CN108196377B - Scanning mechanism light path debugging device and method - Google Patents
Scanning mechanism light path debugging device and method Download PDFInfo
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- CN108196377B CN108196377B CN201711335291.XA CN201711335291A CN108196377B CN 108196377 B CN108196377 B CN 108196377B CN 201711335291 A CN201711335291 A CN 201711335291A CN 108196377 B CN108196377 B CN 108196377B
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- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/62—Optical apparatus specially adapted for adjusting optical elements during the assembly of optical systems
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Abstract
The invention provides a device and a method for debugging a light path of a scanning mechanism. The optical axis of the third autocollimator C passes through the reflector and then is parallel to the rotary table rotary shaft, so that an orthogonal optical reference taking the axis of the rotary table as a reference is formed, the table surface of the debugging rotary table is provided with an angle adjusting mechanism, angle fine adjustment in two orthogonal directions can be realized, and the debugging rotary table is provided with a dual-channel rotary transformer interpreter, so that the accurate measurement of the rotation angle can be realized. By adopting the debugging device and the debugging method, the positions and the angles of the spectroscope and the fixed reflector of the scanning mechanism can be respectively adjusted, and the verticality between the infrared light path and the azimuth axis of the scanning mechanism is less than or equal to 10 'and the verticality between the laser light path and the azimuth axis of the scanning mechanism is less than or equal to 10'.
Description
Technical Field
The invention belongs to the technical field of optical machine debugging, and particularly relates to a scanning mechanism light path debugging device and a debugging method. The invention can be used for the installation and adjustment of the scanning mechanism with infrared and laser deflection light paths.
Background
The photoelectric radar scanning mechanism is an important part of the photoelectric radar, and comprises a scanning reflecting mirror, an infrared laser spectroscope and a fixed reflecting mirror. The scanning reflector can scan in the direction of elevation and receive infrared and laser information, and then the infrared and laser information are separated by the infrared laser spectroscope and enter the infrared system and the laser optical system respectively. The perpendicularity between the infrared light path and the azimuth axis of the scanning mechanism is required to be less than or equal to 10 'and the perpendicularity between the laser light path and the azimuth axis of the scanning mechanism is required to be less than or equal to 10'.
At present, when a photoelectric radar scanning mechanism is installed, the verticality of infrared and laser light paths and an azimuth axis of the scanning mechanism is ensured to meet the requirement only through the dimensional precision of mechanical parts; however, because the precision of the machine-added parts is limited, the verticality requirement of the photoelectric radar scanning mechanism is difficult to guarantee, and a corresponding assembling and adjusting device and a corresponding method are necessary to be designed to meet the light path design requirement in the installation process of the photoelectric radar scanning mechanism.
Disclosure of Invention
The invention aims to provide a device and a method for debugging the optical path of a scanning mechanism, which can be used for debugging an optical system with a complex axis system and a plurality of deflection optical paths.
The technical scheme of the invention is as follows:
the light path debugging device of the scanning mechanism is characterized in that: the device comprises a mounting bracket, a debugging rotary table, a clamping mechanism, a first autocollimator, a second autocollimator, a third autocollimator, a flat crystal reflector, a dual-channel rotary transformer interpreter and an internal reflector;
the debugging rotary table, the first autocollimator, the second autocollimator, the third autocollimator and the internal reflector are all arranged on the mounting bracket, and the height of the second autocollimator can be adjusted to be used for debugging light paths of different wave bands respectively;
the table top of the debugging rotary table is provided with an angle adjusting mechanism, so that the fine adjustment of the angle of the table top in the azimuth direction and the pitching direction can be realized; the debugging rotary table is provided with a two-channel rotary transformer interpreter, so that the accurate measurement of the rotation angle can be realized; the rotating shaft of the debugging rotary table is perpendicular to the optical axes of the first autocollimator and the second autocollimator, and the optical axis of the third autocollimator passes through the internal reflector and then is parallel to the rotating shaft of the debugging rotary table;
the clamping mechanism is arranged on the table top of the debugging rotary table;
the flat crystal reflector can be installed on the scanning mechanism with the reflecting surface facing downwards.
Further preferably, the optical path adjusting device for a scanning mechanism is characterized in that: the parallelism of the first autocollimator and the second autocollimator is less than or equal to 5'; the perpendicularity between the first autocollimator and the rotary shaft of the debugging rotary table is less than or equal to 5'; the parallelism between the optical axis of the third autocollimator after being reflected by the internal reflector and the rotating shaft of the debugging turntable is less than or equal to 5'.
Further preferably, the optical path adjusting device for a scanning mechanism is characterized in that: the coaxiality of the central axis of the clamping mechanism and the rotating shaft of the debugging rotary table is less than or equal to 3 mm.
Further preferably, the optical path adjusting device for a scanning mechanism is characterized in that: the radial runout is less than or equal to 2 mu m and the angular wobble is less than or equal to 3' in the rotation process of the debugging turntable.
The method for debugging the optical path of the scanning mechanism by using the debugging device is characterized in that: the method comprises the following steps:
step 1: fixing the scanning mechanism component on the table top of the debugging turntable through a clamping mechanism; a flat crystal reflector with a downward reflecting surface is arranged on the azimuth axis of the scanning mechanism; rotating the azimuth axis of the scanning mechanism by the debugging rotary table, and adjusting the flat crystal reflector to minimize the circle drawing amount observed by the third autocollimator, wherein the deviation amount from the circle center of the circle drawing to the center of the reticle of the third autocollimator is the perpendicularity between the azimuth axis of the scanning mechanism and the table top of the debugging rotary table;
step 2: adjusting the angle of the table top of the debugging rotary table to enable the third autocollimator to be autocollimated, and enabling the azimuth axis of the scanning mechanism to be parallel to the optical axis of the third autocollimator after being reflected by the inner reflector; rotating the debugging rotary table to a calibrated zero position, and rotating a scanning reflecting mirror of the scanning mechanism to enable a first autocollimator and a third autocollimator which are the same in height as the scanning reflecting mirror to be mutually aligned;
and step 3: a flat crystal reflector with a downward reflecting surface is arranged on the azimuth axis of the scanning mechanism, and the height of the second autocollimator is adjusted to be the same as that of the spectroscope in the scanning mechanism, so that the second autocollimator can see an autocollimation image of the flat crystal reflector through the spectroscope; rotating the azimuth axis of the scanning mechanism, adjusting the flat crystal reflector to minimize the circle drawing amount observed by the second autocollimator, wherein the deviation amount from the circle center of the circle drawing to the center of the reticle of the second autocollimator is the deviation amount of the current waveband light path; adjusting the spectroscope according to the deviation amount to enable the second autocollimator to be self-aligned;
and 4, step 4: adjusting the height of the second autocollimator to be the same as that of a fixed reflector in the scanning mechanism, so that the second autocollimator can see an autocollimation image of the flat crystal reflector through the fixed reflector; rotating the azimuth axis of the scanning mechanism, adjusting the flat crystal reflector to minimize the circle drawing amount observed by the second autocollimator, wherein the deviation amount from the circle center of the circle drawing to the center of the reticle of the second autocollimator is the deviation amount of the current waveband light path; and adjusting the fixed reflector according to the deviation amount to enable the second autocollimator to be self-aligned.
Advantageous effects
By adopting the debugging device and the debugging method, the positions and the angles of the spectroscope and the fixed reflector of the scanning mechanism can be respectively adjusted, and the verticality between the infrared light path and the azimuth axis of the scanning mechanism is less than or equal to 10 'and the verticality between the laser light path and the azimuth axis of the scanning mechanism is less than or equal to 10'.
Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
The above and/or additional aspects and advantages of the present invention will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:
fig. 1 is a schematic view of a scanning mechanism.
Fig. 2 is a scanning mechanism light path debugging device.
Detailed Description
The following detailed description of embodiments of the invention is intended to be illustrative, and not to be construed as limiting the invention.
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", and the like, indicate orientations and positional relationships based on those shown in the drawings, and are used only for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be considered as limiting the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically defined otherwise.
As shown in fig. 2, the optical path debugging device for a scanning mechanism in this embodiment includes a mounting bracket, a debugging turntable, a clamping mechanism, a first autocollimator a, a second autocollimator B, a third autocollimator C, a flat crystal mirror, a two-channel resolver interpreter, and an internal reflection mirror.
The debugging rotary table, the first autocollimator A, the second autocollimator B, the third autocollimator C and the inner reflector are all arranged on the mounting support, and the second autocollimator B can adjust the height and is used for debugging light paths of different wave bands respectively.
The table top of the debugging rotary table is provided with an angle adjusting mechanism, so that the fine adjustment of the angle of the table top in the azimuth direction and the pitching direction can be realized; the debugging rotary table is provided with a two-channel rotary transformer interpreter, so that the accurate measurement of the rotation angle can be realized; the rotating shaft of the debugging rotary table is perpendicular to the optical axes of the first autocollimator A and the second autocollimator B, and the optical axis of the third autocollimator C is parallel to the rotating shaft of the debugging rotary table after passing through the inner reflector. In this embodiment, the parallelism between the first autocollimator a and the second autocollimator B is required to be less than or equal to 5 ″; the perpendicularity between the first autocollimator A and the rotating shaft of the debugging rotary table is less than or equal to 5'; the parallelism between the optical axis of the third autocollimator C after being reflected by the internal reflector and the rotating shaft of the debugging turntable is less than or equal to 5'.
The clamping mechanism is arranged on the table surface of the debugging rotary table. The coaxiality of the central axis of the clamping mechanism and the rotating shaft of the debugging rotary table is less than or equal to 3 mm. The radial runout is less than or equal to 2 mu m and the angular wobble is less than or equal to 3' in the rotation process of the debugging turntable.
The flat crystal reflector can be installed on the scanning mechanism with the reflecting surface facing downwards.
The method for debugging the optical path of the scanning mechanism by using the debugging device is characterized in that: the method comprises the following steps:
step 1: fixing the scanning mechanism component on the table top of the debugging turntable through a clamping mechanism; a flat crystal reflector with a downward reflecting surface is arranged on the azimuth axis of the scanning mechanism; rotating the azimuth axis of the scanning mechanism by the debugging rotary table, and adjusting the flat crystal reflector to minimize the circle drawing amount observed by the third autocollimator C, wherein the deviation amount from the circle center of the circle drawing to the center of the reticle of the third autocollimator C is the perpendicularity between the azimuth axis of the scanning mechanism and the table top of the debugging rotary table;
step 2: adjusting the angle of the table top of the debugging rotary table to enable the third autocollimator C to be autocollimated, and enabling the azimuth axis of the scanning mechanism to be parallel to the optical axis of the third autocollimator C after being reflected by the inner reflector; rotating the debugging rotary table to a calibrated zero position, and rotating a scanning reflecting mirror of the scanning mechanism to enable a first autocollimator A and a third autocollimator C which are the same in height as the scanning reflecting mirror to be mutually aligned;
and step 3: a flat crystal reflector with a downward reflecting surface is arranged on an azimuth axis of the scanning mechanism, and the height of a second autocollimator B is adjusted to be the same as that of a laser infrared spectroscope in the scanning mechanism, so that the second autocollimator B can see an autocollimation image of the flat crystal reflector through the spectroscope; rotating the azimuth axis of the scanning mechanism, adjusting the flat crystal reflector to minimize the circle drawing amount observed by the second autocollimator B, wherein the deviation amount from the circle center of the circle drawing to the center of the reticle of the second autocollimator B is the deviation amount of the laser light path; adjusting the spectroscope according to the deviation amount to enable the second autocollimator B to be autocollimated;
and 4, step 4: adjusting the height of the second autocollimator B to be the same as that of a fixed reflector in the scanning mechanism, so that the second autocollimator B can see an autocollimation image of the flat crystal reflector through the fixed reflector; rotating the azimuth axis of the scanning mechanism, adjusting the flat crystal reflector to minimize the circle drawing amount observed by the second autocollimator B, wherein the deviation amount from the circle center of the circle drawing to the center of the reticle of the second autocollimator B is the deviation amount of the infrared light path; the fixed mirror is adjusted according to the deviation amount to self-collimate the second autocollimator B.
Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made in the above embodiments by those of ordinary skill in the art without departing from the principle and spirit of the present invention.
Claims (5)
1. The utility model provides a scanning mechanism light path debugging device which characterized in that: the device comprises a mounting bracket, a debugging rotary table, a clamping mechanism, a first autocollimator, a second autocollimator, a third autocollimator, a flat crystal reflector, a dual-channel rotary transformer interpreter and an internal reflector;
the debugging rotary table, the first autocollimator, the second autocollimator, the third autocollimator and the internal reflector are all arranged on the mounting bracket, and the height of the second autocollimator can be adjusted to be used for debugging light paths of different wave bands respectively;
the table top of the debugging rotary table is provided with an angle adjusting mechanism, so that the fine adjustment of the angle of the table top in the azimuth direction and the pitching direction can be realized; the debugging rotary table is provided with a two-channel rotary transformer interpreter, so that the accurate measurement of the rotation angle can be realized; the rotating shaft of the debugging rotary table is perpendicular to the optical axes of the first autocollimator and the second autocollimator, and the optical axis of the third autocollimator passes through the internal reflector and then is parallel to the rotating shaft of the debugging rotary table;
the clamping mechanism is arranged on the table top of the debugging rotary table;
the flat crystal reflector can be installed on the scanning mechanism with the reflecting surface facing downwards.
2. The optical path adjustment device for scanning mechanism of claim 1, wherein: the parallelism of the first autocollimator and the second autocollimator is less than or equal to 5'; the perpendicularity between the first autocollimator and the rotary shaft of the debugging rotary table is less than or equal to 5'; the parallelism between the optical axis of the third autocollimator after being reflected by the internal reflector and the rotating shaft of the debugging turntable is less than or equal to 5'.
3. The optical path adjustment device for a scanning mechanism according to claim 1 or 2, wherein: the coaxiality of the central axis of the clamping mechanism and the rotating shaft of the debugging rotary table is less than or equal to 3 mm.
4. The optical path adjustment device for scanning mechanism of claim 3, wherein: the radial runout is less than or equal to 2 mu m and the angular wobble is less than or equal to 3' in the rotation process of the debugging turntable.
5. A method for debugging an optical path of a scanning mechanism using the debugging apparatus according to claim 1, comprising: the method comprises the following steps:
step 1: fixing the scanning mechanism component on the table top of the debugging turntable through a clamping mechanism; a flat crystal reflector with a downward reflecting surface is arranged on the azimuth axis of the scanning mechanism; rotating the azimuth axis of the scanning mechanism by the debugging rotary table, and adjusting the flat crystal reflector to minimize the circle drawing amount observed by the third autocollimator, wherein the deviation amount from the circle center of the circle drawing to the center of the reticle of the third autocollimator is the perpendicularity between the azimuth axis of the scanning mechanism and the table top of the debugging rotary table;
step 2: adjusting the angle of the table top of the debugging rotary table to enable the third autocollimator to be autocollimated, and enabling the azimuth axis of the scanning mechanism to be parallel to the optical axis of the third autocollimator after being reflected by the inner reflector; rotating the debugging rotary table to a calibrated zero position, and rotating a scanning reflecting mirror of the scanning mechanism to enable a first autocollimator and a third autocollimator which are the same in height as the scanning reflecting mirror to be mutually aligned;
and step 3: a flat crystal reflector with a downward reflecting surface is arranged on the azimuth axis of the scanning mechanism, and the height of the second autocollimator is adjusted to be the same as that of the spectroscope in the scanning mechanism, so that the second autocollimator can see an autocollimation image of the flat crystal reflector through the spectroscope; rotating the azimuth axis of the scanning mechanism, adjusting the flat crystal reflector to minimize the circle drawing amount observed by the second autocollimator, wherein the deviation amount from the circle center of the circle drawing to the center of the reticle of the second autocollimator is the deviation amount of the current waveband light path; adjusting the spectroscope according to the deviation amount to enable the second autocollimator to be self-aligned;
and 4, step 4: adjusting the height of the second autocollimator to be the same as that of a fixed reflector in the scanning mechanism, so that the second autocollimator can see an autocollimation image of the flat crystal reflector through the fixed reflector; rotating the azimuth axis of the scanning mechanism, adjusting the flat crystal reflector to minimize the circle drawing amount observed by the second autocollimator, wherein the deviation amount from the circle center of the circle drawing to the center of the reticle of the second autocollimator is the deviation amount of the current waveband light path; and adjusting the fixed reflector according to the deviation amount to enable the second autocollimator to be self-aligned.
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| CN109212775B (en) * | 2018-10-24 | 2020-09-08 | 长春理工大学 | Debugging device and method for zero arm of biological measuring instrument |
| CN109827505B (en) * | 2019-03-26 | 2020-05-19 | 北京航空航天大学 | High-precision laser scanning galvanometer position sensor calibration system |
| CN112834046B (en) * | 2021-01-07 | 2022-06-28 | 中国电子科技集团公司第十一研究所 | Micro-scanning mechanism and assembling and adjusting method |
| CN114415389B (en) * | 2022-01-26 | 2023-11-14 | 西安应用光学研究所 | Optical-mechanical system adjustment method comprising multiple reflectors |
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| CN101393753A (en) * | 2007-09-20 | 2009-03-25 | 新科实业有限公司 | Method for manufacturing optical head |
| CN101718534B (en) * | 2009-12-22 | 2011-01-19 | 中国科学院长春光学精密机械与物理研究所 | Parallelism detector for optical axis of multi-optical system |
| CN102620688B (en) * | 2012-03-23 | 2014-03-12 | 中国科学院西安光学精密机械研究所 | Multifunctional optical axis parallelism corrector and calibration method thereof |
| CN103363901B (en) * | 2013-07-15 | 2016-04-06 | 北京理工大学 | A kind of scaling method towards coaxial alignment microassembly system |
| CN204027529U (en) * | 2014-07-07 | 2014-12-17 | 中国电子科技集团公司第五十三研究所 | Based on the biaxial stabilization turntable error of perpendicularity pick-up unit of autocollimator |
| RU2611604C1 (en) * | 2015-09-21 | 2017-02-28 | Российская Федерация, от имени которой выступает Министерство обороны Российской Федерации | Device for automatic alignment of two-mirror telescope system to given direction of output radiation |
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