CN108254627A - Electromagnetic field waveform signal acquires control methods and device - Google Patents
Electromagnetic field waveform signal acquires control methods and device Download PDFInfo
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- CN108254627A CN108254627A CN201810101000.9A CN201810101000A CN108254627A CN 108254627 A CN108254627 A CN 108254627A CN 201810101000 A CN201810101000 A CN 201810101000A CN 108254627 A CN108254627 A CN 108254627A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
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Abstract
The present invention provides a kind of acquisition control methods of electromagnetic field waveform signal and devices, are related to electromagnetic field waveform signal acquisition technique field.Electromagnetic field waveform signal acquires control methods, including receiving the basic waveform signal disturbed by sample to be tested by external equipment, external equipment is set to the precalculated position of sample to be tested, the basic waveform signal of the comparison by disturbance and pre-stored contrast sample's data, obtains comparing result.The present invention can acquire multiple waveforms and easily and effectively waveform signal is compared and analyzed, and intuitive comparing result is obtained eventually by the feedback channel of computer.
Description
Technical field
The present invention relates to electromagnetic field waveform signal acquisition technique field more particularly to a kind of acquisitions pair of electromagnetic field waveform signal
Ratio method and device.
Background technology
In electromagnetism, electromagnetic field is a kind of a kind of physical field generated by charged object, electromagnetic field be have inner link,
The general name of the electric field of interdependence and the entity in magnetic field.The electric field changed over time generates magnetic field, the magnetic field changed over time
Electric field is generated, the two reciprocal causation forms electromagnetic field.Electromagnetic field can be caused by the charged particle of variable motion, also can be by power
The electric current of variation causes, no matter reason, always electromagnetic field is propagated around with the light velocity, forms electromagnetic wave.
Electromagnetic wave is all widely used in electrotechnics, electronic technology and electromagnetic measurement etc., general electromagnetism
Field wave shape signal acquisition method is only capable of several waveforms for the finite form that acquisition generates, and is difficult to waveform signal is compared point
Analysis.
Invention content
In view of this, the purpose of the present invention is to provide a kind of acquisition control methods of electromagnetic field waveform signal and device, energy
It enough acquires multiple waveforms and easily and effectively waveform signal is compared and analyzed, export comparing result.
To achieve these goals, technical solution used in the embodiment of the present invention is as follows：
In a first aspect, an embodiment of the present invention provides a kind of acquisition control methods of electromagnetic field waveform signal and device, including：
The basic waveform signal disturbed by sample to be tested is received by external equipment, external equipment is set to the pre-determined bit of sample to be tested
It puts；Basic waveform signal of the comparison by disturbance and pre-stored contrast sample's data, obtain comparing result.
With reference to first aspect, an embodiment of the present invention provides the first possible embodiment of first aspect, wherein, on
It is frequency for 10-25KHZ to state basic waveform signal, and amplitude is the Sine Wave Amplitude Modulation signal of 15-20V.
With reference to first aspect, an embodiment of the present invention provides second of possible embodiment of first aspect, wherein, on
It states external equipment and includes conductive component and adaptability to changes detection chip；Conductive component is set to the precalculated position of sample to be tested and with treating
Survey sample contact, variable force detection chip by the contact force between sample to be tested and conductive component be converted into can dynamometry angle value, can survey
Dynamics value forms basic waveform signal and disturbs.
With reference to first aspect, an embodiment of the present invention provides the third possible embodiment of first aspect, wherein, on
The step of stating basic waveform signal of the comparison by disturbance and pre-stored contrast sample's data, obtaining comparing result, including：
Obtain the parameter of the basic waveform signal after sample to be tested disturbs；Compare the basic waveform signal after sample to be tested disturbs
Parameter and the parameter of the waveform signal in contrast sample's data, parameter include frequency and/or amplitude；When frequency and/or amplitude
When similarity degree is more than threshold value, the basic waveform signal comparing result identical with the waveform signal in contrast sample's data is obtained.
With reference to first aspect, an embodiment of the present invention provides the 4th kind of possible embodiment of first aspect, wherein, on
The method of stating further includes：Export simultaneously display comparison result.
With reference to first aspect, an embodiment of the present invention provides the 5th kind of possible embodiment of first aspect, wherein, on
The method of stating further includes：Basic waveform signal of the acquisition by comparison sample disturbance in kind, will be by comparing sample disturbance in kind
Basic waveform signal is stored as contrast sample's data.
Second aspect, the embodiment of the present invention also provide a kind of electromagnetic field waveform signal acquisition comparison device, including：Receive mould
Block, for receiving the basic waveform signal disturbed by sample to be tested by external equipment；External equipment is set to sample to be tested
Precalculated position；
Contrast module for comparing the basic waveform signal by disturbance and pre-stored contrast sample's data, obtains
Comparing result.
With reference to second aspect, an embodiment of the present invention provides the first possible embodiment of second aspect, wherein, base
Plinth waveform signal is that frequency is 10-25KHZ, and amplitude is the Sine Wave Amplitude Modulation signal of 15-20V.
With reference to second aspect, an embodiment of the present invention provides second of possible embodiment of second aspect, wherein, it is right
It is additionally operable to than module：Obtain the parameter of the basic waveform signal after sample to be tested disturbs；Comparison is after sample to be tested disturbs
The parameter of basic waveform signal and the parameter of the waveform signal in contrast sample's data, parameter include frequency and/or amplitude；When frequency
When the similarity degree of rate and/or amplitude is more than threshold value, basic waveform signal and the waveform signal phase in contrast sample's data are obtained
Same comparing result.
With reference to second aspect, an embodiment of the present invention provides the third possible embodiment of second aspect, wherein, also
Including：Output module, for exporting simultaneously display comparison result.
The embodiment of the present invention brings following advantageous effect：An embodiment of the present invention provides a kind of electromagnetic field waveform signals to adopt
Collect control methods and device, using specific basic waveform as carrier, external equipment is connected with sample to be tested, makes sample to be tested pair
Basic waveform forms disturbance, and basic waveform of the acquisition by sample to be tested disturbance is carried out with pre-stored contrast sample's data
Analysis comparison, obtains comparing result.It is rich due to sample to be tested, it can be generated after being disturbed to basic waveform a variety of through treating
The basic waveform of this disturbance of test sample, therefore the waveform catalog acquired enriches；The embodiment of the present invention has added a kind of simple control point
Module is analysed, there can be effective feedback function to the waveform signal of output, waveform signal is compared and analyzed, is finally obtained
Intuitive comparing result.The embodiment of the present invention can quickly and effectively carry out the magnetic field of a variety of electromagnetic fields, particularly cross discipline
The acquisition of signal.In addition, the hardware cost of the embodiment of the present invention is relatively low, can a variety of electromagnetic field signals be compared with feedback processing, fitted
It is relatively broad with range.
Other feature and advantage of the disclosure will illustrate in the following description, alternatively, Partial Feature and advantage can be with
Deduce from specification or unambiguously determine or by implement the disclosure above-mentioned technology it can be learnt that.
For the above-mentioned purpose of the disclosure, feature and advantage is enable to be clearer and more comprehensible, preferred embodiment cited below particularly, and coordinate
Appended attached drawing, is described in detail below.
Description of the drawings
It, below will be to specific in order to illustrate more clearly of the specific embodiment of the invention or technical solution of the prior art
Embodiment or attached drawing needed to be used in the description of the prior art are briefly described, it should be apparent that, in being described below
Attached drawing is some embodiments of the present invention, for those of ordinary skill in the art, before not making the creative labor
It puts, can also be obtained according to these attached drawings other attached drawings.
Fig. 1 is flow chart of the method for the present invention；
Fig. 2 is the hardware structure diagram of the present invention；
Fig. 3 is the present invention to basic waveform process chart；
Fig. 4 is waveform signal generation module logic chart；
Fig. 5 is the device of the invention structure chart.
Specific embodiment
Purpose, technical scheme and advantage to make the embodiment of the present invention are clearer, below in conjunction with attached drawing to the present invention
Technical solution be clearly and completely described, it is clear that described embodiment be part of the embodiment of the present invention rather than
Whole embodiments.Based on the embodiments of the present invention, those of ordinary skill in the art are not making creative work premise
Lower all other embodiments obtained, shall fall within the protection scope of the present invention.
Current electromagnetic field waveform signal acquisition method is only capable of generating several waveforms of finite form and acquire, and waveform is believed
Number output result does not have effective feedback channel, based on this, electromagnetic field waveform signal provided in an embodiment of the present invention acquisition comparison
Method and device can generate and acquire the abundant waveform of type and waveform signal can be compared and analyzed, output comparison knot
Fruit.
For ease of understanding the present embodiment, first with reference to attached drawing to the electromagnetic field waveform disclosed in the embodiment of the present invention
Signal acquisition control methods describes in detail.
Embodiment 1
The embodiment of the present invention 1 provides a kind of electromagnetic field waveform signal acquisition control methods, electromagnetic field shown in Figure 1
Waveform signal acquires the flow chart of control methods, and this method comprises the following steps：
Step S102 receives the basic waveform signal disturbed by sample to be tested by external equipment.
External equipment is set to the precalculated position of sample to be tested.
Microcontroller waveform parameter generation module generates basic waveform data, is transferred to wave generator circuit module；Waveform is sent out
Raw circuit module generates basic waveform signal, intermittently sends out basic waveform, basic waveform is as carrier；Basic waveform signal occurs
Circuit module connects amplifier circuit, and it is whole to be transported to waveform after reception and the waveform signal of waveform amplification generation circuit module output
Shape circuit module；Waveform shaping circuit module the waveform peak of waveform signal, phase parameter are carried out sliding average, filter out it is dry
It disturbs, waveform shaping circuit output basic waveform；Sample to be tested disturbance of the basic waveform by the access of external feedback equipment, then will
The basic waveform signal disturbed by sample to be tested is transported in waveform control analysis module.
External feedback equipment is equipped with conductive component, and conductive component is contacted with sample to be tested, conductive component and basic waveform institute
In circuit communication, comparison to be measured sample in kind is accessed in circuit by alternating current, so as to basic waveform signal pass through it is to be measured
Sample, sample to be tested form basic waveform signal and disturb.External equipment includes conductive component and adaptability to changes detection chip；It is conductive
Component is set to the precalculated position of sample to be tested and is contacted with sample to be tested, and adaptability to changes detection chip is by sample to be tested and conductive part
Contact force between part be converted into can dynamometry angle value, can dynamometry angle value the acquisition opportunity of sample to be tested signal is controlled, only
There is the waveform signal in sample to be tested that can be in the range of dynamometry angle value to be only effectively.Above-mentioned conductive component is detection probe and leads
Electrode, conductive electrode can be fixed on the precalculated position of sample to be tested, can clamp or hold, detection probe is grasped by worker
Work is contacted with sample to be tested, sample to be tested access is carried in the alternating current circuit of basic waveform, so as to make sample to be tested to circuit
In basic waveform generate disturbance.Due to the diversity of sample to be tested, sample to be tested and the diversity of the detection probe way of contact,
Lead to contact area, the cause not of uniform size of contact dynamics of sample to be tested and detection probe, adaptability to changes inspection is provided in external equipment
Chip is surveyed, after detection probe touches sample to be tested, generates power not of uniform size, adaptability to changes detection chip will be not of uniform size
Power is converted into the power in the range of can surveying, to ensure the consistency of the disturbance effect after sample to be tested access circuit.
Basic waveform signal is that frequency is 10-25KHZ, and amplitude is the Sine Wave Amplitude Modulation signal of 15-20V.Basic waveform is joined
Number is by long-term experiment detection and accumulates, and the waveform in this parameter area is to be most susceptible to sample to be tested in nature to disturb
Dynamic waveform.
The basic waveform for being used as carrier is disturbed by different samples to be tested, abundant waveform can be collected.
Step S104, basic waveform signal of the comparison by disturbance and pre-stored contrast sample's data, are compared
As a result.
The basic waveform signal disturbed through sample to be tested is converted into sample to be tested data by the data generation module of computer
And it is sent to waveform control analysis module；Waveform control analysis module is treated test sample notebook data and is compared with contrast sample's data
Analysis.
The basic waveform signal of the comparison by disturbance and pre-stored contrast sample's data, obtain comparing result
Step, including：Obtain the parameter of the basic waveform signal after sample to be tested disturbs；Compare the basis after sample to be tested disturbs
The parameter of waveform signal and the parameter of the waveform signal in contrast sample's data, parameter include frequency and/or amplitude；Work as frequency
And/or the similarity degree of amplitude be more than threshold value when, it is identical with the waveform signal in contrast sample's data to obtain basic waveform signal
Comparing result.It exports and shows the comparing result.
Basic waveform signal of the acquisition by comparison sample disturbance in kind, by the basic wave by comparing sample disturbance in kind
Shape signal is stored as contrast sample's data.The acquisition of comparison sample data in kind is to basic waveform signal with comparison sample in kind
It is disturbed, concrete operation step repeats no more as the step of sample to be tested disturbance basic waveform.
Step S106 exports comparing result.
Comparing result is shown by computer screen, artificially can carry out subsequent operation according to comparing result.
The biomagnetism research that comparing result can be applied to biology and magnetics is intersected, situation is shown according to comparing result, will
The signal disturbed by sample to be tested collected recalls, and is converted by synchronous mirror, reverses the signal message of disturbance, Ran Houtong
It crosses equipment to be amplified, re-enters sample to be tested, wave special-shaped in sample to be tested is reverted into normal waveform, it is to be measured so as to calm down
Sample interior disturbs.
Embodiment 2
The embodiment of the present invention 2 provides a kind of electromagnetic field waveform signal acquisition comparison device, electromagnetic field shown in Figure 2
The hardware structure diagram of waveform signal acquisition comparison device, the device hardware configuration include：Microcontroller generates waveform module 11, waveform
Signal generator module 14, amplifier circuit 15, computer 10.
Microcontroller generates waveform module 13 and generates signal transmission to waveform signal generation module 14, waveform signal generation module
14 transfer signals to amplifier circuit 15, and amplifier circuit 15 transfers signals to control analysis module 12, while data are given birth to
Control analysis module 12 is also transferred information into module 11.
10 inside of computer includes data generation module 11 and control analysis module 12.
For data generation module 11 for prestoring contrast sample's data, contrast sample's data include two kinds of producing methods：
One kind is known data samples, and one kind is sample in kind, it is known that data sample is pre-stored data sample；Sample in kind is
By basic waveform signal sample disturbance in kind and the number of the basic waveform signal of sample disturbance in kind by contrast that generates by contrast
According to sample.
Control analysis module 12 can easily control and feed back the electromagnetic field waveform through the amplification output of amplifier circuit 15 to believe
Number, handling result is analyzed, is compared, waveform peak, phase parameter carry out sliding average, filter out interference.
Embodiment 3
The embodiment of the present invention 3 provides a kind of electromagnetic field waveform signal acquisition control methods, electromagnetic field shown in Figure 3
Waveform signal acquires the signal control structure figure of control methods, and this method implementation needs to include following module：Microcontroller waveform is joined
Number generation 21, wave generator circuit 22, amplifier circuit 23, waveform shaping circuit 24, external feedback equipment 25, waveform control point
Analysis apparatus 26, display device 27.
Data generation module 11 in computer 10 generates contrast sample's wave signal data, and contrast sample's waveform is believed
Number is passed to waveform control analysis module 12；
The waveform parameter of generation is transported to waveform hair by microcontroller waveform parameter generation 21, microcontroller generation waveform parameter
Raw circuit 22 is used to generate waveform signal；
Wave generator circuit 22 generates waveform signal, and wave generator circuit 22 and amplifier circuit 23 connect；
Waveform shaping electricity is transported to after the waveform signal that amplifier circuit 23 receives and waveform amplification generation circuit 22 exports
Road 24；
Waveform shaping circuit 24, waveform peak, phase parameter to waveform signal carry out sliding average, filter out interference, defeated
Go out basic waveform；
Basic waveform is after the sample to be tested disturbance that external feedback equipment 25 accesses, by the base by sample to be tested disturbance
Plinth waveform signal is transported to waveform control analytical equipment 26；External feedback equipment 25 be equipped with conductive component, conductive component with it is to be measured
Sample contact, conductive component and circuit communication where basic waveform, indirect current access sample to be tested in circuit, so as to basis
Waveform signal forms basic waveform signal and is disturbed by sample to be tested, sample to be tested；
Waveform controls analytical equipment 26, and the basic waveform signal data by sample to be tested disturbance controls analysis dress in waveform
Compared and analyzed in putting 26 with contrast sample's wave signal data, comparative analysis the specific steps are：
When contrast sample is known data samples, if the two frequency similarity>75%, then feedback result is matching；
When contrast sample is sample data in kind, if the two amplitude becomes moment>30%, then feedback result is matching；
The result of 27 display comparison of the display device analysis of computer 10.
Embodiment 4
Referring to the waveform signal generation module logic chart in Fig. 4, it is shown that waveform signal of the invention generates process, including
The part such as industrial personal computer 31, microcontroller 32, D/A modular converters 33, signal switching apparatus 34, signal amplification module 35 forms.
Shown industrial personal computer 31 and microcontroller 32 can directly generate Wave data, pass through climate digital and simulation D/A
Analog waveform signal is produced after modular converter 33, waveform signal can be amplified；Also it can be carried out by signal switching apparatus 34
Signal is amplified through signal amplification module 35 again after adjusting.
Shown industrial personal computer 31 transfers signals to D/A modular converters 33, and D/A modular converters 33 put signal progress signal
Greatly and/or signal switching apparatus 34 is transferred to, signal is carried out signal amplification by signal switching apparatus 34.
Shown microcontroller 32 transfers signals to D/A modular converters 33, and D/A modular converters 33 put signal progress signal
Greatly and/or signal switching apparatus 34 is transferred to, signal is carried out signal amplification by signal switching apparatus 34.
Embodiment 5
The embodiment of the present invention 5 provides a kind of electromagnetic field waveform signal acquisition comparison device, electromagnetism field wave shown in Figure 5
The structure chart of shape signal pickup assembly, including：
Receiving module 51, for receiving the basic waveform signal disturbed by sample to be tested by external equipment；Outside is set
The standby precalculated position for being set to sample to be tested；
Contrast module 52 for comparing the basic waveform signal by disturbance and pre-stored contrast sample's data, obtains
To comparing result.
Basic waveform signal is that frequency is 10-25KHZ, and amplitude is the Sine Wave Amplitude Modulation signal of 15-20V, and basic waveform is believed
Number by microcontroller generate waveform module interval send out.Since sample to be tested has certain adaptation to the signal of external electromagnetic field
Property, it is unknown to number disturbance of electromagnetic field letter after sample to be tested adapts to if the signal of external electromagnetic field is invariable
The aobvious basic waveform disturbed through sample to be tested to get less than qualification can cause shadow to the comparison result finally with contrast sample
It rings, therefore, basic waveform signal is set as non-continuous, sends out indirectly, typically at interval of 50-1000ms, sends out
A length of 500-800ms during basic waveform signal.
Contrast module is additionally operable to：Obtain the parameter of the basic waveform signal after sample to be tested disturbs；Comparison is through treating test sample
The parameter of basic waveform signal after this disturbance and the parameter of the waveform signal in contrast sample's data, parameter include frequency and/
Or amplitude；When the similarity degree of frequency and/or amplitude is more than threshold value, obtain in basic waveform signal and contrast sample's data
The identical comparing result of waveform signal.Output module, for exporting simultaneously display comparison result.
Receiving module can acquire a variety of electromagnetic field waveform signals, and be compared and analyzed by contrast module, effective Feedback
Comparing result.
Finally it should be noted that：Embodiment described above, only specific embodiment of the invention, to illustrate the present invention
Technical solution, rather than its limitations, protection scope of the present invention is not limited thereto, although with reference to the foregoing embodiments to this hair
It is bright to be described in detail, it will be understood by those of ordinary skill in the art that：Any one skilled in the art
In the technical scope disclosed by the present invention, it can still modify to the technical solution recorded in previous embodiment or can be light
It is readily conceivable that variation or equivalent replacement is carried out to which part technical characteristic；And these modifications, variation or replacement, do not make
The essence of corresponding technical solution is detached from the spirit and scope of technical solution of the embodiment of the present invention, should all cover the protection in the present invention
Within the scope of.Therefore, protection scope of the present invention described should be subject to the protection scope in claims.
Claims (10)
1. a kind of electromagnetic field waveform signal acquires control methods, which is characterized in that including：
The basic waveform signal disturbed by sample to be tested is received by external equipment；The external equipment is set to sample to be tested
Precalculated position；
The basic waveform signal of the comparison by disturbance and pre-stored contrast sample's data, obtain comparing result.
2. according to the method described in claim 1, it is characterized in that, the basic waveform signal is frequency for 10-25KHZ, width
It is worth the Sine Wave Amplitude Modulation signal for 15-20V.
3. according to the method described in claim 1, it is characterized in that, the external equipment includes conductive component and adaptability to changes detects
Chip；
The conductive component is set to the precalculated position of sample to be tested and is contacted with sample to be tested, and the variable force detection chip will be treated
Contact force between test sample sheet and conductive component be converted into can dynamometry angle value, it is described can dynamometry angle value basic waveform signal is formed
Disturbance.
4. according to the method described in claim 1, it is characterized in that, it is described comparison by disturbance the basic waveform signal with
Pre-stored contrast sample's data, the step of obtaining comparing result, including：
Obtain the parameter of the basic waveform signal after sample to be tested disturbs；
The parameter and the waveform in contrast sample's data for comparing the basic waveform signal after sample to be tested disturbs are believed
Number parameter, the parameter include frequency and/or amplitude；
When the similarity degree of the frequency and/or amplitude is more than threshold value, the basic waveform signal and the comparative sample are obtained
The identical comparing result of waveform signal in notebook data.
5. it according to the method described in claim 1, it is characterized in that, further includes：It exports and shows the comparing result.
6. it according to the method described in claim 1, it is characterized in that, further includes：Base of the acquisition by comparison sample disturbance in kind
Plinth waveform signal will be stored as contrast sample's data by the basic waveform signal for comparing sample disturbance in kind.
7. a kind of electromagnetic field waveform signal acquisition comparison device, which is characterized in that including：
Receiving module, for receiving the basic waveform signal disturbed by sample to be tested by external equipment；The external equipment
It is set to the precalculated position of sample to be tested；
Contrast module for comparing the basic waveform signal by disturbance and pre-stored contrast sample's data, obtains
Comparing result.
8. device according to claim 7, which is characterized in that the basic waveform signal is frequency for 10-25KHZ, width
It is worth the Sine Wave Amplitude Modulation signal for 15-20V, the basic waveform signal generates waveform module interval by microcontroller and sends out.
9. device according to claim 7, which is characterized in that the contrast module is additionally operable to：
Obtain the parameter of the basic waveform signal after sample to be tested disturbs；
The parameter and the waveform in contrast sample's data for comparing the basic waveform signal after sample to be tested disturbs are believed
Number parameter, the parameter include frequency and/or amplitude；
When the similarity degree of the frequency and/or amplitude is more than threshold value, the basic waveform signal and the comparative sample are obtained
The identical comparing result of waveform signal in notebook data.
10. device according to claim 7, which is characterized in that further include：Output module, it is described for exporting and showing
Comparing result.
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