CN108254079A - A kind of dual wavelength radiation temperature measuring equipment and method - Google Patents
A kind of dual wavelength radiation temperature measuring equipment and method Download PDFInfo
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- CN108254079A CN108254079A CN201810062303.4A CN201810062303A CN108254079A CN 108254079 A CN108254079 A CN 108254079A CN 201810062303 A CN201810062303 A CN 201810062303A CN 108254079 A CN108254079 A CN 108254079A
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- 230000005855 radiation Effects 0.000 title claims abstract description 66
- 230000009977 dual effect Effects 0.000 title claims abstract description 30
- 238000000034 method Methods 0.000 title claims abstract description 19
- 238000005259 measurement Methods 0.000 claims abstract description 29
- 230000003287 optical effect Effects 0.000 claims abstract description 29
- 238000012360 testing method Methods 0.000 claims abstract description 23
- 238000011156 evaluation Methods 0.000 claims abstract description 9
- 238000013459 approach Methods 0.000 claims abstract description 8
- 238000007405 data analysis Methods 0.000 claims abstract description 7
- 238000013480 data collection Methods 0.000 claims abstract description 7
- 230000003595 spectral effect Effects 0.000 claims description 18
- 238000004458 analytical method Methods 0.000 claims description 3
- 238000004088 simulation Methods 0.000 claims description 3
- 238000009529 body temperature measurement Methods 0.000 description 2
- 230000008602 contraction Effects 0.000 description 2
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
Abstract
The invention discloses a kind of dual wavelength radiation temperature measuring equipment and methods, the device includes the optical lens for the radiation laser beam of object under test to be focused on to semi-transparent semi-reflecting beam splitting system, semi-transparent semi-reflecting beam splitting system includes radiation laser beam being divided into transmitted light beam and the semi-transparent semi-reflecting light splitting piece of the reflected beams, the optical radiation measurement signal that receipts transmitted light beam and the reflected beams are received and generated by sensor, data collection and analysis unit and error evaluation system calculate the temperature value of object under test according to optical radiation measurement signal, and temperature value error prediction is assessed.This method includes the following steps：It is loose to approach, solve modified dual wavelength temperature；Monochromatic probabilistic approximation solves monochromatic probability mean temperature；Modified dual wavelength temperature and monochromatic probability mean temperature are averaged by equalization.The present invention can realize the high-acruracy survey on grey body surface or non-gray surface temperature under the conditions of emissivity behavior is not known, and can be facilitated based on measured temperature and carry out error evaluation prediction.
Description
Technical field
Colorimetric solution need not be carried out the present invention relates to optical measuring technique more particularly to one kind and is suitable for that there is non-grey body
The device and method of feature body surface temperature survey.
Background technology
In the field of industrial production such as petrochemical industry, metallurgy, steel, cement, glass, power plant, the thermometric based on actinometry
Instrument has the huge market demand and wide application prospect.In these application fields, traditional thermocouple contact temperature-measuring
Means, due to the material consumption of the limitation and high cost of measurement, currently gradually by more at a low price, more stable non-of performance
Contact optical temperature measuring equipment is replaced.Multi-wavelength thermometric signal-to-noise ratio is low, and emissivity behavior is difficult to determine, temperature retrieval stability
Difference, measurement error may be larger under the conditions of unknown emissivity for monochromatic thermometric.The color comparison temperature measurement side measured based on dual wavelength radiation
Method has the advantages that the two, but is limited to the measurement of grey body surface temperature.
Invention content
Goal of the invention：Colorimetric solution need not be carried out the object of the present invention is to provide one kind and is suitable for that there are non-grey body characteristics
The device and method of body surface temperature survey, to overcome the office of multi-wavelength thermometric, monochromatic thermometric and color comparison temperature measurement method application
It is sex-limited.
To achieve these goals, present invention employs following technical solutions：A kind of dual wavelength radiation temperature measuring equipment,
It is characterized in that：Including optical lens, semi-transparent semi-reflecting beam splitting system, monochromatic filter a, sensor a, data collection and analysis unit and
Error evaluation system, sensor b and monochromatic filter b；
Optical lens is used to the radiation laser beam of object under test focusing on semi-transparent semi-reflecting beam splitting system, semi-transparent semi-reflecting light splitting system
System includes semi-transparent semi-reflecting light splitting piece, and semi-transparent semi-reflecting light splitting piece is used to radiation laser beam being divided into transmitted light beam and the reflected beams, monochromatic
Colour filter a is for correcting perspective light beam color error ratio, and for correcting the reflected beams color error ratio, sensor a is used monochromatic filter b
In the perspective light beam received through monochromatic filter a and optical radiation measurement signal is generated, sensor b penetrates monochromatic filter for receiving
The reflected beams of color chips b simultaneously generate optical radiation measurement signal, and data collection and analysis unit and error evaluation system pass for acquiring
Then the optical radiation measurement signal of sensor a and sensor b generations calculates the temperature number of object under test according to optical radiation measurement signal
Value, and forecast assessment is carried out to temperature value error.
Further, the semi-transparent semi-reflecting beam splitting system further includes the collimation for collimating transmitted light beam and the reflected beams
Device.
According to the dual wavelength radiation temp measuring method of above-mentioned dual wavelength radiation temperature measuring equipment, include the following steps：
Step 1 loose is approached
The radiation laser beam of the object under test by be divided into after optical lens and semi-transparent semi-reflecting beam splitting system transmitted light beam and
The reflected beams, transmitted light beam are received by monochromatic filter a by sensor a, and the reflected beams are sensed after penetrating monochromatic filter b
Device b is received, and the optical radiation measurement signal of sensor a and sensor b generations is：
Wherein KiIt is instrumental constant, is determined by radiation calibration, εiFor the spectral emissivity of object under test, εiRestriction area
Between for [0.3,1], λiIt is to measure wavelength, C1It is first radiation constant, C2It is second radiation constant, TtrueFor unknown determinand
Body surface true temperature, i=1,2,1,2 represent radiation measurement channels under two wavelength；
The radiation intensity of transmitted light beam and the reflected beams can be expressed as：
Equation (2) is deformed into：
When using Wien approximate and the spectral emissivity of object under test is close to 1, it is believed that C2/λiTtrue＞ ＞
lnεi, therefore minimum item is ignored, equation (3) is expressed as：
Wherein, TbtIt is least square temperature, TbtIt is TtrueApproximation；
Least square temperature T can be acquired using least square methodbt, based on least square temperature Tbt, can reverse wavelength Xi
The spectral emissivity at place：
εbti=Iiλi 5(exp(C2/(λiTbt))-1)/C1 (5)
Wavelength X in equation (5)iThe spectral emissivity ε at placebtiSignificantly than the spectral emissivity ε of object under testiIt is bigger than normal, draw
Enter the relaxation factor R less than 1 to make εbtiApproach εi：
εi=R εbti (6)
Equation (6) is substituted into equation (3)：
Wherein, TmbtIt is modified dual wavelength temperature, TmbtIt is TtrueApproximation, and TmbtRelative to TbtIt is more nearly
Ttrue；
Modified dual wavelength temperature T can be acquired using least square methodmbt, dual wavelength temperature TmbtError formula be：
It can be obtained through analysis, the optimum value of relaxation factor R is being limited in section [0.3,1] in equation (11), from probability angle,
R takes intermediate value 0.65 that can make TmbtPreferably approach Ttrue；
Step 2: monochromatic probabilistic approximation
The spectral emissivity on object under test surface limits section as [0.3,1], based on surveyed radiation intensity I1, wavelength X1
And λ2, T can be acquired using equation (2)truePlace section [T11,T12], based on surveyed radiation intensity I2, wavelength X1And λ2, user
Journey (2) can acquire TtruePlace section [T21,T22], determine TtruePlace section is [T21,T12], consider measure temperature T with
TtrueDifference cannot be too big, the monochromatic probability mean temperature T from probability meaningdsIt is global during positioned at the center of two section intersection parts
Error is smaller, i.e.,
TdsAs monochromatic probability mean temperature, makes measurement temperature with limiting section [T21,T12] in true temperature difference most
It is small；
Step 3: equalization
By modified dual wavelength temperature TmbtWith probability mean temperature TdsIt is averaged, acquires and measure temperature T：
It is found by numerical simulation, the measurement temperature T in equation (9) can preferably approaching to reality temperature Ttrue。
Further, the ε1Change step is 0.1, and ε2Change step is 0.01.
Advantageous effect：The present invention can realize grey body surface or non-gray surface temperature under the conditions of emissivity behavior is not known
High-acruracy survey, and based on measured temperature can facilitate carry out error evaluation prediction.Invention introduces emissivity contractions
Section can be taken as [0.3,1] under usual conditions, it means that the present invention is suitable for the radiation temperature that emissivity is more than more than 0.3
It measures, the temperature survey under the conditions of extremely low emissivity need to be further processed.Meanwhile the emissivity section of contraction becomes smaller, and surveys
Warm error can reduce.
Description of the drawings
Fig. 1 is the structure diagram of dual wavelength radiation temperature measuring equipment of the present invention；
Fig. 2 monochromes approach schematic diagram.
Specific embodiment：
Further explanation is done to the present invention below in conjunction with the accompanying drawings.
As shown in Figure 1, a kind of dual wavelength radiation temperature measuring equipment of the present invention, including optical lens, semi-transparent semi-reflecting light splitting system
System, monochromatic filter a, sensor a, data collection and analysis unit and error evaluation system, sensor b and monochromatic filter b.
Optical lens is used to the radiation laser beam of object under test focusing on semi-transparent semi-reflecting beam splitting system.Semi-transparent semi-reflecting light splitting system
System includes semi-transparent semi-reflecting light splitting piece and collimator, and semi-transparent semi-reflecting light splitting piece is used to radiation laser beam being divided into transmitted light beam and reflected light
Beam, collimator are used to collimate transmitted light beam and the reflected beams.Monochromatic filter a is monochromatic for correcting perspective light beam color error ratio
Colour filter b is used to correct the reflected beams color error ratio.Sensor a penetrates perspective light beam and the life of monochromatic filter a for receiving
Into optical radiation measurement signal, sensor b believes for receiving the reflected beams through monochromatic filter b and generating optical radiation measurement
Number, data collection and analysis unit and error evaluation system are used to acquire the optical radiation measurement letter that sensor a and sensor b is generated
Number, the temperature value of object under test is then calculated according to optical radiation measurement signal, and forecast assessment is carried out to temperature value error.
According to the dual wavelength radiation temp measuring method of above-mentioned dual wavelength radiation temperature measuring equipment, include the following steps：
Step 1 loose is approached
The radiation laser beam of the object under test by be divided into after optical lens and semi-transparent semi-reflecting beam splitting system transmitted light beam and
The reflected beams, transmitted light beam are received by monochromatic filter a by sensor a, and the reflected beams are sensed after penetrating monochromatic filter b
Device b is received, and the optical radiation measurement signal of sensor a and sensor b generations is：
Wherein KiIt is instrumental constant, is determined by radiation calibration, εiFor the spectral emissivity of object under test, εiRestriction area
Between for [0.3,1], λiIt is to measure wavelength, C1It is first radiation constant, C2It is second radiation constant, TtrueFor unknown determinand
Body surface true temperature, i=1,2, i=1,2 represent radiation measurement channels under two wavelength, ε1Change step is 0.1, and ε2Become
It is 0.01 to change step-length；
The radiation intensity of transmitted light beam and the reflected beams can be expressed as：
Equation (2) is deformed into：
When using Wien approximate and the spectral emissivity of object under test is close to 1, it is believed that C2/λiTtrue＞ ＞
lnεi, therefore minimum item is ignored, equation (3) is expressed as：
Wherein, TbtIt is least square temperature, TbtIt is TtrueApproximation；
Least square temperature T can be acquired using least square methodbt, based on least square temperature Tbt, can reverse wavelength Xi
The spectral emissivity at place：
εbti=Iiλi 5(exp(C2/(λiTbt))-1)/C1 (5)
Wavelength X in equation (5)iThe spectral emissivity ε at placebtiSignificantly than the spectral emissivity ε of object under testiIt is bigger than normal, draw
Enter the relaxation factor R less than 1 to make εbtiApproach εi：
εi=R εbti (6)
Equation (6) is substituted into equation (3)：
Wherein, TmbtIt is modified dual wavelength temperature, TmbtIt is TtrueApproximation, and TmbtRelative to TbtIt is more nearly
Ttrue；
Modified dual wavelength temperature T can be acquired using least square methodmbt, dual wavelength temperature TmbtError formula be：
It can be obtained through analysis, the optimum value of relaxation factor R is being limited in section [0.3,1] in equation (11), from probability angle,
R takes intermediate value 0.65 that can make TmbtPreferably approach Ttrue；
Step 2: monochromatic probabilistic approximation
The spectral emissivity on object under test surface limits section as [0.3,1], based on surveyed radiation intensity I1, wavelength X1
And λ2, T can be acquired using equation (2)truePlace section [T11,T12], based on surveyed radiation intensity I2, wavelength X1And λ2, user
Journey (2) can acquire TtruePlace section [T21,T22], as shown in Figure 2, it may be determined that TtruePlace section is [T21,T12], consider
Measure temperature T and TtrueDifference cannot be too big, the monochromatic probability mean temperature T from probability meaningdsPositioned at two section intersections
Global error is smaller during partial center, i.e.,
TdsAs monochromatic probability mean temperature, makes measurement temperature with limiting section [T21,T12] in true temperature difference most
It is small；
Step 3: equalization
By modified dual wavelength temperature TmbtWith probability mean temperature TdsIt is averaged, acquires and measure temperature T：
It is found by numerical simulation, the measurement temperature T in equation (9) can preferably approaching to reality temperature Ttrue。
The above is only the preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art
For member, various improvements and modifications may be made without departing from the principle of the present invention, these improvements and modifications also should
It is considered as protection scope of the present invention.
Claims (4)
1. a kind of dual wavelength radiation temperature measuring equipment, it is characterised in that：Including optical lens, semi-transparent semi-reflecting beam splitting system, monochromatic filter
Color chips a, sensor a, data collection and analysis unit and error evaluation system, sensor b and monochromatic filter b；
Optical lens is used to the radiation laser beam of object under test focusing on semi-transparent semi-reflecting beam splitting system, semi-transparent semi-reflecting beam splitting system packet
Semi-transparent semi-reflecting light splitting piece is included, semi-transparent semi-reflecting light splitting piece is used to radiation laser beam being divided into transmitted light beam and the reflected beams, monochromatic colour filter
Piece a is for correcting perspective light beam color error ratio, and for correcting the reflected beams color error ratio, sensor a is used to connect monochromatic filter b
It receives the perspective light beam through monochromatic filter a and generates optical radiation measurement signal, sensor b penetrates monochromatic filter for receiving
The reflected beams of b simultaneously generate optical radiation measurement signal, and data collection and analysis unit and error evaluation system are used to acquire sensor a
With the optical radiation measurement signal of sensor b generations, the temperature value of object under test is then calculated according to optical radiation measurement signal, and
Forecast assessment is carried out to temperature value error.
2. a kind of dual wavelength radiation temperature measuring equipment according to claim 1, it is characterised in that：The semi-transparent semi-reflecting light splitting system
System further includes the collimator for collimating transmitted light beam and the reflected beams.
3. the dual wavelength radiation temp measuring method of dual wavelength radiation temperature measuring equipment according to claim 1, which is characterized in that including
Following steps：
Step 1 loose is approached
The radiation laser beam of the object under test after optical lens and semi-transparent semi-reflecting beam splitting system by being divided into transmitted light beam and reflection
Light beam, transmitted light beam are received by monochromatic filter a by sensor a, the reflected beams penetrate monochromatic filter b after by sensor b
It receives, the optical radiation measurement signal of sensor a and sensor b generations is：
Wherein KiIt is instrumental constant, is determined by radiation calibration, εiFor the spectral emissivity of object under test, εiLimit section as
[0.3,1], λiIt is to measure wavelength, C1It is first radiation constant, C2It is second radiation constant, TtrueFor unknown determinand body surface
Face true temperature, i=1,2,1,2 represent radiation measurement channels under two wavelength；
The radiation intensity of transmitted light beam and the reflected beams can be expressed as：
Equation (2) is deformed into：
When using Wien approximate and the spectral emissivity of object under test is close to 1, it is believed that C2/λiTtrue＞ ＞ ln εi,
Therefore minimum item is ignored, equation (3) is expressed as：
Wherein, TbtIt is least square temperature, TbtIt is TtrueApproximation；
Least square temperature T can be acquired using least square methodbt, based on least square temperature Tbt, can reverse wavelength XiPlace
Spectral emissivity：
Wavelength X in equation (5)iThe spectral emissivity ε at placebtiSignificantly than the spectral emissivity ε of object under testiIt is bigger than normal, it introduces small
Make ε in 1 relaxation factor RbtiApproach εi：
εi=R εbti (6)
Equation (6) is substituted into equation (3)：
Wherein, TmbtIt is modified dual wavelength temperature, TmbtIt is TtrueApproximation, and TmbtRelative to TbtIt is more nearly Ttrue；
Modified dual wavelength temperature T can be acquired using least square methodmbt, dual wavelength temperature TmbtError formula be：
It can be obtained through analysis, the optimum value of relaxation factor R is being limited in section [0.3,1] in equation (11), and from probability angle, R takes
Intermediate value 0.65 can make TmbtPreferably approach Ttrue；
Step 2: monochromatic probabilistic approximation
The spectral emissivity on object under test surface limits section as [0.3,1], based on surveyed radiation intensity I1, wavelength X1And λ2,
T can be acquired using equation (2)truePlace section [T11,T12], based on surveyed radiation intensity I2, wavelength X1And λ2, use equation (2)
T can be acquiredtruePlace section [T21,T22], determine TtruePlace section is [T21,T12], consider to measure temperature T and TtrueIt
Difference cannot be too big, the monochromatic probability mean temperature T from probability meaningdsDuring positioned at the center of two section intersection parts global error compared with
It is small, i.e.,
TdsAs monochromatic probability mean temperature, makes measurement temperature with limiting section [T21,T12] in true temperature difference it is minimum；
Step 3: equalization
By modified dual wavelength temperature TmbtWith probability mean temperature TdsIt is averaged, acquires and measure temperature T：
It is found by numerical simulation, the measurement temperature T in equation (9) can preferably approaching to reality temperature Ttrue。
4. dual wavelength radiation temp measuring method according to claim 3, it is characterised in that：The ε1Change step is 0.1, and
ε2Change step is 0.01.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113189115A (en) * | 2021-05-17 | 2021-07-30 | 中国矿业大学 | Temperature field measurement and welding defect online monitoring device and monitoring method |
| CN113401360A (en) * | 2021-06-16 | 2021-09-17 | 电子科技大学 | Aero-engine turbine disc temperature measuring device based on multiband optical radiation temperature measurement |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030225543A1 (en) * | 2002-06-04 | 2003-12-04 | Mcintosh Devon R. | Two-stage multiwavelength thermal radiation analyzer |
| CN101476939A (en) * | 2009-02-12 | 2009-07-08 | 清华大学 | Double-CCD temperature field measuring apparatus and method |
| CN201464053U (en) * | 2009-05-12 | 2010-05-12 | 清华大学 | Double-CCD-based four-channel temperature field measurement device |
| CN106500853A (en) * | 2016-10-09 | 2017-03-15 | 南京理工大学 | A kind of wide-range high-accuracy infrared double color temperature measurer based on multisensor |
-
2018
- 2018-01-23 CN CN201810062303.4A patent/CN108254079B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030225543A1 (en) * | 2002-06-04 | 2003-12-04 | Mcintosh Devon R. | Two-stage multiwavelength thermal radiation analyzer |
| CN101476939A (en) * | 2009-02-12 | 2009-07-08 | 清华大学 | Double-CCD temperature field measuring apparatus and method |
| CN201464053U (en) * | 2009-05-12 | 2010-05-12 | 清华大学 | Double-CCD-based four-channel temperature field measurement device |
| CN106500853A (en) * | 2016-10-09 | 2017-03-15 | 南京理工大学 | A kind of wide-range high-accuracy infrared double color temperature measurer based on multisensor |
Non-Patent Citations (1)
| Title |
|---|
| 陆文强 等: ""双波长高精度红外测温仪"", 《物理实验》 * |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113189115A (en) * | 2021-05-17 | 2021-07-30 | 中国矿业大学 | Temperature field measurement and welding defect online monitoring device and monitoring method |
| CN113401360A (en) * | 2021-06-16 | 2021-09-17 | 电子科技大学 | Aero-engine turbine disc temperature measuring device based on multiband optical radiation temperature measurement |
| CN113401360B (en) * | 2021-06-16 | 2023-03-10 | 电子科技大学 | Aero-engine turbine disk temperature measuring device based on multiband optical radiation temperature measurement |
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