CN108229613A - Opto-electronic device Fault Locating Method and system - Google Patents
Opto-electronic device Fault Locating Method and system Download PDFInfo
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- CN108229613A CN108229613A CN201711491654.9A CN201711491654A CN108229613A CN 108229613 A CN108229613 A CN 108229613A CN 201711491654 A CN201711491654 A CN 201711491654A CN 108229613 A CN108229613 A CN 108229613A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K17/00—Methods or arrangements for effecting co-operative working between equipments covered by two or more of main groups G06K1/00 - G06K15/00, e.g. automatic card files incorporating conveying and reading operations
- G06K17/0022—Methods or arrangements for effecting co-operative working between equipments covered by two or more of main groups G06K1/00 - G06K15/00, e.g. automatic card files incorporating conveying and reading operations arrangements or provisious for transferring data to distant stations, e.g. from a sensing device
- G06K17/0025—Methods or arrangements for effecting co-operative working between equipments covered by two or more of main groups G06K1/00 - G06K15/00, e.g. automatic card files incorporating conveying and reading operations arrangements or provisious for transferring data to distant stations, e.g. from a sensing device the arrangement consisting of a wireless interrogation device in combination with a device for optically marking the record carrier
Abstract
A kind of opto-electronic device Fault Locating Method, including：The corresponding detection station point of links in S1, configuration opto-electronic device fault detect；S2, the corresponding detection content of links in opto-electronic device fault detect is obtained；According to detection time information, the detection project information of the corresponding detection content generation detection device of links；Time point information, residence time information and the detection device test command of the corresponding detection station point of links are reached according to the detection time information of detection device, the tested opto-electronic device of detection project information generation；S3, the tested opto-electronic device of control reach the time point of detection station point, and pass through detection device and the test content of opto-electronic device current link is tested according to test command；And record this test result information；This step is repeated until all links are completed；S4, the fault location information that opto-electronic device is obtained according to all test result informations.
Description
Technical field
The present invention relates to technical field of electro-optical communication more particularly to a kind of opto-electronic device Fault Locating Method and systems.
Background technology
Photoelectric converter is a kind of equipment similar to base band MODEM (digital modems) and base band MODEM differences
Be access be optical fiber special line, be optical signal, be divided into full duplex flow control, half-duplex back pressure control.
Photoelectric converter (also known as fiber optical transceiver), there is 100,000,000 fiber optical transceivers and Kilomega fiber transceiver, is one
Kind of Fast Ethernet, message transmission rate reach 1Gbps, still using the access control mechanisms of CSMA/CD and with existing ether
Net compatibility, under the support of wiring system, can make original Fast Ethernet smooth upgrade and the user that can adequately protect is original
Investment, gigabit network technology have become for New-deployed Network and transformation one preferred technique, thus to the performance requirement of comprehensive wiring system
Also it improves.Affiliated brand has the prosperous communication of TP-link, TC-net, three, the producers such as Chinese letter communication, wherein have a technical grade also has quotient
With type, the parameter index of general commercial style is relatively low, and range is relatively narrow；The performance of technical grade is more excellent, suitable for industrial environment.
Photoelectric converter interface includes：
RJ45 interfaces：10/100BaseT (X) or 10/100/1000BaseT (X) are adapted to automatically
Optical fiber interface：1000Base-SX/CX/LHX/EX (SFP slots, LC connectors)
LED light：Power supply, port status, 10/100/1000M.
Opto-electronic device after production is completed, is needed to carry out it quality testing, be needed light in detection process manually
Electronic device is positioned on the clamping bench of detection device, then pushes one of proae mounting plate by manually mode,
Detection probe with the pin of electronic component is in contact, circuit is being connected, it is detected, detection further takes out after completing
Appliance component, in the detection for carrying out next electronic component.
Above-mentioned detection process needs to detect manually, during proae mounting plate is pushed, larger power is needed, when long
Between detection, the labor intensity of operating personnel is high, is unfavorable for long working, and working efficiency is low.
Invention content
In view of this, the present invention proposes a kind of opto-electronic device Fault Locating Method and system.
A kind of opto-electronic device Fault Locating Method, includes the following steps：
The corresponding detection station point of links in S1, configuration opto-electronic device fault detect；
S2, the corresponding detection content of links in opto-electronic device fault detect is obtained；It is corresponding according to links
Detection content generates detection time information, the detection project information of detection device；According to the detection time information of detection device, inspection
It surveys the tested opto-electronic device of project information generation and reaches the time point information of the corresponding detection station point of links, residence time
Information and detection device test command；
S3, it is tested according to the time point information control of the corresponding detection station point of tested opto-electronic device arrival links
Opto-electronic device reaches the time point of detection station point, and passes through detection device and work as front ring to opto-electronic device according to test command
The test content of section is tested；And record this test result information；This step is repeated until all links are tested
Finish；
S4, the fault location information that opto-electronic device is obtained according to all test result informations.
In opto-electronic device Fault Locating Method of the present invention,
The step S4 is further included：Classification is carried out to the failure of opto-electronic device and obtains Mishap Database, passes through number of faults
The fault location information of acquisition opto-electronic device is analyzed according to library.
In opto-electronic device Fault Locating Method of the present invention, to the failure of opto-electronic device in the step S4
It carries out classification and obtains Mishap Database, included by Mishap Database to analyze the fault location information of acquisition opto-electronic device：
Classification is carried out to the failure of opto-electronic device and obtains Mishap Database, the Mishap Database includes photoelectron device
The corresponding characteristic information of failure of part；
One unique identifier of information configuration is characterized, establishes mapping of the unique identifier with the failure of corresponding opto-electronic device
Relationship；
Pass through unique identifier and the mapping relations of the failure of corresponding opto-electronic device and the matching of test result information
Interpretation of result obtains the fault location information of opto-electronic device.
The present invention also provides a kind of opto-electronic device fault location system, including such as lower unit：
Work station point dispensing unit, for the corresponding detection station point of links in opto-electronic device fault detect to be configured；
Dispensing unit is instructed, for obtaining the corresponding detection content of links in opto-electronic device fault detect；According to
Detection time information, the detection project information of the corresponding detection content generation detection device of links；According to detection device
Detection time information, the tested opto-electronic device of detection project information generation reach the time of the corresponding detection station point of links
Point information, residence time information and detection device test command；
Test cell, for reaching the time point letter of the corresponding detection station point of links according to tested opto-electronic device
The tested opto-electronic device of breath control reaches the time point of detection station point, and pass through detection device according to test command to photoelectron
The test content of device current link is tested；And record this test result information；This step is repeated until all
Link is completed；
Failure location unit, for obtaining the fault location information of opto-electronic device according to all test result informations.
In opto-electronic device fault location system of the present invention,
The failure location unit further includes：Classification is carried out to the failure of opto-electronic device and obtains Mishap Database, is passed through
Mishap Database obtains the fault location information of opto-electronic device to analyze.
In opto-electronic device fault location system of the present invention, to opto-electronic device in the failure location unit
Failure carry out classification obtain Mishap Database, by Mishap Database come analyze obtain opto-electronic device fault location information
Including：
Classification is carried out to the failure of opto-electronic device and obtains Mishap Database, the Mishap Database includes photoelectron device
The corresponding characteristic information of failure of part；
One unique identifier of information configuration is characterized, establishes mapping of the unique identifier with the failure of corresponding opto-electronic device
Relationship；
Pass through unique identifier and the mapping relations of the failure of corresponding opto-electronic device and the matching of test result information
Interpretation of result obtains the fault location information of opto-electronic device.
Implement opto-electronic device Fault Locating Method provided by the invention and system has compared with prior art with following
Beneficial effect：
It can realize the yields for opto-electronic device fault location, improving opto-electronic device.
Description of the drawings
Fig. 1 is opto-electronic device Fault Locating Method flow chart in the prior art.
Specific embodiment
As shown in Figure 1, an a kind of opto-electronic device Fault Locating Method, includes the following steps：
The corresponding detection station point of links in S1, configuration opto-electronic device fault detect；
S2, the corresponding detection content of links in opto-electronic device fault detect is obtained；It is corresponding according to links
Detection content generates detection time information, the detection project information of detection device；According to the detection time information of detection device, inspection
It surveys the tested opto-electronic device of project information generation and reaches the time point information of the corresponding detection station point of links, residence time
Information and detection device test command；
S3, it is tested according to the time point information control of the corresponding detection station point of tested opto-electronic device arrival links
Opto-electronic device reaches the time point of detection station point, and passes through detection device and work as front ring to opto-electronic device according to test command
The test content of section is tested；And record this test result information；This step is repeated until all links are tested
Finish；
S4, the fault location information that opto-electronic device is obtained according to all test result informations.
In opto-electronic device Fault Locating Method of the present invention,
The step S4 is further included：Classification is carried out to the failure of opto-electronic device and obtains Mishap Database, passes through number of faults
The fault location information of acquisition opto-electronic device is analyzed according to library.
In opto-electronic device Fault Locating Method of the present invention, to the failure of opto-electronic device in the step S4
It carries out classification and obtains Mishap Database, included by Mishap Database to analyze the fault location information of acquisition opto-electronic device：
Classification is carried out to the failure of opto-electronic device and obtains Mishap Database, the Mishap Database includes photoelectron device
The corresponding characteristic information of failure of part；
One unique identifier of information configuration is characterized, establishes mapping of the unique identifier with the failure of corresponding opto-electronic device
Relationship；
Pass through unique identifier and the mapping relations of the failure of corresponding opto-electronic device and the matching of test result information
Interpretation of result obtains the fault location information of opto-electronic device.
The present invention also provides a kind of opto-electronic device fault location system, including such as lower unit：
Work station point dispensing unit, for the corresponding detection station point of links in opto-electronic device fault detect to be configured；
Dispensing unit is instructed, for obtaining the corresponding detection content of links in opto-electronic device fault detect；According to
Detection time information, the detection project information of the corresponding detection content generation detection device of links；According to detection device
Detection time information, the tested opto-electronic device of detection project information generation reach the time of the corresponding detection station point of links
Point information, residence time information and detection device test command；
Test cell, for reaching the time point letter of the corresponding detection station point of links according to tested opto-electronic device
The tested opto-electronic device of breath control reaches the time point of detection station point, and pass through detection device according to test command to photoelectron
The test content of device current link is tested；And record this test result information；This step is repeated until all
Link is completed；
Failure location unit, for obtaining the fault location information of opto-electronic device according to all test result informations.
In opto-electronic device fault location system of the present invention,
The failure location unit further includes：Classification is carried out to the failure of opto-electronic device and obtains Mishap Database, is passed through
Mishap Database obtains the fault location information of opto-electronic device to analyze.
In opto-electronic device fault location system of the present invention, to opto-electronic device in the failure location unit
Failure carry out classification obtain Mishap Database, by Mishap Database come analyze obtain opto-electronic device fault location information
Including：
Classification is carried out to the failure of opto-electronic device and obtains Mishap Database, the Mishap Database includes photoelectron device
The corresponding characteristic information of failure of part；
One unique identifier of information configuration is characterized, establishes mapping of the unique identifier with the failure of corresponding opto-electronic device
Relationship；
Pass through unique identifier and the mapping relations of the failure of corresponding opto-electronic device and the matching of test result information
Interpretation of result obtains the fault location information of opto-electronic device.
Implement opto-electronic device Fault Locating Method provided by the invention and system has compared with prior art with following
Beneficial effect：
It can realize the yields for opto-electronic device fault location, improving opto-electronic device.
It is understood that for those of ordinary skill in the art, it can be conceived with the technique according to the invention and done
Go out other various corresponding changes and deformation, and all these changes and deformation should all belong to the protection model of the claims in the present invention
It encloses.
Claims (6)
1. a kind of opto-electronic device Fault Locating Method, which is characterized in that it includes the following steps：
The corresponding detection station point of links in S1, configuration opto-electronic device fault detect；
S2, the corresponding detection content of links in opto-electronic device fault detect is obtained；According to the corresponding detection of links
Content generates detection time information, the detection project information of detection device；According to the detection time information of detection device, detection
The tested opto-electronic device of mesh information generation reaches the time point information of the corresponding detection station point of links, residence time information
And detection device test command；
S3, the tested photoelectricity of time point information control that the corresponding detection station point of links is reached according to tested opto-electronic device
Sub- device reaches the time point of detection station point, and passes through detection device according to test command to opto-electronic device current link
Test content is tested；And record this test result information；This step is repeated until all links are completed；
S4, the fault location information that opto-electronic device is obtained according to all test result informations.
2. opto-electronic device Fault Locating Method as described in claim 1, which is characterized in that
The step S4 is further included：Classification is carried out to the failure of opto-electronic device and obtains Mishap Database, passes through Mishap Database
To analyze the fault location information for obtaining opto-electronic device.
3. opto-electronic device Fault Locating Method as claimed in claim 2, which is characterized in that photoelectron in the step S4
The failure of device carries out classification and obtains Mishap Database, and the fault location of acquisition opto-electronic device is analyzed by Mishap Database
Information includes：
Classification is carried out to the failure of opto-electronic device and obtains Mishap Database, the Mishap Database includes opto-electronic device
The corresponding characteristic information of failure；
One unique identifier of information configuration is characterized, unique identifier is established and is closed with the mapping of the failure of corresponding opto-electronic device
System；
Pass through unique identifier and the mapping relations of the failure of corresponding opto-electronic device and the matching result of test result information
Analysis obtains the fault location information of opto-electronic device.
4. a kind of opto-electronic device fault location system, which is characterized in that it includes such as lower unit：
Work station point dispensing unit, for the corresponding detection station point of links in opto-electronic device fault detect to be configured；
Dispensing unit is instructed, for obtaining the corresponding detection content of links in opto-electronic device fault detect；According to each
Detection time information, the detection project information of the corresponding detection content generation detection device of link；According to the detection of detection device
Temporal information, the tested opto-electronic device of detection project information generation reach the time point letter of the corresponding detection station point of links
Breath, residence time information and detection device test command；
Test cell, for reaching the time point information control of the corresponding detection station point of links according to tested opto-electronic device
The tested opto-electronic device of system reaches the time point of detection station point, and pass through detection device according to test command to opto-electronic device
The test content of current link is tested；And record this test result information；This step is repeated until all links
It is completed；
Failure location unit, for obtaining the fault location information of opto-electronic device according to all test result informations.
5. opto-electronic device fault location system as claimed in claim 4, which is characterized in that
The failure location unit further includes：Classification is carried out to the failure of opto-electronic device and obtains Mishap Database, passes through failure
Database obtains the fault location information of opto-electronic device to analyze.
6. opto-electronic device fault location system as claimed in claim 5, which is characterized in that right in the failure location unit
The failure of opto-electronic device carries out classification and obtains Mishap Database, and the event of acquisition opto-electronic device is analyzed by Mishap Database
Barrier location information includes：
Classification is carried out to the failure of opto-electronic device and obtains Mishap Database, the Mishap Database includes opto-electronic device
The corresponding characteristic information of failure；
One unique identifier of information configuration is characterized, unique identifier is established and is closed with the mapping of the failure of corresponding opto-electronic device
System；
Pass through unique identifier and the mapping relations of the failure of corresponding opto-electronic device and the matching result of test result information
Analysis obtains the fault location information of opto-electronic device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201711491654.9A CN108229613A (en) | 2017-12-30 | 2017-12-30 | Opto-electronic device Fault Locating Method and system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201711491654.9A CN108229613A (en) | 2017-12-30 | 2017-12-30 | Opto-electronic device Fault Locating Method and system |
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| CN106872836A (en) * | 2015-12-11 | 2017-06-20 | 研祥智能科技股份有限公司 | Distributed automatization detecting system and method on production line |
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- 2017-12-30 CN CN201711491654.9A patent/CN108229613A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104734871A (en) * | 2013-12-20 | 2015-06-24 | 中兴通讯股份有限公司 | Method and device for positioning failures |
| CN105223453A (en) * | 2015-11-03 | 2016-01-06 | 广东电网有限责任公司佛山供电局 | Based on substation transformer trouble-shooter and the method for multiple attribute synthetical evaluation |
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Application publication date: 20180629 |