97113725A Expired - Fee Related CN1083111C (en) | 1996-10-04 | 1997-07-04 | Liquid crystal panel and its examining method |
Country Status (3)
| Country | Link |
|---|---|
| KR (1) | KR100445714B1 (en) |
| CN (1) | CN1083111C (en) |
| TW (2) | TW309597B (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100710149B1 (en) * | 2000-12-28 | 2007-04-20 | 엘지.필립스 엘시디 주식회사 | Liquid Crystal Display Device |
| JP3642304B2 (en) | 2001-08-09 | 2005-04-27 | セイコーエプソン株式会社 | Liquid crystal panel, liquid crystal device and electronic device |
| US7330583B2 (en) | 2002-08-19 | 2008-02-12 | Photon Dynamics, Inc. | Integrated visual imaging and electronic sensing inspection systems |
| TWI420457B (en) * | 2010-09-30 | 2013-12-21 | Chunghwa Picture Tubes Ltd | Gate driving voltage supply device and method for a display panel |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61194484A (en) * | 1985-02-25 | 1986-08-28 | 富士通株式会社 | Display panel |
| JPH06138474A (en) * | 1992-10-26 | 1994-05-20 | Matsushita Electric Ind Co Ltd | Liquid crystal display device |
| JPH06140482A (en) * | 1992-10-28 | 1994-05-20 | Tokyo Electron Ltd | Probe device |
| JPH06214201A (en) * | 1993-01-14 | 1994-08-05 | Citizen Watch Co Ltd | Liquid crystal display device and device and method for its inspection |
| JPH08285888A (en) * | 1995-04-17 | 1996-11-01 | Hioki Ee Corp | Line probe provided to z-axis unit of x-y type in-circuit tester |
-
1992
- 1992-11-02 TW TW081108708A patent/TW309597B/en not_active IP Right Cessation
-
1997
- 1997-04-25 TW TW086105428A patent/TW354834B/en not_active IP Right Cessation
- 1997-07-04 CN CN97113725A patent/CN1083111C/en not_active Expired - Fee Related
- 1997-09-26 KR KR1019970049003A patent/KR100445714B1/en not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| TW354834B (en) | 1999-03-21 |
| KR100445714B1 (en) | 2004-12-04 |
| CN1178916A (en) | 1998-04-15 |
| KR19980032412A (en) | 1998-07-25 |
| TW309597B (en) | 1997-07-01 |
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| SE01 | Entry into force of request for substantive examination | ||
| C06 | Publication | ||
| PB01 | Publication | ||
| C14 | Grant of patent or utility model | ||
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Granted publication date: 20020417 Termination date: 20120704 |