CN108254627B - Electromagnetic field waveform signal acquisition and comparison method and device - Google Patents
Electromagnetic field waveform signal acquisition and comparison method and device Download PDFInfo
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Abstract
The invention provides an electromagnetic field waveform signal acquisition and comparison method and device, and relates to the technical field of electromagnetic field waveform signal acquisition. The electromagnetic field waveform signal acquisition and comparison method comprises the steps of receiving a basic waveform signal disturbed by a sample to be detected through external equipment, arranging the external equipment at a preset position of the sample to be detected, and comparing the disturbed basic waveform signal with prestored comparison sample data to obtain a comparison result. The invention can collect various waveforms, conveniently and effectively carry out comparison analysis on the waveform signals, and finally obtain an intuitive comparison result through a feedback channel of a computer.
Description
Technical Field
The invention relates to the technical field of electromagnetic field waveform signal acquisition, in particular to an electromagnetic field waveform signal acquisition and comparison method and device.
Background
In electromagnetism, an electromagnetic field is a physical field generated by a charged object, and is a generic term for a continuum of inter-related, interdependent electric and magnetic fields. The time-varying electric field generates a magnetic field, and the time-varying magnetic field generates an electric field, which are causal to each other to form an electromagnetic field. The electromagnetic field can be caused by charged particles with variable speed motion or by current with variable intensity, and the electromagnetic field always propagates to the periphery at the speed of light to form electromagnetic waves regardless of the reason.
Electromagnetic waves are widely applied to the aspects of electrical technology, electronic technology, electromagnetic measurement and the like, and a general electromagnetic field waveform signal acquisition method can only acquire a plurality of generated waveforms in limited forms and is difficult to compare and analyze waveform signals.
Disclosure of Invention
In view of the above, the present invention provides a method and an apparatus for collecting and comparing electromagnetic waveform signals, which can collect various waveforms, conveniently and effectively compare and analyze the waveform signals, and output a comparison result.
In order to achieve the above purpose, the embodiment of the present invention adopts the following technical solutions:
in a first aspect, an embodiment of the present invention provides an electromagnetic field waveform signal acquisition and comparison method and apparatus, including: receiving a basic waveform signal disturbed by a sample to be detected through external equipment, wherein the external equipment is arranged at a preset position of the sample to be detected; and comparing the disturbed basic waveform signal with pre-stored comparison sample data to obtain a comparison result.
With reference to the first aspect, an embodiment of the present invention provides a first possible implementation manner of the first aspect, wherein the basic waveform signal is a sine wave amplitude modulation signal with a frequency of 10 to 25KHZ and an amplitude of 15 to 20V.
With reference to the first aspect, an embodiment of the present invention provides a second possible implementation manner of the first aspect, where the external device includes a conductive component and a strain detection chip; the variable force detection chip converts the contact force between the sample to be detected and the conductive component into a measurable force value, and the measurable force value forms disturbance on a basic waveform signal.
With reference to the first aspect, an embodiment of the present invention provides a third possible implementation manner of the first aspect, where the step of comparing the disturbed basic waveform signal with pre-stored comparison sample data to obtain a comparison result includes: acquiring parameters of a basic waveform signal disturbed by a sample to be detected; comparing parameters of the basic waveform signal after being disturbed by the sample to be detected with parameters of the waveform signal in the comparison sample data, wherein the parameters comprise frequency and/or amplitude; and when the similarity degree of the frequency and/or the amplitude is larger than the threshold value, obtaining a comparison result that the basic waveform signal is the same as the waveform signal in the comparison sample data.
With reference to the first aspect, an embodiment of the present invention provides a fourth possible implementation manner of the first aspect, where the method further includes: and outputting and displaying the comparison result.
With reference to the first aspect, an embodiment of the present invention provides a fifth possible implementation manner of the first aspect, where the method further includes: and acquiring a basic waveform signal disturbed by the comparative real object sample, and storing the basic waveform signal disturbed by the comparative real object sample as comparative sample data.
In a second aspect, an embodiment of the present invention further provides an electromagnetic field waveform signal acquisition and comparison apparatus, including: the receiving module is used for receiving a basic waveform signal disturbed by a sample to be detected through external equipment; the external equipment is arranged at a preset position of the sample to be detected;
and the comparison module is used for comparing the disturbed basic waveform signal with the prestored comparison sample data to obtain a comparison result.
In combination with the second aspect, the embodiment of the present invention provides a first possible implementation manner of the second aspect, wherein the basic waveform signal is a sine wave amplitude modulation signal with a frequency of 10-25KHZ and an amplitude of 15-20V.
With reference to the second aspect, an embodiment of the present invention provides a second possible implementation manner of the second aspect, where the comparison module is further configured to: acquiring parameters of a basic waveform signal disturbed by a sample to be detected; comparing parameters of the basic waveform signal after being disturbed by the sample to be detected with parameters of the waveform signal in the comparison sample data, wherein the parameters comprise frequency and/or amplitude; and when the similarity degree of the frequency and/or the amplitude is larger than the threshold value, obtaining a comparison result that the basic waveform signal is the same as the waveform signal in the comparison sample data.
With reference to the second aspect, an embodiment of the present invention provides a third possible implementation manner of the second aspect, where the third possible implementation manner further includes: and the output module is used for outputting and displaying the comparison result.
The embodiment of the invention has the following beneficial effects: the embodiment of the invention provides an electromagnetic field waveform signal acquisition and comparison method and device, wherein a specific basic waveform is used as a carrier, external equipment is connected with a sample to be detected, the sample to be detected is enabled to disturb the basic waveform, the basic waveform disturbed by the sample to be detected is acquired, and is analyzed and compared with prestored comparison sample data to obtain a comparison result. Due to the richness of the samples to be detected, a plurality of basic waveforms disturbed by the samples to be detected can be generated after the basic waveforms are disturbed, so the types of the collected waveforms are rich; the embodiment of the invention is additionally provided with a simple control analysis module, so that the output waveform signal can have an effective feedback function, and the waveform signal is contrasted and analyzed to finally obtain an intuitive contrast result. The embodiment of the invention can quickly and effectively acquire various electromagnetic fields, particularly the magnetic field signals of the interdisciplinary department. In addition, the hardware cost of the embodiment of the invention is lower, various electromagnetic field signals can be fed back and compared, and the application range is wider.
Additional features and advantages of the disclosure will be set forth in the description which follows, or in part may be learned by the practice of the above-described techniques of the disclosure, or may be learned by practice of the disclosure.
In order to make the aforementioned objects, features and advantages of the present disclosure more comprehensible, preferred embodiments accompanied with figures are described in detail below.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
FIG. 1 is a flow chart of a method of the present invention;
FIG. 2 is a hardware block diagram of the present invention;
FIG. 3 is a flow chart of the present invention for processing a base waveform;
FIG. 4 is a logic diagram of a waveform signal generation module;
FIG. 5 is a view showing the structure of the apparatus of the present invention.
Detailed Description
To make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Based on the fact that the existing electromagnetic field waveform signal acquisition method can only generate and acquire a plurality of waveforms in a limited form and the waveform signal output result has no effective feedback channel, the electromagnetic field waveform signal acquisition and comparison method and device provided by the embodiment of the invention can generate and acquire various waveforms, can compare and analyze the waveform signals and output the comparison result.
For the understanding of the present embodiment, first, the electromagnetic field waveform signal acquisition comparison method disclosed in the embodiment of the present invention will be described in detail with reference to the accompanying drawings.
Example 1
Embodiment 1 of the present invention provides an electromagnetic field waveform signal acquisition and comparison method, which is shown in a flowchart of the electromagnetic field waveform signal acquisition and comparison method shown in fig. 1, and the method includes the following steps:
and step S102, receiving the basic waveform signal disturbed by the sample to be detected through external equipment.
The external equipment is arranged at a preset position of the sample to be detected.
The singlechip waveform parameter generation module generates basic waveform data and transmits the basic waveform data to the waveform generation circuit module; the waveform generating circuit module generates a basic waveform signal and intermittently sends out a basic waveform, and the basic waveform is used as a carrier; the basic waveform signal generating circuit module is connected with the amplifier circuit, receives and amplifies the waveform signal output by the waveform generating circuit module and then transmits the waveform signal to the waveform shaping circuit module; the waveform shaping circuit module performs moving average and interference filtering on the waveform peak value and the phase parameter of the waveform signal, and the waveform shaping circuit outputs a basic waveform; and the basic waveform is disturbed by a sample to be detected accessed by external feedback equipment, and then a basic waveform signal disturbed by the sample to be detected is transmitted to the waveform control analysis module.
The external feedback equipment is provided with a conductive part, the conductive part is in contact with a sample to be detected, the conductive part is communicated with a circuit where a basic waveform is located, and a comparison object sample to be detected is accessed into the circuit through alternating current, so that a basic waveform signal passes through the sample to be detected, and the sample to be detected forms disturbance on the basic waveform signal. The external device includes a conductive member and a strain force detecting chip; the conductive part is arranged at a preset position of the sample to be detected and is in contact with the sample to be detected, the strain force detection chip converts the contact force between the sample to be detected and the conductive part into a measurable force value, the measurable force value controls the acquisition time of the signal of the sample to be detected, and only the waveform signal of the sample to be detected within the measurable force value range is effective. The conductive parts are a detection probe and a conductive electrode, the conductive electrode can be fixed at a preset position of a sample to be detected and can be clamped or held by hands, the detection probe is operated by a worker to be contacted with the sample to be detected, and the sample to be detected is connected into an alternating current circuit with a basic waveform, so that the sample to be detected generates disturbance on the basic waveform in a loop. Due to the diversity of samples to be detected and the diversity of contact modes of the samples to be detected and the detection probes, the contact areas and the contact force of the samples to be detected and the detection probes are inconsistent in size, the strain force detection chip is arranged in the external equipment, after the detection probes contact the samples to be detected, the strain force detection chip generates different forces, and the strain force detection chip converts the different forces into the forces within a measurable range so as to ensure the consistency of the disturbance effect of the samples to be detected after the samples to be detected are connected into a circuit.
The basic waveform signal is a sine wave amplitude modulation signal with the frequency of 10-25KHZ and the amplitude of 15-20V. The basic waveform parameters are detected and accumulated through long-term experiments, and the waveform in the parameter range is the waveform which is most easily disturbed by a sample to be detected in the nature.
And the basic waveform serving as the carrier is disturbed by different samples to be detected, so that abundant waveforms can be acquired.
And step S104, comparing the disturbed basic waveform signal with pre-stored comparison sample data to obtain a comparison result.
A data generation module of the computer converts the basic waveform signal disturbed by the sample to be tested into sample data to be tested and sends the sample data to a waveform control analysis module; and the waveform control analysis module performs comparative analysis on the sample data to be detected and the comparative sample data.
Comparing the disturbed basic waveform signal with pre-stored comparison sample data to obtain a comparison result, wherein the comparison result comprises the following steps: acquiring parameters of a basic waveform signal disturbed by a sample to be detected; comparing parameters of the basic waveform signal after being disturbed by the sample to be detected with parameters of the waveform signal in the comparison sample data, wherein the parameters comprise frequency and/or amplitude; and when the similarity degree of the frequency and/or the amplitude is larger than the threshold value, obtaining a comparison result that the basic waveform signal is the same as the waveform signal in the comparison sample data. And outputting and displaying the comparison result.
And acquiring a basic waveform signal disturbed by the comparative real object sample, and storing the basic waveform signal disturbed by the comparative real object sample as comparative sample data. The acquisition of the sample data of the comparative real object is to use the sample of the comparative real object to disturb the basic waveform signal, and the specific operation steps are the same as the step of disturbing the basic waveform by the sample to be detected, and are not repeated.
And step S106, outputting a comparison result.
The comparison result is displayed by a computer screen, and subsequent operation can be performed manually according to the comparison result.
The contrast result can be applied to the crossed biomagnetism research of biology and magnetics, the collected signal disturbed by the sample to be detected is called out according to the display condition of the contrast result, the disturbed signal information is reversed through synchronous mirror image conversion, then the signal information is amplified through equipment, the sample to be detected is input again, the abnormal wave in the sample to be detected is restored to be a normal waveform, and the internal disturbance of the sample to be detected is settled.
Example 2
An embodiment 2 of the present invention provides an electromagnetic waveform signal acquisition and comparison device, which refers to a hardware structure diagram of the electromagnetic waveform signal acquisition and comparison device shown in fig. 2, and the hardware structure of the device includes: the device comprises a singlechip waveform generation module 11, a waveform signal generation module 14, an amplifier circuit 15 and a computer 10.
The single chip microcomputer waveform generation module 13 generates signals and transmits the signals to the waveform signal generation module 14, the waveform signal generation module 14 transmits the signals to the amplifier circuit 15, the amplifier circuit 15 transmits the signals to the control analysis module 12, and meanwhile, the data generation module 11 also transmits the information to the control analysis module 12.
The computer 10 internally includes a data generation module 11 and a control analysis module 12.
The data generating module 11 is configured to store comparison sample data in advance, where the comparison sample data includes two generation modes: one is a known data sample, and the other is a physical sample, wherein the known data sample is a pre-stored data sample; the real object sample is a data sample of a base waveform signal disturbed by the comparative real object sample generated by the base waveform signal being disturbed by the comparative real object sample.
The control analysis module 12 can conveniently control and feed back the electromagnetic field waveform signal amplified and output by the amplifier circuit 15, analyze and compare the processing result, and perform moving average and interference filtering on the waveform peak value and the phase parameter.
Example 3
Embodiment 3 of the present invention provides an electromagnetic waveform signal acquisition and comparison method, which is described with reference to a signal control structure diagram of the electromagnetic waveform signal acquisition and comparison method shown in fig. 3, and the method needs to include the following modules: the device comprises a singlechip waveform parameter generation 21, a waveform generation circuit 22, an amplifier circuit 23, a waveform shaping circuit 24, an external feedback device 25, a waveform control analysis device 26 and a display device 27.
A data generation module 11 in the computer 10 generates contrast sample waveform signal data and transmits the contrast sample waveform signal data to a waveform control analysis module 12;
generating 21 a waveform parameter of the singlechip, generating the waveform parameter by the singlechip, and transmitting the generated waveform parameter to a waveform generating circuit 22 for generating a waveform signal;
the waveform generation circuit 22 generates a waveform signal, and the waveform generation circuit 22 is connected to the amplifier circuit 23;
the amplifier circuit 23 receives and amplifies the waveform signal outputted from the waveform generating circuit 22 and then transmits the waveform signal to the waveform shaping circuit 24;
a waveform shaping circuit 24 for performing a moving average of waveform peak values and phase parameters of the waveform signal, filtering interference, and outputting a basic waveform;
after the basic waveform is disturbed by the sample to be detected accessed by the external feedback equipment 25, the basic waveform signal disturbed by the sample to be detected is transmitted to the waveform control analysis device 26; the external feedback equipment 25 is provided with a conductive part which is in contact with the sample to be detected, the conductive part is communicated with a circuit where the basic waveform is located, and the sample to be detected is accessed into the circuit by electrifying alternating current, so that the basic waveform signal passes through the sample to be detected, and the sample to be detected forms disturbance on the basic waveform signal;
the waveform control analysis device 26 compares and analyzes the basic waveform signal data disturbed by the sample to be detected with the waveform signal data of the comparison sample in the waveform control analysis device 26, and the specific steps of the comparison and analysis are as follows:
when the comparison sample is a known data sample, if the frequency similarity of the comparison sample and the known data sample is more than 75%, the feedback result is matching;
when the comparison sample is the sample data of a real object, if the amplitude variation difference of the two samples is greater than 30%, the feedback result is matching;
the display device 27 of the computer 10 displays the result of the comparative analysis.
Example 4
Referring to the logic diagram of the waveform signal generation module in fig. 4, the waveform signal generation process of the present invention is shown, and includes an industrial personal computer 31, a single chip microcomputer 32, a D/a conversion module 33, a signal switching device 34, a signal amplification module 35, and the like.
The industrial personal computer 31 and the single chip microcomputer 32 can directly generate waveform data, generate analog waveform signals after passing through the waveform digital and analog D/A conversion module 33, and amplify the waveform signals; or the signals can be adjusted by the signal switching device 34 and then amplified by the signal amplifying module 35.
The industrial personal computer 31 transmits signals to the D/A conversion module 33, the D/A conversion module 33 amplifies the signals and/or transmits the signals to the signal switching device 34, and the signal switching device 34 amplifies the signals.
The single chip microcomputer 32 transmits signals to the D/A conversion module 33, the D/A conversion module 33 amplifies the signals and/or transmits the signals to the signal switching device 34, and the signal switching device 34 amplifies the signals.
Example 5
Embodiment 5 of the present invention provides an electromagnetic field waveform signal acquisition and comparison device, which refers to a structural diagram of an electromagnetic field waveform signal acquisition device shown in fig. 5, and includes:
a receiving module 51, configured to receive, through an external device, a basic waveform signal disturbed by a sample to be detected; the external equipment is arranged at a preset position of the sample to be detected;
and the comparison module 52 is configured to compare the disturbed basic waveform signal with pre-stored comparison sample data to obtain a comparison result.
The basic waveform signal is a sine wave amplitude modulation signal with the frequency of 10-25KHZ and the amplitude of 15-20V, and the basic waveform signal is intermittently sent out by a waveform generation module of the singlechip. Because the sample to be tested has certain adaptability to the signal of the external electromagnetic field, if the signal of the external electromagnetic field is constant and unchanged, the signal disturbance of the electromagnetic field signal is not obvious after the sample to be tested is adapted, namely the qualified basic waveform disturbed by the sample to be tested can not be obtained, and the final comparison result with the comparison sample can be influenced, therefore, the generation of the basic waveform signal is set to be non-continuous and is indirectly sent out, usually every 50-1000ms, and the time for sending out the basic waveform signal is 800 ms.
The comparison module is further configured to: acquiring parameters of a basic waveform signal disturbed by a sample to be detected; comparing parameters of the basic waveform signal after being disturbed by the sample to be detected with parameters of the waveform signal in the comparison sample data, wherein the parameters comprise frequency and/or amplitude; and when the similarity degree of the frequency and/or the amplitude is larger than the threshold value, obtaining a comparison result that the basic waveform signal is the same as the waveform signal in the comparison sample data. And the output module is used for outputting and displaying the comparison result.
The receiving module can collect various electromagnetic field waveform signals, and the signals are compared and analyzed through the comparison module, so that the comparison result is effectively fed back.
Finally, it should be noted that: the above-mentioned embodiments are only specific embodiments of the present invention, which are used for illustrating the technical solutions of the present invention and not for limiting the same, and the protection scope of the present invention is not limited thereto, although the present invention is described in detail with reference to the foregoing embodiments, those skilled in the art should understand that: any person skilled in the art can modify or easily conceive the technical solutions described in the foregoing embodiments or equivalent substitutes for some technical features within the technical scope of the present disclosure; such modifications, changes or substitutions do not depart from the spirit and scope of the embodiments of the present invention, and they should be construed as being included therein. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (9)
1. An electromagnetic field waveform signal acquisition and comparison method is characterized by comprising the following steps:
receiving a basic waveform signal disturbed by a sample to be detected through external equipment; the external equipment is arranged at a preset position of the sample to be detected; the external device includes a conductive member and a strain force detecting chip; the strain force detection chip converts the contact force between the sample to be detected and the conductive part into a measurable force value, and the measurable force value controls the acquisition time of a sample signal to be detected so that a waveform signal of the sample to be detected in a measurable force value range is an effective signal; the method comprises the steps that a sample to be detected is connected into an alternating current circuit with a basic waveform, so that the sample to be detected generates disturbance on the basic waveform in a loop;
and comparing the disturbed basic waveform signal with pre-stored comparison sample data to obtain a comparison result.
2. The method of claim 1, wherein the base waveform signal is a sine wave amplitude modulated signal having a frequency of 10-25KHZ and an amplitude of 15-20V.
3. The method of claim 1, wherein the step of comparing the perturbed base waveform signal with pre-stored comparison sample data to obtain a comparison result comprises:
acquiring parameters of a basic waveform signal disturbed by a sample to be detected;
comparing the parameters of the basic waveform signal disturbed by the sample to be detected with the parameters of the waveform signal in the comparison sample data, wherein the parameters comprise frequency and/or amplitude;
and when the similarity degree of the frequency and/or the amplitude is larger than a threshold value, obtaining a comparison result that the basic waveform signal is the same as the waveform signal in the comparison sample data.
4. The method of claim 1, further comprising: and outputting and displaying the comparison result.
5. The method of claim 1, further comprising: and acquiring a basic waveform signal disturbed by the comparative sample, and storing the basic waveform signal disturbed by the comparative sample as comparative sample data.
6. An electromagnetic field waveform signal acquisition and comparison device, comprising:
the receiving module is used for receiving a basic waveform signal disturbed by a sample to be detected through external equipment; the external equipment is arranged at a preset position of the sample to be detected; the external device comprises a conductive part and a strain force detection chip; the strain force detection chip converts the contact force between the sample to be detected and the conductive part into a measurable force value, and the measurable force value controls the acquisition time of a sample signal to be detected so that a waveform signal of the sample to be detected in a measurable force value range is an effective signal; the method comprises the steps that a sample to be detected is connected into an alternating current circuit with a basic waveform, so that the sample to be detected generates disturbance on the basic waveform in a loop;
and the comparison module is used for comparing the disturbed basic waveform signal with pre-stored comparison sample data to obtain a comparison result.
7. The device as claimed in claim 6, wherein the basic waveform signal is a sine wave amplitude modulation signal with a frequency of 10-25KHZ and an amplitude of 15-20V, and the basic waveform signal is intermittently sent out by the waveform generating module of the single chip microcomputer.
8. The apparatus of claim 6, wherein the comparison module is further configured to:
acquiring parameters of a basic waveform signal disturbed by a sample to be detected;
comparing the parameters of the basic waveform signal disturbed by the sample to be detected with the parameters of the waveform signal in the comparison sample data, wherein the parameters comprise frequency and/or amplitude;
and when the similarity degree of the frequency and/or the amplitude is larger than a threshold value, obtaining a comparison result that the basic waveform signal is the same as the waveform signal in the comparison sample data.
9. The apparatus of claim 6, further comprising: and the output module is used for outputting and displaying the comparison result.
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