CN108279388A - A kind of injection of Switching Power Supply fault simulation and testability analysis device and method - Google Patents
A kind of injection of Switching Power Supply fault simulation and testability analysis device and method Download PDFInfo
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- CN108279388A CN108279388A CN201810111796.6A CN201810111796A CN108279388A CN 108279388 A CN108279388 A CN 108279388A CN 201810111796 A CN201810111796 A CN 201810111796A CN 108279388 A CN108279388 A CN 108279388A
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
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Abstract
The invention discloses a kind of injection of Switching Power Supply fault simulation and testability analysis device and method, described device includes switch power module, signal switches and conditioning module, master system, oscillograph, wherein：The switch power module is provided with several direct fault location points and crucial test node；The signal switching and conditioning module are connected with the crucial test node of switch power module；The master system switches with signal and conditioning module, oscillograph are connected；The oscillograph switches with signal and conditioning module, master system are connected.The present invention carries out simulated injection for the various faults pattern of Switching Power Supply, and the voltage signal by monitoring the crucial test node in the real-time monitoring switch power circuit of system, Fault characteristic parameters are extracted, fault test correlation matrix is built, realize the testability analysis to Switching Power Supply.
Description
Technical field
The invention belongs to switch power technology field, it is related to a kind of electrical power monitoring device and testability analysis method, especially
It is related to a kind of injection of Switching Power Supply fault simulation and testability analysis device and method.
Background technology
As the capital equipment for completing electric energy conversion and power transfer, Switching Power Supply can module, computer, relay in order to control
The load supplyings such as device are one of most important units in power electronic system.In recent years, the rapid development of electronic technology makes one
Have a higher requirement to electronic instrument and equipment, and power supply is the basic components of electronic equipment normal work, is usually located at
The most upstream of system provides energy for whole system.Its failure arrives the working condition of downstream various components by seriously endangering, therefore
Requirement to its reliability is higher and higher, ensures it with good testability.
Invention content
The object of the present invention is to provide a kind of Switching Power Supply fault simulation injection and testability analysis device and method, for
The various faults pattern of Switching Power Supply carries out simulated injection, and by monitoring the key in the real-time monitoring switch power circuit of system
The voltage signal of test node extracts Fault characteristic parameters, builds failure-test correlation matrix, realizes to Switching Power Supply
Testability analysis.
The purpose of the present invention is what is be achieved through the following technical solutions：
A kind of injection of Switching Power Supply fault simulation and testability analysis device, including the switching of switch power module, signal and conditioning
Module, master system, oscillograph, wherein：
The switch power module is provided with several direct fault location points and crucial test node；
The signal switching and conditioning module are connected with the crucial test node of switch power module；
The master system switches with signal and conditioning module, oscillograph are connected；
The oscillograph switches with signal and conditioning module, master system are connected；
The direct fault location point completes the fault simulation drifted about to a variety of component parameters of Switching Power Supply, and master system is to letter
Number switching and conditioning module send control instruction, signal switching and conditioning module cut according to the control instruction that master system is sent
Corresponding key test node in switch power module is changed, and the voltage signal of each crucial test node is improved to oscillograph and is permitted
Perhaps within the scope of voltage measurement, oscillograph completes the crucial test node signal testing that signal switches and conditioning module is transmitted
Afterwards, test data being transmitted to master system, master system builds failure-test correlation matrix according to test data,
Realize the testability analysis to Switching Power Supply.
A method of the injection of Switching Power Supply fault simulation and testability analysis are carried out using above-mentioned apparatus, including walked as follows
Suddenly：
Step 1：The crucial test node of switch power module is switched with signal and conditioning module is connected, signal switching and tune
The output of reason module is connected with oscillograph, and oscillograph is connected with master system；
Step 2：By needing crucial test node to be tested, setting to survey in master system selecting switch power module circuitry
Try the store path of data；
Step 3：The failure component and its fault mode of Switching Power Supply are chosen, and is completed to the failure by direct fault location point
Simulation, power on after Switching Power Supply stablize output after, run master system program, control signal switching and conditioning module, lead to
It crosses oscillograph and completes the measurement of each crucial test node voltage signal, and be transferred to master system；
Step 4：By master system, the characteristic parameter extracted needed for each crucial test node voltage data and its preservation are set
Path；
Step 5：The threshold value bound of each crucial test node characteristic parameter of switch power module is set by master system,
Failure-test matrix of switch power module is established accordingly, and calculates testability index, completes the survey to switch power module
The analysis of examination property.
The invention has the advantages that：
1, the present invention can carry out Switching Power Supply by way of plug or dial-up switching the simulation note of various faults pattern
Enter.
2, the present invention can real-time and accurately each key node of monitoring switch power supply voltage signal situation of change, by upper
Position machine system processing analysis data, analyze the testability of Switching Power Supply.
3, the present invention is suitable for the status monitoring and testability analysis of most of Switching Power Supplies, has very high transplantability,
Platform can be provided for the status monitoring and testability analysis of other power supplys.
Description of the drawings
Fig. 1 is the structural schematic diagram of the injection of Switching Power Supply fault simulation and testability analysis device；
Fig. 2 is the structural schematic diagram of switch power module；
Fig. 3 is each crucial test node voltage signal measuring principle figure of Switching Power Supply；
Fig. 4 is the structural schematic diagram of relay switch unit；
Fig. 5 is master system structure chart；
Fig. 6 is the schematic diagram that testability is analyzed according to failure-test correlation matrix.
Specific implementation mode
Technical scheme of the present invention is further described below in conjunction with the accompanying drawings, however, it is not limited to this, every to this
Inventive technique scheme is modified or replaced equivalently, and without departing from the spirit of the technical scheme of the invention and range, should all be covered
In protection scope of the present invention.
Specific implementation mode one：Illustrate present embodiment with reference to Fig. 1.Switching Power Supply failure described in present embodiment
Simulated injection and testability analysis device are by switch power module 1, signal switching and conditioning module 2, master system 3, oscillography
Device 4 is constituted, wherein：
The switch power module 1 selects certain LED drive power, is a kind of constant-current source that output current is 700mA.According to electricity
The failure statistics data in source and sensitivity analysis are as a result, the direct fault location point 1-2 of setting includes MOSFET, optocoupler, output filtering
The components such as capacitance, sampling resistor are 11 total.The crucial test node 1-1 of each section is 14 total in circuit.
The signal switching and conditioning module 2 are connected with 14 key test node 1-1 of switch power module 1, root
Switch corresponding node according to the control instruction that master system 3 is sent, and each key test node in switch power module 1 is electric
Within the scope of the voltage measurement that pressure signal condition allows to oscillograph 4.
The master system 3 and signal switch and conditioning module 2, oscillograph 4 are connected, by master system 3 to
Signal switches and conditioning module 2 sends control instruction, and control switches corresponding test node voltage signal, and by matching
Modulate circuit and be connected with oscillograph 4.After oscillograph 4 completes test, test data is transferred to master system 3.
The oscillograph 4 is shown using the number of the DSO5012A models of Agilent Technologies Inc. companies
Wave device is connected with signal switching and conditioning module 2, master system 3, the test section that signal switching and conditioning module 2 are transmitted
After the completion of point signal testing, data are passed through into LAN（LAN）It is transmitted to master system 3.
Specific implementation mode two：Present embodiment is said with reference to Fig. 2 to the further explanation of specific implementation mode one
Bright present embodiment.Switch power module 1 described in present embodiment includes crucial test node 1-1, direct fault location point 1-2,
Wherein：
The crucial test node 1-1 is 14 total, contains the input voltage point, output voltage point, feedback of Switching Power Supply
Electrical voltage point, optocoupler input voltage point, optocoupler output voltage point, reference voltage point, MOSFET grid voltages point, MOSFET source electricity
Pressure point, MOSFET drain voltage points etc..As shown in Fig. 2, TP1For 400V input voltages, TP2For drain voltage, TP3For source electrode electricity
Pressure, TP4For grid voltage, TP5For auxiliary supply voltage, TP6For optocoupler output voltage, TP7For NCP1230 export 15V voltages,
TP8For diode input voltage, TP9For output voltage, TP10For TL431 supply voltages, TP11For amplifier supply voltage, TP12For
Reference voltage, TP13For output sampled voltage, TP14For optocoupler input voltage.
The direct fault location point 1-2 is 11 total, can be realized by way of plug or dial-up switching split powered-down
The fault simulation of a variety of component parameter drifts in source.Wherein failure component includes MOSFET, optocoupler, alminium electrolytic condenser, sampling
Resistance etc..As shown in Fig. 2, RC1For decanting point, the RC of output sampling resistor resistance value drift2For resistance in reference voltage module
First decanting point, RC of drift3Second decanting point, the RC to drift about for resistance in reference voltage module4It is adjusted to compare
Decanting point, the RC of mould resistance drift in the block5For decanting point, the RC of the resistance drift in PWM control modules6It is right
Decanting point, the C for the resistance drift that MOSFET electric currents are sampled2Decanting point, C for the drift of alminium electrolytic condenser capacitance4For than
Compared with decanting point, the C of the capacitor's capacity drift in adjustment module5For in light-coupled isolation module capacitor's capacity drift decanting point,
OP1For decanting point, the Q of the optocoupler current transfer ratio drift in light-coupled isolation module1For the note of MOSFET conducting resistance resistance values drift
Access point.
Specific implementation mode three：Present embodiment is the further explanation to specific implementation mode one, with reference to Fig. 3 and
4 illustrate present embodiment.Signal described in present embodiment switches and conditioning module 2 includes main control unit 2-1, serial communication list
First 2-2, driving unit 2-3, relay switching circuit 2-4, voltage modulate circuit 2-5, wherein：
The main control unit 2-1 is STM32, model F103ZET6.
The serial communication unit 2-2 is PL2303, is connected between main control unit 2-1 and master system 3, will lead
The RS2303 signals of control unit 2-1 are converted with usb signal.
The driving unit 2-3 is made of coding chip 2-3-1 and transistor array 2-3-2.Coding chip 2-3-1 choosings
With 74LS238 chips, transistor array 2-3-2 selects ULN2003.The input terminal connection main control unit 2-1 of coding chip 2-3-1
I/O pin, output end connects the input terminal of transistor array 2-3-2.
The relay switching circuit 2-4 is made of multiple relay switch units, and each relay unit is by shining
Diode 2-4-1, resistance 2-4-2 and relay 2-4-3 compositions.+ 5V feeder ears connection light emitting diode the 2- of relay 2-4-3
The anode of 4-1.The both ends of resistance 2-4-2 are separately connected the control terminal of the cathode and relay 2-4-3 of diode 2-4-1.Relay
The control port of device 2-4-3 is connected with the transistor array 2-3-2 output ports of driving unit 2-3, transistor array 2-3-2's
Each output port connects the control terminal of two relay control units.The normally opened contact connection voltage conditioning of relay 2-4-3
The test node of the input terminal of circuit 2-5, switch power module 1 is signally attached on the moving contact of relay 2-4-3.
The voltage modulate circuit 2-5 is connected with the output end of relay switching circuit 2-4 and oscillograph 4.Voltage tune
Reason circuit 2-5 follows circuit 2-5-2 to form by bleeder circuit 2-5-1 and amplifier, the output end connection of relay handover module 2-4
Bleeder circuit 2-5-1 is input to oscillography by the signal after bleeder circuit 2-5-1 decompressions after amplifier follows circuit 2-5-2 to be isolated
Device 4.
Specific implementation mode four：Present embodiment is the further explanation to specific implementation mode one.In present embodiment
The oscillograph 4 uses dual channel oscilloscope, model DSO5012A.Master system 3 is connected with oscillograph 4 by network interface,
And application VISA sends standard commands for programmable instruments to oscillograph DSO5012A（SCPI）, control the measurement of oscillograph 4 and simultaneously transmit
Through signal switching and treated the test node voltage signal data of conditioning module 2.
Specific implementation mode five：Present embodiment is said with reference to Fig. 5 to the further explanation of specific implementation mode one
Bright present embodiment.Master system 3 described in present embodiment include test setting interface 3-1, data processing interface 3-2,
Testability analysis interface 3-3, wherein：
The test setting interface 3-1 is made of selection test node 3-1-1 and setting data storage path 3-1-2.Selection
Test node 3-1-1 is made of test node access select button and test node display lamp, may be implemented to Switching Power Supply mould
The selection of the crucial test node of block 1, according to selection result, master system 3 sends instruction to signal and switching conditioning module 2,
Control the voltage signal of test node selected by handover measurement.Test data is stored in selected by setting data storage path 3-1-2
Path in.
The data processing interface 3-2 shows that 3-2-2 is formed by selection characteristic parameter 3-2-1 and before and after the processing waveform.
After crucial test node characteristic parameter is provided with by selection characteristic parameter 3-2-1,3 MATLAB Program of master system is complete
The processing of each crucial test node voltage data in pairs, and rear waveform display portion 3-2-2 is intuitively shown before treatment,
Characteristic parameter is automatically saved in the form of .mat files in set data storage path 3-1-2 simultaneously.
The testability analysis interface 3-3 is by setting threshold value bound 3-3-1, structure failure-test correlation matrix
3-3-2 and calculating testability index 3-3-3 compositions.Compare each crucial test node characteristic parameter under each fault mode with without reason
The difference of each characteristic parameter under barrier state is more than set threshold value, is then by this feature parameter definition under the fault mode
" 1 ", on the contrary it is " 0 ".All " 1 " and " 0 " elements are then carried out structure matrix by failure-test correlation matrix 3-3-2.According to
The matrix established, master system 3 directly invoke MATLAB programs calculate testability index 3-3-3, including failure recall rate,
Percent Isolated fails to detect failure and ambiguity group.
Specific implementation mode six：Present embodiment is said with reference to Fig. 6 to the further explanation of specific implementation mode one
Bright present embodiment.A kind of calculating side analyzing testability according to failure-test correlation matrix is provided in present embodiment
Method, the method are as follows：
Step 1：After obtaining failure-test correlation matrix, it is first determined whether there are full zero row, carried out if there is no if
Step 2 deletes full zero row if there are full zero row, and it is to fail to examine to define the fault mode corresponding to all full zero row
The failure haveing；Meanwhile the fault mode corresponding to all rows in obtained new matrix is the failure that can be detected, then failure is examined
Extracting rate is the ratio between the fault mode that can be detected and all fault modes；
Step 2：It is calculated on the basis of new matrix：Judgment matrix whether there is the identical column vector of element, if being not present
Then carry out step 3, and if it exists, then show that these are redundancy testing group；
Step 3：On the basis of new matrix, the identical row vector of element is judged whether again, is walked if there is no if
Rapid four, if all deleting identical row vector in the presence of if, and define the fault mode corresponding to these identical row vectors
For ambiguity group；
Step 4：Percent Isolated is finally calculated, the Percent Isolated is all row vector institutes of the final matrix obtained
The ratio between corresponding fault mode and all fault modes.
Specific implementation mode seven：It is carried out using one ~ six described device of specific implementation mode present embodiments provide for a kind of
Switching Power Supply fault simulation is injected and the method for testability analysis, the method specific implementation step are as follows：
Step 1：The crucial test node 1-1 of switch power module 1 is passed through into DB9 lines and signal switching and 2 phase of conditioning module
Even；Signal switching and the output of conditioning module 2 are connected with oscillograph 4；Oscillograph 4 is passed through into LAN（LAN）With host computer
System 3 is connected.
Step 2：By needing to survey in 1 circuit of test setting interface 3-1 selecting switch power module of master system 3
The store path of test data is arranged in the key node of examination.
Step 3：The failure component and its fault mode of Switching Power Supply are chosen, and passes through the 1-2 completions pair of direct fault location point
The simulation of the failure.It powers on after Switching Power Supply stablizes output, runs 3 program of master system, the switching of control signal and conditioning
Module 2, the measurement of each crucial test node 1-1 voltage signals is completed by oscillograph 4, and is transferred to master system 3.
Step 4：It is arranged needed for each test node voltage data by the data processing interface 3-2 of master system 3 and is extracted
Characteristic parameter and its storing path.
Step 5：By the testability analysis interface 3-3 of master system 3, each crucial test of switch power module 1 is set
The threshold value bound of node diagnostic parameter establishes failure-test matrix of switch power module 1, and calculates inspection of being out of order accordingly
The testability indexes such as extracting rate, Percent Isolated, ambiguity group complete the testability analysis to switch power module 1.
Claims (10)
1. a kind of Switching Power Supply fault simulation injection and testability analysis device, it is characterised in that described device includes Switching Power Supply
Module, signal switching and conditioning module, master system, oscillograph, wherein：
The switch power module is provided with several direct fault location points and crucial test node；
The signal switching and conditioning module are connected with the crucial test node of switch power module；
The master system switches with signal and conditioning module, oscillograph are connected；
The oscillograph switches with signal and conditioning module, master system are connected.
2. Switching Power Supply fault simulation injection according to claim 1 and testability analysis device, it is characterised in that described
Switch power module is the constant-current source that output current is 700mA.
3. Switching Power Supply fault simulation injection according to claim 1 and testability analysis device, it is characterised in that described
The number of crucial test node is 14, respectively：400V input voltages, drain voltage, source voltage, T grid voltages, T are auxiliary
Help supply voltage, T optocouplers output voltage, NCP1230 output 15V voltages, diode input voltage, output voltage, TL431 power supplies
Voltage, amplifier supply voltage, reference voltage, output sampled voltage, optocoupler input voltage；The number of the direct fault location point is 11
It is a, respectively：Export the decanting point of sampling resistor resistance value drift, first injection that resistance drifts about in reference voltage module
In point, reference voltage module resistance drift about second decanting point, compare in adjustment module resistance drift note
The decanting point of resistance drift in access point, PWM control modules, the resistance sampled to MOSFET electric currents drift about
Decanting point, alminium electrolytic condenser capacitance drift decanting point, compare in adjustment module capacitor's capacity drift decanting point, optocoupler every
The decanting point of the optocoupler current transfer ratio drift in decanting point, light-coupled isolation module from mould capacitor's capacity drift in the block,
The decanting point of MOSFET conducting resistance resistance values drift.
4. Switching Power Supply fault simulation injection according to claim 1 and testability analysis device, it is characterised in that described
Signal switches and conditioning module includes main control unit, serial communication unit, driving unit, relay switching circuit, voltage conditioning
Circuit, wherein：
The serial communication unit is connected between main control unit and master system, by the RS2303 signals of main control unit with
Usb signal is converted；
The driving unit is made of coding chip and transistor array, the IO of the input terminal connection main control unit of coding chip
Pin, output end connect the input terminal of transistor array；
The relay switching circuit is made of multiple relay switch units, each relay unit by light emitting diode,
Resistance and relay composition；The anode of+5V feeder ears connection the light emitting diode of relay, the both ends of resistance are separately connected two poles
The cathode of pipe and the control terminal of relay, the control port of relay are connected with the transistor array output port of driving unit,
Each output port of transistor array connects the control terminal of two relay control units, the normally opened contact connection electricity of relay
The input terminal of modulate circuit, the crucial test node of switch power module is pressed to be connected on the moving contact of relay；
The voltage modulate circuit follows circuit to form by bleeder circuit and amplifier, the output end connection of relay handover module
Bleeder circuit, the signal after being depressured by bleeder circuit are input to oscillograph after amplifier follows circuit to be isolated.
5. Switching Power Supply fault simulation injection according to claim 4 and testability analysis device, it is characterised in that described
Main control unit is STM32, model F103ZET6；Serial communication unit is PL2303；Coding chip selects 74LS238 chips,
Transistor array selects ULN2003.
6. Switching Power Supply fault simulation injection according to claim 1 and testability analysis device, it is characterised in that described
Oscillograph uses dual channel oscilloscope, model DSO5012A.
7. Switching Power Supply fault simulation injection according to claim 1 and testability analysis device, it is characterised in that described
Master system includes test setting interface, data processing interface, testability analysis interface, wherein：
The test setting interface is made of selection test node and setting data storage path；
The data processing interface is shown by selection characteristic parameter and before and after the processing waveform to be formed；
The testability analysis interface is by setting threshold value bound, structure failure-test correlation matrix and calculates testability
Index forms.
8. Switching Power Supply fault simulation injection according to claim 7 and testability analysis device, it is characterised in that described
The construction method of failure-test correlation matrix is as follows：
（1）Compare the difference of each crucial the test node characteristic parameter and each characteristic parameter under unfaulty conditions under each fault mode
Not, it is more than set threshold value, then is " 1 " by this feature parameter definition under the fault mode, otherwise is " 0 "；
（2）All " 1 " and " 0 " elements are carried out to the structure of failure-test correlation matrix.
9. Switching Power Supply fault simulation injection according to claim 7 and testability analysis device, it is characterised in that described
The computational methods of testability index are as follows：
Step 1：After obtaining failure-test correlation matrix, it is first determined whether there are full zero row, carried out if there is no if
Step 2 deletes full zero row if there are full zero row, and it is to fail to examine to define the fault mode corresponding to all full zero row
The failure haveing；Meanwhile the fault mode corresponding to all rows in obtained new matrix is the failure that can be detected, then failure is examined
Extracting rate is the ratio between the fault mode that can be detected and all fault modes；
Step 2：It is calculated on the basis of new matrix：Judgment matrix whether there is the identical column vector of element, if being not present
Then carry out step 3, and if it exists, then show that these are redundancy testing group；
Step 3：On the basis of new matrix, the identical row vector of element is judged whether again, is walked if there is no if
Rapid four, if all deleting identical row vector in the presence of if, and define the fault mode corresponding to these identical row vectors
For ambiguity group；
Step 4：Percent Isolated is finally calculated, the Percent Isolated is all row vector institutes of the final matrix obtained
The ratio between corresponding fault mode and all fault modes.
10. a kind of device using described in claim 1-9 any claims carries out the injection of Switching Power Supply fault simulation and survey
The method of examination property analysis, it is characterised in that steps are as follows for the method：
Step 1：The crucial test node of switch power module is switched with signal and conditioning module is connected, signal switching and tune
The output of reason module is connected with oscillograph, and oscillograph is connected with master system；
Step 2：By needing crucial test node to be tested, setting to survey in master system selecting switch power module circuitry
Try the store path of data；
Step 3：The failure component and its fault mode of Switching Power Supply are chosen, and is completed to the failure by direct fault location point
Simulation, power on after Switching Power Supply stablize output after, run master system program, control signal switching and conditioning module, lead to
It crosses oscillograph and completes the measurement of each crucial test node voltage signal, and be transferred to master system；
Step 4：By master system, the characteristic parameter extracted needed for each crucial test node voltage data and its preservation are set
Path；
Step 5：The threshold value bound of each crucial test node characteristic parameter of switch power module is set by master system,
Failure-test matrix of switch power module is established accordingly, and calculates testability index, completes the survey to switch power module
The analysis of examination property.
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Cited By (1)
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| CN113740759A (en) * | 2021-09-08 | 2021-12-03 | 上海地铁维护保障有限公司 | Switching power supply performance testing device |
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Application publication date: 20180713 |