CN108259085A - Opto-electronic device non-defective unit detection method and system - Google Patents
Opto-electronic device non-defective unit detection method and system Download PDFInfo
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- CN108259085A CN108259085A CN201711491589.XA CN201711491589A CN108259085A CN 108259085 A CN108259085 A CN 108259085A CN 201711491589 A CN201711491589 A CN 201711491589A CN 108259085 A CN108259085 A CN 108259085A
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- opto
- electronic device
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- defective unit
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/073—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an out-of-service signal
- H04B10/0731—Testing or characterisation of optical devices, e.g. amplifiers
Abstract
A kind of opto-electronic device non-defective unit detection method, including：S1, analysis acquisition opto-electronic device failure cause is carried out to opto-electronic device failure；It obtains the corresponding detection failure code of opto-electronic device failure cause and stores in the server；S2, each test session that opto-electronic device is configured in the server, and the required test suite of each test session is set；S3, automatic test part and manual testing part in each test session are configured in the server；S4, the control instruction information that corresponding test suite is configured according to automatic test part；S5, the required personnel specialty performance information in manual testing part, required personnel's working hour information are obtained；S6, opto-electronic device information to be measured at present is obtained, the required personnel in manual testing part are screened according to opto-electronic device information to be measured, and the control instruction information of test suite is corresponded to according to automatic test part generation opto-electronic device to be measured, non-defective unit test is carried out to opto-electronic device to be measured.
Description
Technical field
The present invention relates to technical field of electro-optical communication more particularly to a kind of opto-electronic device non-defective unit detection methods and system.
Background technology
Photoelectric converter be a kind of equipment similar to base band MODEM (digital modems) and base band MODEM not
Be access be optical fiber special line, be optical signal, be divided into full duplex flow control, half-duplex back pressure control.
Photoelectric converter (also known as fiber optical transceiver), there is 100,000,000 fiber optical transceivers and Kilomega fiber transceiver, is one
Kind of Fast Ethernet, message transmission rate reach 1Gbps, still using the access control mechanisms of CSMA/CD and with existing ether
Net compatibility, under the support of wiring system, can make original Fast Ethernet smooth upgrade and the user that can adequately protect is original
Investment, gigabit network technology have become for New-deployed Network and transformation one preferred technique, thus to the performance requirement of comprehensive wiring system
Also it improves.Affiliated brand has the prosperous communication of TP-link, TC-net, three, the producers such as Chinese letter communication, wherein have a technical grade also has quotient
With type, the parameter index of general commercial style is relatively low, and range is relatively narrow；The performance of technical grade is more excellent, suitable for industrial environment.
Photoelectric converter interface includes：
RJ45 interfaces：10/100BaseT (X) or 10/100/1000BaseT (X) are adapted to automatically
Optical fiber interface：1000Base-SX/CX/LHX/EX (SFP slots, LC connectors)
LED light：Power supply, port status, 10/100/1000M.
Opto-electronic device after production is completed, is needed to carry out it quality testing, be needed light in detection process manually
Electronic device is positioned on the clamping bench of detection device, then pushes one of proae mounting plate by manually mode,
Detection probe with the pin of electronic component is in contact, circuit is being connected, it is detected, detection takes again after completing
Go out appliance component, in the detection for carrying out next electronic component.
Above-mentioned detection process needs to detect manually, during proae mounting plate is pushed, larger power is needed, when long
Between detection, the labor intensity of operating personnel is high, is unfavorable for long working, and working efficiency is low.
Invention content
In view of this, the present invention proposes a kind of opto-electronic device non-defective unit detection method and system.
A kind of opto-electronic device non-defective unit detection method, includes the following steps：
S1, analysis acquisition opto-electronic device failure cause is carried out to opto-electronic device failure；Obtain opto-electronic device failure
The corresponding detection failure code of reason simultaneously stores in the server；
S2, each test session that opto-electronic device is configured in the server, and set each test session required
Test suite；
S3, automatic test part and manual testing part in each test session are configured in the server；
S4, the control instruction information that corresponding test suite is configured according to automatic test part；
S5, the required personnel specialty performance information in manual testing part, required personnel's working hour information are obtained；
S6, opto-electronic device information to be measured at present is obtained, according to opto-electronic device information to be measured to manual testing part institute
The personnel needed are screened, and the control of test suite is corresponded to according to automatic test part generation opto-electronic device to be measured
Command information carries out non-defective unit test to opto-electronic device to be measured.
In opto-electronic device non-defective unit detection method of the present invention,
Non-defective unit test is carried out in the step S6 to opto-electronic device to be measured to include：
The control instruction information that test suite is corresponded to by generating opto-electronic device to be measured carries out test control to test suite
System, and obtain automation part of detecting test result；
Obtain manual testing's partial test result；
Automatic test partial test result and manual testing's partial test result are sent to server.
In opto-electronic device non-defective unit detection method of the present invention,
Division of teaching contents is tested, and different tests is set to be specifically included by condition model to opto-electronic device：
Opto-electronic device is subjected to functional unit division, and according to the different monitoring model of different function component Configuration；
Different monitoring monitoring models is configured passes through condition model；
Based on opto-electronic device is tested by condition model, judge whether to meet passing through by condition model
Condition, meet pass through condition when, assert the link test pass through.
In opto-electronic device non-defective unit detection method of the present invention,
It is described that opto-electronic device is subjected to functional unit division, and according to the different monitoring mould of different function component Configuration
Type includes：
Opto-electronic device is tested into division of teaching contents, including electric component, control assembly and mechanical component；
Electric component, control assembly and mechanical component is configured passes through condition model；
The electric component it is as follows by condition model：
The electric current, voltage, temperature value of electric component are monitored；
The control assembly it is as follows by condition model：
Chip in control assembly is verified；
The mechanical component it is as follows by condition model：
The service life of mechanical component, deformation values, tension values are monitored.
The present invention also provides a kind of opto-electronic device non-defective unit detecting system, including such as lower unit：
Fault message extraction unit obtains opto-electronic device failure cause for carrying out analysis to opto-electronic device failure；
It obtains the corresponding detection failure code of opto-electronic device failure cause and stores in the server；
Test session division unit for each test session of opto-electronic device to be configured in the server, and is set each
A required test suite of test session；
Part division unit, for automatic test part and artificial to be configured in each test session in the server
Part of detecting；
Information generating unit is controlled, is believed for the control instruction of corresponding test suite to be configured according to automatic test part
Breath；
Human configuration unit, for obtaining the required personnel specialty performance information in manual testing part, required people
Information during employee；
Test cell, for obtaining current opto-electronic device information to be measured, according to opto-electronic device information to be measured to artificial
The required personnel of part of detecting are screened, and are generated opto-electronic device to be measured according to automatic test part and corresponded to test
The control instruction information of component carries out non-defective unit test to opto-electronic device to be measured.
In opto-electronic device non-defective unit detecting system of the present invention,
Non-defective unit test is carried out in the test cell to opto-electronic device to be measured to include：
The control instruction information that test suite is corresponded to by generating opto-electronic device to be measured carries out test control to test suite
System, and obtain automation part of detecting test result；
Obtain manual testing's partial test result；
Automatic test partial test result and manual testing's partial test result are sent to server.
In opto-electronic device non-defective unit detecting system of the present invention,
Division of teaching contents is tested, and different tests is set to be specifically included by condition model to opto-electronic device：
Opto-electronic device is subjected to functional unit division, and according to the different monitoring model of different function component Configuration；
Different monitoring monitoring models is configured passes through condition model；
Based on opto-electronic device is tested by condition model, judge whether to meet passing through by condition model
Condition, meet pass through condition when, assert the link test pass through.
In opto-electronic device non-defective unit detecting system of the present invention,
It is described that opto-electronic device is subjected to functional unit division, and according to the different monitoring mould of different function component Configuration
Type includes：
Opto-electronic device is tested into division of teaching contents, including electric component, control assembly and mechanical component；
Electric component, control assembly and mechanical component is configured passes through condition model；
The electric component it is as follows by condition model：
The electric current, voltage, temperature value of electric component are monitored；
The control assembly it is as follows by condition model：
Chip in control assembly is verified；
The mechanical component it is as follows by condition model：
The service life of mechanical component, deformation values, tension values are monitored.
Implement opto-electronic device non-defective unit detection method and system provided by the invention has compared with prior art with following
Beneficial effect：
It can realize and opto-electronic device non-defective unit is detected, improve the yields of opto-electronic device.
Description of the drawings
Fig. 1 is the opto-electronic device non-defective unit detection method flow chart of the embodiment of the present invention.
Specific embodiment
As shown in Figure 1, a kind of opto-electronic device non-defective unit detection method, includes the following steps：
S1, analysis acquisition opto-electronic device failure cause is carried out to opto-electronic device failure；Obtain opto-electronic device failure
The corresponding detection failure code of reason simultaneously stores in the server；
S2, each test session that opto-electronic device is configured in the server, and set each test session required
Test suite；
S3, automatic test part and manual testing part in each test session are configured in the server；
S4, the control instruction information that corresponding test suite is configured according to automatic test part；
S5, the required personnel specialty performance information in manual testing part, required personnel's working hour information are obtained；
S6, opto-electronic device information to be measured at present is obtained, according to opto-electronic device information to be measured to manual testing part institute
The personnel needed are screened, and the control of test suite is corresponded to according to automatic test part generation opto-electronic device to be measured
Command information carries out non-defective unit test to opto-electronic device to be measured.
In opto-electronic device non-defective unit detection method of the present invention,
Non-defective unit test is carried out in the step S6 to opto-electronic device to be measured to include：
The control instruction information that test suite is corresponded to by generating opto-electronic device to be measured carries out test control to test suite
System, and obtain automation part of detecting test result；
Obtain manual testing's partial test result；
Automatic test partial test result and manual testing's partial test result are sent to server.
In opto-electronic device non-defective unit detection method of the present invention,
Division of teaching contents is tested, and different tests is set to be specifically included by condition model to opto-electronic device：
Opto-electronic device is subjected to functional unit division, and according to the different monitoring model of different function component Configuration；
Different monitoring monitoring models is configured passes through condition model；
Based on opto-electronic device is tested by condition model, judge whether to meet passing through by condition model
Condition, meet pass through condition when, assert the link test pass through.
In opto-electronic device non-defective unit detection method of the present invention,
It is described that opto-electronic device is subjected to functional unit division, and according to the different monitoring mould of different function component Configuration
Type includes：
Opto-electronic device is tested into division of teaching contents, including electric component, control assembly and mechanical component；
Electric component, control assembly and mechanical component is configured passes through condition model；
The electric component it is as follows by condition model：
The electric current, voltage, temperature value of electric component are monitored；
The control assembly it is as follows by condition model：
Chip in control assembly is verified；
The mechanical component it is as follows by condition model：
The service life of mechanical component, deformation values, tension values are monitored.
The present invention also provides a kind of opto-electronic device non-defective unit detecting system, including such as lower unit：
Fault message extraction unit obtains opto-electronic device failure cause for carrying out analysis to opto-electronic device failure；
It obtains the corresponding detection failure code of opto-electronic device failure cause and stores in the server；
Test session division unit for each test session of opto-electronic device to be configured in the server, and is set each
A required test suite of test session；
Part division unit, for automatic test part and artificial to be configured in each test session in the server
Part of detecting；
Information generating unit is controlled, is believed for the control instruction of corresponding test suite to be configured according to automatic test part
Breath；
Human configuration unit, for obtaining the required personnel specialty performance information in manual testing part, required people
Information during employee；
Test cell, for obtaining current opto-electronic device information to be measured, according to opto-electronic device information to be measured to artificial
The required personnel of part of detecting are screened, and are generated opto-electronic device to be measured according to automatic test part and corresponded to test
The control instruction information of component carries out non-defective unit test to opto-electronic device to be measured.
In opto-electronic device non-defective unit detecting system of the present invention,
Non-defective unit test is carried out in the test cell to opto-electronic device to be measured to include：
The control instruction information that test suite is corresponded to by generating opto-electronic device to be measured carries out test control to test suite
System, and obtain automation part of detecting test result；
Obtain manual testing's partial test result；
Automatic test partial test result and manual testing's partial test result are sent to server.
In opto-electronic device non-defective unit detecting system of the present invention,
Division of teaching contents is tested, and different tests is set to be specifically included by condition model to opto-electronic device：
Opto-electronic device is subjected to functional unit division, and according to the different monitoring model of different function component Configuration；
Different monitoring monitoring models is configured passes through condition model；
Based on opto-electronic device is tested by condition model, judge whether to meet passing through by condition model
Condition, meet pass through condition when, assert the link test pass through.
In opto-electronic device non-defective unit detecting system of the present invention,
It is described that opto-electronic device is subjected to functional unit division, and according to the different monitoring mould of different function component Configuration
Type includes：
Opto-electronic device is tested into division of teaching contents, including electric component, control assembly and mechanical component；
Electric component, control assembly and mechanical component is configured passes through condition model；
The electric component it is as follows by condition model：
The electric current, voltage, temperature value of electric component are monitored；
The control assembly it is as follows by condition model：
Chip in control assembly is verified；
The mechanical component it is as follows by condition model：
The service life of mechanical component, deformation values, tension values are monitored.
Implement opto-electronic device non-defective unit detection method and system provided by the invention has compared with prior art with following
Beneficial effect：
It can realize and opto-electronic device non-defective unit is detected, improve the yields of opto-electronic device.
Implement opto-electronic device non-defective unit detection method and system provided by the invention has compared with prior art with following
Beneficial effect：
It can realize and opto-electronic device non-defective unit is detected, improve the yields of opto-electronic device.
It is understood that for those of ordinary skill in the art, it can be conceived with the technique according to the invention and done
Go out other various corresponding changes and deformation, and all these changes and deformation should all belong to the protection of the claims in the present invention
Range.
Claims (8)
1. a kind of opto-electronic device non-defective unit detection method, which is characterized in that it includes the following steps：
S1, analysis acquisition opto-electronic device failure cause is carried out to opto-electronic device failure；Obtain opto-electronic device failure cause
Corresponding detection failure code simultaneously stores in the server；
S2, each test session that opto-electronic device is configured in the server, and the required test of each test session is set
Component；
S3, automatic test part and manual testing part in each test session are configured in the server；
S4, the control instruction information that corresponding test suite is configured according to automatic test part；
S5, the required personnel specialty performance information in manual testing part, required personnel's working hour information are obtained；
S6, opto-electronic device information to be measured at present is obtained, according to opto-electronic device information to be measured to required for manual testing part
Personnel screened, and the control instruction letter that opto-electronic device to be measured corresponds to test suite is generated according to automatic test part
Breath carries out non-defective unit test to opto-electronic device to be measured.
2. opto-electronic device non-defective unit detection method as described in claim 1, which is characterized in that
Non-defective unit test is carried out in the step S6 to opto-electronic device to be measured to include：
The control instruction information that test suite is corresponded to by generating opto-electronic device to be measured carries out testing and control to test suite, and
Obtain automation part of detecting test result；
Obtain manual testing's partial test result；
Automatic test partial test result and manual testing's partial test result are sent to server.
3. opto-electronic device non-defective unit detection method as claimed in claim 2, which is characterized in that
Division of teaching contents is tested, and different tests is set to be specifically included by condition model to opto-electronic device：
Opto-electronic device is subjected to functional unit division, and according to the different monitoring model of different function component Configuration；
Different monitoring monitoring models is configured passes through condition model；
Based on opto-electronic device is tested by condition model, judge whether to meet through condition model through condition,
Meet pass through condition when, assert the link test pass through.
4. opto-electronic device non-defective unit detection method as claimed in claim 3, which is characterized in that
It is described that opto-electronic device is subjected to functional unit division, and according to the different monitoring model packet of different function component Configuration
It includes：
Opto-electronic device is tested into division of teaching contents, including electric component, control assembly and mechanical component；
Electric component, control assembly and mechanical component is configured passes through condition model；
The electric component it is as follows by condition model：
The electric current, voltage, temperature value of electric component are monitored；
The control assembly it is as follows by condition model：
Chip in control assembly is verified；
The mechanical component it is as follows by condition model：
The service life of mechanical component, deformation values, tension values are monitored.
5. a kind of opto-electronic device non-defective unit detecting system, which is characterized in that it includes such as lower unit：
Fault message extraction unit obtains opto-electronic device failure cause for carrying out analysis to opto-electronic device failure；It obtains
The corresponding detection failure code of opto-electronic device failure cause simultaneously stores in the server；
Test session division unit for each test session of opto-electronic device to be configured in the server, and sets each survey
The required test suite of test ring section；
Part division unit, for automatic test part and manual testing portion in each test session to be configured in the server
Point；
Information generating unit is controlled, for the control instruction information of corresponding test suite to be configured according to automatic test part；
Human configuration unit, for obtaining the required personnel specialty performance information in manual testing part, required personnel's work
When information；
Test cell, for obtaining current opto-electronic device information to be measured, according to opto-electronic device information to be measured to manual testing
The required personnel in part are screened, and are generated opto-electronic device to be measured according to automatic test part and corresponded to test suite
Control instruction information carries out non-defective unit test to opto-electronic device to be measured.
6. opto-electronic device non-defective unit detecting system as claimed in claim 5, which is characterized in that
Non-defective unit test is carried out in the test cell to opto-electronic device to be measured to include：
The control instruction information that test suite is corresponded to by generating opto-electronic device to be measured carries out testing and control to test suite, and
Obtain automation part of detecting test result；
Obtain manual testing's partial test result；
Automatic test partial test result and manual testing's partial test result are sent to server.
7. opto-electronic device non-defective unit detecting system as claimed in claim 6, which is characterized in that
Division of teaching contents is tested, and different tests is set to be specifically included by condition model to opto-electronic device：
Opto-electronic device is subjected to functional unit division, and according to the different monitoring model of different function component Configuration；
Different monitoring monitoring models is configured passes through condition model；
Based on opto-electronic device is tested by condition model, judge whether to meet through condition model through condition,
Meet pass through condition when, assert the link test pass through.
8. opto-electronic device non-defective unit detecting system as claimed in claim 7, which is characterized in that
It is described that opto-electronic device is subjected to functional unit division, and according to the different monitoring model packet of different function component Configuration
It includes：
Opto-electronic device is tested into division of teaching contents, including electric component, control assembly and mechanical component；
Electric component, control assembly and mechanical component is configured passes through condition model；
The electric component it is as follows by condition model：
The electric current, voltage, temperature value of electric component are monitored；
The control assembly it is as follows by condition model：
Chip in control assembly is verified；
The mechanical component it is as follows by condition model：
The service life of mechanical component, deformation values, tension values are monitored.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201711491589.XA CN108259085A (en) | 2017-12-30 | 2017-12-30 | Opto-electronic device non-defective unit detection method and system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711491589.XA CN108259085A (en) | 2017-12-30 | 2017-12-30 | Opto-electronic device non-defective unit detection method and system |
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| CN108259085A true CN108259085A (en) | 2018-07-06 |
Family
ID=62725349
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Application publication date: 20180706 |
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